WO2010040257A1 - In situ particle measuring device - Google Patents

In situ particle measuring device Download PDF

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Publication number
WO2010040257A1
WO2010040257A1 PCT/CN2008/072626 CN2008072626W WO2010040257A1 WO 2010040257 A1 WO2010040257 A1 WO 2010040257A1 CN 2008072626 W CN2008072626 W CN 2008072626W WO 2010040257 A1 WO2010040257 A1 WO 2010040257A1
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WO
WIPO (PCT)
Prior art keywords
unit
optical path
light
receiving unit
situ particle
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PCT/CN2008/072626
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French (fr)
Chinese (zh)
Inventor
孔兵
杨宏伟
范顺杰
贺伯特·格里布
蒋俊峰
卓越
Original Assignee
西门子公司
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Application filed by 西门子公司 filed Critical 西门子公司
Priority to PCT/CN2008/072626 priority Critical patent/WO2010040257A1/en
Publication of WO2010040257A1 publication Critical patent/WO2010040257A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N9/00Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
    • G01N9/24Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N15/075

Definitions

  • the present invention relates to particle measuring devices, and more particularly to in-situ particle size distribution measurement and density measuring devices. Background technique
  • U.S. Patent 6,098,862 discloses an in situ microscope apparatus.
  • the particles must be visually separable to the detector of the device and scaled up to obtain a clear image of the particle, which makes the device's measurement area small and only suitable for a limited range of particle density measurements.
  • U.S. Patent No. 4,890,920 discloses an in-situ particle size distribution measuring apparatus based on a light scatter method, the apparatus comprising a light source, a collimator, an optical path, a focusing mirror, and a detector.
  • the scattered light from the particles in such a device is re-scattered by other particles, causing measurement errors, so the optical path of such a device needs to be designed to be shorter to reduce the error; and such a device is not suitable for use in Measure particle density.
  • An in situ particle density probe based on an optical absorbance method comprising a light source, a light gap, and a photodetector is disclosed in US Patent Application No. US20050264817 A1.
  • the absorbance in the light gap is related to the density of the particles and can be measured by a photodetector.
  • This probe can only be used to measure particle density and not to measure particle size distribution. Since the particle density is measured based on the absorbance method, the optical path of such a device is used to measure the particle size distribution as described above.
  • the optical path of U.S. Patent No. 4,890,920 is such that light encounters the particles multiple times as it passes through the optical path.
  • the disadvantages of the above-mentioned U.S. Patent No. 4,890,920 and U.S. Patent Application No. US20050264817 A1 are:
  • optical path is fixed and is not suitable for measuring particle density and measuring particle size distribution in the same device
  • an object of the present invention to provide an in-situ particle measuring apparatus which is suitable for measuring particle size distribution and density.
  • the present invention provides an in-situ particle measuring apparatus for measuring a particle size distribution and density in a solution, comprising an irradiation unit for generating incident light and a receiving unit for receiving the emitted light, the irradiation Forming an optical path between the unit and the receiving unit, the solution to be measured is filled in the optical path, the in-situ particle measuring device further includes a moving unit, and the moving unit is driven into the optical path to form A short path of light that measures the particle size distribution, or is driven out of the path to form a long path for measuring particle density.
  • the moving unit is light transmissive, and the light maintains the original direction of propagation in the moving unit.
  • the length of the short optical path is the sum of the distance from the illumination unit to the mobile unit and the distance from the mobile unit to the receiving unit.
  • the position of the mobile unit between the illumination unit and the reception unit is adjusted such that the distance from the illumination unit to the mobile unit or the distance from the mobile unit to the receiving unit is zero.
  • the in-situ particle measuring device further includes a light emitting unit and a detecting unit, wherein the light emitting unit and the irradiation unit are connected by an optical fiber, and the receiving unit and the detecting unit are connected by a fiber bundle.
  • the illuminating unit, the moving unit and the receiving unit are disposed in one housing to form a probe.
  • the moving unit is fixedly mounted on a rotating shaft, and the rotating shaft is driven to drive the moving unit to move into or out of the optical path.
  • the outer casing of the probe opens a groove corresponding to a position between the irradiation unit and the receiving unit, and the solution to be measured is filled in the optical path through the groove.
  • a light window is disposed at an end of the illumination unit opposite to the receiving unit, and another light window is disposed at an end of the receiving unit opposite to the illumination unit.
  • the in-situ particle measuring apparatus of the present invention conveniently measures the particle size distribution and density by separately applying a light scattering method and an absorbance method by forming optical paths of different lengths.
  • Figure 1 is a schematic view showing the principle of the in-situ particle measuring device of the present invention
  • FIG. 2 is a schematic structural view of an in-situ particle measuring device of the present invention.
  • FIG. 3 is a cross-sectional view showing a structure of a specific embodiment of the in-situ particle measuring device of the present invention, wherein a short light path is formed between the irradiation unit and the receiving unit;
  • Figure 4 is a cross-sectional view showing a structure of a specific embodiment of the in-situ particle measuring device of the present invention, wherein a long light path is formed between the irradiation unit and the receiving unit;
  • Figure 5 is a schematic diagram showing measurement of particle size distribution according to a light scattering method when a short optical path is formed by applying the in-situ particle measuring device of the present invention
  • Fig. 6 is a schematic view showing measurement of particle density by an absorbance method when the in-situ particle measuring apparatus of the present invention is used to form a short optical path and a long optical path, respectively. detailed description
  • the in-situ particle measuring apparatus of the present invention measures the size distribution and density of particles by forming light paths of different lengths, respectively, using a light scattering method and an absorbance method.
  • the in-situ particle measuring apparatus 100 of the present invention includes a light emitting unit 110 , an illuminating unit 130 , a receiving unit 150 , and a detecting unit 170 .
  • the light emitting unit 110 and the illuminating unit 130 are connected by an optical fiber 120 , and the illuminating unit 130 .
  • An optical path 140 is formed with the receiving unit 150.
  • the optical path 140 is filled with a sample solution of a particle size distribution and density to be measured, and the receiving unit 150 and the detecting unit 170 are connected by a fiber bundle 160.
  • the light emitting unit further includes a laser diode 111 and a coupling lens 112, and the illumination unit 130 further includes a calibration lens 131.
  • the receiving unit 150 further includes a focus lens 151.
  • the laser diode 111 of the light emitting unit 110 emits light, and the light is coupled into the optical fiber 120 through the coupling lens 112, and transmitted to the illumination unit 130 through the optical fiber 120, in which the illumination unit 130 passes
  • the calibration lens 131 aligns the light into parallel light that propagates in the optical path 140 formed between the illumination unit 130 and the receiving unit 150, and the partially parallel light encounters a sample filled in the optical path 140.
  • the particles in the solution are scattered, and the scattered light and the non-scattered parallel light pass through the sample solution and reach the receiving unit 150.
  • the arriving light is focused by the focusing lens 151, after focusing
  • the light beam is transmitted to the detecting unit 170 through a fiber bundle 160 disposed at one end on the focal plane of the focusing lens 151 and disposed at the other end in the detecting unit 170, the detecting unit 170 according to the focused Light measures the particle size distribution and density of the sample solution.
  • the illuminating unit 130 and the receiving unit 150 are disposed in a casing to form a probe 200.
  • the illuminating unit 130 is connected to the illuminating unit 110 through an optical fiber 120, and the receiving unit 150 passes through an optical fiber.
  • a bundle 160 is coupled to the detection unit 170.
  • the light emitting unit 110 and the detecting unit 170 are connected to the controller 190 to form a control terminal 300.
  • the controller 190 is used to control the opening and closing of the lighting unit 110, and is used to control the measurement of the detecting unit 170.
  • the in-situ particle measuring device of the present invention is characterized in that the length of the optical path 140 is variable, and a short optical path suitable for measuring the particle size distribution of the solution or a length of the particle density suitable for measuring the solution can be formed according to the needs of the measurement. Light path.
  • a light transmitting unit 141 is disposed in the probe 200, and the light can maintain the original propagation direction in the moving unit 141, and the moving unit 141 passes.
  • the cable 142 is connected to a drive unit 180 disposed in the control terminal 300 and connected to the controller 190.
  • the driving unit 180 is configured to drive the moving unit 141 to move into the optical path 140 between the illumination unit 130 and the receiving unit 150, thereby forming a short optical path, and the sum of the distances of the short element 141 to the receiving unit 150
  • the driving unit 180 is further configured to drive the moving unit 141 from the irradiation unit.
  • the optical path 140 between the 130 and the receiving unit 150 is removed to form a long optical path.
  • a groove 210 is formed at a position corresponding to the outer casing of the probe 200 corresponding to the irradiation unit 130 and the receiving unit 150.
  • the solution can be filled by the groove 210 between the irradiation unit 130 and the receiving unit 150 for measurement.
  • the moving unit 141 is selected as an optical brick, and the light can maintain the original propagation direction in the light brick.
  • the moving unit 141 is fixedly mounted on a rotating shaft 143, and the rotating shaft 143 is driven by the driving unit 180.
  • the driving unit 180 is selected as a motor, and the rotating shaft 143 is rotated by the motor to drive the moving unit 141 into the optical path 140 between the illumination unit 130 and the receiving unit 150. Or removed from the optical path 140 between the illumination unit 130 and the receiving unit 150.
  • the optical path 140 at this time is the short optical path 140
  • the length of the short optical path 140 is The sum of the distance from the illuminating unit 130 to the moving unit 141 and the distance between the moving unit 141 and the receiving unit 150, in the present embodiment, preferably, the moving unit 141 is in close proximity to the lighting unit 130, Therefore, the distance from the moving unit 141 to the illuminating unit 130 is zero, thereby preventing scattered light from a certain particle from being scattered again by other particles, thereby improving the accuracy of measurement, in which case the short optical path 140, The length is equal to the distance from the mobile unit 141 to the receiving unit 150.
  • the optical path 140 at this time is a long optical path 140"
  • the length of the long optical path 140" is The distance from the illumination unit 130 to the receiving unit 150.
  • the in-situ particle measuring device of the present invention further provides an optical window 132 at an end of the illumination unit 130 opposite to the receiving unit 150, at the receiving unit.
  • An optical window 152 is disposed at one end of the 150 opposite to the illumination unit 130.
  • the light in the illumination unit 130 is calibrated into parallel rays through the calibration lens 131, and then enters the short light path 140' or the long light path 140" through the light window 132.
  • the light window 152 is passed through the light window 152.
  • the receiving device 150 is entered and focused by the focusing lens 151.
  • the light windows 132, 152 can effectively prevent sample solutions in the optical path from entering the lighting unit 130 and the receiving unit 150.
  • the particle size distribution can be conveniently measured by applying the in-situ particle measuring device of the present invention.
  • the density, and by the movement of the moving unit 141 in the optical path, can effectively remove particles or other contaminants accumulated in the optical path.
  • the particle size distribution is measured by a light scattering method.
  • Parallel rays from the illumination unit 130 propagate in the short optical path 140, and partially parallel rays are scattered by particles of the sample solution filled in the short optical path 140, for larger volume
  • the particles have a smaller angle of scattering, and for larger particles, the angle of scattering is larger, after focusing by the focusing lens 20, on the fiber bundle 160 disposed on the focal plane of the focusing lens 20.
  • the optical density distribution is determined by the particle size distribution in the sample solution in the short optical path 140'.
  • the particle size distribution in the sample solution can be obtained by deconvolving the optical density distribution by using the Fraunhofer diffraction theory for larger particles, and for smaller particles.
  • the optical density distribution is deconvolved using the MIE scattering theory.
  • the particle density is measured by an absorbance method.
  • the absorbance method is obtained by the following Lamberts-Beer law. Description: (Equation 1)
  • /o/ 2 is the light attenuation intensity of the exiting light of the incident light from the illumination unit 130 passing through the sample solution in the long optical path 140" and the short optical path 140', respectively.
  • Equation 4 / and / 2 can be detected by the detection, the absorption coefficient of the sample solution and the optical path lengths ⁇ , 2 are known parameters, so that the particle density C in the sample solution can be conveniently determined. Since the measurement of the particle density using Equation 4 is independent of the intensity of light attenuation after reference or blank solution, the measurement of particle density using the in-situ particle measuring device of the present invention does not require zero correction before each measurement.

Abstract

An in situ particle measuring device, for measuring particle size distribution and density of a solution, includes an irradiation unit (130) for generating an incident ray and a receiving unit (150) for receiving an emission ray. An optical path (140) is provided between the irradiation unit (130) and the receiving unit (150), and the solution to be measured fills in the optical path (140). Said in situ particle measuring device further includes a mobile unit (141)l, which is driven to move in the optical path (140) to form a short optical path (140') for measuring particle size distribution, or is driven to move out the optical path (140) to form a long optical path (140'') for measuring particle density.

Description

原位粒子测量装置 技术领域  In-situ particle measuring device
本发明涉及粒子测量装置, 特别涉及原位(in-situ )粒子大小分布(size distribution )测量和密度测量装置。 背景技术  The present invention relates to particle measuring devices, and more particularly to in-situ particle size distribution measurement and density measuring devices. Background technique
在化学和制药领域中, 对粒子的密度和大小分布的实时测量是非常重要 的; 例如, 在发酵过程中, 微生物的密度会影响生产率; 晶体的粒子密度和 大小决定药物的功效。  In the chemical and pharmaceutical fields, real-time measurement of the density and size distribution of particles is very important; for example, the density of microorganisms affects productivity during fermentation; the density and size of crystals determine the efficacy of the drug.
现有的用来测量粒子密度和大小分布的方法, 如筛分法 (sieving method )、 沉淀法 ( sedimentation method )、 显微镜方法 ( microscopy )等, 通 常需要进行釆样, 从而使得这些方法只适用于离线测量。 这些现有方法的普 遍缺点是耗时费力。  Existing methods for measuring particle density and size distribution, such as sieving method, sedimentation method, microscopy, etc., usually need to be sampled, so that these methods are only applicable to Offline measurement. The general disadvantage of these existing methods is that they are time consuming and labor intensive.
美国专利 US6809862公开了一种原位显微镜设备。粒子对于设备的探测 器必须是视觉上可分离的, 并且被高倍放大以得到清晰的粒子图像, 这使得 设备的测量面积很小, 只适用于有限范围的粒子密度的测量。  U.S. Patent 6,098,862 discloses an in situ microscope apparatus. The particles must be visually separable to the detector of the device and scaled up to obtain a clear image of the particle, which makes the device's measurement area small and only suitable for a limited range of particle density measurements.
现有的原位测量方法, 特别是工业应用的原位感应器, 通常只能用来测 量粒子的密度和大小分布之一者, 同一方法或者设备不适合既用于测量粒子 的密度, 又用于测量粒子的大小分布。  Existing in-situ measurement methods, especially for in-situ sensors for industrial applications, can only be used to measure the density and size distribution of particles. The same method or device is not suitable for measuring both the density of particles and For measuring the size distribution of particles.
美国专利 US4890920公开了一种基于光散射方法( light scatter method ) 的原位粒子大小分布测量设备, 所述设备包括光源、 准直器、 光路、 聚焦镜、 和探测器。 然而, 这种设备中来自粒子的散射光会被其他粒子再散射, 从而 引起测量误差, 因此这种设备的光路需要被设计得较短以减小所述误差; 并 且这种设备不适合用于测量粒子密度。  U.S. Patent No. 4,890,920 discloses an in-situ particle size distribution measuring apparatus based on a light scatter method, the apparatus comprising a light source, a collimator, an optical path, a focusing mirror, and a detector. However, the scattered light from the particles in such a device is re-scattered by other particles, causing measurement errors, so the optical path of such a device needs to be designed to be shorter to reduce the error; and such a device is not suitable for use in Measure particle density.
美国专利申请 US20050264817A1 公开了一种基于吸光度方法(optical absorbance method ) 的原位粒子密度探针, 所述探针包括光源、 光隙、 和光 探测器。 在光隙中的吸光度与粒子的密度相关, 并且能通过光探测器测量。 这种探针只能用于测量粒子密度, 而无法测量粒子大小分布。 由于基于吸光 度方法来测量粒子密度, 这种设备的光路要比前述用于测量粒子大小分布的 美国专利 US4890920的光路长, 从而使得光通过光路时与粒子相遇多次。 上述美国专利 US4890920和美国专利申请 US20050264817A1的缺点在 于: An in situ particle density probe based on an optical absorbance method comprising a light source, a light gap, and a photodetector is disclosed in US Patent Application No. US20050264817 A1. The absorbance in the light gap is related to the density of the particles and can be measured by a photodetector. This probe can only be used to measure particle density and not to measure particle size distribution. Since the particle density is measured based on the absorbance method, the optical path of such a device is used to measure the particle size distribution as described above. The optical path of U.S. Patent No. 4,890,920 is such that light encounters the particles multiple times as it passes through the optical path. The disadvantages of the above-mentioned U.S. Patent No. 4,890,920 and U.S. Patent Application No. US20050264817 A1 are:
1 )光路是固定的,不适合在同一装置中测量粒子密度和测量粒子大小分 布;  1) The optical path is fixed and is not suitable for measuring particle density and measuring particle size distribution in the same device;
2 )在短光路中容易堆积粒子或者其他污染物;  2) It is easy to accumulate particles or other pollutants in short light paths;
3 )在原位粒子密度测量中,在监控流程中很难甚至不可能在每一次测量 之前都通过参考或者空白溶液 ( reference or blank solution )进行零校准( zero calibration )。 发明内容  3) In the in-situ particle density measurement, it is difficult or even impossible to perform zero calibration by reference or blank solution in each monitoring process in the monitoring process. Summary of the invention
有鉴于此, 本发明的目的在于提供一种原位粒子测量装置, 同时适用于 测量粒子大小分布和密度。  In view of the above, it is an object of the present invention to provide an in-situ particle measuring apparatus which is suitable for measuring particle size distribution and density.
为实现上述目的, 本发明提供一种原位粒子测量装置, 用于测量溶液中 的粒子大小分布和密度, 包括用于产生入射光线的照射单元和用于接收出射 光线的接收单元, 所述照射单元与所述接收单元之间形成光路, 待测量的溶 液填充于所述光路中, 所述原位粒子测量装置还包括移动单元, 所述所述移 动单元受驱动移入所述光路中从而形成用于测量粒子大小分布的短光路, 或 者受驱动从所述光路中移出从而形成用于测量粒子密度的长光路。  In order to achieve the above object, the present invention provides an in-situ particle measuring apparatus for measuring a particle size distribution and density in a solution, comprising an irradiation unit for generating incident light and a receiving unit for receiving the emitted light, the irradiation Forming an optical path between the unit and the receiving unit, the solution to be measured is filled in the optical path, the in-situ particle measuring device further includes a moving unit, and the moving unit is driven into the optical path to form A short path of light that measures the particle size distribution, or is driven out of the path to form a long path for measuring particle density.
根据本发明的一个方面, 所述移动单元是透光的, 光线在所述移动单元 中保持原有的传播方向。  According to an aspect of the invention, the moving unit is light transmissive, and the light maintains the original direction of propagation in the moving unit.
根据本发明的一个方面, 所述短光路的长度为所述照射单元至所述移动 单元的距离以及所述移动单元至所述接收单元的距离之和。  According to an aspect of the invention, the length of the short optical path is the sum of the distance from the illumination unit to the mobile unit and the distance from the mobile unit to the receiving unit.
根据本发明的一个方面, 调整所述移动单元在所述照射单元和接收单元 之间的位置使得所述照射单元至所述移动单元的距离或者移动单元至所述接 收单元的距离为零。  According to an aspect of the invention, the position of the mobile unit between the illumination unit and the reception unit is adjusted such that the distance from the illumination unit to the mobile unit or the distance from the mobile unit to the receiving unit is zero.
根据本发明的一个方面, 所述原位粒子测量装置还包括发光单元和探测 单元, 所述发光单元与照射单元之间通过光纤相连, 所述接收单元与所述探 测单元之间通过光纤束相连。  According to an aspect of the invention, the in-situ particle measuring device further includes a light emitting unit and a detecting unit, wherein the light emitting unit and the irradiation unit are connected by an optical fiber, and the receiving unit and the detecting unit are connected by a fiber bundle. .
根据本发明的一个方面, 所述照射单元、 移动单元和接收单元设置在一 个外壳中从而形成探针。 根据本发明的一个方面, 所述移动单元固定安装在转轴上, 驱动所述转 轴转动从而驱动所述移动单元移入所述光路中或者从所述光路中移出。 According to an aspect of the invention, the illuminating unit, the moving unit and the receiving unit are disposed in one housing to form a probe. According to an aspect of the invention, the moving unit is fixedly mounted on a rotating shaft, and the rotating shaft is driven to drive the moving unit to move into or out of the optical path.
根据本发明的一个方面, 所述探针的外壳对应所述照射单元和接收单元 之间的位置开设槽, 所述待测量的溶液通过所述槽填充于所述光路中。  According to an aspect of the invention, the outer casing of the probe opens a groove corresponding to a position between the irradiation unit and the receiving unit, and the solution to be measured is filled in the optical path through the groove.
根据本发明的一个方面, 在所述照射单元上与所述接收单元相对的一端 设置光窗,在所述所述接收单元上与所述照射单元相对的一端设置另一光窗。  According to an aspect of the invention, a light window is disposed at an end of the illumination unit opposite to the receiving unit, and another light window is disposed at an end of the receiving unit opposite to the illumination unit.
本发明原位粒子测量装置通过形成不同长度的光路, 方便地分别应用光 散射方法和吸光度方法来测量粒子的大小分布和密度。 附图说明  The in-situ particle measuring apparatus of the present invention conveniently measures the particle size distribution and density by separately applying a light scattering method and an absorbance method by forming optical paths of different lengths. DRAWINGS
图 1是本发明原位粒子测量装置的原理示意图;  Figure 1 is a schematic view showing the principle of the in-situ particle measuring device of the present invention;
图 2是本发明原位粒子测量装置的结构示意图;  2 is a schematic structural view of an in-situ particle measuring device of the present invention;
图 3是本发明原位粒子测量装置的一个具体实施例的结构剖视图,其中, 照射单元和接收单元之间形成短光路;  3 is a cross-sectional view showing a structure of a specific embodiment of the in-situ particle measuring device of the present invention, wherein a short light path is formed between the irradiation unit and the receiving unit;
图 4是本发明原位粒子测量装置的一个具体实施例的结构剖视图,其中, 照射单元和接收单元之间形成长光路;  Figure 4 is a cross-sectional view showing a structure of a specific embodiment of the in-situ particle measuring device of the present invention, wherein a long light path is formed between the irradiation unit and the receiving unit;
图 5是应用本发明原位粒子测量装置形成短光路时根据光散射方法测量 粒子大小分布的原理图;  Figure 5 is a schematic diagram showing measurement of particle size distribution according to a light scattering method when a short optical path is formed by applying the in-situ particle measuring device of the present invention;
图 6是应用本发明原位粒子测量装置分别形成短光路和长光路时根据吸 光度方法测量粒子密度的原理图。 具体实施方式  Fig. 6 is a schematic view showing measurement of particle density by an absorbance method when the in-situ particle measuring apparatus of the present invention is used to form a short optical path and a long optical path, respectively. detailed description
以下结合图示对本发明进行详细说明。  The invention will be described in detail below with reference to the drawings.
本发明原位粒子测量装置通过形成不同长度的光路, 分别应用光散射方 法和吸光度方法来测量粒子的大小分布和密度。  The in-situ particle measuring apparatus of the present invention measures the size distribution and density of particles by forming light paths of different lengths, respectively, using a light scattering method and an absorbance method.
参见图 1 , 本发明原位粒子测量装置 100 包括发光单元 110、 照射单元 130、 接收单元 150和探测单元 170, 所述发光单元 110与照射单元 130之间 通过光纤 120相连,所述照射单元 130与所述接收单元 150之间形成光路 140 , 光路 140中填充待测量粒子大小分布和密度的样本溶液, 所述接收单元 150 与所述探测单元 170之间通过光纤束 160相连。 所述发光单元进一步包括激 光二极管 111和耦合透镜 112, 所述照射单元 130进一步包括校准透镜 131 , 所述接收单元 150进一步包括聚焦透镜 151。 Referring to FIG. 1 , the in-situ particle measuring apparatus 100 of the present invention includes a light emitting unit 110 , an illuminating unit 130 , a receiving unit 150 , and a detecting unit 170 . The light emitting unit 110 and the illuminating unit 130 are connected by an optical fiber 120 , and the illuminating unit 130 . An optical path 140 is formed with the receiving unit 150. The optical path 140 is filled with a sample solution of a particle size distribution and density to be measured, and the receiving unit 150 and the detecting unit 170 are connected by a fiber bundle 160. The light emitting unit further includes a laser diode 111 and a coupling lens 112, and the illumination unit 130 further includes a calibration lens 131. The receiving unit 150 further includes a focus lens 151.
所述发光单元 110的激光二极管 111发射光线, 光线通过所述耦合透镜 112耦合进所述光纤 120, 并通过所述光纤 120传输至所述照射单元 130, 在 所述照射单元 130中, 通过所述校准透镜 131将光线校准为平行光, 所述平 行光在所述照射单元 130和所述接收单元 150之间形成的光路 140中传播, 部分平行光遇到填充在所述光路 140中的样本溶液中的粒子而发生散射, 散 射光和未发生散射的平行光穿过样本溶液后到达接收单元 150, 在所述接收 单元 150中, 通过所述聚焦透镜 151对到达的光线进行聚焦, 聚焦后的光线 通过一端设置在所述聚焦透镜 151的聚焦平面上、 另一端设置在所述探测单 元 170中的光纤束 160传输至所述的探测单元 170, 所述探测单元 170根据 所述聚焦后的光线测量所述样本溶液的粒子大小分布和密度。  The laser diode 111 of the light emitting unit 110 emits light, and the light is coupled into the optical fiber 120 through the coupling lens 112, and transmitted to the illumination unit 130 through the optical fiber 120, in which the illumination unit 130 passes The calibration lens 131 aligns the light into parallel light that propagates in the optical path 140 formed between the illumination unit 130 and the receiving unit 150, and the partially parallel light encounters a sample filled in the optical path 140. The particles in the solution are scattered, and the scattered light and the non-scattered parallel light pass through the sample solution and reach the receiving unit 150. In the receiving unit 150, the arriving light is focused by the focusing lens 151, after focusing The light beam is transmitted to the detecting unit 170 through a fiber bundle 160 disposed at one end on the focal plane of the focusing lens 151 and disposed at the other end in the detecting unit 170, the detecting unit 170 according to the focused Light measures the particle size distribution and density of the sample solution.
参见图 2, 进一步地, 所述照射单元 130和接收单元 150设置在一个外 壳中从而形成探针 200,所述照射单元 130通过光纤 120与所述发光单元 110 相连, 所述接收单元 150通过光纤束 160与所述探测单元 170相连。 所述发 光单元 110和探测单元 170与控制器 190相连形成控制端 300, 所述控制器 190用来控制所述发光单元 110的开启和关闭, 以及用来控制所述探测单元 170的测量。  Referring to FIG. 2, further, the illuminating unit 130 and the receiving unit 150 are disposed in a casing to form a probe 200. The illuminating unit 130 is connected to the illuminating unit 110 through an optical fiber 120, and the receiving unit 150 passes through an optical fiber. A bundle 160 is coupled to the detection unit 170. The light emitting unit 110 and the detecting unit 170 are connected to the controller 190 to form a control terminal 300. The controller 190 is used to control the opening and closing of the lighting unit 110, and is used to control the measurement of the detecting unit 170.
本发明原位粒子测量装置的特征在于,所述的光路 140的长度是可变的, 可以根据测量的需要形成适合于测量溶液的粒子大小分布的短光路或者适合 于测量溶液的粒子密度的长光路。  The in-situ particle measuring device of the present invention is characterized in that the length of the optical path 140 is variable, and a short optical path suitable for measuring the particle size distribution of the solution or a length of the particle density suitable for measuring the solution can be formed according to the needs of the measurement. Light path.
参见图 2,为了实现长度可变的光路 140,在所述探针 200中设置透光的 移动单元 141 , 光线在所述移动单元 141 中能保持原有的传播方向, 所述移 动单元 141通过电缆 142与设置在控制端 300中并与所述控制器 190相连的 驱动单元 180相连。 所述驱动单元 180用于驱动所述移动单元 141移入所述 照射单元 130和接收单元 150之间的光路 140中, 从而形成短光路, 所述短 元 141至所述接收单元 150的距离之和, 在优选的实施例中, 通过调整所述 移动单元 141在所述照射单元 130和接收单元 150之间的位置使得所述照射 单元 130至所述移动单元 141的距离或者移动单元 141至所述接收单元 150 的距离为零, 从而避免来自某一粒子的散射光被其他粒子再次散射, 提高测 量的准确性; 述驱动单元 180还用于驱动所述移动单元 141从所述照射单元 130和接收单元 150之间的光路 140中移出, 从而形成长光路。 Referring to FIG. 2, in order to realize the optical path 140 having a variable length, a light transmitting unit 141 is disposed in the probe 200, and the light can maintain the original propagation direction in the moving unit 141, and the moving unit 141 passes. The cable 142 is connected to a drive unit 180 disposed in the control terminal 300 and connected to the controller 190. The driving unit 180 is configured to drive the moving unit 141 to move into the optical path 140 between the illumination unit 130 and the receiving unit 150, thereby forming a short optical path, and the sum of the distances of the short element 141 to the receiving unit 150 In a preferred embodiment, by adjusting the position of the moving unit 141 between the illumination unit 130 and the receiving unit 150 such that the distance of the illumination unit 130 to the moving unit 141 or the moving unit 141 to the The distance of the receiving unit 150 is zero, so that the scattered light from a certain particle is prevented from being scattered again by other particles, thereby improving the accuracy of the measurement; the driving unit 180 is further configured to drive the moving unit 141 from the irradiation unit. The optical path 140 between the 130 and the receiving unit 150 is removed to form a long optical path.
同时参见图 3和图 4,在本发明原位粒子测量装置的一个具体实施例中, 在所述探针 200的外壳对应所述照射单元 130和接收单元 150之间的位置开 设槽 210, 样本溶液可以通过所述槽 210填充入所述照射单元 130和接收单 元 150 之间来进行测量。 所述的移动单元 141 在本实施例中选择为光砖 ( optical brick ), 光线在所述光砖中能保持原有的传播方向。 所述移动单元 141固定安装在转轴 143上, 所述转轴 143由所述驱动单元 180进行驱动。 在本实施例中, 所述驱动单元 180选择为电机, 所述转轴 143在所述电机的 驱动下转动, 带动所述移动单元 141移入所述照射单元 130和接收单元 150 之间的光路 140中,或者从所述照射单元 130和接收单元 150之间的光路 140 中移出。  Referring to FIG. 3 and FIG. 4, in a specific embodiment of the in-situ particle measuring device of the present invention, a groove 210 is formed at a position corresponding to the outer casing of the probe 200 corresponding to the irradiation unit 130 and the receiving unit 150. The solution can be filled by the groove 210 between the irradiation unit 130 and the receiving unit 150 for measurement. In the embodiment, the moving unit 141 is selected as an optical brick, and the light can maintain the original propagation direction in the light brick. The moving unit 141 is fixedly mounted on a rotating shaft 143, and the rotating shaft 143 is driven by the driving unit 180. In this embodiment, the driving unit 180 is selected as a motor, and the rotating shaft 143 is rotated by the motor to drive the moving unit 141 into the optical path 140 between the illumination unit 130 and the receiving unit 150. Or removed from the optical path 140 between the illumination unit 130 and the receiving unit 150.
特别参见图 3 , 当所述移动单元 141移入所述照射单元 130和接收单元 150之间的光路 140中时, 此时的光路 140为短光路 140,, 所述短光路 140, 的长度为所述照射单元 130 至所述移动单元 141 的距离以及所述移动单元 141至所述接收单元 150的距离之和, 在本实施例中, 优选使得所述移动单 元 141紧靠所述照明单元 130, 从而使得所述移动单元 141至所述照射单元 130 的距离为零, 从而避免来自某一粒子的散射光被其他粒子再次散射, 提 高测量的准确性,在此情况下,所述短光路 140,的长度等于所述移动单元 141 至所述接收单元 150的距离。  Referring to FIG. 3, when the moving unit 141 is moved into the optical path 140 between the illumination unit 130 and the receiving unit 150, the optical path 140 at this time is the short optical path 140, and the length of the short optical path 140 is The sum of the distance from the illuminating unit 130 to the moving unit 141 and the distance between the moving unit 141 and the receiving unit 150, in the present embodiment, preferably, the moving unit 141 is in close proximity to the lighting unit 130, Therefore, the distance from the moving unit 141 to the illuminating unit 130 is zero, thereby preventing scattered light from a certain particle from being scattered again by other particles, thereby improving the accuracy of measurement, in which case the short optical path 140, The length is equal to the distance from the mobile unit 141 to the receiving unit 150.
特别参见图 4,当所述移动单元 141从所述照射单元 130和接收单元 150 之间的光路 140中移出时,此时的光路 140为长光路 140" ,所述长光路 140" 的长度为所述照射单元 130至所述接收单元 150的距离。  Referring particularly to FIG. 4, when the moving unit 141 is removed from the optical path 140 between the illumination unit 130 and the receiving unit 150, the optical path 140 at this time is a long optical path 140", and the length of the long optical path 140" is The distance from the illumination unit 130 to the receiving unit 150.
同时参见图 3和图 4, 本发明原位粒子测量装置进一步地还在所述照射 单元 130上与所述接收单元 150相对的一端设置光窗( optical window ) 132, 在所述所述接收单元 150上与所述照射单元 130相对的一端设置光窗( optical window ) 152。 所述照射单元 130中的光线经过所述校准透镜 131校准为平 行光线后通过所述光窗 132进入短光路 140'或者长光路 140" ,到达所述接收 装置 150后, 通过所述光窗 152进入所述述接收装置 150并被所述聚焦透镜 151进行聚焦。 所述的光窗 132、 152可以有效地防止光路中的样本溶液进入 所述照明单元 130和接收单元 150中。  Referring to FIG. 3 and FIG. 4, the in-situ particle measuring device of the present invention further provides an optical window 132 at an end of the illumination unit 130 opposite to the receiving unit 150, at the receiving unit. An optical window 152 is disposed at one end of the 150 opposite to the illumination unit 130. The light in the illumination unit 130 is calibrated into parallel rays through the calibration lens 131, and then enters the short light path 140' or the long light path 140" through the light window 132. After reaching the receiving device 150, the light window 152 is passed through the light window 152. The receiving device 150 is entered and focused by the focusing lens 151. The light windows 132, 152 can effectively prevent sample solutions in the optical path from entering the lighting unit 130 and the receiving unit 150.
通过应用本发明原位粒子测量装置便可以很方便地测量粒子大小分布和 密度, 而且通过所述移动单元 141在光路中的移动, 可以有效地清除在光路 中堆积的粒子或者其他污染物。 The particle size distribution can be conveniently measured by applying the in-situ particle measuring device of the present invention. The density, and by the movement of the moving unit 141 in the optical path, can effectively remove particles or other contaminants accumulated in the optical path.
参见图 5, 当本发明原位粒子测量装置形成短光路 140,时, 通过光散射 方法测量粒子大小分布。 来自所述照明单元 130 (图未示) 的平行光线在所 述短光路 140,中传播, 部分平行光线遇到填充在短光路 140,中的样本溶液的 粒子而发生散射, 对于体积较大的粒子, 散射的角度较小, 而对于体积较大 的粒子,散射的角度较大, 经过所述聚焦透镜 20的聚焦后,在设置在所述聚 焦透镜 20的聚焦平面上的光纤束 160上的光密度分布由所述短光路 140'中 的样本溶液中的粒子大小分布决定。 所述样本溶液中的粒子大小分布, 对于 体积较大的粒子, 可以通过应用夫琅和费衍射原理 (Fraunhofer diffraction theory )对光密度分布进行反卷积得到, 对于体积较小的粒子, 可以通过应 用米氏散射原理( MIE scattering theory )对光密度分布进行反卷积得到。  Referring to Fig. 5, when the in-situ particle measuring apparatus of the present invention forms the short optical path 140, the particle size distribution is measured by a light scattering method. Parallel rays from the illumination unit 130 (not shown) propagate in the short optical path 140, and partially parallel rays are scattered by particles of the sample solution filled in the short optical path 140, for larger volume The particles have a smaller angle of scattering, and for larger particles, the angle of scattering is larger, after focusing by the focusing lens 20, on the fiber bundle 160 disposed on the focal plane of the focusing lens 20. The optical density distribution is determined by the particle size distribution in the sample solution in the short optical path 140'. The particle size distribution in the sample solution can be obtained by deconvolving the optical density distribution by using the Fraunhofer diffraction theory for larger particles, and for smaller particles. The optical density distribution is deconvolved using the MIE scattering theory.
参见图 6, 当本发明原位粒子测量装置形成分别形成短光路 140,和长光 路 140"时, 通过吸光度方法测量粒子密度。 吸光度方法通过下述朗伯 -比尔 定律( Lamberts-Beer law )来描述: (方程 1) Referring to Fig. 6, when the in-situ particle measuring apparatus of the present invention forms the short optical path 140 and the long optical path 140, respectively, the particle density is measured by an absorbance method. The absorbance method is obtained by the following Lamberts-Beer law. Description: (Equation 1)
Figure imgf000008_0001
Figure imgf000008_0001
其中, /。是光线通过光路中的参考或者空白溶液(如蒸摺水)后的光衰 减强度 ( attenuated light intensity ), 亦称透射光强度, J是光线通过光路中的 样本溶液的光衰减强度, ^是样本溶液的吸光度, 是样本溶液的吸光系数, C是样本溶液的粒子密度, J是光路长度。  among them, /. Is the attenuated light intensity of the light passing through the reference in the optical path or the blank solution (such as steaming water), also known as the transmitted light intensity, J is the light attenuation intensity of the sample solution passing through the light path, ^ is the sample The absorbance of the solution is the absorption coefficient of the sample solution, C is the particle density of the sample solution, and J is the optical path length.
在现有的基于吸光度的测量方法中,为了减小光源的影响和探测器漂移, 在每次测量之前, 都需要使用参考或者空白溶液进行零校正。 但是, 在原位 测量中, 只在监控流程开始前进行一次零校正, 而在一个较长周期的监控流 程中, 在需要多次测量粒子密度时, 很难甚至不可能在每次测量之前都进行 零校正。  In the existing absorbance-based measurement method, in order to reduce the influence of the light source and the drift of the detector, it is necessary to perform zero correction using a reference or blank solution before each measurement. However, in in-situ measurements, zero calibration is performed only before the monitoring process begins, and in a longer cycle monitoring process, it is difficult or even impossible to measure the particle density multiple times before each measurement. Perform zero correction.
而通过应用本发明原位粒子测量装置形成分别形成短光路 140'和长光路 140"时, 假设所述长光路 140"和短光路 140'的长度分别为 和^ , 根据上 述方程 1 , 分别得到: = KCL, (万程 2) When the in-situ particle measuring device of the present invention is used to form the short optical path 140' and the long optical path 140", respectively, the lengths of the long optical path 140" and the short optical path 140' are respectively assumed to be ^, according to the above equation 1, respectively. : = KCL, (Wancheng 2)
Figure imgf000008_0002
Figure imgf000009_0001
Figure imgf000008_0002
Figure imgf000009_0001
其中, / o /2分别是作为入射光 的来自所述照射单元 130的平行光线通 过所述长光路 140"和短光路 140'中的样本溶液后的出射光的光衰减强度。
Figure imgf000009_0002
Wherein, /o/ 2 is the light attenuation intensity of the exiting light of the incident light from the illumination unit 130 passing through the sample solution in the long optical path 140" and the short optical path 140', respectively.
Figure imgf000009_0002
在上述方程 4 中, /和/2可以通过探测得知, 样本溶液的吸光系数 和 光路长度^、 2是已知参数, 因此便可以方便地求得样本溶液中的粒子密度 C。 由于应用方程 4测量粒子密度与通过参考或者空白溶液后的光衰减强度 无关, 因此应用本发明原位粒子测量装置测量粒子密度无需在每次测量之前 都进行零校正。 In Equation 4 above, / and / 2 can be detected by the detection, the absorption coefficient of the sample solution and the optical path lengths ^, 2 are known parameters, so that the particle density C in the sample solution can be conveniently determined. Since the measurement of the particle density using Equation 4 is independent of the intensity of light attenuation after reference or blank solution, the measurement of particle density using the in-situ particle measuring device of the present invention does not require zero correction before each measurement.
以上所述仅为本发明的较佳实施例而已, 并不用以限制本发明, 凡在本 发明的精神和原则之内, 所做的任何修改, 等同替换, 改进等, 均应包含在 本发明保护的范围之内。  The above description is only the preferred embodiment of the present invention, and is not intended to limit the present invention. Any modifications, equivalents, improvements, etc., which are made within the spirit and principles of the present invention, should be included in the present invention. Within the scope of protection.

Claims

权利要求书 Claim
1、一种原位粒子测量装置, 用于测量溶液中的粒子大小分布和密度, 包 括用于产生入射光线的照射单元 ( 130 ) 和用于接收出射光线的接收单元An in-situ particle measuring apparatus for measuring particle size distribution and density in a solution, comprising an irradiation unit (130) for generating incident light and a receiving unit for receiving outgoing light
( 150 ), 所述照射单元( 130 )与所述接收单元( 150 )之间形成光路 ( 140 ), 待测量的溶液填充于所述光路(140 )中, 其特征在于: 所述原位粒子测量装 置还包括移动单元( 141 ),所述所述移动单元( 141 )受驱动移入所述光路( 140 ) 中从而形成用于测量粒子大小分布的短光路( 140, ), 或者受驱动从所述光路 ( 140 ) 中移出从而形成用于测量粒子密度的长光路(140" )。 (150), an optical path (140) is formed between the illumination unit (130) and the receiving unit (150), and a solution to be measured is filled in the optical path (140), wherein: the in-situ particle The measuring device further includes a moving unit (141) that is driven into the optical path (140) to form a short optical path (140, ) for measuring particle size distribution, or driven by the mobile unit (141) The light path (140) is removed to form a long light path (140") for measuring the particle density.
2、根据权利要求 1所述的原位粒子测量装置, 其特征在于, 所述移动单 元(141 )是透光的, 光线在所述移动单元(141 ) 中保持原有的传播方向。  The in-situ particle measuring apparatus according to claim 1, wherein the moving unit (141) is light transmissive, and the light maintains an original propagation direction in the moving unit (141).
3、根据权利要求 1所述的原位粒子测量装置, 其特征在于, 所述短光路 ( 140, ) 的长度为所述照射单元( 130 )至所述移动单元( 141 ) 的距离以及 所述移动单元( 141 )至所述接收单元( 150 ) 的距离之和。  The in-situ particle measuring apparatus according to claim 1, wherein a length of the short optical path (140, ) is a distance from the irradiation unit (130) to the moving unit (141) and the length The sum of the distances of the mobile unit (141) to the receiving unit (150).
4、根据权利要求 3所述的原位粒子测量装置, 其特征在于,调整所述移 动单元( 141 )在所述照射单元( 130 )和接收单元( 150 )之间的位置使得所 述照射单元( 130 )至所述移动单元( 141 )的距离或者移动单元( 141 )至所 述接收单元(150 ) 的 巨离为零。  The in-situ particle measuring apparatus according to claim 3, wherein a position of the moving unit (141) between the irradiation unit (130) and the receiving unit (150) is adjusted such that the irradiation unit (130) The distance to the mobile unit (141) or the large separation of the mobile unit (141) to the receiving unit (150) is zero.
5、 根据权利要求 1-4任意一项所述的原位粒子测量装置, 其特征在于, 所述原位粒子测量装置还包括发光单元( 110 )和探测单元( 170 ), 所述发光 单元( 110 )与照射单元( 130 )之间通过光纤( 120 )相连,所述接收单元( 150 ) 与所述探测单元 ( 170 )之间通过光纤束 ( 160 )相连。  The in-situ particle measuring device according to any one of claims 1 to 4, wherein the in-situ particle measuring device further comprises a light emitting unit (110) and a detecting unit (170), the light emitting unit ( 110) is connected to the illumination unit (130) through an optical fiber (120), and the receiving unit (150) is connected to the detection unit (170) through a fiber bundle (160).
6、根据权利要求 5所述的原位粒子测量装置, 其特征在于, 所述照射单 元( 130 )、 移动单元( 141 )和接收单元( 150 )设置在一个外壳中从而形成 探针 ( 200 )。  The in-situ particle measuring apparatus according to claim 5, wherein the irradiation unit (130), the moving unit (141), and the receiving unit (150) are disposed in one housing to form a probe (200) .
7、根据权利要求 6所述的原位粒子测量装置, 其特征在于, 所述移动单 元( 141 ) 固定安装在转轴( 143 )上, 驱动所述转轴( 143 )转动从而驱动所 述移动单元( 141 )移入所述光路( 140 ) 中或者从所述光路 ( 140 ) 中移出。  The in-situ particle measuring device according to claim 6, wherein the moving unit (141) is fixedly mounted on a rotating shaft (143), and the rotating shaft (143) is driven to rotate to drive the moving unit ( 141) moving into or out of the optical path (140).
8、 根据权利要求 6 所述的原位粒子测量装置, 其特征在于, 所述探针 8. The in-situ particle measuring device according to claim 6, wherein the probe
( 200 )的外壳对应所述照射单元( 130 )和接收单元( 150 )之间的位置开设 槽( 210 ), 所述待测量的溶液通过所述槽 ( 210 )填充于所述光路( 140 )中。 9、根据权利要求 5所述的原位粒子测量装置, 其特征在于,在所述照射 单元(130 )上与所述接收单元(150 )相对的一端设置光窗 (132 ), 在所述 所述接收单元( 150 )上与所述照射单元( 130 )相对的一端设置另一光窗( 152 )。 The outer casing of (200) corresponds to the position between the irradiation unit (130) and the receiving unit (150) a tank (210), the solution to be measured is filled in the light path (140) through the tank (210). The in-situ particle measuring apparatus according to claim 5, wherein a light window (132) is disposed at an end of the irradiation unit (130) opposite to the receiving unit (150), Another optical window (152) is disposed at an end of the receiving unit (150) opposite to the illumination unit (130).
PCT/CN2008/072626 2008-10-09 2008-10-09 In situ particle measuring device WO2010040257A1 (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN87100685A (en) * 1986-02-12 1987-08-26 燃烧工程有限公司 Original position particle size measurer
JP2004101381A (en) * 2002-09-10 2004-04-02 Nittec Co Ltd Double path cell for automatic analyzer, and analysis method using the double path cell
US20050264817A1 (en) * 2004-05-27 2005-12-01 Envision Instruments, Llc Systems and methods for in situ spectroscopic measurements

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN87100685A (en) * 1986-02-12 1987-08-26 燃烧工程有限公司 Original position particle size measurer
JP2004101381A (en) * 2002-09-10 2004-04-02 Nittec Co Ltd Double path cell for automatic analyzer, and analysis method using the double path cell
US20050264817A1 (en) * 2004-05-27 2005-12-01 Envision Instruments, Llc Systems and methods for in situ spectroscopic measurements

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