WO2010088617A1 - Procédé et appareil permettant de produire une carte topologique de surface haute résolution à l'aide d'instruments d'établissement de profil et d'arpentage de surface - Google Patents

Procédé et appareil permettant de produire une carte topologique de surface haute résolution à l'aide d'instruments d'établissement de profil et d'arpentage de surface Download PDF

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Publication number
WO2010088617A1
WO2010088617A1 PCT/US2010/022761 US2010022761W WO2010088617A1 WO 2010088617 A1 WO2010088617 A1 WO 2010088617A1 US 2010022761 W US2010022761 W US 2010022761W WO 2010088617 A1 WO2010088617 A1 WO 2010088617A1
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Prior art keywords
sample points
survey
profile
survey sample
profiling
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PCT/US2010/022761
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English (en)
Inventor
Dennis P. Scott
Dwight D. Day
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Surface Systems & Instruments, LLC
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Publication date
Priority claimed from US12/409,329 external-priority patent/US8352189B2/en
Application filed by Surface Systems & Instruments, LLC filed Critical Surface Systems & Instruments, LLC
Publication of WO2010088617A1 publication Critical patent/WO2010088617A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects
    • G06T17/05—Geographic models

Definitions

  • This invention pertains to a method for generating high resolution surface topology maps, and more particularly, to a method for generating high resolution surface topology maps using surface profiling data combined with data collected from a land surveying instrument, such as either a total station or a Global Positioning System with Real Time Kinemetic (RTK) surveying device, such as a Carrier-Phase Enhancement GPS System (CPGPS) using a single reference station or a Virtual Reference Station (VRS) using a group of networked reference stations.
  • RTK Real Time Kinemetic
  • CPGPS Carrier-Phase Enhancement GPS System
  • VRS Virtual Reference Station
  • Land surveying instruments are used to generate three-dimensional topography maps of surfaces at grade for use in civil engineering and construction projects.
  • a total station is an optical instrument used in modern surveying.
  • a total station system includes a base station equipped with a computer, a laser, and an optical receiver.
  • the total station is designed to work in cooperation with a prism, which is moved to various points on the surface to be mapped. During operation, the prism is moved from point to point within the area to be surveyed. At each point, the laser transmits a signal from the base station to the prism, which reflects the signal back to the optical receiver at the base station.
  • the computer at the base station calculates the X, Y and Z coordinate of the location of the prism.
  • the X and Y coordinates are calculated by the round-trip travel time of the laser.
  • the Z coordinate is determined by the angle of the return laser signal.
  • RTK Real Time Kinematic
  • GPS Global Positioning System
  • a static base GPS unit is used in cooperation with a roving GPS unit.
  • the static base GPS unit accurately measure its position relative to one or more GPS satellites or a Virtual Reference System (VRS), which is a group of networked base stations located in the general vicinity of the area to be surveyed. In either case, the static base unit measures atmospheric and other disturbances that may cause positional errors.
  • VRS Virtual Reference System
  • the static base station transmits a corrections factor signal to the roving GPS unit, which compensates for any measured atmospheric or positional errors.
  • the roving GPS unit moves across the surface to be mapped, sampling and measuring the X, Y and Z coordinate of multiple points within the survey area.
  • the correction factor signal from the static base GPS unit is then applied to the measured X, Y and Z coordinate of each sample point, correcting for any inaccuracies due to atmospheric and other disturbances.
  • the compensated X, Y and Z coordinate for the sampled points are therefore more accurate than if the correction factor was not applied.
  • GPS and VRS systems have inability to function in areas of overhead cover (wooded areas, urban areas, inside buildings, etc.), where clear access to the GPS satellite is either partially or fully blocked.
  • inertial profiling systems are increasingly popular devices used for quality assurance and quality control purposes.
  • the most common use of inertial profilers is to test the surface ride quality or "smoothness" of the top layer of asphalt or concrete pavement on road surfacing construction projects.
  • Transportation agencies also commonly use inertial profiling systems for pavement management and maintenance applications. Roads are periodically analyzed for condition assessment and for making decisions with regard to rehabilitating or resurfacing of the roadway.
  • the profile of a surface generated by an inertial profiling system is a relative profile, not an absolute or true profile.
  • Inertial profilers generate only a two- dimensional surface profile along a longitudinal surface in the X and Y dimensions, along the path traveled by the profiler.
  • Inertial profiling systems do not generate a true profile since they do not record absolute elevation readings in the Z dimension, as do RTK or total stations surveying instruments.
  • an inertial profiling system can accurately detect the changes in the surface profile contour between points A and B on a given road surface, they cannot detect the absolute change in elevation from point A to point B.
  • Inertial profiling systems are typically vehicle mounted devices generally consisting of laser sensors for measuring vertical displacement from a fixed point on the vehicle to the ground underneath, accelerometer sensors to measure the vertical acceleration of the vehicle, and a distance measurement interface to record the vehicle's longitudinal movement in the direction of travel.
  • Commercially available inertial profiling systems typically have a very high degree of resolution.
  • Many commercially available profilers are capable of acquiring valid samples at one-inch (25 mm) increments along the traveled surface and can detect changes in surface profile conditions on the order of 0.00 i inches.
  • Inertial profiling systems can collect data samples at one inch (25 mm) at speeds up to 70 mile per hour (1 12 kilometers per hour).
  • both total stations and RTK surveying devices have a lower resolution than inertial profiling systems if only relative profile data is considered, but those devices have a much higher resolution in capturing the Z dimension necessary to generate an absolute or true profile. While the resolution of both total stations and RTK surveying devices is sufficient for some applications, the resolution of these devices alone is not adequate or optimal for other applications, such as high tolerance surface design, construction project progress monitoring, or precision machine control, where a highly accurate and more resolute surface topology is desirable.
  • a method for generating high-resolution surface topology measurements using surface profiling data combined with data collected from a surveying instrument such as either a total station or a Real Time Kinematic (RTK) surveying device, including either a total station RTK surveying device used with either GPS or VRS, is needed.
  • a surveying instrument such as either a total station or a Real Time Kinematic (RTK) surveying device, including either a total station RTK surveying device used with either GPS or VRS.
  • the present invention is directed to a method for generating a high-resolution surface topology map of a surface using surface profiling data combined with data collected from a surveying instrument.
  • the method involves collecting a plurality of survey sample points and collecting a plurality of profile sample points of the surface.
  • the profile sample points are then correlated with the survey sample points in the Z direction. Once the correlation is performed, the correlated profile sample points are merged or "filled-in" between the survey sample points.
  • the high-resolution surface topology map is generated from the merging of the survey and profile sample points.
  • the survey data may be generated using an profiler, an inclinometer based walking device, or a rolling-reference type profile device.
  • Figure 1 is a diagram of a high-resolution surface topology measurement system using an inertial profiler and a total stations surveying instrument according to one embodiment of the present invention.
  • Figure 2A is a diagram of a high-resolution surface topology measurement system using an inertial profiler and a RTK surveying instrument used in cooperation with GPS according to another embodiment of the present invention.
  • Figure 2B is a diagram of a high-resolution surface topology measurement system using an inertial profiler and a RTK surveying instrument used in cooperation with a Virtual Reference System (VRS) according to another embodiment of the present invention
  • VRS Virtual Reference System
  • Figure 3 is a diagram illustrating the computing hardware for generating high- resolution surface topology maps using data from both an inertial profiler and either a total stations or RTK surveying instrument used by the system of the present invention.
  • Figure 4 is a flow diagram illustrating the algorithm implemented by the computing hardware to generate the high-resolution surface topology maps using inertial profiler and survey sample points according to the present invention.
  • Figure 5 is a plot illustrating unprocessed inertial profile sample points and survey instrument data samples collected during a single longitudinal run using the system of the present invention.
  • Figure 6 is a plot illustrating inertial profile sample points of a multiple longitudinal runs adjusted to match the survey instrument data samples collected using the system of the present invention.
  • Figure 7 is a high-resolution surface topology map created using the system of the present invention.
  • Figure 8 is a surface topology created using only conventional surveying equipment.
  • Figure 9 is a diagram illustrating a number of uses or applications of the high resolution surface topology maps generated by the present invention
  • Figure 10 is flow chart illustrating a sequence for using the high resolution surface topology maps.
  • the present invention is directed to a high-resolution surface topology measurement apparatus and method that uses data collected from both an inertial profiling system and a surveying instrument, such as either a total stations system or an RTK system that uses either GPS or VRS.
  • a surveying instrument such as either a total stations system or an RTK system that uses either GPS or VRS.
  • the "gaps" between the survey instrument sample points can be "filled-in” with the finer or higher resolution inertial profiler sample points.
  • the inertial data points are then mathematically height-correlated with the true elevation readings from survey instrument.
  • FIG. 1 is a diagram of a high-resolution surface topology measurement system 10 including a total stations surveying instrument 12 and an inertial profiler 14 according to one embodiment of the present invention.
  • the system 10 is being used to generate a high-resolution topology map of a surface 16.
  • the surface 16 is illustrated as flat.
  • the total stations instrument 12 is a conventional survey instrument that includes a computer, laser and optical receiver, as is well known in the art.
  • the inertial profiler 14 includes all the standard instrumentations known in the art used for generating inertial profile data, such as a distance measuring device (DMI), an accelerometer which generates a signal commensurate with the up/down movements or vertical acceleration of the host vehicle as it travels along the surface terrain being measured, and a laser range finder that measures the vertical offset between the inertial profiler 14 relative to the surface.
  • DMI distance measuring device
  • an accelerometer which generates a signal commensurate with the up/down movements or vertical acceleration of the host vehicle as it travels along the surface terrain being measured
  • a laser range finder that measures the vertical offset between the inertial profiler 14 relative to the surface.
  • the system 10 further includes a prism 18 located on the roving initial profiler 14 and radio transceivers 20 and 22 provided on the total station 12 and the profiler 14 respectively.
  • the profiler 14 may generate the inertial profile data as it roves across the surface 16.
  • the total stations 12 uses the prism 18 on the roving profiler 14 to measure and compute survey data points.
  • the roving inertial profiler traverses back and forth across the surface 16, as indicated by the dashed lines in the figure, collecting the inertial profile data points.
  • the survey data points are determined at the total stations instrument 12 and are transmitted in substantially real-time back to the inertial profiler 14 using transceivers 20 and 22 respectively.
  • the collection of sample points from the total station 12 and inertial profiler 14 system are then reconciled by computing hardware located on the roving inertial profiler, as described in more detail below.
  • the risk of errors or inaccuracies that can occur with alterative post processing methods is minimized.
  • a highly detailed topology map of the surface 16 is generated, as described in more detail below.
  • FIG. 2A a diagram of a high-resolution surface topology measurement system 30A using an inertial profiler and a RTK surveying instrument using GPS according to another embodiment of the present invention is shown.
  • the RTK surveying instrument includes a conventional static base GPS unit 32 and a combination roving inertial profiler and GPS unit 34.
  • the static base GPS unit 32 measures its position relative to one or more GPS satellites 36, and generates a corrections factor signal, which compensates for atmospheric and other disturbances that may cause positional errors.
  • the static base GPS unit 32 locks-in and accurately determines its position, it transmits the corrections factor signal to the combination roving inertial profiler and GPS unit 34.
  • the onboard GPS unit samples and measures the X, Y and Z coordinate of multiple survey points on the surface 16.
  • the correction factor signal from the static base GPS unit 32 is then applied to the measured X, Y and Z coordinate of each sample survey point, correcting for any inaccuracies due to atmospheric and other disturbances.
  • the inertial profiler on the roving unit 34 also generates highly accurate inertial profile data points. Since the survey points and the inertial profile points are generated at the same time and both on the roving unit 34, the two sets of data points are readily reconciled, minimizing the risk of errors or inaccuracies that can occur with post processing methods.
  • the roving unit 34 traverses back and forth across the surface 16, as indicated by the dashed lines in the figure, collecting both the survey data points and the inertial profile data points. This information is subsequently processed in the manner described in detail below, generating a highly detailed topology map of the surface 16.
  • FIG. 2B a diagram of a high-resolution surface topology measurement system 30B using an inertial profiler and a RTK surveying instrument 32 used in cooperation with a Virtual Reference System (VRS) according to another embodiment of the present invention is shown.
  • This embodiment is essentially the same as that described with regard to Figure 2A, except the static base GPS unit 32 measures its position and generates the corrections factor signal relative to one or more networked Virtual Reference Stations (VRS) 38, as opposed to GPS satellites 36. Otherwise the operation of the two systems 30A and 30B are substantially identical, with the roving unit 34 collecting both inertial profile data points and multiple survey points, which are adjusted by the corrections factor signal.
  • VRS Virtual Reference System
  • the RTK surveying instrument 32 is a Carrier-Phase Enhancement GPS System (CPGPS) using a single VRS or a group of networked VSRs.
  • CPGPS Carrier-Phase Enhancement GPS System
  • the inertial profiler used in the systems 10, 30A and 30B of Figures 1, 2A and 2B may differ in accordance with various embodiments.
  • these inertial profilers may include multiple laser and accelerometers sensors installed on the host vehicle.
  • the multiple lasers and sensors are arranged in a dual track system, which is capable of simultaneously generating inertial profile measurements along two longitudinal tracks on the surface to be measured.
  • the measured inertial profile data points of the first track may be matched with the survey points collected over the same longitudinal path.
  • an inclinometer or tilt-sensor may be added to the roving host unit to detect deviations in any cross- slope or transverse movements of the vehicle.
  • the inertial profiling system may be configured with a line scan of lasers or a laser imaging system to collect inertial profile samples from a wider transverse area of the surface 16, as opposed to one or more narrow longitudinal runs as illustrated in Figures 1, 2A and 2B.
  • the increased number of collected data points from the transverse image may be useful to generate even more detailed surface topology maps than otherwise possible using just longitudinal profile data.
  • the computing hardware 40 includes a processor 42, memory 44, a file storage system 46, and an optional display 48 and printer 50.
  • the processor 42 is configured to receive inertial profile inputs from one or more lasers 52, one or more accelerometers 54, an optional tilt sensor 56, and a Distance Measuring Instrument (DMI) 58.
  • the processor is also configured to receive survey data points 60 from a surveying instrument, either a total station 12 or RTK device 32.
  • the inertial profile sample points are computed by the processor from the inputs from the laser(s) 52, accelerometer(s) 54, the DMI 58 and the optional tilt sensor 56, which is typically used with two or more accelerometer/laser pairs located on opposing or different locations on the roving inertial profile unit.
  • the processor 42 also reconciles the inertial profile data points with the incoming survey data points. Once the two data sets are reconciled, the processor generates the topology map of the measured surface.
  • the memory 44 is a general-purpose memory used by the processor to temporarily store computational data. Once the topology map is generated, it is permanently stored in the file storage system 46, until it is deleted or transferred to another storage location.
  • the display 48 and the printer 50 are provided for displaying and printing the topology maps.
  • the computing hardware 40 resides either on or remote from the roving inertial profiler.
  • the computing hardware may reside on a portable computer, such as a Panasonic Toughbook laptop computer, that can be installed on the roving inertial profiler during use and then later removed.
  • a flow diagram 70 illustrating the algorithm implemented by the computing hardware 40 to generate the high-resolution surface topology maps according to the present invention is illustrated. In the initial steps 72 and 74, the survey sample and the inertial profile sample points are respectively taken as the roving inertial profiler moves across the surface to be mapped.
  • each survey sample is indexed to the corresponding inertial profile sample (step 76).
  • Table I provided below, the first few feet of the survey samples indexed relative to the inertial profile samples generated during an exemplary run is shown.
  • the survey data points are provided in sequential order.
  • the indexed inertial profile point that matches to the corresponding survey point is provided.
  • an optional status indicator sent provided by the GPS system to the RTK base-station In this example, a status of "4", indicates a valid correction factor is being used. In total station embodiments where a correction factor signal is not used, the status indicator provided in column 3 is not needed.
  • the numbers provided in the last three columns are the latitude, longitude and elevation of the survey sample respectively.
  • the inertial profile points are sampled every inch.
  • the first survey point is indexed with the 10 th inertial profile sample or the 10 -vth inch.
  • the second survey point is indexed with the 43 ,r r d inertial profile sample point or the 43 rd inch and so forth for the remainder of the survey sample points.
  • the inertial profile data on the other hand is sampled and saved as a sequence, with each sample being one inch (25 mm) apart.
  • a correction factor is computed between the latitude, longitude and height reading for each survey point relative to its indexed inertial profile sample (step 78).
  • the correction factor is computed by constructing a model of the difference between the two measurements that is a function of distance. In other words, a model of the drift between the inertial and the survey reading is built as a function of distance.
  • the model of the inertial profiler' s drift is created by taking the reading from the survey sample points in groups of N, and then computing the difference between the survey sample point elevations and the corresponding inertial profile elevation readings.
  • the first survey point reading shows an elevation of 338.23999 meters as provided in the first row, last column of Table I, while the corresponding indexed profiler elevation at sample 10 of Table II is 0.044912788 meters.
  • the difference between the indexed survey and inertial profile elevations (i.e., the drift numbers or values) for the first four survey samples are shown in Table in below.
  • the height reading of the 43 rd sample profile point is subtracted from the elevation reading of the second survey sample. This subtraction process is continually repeated for all of the remaining survey points. As a result, a corrections factor is computed for each collected survey point (step 78). It should be noted that the height readings for the 43 rd , 78 th and 114 th profile points are not listed in Table II for the sake of brevity, but are actual readings of the profile run used for this example.
  • a drift model between the survey points and the corresponding or indexed inertial profile data points is constructed.
  • any type of equation fitting process could be employed to create an equation that relates drift to distance.
  • a common way to develop such a model is to create a matrix that represents the various weights of the distances, such as the Vandermonde matrix as provided in Table IV.
  • the first row corresponds to the first survey point, which is indexed to the 10th inertial profile reading.
  • the Moore-Penrose inverse of the above Vandermonde matrix is used in order to determine the equation for the drift model.
  • the Moore-Penrose is a well-known operation that finds a least-square solution to an over-determined set of equations.
  • a correction for drift versus distance is then computed (step 84) for the first inertial profile height reading, based on the correction model developed in the previous step and the corresponding index of that reading.
  • the correction is then added (step 85) to the profile height reading to create a corrected reading. For example, the correction for the fourth profile sample, which has a height reading of
  • the inertial survey point is then incremented (step 86).
  • the steps 84 and 85 are repeated, resulting the calculation of the drift versus distance and height correction or each inertial profile point.
  • a new model with a different set of four values of (N) is created.
  • the new set of values for N is defined for the next pass. For example, if the initial values for N were survey points 1 through 4 for the first pass, then the next set of survey points is 2 through 5 for the second pass.
  • drift is computed (step 80), a new Vandermonde matrix is generated for survey points 2 through 5 as shown in Table VII below, and the Moore- Penrose inverse matrix performed (step 82).
  • step 90 the process increments to the next set of survey points (i.e., 3 through 6) in step 90, and the aforementioned process is repeated.
  • the steps 80 through 90 are repeated, over and over, until the last survey point is reached (step 92).
  • the algorithm is complete, resulting in the high-resolution surface topology map.
  • FIG. 5 a plot illustrating unprocessed inertial profile samples and survey instrument samples collected during a single longitudinal run using the system of the present invention is shown.
  • the inertial profile samples are designated by solid dots "•”, whereas the survey sample points are represented by the "X" markings.
  • the inertial profile and survey sample points are "indexed" with respect to one another by distance, as described above with regard to step 76 of Figure 4.
  • the inertial profile and survey sample points may also be indexed by time or both distance and time.
  • the survey samples X are more accurate than the profile samples from a global (i.e., a height or in the Z direction) perspective, whereas the inertial profile samples are more accurate on a point-to-point basis.
  • the survey sample points may be generated by either a total stations instrument 12 or RTK instrument 32.
  • the inertial profile sample points may be either adjusted or not adjusted to compensate for cross slope deviations or traverse movements of the roving inertial profiler
  • Figure 6 is a plot illustrating inertial profile sample points of a multiple longitudinal runs adjusted to match the survey instrument data samples collected using the system of the present invention.
  • the "X" markings show the original GPS samples along each of the longitudinal runs.
  • the corrected inertial profile samples are shown by the solid lines running between the individual X marks after the inertial sample points are processed as described above with regard to Figure 4.
  • Figure 7 is a high-resolution surface topology map created using the system of the present invention.
  • the topography map is of an actual 400 feet x 400 feet parking lot surface as measured by an inertial profiling system with an RTK system used in cooperation with either GPS or a VRS, as illustrated in Figures 2A or 2B for example.
  • Figure 8 is a surface topology of the same 400 feet x 400 feet parking lot created using only conventional surveying equipment.
  • the topology map was created from 198 survey sample points or shots taken over a span of approximately 3 hours. As evident by comparing the two surface maps, the system of the present invention generates a denser, more accurate surface topology than is possible with conventional surveying instruments alone.
  • Figure 9 illustrates a number of uses or applications the high-resolution surface topology maps of the present invention may be used for in the construction industry.
  • the systems 10, 30A and 30B enables a more thorough and accurate surface topography mapping in less time than traditional surveying techniques, it offers a number of opportunities in the construction industry.
  • the higher resolution data is not only collected faster, but also has a higher data or sampling point density, and generates more accurate data files than conventional surveying instruments.
  • the higher quality data results in significantly improved surface topology maps.
  • the denser, more accurate maps may be used to improve the results of a wide range of construction project applications across several disciplines, including construction project bid preparation, estimating and proposal submission, project or site design, site preparation, construction project progress and evaluation, project design, and construction project planning.
  • Figure 10 illustrates a flow chart illustrating a sequence for using the high- resolution surface topology maps to improve the quality of surface preparation according to the present invention.
  • the high-resolution surface topology map of the construction site is generated.
  • construction machinery such as milling machines, pavers and/or concrete grinders are placed at the construction site.
  • the high-resolution surface topology map is used in the finite control of movements of construction machinery, e.g., milling machines, pavers and/or concrete grinders.
  • the systems 10, 30A and 30B may be with a wide variety of other types of surface profiling systems, such as reference profiling devices or walking profilers. Most walking profiler devices are inclinometer-based systems that measure the surface profile as the instrument is moved along a test surface.
  • Such instruments are commonly used for shorter surface data collections, such as airport runways or floor surfaces in commercial construction (factories, warehouses, etc.)
  • These walking profilers typically use an inclinometer and optical encoders as the core sensors to measure surface profiles at a walking speed.
  • the inclinometer and encoder based data collection allows measurement of absolute elevation changes, such that the device can generate a "true profile" with XYZ dimensional data content.
  • the accuracy of the elevation component of the true profile can be impacted by several variables, including sensor drift, measurement error, vibration induced by coarse surface texture or an excessive operating speed on rough surfaces.
  • the integration of the profile data from the walking profiler with the data from survey instruments may be used for the correction of measurement errors or other variables in the data collection.
  • walking profiler device can generate a denser, more accurate surface topography map, using essentially the same algorithm as described above with respect to Figure 4, for merging the data from the walking profiler with a survey instrument.
  • model number CS 8800 designed and sold by Surface Systems and Instruments, LLC, Mill Valley California, assignee of the present application.

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Abstract

L'invention concerne un procédé permettant de générer une carte topologique de surface haute résolution à l'aide de données d'établissement de profil de surface recueillies à partir d'un instrument d'arpentage. Le système et le procédé consistent à collecter une pluralité de points échantillons de levé sur le terrain et à collecter une pluralité de points échantillons de profil de la surface. Les points échantillons de profil sont ensuite corrélés aux points échantillons de levé sur le terrain dans le sens Z. Une fois la corrélation terminée, les points échantillons de profil corrélés sont fusionnés ou « remplis » entre les points échantillons de levé de terrain. La carte topologique de surface haute résolution est produite à partir de la fusion des points échantillons de levé de terrain et de profil. Dans plusieurs modes de réalisation, les données de levé de terrain peuvent être produites à l'aide d'un instrument d'établissement de profil à inertie, d'un dispositif de marche à base de clinomètre ou d'un profileur de type à référence de roulis.
PCT/US2010/022761 2009-02-02 2010-02-01 Procédé et appareil permettant de produire une carte topologique de surface haute résolution à l'aide d'instruments d'établissement de profil et d'arpentage de surface WO2010088617A1 (fr)

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Application Number Priority Date Filing Date Title
US14922709P 2009-02-02 2009-02-02
US61/149,227 2009-02-02
US12/409,329 US8352189B2 (en) 2009-02-02 2009-03-23 Method for generating high resolution surface topology map using surface profiling and surveying instrumentation
US12/409,317 2009-03-23
US12/409,329 2009-03-23
US12/409,317 US8352188B2 (en) 2009-02-02 2009-03-23 Apparatus for generating high resolution surface topology map using surface profiling and surveying instrumentation

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US10921137B2 (en) 2017-07-10 2021-02-16 Audi Ag Data generation method for generating and updating a topological map for at least one room of at least one building

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US20030135328A1 (en) * 2001-03-14 2003-07-17 Witten Technologies, Inc. Method for merging position information with measurements and filtering to obtain high-quality images that are positioned accurately with respect to global coordinates
US20050010379A1 (en) * 2003-07-08 2005-01-13 Meiners Robert E. System and method of sub-surface system design and installation

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030135328A1 (en) * 2001-03-14 2003-07-17 Witten Technologies, Inc. Method for merging position information with measurements and filtering to obtain high-quality images that are positioned accurately with respect to global coordinates
US20050010379A1 (en) * 2003-07-08 2005-01-13 Meiners Robert E. System and method of sub-surface system design and installation

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10921137B2 (en) 2017-07-10 2021-02-16 Audi Ag Data generation method for generating and updating a topological map for at least one room of at least one building

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