WO2010093314A1 - Silicon detector assembly for x-ray imaging - Google Patents

Silicon detector assembly for x-ray imaging Download PDF

Info

Publication number
WO2010093314A1
WO2010093314A1 PCT/SE2010/050106 SE2010050106W WO2010093314A1 WO 2010093314 A1 WO2010093314 A1 WO 2010093314A1 SE 2010050106 W SE2010050106 W SE 2010050106W WO 2010093314 A1 WO2010093314 A1 WO 2010093314A1
Authority
WO
WIPO (PCT)
Prior art keywords
detector
rays
silicon
modules
ray
Prior art date
Application number
PCT/SE2010/050106
Other languages
French (fr)
Inventor
Mats Danielsson
Staffan Karlsson
Original Assignee
Mats Danielsson
Staffan Karlsson
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mats Danielsson, Staffan Karlsson filed Critical Mats Danielsson
Priority to CN201080007458.XA priority Critical patent/CN102224434B/en
Priority to JP2011550091A priority patent/JP5717652B2/en
Priority to DE112010000797.7T priority patent/DE112010000797B4/en
Priority to GB1112331.2A priority patent/GB2480561B/en
Priority to KR1020117020100A priority patent/KR101716911B1/en
Publication of WO2010093314A1 publication Critical patent/WO2010093314A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/242—Stacked detectors, e.g. for depth information
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/02—Devices for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computerised tomographs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/243—Modular detectors, e.g. arrays formed from self contained units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/249—Measuring radiation intensity with semiconductor detectors specially adapted for use in SPECT or PET
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)

Definitions

  • the present invention relates to x-ray imaging and more particularly to a silicon detector assembly for x-ray imaging.
  • X-ray imaging is a common procedure, in medical imaging the energy range for the x- rays is typically 10 keV to 200 keV, in non-destructive testing or security screening the energy may be higher. In this range the x-rays reacts with matter mainly through Compton effect and Photoelectric effect. In the first case only a part of the energy of the x-ray photon is passed on to the electron and the x-ray continues with decreased energy after this scattering event. In the latter case all the energy is passed to the electron and the x-ray is completely absorbed.
  • the challenge for x-ray imaging detectors is to extract maximum information from the detected x-rays to provide input to an image of an object where the object is depicted in terms of density, composition and structure. It is still common to use film- screen as detector but mostly the detectors today provide a digital image.
  • the detector needs to convert the incident x-rays into electrons, this typically take place through Photo-effect or through Compton interaction and the resulting electron are usually creating secondary visible light until its energy is lost and this light is in turn detected by a photo-sensitive material.
  • detectors less common, which are based on semiconductors such as amorphous Selenium or Silicon and in this case the electrons created by the x-ray is creating electric charge in terms of electrons and hole- pairs which are collected through an applied electric field with enough strength.
  • the most detectors operate in an integrating mode in the sense that they integrate the signal from a multitude of x-rays and this signal is only later digitized to retrieve a best guess for the number of incident x-rays in a pixel.
  • photon counting detectors have emerged as a feasible alternative in some applications; currently those detectors are commercially available mainly in mammography.
  • the photon counting detectors have an advantage since in principal the energy for each x-ray can be measured which yields additional information about the composition of the object; which can be used to increase the image quality and/or to decrease the radiation dose.
  • a very common configuration for the detector is as outlined in US7471765 "Cone Beam Computed Tomography With A Flat Panel Imager".
  • the detector incorporates a 512.times.512 array of a-Si:H photodiodes and thin-film transistors coupled to a scintillators and is operated in integration mode. In this case the application is to optimize radiation therapy but these detectors are also very common place in diagnostic imaging and other applications.
  • Silicon have many advantages as detector material such as high purity and a low energy required for creation of charge carriers (electron-hole pairs) and a also a high mobility for these charge carriers which means it will work even for high rates of x- rays. Not the least it is also readily available in large volumes.
  • the main challenge with Silicon is its low atomic number and low density which means it has to be made very thick for higher energies to be an efficient absorber.
  • the low atomic number also means the fraction of Compton scattered x-ray photons in the detector will dominate over the Photo absorbed photons which will create problem with the scattered photons since they may induce signals in other pixels in the detector which will be equivalent to noise in those pixels.
  • Silicon has however been used successfully in applications with lower energy as is for example outlined by M. Danielsson, H. Bornefalk, B. Cederstr ⁇ m, V. Chmill, B. Hasegawa, M. Lundqvist, D. Nygren and T. Tabar, "Dose-efficient system for digital mammography", Proc.
  • the Silicon is produced in wafers which are approximately 500 ⁇ m thick and these wafers can be oriented so that the x-rays are incident edge-on and the depth of silicon may be as much as the diameter of the wafer if required.
  • edge-on detectors are used for so called Compton imaging, in which the energy and direction of the Compton scattered x-ray is measured in order to make an estimation of the energy of the original x-ray.
  • the method of Compton imaging has been much discussed in the literature for a long time but mainly applies to energies higher than what is employed in x-ray imaging, such as Positron Emission Tomography. Compton imaging does not relate to the present invention.
  • a basic idea is to provide a Silicon detector for x-ray imaging that is based on multiple semiconductor detector modules arranged together to form an overall detector area.
  • Each semiconductor detector module comprises an x-ray sensor of crystalline Silicon oriented edge-on to incoming x-rays and connected to integrated circuitry for registration of x-rays interacting in the x-ray sensor through the photoelectric effect and through Compton scattering and for an incident x-ray energy between 40 keV and 250 keV to provide the spatial and energy information from these interactions to enable an image of an object.
  • anti-scatter modules are interfolded between at least a subset of the semiconductor detector modules to at least partly absorb Compton scattered x-rays.
  • each anti-scatter module includes a foil of relatively heavy material to prevent most of the Compton scattered x-rays in a semiconductor detector module to reach an adjacent detector module.
  • each of the semiconductor detector modules is implemented as a Multi Chip Module (MCM), and the integrated circuitry comprises at least two integrated circuits, which are mounted by a flip-chip technique. It should though be understood that it is possible to employ implementations, where the semiconductor detector module only has a single integrated circuit.
  • MCM Multi Chip Module
  • the present invention will overcome these problems which may make photon counting detectors a reality also in applications with higher x-ray energies.
  • the invention can be used in many different applications including computer tomography, security scanning and non-destructive testing.
  • Figure 1 is a schematic diagram of an X-ray detector according to an exemplary embodiment.
  • Figure 2 is a schematic diagram illustrating an example of a semiconductor detector module according to an exemplary embodiment.
  • Figure 3 is a schematic diagram illustrating an example of semiconductor detector module according to another exemplary embodiment.
  • Figure 4 is a schematic diagram illustrating a semiconductor detector module implemented as a multi chip module according to an exemplary embodiment.
  • Figure 5 is a schematic diagram illustrating an example of how several semiconductor detector modules can be positioned next to each other in order to build a whole x-ray detector.
  • Figure 6 is a schematic diagram illustrating an example of a semiconductor detector module according to another exemplary embodiment of the invention.
  • Figure 7 is a schematic diagram illustrating different examples of how semiconductor detector modules can be positioned next to each other with anti-scatter sheets positioned in-between detector modules.
  • Figure 8 is a schematic diagram illustrating an example of how semiconductor detector modules can be segmented in depth; in the direction of incoming x-rays.
  • Figure 9 is a schematic diagram illustrating an example of how the integrated circuits of a semiconductor detector module can be protected from ionizing radiation.
  • Figures lOa-c are different schematic views illustrating an example of the arrangement of semiconductor detector modules in two levels (B) to allow for seamless tiling of the semiconductor detector modules.
  • Figure 1Od illustrates an example of a mechanical frame for the semiconductor detector modules.
  • Figure 11 is a schematic diagram illustrating an example of how a full detector can be constructed in two halves and assembled together seamlessly in order to build a wider detector.
  • Figure 12 is a schematic diagram illustrating examples of how semiconductor detector modules can be displaced relative to each other to optimize spatial resolution.
  • a basic idea is to provide a Silicon detector for x-ray imaging that is based on multiple semiconductor detector modules arranged together to form an overall detector area, where each semiconductor detector module comprises an x-ray sensor of crystalline Silicon oriented edge-on to incoming x-rays and connected to integrated circuitry for registration of x-rays interacting in the x-ray sensor through the photoelectric effect and through Compton scattering and for an incident x-ray energy between 40 keV and 250 keV to provide the spatial and energy information from these interactions to enable an image of an object. Further, anti-scatter modules are interfolded between at least a subset of the semiconductor detector modules to at least partly absorb Compton scattered x-rays.
  • semiconductor detector modules each including an x-ray sensor, are tiled together to form a full detector of almost arbitrary size with almost perfect geometrical efficiency except for an anti-scatter grid which is integrated between at least some of the semiconductor detector modules.
  • the x-ray sensors are attached to integrated circuits which use the information both from x-rays that Compton scatter in the sensors and from x-rays which reacts through photo-effect. This information is used to reconstruct the final image with optimum contrast for a certain imaging task.
  • the energy for each x-ray can be deduced with the combined information of the deposited energy in the semiconductor sensor and the depth of interaction for the x-ray.
  • the anti-scatter grid which normally is made of a relatively heavy material not only cut Compton scattered x-rays from the object but also prevents Compton scattered x-rays in the semiconductor sensors to reach other sensors. These Compton scattered x-rays would otherwise mainly add to the noise.
  • each anti-scatter module includes a foil of relatively heavy material to prevent most of the Compton scattered x-rays in a semiconductor detector module to reach an adjacent detector module.
  • Figure 1 is a schematic diagram of an X-ray detector according to an exemplary embodiment. In this example there is shown a schematic view of an X-ray detector (A) with x-ray source (B) emitting x-rays (C). The elements of the detector (D) are pointing back to the source, and thus preferably arranged in a slightly curved overall configuration. Two possible scanning motions (E 7 F) of the detector are indicated.
  • the source In each scanning motion the source may be stationary or moving, in the scanning motion indicated by (E) the x-ray source and detector may be rotated around an object positioned in between. In the scanning motion indicated with (F) the detector and the source may be translated relative to the object, or the object may be moving, e.g. if it is positioned on a conveyor belt. Also in scan motion (E) the object may be translated during the rotation, so called spiral scanning.
  • semiconductor sensors made of Crystalline Silicon are used to convert the x-rays into an electric signal.
  • the sensor is oriented edge-on to the incoming x-rays and the depth should be enough to absorb at least more than 50% of incoming x-rays, for an application in Computed Tomography the depth should be around 30 mm.
  • the semiconductor sensor is around 0.5 mm thick and is preferably subdivided into pixels and each pixel is formed, e.g. by a back-biased diode which should be fully depleted in so that the whole volume works as sensor for the x-rays.
  • the width of the pixels may be around 0.4 mm.
  • each pixel diode should be subdivided into depth segments to decrease the count rate, the length of these depth segments should preferably vary exponentially to make sure that the detection rate, which decreases exponentially with depth, is kept approximately even.
  • FIG. 2 is a schematic diagram illustrating an example of a semiconductor detector module according to an exemplary embodiment.
  • This is an example of a semiconductor detector module (A) with the sensor part split into pixels (B), where each sensor pixel is constituted, e.g. by a diode.
  • the x-rays (C) enter through the edge (D) of the semiconductor sensor.
  • Figure 3 is a schematic diagram illustrating an example of semiconductor detector module according to another exemplary embodiment.
  • the semiconductor detector module sensor part (A) is split into pixels (B) where each sensor pixel is constituted by a diode.
  • the semiconductor sensor part is also split into so-called depth segments in the depth direction, again assuming the x- rays (C) enter through the edge (D).
  • the semiconductor sensors may also be used as so called Multi Chip Modules in the sense that they are used as base substrates for electric routing and for a number of Application Specific Integrated Circuits (ASICs) which are attached preferably through so called flip-chip technique.
  • the routing will include a connection for the signal from each pixel to the ASIC input as well as connections from the ASIC to external memory and/or digital data processing.
  • Power to the ASICs may be provided through similar routing taking into account the increase in cross-section which is required for the large currents in these connections, but the power may also be provided through a separate connection.
  • the ASICS are positioned on the side of the active sensor and this means it can be protected from the incident x-rays if an absorbing cover is placed on top and it can also be protected from scattered x-rays from the side by positioning an absorber also in this direction. This may be important since x-rays may harm the ASICs and cause errors both in short and long term, mainly through charge up of oxide layers in the ASIC.
  • the ASICs are Silicon-based and manufactured through Complementary Metal Oxide Semiconductor (CMOS) technology.
  • CMOS Complementary Metal Oxide Semiconductor
  • FIG. 4 is a schematic diagram illustrating a semiconductor detector module implemented as a multi chip module according to an exemplary embodiment.
  • This example shows how the semiconductor sensor also can have the function of substrate (A) in a Multi Chip Module (MCM).
  • MCM Multi Chip Module
  • the signal is routed (B) from the pixels (C) to inputs of parallel processing integrated circuits (e.g. ASICs) (D) which are positioned next to the active sensor area.
  • ASICs Application Specific Integrated Circuit
  • the ASICs process the electric charge generated from each x-ray and converts it to digital data which can be used to estimate the energy.
  • the ASICs are configured for connection a digital data processing circuitry so the digital data may be sent to further digital data processing (E) and memories located outside of the MCM and finally the data will be the input to the reconstructed image.
  • the signal from each x-ray is measured and the deposited energy by each x-ray is estimated.
  • the measured energy of each x-ray will be used to increase the contrast of desired elements in the image.
  • energy information will be used to separate electronic noise from x-rays which Compton scatters in the semiconductor sensor from x-rays which react through photo effect.
  • the information will preferably be weighted together to maximize the contrast for desired elements and structures in the object.
  • the combination of the ASIC electronics and semiconductor sensors should ideally have a non-paralyzable dead time short enough to keep up with high flux of x-rays and avoid so called pile-up which means that two events will be mistaken for one event with the combined energy of the two contributing events.
  • the dead time can be corrected for in order not to create artifacts in the image but will mean a loss of image quality and should be kept as low as possible. It is possible to discriminate the pile-up events with an energy exceeding the maximum energy of the incident x-rays since this is physically impossible.
  • FIG. 5 is a schematic diagram illustrating an example of how several semiconductor detector modules can be positioned next to each other in order to build a whole x-ray detector.
  • MCMs Multi Chip Modules
  • A Multi Chip Modules
  • the MCMs are interfolded by sheets of a heavy element (such as Tungsten) (B) in order to absorb x-rays which were Compton scattered in the semiconductor sensors (C) or in the object (D), these x-rays would otherwise contribute to the noise in the image.
  • a heavy element such as Tungsten
  • FIG. 6 is a schematic diagram illustrating an example of a semiconductor detector module according to another exemplary embodiment of the invention.
  • This example illustrates a Multi Chip Module (A) where the ASICs (B) are spread out over the area of the sensor in order to minimize capacitance to the input of the ASICs. Capacitance increases the electronic noise which may have an unfavorable impact on image quality. Spreading out the ASICs over the semiconductor sensor means that the routing length, which is proportional to the capacitance, can be much shorter.
  • the drawback with this arrangement is that the ASICs will be exposed to direct x-ray radiation (C) which may be harmful and also that the ASICs will take space and make impossible a very dense packing unless they are made very thin. It is even conceivable that the ASICs are merged to one large ASIC covering a larger part of the sensor or the whole semiconductor sensor. It should thus be understood that it is possible to employ implementations, where the semiconductor detector module only has a single integrated circuit.
  • Figure 7 is a schematic diagram illustrating different examples of how semiconductor detector modules can be positioned next to each other with anti-scatter sheets positioned in-between detector modules.
  • detector modules such as Multi Chip Modules (A) are positioned next to each other as in Figure 5 with the sheets made of heavy material (B).
  • the sheets may be positioned between every MCM as indicated to the left, or between for example every third as indicated to the right, depending on what optimizes the signal to noise level.
  • Figure 8 is a schematic diagram illustrating an example of how semiconductor detector modules can be segmented in depth; in the direction of incoming x-rays.
  • This example illustrates semiconductor detector modules (A) with shield (B) and with depth segmentation with a top (C) and bottom (D) segment.
  • To the left the semiconductor detector module is aligned relative to the incoming x-rays from the source.
  • To the right the semiconductor detector module is misaligned relative to x- rays from the source.
  • Mechanical alignment may be a challenge for long semiconductor detectors and misalignment may cause artifacts in the image since parts of the semiconductor sensor area may be shadowed by the interfolding heavy material sheets.
  • a volume of the detector module which becomes shadowed (E) is indicated to the right.
  • the length of the depth segments is chosen so that the count rate in the segment counting most x-rays is less than a factor 10 higher compared to the depth segment counting the median number of x-ray photons compared to the other segments.
  • the length of the depth segments may also be chosen so that the count rate in the segment counting least x-rays is less than a factor 10 less compared to the depth segment counting the median number of x-ray photons compared to the other segments.
  • FIG 9 is a schematic diagram illustrating an example of how the integrated circuits of a semiconductor detector module can be protected from ionizing radiation.
  • the ASICs may be sensitive to ionizing radiation such as x-rays (A) and in this example it is shown how they can be very efficiently shielded by adding absorbers made of heavy material (B), such as Tungsten or Copper, between the irradiated volume and the said ASICs.
  • B absorbers made of heavy material
  • the shielding material will thus protect the ASICs from radiation from above (A) and scattered from the side (C).
  • the heavy material sheet (D) which is inserted primarily to absorb scattered x-rays in the semiconductor detectors and in the object will also serve as a radiation protection for the ASICs.
  • a foil of x-ray absorbing material is interfolded between at least some of the detector modules.
  • the foils should preferably be made in a heavy material with high atomic number such as Tungsten.
  • the overall detector involves arrangement of the semiconductor detector modules in a number of levels, where the number of levels is equal to or greater than 2.
  • the levels are also referred to as layers, and the overall detector structure is thus referred to as a layered detector, with the different layers arranged substantially in the direction of incoming x-rays.
  • a first set of detector modules are arranged in an upper layer and a second set of detector modules are arranged in a lower layer.
  • detector modules of one of the layers are staggered (displaced) with respect to detector modules of another one of the layers in order to achieve an efficient geometrical coverage of active detector area and/or efficient resolution.
  • the detector modules of one of the layers are arranged with a predetermined offset, in a direction substantially orthogonal to incoming x-rays, with respect to the detector modules of another layer to enable an efficient active detector area.
  • Figures lOa-c are different schematic views illustrating an example of the mechanical arrangement of semiconductor detector modules in two layers or levels (B) to allow for seamless tiling of the semiconductor detector modules.
  • This example shows mechanical arrangement of detector modules such as MCMs (A) in two levels (B) to allow for seamless tiling of the semiconductor sensors. Also a magnified view is displayed both from two views.
  • the space (C) between detector modules e.g. MCMs
  • the space (C) between detector modules allows for efficient cooling of the ASICs which may consume significant power. Thermal expansion is accounted for since each MCM is attached separately and the expansion does not add up which would be the case if they were positioned in direct contact with each other side by side.
  • the mechanical arrangement according to the figure also leaves room for connections for data transfer and for power. It also facilitates easy mounting and accurate alignment.
  • the detector modules of the overall layered Silicon detector will be arranged or tiled with a minimum dead detector area in both directions orthogonal to incident x-rays.
  • the semiconductor detector modules are put in a mechanical jig/frame according to Figure lOa-c where each semiconductor detector module including sensor is arranged for pointing back to the x-ray source which should also be true for the individual pixels in the semiconductor sensor of the detector module.
  • the staggered multi (two or more) level arrangement provides means for the jig/frame to hold and precisely position each semiconductor detector module including the active sensor while maximum geometrical coverage of active detector area for the incident x-rays is enabled. Furthermore space for the ASICs and read-out electronics is provided.
  • An example of a suitable mechanical frame for semiconductor detector modules is illustrated in Figure 1Od. Precision alignment features (dotted areas in Figure 1Od) for each semiconductor detector module (including sensor), preferably of kinematic type, is formed in the mechanical jig/frame.
  • the semiconductor detector modules (including sensors) are held/secured/locked against these alignment features by holding arrangements/features (A), preferably of a resilient type.
  • thermal expansion of the jig/frame material itself in this arrangement do not need to be matched to the thermal expansion of the sensor material (here silicon) which means it can be made in a standard material such as Aluminum which can be easily processed to the desired shape and is readily available.
  • the assembly also allows for efficient air cooling of the ASICs and MCMs when air is forced / blown through the space between the MCMs as a large surface area for heat transfer between the air and MCMs is present.
  • the MCMs themselves functions as cooling fins.
  • Figure 11 is a schematic diagram illustrating an example of how a full detector can be constructed in two halves and assembled together seamlessly in order to build a wider detector.
  • This example shows that a full detector can be constructed in two halves (A) and assembled together seamlessly in order to build a wider detector as indicated also in a magnified view. This would increase cost and also the amount of scattered radiation from the object would increase which will increase noise. It may still be desirable though since a wider detector decreases image acquisition time which is important in imaging of moving objects such as the human heart.
  • Figure 12 is a schematic diagram illustrating examples of how semiconductor detector modules can be displaced relative to each other to optimize spatial resolution.
  • the mechanical arrangement of the semiconductor detectors orthogonal to scan direction may be displaced relative to each other with a known fraction (A) of the actual pixel size (B) of the semiconductor sensor.
  • A the fraction of the actual pixel size
  • B the semiconductor sensor.
  • the figure shows two examples of this; one with every pixel is displaced with 1/3 (C) relative to adjacent detector pixel, one example with displacement of 1/5 (D). More generally, the offset may be between half a pixel and one tenth of a pixel.
  • the assembled detector according to above may be used for Computed Tomography but also for other imaging applications such as security screening and non-destructive testing.
  • Another embodiment of the invention places the ASICs on top of the semiconductor sensors, this arrangement would cut the required area for the MCM. Moreover, and more importantly it would cut the input capacitance to the ASIC which increases the performance and decreases the noise which is beneficial for image quality.
  • the main challenge with this arrangement is that the ASICs will be exposed to the radiation which may create malfunctioning both in short and long term, this may however be mitigated with special design processes for the ASIC.
  • a problem is also that in this configuration the ASICs will shadow the Semiconductor sensors positioned below and x-rays absorbed in the ASIC will only contribute to the dose and not to the image quality. This absorption may also cause artifacts in the image.

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Medical Informatics (AREA)
  • Pulmonology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Biophysics (AREA)
  • Optics & Photonics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Surgery (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biomedical Technology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

A Silicon detector for x-ray imaging is based on multiple semiconductor detector modules (A) arranged together to form an overall detector area, where each semiconductor detector module comprises an x-ray sensor of crystalline Silicon oriented edge-on to incoming x-rays and connected to integrated circuitry for registration of x-rays interacting in the x-ray sensor through the photoelectric effect and through Compton scattering and for an incident x-ray energy between 40 keV and 250 keV to provide the spatial and energy information from these interactions to enable an image of an object. Further, anti-scatter modules (B) are interfolded between at least a subset of the semiconductor detector modules to at least partly absorb Compton scattered x-rays.

Description

Silicon Detector Assembly for x-ray Imaging
TECHNICAL FIELD
The present invention relates to x-ray imaging and more particularly to a silicon detector assembly for x-ray imaging.
TECHNICAL BACKGROUND
X-ray imaging is a common procedure, in medical imaging the energy range for the x- rays is typically 10 keV to 200 keV, in non-destructive testing or security screening the energy may be higher. In this range the x-rays reacts with matter mainly through Compton effect and Photoelectric effect. In the first case only a part of the energy of the x-ray photon is passed on to the electron and the x-ray continues with decreased energy after this scattering event. In the latter case all the energy is passed to the electron and the x-ray is completely absorbed.
The challenge for x-ray imaging detectors is to extract maximum information from the detected x-rays to provide input to an image of an object where the object is depicted in terms of density, composition and structure. It is still common to use film- screen as detector but mostly the detectors today provide a digital image.
The detector needs to convert the incident x-rays into electrons, this typically take place through Photo-effect or through Compton interaction and the resulting electron are usually creating secondary visible light until its energy is lost and this light is in turn detected by a photo-sensitive material. There are also detectors, less common, which are based on semiconductors such as amorphous Selenium or Silicon and in this case the electrons created by the x-ray is creating electric charge in terms of electrons and hole- pairs which are collected through an applied electric field with enough strength. By far the most detectors operate in an integrating mode in the sense that they integrate the signal from a multitude of x-rays and this signal is only later digitized to retrieve a best guess for the number of incident x-rays in a pixel. The last years also so called photon counting detectors have emerged as a feasible alternative in some applications; currently those detectors are commercially available mainly in mammography. The photon counting detectors have an advantage since in principal the energy for each x-ray can be measured which yields additional information about the composition of the object; which can be used to increase the image quality and/or to decrease the radiation dose.
A very common configuration for the detector is as outlined in US7471765 "Cone Beam Computed Tomography With A Flat Panel Imager". The detector incorporates a 512.times.512 array of a-Si:H photodiodes and thin-film transistors coupled to a scintillators and is operated in integration mode. In this case the application is to optimize radiation therapy but these detectors are also very common place in diagnostic imaging and other applications.
In US4785186 it is proposed an amorphous silicon detector for counting high energy particles including x-rays. US7471765 "Cone Beam Computed Tomography with A Flat Panel Imager". This innovation was not exploited for x-ray imaging, maybe because of challenges with the amorphous silicon material in this application and also probably because of challenges with absorption efficiency.
Since in Photon Counting mode the signal from an individual x-ray is quite weak you need to maximize it by optimizing the conversion efficiency from x-ray energy into collected electric charge for each event. This means the use of Crystalline materials in detector is normally advisable. The advantages and the pit-falls with photon counting is described in Borje Norlin, "Characterisation and application of photon counting X- ray detector systems" Mid Sweden University Doctoral Thesis 26, ISSN 1652-893X, ISBN 978-91-85317-55-4 Electronics Design Division, in the Department of Information Technology and Media Mid Sweden University, SE-851 70 Sundsvall, Sweden and also in Mats Lundqvist Mats Lundqvist: Silicon Strip Detectors for Scanned Multi-Slit X-Ray Imaging. Both of the thesis concerns the development and characterization of X-ray imaging systems based on single photon processing. One can compare measuring the energy of each x-ray to seeing the color of the x-ray, analogous to color imaging in the visible range. "Color" X-ray imaging opens up new perspectives in medical X-ray diagnosis and other applications. The difference in absorption for different colors can be used to discern materials in the object and in principle the elemental composition of an object could be determined and not only the gray scale. For instance, this information might be used to identify contrast media which is used in a large number of examinations in diagnostic x-ray imaging.
Lundqvist and Norlin point out that today's technology make it possible to construct photon counting detector systems that can resolve details to a level of approximately 50 μm. However, there is also a complication with such small pixels since in a semiconductor detector each absorbed X-ray photon creates a cloud of charge which contributes to the image. For high photon energies the size of the charge cloud is comparable to 50 μm and might be distributed between several pixels in the image. Charge sharing is a key problem since, not only is the resolution degenerated, but it also destroys the "color" information in the image. They also outline methods to get around this problem, such as charge summing between adjacent pixels.
A suggestion for a detector for computed tomography for breast imaging is outlined in M. G. Bisogni, A. Del Guerra, N. Lanconelli, A. Lauria, G. Mettivier, M. C. Montesi, D. Panetta, R. Pani, M. G. Quattrocchi, P. Randaccio, V. Rosso and P. Russo "Experimental study of beam hardening artifacts in photon counting breast computed tomography" Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Volume 581, Issues 1-2, 21 October 2007, Pages 94-98 This is an example where the energies are so low that Silicon can be used as a detector still maintaining some of the detector efficiency. The X-ray breast Computed Tomography (CT) system is implemented on the gantry of a dedicated single photon emission tomography system for breast Tc-99 imaging. The single photon counting silicon pixel detector was 0.3 mm thick, 256x256 pixel, 55μm pitch, bump-bonded to the Medipix2 photon counting readout chip. Artifacts may be due to the low detection efficiency and the charge sharing effect of the silicon pixel detector.
Another photon counting detector for low energies is proposed by V. Rosso, N. Belcari, M. G. Bisogni, C. Carpentieri, A. Del Guerra, P. Delogu, G. Mettivier, M. C. Montesi, D. Panetta, M. Quattrocchi, P. Russo and A. Stefanini "Preliminary study of the advantages of X-ray energy selection in CT imaging" Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Volume 572, Issue 1, 1 March 2007, Pages 270-273. This detector ensures good detection efficiency (46%) in the used energy range (60 kVp) with a good spatial resolution that arises from a 55 μm square pixel.
Silicon have many advantages as detector material such as high purity and a low energy required for creation of charge carriers (electron-hole pairs) and a also a high mobility for these charge carriers which means it will work even for high rates of x- rays. Not the least it is also readily available in large volumes.
The main challenge with Silicon is its low atomic number and low density which means it has to be made very thick for higher energies to be an efficient absorber. The low atomic number also means the fraction of Compton scattered x-ray photons in the detector will dominate over the Photo absorbed photons which will create problem with the scattered photons since they may induce signals in other pixels in the detector which will be equivalent to noise in those pixels. Silicon has however been used successfully in applications with lower energy as is for example outlined by M. Danielsson, H. Bornefalk, B. Cederstrόm, V. Chmill, B. Hasegawa, M. Lundqvist, D. Nygren and T. Tabar, "Dose-efficient system for digital mammography", Proc. SPIE, Physics of Medical Imaging, vol. 3977, pp. 239-249 San Diego, 2000. One way to overcome the problem of low absorption efficiency for Silicon is to simply make it very thick, the Silicon is produced in wafers which are approximately 500 μm thick and these wafers can be oriented so that the x-rays are incident edge-on and the depth of silicon may be as much as the diameter of the wafer if required.
Another method to make Silicon deep enough to get high efficiency is advocated in patent US5889313 Sherwood Parker "Three dimensional architecture for solid state radiation detectors" 1999, this is an inventive method but involves some non standard production methods which may be the reason why it has not been used in commercial imaging detectors.
The first mentioning of crystalline Silicon strip detectors in edge-on geometry as an x- ray detector we could find is R. Nowotny: "Application Of Si-Microstrip-Detectors In Medicine And Structural Analysis" Nuclear Instruments and Methods in Physics Research 226 (1984) 34-39. It concludes that Silicon will work at low energies such as for breast imaging but not for higher energies such as computed tomography mainly because of the higher fraction of Compton scattering and problems related to this.
The edge-on geometry for semiconductor detectors is also suggested in US4937453 Robert Nelson "X-ray detector for radiographic imaging" (edge-on), US5434417 David Nygren "High resolution energy-sensitive digital X-ray "and US2004/0251419 patent application by Robert Nelson. In the US2004/0251419 patent application edge-on detectors are used for so called Compton imaging, in which the energy and direction of the Compton scattered x-ray is measured in order to make an estimation of the energy of the original x-ray. The method of Compton imaging has been much discussed in the literature for a long time but mainly applies to energies higher than what is employed in x-ray imaging, such as Positron Emission Tomography. Compton imaging does not relate to the present invention.
In a paper by S Shoichi Yoshida, Takashi Ohsugi "Application of silicon strip detectors to X-ray computed tomography" Nuclear Instruments and Methods in Physics Research A 541 (2005) 412-420 an implementation of the edge-on concept is outlined. In this implementation thin tungsten plates placed between edge-on silicon strip detector reduces the background of scattered X-rays and improve the image contrast with low dose. The implementation is very similar to what is proposed by R. Nowotny:"Application Of Si-Microstrip-Detectors In Medicine And Structural Analysis" Nuclear Instruments and Methods in Physics Research 226 (1984) 34-39.
Several proposals have been made for photon-counting semiconductor detectors based on high-Z materials such as CdZnTe and clinical images have also been acquired with prototype detectors. The drawback with these materials is the cost and lack of experience in production volumes.
There has been a considerable interest in photon counting detectors in particular for medical imaging but so far there is no working commercial solution at higher energies than around 40 keV. This is because of problems to manufacture detectors in feasible and readily available materials; exotic high Z semiconductors are still expensive and unproven. Silicon has worked for lower energies but for higher energies the problem of high fraction of Compton scatter has been a prohibitive problem together with a working system assembly of a detector that fulfills the geometrical requirements of for example today's CT modalities in terms of combining high detection efficiency in terms of geometry and absorption.
SUMMARY
It is a general object to provide a silicon detector assembly for x-ray imaging.
This object is met by the invention as defined by the accompanying patent claims.
A basic idea is to provide a Silicon detector for x-ray imaging that is based on multiple semiconductor detector modules arranged together to form an overall detector area. Each semiconductor detector module comprises an x-ray sensor of crystalline Silicon oriented edge-on to incoming x-rays and connected to integrated circuitry for registration of x-rays interacting in the x-ray sensor through the photoelectric effect and through Compton scattering and for an incident x-ray energy between 40 keV and 250 keV to provide the spatial and energy information from these interactions to enable an image of an object. Further, anti-scatter modules are interfolded between at least a subset of the semiconductor detector modules to at least partly absorb Compton scattered x-rays.
Preferably, each anti-scatter module includes a foil of relatively heavy material to prevent most of the Compton scattered x-rays in a semiconductor detector module to reach an adjacent detector module.
By way of example, in an advantageous implementation, each of the semiconductor detector modules is implemented as a Multi Chip Module (MCM), and the integrated circuitry comprises at least two integrated circuits, which are mounted by a flip-chip technique. It should though be understood that it is possible to employ implementations, where the semiconductor detector module only has a single integrated circuit.
In summary the present invention will overcome these problems which may make photon counting detectors a reality also in applications with higher x-ray energies.
The invention can be used in many different applications including computer tomography, security scanning and non-destructive testing.
Other advantages and features offered by the present invention will be appreciated upon reading of the following description of the embodiments of the invention.
BRIEF DESCRIPTION OF DRAWINGS
The invention, together with further objects and advantages thereof, may best be understood by making reference to the following description taken together with the accompanying drawings, in which: Figure 1 is a schematic diagram of an X-ray detector according to an exemplary embodiment.
Figure 2 is a schematic diagram illustrating an example of a semiconductor detector module according to an exemplary embodiment.
Figure 3 is a schematic diagram illustrating an example of semiconductor detector module according to another exemplary embodiment.
Figure 4 is a schematic diagram illustrating a semiconductor detector module implemented as a multi chip module according to an exemplary embodiment.
Figure 5 is a schematic diagram illustrating an example of how several semiconductor detector modules can be positioned next to each other in order to build a whole x-ray detector.
Figure 6 is a schematic diagram illustrating an example of a semiconductor detector module according to another exemplary embodiment of the invention.
Figure 7 is a schematic diagram illustrating different examples of how semiconductor detector modules can be positioned next to each other with anti-scatter sheets positioned in-between detector modules.
Figure 8 is a schematic diagram illustrating an example of how semiconductor detector modules can be segmented in depth; in the direction of incoming x-rays.
Figure 9 is a schematic diagram illustrating an example of how the integrated circuits of a semiconductor detector module can be protected from ionizing radiation.
Figures lOa-c are different schematic views illustrating an example of the arrangement of semiconductor detector modules in two levels (B) to allow for seamless tiling of the semiconductor detector modules.
Figure 1Od illustrates an example of a mechanical frame for the semiconductor detector modules. Figure 11 is a schematic diagram illustrating an example of how a full detector can be constructed in two halves and assembled together seamlessly in order to build a wider detector.
Figure 12 is a schematic diagram illustrating examples of how semiconductor detector modules can be displaced relative to each other to optimize spatial resolution.
DETAILED DESCRIPTION
A basic idea is to provide a Silicon detector for x-ray imaging that is based on multiple semiconductor detector modules arranged together to form an overall detector area, where each semiconductor detector module comprises an x-ray sensor of crystalline Silicon oriented edge-on to incoming x-rays and connected to integrated circuitry for registration of x-rays interacting in the x-ray sensor through the photoelectric effect and through Compton scattering and for an incident x-ray energy between 40 keV and 250 keV to provide the spatial and energy information from these interactions to enable an image of an object. Further, anti-scatter modules are interfolded between at least a subset of the semiconductor detector modules to at least partly absorb Compton scattered x-rays.
As mentioned, semiconductor detector modules, each including an x-ray sensor, are tiled together to form a full detector of almost arbitrary size with almost perfect geometrical efficiency except for an anti-scatter grid which is integrated between at least some of the semiconductor detector modules. The x-ray sensors are attached to integrated circuits which use the information both from x-rays that Compton scatter in the sensors and from x-rays which reacts through photo-effect. This information is used to reconstruct the final image with optimum contrast for a certain imaging task. Preferably, the energy for each x-ray can be deduced with the combined information of the deposited energy in the semiconductor sensor and the depth of interaction for the x-ray. The anti-scatter grid which normally is made of a relatively heavy material not only cut Compton scattered x-rays from the object but also prevents Compton scattered x-rays in the semiconductor sensors to reach other sensors. These Compton scattered x-rays would otherwise mainly add to the noise.
Preferably, each anti-scatter module includes a foil of relatively heavy material to prevent most of the Compton scattered x-rays in a semiconductor detector module to reach an adjacent detector module. Figure 1 is a schematic diagram of an X-ray detector according to an exemplary embodiment. In this example there is shown a schematic view of an X-ray detector (A) with x-ray source (B) emitting x-rays (C). The elements of the detector (D) are pointing back to the source, and thus preferably arranged in a slightly curved overall configuration. Two possible scanning motions (E7F) of the detector are indicated. In each scanning motion the source may be stationary or moving, in the scanning motion indicated by (E) the x-ray source and detector may be rotated around an object positioned in between. In the scanning motion indicated with (F) the detector and the source may be translated relative to the object, or the object may be moving, e.g. if it is positioned on a conveyor belt. Also in scan motion (E) the object may be translated during the rotation, so called spiral scanning.
In a preferred embodiment semiconductor sensors made of Crystalline Silicon are used to convert the x-rays into an electric signal. To absorb the x-rays the sensor is oriented edge-on to the incoming x-rays and the depth should be enough to absorb at least more than 50% of incoming x-rays, for an application in Computed Tomography the depth should be around 30 mm. The semiconductor sensor is around 0.5 mm thick and is preferably subdivided into pixels and each pixel is formed, e.g. by a back-biased diode which should be fully depleted in so that the whole volume works as sensor for the x-rays. In an exemplary application, the width of the pixels may be around 0.4 mm. In a preferred exemplary embodiment, each pixel diode should be subdivided into depth segments to decrease the count rate, the length of these depth segments should preferably vary exponentially to make sure that the detection rate, which decreases exponentially with depth, is kept approximately even.
Figure 2 is a schematic diagram illustrating an example of a semiconductor detector module according to an exemplary embodiment. This is an example of a semiconductor detector module (A) with the sensor part split into pixels (B), where each sensor pixel is constituted, e.g. by a diode. The x-rays (C) enter through the edge (D) of the semiconductor sensor.
Figure 3 is a schematic diagram illustrating an example of semiconductor detector module according to another exemplary embodiment. In this example, the semiconductor detector module sensor part (A) is split into pixels (B) where each sensor pixel is constituted by a diode. In this case the semiconductor sensor part is also split into so-called depth segments in the depth direction, again assuming the x- rays (C) enter through the edge (D).
The semiconductor sensors may also be used as so called Multi Chip Modules in the sense that they are used as base substrates for electric routing and for a number of Application Specific Integrated Circuits (ASICs) which are attached preferably through so called flip-chip technique. The routing will include a connection for the signal from each pixel to the ASIC input as well as connections from the ASIC to external memory and/or digital data processing. Power to the ASICs may be provided through similar routing taking into account the increase in cross-section which is required for the large currents in these connections, but the power may also be provided through a separate connection. The ASICS are positioned on the side of the active sensor and this means it can be protected from the incident x-rays if an absorbing cover is placed on top and it can also be protected from scattered x-rays from the side by positioning an absorber also in this direction. This may be important since x-rays may harm the ASICs and cause errors both in short and long term, mainly through charge up of oxide layers in the ASIC.
In a preferred exemplary embodiment, the ASICs are Silicon-based and manufactured through Complementary Metal Oxide Semiconductor (CMOS) technology.
Figure 4 is a schematic diagram illustrating a semiconductor detector module implemented as a multi chip module according to an exemplary embodiment. This example shows how the semiconductor sensor also can have the function of substrate (A) in a Multi Chip Module (MCM). The signal is routed (B) from the pixels (C) to inputs of parallel processing integrated circuits (e.g. ASICs) (D) which are positioned next to the active sensor area. It should be understood that the term Application Specific Integrated Circuit (ASIC) is to be interpreted broadly as any general integrated circuit used and configured for a specific application. The ASICs process the electric charge generated from each x-ray and converts it to digital data which can be used to estimate the energy. The ASICs are configured for connection a digital data processing circuitry so the digital data may be sent to further digital data processing (E) and memories located outside of the MCM and finally the data will be the input to the reconstructed image.
In the ASICs the signal from each x-ray is measured and the deposited energy by each x-ray is estimated. The measured energy of each x-ray will be used to increase the contrast of desired elements in the image. To achieve this, energy information will be used to separate electronic noise from x-rays which Compton scatters in the semiconductor sensor from x-rays which react through photo effect. The information will preferably be weighted together to maximize the contrast for desired elements and structures in the object. There will also be some energy information from the measurement of the depth of interaction for the x-ray, which is performed since may keep track of which depth segment the x-ray converted. This is particularly important for the Compton scattered x-rays in the detector since for these x-rays the energy will be more uncertain since only a part of the original energy was deposited in the semiconductor sensor.
For smaller pixels it may be necessary to take into account charge sharing between pixels which, if not corrected for, will deteriorate the information for these events since one event will otherwise be mistaken for two events with lower energy.
The combination of the ASIC electronics and semiconductor sensors should ideally have a non-paralyzable dead time short enough to keep up with high flux of x-rays and avoid so called pile-up which means that two events will be mistaken for one event with the combined energy of the two contributing events. The dead time can be corrected for in order not to create artifacts in the image but will mean a loss of image quality and should be kept as low as possible. It is possible to discriminate the pile-up events with an energy exceeding the maximum energy of the incident x-rays since this is physically impossible.
Figure 5 is a schematic diagram illustrating an example of how several semiconductor detector modules can be positioned next to each other in order to build a whole x-ray detector. In this particular example, several Multi Chip Modules (MCMs) (A) according to Figure 4 are positioned next to each other in order to build a whole x-ray detector. The MCMs are interfolded by sheets of a heavy element (such as Tungsten) (B) in order to absorb x-rays which were Compton scattered in the semiconductor sensors (C) or in the object (D), these x-rays would otherwise contribute to the noise in the image.
Figure 6 is a schematic diagram illustrating an example of a semiconductor detector module according to another exemplary embodiment of the invention. This example illustrates a Multi Chip Module (A) where the ASICs (B) are spread out over the area of the sensor in order to minimize capacitance to the input of the ASICs. Capacitance increases the electronic noise which may have an unfavorable impact on image quality. Spreading out the ASICs over the semiconductor sensor means that the routing length, which is proportional to the capacitance, can be much shorter. The drawback with this arrangement is that the ASICs will be exposed to direct x-ray radiation (C) which may be harmful and also that the ASICs will take space and make impossible a very dense packing unless they are made very thin. It is even conceivable that the ASICs are merged to one large ASIC covering a larger part of the sensor or the whole semiconductor sensor. It should thus be understood that it is possible to employ implementations, where the semiconductor detector module only has a single integrated circuit.
Figure 7 is a schematic diagram illustrating different examples of how semiconductor detector modules can be positioned next to each other with anti-scatter sheets positioned in-between detector modules. In this example it is indicated that several detector modules such as Multi Chip Modules (A) are positioned next to each other as in Figure 5 with the sheets made of heavy material (B). The sheets may be positioned between every MCM as indicated to the left, or between for example every third as indicated to the right, depending on what optimizes the signal to noise level.
Figure 8 is a schematic diagram illustrating an example of how semiconductor detector modules can be segmented in depth; in the direction of incoming x-rays. This example illustrates semiconductor detector modules (A) with shield (B) and with depth segmentation with a top (C) and bottom (D) segment. To the left the semiconductor detector module is aligned relative to the incoming x-rays from the source. To the right the semiconductor detector module is misaligned relative to x- rays from the source. Mechanical alignment may be a challenge for long semiconductor detectors and misalignment may cause artifacts in the image since parts of the semiconductor sensor area may be shadowed by the interfolding heavy material sheets. A volume of the detector module which becomes shadowed (E) is indicated to the right. By segmenting the semiconductor detector module in depth this can be measured and corrected for. The expected ratio of detected x-rays in the top and bottom segments is reasonably well known for any object and x-ray imaging set-up. This knowledge can be used to normalize the measured ratio and this will efficiently suppress any artifacts.
For example, the length of the depth segments is chosen so that the count rate in the segment counting most x-rays is less than a factor 10 higher compared to the depth segment counting the median number of x-ray photons compared to the other segments.
The length of the depth segments may also be chosen so that the count rate in the segment counting least x-rays is less than a factor 10 less compared to the depth segment counting the median number of x-ray photons compared to the other segments.
Figure 9 is a schematic diagram illustrating an example of how the integrated circuits of a semiconductor detector module can be protected from ionizing radiation. The ASICs may be sensitive to ionizing radiation such as x-rays (A) and in this example it is shown how they can be very efficiently shielded by adding absorbers made of heavy material (B), such as Tungsten or Copper, between the irradiated volume and the said ASICs. The shielding material will thus protect the ASICs from radiation from above (A) and scattered from the side (C). The heavy material sheet (D) which is inserted primarily to absorb scattered x-rays in the semiconductor detectors and in the object will also serve as a radiation protection for the ASICs. As previously mentioned, to prevent x-rays which are Compton scattered in the semiconductor sensors to reach other semiconductor sensors a foil of x-ray absorbing material is interfolded between at least some of the detector modules. The foils should preferably be made in a heavy material with high atomic number such as Tungsten.
It has also been recognized that a particularly beneficial example implementation of the overall detector involves arrangement of the semiconductor detector modules in a number of levels, where the number of levels is equal to or greater than 2. The levels are also referred to as layers, and the overall detector structure is thus referred to as a layered detector, with the different layers arranged substantially in the direction of incoming x-rays.
For example, with two layers of semiconductor detector modules, a first set of detector modules are arranged in an upper layer and a second set of detector modules are arranged in a lower layer.
Preferably, detector modules of one of the layers are staggered (displaced) with respect to detector modules of another one of the layers in order to achieve an efficient geometrical coverage of active detector area and/or efficient resolution. Normally, the detector modules of one of the layers are arranged with a predetermined offset, in a direction substantially orthogonal to incoming x-rays, with respect to the detector modules of another layer to enable an efficient active detector area.
Figures lOa-c are different schematic views illustrating an example of the mechanical arrangement of semiconductor detector modules in two layers or levels (B) to allow for seamless tiling of the semiconductor detector modules. This example shows mechanical arrangement of detector modules such as MCMs (A) in two levels (B) to allow for seamless tiling of the semiconductor sensors. Also a magnified view is displayed both from two views. The space (C) between detector modules (e.g. MCMs) allows for efficient cooling of the ASICs which may consume significant power. Thermal expansion is accounted for since each MCM is attached separately and the expansion does not add up which would be the case if they were positioned in direct contact with each other side by side. The mechanical arrangement according to the figure also leaves room for connections for data transfer and for power. It also facilitates easy mounting and accurate alignment.
Although there is spacing between detector modules in any individual layer or level, the detector modules of the overall layered Silicon detector will be arranged or tiled with a minimum dead detector area in both directions orthogonal to incident x-rays.
The semiconductor detector modules are put in a mechanical jig/frame according to Figure lOa-c where each semiconductor detector module including sensor is arranged for pointing back to the x-ray source which should also be true for the individual pixels in the semiconductor sensor of the detector module.
In a preferred example, the staggered multi (two or more) level arrangement provides means for the jig/frame to hold and precisely position each semiconductor detector module including the active sensor while maximum geometrical coverage of active detector area for the incident x-rays is enabled. Furthermore space for the ASICs and read-out electronics is provided. An example of a suitable mechanical frame for semiconductor detector modules is illustrated in Figure 1Od. Precision alignment features (dotted areas in Figure 1Od) for each semiconductor detector module (including sensor), preferably of kinematic type, is formed in the mechanical jig/frame. The semiconductor detector modules (including sensors) are held/secured/locked against these alignment features by holding arrangements/features (A), preferably of a resilient type. It must be emphasized that the solution shown in Figure 1Od is merely an example of a feasible solution. Anyway, an arrangement where the precision alignment of the semiconductor sensors is provided by the mechanical jig/frame ensures that all semiconductor sensors are held in a precisely known position and that said sensors individual tolerances does not add-up throughout the structure ruining their alignment. Still another advantage of the proposed multilevel arrangement is that only the eventual non active layers on the semiconductor detector modules (scatter shield, routing layer, passivation layer, etc.) on the top level need to be positioned in the x-ray beam, hence the geometric coverage of the active detector area can be increased even more.
Moreover thermal expansion of the jig/frame material itself in this arrangement do not need to be matched to the thermal expansion of the sensor material (here silicon) which means it can be made in a standard material such as Aluminum which can be easily processed to the desired shape and is readily available. The assembly also allows for efficient air cooling of the ASICs and MCMs when air is forced / blown through the space between the MCMs as a large surface area for heat transfer between the air and MCMs is present. The MCMs themselves functions as cooling fins.
Figure 11 is a schematic diagram illustrating an example of how a full detector can be constructed in two halves and assembled together seamlessly in order to build a wider detector. This example shows that a full detector can be constructed in two halves (A) and assembled together seamlessly in order to build a wider detector as indicated also in a magnified view. This would increase cost and also the amount of scattered radiation from the object would increase which will increase noise. It may still be desirable though since a wider detector decreases image acquisition time which is important in imaging of moving objects such as the human heart.
In order to increase spatial resolution the individual semiconductor sensors can be displaced relative to each other in the direction 90 degrees to the scan direction as indicated in Figure 12. Figure 12 is a schematic diagram illustrating examples of how semiconductor detector modules can be displaced relative to each other to optimize spatial resolution. In order to optimize spatial resolution for a scanned detector the mechanical arrangement of the semiconductor detectors orthogonal to scan direction may be displaced relative to each other with a known fraction (A) of the actual pixel size (B) of the semiconductor sensor. The figure shows two examples of this; one with every pixel is displaced with 1/3 (C) relative to adjacent detector pixel, one example with displacement of 1/5 (D). More generally, the offset may be between half a pixel and one tenth of a pixel.
The assembled detector according to above may be used for Computed Tomography but also for other imaging applications such as security screening and non-destructive testing.
Another embodiment of the invention places the ASICs on top of the semiconductor sensors, this arrangement would cut the required area for the MCM. Moreover, and more importantly it would cut the input capacitance to the ASIC which increases the performance and decreases the noise which is beneficial for image quality. The main challenge with this arrangement is that the ASICs will be exposed to the radiation which may create malfunctioning both in short and long term, this may however be mitigated with special design processes for the ASIC. A problem is also that in this configuration the ASICs will shadow the Semiconductor sensors positioned below and x-rays absorbed in the ASIC will only contribute to the dose and not to the image quality. This absorption may also cause artifacts in the image.
The embodiments described above are to be understood as a few illustrative examples of the present invention. It will be understood by those skilled in the art that various modifications, combinations and changes may be made to the embodiments without departing from the scope of the present invention. In particular, different part solutions in the different embodiments can be combined in other configurations, where technically possible. The scope of the present invention is, however, defined by the appended claims.
REFERENCES
US7471765 "Cone Beam Computed Tomography With A Flat Panel Imager" (radiotherapy)
US4785186 "Amorphous Silicon Ionizing Particle Detectors" (Xerox)
Bόrje Norlin, "Characterisation and application of photon counting X-ray detector systems" Mid Sweden University Doctoral Thesis 26, ISSN 1652-893X, ISBN 978-91- 85317-55-4 Electronics Design Division, in the Department of Information Technology and Media Mid Sweden University, SE-851 70 Sundsvall, Sweden
M. G. Bisogni, A. Del Guerra, N. Lanconelli, A. Lauria, G. Mettivier, M. C. Montesi, D. Panetta, R. Pani, M. G. Quattrocchi, P. Randaccio, V. Rosso and P. Russo "Experimental study of beam hardening artifacts in photon counting breast computed tomography" Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Volume 581, Issues 1-2, 21 October 2007, Pages 94-98
V. Rosso, N. Belcari, M. G. Bisogni, C. Carpentieri, A. Del Guerra, P. Delogu, G. Mettivier, M. C. Montesi, D. Panetta, M. Quattrocchi, P. Russo and A. Stefanini "Preliminary study of the advantages of X-ray energy selection in CT imaging" Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Volume 572, Issue 1, 1 March 2007, Pages 270-273
M. Danielsson, H. Bomefalk, B. Cederstrόm, V. Chmill, B. Hasegawa, M. Lundqvist, D. Nygren and T. Tabar, "Dose-efficient system for digital mammography", Proc. SPIE, Physics of Medical Imaging, vol. 3977, pp. 239-249 San Diego, 2000
R. Nowotny "Application Of Si-Microstrip-Detectors In Medicine And Structural Analysis" Nuclear Instruments and Methods in Physics Research 226 (1984) 34-39
Shoichi Yoshida, Takashi Ohsugi "Application of silicon strip detectors to X-ray computed tomography" Nuclear Instruments and Methods in Physics Research A 541 (2005) 412-420
US5889313 Sherwood Parker "Three dimensional architecture for solid state radiation detectors" 1999
US4937453 Robert Nelson "X-ray detector for radiographic imaging" (edge-on) US5434417 David Nygren "High resolution energy-sensitive digital X-ray " US2004/0251419 patent application, Robert Nelson

Claims

1) A Silicon detector for x-ray imaging of an object, wherein said detector is based on multiple semiconductor detector modules arranged together to form an overall detector area, each semiconductor detector module comprising an x-ray sensor of crystalline Silicon oriented edge-on to incoming x-rays and connected to integrated circuitry for registration of x-rays interacting in said x- ray sensor through the photoelectric effect and through Compton scattering and for an incident x-ray energy between 40 keV and 250 keV providing the spatial and energy information from these interactions to enable an image of said object, wherein anti-scatter modules are interfolded between at least a subset of said semiconductor detector modules to at least partly absorb Compton scattered x-rays.
2) The Silicon detector of claim 1, wherein said anti-scatter modules are arranged to at least partly absorb Compton scattered x-rays from said object and at least partly prevent Compton scattered x-rays in a semiconductor detector module to reach another semiconductor detector module.
3) The Silicon detector of claim 1 or 2, wherein each of said anti-scatter modules includes a foil made of an elemental composition with an average atomic number exceeding 25 and a thickness less than 200 μm to prevent most of the Compton scattered x-rays in a semiconductor detector module to reach an adjacent detector module.
4) The Silicon detector of claim 1, wherein said anti-scatter modules are interfolded between every detector module, every second detector module, every third detector module or any number of detector modules per interfolding foil less than 10, depending on desired signal to noise level.
5) The Silicon detector of claim 1, wherein said integrated circuitry is configured to enable energy of each x-ray to be deduced based on the combined information of deposited energy in the corresponding x-ray sensor and the depth of interaction of the x-ray.
6) The Silicon detector of claim 1, wherein each of said semiconductor detector modules is implemented as a Multi Chip Module (MCM), and said integrated circuitry comprises at least two integrated circuits, and said integrated circuits are flip-chip mounted.
7) The Silicon detector of claim 6, wherein said integrated circuits are configured to process electrical charge generated from each x-ray to convert the charge into digital data, and said integrated circuitry is configured for connection to image processing circuitry for reconstruction of said image of said object.
8) The Silicon detector of claim 1, wherein said x-ray sensor is divided into a plurality of pixels in a direction orthogonal to the depth direction, assuming that x-rays enter through the edge of the x-ray sensor.
9) The Silicon detector of claim 1 or 8, wherein said semiconductor detector modules are sub-divided into at least two depth segments to make it feasible to handle high rates of incoming x-rays.
10)The Silicon detector of claim 9, wherein the length of the depth segments is chosen so that the count rate in the segment counting most x-rays is less than a factor 10 higher compared to the depth segment counting the median number of x-ray photons compared to the other segments.
11) The Silicon detector of claim 9, wherein the length of the depth segments is chosen so that the count rate in the segment counting least x-rays is less than a factor 10 less compared to the depth segment counting the median number of x-ray photons compared to the other segments.
12)The Silicon detector of claim 9, wherein each of said sub-segments is connected to means for measuring the energy deposition for each x-ray interaction.
13)The Silicon detector of claim 9, wherein data processing circuitry is configured for calculating an improved energy estimate for any incident x-ray based on combining the energy as measured by the integrated circuitry with knowledge of in which depth segment the interaction took place. 14)The Silicon detector of claim 9, wherein data processing circuitry is configured for summing together events in several depth segments for the overall pixel data. 15)The Silicon detector of claim 9, wherein data processing circuitry is configured for comparing the count rate in upper and lower depth segments to an expected ratio for any x-ray energy and using the result to correct for alignment errors. 16)The Silicon detector of claim 1, wherein said semiconductor detector modules are arranged in a number of layers, where the number of layers is equal to or greater than 2. 17)The Silicon detector of claim 16, wherein said layers are arranged to obtain a layered Silicon detector in the direction of incoming x-rays. 18)The Silicon detector of claim 16 or 17, wherein a first set of said detector modules are arranged in an upper layer and a second set of said detector modules are arranged in a lower layer. 19)The Silicon detector of claim 16 or 17, wherein the detector modules of one of said layers are staggered with respect to the detector modules of another one of said layers to enable an efficient active detector area. 20)The Silicon detector of claim 19, wherein the detector modules of one of said layers are arranged with a predetermined offset, in a direction substantially orthogonal to incoming x-rays, with respect to the detector modules of another one of said layers. 21)The Silicon detector of claim 19 or 20, wherein detector modules of an individual layer are arranged with spacing between each other to allow for thermal expansion and cooling and electric connections. 22)The Silicon detector of claim 21, wherein said semiconductor detector modules are arranged in a mechanical frame, where each semiconductor detector module including sensor are arranged for pointing back to an intended x-ray source, and precision alignment features are provided in the mechanical frame for each semiconductor detector module to hold and precisely position each semiconductor detector module while a maximum geometrical coverage of active detector area for incoming x-rays is enabled.
23)The Silicon detector module of claim 22, wherein the semiconductor detector modules are secured in relation to the precision alignment features by corresponding holding features.
24)The Silicon detector of claim 1, wherein said semiconductor detector modules are arranged in association with shielding material in such a way that the integrated circuitry is shielded from incident x-rays.
25)The Silicon detector of claim 1, wherein said semiconductor detector modules are arranged in association with said anti-scatter modules in such a way that the integrated circuitry is shielded from x-rays scattered in the silicon detector.
26)The Silicon detector of claim I1 wherein said semiconductor detector modules are arranged in such a way that tiling of detector modules with a minimum dead area is allowed in both directions orthogonal to incident x-rays.
27)The Silicon detector of claim I1 wherein said Silicon detector is configured for scanning relative to the object, and said semiconductor detector modules are arranged in such a way that they are offset relative to each other by a known fraction of the pixel size in a direction orthogonal to a scanning direction of the Silicon detector.
PCT/SE2010/050106 2009-02-11 2010-02-01 Silicon detector assembly for x-ray imaging WO2010093314A1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN201080007458.XA CN102224434B (en) 2009-02-11 2010-02-01 Silicon detector assembly for x-ray imaging
JP2011550091A JP5717652B2 (en) 2009-02-11 2010-02-01 Photon counting silicon detector
DE112010000797.7T DE112010000797B4 (en) 2009-02-11 2010-02-01 Silicon detector arrangement for X-ray imaging
GB1112331.2A GB2480561B (en) 2009-02-11 2010-02-01 Silicon detector assembly for x-ray imaging
KR1020117020100A KR101716911B1 (en) 2009-02-11 2010-02-01 Silicon detector assembly for X-ray imaging

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US15163709P 2009-02-11 2009-02-11
US61/151,637 2009-02-11
US12/488,930 2009-06-22
US12/488,930 US8183535B2 (en) 2009-02-11 2009-06-22 Silicon detector assembly for X-ray imaging

Publications (1)

Publication Number Publication Date
WO2010093314A1 true WO2010093314A1 (en) 2010-08-19

Family

ID=42541111

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/SE2010/050106 WO2010093314A1 (en) 2009-02-11 2010-02-01 Silicon detector assembly for x-ray imaging

Country Status (7)

Country Link
US (1) US8183535B2 (en)
JP (1) JP5717652B2 (en)
KR (1) KR101716911B1 (en)
CN (1) CN102224434B (en)
DE (1) DE112010000797B4 (en)
GB (1) GB2480561B (en)
WO (1) WO2010093314A1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017052431A1 (en) * 2015-09-23 2017-03-30 Prismatic Sensors Ab Determining the orientation of an edge-on x-ray detector with respect to the direction of incoming x-rays
WO2018203800A1 (en) * 2017-05-05 2018-11-08 Prismatic Sensors Ab Radiation hard silicon detectors for x-ray imaging
US10271803B2 (en) 2015-11-12 2019-04-30 Prismatic Sensors Ab High-resolution computed tomography using edge-on detectors with temporally offset depth-segments
US10468383B2 (en) 2015-01-16 2019-11-05 Makoto Shizukuishi Semiconductor device and manufacturing method thereof

Families Citing this family (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10371834B2 (en) * 2012-05-31 2019-08-06 Minnesota Imaging And Engineering Llc Detector systems for integrated radiation imaging
US10067239B2 (en) 2012-05-31 2018-09-04 Minnesota Imaging And Engineering Llc Detector systems for radiation imaging
US10088580B2 (en) 2012-05-31 2018-10-02 Minnesota Imaging And Engineering Llc Detector systems for radiation imaging
JP6241888B2 (en) * 2012-06-07 2017-12-06 国立大学法人静岡大学 Radiation dosimeter and radiation dose calculation method
KR101378757B1 (en) 2012-08-30 2014-03-27 한국원자력연구원 Radiation imaging equipment and method available to obtain element date of material and select dimensions of image
US9076563B2 (en) * 2013-06-03 2015-07-07 Zhengrong Ying Anti-scatter collimators for detector systems of multi-slice X-ray computed tomography systems
US9488739B2 (en) 2013-12-18 2016-11-08 The Board Of Trustees Of The Leland Stanford Junior University Spectral imaging system and method
WO2016093140A1 (en) 2014-12-09 2016-06-16 雫石　誠 Imaging device
JP5970641B2 (en) * 2014-12-09 2016-08-17 雫石　誠 Imaging device
WO2016106348A1 (en) * 2014-12-22 2016-06-30 Rensselaer Polytechinic Institute Novel spectral ct systems and methods
US9545236B2 (en) * 2015-01-23 2017-01-17 Toshiba Medical Systems Corporation Method for scanogram scans in photon-counting computed tomography
US10393917B2 (en) * 2015-03-26 2019-08-27 Halliburton Energy Services, Inc. Cement evaluation with X-ray tomography
EP3314307B1 (en) * 2015-06-26 2023-11-29 Prismatic Sensors AB Scatter estimation and/or correction in x-ray imaging
JP6753659B2 (en) 2015-09-18 2020-09-09 キヤノンメディカルシステムズ株式会社 Radiation detector and medical diagnostic imaging equipment
CN108780158A (en) * 2015-09-24 2018-11-09 棱镜传感器公司 Modular x-ray detector
US9841514B2 (en) * 2015-09-24 2017-12-12 Prismatic Sensors Ab X-ray detector arrangement
JP6583855B2 (en) * 2015-11-25 2019-10-02 国立大学法人静岡大学 Radiation detector
US10182194B2 (en) 2016-02-19 2019-01-15 Karim S. Karim Method and apparatus for improved detective quantum efficiency in an X-ray detector
US10338012B2 (en) * 2016-03-09 2019-07-02 Toshiba Medical Systems Corporation Photon counting detector and X-ray computed tomography (CT) apparatus
JP6201095B1 (en) * 2016-04-27 2017-09-20 雫石　誠 Imaging module and imaging apparatus
WO2017209662A1 (en) 2016-05-30 2017-12-07 Prismatic Sensors Ab X-ray imaging for enabling assessment of scoliosis
JP6776024B2 (en) * 2016-06-30 2020-10-28 キヤノンメディカルシステムズ株式会社 X-ray detector, X-ray detector module, support member and X-ray CT device
JP7035012B2 (en) * 2016-08-11 2022-03-14 プリズマティック、センサーズ、アクチボラグ X-ray detector with low dose efficiency in the surrounding area
US10575801B2 (en) * 2016-08-11 2020-03-03 Prismatic Sensors Ab Photon counting detector
US10274610B2 (en) 2016-09-09 2019-04-30 Minnesota Imaging And Engineering Llc Structured detectors and detector systems for radiation imaging
US10365383B2 (en) 2016-09-09 2019-07-30 Minnesota Imaging And Engineering Llc Structured detectors and detector systems for radiation imaging
US10509135B2 (en) 2016-09-09 2019-12-17 Minnesota Imaging And Engineering Llc Structured detectors and detector systems for radiation imaging
KR101866947B1 (en) * 2016-12-09 2018-06-14 한국원자력연구원 Radiation transmission image apparatus removable image noise by compton scattering and method for removing image noise by compton scattering
KR102621507B1 (en) 2016-12-16 2024-01-05 프리스매틱 센서즈 에이비 Reproduction of conventional computed tomography images from spectral computed tomography data
US10398394B2 (en) * 2017-01-06 2019-09-03 General Electric Company Energy-discriminating photon-counting detector and the use thereof
US10575800B2 (en) * 2017-03-08 2020-03-03 Prismatic Sensors Ab Increased spatial resolution for photon-counting edge-on x-ray detectors
US10422887B2 (en) * 2017-04-06 2019-09-24 Prismatic Sensors Ab Photon-counting x-ray detector system having an adaptive anti-coincidence system
US10126437B1 (en) * 2017-05-15 2018-11-13 Prismatic Sensors Ab Detector for x-ray imaging
US10610191B2 (en) * 2017-07-06 2020-04-07 Prismatic Sensors Ab Managing geometric misalignment in x-ray imaging systems
EP3444826A1 (en) * 2017-08-14 2019-02-20 Koninklijke Philips N.V. Low profile anti scatter and anti charge sharing grid for photon counting computed tomography
US11054532B2 (en) * 2018-06-13 2021-07-06 Prismatic Sensors Ab X-ray detector system design
JP7293334B2 (en) * 2018-08-07 2023-06-19 シーメンス メディカル ソリューションズ ユーエスエー インコーポレイテッド Nearly 2π Compton camera for medical imaging
CN112512424B (en) * 2018-08-07 2023-07-04 美国西门子医疗系统股份有限公司 Multi-modality compton and single photon emission computed tomography medical imaging system
CN112639531A (en) 2018-09-07 2021-04-09 深圳帧观德芯科技有限公司 Radiation detection device
WO2020085214A1 (en) * 2018-10-25 2020-04-30 株式会社 東芝 Photon-counting type radiation detector and radiation examination device using same
JP7193631B2 (en) 2018-11-19 2022-12-20 プリズマティック、センサーズ、アクチボラグ X-ray imaging system for phase-contrast imaging using photon counting events
JP7179177B2 (en) * 2018-11-19 2022-11-28 プリズマティック、センサーズ、アクチボラグ Edge-on photon counting detector
WO2020106198A1 (en) 2018-11-19 2020-05-28 Prismatic Sensors Ab A method and a system for enabling estimation of an initial point of interaction of an x-ray photon in a photon-counting x-ray detector
US10898159B2 (en) 2019-01-11 2021-01-26 General Electric Company X-ray imaging system use and calibration
CN109633733B (en) * 2019-01-25 2022-06-10 成都理工大学 Digital anti-Compton energy spectrum measuring system adopting particle event reading mode
DE102019202442A1 (en) * 2019-02-22 2020-08-27 Bruker Axs Gmbh Measurement arrangement for X-rays for a gap-free 1D measurement
US11521309B2 (en) 2019-05-30 2022-12-06 Bruker Nano, Inc. Method and apparatus for rapid inspection of subcomponents of manufactured component
US20220057534A1 (en) * 2020-08-18 2022-02-24 Prismatic Sensors Ab Methods and systems for coincidence detection in x-ray detectors
JP2023544482A (en) 2020-08-18 2023-10-24 プリズマティック、センサーズ、アクチボラグ Method and system for coincidence detection in an X-ray detector
US11647973B2 (en) * 2021-05-04 2023-05-16 Siemens Medical Solutions Usa, Inc. Three-dimensional tileable gamma ray detector
CN113432699B (en) * 2021-05-26 2022-04-01 中国科学院高能物理研究所 Amplitude measuring device of ultralight beam
CN113471232B (en) * 2021-05-31 2024-01-26 核芯光电科技(山东)有限公司 Detection device based on deep silicon detector module
EP4329623A1 (en) * 2021-11-24 2024-03-06 Shanghai United Imaging Healthcare Co., Ltd. Detector systems for imaging
US20230363728A1 (en) 2022-05-13 2023-11-16 GE Precision Healthcare LLC Collimator assembly for an x-ray detector

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4025427A1 (en) * 1990-08-10 1992-02-13 Siemens Ag X=ray detector formed from semiconductor wafer - has silicon detector elements with separating gaps and electrodes for collecting charge formed by perpendicular incidence radiation
US5434417A (en) * 1993-11-05 1995-07-18 The Regents Of The University Of California High resolution energy-sensitive digital X-ray
DE19618465C1 (en) * 1996-05-08 1997-06-05 Siemens Ag Radiation detector array for X=ray or gamma radiation
US5821540A (en) * 1995-04-12 1998-10-13 Seiko Instruments, Inc. Semiconductor radiation-detecting device
WO2000068710A2 (en) * 1999-05-10 2000-11-16 Lippens Francois Energy-selective x-ray radiation detection system
US20020017609A1 (en) * 1999-03-10 2002-02-14 Mats Danielsson Method and apparatus for detecting X-rays
US20020018543A1 (en) * 1999-03-15 2002-02-14 Mats Danielsson Device and method related to X-ray imaging

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU386361A1 (en) * 1970-10-23 1973-06-14 GODOSCOPE DETECTORS FOR REGISTRATION
SU754341A1 (en) * 1978-07-31 1980-08-07 Uk Selskokhoz Akademiya Method of registerinf x-ray radiation
JPS6078376A (en) * 1983-10-05 1985-05-04 Matsushita Electric Ind Co Ltd Radiation detector
JPS6114590A (en) * 1984-06-30 1986-01-22 Shimadzu Corp Semiconductor radiation detector
US4785186A (en) 1986-10-21 1988-11-15 Xerox Corporation Amorphous silicon ionizing particle detectors
US4937453A (en) 1987-05-06 1990-06-26 Nelson Robert S X-ray detector for radiographic imaging
JPH02259590A (en) * 1989-03-31 1990-10-22 Shimadzu Corp Radiation detecting device
JPH0678376U (en) * 1993-04-20 1994-11-04 株式会社日立ビルシステムサービス Elevator car
JP3309618B2 (en) * 1995-01-11 2002-07-29 株式会社日立製作所 X-ray CT system
US5889313A (en) 1996-02-08 1999-03-30 University Of Hawaii Three-dimensional architecture for solid state radiation detectors
US6169287B1 (en) * 1997-03-10 2001-01-02 William K. Warburton X-ray detector method and apparatus for obtaining spatial, energy, and/or timing information using signals from neighboring electrodes in an electrode array
WO2001060236A2 (en) 2000-02-18 2001-08-23 William Beaumont Hospital Cone-beam computerized tomography with a flat-panel imager
JP2002257937A (en) 2001-03-02 2002-09-11 Reitekku:Kk Semiconductor radiation detector
EP1543350A1 (en) * 2002-09-18 2005-06-22 Koninklijke Philips Electronics N.V. Radiation detector
EP1852716A3 (en) * 2002-10-07 2007-11-14 Hitachi, Ltd. Radiation detector, radiation detector element, and radiation imaging apparatus
US7291841B2 (en) 2003-06-16 2007-11-06 Robert Sigurd Nelson Device and system for enhanced SPECT, PET, and Compton scatter imaging in nuclear medicine
US7342233B2 (en) * 2005-11-18 2008-03-11 Sectra Mamea Ab Method and arrangement relating to x-ray imaging
US7208739B1 (en) * 2005-11-30 2007-04-24 General Electric Company Method and apparatus for correction of pileup and charge sharing in x-ray images with energy resolution
JP4139905B2 (en) * 2005-12-16 2008-08-27 大学共同利用機関法人自然科学研究機構 Radiation discrimination detector
US7525098B2 (en) * 2006-04-05 2009-04-28 Orbotech Ltd. High resolution energy detector
JP4834467B2 (en) * 2006-06-15 2011-12-14 株式会社日立製作所 Printed circuit board mounting structure and nuclear medicine diagnostic apparatus
RU2445647C2 (en) * 2006-11-17 2012-03-20 Конинклейке Филипс Электроникс Н.В. Radiation detector with multiple electrodes on sensitive layer
JP2008268038A (en) * 2007-04-23 2008-11-06 Hitachi Ltd Semiconductor radiation detector and industrial x-ray ct apparatus
WO2009058092A1 (en) * 2007-11-01 2009-05-07 Sectra Mamea Ab X-ray detector

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4025427A1 (en) * 1990-08-10 1992-02-13 Siemens Ag X=ray detector formed from semiconductor wafer - has silicon detector elements with separating gaps and electrodes for collecting charge formed by perpendicular incidence radiation
US5434417A (en) * 1993-11-05 1995-07-18 The Regents Of The University Of California High resolution energy-sensitive digital X-ray
US5821540A (en) * 1995-04-12 1998-10-13 Seiko Instruments, Inc. Semiconductor radiation-detecting device
DE19618465C1 (en) * 1996-05-08 1997-06-05 Siemens Ag Radiation detector array for X=ray or gamma radiation
US20020017609A1 (en) * 1999-03-10 2002-02-14 Mats Danielsson Method and apparatus for detecting X-rays
US20020018543A1 (en) * 1999-03-15 2002-02-14 Mats Danielsson Device and method related to X-ray imaging
WO2000068710A2 (en) * 1999-05-10 2000-11-16 Lippens Francois Energy-selective x-ray radiation detection system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
BEUVILLE, E. ET AL.: "High Resolution X-ray Imaging using a Silicon Strip Detector", IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 45, no. 6, 6 December 1998 (1998-12-06), pages 3059 - 3063, XP011041443 *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10468383B2 (en) 2015-01-16 2019-11-05 Makoto Shizukuishi Semiconductor device and manufacturing method thereof
US11024606B2 (en) 2015-01-16 2021-06-01 Makoto Shizukuishi Semiconductor device and manufacturing method thereof
WO2017052431A1 (en) * 2015-09-23 2017-03-30 Prismatic Sensors Ab Determining the orientation of an edge-on x-ray detector with respect to the direction of incoming x-rays
US9903958B2 (en) 2015-09-23 2018-02-27 Prismatic Sensors Ab Obtaining measurement information from an edge-on X-ray detector and determining the orientation of an edge-on X-ray detector with respect to the direction of incoming X-rays
KR20180057615A (en) * 2015-09-23 2018-05-30 프리스매틱 센서즈 에이비 Determination of the orientation of an edge-on x-ray detector with respect to the direction of the incident x-ray
KR102417791B1 (en) 2015-09-23 2022-07-06 프리스매틱 센서즈 에이비 Determining the orientation of an edge-on x-ray detector with respect to the direction of incoming x-rays
US10271803B2 (en) 2015-11-12 2019-04-30 Prismatic Sensors Ab High-resolution computed tomography using edge-on detectors with temporally offset depth-segments
WO2018203800A1 (en) * 2017-05-05 2018-11-08 Prismatic Sensors Ab Radiation hard silicon detectors for x-ray imaging
US10191162B2 (en) 2017-05-05 2019-01-29 Prismatic Sensors Ab Radiation hard silicon detectors for x-ray imaging

Also Published As

Publication number Publication date
GB2480561A (en) 2011-11-23
US20100204942A1 (en) 2010-08-12
US8183535B2 (en) 2012-05-22
GB2480561B (en) 2013-08-21
JP2012517604A (en) 2012-08-02
JP5717652B2 (en) 2015-05-13
GB201112331D0 (en) 2011-08-31
DE112010000797B4 (en) 2020-02-27
KR20110126645A (en) 2011-11-23
CN102224434B (en) 2014-02-19
DE112010000797T5 (en) 2012-07-12
KR101716911B1 (en) 2017-03-15
CN102224434A (en) 2011-10-19

Similar Documents

Publication Publication Date Title
US8183535B2 (en) Silicon detector assembly for X-ray imaging
EP2347285B1 (en) Device for detecting highly energetic photons
CN101138502B (en) Tileable multi-layer detector
US8513613B2 (en) Radiation detector with several conversion layers
US20100116999A1 (en) High Resolution Imaging System
JP6251683B2 (en) Radiation detection apparatus, radiation detection method, and imaging system
JP7127066B2 (en) Detector for X-ray imaging
WO2001056451A2 (en) Simultaneous ct and spect tomography using czt detectors
Eisen et al. CdTe and CdZnTe X-ray and gamma-ray detectors for imaging systems
US11054532B2 (en) X-ray detector system design
US11147522B2 (en) Photon counting detector and x-ray computed tomography apparatus
US9841514B2 (en) X-ray detector arrangement
EP4229449A1 (en) Combined imaging detector and imaging system
Russo et al. Solid-state detectors for small-animal imaging
Iwanczyk et al. Optimization of room-temperature semiconductor detectors for energy-resolved x-ray imaging
Abbaszadeh et al. Direct conversion semiconductor detectors for radiation imaging
Abdalla Pixel detectors and electronics for high energy radiation imaging
Clajus et al. A new four-side abuttable ASIC for high-resolution multi-energy CT imaging detector arrays

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 201080007458.X

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 10741477

Country of ref document: EP

Kind code of ref document: A1

DPE1 Request for preliminary examination filed after expiration of 19th month from priority date (pct application filed from 20040101)
ENP Entry into the national phase

Ref document number: 1112331

Country of ref document: GB

Kind code of ref document: A

Free format text: PCT FILING DATE = 20100201

WWE Wipo information: entry into national phase

Ref document number: 1112331.2

Country of ref document: GB

WWE Wipo information: entry into national phase

Ref document number: 2011550091

Country of ref document: JP

WWE Wipo information: entry into national phase

Ref document number: 1120100007977

Country of ref document: DE

Ref document number: 112010000797

Country of ref document: DE

ENP Entry into the national phase

Ref document number: 20117020100

Country of ref document: KR

Kind code of ref document: A

122 Ep: pct application non-entry in european phase

Ref document number: 10741477

Country of ref document: EP

Kind code of ref document: A1