WO2009090798A1 - Flux creeping-up preventive composition for solder, electronic member for solder coated with the composition, method for soldering the member, and electrical appliance - Google Patents

Flux creeping-up preventive composition for solder, electronic member for solder coated with the composition, method for soldering the member, and electrical appliance Download PDF

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Publication number
WO2009090798A1
WO2009090798A1 PCT/JP2008/071320 JP2008071320W WO2009090798A1 WO 2009090798 A1 WO2009090798 A1 WO 2009090798A1 JP 2008071320 W JP2008071320 W JP 2008071320W WO 2009090798 A1 WO2009090798 A1 WO 2009090798A1
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Prior art keywords
group
polymer
solder
flux
composition
Prior art date
Application number
PCT/JP2008/071320
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French (fr)
Japanese (ja)
Inventor
Ryo Hirabayashi
Fusae Ishiwata
Original Assignee
Agc Seimi Chemical Co., Ltd.
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Publication date
Application filed by Agc Seimi Chemical Co., Ltd. filed Critical Agc Seimi Chemical Co., Ltd.
Priority to JP2009549962A priority Critical patent/JP5295131B2/en
Priority to CN2008801253005A priority patent/CN101952082B/en
Publication of WO2009090798A1 publication Critical patent/WO2009090798A1/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K1/00Soldering, e.g. brazing, or unsoldering
    • B23K1/0008Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
    • B23K1/0016Brazing of electronic components
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K1/00Soldering, e.g. brazing, or unsoldering
    • B23K1/20Preliminary treatment of work or areas to be soldered, e.g. in respect of a galvanic coating
    • B23K1/203Fluxing, i.e. applying flux onto surfaces
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/10Esters
    • C08F220/22Esters containing halogen
    • C08F220/24Esters containing halogen containing perhaloalkyl radicals
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/10Esters
    • C08F220/26Esters containing oxygen in addition to the carboxy oxygen
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3452Solder masks
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00Articles made by soldering, welding or cutting
    • B23K2101/36Electric or electronic devices
    • B23K2101/42Printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0137Materials
    • H05K2201/015Fluoropolymer, e.g. polytetrafluoroethylene [PTFE]

Definitions

  • a flux treatment for improving the adhesiveness of the solder is performed in advance.
  • a general flux is a corrosive agent containing an acidic component in a solvent. For this reason, it is undesirable for flux to penetrate or adhere to electrical contact parts of electronic parts such as connectors, switches, volumes, semi-fixed resistors, or parts that do not require soldering on printed circuit boards, and this must be prevented. .
  • the flux scooping up that occurs in the through-hole part of electronic parts due to the capillary phenomenon, the flux adheres to or penetrates into parts that are not soldered, causing corrosion. Need to prevent.
  • such a polymer is typically CH 2 ⁇ C (R 1 ) COO—QR f (wherein R 1 is a hydrogen atom or a methyl group, Q is a divalent linking group, R f is A polymer derived from a (meth) acrylate having a polyfluoroalkyl group represented by (C4-14 polyfluoroalkyl group) (see Patent Document 1).
  • the flux creeping-up preventing agent is required to be a very thin film in order to prevent contact failure due to the flux creeping-up preventing film processed on the contact part of the electronic component.
  • IPA performance at a very low concentration is required.
  • the present invention is a polymer containing a polymer unit derived from an unsaturated compound having a polyfluoroalkyl group having 6 or less carbon atoms, which has little influence on the living body and the environment.
  • a flux scooping prevention composition for a solder having a performance equivalent to that of a flux scooping prevention agent comprising a polymer containing a polymer unit derived from an unsaturated compound having a molecular weight of 8 or more and having a high flux scooping prevention performance With the goal.
  • the present invention is a polymer containing a polymer unit derived from an unsaturated compound having a polyfluoroalkyl group having 6 or less carbon atoms, which has little influence on the living body and the environment.
  • a polar group into the polymer and setting the weight average molecular weight of the polymer to 150,000 or more, a polymer unit derived from an unsaturated compound having 8 or more carbon atoms in a conventional polyfluoroalkyl group is obtained.
  • the present invention makes it possible to provide a flux scooping preventive agent having the same performance as the flux scooping preventive agent containing the polymer contained.
  • the solder flux creeping-up composition according to the present invention comprises a polymerization unit (A) derived from a compound represented by the following formula (a) and a polymerization unit (B) derived from an unsaturated compound containing a hydroxyl group.
  • A polymerization unit
  • B polymerization unit
  • Each polymer contains at least one polymer and has a weight average molecular weight (in terms of polymethyl methacrylate) of 150,000 or more.
  • R 1 a hydrogen atom or a methyl group
  • Q 1 a single bond or a divalent linking group
  • R f represents a polyfluoroalkyl group or polyfluoroether group having a main chain length of 1 to 6 carbon atoms.
  • a preferred R f group is a linear perfluoroalkyl group or perfluoroether group having 1 to 6 carbon atoms.
  • Q 1 is preferably a single bond or a linear alkylene group having 1 to 6 carbon atoms, an amino group, a sulfonyl group, or a combination thereof.
  • the polymerization unit (B) is preferably derived from a compound represented by the following formula (b). CH 2 ⁇ C (R 1 ) —C (O) O—Q 2 —OH (b) Wherein, R 1: same as in the formula (a), Q 2: 2 divalent linking group.
  • the solder flux creeping-up composition according to the present invention is usually in a liquid form, and preferably contains a polymer as described above at a concentration of 0.001 to 10% by mass.
  • Another aspect of the present invention is an electronic member that has a coating made of any of the above-described compositions on part or all of the soldering portion of the electronic member and has a solder flux creeping-up preventing performance.
  • the present invention also provides a method of forming a film made of any of the above-described compositions on a part or all of a part to be soldered of an electronic member, applying a part or all of the film with a soldering flux, A method of soldering an electronic member to be attached is provided, and an electric product including the electronic member soldered by the method is also provided.
  • (meth) acrylate represents both or one of acrylic ester and methacrylic ester.
  • the polymer contained in the composition for preventing creeping up of the solder flux of the present invention is a polymer unit (A) derived from a compound represented by the following formula (a): And at least one polymerization unit (B) derived from an unsaturated compound containing a hydroxyl group. CH 2 ⁇ C (R 1 ) —COO—Q 1 —R f (a)
  • the symbols in the formulas have the following meanings.
  • R 1 a hydrogen atom or a methyl group
  • Q 1 a single bond or a divalent linking group
  • R f a polyfluoroalkyl group or polyfluoroether group having a main chain length of 1 to 6 carbon atoms.
  • the polyfluoroalkyl group means a partially fluoro-substituted or perfluoro-substituted alkyl group in which two to all of the hydrogen atoms of the alkyl group are substituted with fluorine atoms.
  • the polyfluoroalkyl group represented by the R f group may have either a straight chain structure or a branched structure, but the main chain length (the number of carbon atoms not including the side chain) is an alkyl having 1 to 6 carbon atoms.
  • the polyfluoroether group means a group in which an etheric oxygen atom is inserted between one or more carbon-carbon atoms in the polyfluoroalkyl group.
  • the R f group preferably has a linear structure from the viewpoint of increasing the packing of the R f group. For the same reason, in the case of a branched structure, it is preferable that the branched portion is present at the terminal portion of the R f group.
  • the R f group is preferably a polyfluoroalkyl group. Further, the R f group is preferably a substantially perfluorinated perfluoroalkyl group (R F ), more preferably an R F group having a main chain length of 1 to 6 carbon atoms, It is particularly preferable that the R F group is.
  • Q 1 is a single bond or a divalent linking group.
  • the above linking group may have a substituent.
  • substituents include a halogen atom (F, Cl, Br, I), a hydroxyl group, a cyano group, an alkoxy group (methoxy, ethoxy, butoxy, octyl).
  • Q 1 can be appropriately selected as long as it is a single bond or a divalent linking group, but is a single bond or a linear or branched alkylene group having 1 to 6 carbon atoms, a phenylene group, an amino group (—N ( R)-), a sulfonyl group (—SO 2 —) and a divalent linking group selected from a combination thereof are preferable.
  • Specific examples of the divalent linking group in this combination include —N (R) —SO 2 —, the above alkylene group or phenylene group, and —NR—, —SO 2 — or —N (R) —SO. Examples thereof include a linking group to 2- .
  • the alkylene group is preferably linear.
  • a preferable one is represented by the following formula (a1).
  • p is an integer from 0 to 6
  • R 1 and R f are the same as those in the formula (a).
  • R f is a linear perfluoroalkyl group (R F ) having 1 to 6 carbon atoms
  • R F a linear perfluoroalkyl group
  • R 1 is the same as defined above, and Q 3 represents an alkylene group, a phenylene group, a cyclohexylene group, an ester bond, an amide bond, — (CH 2 CH 2 O) n —, — (CH 2 CH 2 CH 2 O) n- , or a combination thereof (where n is an integer from 1 to 30).
  • Q 3 represents an alkylene group, a phenylene group, a cyclohexylene group, an ester bond, an amide bond, — (CH 2 CH 2 O) n —, — (CH 2 CH 2 CH 2 O) n- , or a combination thereof (where n is an integer from 1 to 30).
  • These groups may have a substituent such as a hydroxyl group or an aryl group.
  • N 1 to 10 in Table 1 above
  • the polymer according to the present invention is a copolymer containing at least one of the above polymerized units (A) and polymerized units (B), and the polymerized units (B) are represented by the formula (b). It is preferable that the polymerization unit (A) is derived from the compound represented by the formula (a1) and the polymerization unit (B) is derived from the compound represented by the formula (b1). It is more preferable that they are used.
  • the content of polymer units (A) in the polymer is preferably 90% by mass or more, and more preferably 95% by mass or more.
  • the content of the polymerization unit (A) is 90% by mass or more, the IPA performance can be maintained and the creeping prevention performance can be maintained.
  • the content of the polymer units (B) in the polymer is preferably 0.1 to 10% by mass, more preferably 0.5 to 5% by mass.
  • the content is within the above range, the IPA performance of the copolymer is improved, and good anti-cracking performance of the flux can be obtained.
  • the content is too small, the creeping prevention performance is low, and when the content is too large, the solubility of the copolymer in the solvent is remarkably lowered.
  • the content of each polymerization unit can be substantially regarded as a polymerization charge amount.
  • the content is the total of the respective polymerization units.
  • the polymer according to the present invention may contain other polymer units (C) in addition to the polymer units (A) and (B) as described above.
  • the other polymerization unit (C) is not particularly limited as long as it is a polymerization unit derived from a compound that can be copolymerized with the compounds forming the above (A) and (B).
  • this compound include a compound (c) having a polymerizable group.
  • examples thereof include a compound (c) having an unsaturated group such as an acrylic acid compound (c2) and a further polymerizable compound (c3).
  • an acrylic acid compound (c2) and a further polymerizable compound (c3).
  • R 2 —H, CH 3 , —Cl, —CHO, —COOH, —CH 2 Cl, —CH 2 NH 2 , —CH 2 N (CH 3 ) 2 , —CH 2 N (CH 3 ) 3 Cl, —CH 2 NH 3 Cl, —CH 2 CN, —CH 2 COOH, —CH 2 N (CH 2 COOH) 2 , —CH 2 SH, —CH 2 SO 3 Na or —CH 2 OCOCH 3 .
  • the polymer according to the present invention can contain, as the polymerized unit (C), a polymerized unit derived from one or more of the compounds (c) as described above.
  • the total amount may be 50% by mass or less, preferably 20% by mass or less.
  • the polymer according to the present invention requires a high molecular weight for sufficiently exhibiting the creeping prevention performance in addition to the structure as described above.
  • the polymer has a weight average molecular weight (Mw) of 150,000 or more.
  • Mw weight average molecular weight
  • the molecular weight is preferably 180,000 or more, more preferably 200,000 or more.
  • the molecular weight is too large, solubility in a solvent and handling of a polymer become difficult, so that it is preferably at most 2 million, more preferably 1 million or less. Even 500,000 or less may be sufficient.
  • the weight average molecular weight is defined as GPC (gel permeation chromatography; column filler: styrene divinylbenzene copolymer, moving layer: polymethyl methacrylate (standard name) measured by Asahiklin AK-225 (trade name). Substance) The molecular weight in terms of conversion.
  • the polymer according to the present invention is not particularly limited with respect to the polymerization form and the like except that it includes the above-described polymerization units (A) and (B) and an additional polymerization unit (C).
  • the polymerization form may be any of random, block, graft and the like, and is not particularly limited, but usually a random copolymer is preferred.
  • the scooping preventive agent of the present invention is a liquid composition containing the above-mentioned polymer and usually dissolved or dispersed in a solvent.
  • the polymer is produced by solution polymerization using a solvent described later as a polymerization medium, and the liquid composition is directly prepared by polymerization.
  • the polymerization raw material compound is a gas such as vinyl chloride, it may be continuously supplied under pressure using a pressure vessel.
  • the solvent for forming the composition is not particularly limited as long as it can dissolve or disperse the polymer, and examples thereof include various organic solvents, water, and mixed media thereof.
  • the polymer is particularly easily dissolved in a fluorinated solvent, and hydrochlorofluorocarbon (HCFC) and perfluorocarbon (PFC) can also be used.
  • hydrochlorofluorocarbon (HCFC) and perfluorocarbon (PFC) can also be used.
  • hydrofluorocarbon (HFC) or hydrofluoroether (HFE) is preferable. Specific examples of usable fluorine-based solvents are shown below, but are not limited thereto.
  • m-XHF m-xylene hexafluoride
  • p-XHF p-xylene hexafluoride
  • CF 3 CH 2 CF 2 CH 3 CF 3 CH 2 CF 2 H
  • C 6 F 13 OCH 3 C 6 F 13 OC 2 H 5
  • C 3 F 7 OCH 3 C 3 F 7 OC 2 H 5
  • C 6 F 13 H CF 2 HCF 2 CH 2 OCF 2 CF 2 H
  • CF 3 (OCF 2 CF 2 ) n (OCF 2 ) m OCF 2 H m and n are each 1 to 20
  • CF 3 CF 2 CHCl 2 and CClF 2 CF 2 CHClF is a trade name of Asahi Clin AK-225 (manufactured by Asahi Glass Co., Ltd.), and CF 3 (CF 2 ) 3 OC 2 H 5 and (CF 3 )
  • a hydrofluoroether mixture with 2 CFCF 2 OC 2 H 5 is available under the trade name Novec HFE 7200 (manufactured by 3M).
  • the scooping preventive agent of the present invention may contain any desired component as long as it does not adversely affect the stability of the composition, the flux scooping prevention performance or the appearance.
  • Such components include, for example, pH control agents, rust preventives for preventing corrosion of the coating surface, the purpose of controlling the concentration of the polymer in the liquid when the composition is diluted, and untreated parts Dyes, dye stabilizers, flame retardants, antifoaming agents, antistatic agents, and the like.
  • a coating film of the scooping-up preventing agent as described above is formed on a part or all of the soldering portion of the surface of the electronic member, and after treating a part or all of the coating film with a soldering flux, An electronic member soldering method for soldering is provided.
  • the scooping-up preventing agent can be diluted to an arbitrary concentration according to the purpose and application and coated on the electronic member.
  • a coating method a general coating method can be employed. For example, there are methods such as dip coating, spray coating, or coating with an aerosol can filled with the composition of the present invention.
  • the electronic member include an electronic component having an electrical contact such as a connector, a switch, a volume, or a semi-fixed resistor, and a printed circuit board having an electrical contact.
  • the location covered with the scooping preventive agent of the present invention include a location where a flux scooping may occur when an electronic component such as a connector is soldered to a printed circuit board. More specifically, a base part of an electronic component such as a connector to be attached to the printed board, a substrate surface on the side of the printed board on which the electronic component main body is mounted, or a through hole provided in the printed board for attaching the electronic component, etc. It is done. Moreover, you may coat
  • the scooping preventive agent of the present invention forms a film on the surface of an electronic member such as an electronic component or a printed circuit board and prevents scooping of the solder flux. Therefore, according to the present invention, an electronic member such as an electronic component or a printed board in which corrosion due to flux is prevented is provided.
  • An electronic component such as an electronic component or a printed circuit board having a coating (dried) formed on the surface as described above or a printed board is then treated with a soldering flux, and then soldered.
  • the soldering method is not particularly limited, and is performed according to a conventionally known method.
  • the types of flux and solder are not particularly limited, and those commonly used for soldering electronic members can be used.
  • the electronic components or electronic members such as printed boards are used as materials for various electric products.
  • the electrical product is an excellent quality electrical product in which a failure caused by corrosion due to flux is prevented.
  • Specific examples of the electric products include devices for computer devices, televisions, audio devices (radio cassettes, compact discs, minidiscs), mobile phones, and the like.
  • Test 2 The polymerization compositions of Examples 1 to 5 were diluted with HFE7200 to prepare solder flux creep-up inhibitors having a polymer concentration of 1%. A test piece subjected to silver plating (3 ⁇ m) was dipped in each scooping preventive agent at room temperature for 1 minute, then taken out and dried at room temperature, and treated with a scooping preventive agent.
  • SAT-5100 (Resca Co., Ltd.) was used for the zero cross time measurement.
  • Solder used H63A-B20 (eutectic solder, Senju Metal Industry Co., Ltd.) Solder temperature: 235 ° C Flux: Rosin flux 25% IPA solution (Senju Metal Industry Co., Ltd.)
  • Base material Silver-plated plate (10 x 30 x 0.3 mm, Reska Co., Ltd.) Immersion conditions: Immersion speed: 20 mm / sec, Immersion depth: 2 mm, Immersion time: 10 sec Treatment conditions: After immersion for 1 minute, air-dry at room temperature for 20 minutes or more.
  • Table 4 shows the evaluation results of contact resistance and solder wettability (zero cross time).
  • the scooping-up preventing agent even when the treatment was performed at a concentration of 1% which is considerably higher than the concentration of a general scooping-up preventing agent, the contact resistance was almost the same as that of untreated. From this, it was confirmed that even if a film made of the scooping-up preventing agent is formed on the contact portion of the electrical component, the possibility of contact failure is very low. Moreover, since the zero cross time after the treatment at the above 1% concentration is also 1 second or less, it has been confirmed that even if the scooping prevention coating is processed on the soldered portion, it does not affect the soldering. .

Abstract

Disclosed is a flux creeping-up preventive composition for a solder that has flux creeping-up preventive properties comparable with those of a conventional flux creeping-up preventive agent comprising a polymer containing a polyfluoroalkyl group having 8 or more carbon atoms, wherein an influence on a living body and an environment can be significantly reduced. The flux creeping-up preventive composition comprises a polymer comprising at least one type of an (meth)acrylate polymerization unit (A) containing a perfluoroalkyl group having 6 or less carbon atoms and at least one type of a polymerization unit (B) derived from a hydroxyl group-containing unsaturated compound. The polymer has a weight average molecular weight (in terms of polymethyl methacrylate) of not less than 150000.

Description

はんだ用フラックス這い上がり防止組成物、該組成物を被覆したはんだ用電子部材、該部材のはんだ付け方法および電気製品Solder flux creeping-up composition, electronic member for solder coated with the composition, method for soldering the member, and electrical product
 本発明は、電気接点を有する電子部品またはプリント基板等の電子部材のはんだ付けの際に、はんだ用フラックスの這い上がりを防止するための前処理剤として用いられるフラックス這い上がり防止組成物に関する。また本発明は、該組成物から形成された被膜を有するはんだ用電子部品またはプリント基板などの電子部材、該組成物を用いるはんだ付け方法、さらに、はんだ付けされた上記電子部材を含む電気製品に関する。 The present invention relates to a flux creeping-up preventing composition used as a pretreatment agent for preventing solder flux from creeping up when soldering an electronic component having electrical contacts or an electronic member such as a printed circuit board. The present invention also relates to an electronic component such as an electronic component for soldering or a printed board having a coating formed from the composition, a soldering method using the composition, and an electric product including the soldered electronic component. .
 プリント基板に各種部品をはんだ付けしたり、ICソケットにICをはんだ付けする際には、予め、はんだの接着性を向上させるためのフラックス処理が施される。一般のフラックスは、溶媒中に酸性成分を含む腐食剤である。このため、コネクタ、スイッチ、ボリューム、半固定抵抗等の電子部品の電気接点部分、またはプリント基板のはんだ付けが不要な部分などにフラックスが浸透あるいは付着することは望ましくなく、これを防ぐ必要がある。特に、電子部品のスルーホール部分などで起きる、フラックスが毛細管現象等により這い上がる「フラックスの這い上がり」と呼ばれる現象により、はんだ付けの不要な部分にまでフラックスが付着あるいは浸透し、腐食を起こすことを防ぐ必要がある。 When soldering various parts to a printed circuit board or soldering an IC to an IC socket, a flux treatment for improving the adhesiveness of the solder is performed in advance. A general flux is a corrosive agent containing an acidic component in a solvent. For this reason, it is undesirable for flux to penetrate or adhere to electrical contact parts of electronic parts such as connectors, switches, volumes, semi-fixed resistors, or parts that do not require soldering on printed circuit boards, and this must be prevented. . In particular, due to the phenomenon called “flux scooping up” that occurs in the through-hole part of electronic parts due to the capillary phenomenon, the flux adheres to or penetrates into parts that are not soldered, causing corrosion. Need to prevent.
 このため、はんだ付けに先立って、フラックス這い上がりを防止するための前処理が行われている。この前処理に用いられるフラックス這い上がり防止剤は、通常、フラックスの溶媒に対し撥溶媒性のあるポリマーを含む組成物である。従来、フラックスの溶媒は典型的にIPAであることから、撥IPA性がフラックス這い上がり防止性能の目安となる指標として使用されている。そのため、フラックス這い上がり防止剤の有効成分として、撥IPA性の高い、ポリフルオロアルキル基含有重合体が使用されてきた。 For this reason, prior to soldering, pre-treatment is performed to prevent flux creeping. The flux creep-up preventing agent used for this pretreatment is usually a composition containing a polymer having a solvent repellency with respect to the solvent of the flux. Conventionally, since the flux solvent is typically IPA, IPA repellency has been used as an index of the flux creep-up prevention performance. Therefore, a polyfluoroalkyl group-containing polymer having high IPA repellency has been used as an active ingredient of the flux creeping-up preventing agent.
 このような重合体は、従来、典型的に、CH=C(R1)COO-Q-Rf (式中、R1:水素原子またはメチル基、Q:2価連結基、Rf:炭素数4~14のポリフルオロアルキル基)で表されるポリフルオロアルキル基含有(メタ)アクリレートから導かれる重合体である(特許文献1参照)。 Conventionally, such a polymer is typically CH 2 ═C (R 1 ) COO—QR f (wherein R 1 is a hydrogen atom or a methyl group, Q is a divalent linking group, R f is A polymer derived from a (meth) acrylate having a polyfluoroalkyl group represented by (C4-14 polyfluoroalkyl group) (see Patent Document 1).
特開平10-303536号公報JP-A-10-303536
 米国環境保護庁(USEPA)は、野生動物や人の血液を含め、種々の環境から検出されるパーフロオロオクタン酸(PFOA)の安全性に関する予備リスク調査報告書を2003年3月に公開した。さらに、2006年1月には、PFOAとその類縁物質、およびこれらの前駆体物質の環境中への排出削減と製品中の含有量削減計画への参加をフッ素樹脂メーカー等に提唱している。パーフルオロアルキル基の炭素数が6以下になると、生体および環境へのリスクが大きく低下する。 The US Environmental Protection Agency (USEPA) published a preliminary risk study report on the safety of perfluorooctanoic acid (PFOA) detected in various environments, including wild animals and human blood, in March 2003. Furthermore, in January 2006, PFOA and its related substances and their precursor substances were proposed to fluororesin manufacturers and others to participate in a reduction plan in the environment and content reduction in products. When the carbon number of the perfluoroalkyl group is 6 or less, the risk to living bodies and the environment is greatly reduced.
 しかしながら、重合体中のパーフルオロアルキル基に起因する、疎水性、疎油性などの性能は、パーフルオロアルキル基の炭素数が8以上であると高いが、炭素数が6以下であると著しく低下する。これは、炭素数が8以上のパーフルオロアルキル基が結晶性を持つためと言われている。フラックス這い上がり防止剤の性能の指標として重要な撥IPA性も、パーフロオロアルキル基の炭素数が6以下になると、急激に低下する。特に低濃度で浸漬処理した場合の性能低下は非常に大きい。 However, the performance such as hydrophobicity and oleophobicity resulting from the perfluoroalkyl group in the polymer is high when the carbon number of the perfluoroalkyl group is 8 or more, but is remarkably lowered when the carbon number is 6 or less. To do. This is said to be because a perfluoroalkyl group having 8 or more carbon atoms has crystallinity. The IPA repellency, which is important as an index of the performance of the flux creeping-up preventing agent, also decreases rapidly when the carbon number of the perfluoroalkyl group is 6 or less. Especially when the immersion treatment is performed at a low concentration, the performance degradation is very large.
 さらに、フラックス這い上がり防止剤は、電子部品の接点部に処理されたフラックス這い上がり防止皮膜により、接触不良が生じるのを防ぐため、非常に薄い皮膜であることが要求される。浸漬処理を行う場合は、非常に低濃度での撥IPA性能が要求される。 Furthermore, the flux creeping-up preventing agent is required to be a very thin film in order to prevent contact failure due to the flux creeping-up preventing film processed on the contact part of the electronic component. When the immersion treatment is performed, IPA performance at a very low concentration is required.
 本発明は、生体および環境への影響が少ない炭素数が6以下のポリフルオロアルキル基を有する不飽和化合物から導かれる重合単位を含有する重合体であるが、従来のポリフルオロアルキル基の炭素数が8以上の不飽和化合物から導かれる重合単位を含有する重合体を含むフラックス這い上がり防止剤と同等の性能を有し、フラックス這い上がり防止性能が高い、はんだ用フラックス這い上がり防止組成物の提供を目的とする。 The present invention is a polymer containing a polymer unit derived from an unsaturated compound having a polyfluoroalkyl group having 6 or less carbon atoms, which has little influence on the living body and the environment. Of a flux scooping prevention composition for a solder having a performance equivalent to that of a flux scooping prevention agent comprising a polymer containing a polymer unit derived from an unsaturated compound having a molecular weight of 8 or more and having a high flux scooping prevention performance With the goal.
 上記のような諸問題に鑑み、本発明は、生体および環境への影響が少ない炭素数が6以下のポリフルオロアルキル基を有する不飽和化合物から導かれる重合単位を含有する重合体であるが、該重合体中への極性基の導入と、該重合体の重量平均分子量を15万以上にすることで、従来のポリフルオロアルキル基の炭素数が8以上の不飽和化合物から導かれる重合単位を含有する重合体を含むフラックス這い上がり防止剤と同等の性能を有するフラックス這い上がり防止剤の提供を可能とした。 In view of the above problems, the present invention is a polymer containing a polymer unit derived from an unsaturated compound having a polyfluoroalkyl group having 6 or less carbon atoms, which has little influence on the living body and the environment. By introducing a polar group into the polymer and setting the weight average molecular weight of the polymer to 150,000 or more, a polymer unit derived from an unsaturated compound having 8 or more carbon atoms in a conventional polyfluoroalkyl group is obtained. The present invention makes it possible to provide a flux scooping preventive agent having the same performance as the flux scooping preventive agent containing the polymer contained.
 本発明に係るはんだ用フラックス這い上がり防止組成物は、下記式(a)で表される化合物から導かれる重合単位(A)と、水酸基を含有する不飽和化合物から導かれる重合単位(B)のそれぞれ少なくとも1種を含有し、重量平均分子量(ポリメチルメタクリレート換算)が15万以上である重合体を含む。
CH=C(R1)-C(O)O-Q-R (a)
式中、R:水素原子またはメチル基、
 Q:単結合または2価の連結基、
 R:主鎖の鎖長が炭素数1~6のポリフルオロアルキル基またはポリフルオロエーテル基を示す。
The solder flux creeping-up composition according to the present invention comprises a polymerization unit (A) derived from a compound represented by the following formula (a) and a polymerization unit (B) derived from an unsaturated compound containing a hydroxyl group. Each polymer contains at least one polymer and has a weight average molecular weight (in terms of polymethyl methacrylate) of 150,000 or more.
CH 2 ═C (R 1 ) —C (O) OQ 1 —R f (a)
In the formula, R 1 : a hydrogen atom or a methyl group,
Q 1 : a single bond or a divalent linking group,
R f represents a polyfluoroalkyl group or polyfluoroether group having a main chain length of 1 to 6 carbon atoms.
 上記式(a)において、好ましいR基は炭素数1~6の直鎖のパーフルオロアルキル基またはパーフルオロエーテル基である。
 また式(a)において、好ましいQは単結合または炭素数1~6の直鎖アルキレン基、アミノ基、スルホニル基、またはこれらの組合せである。
In the above formula (a), a preferred R f group is a linear perfluoroalkyl group or perfluoroether group having 1 to 6 carbon atoms.
In Formula (a), Q 1 is preferably a single bond or a linear alkylene group having 1 to 6 carbon atoms, an amino group, a sulfonyl group, or a combination thereof.
 上記重合単位(B)は、好ましくは下記式(b)で表される化合物から導かれる。
CH=C(R1)-C(O)O-Q-OH (b)
式中、R:前記式(a)と同じ、Q:2価の連結基。
The polymerization unit (B) is preferably derived from a compound represented by the following formula (b).
CH 2 ═C (R 1 ) —C (O) O—Q 2 —OH (b)
Wherein, R 1: same as in the formula (a), Q 2: 2 divalent linking group.
 上記重合体中の重合単位(B)の割合が10質量%以下である態様は好ましい。
 本発明に係るはんだ用フラックス這い上がり防止組成物は、通常、液状形態であり、好ましくは上記のような重合体を0.001~10質量%の濃度で含有する。
An embodiment in which the proportion of the polymer units (B) in the polymer is 10% by mass or less is preferable.
The solder flux creeping-up composition according to the present invention is usually in a liquid form, and preferably contains a polymer as described above at a concentration of 0.001 to 10% by mass.
 本発明の他の態様は、電子部材のはんだ付けする箇所の一部または全部に、上記いずれかの組成物からなる被膜を有し、はんだ用フラックス這い上がり防止性能を有する電子部材である。 Another aspect of the present invention is an electronic member that has a coating made of any of the above-described compositions on part or all of the soldering portion of the electronic member and has a solder flux creeping-up preventing performance.
 また、本発明は、電子部材のはんだ付けする箇所の一部または全部に、上記のいずれかの組成物からなる被膜を形成し、該被膜の一部または全部をはんだ用フラックスで塗布後、はんだ付けする、電子部材のはんだ付け方法を提供し、さらに、該方法ではんだ付けされた電子部材を含む電気製品をも提供する。 The present invention also provides a method of forming a film made of any of the above-described compositions on a part or all of a part to be soldered of an electronic member, applying a part or all of the film with a soldering flux, A method of soldering an electronic member to be attached is provided, and an electric product including the electronic member soldered by the method is also provided.
 本発明は、フラックス這い上がり防止組成物において、重合体中の炭素数が8以上のポリフルオロアルキル基の含有量を抑えて、生体および環境への安全性を確保するだけではなく、ポリフルオロアルキル基の鎖長の減少による這い上がり防止性能の低下を抑え、従来品と同程度の性能を維持することを可能にした。
 本発明のフラックス這い上がり防止組成物は、それにより形成される被膜の接触抵抗やはんだ濡れ性が該被膜のない状態と同じであることから、電子部品等に被膜を形成しても、接点部が被膜による接触不良を起こす可能性が低く、さらに、被膜形成部分のはんだ付けに支障が生じにくいものと考えられる。
The present invention provides a composition for preventing flux creep-up, not only by suppressing the content of polyfluoroalkyl groups having 8 or more carbon atoms in the polymer to ensure safety to living bodies and the environment, but also to polyfluoroalkyl. Suppression of the creeping prevention performance due to the decrease in the chain length of the group is suppressed, and it is possible to maintain the same level of performance as conventional products.
The flux scooping prevention composition of the present invention has the same contact resistance and solder wettability as the film formed thereby, so that even if a film is formed on an electronic component or the like, the contact portion Is less likely to cause contact failure due to the coating, and it is considered that the soldering of the coating forming portion is less likely to cause trouble.
 なお本明細書中、(メタ)アクリレートとは、アクリル酸エステルおよびメタクリル酸エステルの両方またはどちらか一方を表す。 In addition, in this specification, (meth) acrylate represents both or one of acrylic ester and methacrylic ester.
 本発明のはんだ用フラックスの這い上がり防止組成物(「這い上がり防止剤」とも記す)が被覆成分として含む重合体は、下記式(a)で表される化合物から導かれる重合単位(A)と、水酸基を含有する不飽和化合物から導かれる重合単位(B)のそれぞれ少なくとも1種を含有する。
 CH=C(R1)-COO-Q-R  (a)
 ただし、式中の記号は以下の意味を示す。
 R:水素原子またはメチル基、
 Q:単結合または2価の連結基、
 R:主鎖の鎖長が炭素数1~6のポリフルオロアルキル基またはポリフルオロエーテル基。
The polymer contained in the composition for preventing creeping up of the solder flux of the present invention (also referred to as “scooping-up preventing agent”) is a polymer unit (A) derived from a compound represented by the following formula (a): And at least one polymerization unit (B) derived from an unsaturated compound containing a hydroxyl group.
CH 2 ═C (R 1 ) —COO—Q 1 —R f (a)
However, the symbols in the formulas have the following meanings.
R 1 : a hydrogen atom or a methyl group,
Q 1 : a single bond or a divalent linking group,
R f : a polyfluoroalkyl group or polyfluoroether group having a main chain length of 1 to 6 carbon atoms.
 ポリフルオロアルキル基とは、アルキル基の水素原子の2個ないし全部がフッ素原子に置換された部分フルオロ置換またはパーフルオロ置換アルキル基を意味する。上記Rf基で示されるポリフルオロアルキル基は、直鎖構造または分岐構造のいずれであってもよいが、主鎖の鎖長(側鎖を含まない炭素数)が炭素数1~6のアルキル基に対応する部分フルオロ置換またはパーフルオロ置換アルキル基である。具体的には、たとえば、メチル、エチル、プロピル、ブチル、ペンチル、ヘキシル、イソプロピル、3-メチルブチルなどのアルキル基に対応する部分またはパーフルオロ置換アルキル基が挙げられる。
 また、ポリフルオロエーテル基とは、上記ポリフルオロアルキル基中の1箇所以上の炭素-炭素原子間にエーテル性酸素原子が挿入された基を意味する。
The polyfluoroalkyl group means a partially fluoro-substituted or perfluoro-substituted alkyl group in which two to all of the hydrogen atoms of the alkyl group are substituted with fluorine atoms. The polyfluoroalkyl group represented by the R f group may have either a straight chain structure or a branched structure, but the main chain length (the number of carbon atoms not including the side chain) is an alkyl having 1 to 6 carbon atoms. A partially fluoro- or perfluoro-substituted alkyl group corresponding to the group. Specific examples include a moiety corresponding to an alkyl group such as methyl, ethyl, propyl, butyl, pentyl, hexyl, isopropyl, 3-methylbutyl or a perfluoro-substituted alkyl group.
The polyfluoroether group means a group in which an etheric oxygen atom is inserted between one or more carbon-carbon atoms in the polyfluoroalkyl group.
 上記のうちでも、R基のパッキングを上げる観点からR基は直鎖構造が好ましい。同様の理由から、分岐構造である場合には、分岐部分がR基の末端部分に存在する場合が好ましい。
 また、R基としては、ポリフルオロアルキル基が好ましい。さらに、R基は、実質的に全フッ素置換されたパーフルオロアルキル基(R)が好ましく、主鎖の鎖長が炭素数1~6のR基であることがより好ましく、直鎖のR基であることが特に好ましい。
Among the above, the R f group preferably has a linear structure from the viewpoint of increasing the packing of the R f group. For the same reason, in the case of a branched structure, it is preferable that the branched portion is present at the terminal portion of the R f group.
The R f group is preferably a polyfluoroalkyl group. Further, the R f group is preferably a substantially perfluorinated perfluoroalkyl group (R F ), more preferably an R F group having a main chain length of 1 to 6 carbon atoms, It is particularly preferable that the R F group is.
 Qは、単結合または2価の連結基である。2価の連結基としては、これらに限定されるものではないが、-O-、-S-、-N(R)-(ここでのRはHまたは炭素数1~3のアルキル基)、-SO-、-PO-、-CH=CH-、-CH=N-、-N=N-、-N(O)=N-、-COO-、-COS-、-CONH-、-COCH-、-CHNH-、-CH-、-CO-、-CH=CH-COO-、-CH=CH-CO-、直鎖状もしくは分岐状のアルキレン基またはアルケニレン基、-(CHCHO)-、-(CHCHCHO)-(ここでのnは1~30の整数)などのアルキレンオキシ基、2価の4、5、6または7員環置換基、またそれらから構成される縮合置換基、フェニレンなどの6員環芳香族基、4ないし6員環の飽和または不飽和の脂肪族基、5または6員環複素環基、またはそれらの縮合環が挙げられる。また、これら2価の連結基の組合せから構成される基が挙げられる。 Q 1 is a single bond or a divalent linking group. Examples of the divalent linking group include, but are not limited to, —O—, —S—, —N (R) — (wherein R is H or an alkyl group having 1 to 3 carbon atoms), -SO 2 -, - PO 2 - , - CH = CH -, - CH = N -, - N = N -, - N (O) = N -, - COO -, - COS -, - CONH -, - COCH 2 —, —CH 2 NH—, —CH 2 —, —CO—, —CH═CH—COO—, —CH═CH—CO—, a linear or branched alkylene group or alkenylene group, — ( An alkyleneoxy group such as CH 2 CH 2 O) n —, — (CH 2 CH 2 CH 2 O) n — (where n is an integer of 1 to 30), divalent 4, 5, 6 or 7 members Ring substituents, condensed substituents composed thereof, 6-membered aromatic groups such as phenylene, 4- to 6-membered saturated saturated groups The unsaturated aliphatic groups, 5- or 6-membered heterocyclic group or include their condensed rings. Moreover, the group comprised from the combination of these bivalent coupling groups is mentioned.
 上記の連結基は、置換基を有していてもよく、置換基の例としては、ハロゲン原子(F、Cl、Br、I)、水酸基、シアノ基、アルコキシ基(メトキシ、エトキシ、ブトキシ、オクチルオキシ、メトキシエトキシなど)、アリーロキシ基(フェノキシなど)、アルキルチオ基(メチルチオ、エチルチオなど)、アシル基(アセチル、プロピオニル、ベンゾイルなど)、スルホニル基(メタンスルホニル、ベンゼンスルホニルなど)、アシルオキシ基(アセトキシ、ベンゾイルオキシなど)、スルホニルオキシ基(メタンスルホニルオキシ、トルエンスルホニルオキシなど)、ホスホニル基(ジエチルホスホニルなど)、アミド基(アセチルアミノ、ベンゾイルアミノなど)、カルバモイル基(N,N-ジメチルカルバモイル、N-フェニルカルバモイルなど)、アルキル基(メチル、エチル、プロピル、イソプロピル、シクロプロピル、ブチルなど)、アリール基(フェニル、トルイルなど)、複素環基(ピリジル、イミダゾリル、フラニルなど)、アルケニル基(ビニル、1-プロペニルなど)、アルコキシアシルオキシ基(アセチルオキシなど)、アルコキシカルボニル基(メトキシカルボニル、エトキシカルボニルなど)、および重合性基(ビニル基、アクリロイル基、メタクロイル基、シリル基、桂皮酸残基など)などが挙げられる。 The above linking group may have a substituent. Examples of the substituent include a halogen atom (F, Cl, Br, I), a hydroxyl group, a cyano group, an alkoxy group (methoxy, ethoxy, butoxy, octyl). Oxy, methoxyethoxy, etc.), aryloxy groups (phenoxy, etc.), alkylthio groups (methylthio, ethylthio, etc.), acyl groups (acetyl, propionyl, benzoyl, etc.), sulfonyl groups (methanesulfonyl, benzenesulfonyl, etc.), acyloxy groups (acetoxy, Benzoyloxy etc.), sulfonyloxy groups (methanesulfonyloxy, toluenesulfonyloxy etc.), phosphonyl groups (diethylphosphonyl etc.), amide groups (acetylamino, benzoylamino etc.), carbamoyl groups (N, N-dimethylcarbamoyl, N -Feni Carbamoyl etc.), alkyl groups (methyl, ethyl, propyl, isopropyl, cyclopropyl, butyl etc.), aryl groups (phenyl, toluyl etc.), heterocyclic groups (pyridyl, imidazolyl, furanyl etc.), alkenyl groups (vinyl, 1- Propenyl, etc.), alkoxyacyloxy groups (acetyloxy, etc.), alkoxycarbonyl groups (methoxycarbonyl, ethoxycarbonyl, etc.), and polymerizable groups (vinyl group, acryloyl group, methacryloyl group, silyl group, cinnamic acid residue, etc.) Can be mentioned.
 Qは、単結合または2価の連結基であれば適宜選択可能であるが、単結合、または炭素数1~6の直鎖もしくは分岐状のアルキレン基、フェニレン基、アミノ基(-N(R)-)、スルホニル基(-SO-)およびこれらの組合せから選ばれる2価の連結基であることが好ましい。ここでの組合せの2価の連結基としては、具体的に、-N(R)-SO-、上記アルキレン基またはフェニレン基と-NR-、-SO-または-N(R)-SO-との連結基などが挙げられる。アルキレン基は直鎖状が好ましい。 Q 1 can be appropriately selected as long as it is a single bond or a divalent linking group, but is a single bond or a linear or branched alkylene group having 1 to 6 carbon atoms, a phenylene group, an amino group (—N ( R)-), a sulfonyl group (—SO 2 —) and a divalent linking group selected from a combination thereof are preferable. Specific examples of the divalent linking group in this combination include —N (R) —SO 2 —, the above alkylene group or phenylene group, and —NR—, —SO 2 — or —N (R) —SO. Examples thereof include a linking group to 2- . The alkylene group is preferably linear.
 式(a)で表される化合物のうちでも好適なものは、下記式(a1)で表される。
CH=C(R1)-COO-(CH-R  (a1)
 式中、p:0~6の整数、
 R、R:式(a)と同じ。
Among the compounds represented by the formula (a), a preferable one is represented by the following formula (a1).
CH 2 ═C (R 1 ) —COO— (CH 2 ) p —R f (a1)
Where p is an integer from 0 to 6,
R 1 and R f are the same as those in the formula (a).
 上記のうちでも、Rが炭素数1~6の直鎖のパーフルオロアルキル基(R)である構造の化合物が特に好適である。このような化合物は、具体的には、
CH=CH-COO-(CH-C13
CH=C(CH)-COO-(CH-C13
CH=CH-COO-(CH-C
CH=C(CH)-COO-(CH-C
などである。
Among these, compounds having a structure in which R f is a linear perfluoroalkyl group (R F ) having 1 to 6 carbon atoms are particularly suitable. Such compounds specifically include
CH 2 ═CH—COO— (CH 2 ) 2 —C 6 F 13 ,
CH 2 ═C (CH 3 ) —COO— (CH 2 ) 2 —C 6 F 13 ,
CH 2 = CH-COO- (CH 2) 2 -C 4 F 9,
CH 2 ═C (CH 3 ) —COO— (CH 2 ) 2 —C 4 F 9
Etc.
 重合単位(B)は、水酸基を含有する不飽和化合物から導かれる。この化合物は、下記式(b)で表される化合物であることが好ましい。
CH=C(R)-C(O)O-Q-OH (b)
 式中、R:式(a)における定義と同じであり、Q:2価の連結基である。
 Qは、2価の連結基であれば適宜選択可能であり、前記式(a)におけるQと同様のものが挙げられるが、これらに限定されるものではない。
The polymerization unit (B) is derived from an unsaturated compound containing a hydroxyl group. This compound is preferably a compound represented by the following formula (b).
CH 2 ═C (R 1 ) —C (O) O—Q 2 —OH (b)
In the formula, R 1 is the same as defined in formula (a), and Q 2 is a divalent linking group.
Q 2 can be appropriately selected as long as it is a divalent linking group, and examples thereof include, but are not limited to, those similar to Q 1 in formula (a).
 上記のうちでも、下記式(b1)で表される化合物が好ましい。
CH=C(R)-C(O)O-Q-OH (b1)
 式中、Rは前記と同じであり、Qは、アルキレン基、フェニレン基、シクロヘキシレン基、エステル結合、アミド結合、-(CHCHO)-、-(CHCHCHO)-、またはこれらの組合せである(ここでのnは1~30の整数)。これらの基は、たとえば水酸基、アリール基等の置換基を有していてもよい。Qの具体例を表1に示す。Phはフェニル基である。
Figure JPOXMLDOC01-appb-T000001

 上記表1におけるn=1~10
Among these, a compound represented by the following formula (b1) is preferable.
CH 2 ═C (R 1 ) —C (O) O—Q 3 —OH (b1)
In the formula, R 1 is the same as defined above, and Q 3 represents an alkylene group, a phenylene group, a cyclohexylene group, an ester bond, an amide bond, — (CH 2 CH 2 O) n —, — (CH 2 CH 2 CH 2 O) n- , or a combination thereof (where n is an integer from 1 to 30). These groups may have a substituent such as a hydroxyl group or an aryl group. Specific examples of Q 3 shown in Table 1. Ph is a phenyl group.
Figure JPOXMLDOC01-appb-T000001

N = 1 to 10 in Table 1 above
 本発明に係る重合体は、上記のような重合単位(A)および重合単位(B)の各少なくとも1種を含有する共重合体であり、重合単位(B)が、式(b)で表される化合物から導かれるものであるのが好ましく、重合単位(A)が式(a1)で表される化合物から導かれ、かつ重合単位(B)が式(b1)で表される化合物から導かれるものであるのがより好ましい。 The polymer according to the present invention is a copolymer containing at least one of the above polymerized units (A) and polymerized units (B), and the polymerized units (B) are represented by the formula (b). It is preferable that the polymerization unit (A) is derived from the compound represented by the formula (a1) and the polymerization unit (B) is derived from the compound represented by the formula (b1). It is more preferable that they are used.
 重合体の重合単位(A)の含有量は、好ましくは90質量%以上であり、より好ましくは95質量%以上である。重合単位(A)の含有量が90質量%以上であれば、撥IPA性能を保持し、這い上がり防止性能を保持することができる。 The content of polymer units (A) in the polymer is preferably 90% by mass or more, and more preferably 95% by mass or more. When the content of the polymerization unit (A) is 90% by mass or more, the IPA performance can be maintained and the creeping prevention performance can be maintained.
 重合体の重合単位(B)の含有量は、好ましくは0.1~10質量%であり、より好ましくは0.5~5質量%である。上記範囲内であると、共重合体の撥IPA性能が向上し、良好なフラックスの這い上がり防止性能を得ることができる。含有量が少なすぎると這い上がり防止性能が低く、含有量が多すぎると共重合体の溶剤への溶解性が著しく低くなる。
 なお、本発明に係る重合体において、各重合単位の含有量は、実質的に、重合仕込み量とみなすことができる。また、重合単位(A)または(B)において、重合単位が2種以上からなる場合には、上記含有量は、各重合単位の合計でのものである。
The content of the polymer units (B) in the polymer is preferably 0.1 to 10% by mass, more preferably 0.5 to 5% by mass. When the content is within the above range, the IPA performance of the copolymer is improved, and good anti-cracking performance of the flux can be obtained. When the content is too small, the creeping prevention performance is low, and when the content is too large, the solubility of the copolymer in the solvent is remarkably lowered.
In the polymer according to the present invention, the content of each polymerization unit can be substantially regarded as a polymerization charge amount. In the polymerization unit (A) or (B), when the polymerization unit is composed of two or more kinds, the content is the total of the respective polymerization units.
 本発明に係る重合体は、上記のような重合単位(A)および(B)とともに、他の重合単位(C)を含んでいてもよい。他の重合単位(C)は、上記(A)および(B)を形成する化合物と共重合しうる化合物から導かれる重合単位であれば特に限定されない。この化合物として、通常、重合性基を有する化合物(c)が挙げられ、具体的には、スチレン系化合物(c1)、上記重合単位(A)および(B)について例示した化合物以外の(メタ)アクリル酸系化合物(c2)などの不飽和基を有する化合物(c)およびさらに他の重合性化合物(c3)が挙げられる。このような化合物(c)の具体例を以下に示すが、これらに限定されるものではない。 The polymer according to the present invention may contain other polymer units (C) in addition to the polymer units (A) and (B) as described above. The other polymerization unit (C) is not particularly limited as long as it is a polymerization unit derived from a compound that can be copolymerized with the compounds forming the above (A) and (B). Examples of this compound include a compound (c) having a polymerizable group. Specifically, (meth) other than the compounds exemplified for the styrene compound (c1) and the polymerized units (A) and (B). Examples thereof include a compound (c) having an unsaturated group such as an acrylic acid compound (c2) and a further polymerizable compound (c3). Although the specific example of such a compound (c) is shown below, it is not limited to these.
 上記(c1)としては、下記式で表わされるスチレン系化合物が挙げられる。
Figure JPOXMLDOC01-appb-C000002

 式中、R:-H、CH、-Cl、-CHO、-COOH、-CHCl、-CHNH、-CHN(CH)、-CHN(CH)Cl、-CHNHCl、-CHCN、-CHCOOH、-CHN(CHCOOH)、-CHSH、-CHSONaまたは-CHOCOCHである。
As said (c1), the styrene-type compound represented by a following formula is mentioned.
Figure JPOXMLDOC01-appb-C000002

In the formula, R 2 : —H, CH 3 , —Cl, —CHO, —COOH, —CH 2 Cl, —CH 2 NH 2 , —CH 2 N (CH 3 ) 2 , —CH 2 N (CH 3 ) 3 Cl, —CH 2 NH 3 Cl, —CH 2 CN, —CH 2 COOH, —CH 2 N (CH 2 COOH) 2 , —CH 2 SH, —CH 2 SO 3 Na or —CH 2 OCOCH 3 .
 上記(c2)としては、アクリル酸、メタクリル酸および下記式で表わされる(メタ)アクリレートが挙げられる。
CH=C(R)-COO-R
 式中、R:水素原子またはメチル基であり、R:-CH-CHCHN(CH)、-(CH)H (m=2~20)、-CHCH(CH)、-CH-C(CH)-OCO-Ph、-CHPh、-CHCHOPh、-CHN(CHCl、-(CHCHO)CH(m=2~20)、-(CH)-NCO、
Figure JPOXMLDOC01-appb-C000003

である。
Examples of (c2) include acrylic acid, methacrylic acid, and (meth) acrylate represented by the following formula.
CH 2 ═C (R 1 ) —COO—R 3
In the formula, R 1 is a hydrogen atom or a methyl group, and R 3 is —CH 3 —CH 2 CH 2 N (CH 3 ) 2 , — (CH 2 ) m H (m = 2 to 20), —CH 2 CH (CH 3 ) 2 , —CH 2 —C (CH 3 ) 2 —OCO—Ph, —CH 2 Ph, —CH 2 CH 2 OPh, —CH 2 N (CH 3 ) 3 Cl, — (CH 2 CH 2 O) m CH 3 (m = 2 to 20), — (CH 2 ) 2 —NCO,
Figure JPOXMLDOC01-appb-C000003

It is.
 上記(c2)としては、さらに、アクリル酸ジエステル等の(メタ)アクリル酸のポリエステルおよび下記式で表わされる化合物なども挙げられる。
CH=C(R)-CONH-R
 式中、R:水素原子またはメチル基であり、R:-C2m+1(m=2~20)、-Hである。
Examples of (c2) further include polyesters of (meth) acrylic acid such as acrylic acid diesters and compounds represented by the following formula.
CH 2 = C (R 1 ) -CONH-R 4
In the formula, R 1 is a hydrogen atom or a methyl group, and R 4 is —C m H 2m + 1 (m = 2 to 20), —H.
 さらに他の重合性化合物(c3)としては、上記(c1)および(c2)以外のビニル化合物、たとえば塩化ビニル(CH=CHCl)、アクリロニトリル(CH=CHCN)などが挙げられる。
 また、重合性化合物(c3)としては、以下のようなエポキシ基を有する不飽和エステルも挙げられる。
Figure JPOXMLDOC01-appb-C000004
Still other polymerizable compounds (c3) include vinyl compounds other than the above (c1) and (c2), such as vinyl chloride (CH 2 ═CHCl) and acrylonitrile (CH 2 ═CHCN).
Moreover, as a polymeric compound (c3), the unsaturated ester which has the following epoxy groups is also mentioned.
Figure JPOXMLDOC01-appb-C000004
 本発明に係る重合体は、重合単位(C)として、上記のような化合物(c)の1種または2種以上から導かれる重合単位を含むことができ、その種類によっても異なるが、重合単位(C)全量で、50質量%以下、好ましくは20質量%以下の量で含むことができる。 The polymer according to the present invention can contain, as the polymerized unit (C), a polymerized unit derived from one or more of the compounds (c) as described above. (C) The total amount may be 50% by mass or less, preferably 20% by mass or less.
 上記のような重合体の分子量が小さいと、十分に這い上がり防止性能を発揮することができない。このため、本発明に係る重合体は、上記のような構造とともに、這い上がり防止性能を充分に発揮するための高分子量を必要とし、具体的には、重量平均分子量(Mw)で15万以上の分子量をもつのが好ましく、より好ましくは18万以上、さらに好ましくは20万以上である。しかしながら、分子量が余りにも大きすぎると溶媒への溶解性、重合物の取り扱いが困難になるため、最大でも200万までが好ましく、100万以下がより好ましい。50万以下でも充分な場合もある。
 なお、本発明における重量平均分子量とは、GPC(ゲル浸透クロマトグラフィー;カラム充填剤:スチレンジビニルベンゼン共重合体,移動層:アサヒクリンAK-225(商品名)により測定されるポリメチルメタクリレート(標準物質)換算分子量である。
If the molecular weight of the polymer as described above is small, it will not be possible to exhibit sufficient creeping prevention performance. For this reason, the polymer according to the present invention requires a high molecular weight for sufficiently exhibiting the creeping prevention performance in addition to the structure as described above. Specifically, the polymer has a weight average molecular weight (Mw) of 150,000 or more. The molecular weight is preferably 180,000 or more, more preferably 200,000 or more. However, if the molecular weight is too large, solubility in a solvent and handling of a polymer become difficult, so that it is preferably at most 2 million, more preferably 1 million or less. Even 500,000 or less may be sufficient.
In the present invention, the weight average molecular weight is defined as GPC (gel permeation chromatography; column filler: styrene divinylbenzene copolymer, moving layer: polymethyl methacrylate (standard name) measured by Asahiklin AK-225 (trade name). Substance) The molecular weight in terms of conversion.
 本発明に係る重合体は、上記のような重合単位(A)および(B)、付加的な重合単位(C)を含む以外は、重合形態などについては特に制限されない。重合形態は、ランダム、ブロック、グラフトなどのいずれでもよく、特に制限されないが、通常、ランダム共重合体が好ましい。 The polymer according to the present invention is not particularly limited with respect to the polymerization form and the like except that it includes the above-described polymerization units (A) and (B) and an additional polymerization unit (C). The polymerization form may be any of random, block, graft and the like, and is not particularly limited, but usually a random copolymer is preferred.
 その製造方法についても特に制限されないが、本発明では、通常、各化合物中の不飽和基に基づき付加重合させることができる。重合に際しては、公知の不飽和化合物の付加重合条件を適宜に採択して行うことができる。たとえば重合開始源としては、特に限定されないが、有機過酸化物、アゾ化合物、過硫酸塩等の通常の開始剤が利用できる。 The production method is not particularly limited, but in the present invention, it is usually possible to carry out addition polymerization based on unsaturated groups in each compound. The polymerization can be carried out by appropriately adopting known addition polymerization conditions for unsaturated compounds. For example, the polymerization initiation source is not particularly limited, and usual initiators such as organic peroxides, azo compounds and persulfates can be used.
 本発明に係る重合体を重合する際には、重合原料の上記化合物とともに、本発明の効果を損ねない範囲において、所望されるその他の成分を使用してもよい。その他の成分としては、上記開始剤、さらには重合調整剤、重合触媒、反応性の染料および帯電防止剤等が挙げられる。このようなその他の成分の重合体中の合計含有率は、好ましくは10質量%以下、より好ましくは5質量%以下、さらに好ましくは1質量%以下である。 When polymerizing the polymer according to the present invention, other desired components may be used together with the above-mentioned compound as a polymerization raw material within a range not impairing the effects of the present invention. Examples of the other components include the above initiator, a polymerization regulator, a polymerization catalyst, a reactive dye, and an antistatic agent. The total content of such other components in the polymer is preferably 10% by mass or less, more preferably 5% by mass or less, and still more preferably 1% by mass or less.
 本発明の這い上がり防止剤は、上記重合体を含み、通常、該重合体が溶媒に溶解または分散した液状組成物である。このため、重合体を後述する溶媒を重合媒体とする溶液重合で製造し、重合により液状組成物を直接調製することは好ましい態様である。重合原料の化合物が、塩化ビニルなどのガスである場合には、圧力容器を用いて、加圧下に連続供給してもよい。 The scooping preventive agent of the present invention is a liquid composition containing the above-mentioned polymer and usually dissolved or dispersed in a solvent. For this reason, it is a preferred embodiment that the polymer is produced by solution polymerization using a solvent described later as a polymerization medium, and the liquid composition is directly prepared by polymerization. When the polymerization raw material compound is a gas such as vinyl chloride, it may be continuously supplied under pressure using a pressure vessel.
 組成物を形成する溶媒は、重合体を溶解または分散できるものであればよく、特に限定されず、各種有機溶媒、水、またはこれらの混合媒体などが挙げられる。重合体は、特にフッ素系溶媒に溶解しやすく、ハイドロクロロフルオロカーボン(HCFC)およびパーフルロカーボン(PFC)の使用も可能である。社会的環境問題を考慮すると、ハイドロフルオロカーボン(HFC)またはハイドロフルオロエーテル(HFE)などが好ましい。使用可能なフッ素系溶媒の具体例を以下に示すが、これらに限定されるものではない。 The solvent for forming the composition is not particularly limited as long as it can dissolve or disperse the polymer, and examples thereof include various organic solvents, water, and mixed media thereof. The polymer is particularly easily dissolved in a fluorinated solvent, and hydrochlorofluorocarbon (HCFC) and perfluorocarbon (PFC) can also be used. In consideration of social environmental problems, hydrofluorocarbon (HFC) or hydrofluoroether (HFE) is preferable. Specific examples of usable fluorine-based solvents are shown below, but are not limited thereto.
m-キシレンヘキサフルオリド(以下、m-XHFと記す。)、
p-キシレンヘキサフルオリド(以下、p-XHFと記す。)、
CFCHCFCH
CFCHCFH、
13OCH
13OC
OCH
OC
13H、
CFHCFCHOCFCFH、
CFCFHCFHCFCH
CF(OCFCFn(OCFmOCFH(m、nはいずれも1~20)、
17OCH
15OCH
OCH
OC
CF(CFOC
(CFCFCFOC
CHCH
CFCHOCFCFCFH、
CFCFCHCl
CClFCFCHClF
およびこれらの混合物。
 たとえばCFCFCHClとCClFCFCHClFとの混合物がアサヒクリンAK-225(旭硝子(株)製)の商品名で、CF(CFOCと(CFCFCFOCとのハイドロフルオロエーテル混合物がノベックHFE7200(3M社製)の商品名で入手可能である。
m-xylene hexafluoride (hereinafter referred to as m-XHF),
p-xylene hexafluoride (hereinafter referred to as p-XHF),
CF 3 CH 2 CF 2 CH 3 ,
CF 3 CH 2 CF 2 H,
C 6 F 13 OCH 3 ,
C 6 F 13 OC 2 H 5 ,
C 3 F 7 OCH 3 ,
C 3 F 7 OC 2 H 5 ,
C 6 F 13 H,
CF 2 HCF 2 CH 2 OCF 2 CF 2 H,
CF 3 CFHCFHCF 2 CH 3,
CF 3 (OCF 2 CF 2 ) n (OCF 2 ) m OCF 2 H (m and n are each 1 to 20),
C 3 F 17 OCH 3 ,
C 7 F 15 OCH 3 ,
C 4 F 9 OCH 3 ,
C 4 F 9 OC 2 H 5 ,
CF 3 (CF 2 ) 3 OC 2 H 5 ,
(CF 3 ) 2 CFCF 2 OC 2 H 5 ,
C 4 F 9 CH 2 CH 3 ,
CF 3 CH 2 OCF 2 CF 2 CF 2 H,
CF 3 CF 2 CHCl 2 ,
CClF 2 CF 2 CHClF
And mixtures of these.
For example, a mixture of CF 3 CF 2 CHCl 2 and CClF 2 CF 2 CHClF is a trade name of Asahi Clin AK-225 (manufactured by Asahi Glass Co., Ltd.), and CF 3 (CF 2 ) 3 OC 2 H 5 and (CF 3 ) A hydrofluoroether mixture with 2 CFCF 2 OC 2 H 5 is available under the trade name Novec HFE 7200 (manufactured by 3M).
 本発明の這い上がり防止剤は、通常、上記重合体を好ましくは0.001~10質量%、より好ましくは0.01~1質量%の濃度で含む。重合体の濃度がこの範囲内であれば、這い上がり防止性能を十分に発揮でき、組成物の安定性も良好である。なお這い上がり防止剤中の上記重合体濃度は、最終的濃度であればよく、たとえば這い上がり防止剤を重合組成物として直接調製する場合には、重合直後の重合組成物の重合体濃度(固形分濃度)が10質量%を超えていてもなんら差し支えない。高濃度の重合組成物は、最終的に上記好ましい濃度となるように適宜に希釈することができる。 The scooping preventive agent of the present invention usually contains the above polymer in a concentration of preferably 0.001 to 10% by mass, more preferably 0.01 to 1% by mass. If the concentration of the polymer is within this range, the creeping prevention performance can be sufficiently exhibited, and the stability of the composition is also good. The concentration of the polymer in the scooping prevention agent may be a final concentration. For example, when the scooping prevention agent is directly prepared as a polymerization composition, the polymer concentration of the polymerization composition immediately after polymerization (solid The partial concentration) may exceed 10% by mass. The high-concentration polymerization composition can be appropriately diluted so that the final desired concentration is obtained.
 本発明の這い上がり防止剤は、組成物の安定性、フラックス這い上がり防止性能または外観等に悪影響を与えない範囲であれば、任意の所望成分を含んでいてもよい。このような成分としては、たとえば被膜表面の腐食を防止するためのpH調整剤、防錆剤、組成物を希釈して使用する場合に液中の重合体の濃度管理をする目的や未処理部品との区別をするための染料、染料の安定剤、難燃剤、消泡剤、および帯電防止剤等が挙げられる。 The scooping preventive agent of the present invention may contain any desired component as long as it does not adversely affect the stability of the composition, the flux scooping prevention performance or the appearance. Such components include, for example, pH control agents, rust preventives for preventing corrosion of the coating surface, the purpose of controlling the concentration of the polymer in the liquid when the composition is diluted, and untreated parts Dyes, dye stabilizers, flame retardants, antifoaming agents, antistatic agents, and the like.
 本発明では、電子部材の表面のはんだ付けする箇所の一部または全部に、上記のような這い上がり防止剤の被膜を形成し、該被膜の一部または全部をはんだ用フラックスで処理した後、はんだ付けする、電子部材のはんだ付け方法が提供される。この際には、這い上がり防止剤を目的および用途に応じて、任意の濃度に希釈し、電子部材に被覆することができる。被覆方法としては、一般的な被覆加工方法が採用できる。たとえば、浸漬塗布、スプレー塗布、または本発明の組成物を充填したエアゾール缶による塗布等の方法がある。 In the present invention, a coating film of the scooping-up preventing agent as described above is formed on a part or all of the soldering portion of the surface of the electronic member, and after treating a part or all of the coating film with a soldering flux, An electronic member soldering method for soldering is provided. In this case, the scooping-up preventing agent can be diluted to an arbitrary concentration according to the purpose and application and coated on the electronic member. As a coating method, a general coating method can be employed. For example, there are methods such as dip coating, spray coating, or coating with an aerosol can filled with the composition of the present invention.
 電子部材としては、具体的に、コネクタ、スイッチ、ボリューム、または半固定抵抗等の電気接点を有する電子部品、電気接点を有するプリント基板などが挙げられる。本発明の這い上がり防止剤で被覆される箇所としては、プリント基板にコネクタ等の電子部品をはんだ付けする際に、フラックスの這い上がりが起こりうる箇所が挙げられる。より詳しくは、プリント基板に取り付けるコネクタ等の電子部品の付け根部分、プリント基板の電子部品本体が実装される側の基板表面、または電子部品を取り付けるためのプリント基板に設けられたスルーホール等が挙げられる。また、電子部品またはプリント基板の表面全体に被覆してもよく、上記以外の被覆方法も採用できる。たとえば、被覆効率のよい全浸漬または半浸漬による方法も採用できる。 Specific examples of the electronic member include an electronic component having an electrical contact such as a connector, a switch, a volume, or a semi-fixed resistor, and a printed circuit board having an electrical contact. Examples of the location covered with the scooping preventive agent of the present invention include a location where a flux scooping may occur when an electronic component such as a connector is soldered to a printed circuit board. More specifically, a base part of an electronic component such as a connector to be attached to the printed board, a substrate surface on the side of the printed board on which the electronic component main body is mounted, or a through hole provided in the printed board for attaching the electronic component, etc. It is done. Moreover, you may coat | cover the whole surface of an electronic component or a printed circuit board, and can also employ | adopt coating methods other than the above. For example, a method of full immersion or semi-immersion with good coating efficiency can be employed.
 這い上がり防止剤塗布後は、溶媒の沸点以上の温度で乾燥を行うことがより好ましい。無論、被処理部品の材質などにより、加熱乾燥が困難な場合には、加熱を回避して乾燥すべきである。なお、加熱条件は、塗布する組成物の組成や、塗布面積等に応じて選択すればよい。 It is more preferable to perform drying at a temperature equal to or higher than the boiling point of the solvent after application of the scooping inhibitor. Of course, when heating and drying are difficult due to the material of the parts to be processed, etc., heating should be avoided to dry. In addition, what is necessary is just to select heating conditions according to the composition of the composition to apply | coat, an application area, etc.
 本発明の這い上がり防止剤は、電子部品またはプリント基板等の電子部材の表面に被膜を形成させ、はんだ用フラックスの這い上がりを防止する。したがって本発明により、フラックスによる腐食が防止された電子部品またはプリント基板等の電子部材が提供される。 The scooping preventive agent of the present invention forms a film on the surface of an electronic member such as an electronic component or a printed circuit board and prevents scooping of the solder flux. Therefore, according to the present invention, an electronic member such as an electronic component or a printed board in which corrosion due to flux is prevented is provided.
 上記により被膜(乾燥)が表面に形成された電子部品またはプリント基板等の電子部材は、次にはんだ用フラックスで処理され、その後、はんだ付けが行われる。はんだ付けの方法は特に制限されることなく、従来公知の方法に従って実施される。
 フラックス及びはんだの種類についても、特に制限されることはなく、電子部材のはんだ付けに常用されているものが使用可能である。
An electronic component such as an electronic component or a printed circuit board having a coating (dried) formed on the surface as described above or a printed board is then treated with a soldering flux, and then soldered. The soldering method is not particularly limited, and is performed according to a conventionally known method.
The types of flux and solder are not particularly limited, and those commonly used for soldering electronic members can be used.
 そして該電子部品またはプリント基板等の電子部材は種々の電気製品の材料として用いられる。該電気製品は、フラックスによる腐食が原因で起こる障害が防止された、優れた品質の電気製品である。該電気製品の具体例としては、コンピュータ用機器、テレビ、オーディオ用機器(ラジオカセット、コンパクトディスク、ミニディスク)等に用いられる機器用、携帯電話などが挙げられる。 The electronic components or electronic members such as printed boards are used as materials for various electric products. The electrical product is an excellent quality electrical product in which a failure caused by corrosion due to flux is prevented. Specific examples of the electric products include devices for computer devices, televisions, audio devices (radio cassettes, compact discs, minidiscs), mobile phones, and the like.
 以下に本発明を具体的に説明するが、本発明は以下の実施例に限定されるものではない。なお、特に断わりのない限り、以下の実施例の記載において「%」で表示されるものは「質量%」を表すものとする。
 以下の調製例で使用した重合モノマーを表2に示す。これらの化合物は、すべて市場から試薬として入手することができる。
The present invention will be specifically described below, but the present invention is not limited to the following examples. Unless otherwise specified, what is indicated by “%” in the description of the following examples represents “mass%”.
The polymerization monomers used in the following preparation examples are shown in Table 2. All of these compounds are commercially available as reagents.
Figure JPOXMLDOC01-appb-T000005
Figure JPOXMLDOC01-appb-T000005
(実施例1~5)
<重合組成物の調製>
 密閉容器に、モノマー、重合溶剤(m-XHF)、開始剤のジメチル2,2'-アゾビス(2-メチルプロピオナート)(V-601:和光純薬工業(株)製商品名)を、それぞれ表3に記載の仕込み比で仕込み、70℃で26時間反応を行い、重合組成物1~5を得た。以下のように求めた各重合組成物の各重合体の分子量を表3に示す。
 以下において、重合組成物を希釈する際には、反応により得られた所定量の重合組成物を120℃で2時間乾燥させた後の乾燥残分を重合体として秤量し、重合組成物の重合体濃度%(質量%)を求めた。
(Examples 1 to 5)
<Preparation of polymerization composition>
In a closed container, monomer, polymerization solvent (m-XHF), initiator dimethyl 2,2′-azobis (2-methylpropionate) (V-601: Wako Pure Chemical Industries, Ltd., trade name) Each was charged at the charging ratio shown in Table 3, and reacted at 70 ° C. for 26 hours to obtain polymerization compositions 1 to 5. Table 3 shows the molecular weight of each polymer of each polymerization composition determined as follows.
In the following, when diluting the polymerization composition, a predetermined amount of the polymerization composition obtained by the reaction is dried at 120 ° C. for 2 hours, and the dry residue is weighed as a polymer. The coalescence concentration% (mass%) was determined.
[重量平均分子量の測定]
 重合組成物を、重合体の濃度が約1%になるように、アサヒクリンAK-225(旭硝子(株)製)を用いて希釈し、測定サンプルとした。昭和電工株式会社製Shodex GPC-104を用いて、以下の条件でGPCを測定した。
<GPC測定条件>
Separtion Column:LF-604(充填剤:スチレンジビニルベンゼン共重合体,昭和電工株式会社製)×2
Default Column:KF600RH(充填剤:なし,昭和電工株式会社製)×2
Clean Liquid:AK-225
Flow Rate:0.2ml/min
標準物質:ポリメチルメタクリレート
[Measurement of weight average molecular weight]
The polymerization composition was diluted with Asahiklin AK-225 (manufactured by Asahi Glass Co., Ltd.) so that the concentration of the polymer was about 1%, and used as a measurement sample. GPC was measured under the following conditions using Shodex GPC-104 manufactured by Showa Denko K.K.
<GPC measurement conditions>
Separtion Column: LF-604 (Filler: Styrene divinylbenzene copolymer, Showa Denko KK) x 2
Default Column: KF600RH (filler: none, Showa Denko KK) x 2
Clean Liquid: AK-225
Flow Rate: 0.2ml / min
Reference material: Polymethylmethacrylate
(比較例1~9)
 表3に記載の仕込みモノマーに代えた以外は、実施例1と同様にして比較重合組成物1~9を得た。実施例と同様にして求めた各重合組成物の各重合体の分子量を表3に示す。
(Comparative Examples 1 to 9)
Comparative polymerization compositions 1 to 9 were obtained in the same manner as in Example 1 except that the charged monomers listed in Table 3 were used. Table 3 shows the molecular weight of each polymer of each polymerization composition obtained in the same manner as in the Examples.
Figure JPOXMLDOC01-appb-T000006
Figure JPOXMLDOC01-appb-T000006
(試験1)撥IPA性
 上記実施例および比較例で得られた各重合組成物を、HFE7200(3M社製)で希釈し、重合体濃度0.05%の各はんだ用フラックス這い上がり防止剤を調製した。
 このはんだ用フラックス這い上がり防止剤について、IPAに対する接触角を測定し、撥IPA性を評価した。結果を上記表3に示す。接触角の測定方法は以下のとおりである。
[接触角の測定]
 銀めっき加工(3μm)を施したテストピースに防止剤の各々に、常温で1分間浸漬後、取出して室温で乾燥させて、這い上がり防止剤の被膜を処理した。該銀めっき板に、2-プロパノール(IPA)を滴下して接触角の測定を行った。接触角の測定には、自動接触角計OCA-20[dataphysics社製]を用いた。
(Test 1) IPA Repellency Each polymerization composition obtained in the above Examples and Comparative Examples was diluted with HFE7200 (manufactured by 3M), and a flux scooping inhibitor for each solder having a polymer concentration of 0.05% was added. Prepared.
About this solder flux creeping-up inhibitor, the contact angle with respect to IPA was measured and IPA repellency was evaluated. The results are shown in Table 3 above. The contact angle measurement method is as follows.
[Measurement of contact angle]
A test piece subjected to silver plating (3 μm) was immersed in each of the inhibitors for 1 minute at room temperature, then taken out and dried at room temperature to treat the scooping-up inhibitor film. 2-propanol (IPA) was dropped onto the silver plating plate, and the contact angle was measured. For the measurement of the contact angle, an automatic contact angle meter OCA-20 (manufactured by dataphysics) was used.
(試験2)
 実施例1~5の重合組成物を、HFE7200を用いて希釈し、重合体濃度1%のはんだ用フラックス這い上がり防止剤を調製した。
 銀めっき加工(3μm)を施したテストピースを、上記各這い上がり防止剤中に、常温で1分間浸漬後、取出して室温で乾燥させて、這い上がり防止剤による処理を行なった。
(Test 2)
The polymerization compositions of Examples 1 to 5 were diluted with HFE7200 to prepare solder flux creep-up inhibitors having a polymer concentration of 1%.
A test piece subjected to silver plating (3 μm) was dipped in each scooping preventive agent at room temperature for 1 minute, then taken out and dried at room temperature, and treated with a scooping preventive agent.
[接触抵抗の測定]
 処理後の各テストピースについて、以下の条件で接触抵抗を測定した。
接触抵抗接触抵抗評価・測定装置:MS2007(ファクトケイ株式会社)
プローブ:Pt,φ=1mm
基材:銀めっき板(10×50×1mm、日本テストパネル株式会社)
処理条件:1分間浸漬後、室温で20分以上風乾。
測定荷重:5gf~100gf
[Measurement of contact resistance]
About each test piece after a process, contact resistance was measured on condition of the following.
Contact resistance Contact resistance evaluation / measurement device: MS2007 (Fact Kei Co., Ltd.)
Probe: Pt, φ = 1mm
Base material: Silver plated plate (10 × 50 × 1 mm, Nippon Test Panel Co., Ltd.)
Treatment conditions: After immersion for 1 minute, air-dry at room temperature for 20 minutes or more.
Measurement load: 5gf-100gf
[はんだ濡れ性(ゼロクロスタイム)の測定]
 上記処理後の各テストピースについて、ゼロクロスタイムを測定した。
 ゼロクロスタイムははんだの濡れ性の目安であり、短時間の方が濡れやすいことを意味し、性能が良好と評価される。
[Measurement of solder wettability (zero cross time)]
The zero cross time was measured for each test piece after the above treatment.
Zero cross time is a measure of the wettability of the solder, meaning that it is easier to wet in a short time, and the performance is evaluated as good.
 ゼロクロスタイムの測定には、SAT-5100(株式会社レスカ)を用いた。
<測定条件>
使用はんだ:H63A-B20(共晶はんだ、千住金属工業株式会社)
はんだ温度:235℃
フラックス:ロジンフラックス25%IPA溶液(千住金属工業株式会社)
基材:銀めっき板(10×30×0.3mm、株式会社レスカ)
浸漬条件:浸漬速度:20mm/sec、浸漬深さ:2mm、浸漬時間:10sec
処理条件:1分間浸漬後、室温で20分以上風乾。
SAT-5100 (Resca Co., Ltd.) was used for the zero cross time measurement.
<Measurement conditions>
Solder used: H63A-B20 (eutectic solder, Senju Metal Industry Co., Ltd.)
Solder temperature: 235 ° C
Flux: Rosin flux 25% IPA solution (Senju Metal Industry Co., Ltd.)
Base material: Silver-plated plate (10 x 30 x 0.3 mm, Reska Co., Ltd.)
Immersion conditions: Immersion speed: 20 mm / sec, Immersion depth: 2 mm, Immersion time: 10 sec
Treatment conditions: After immersion for 1 minute, air-dry at room temperature for 20 minutes or more.
 接触抵抗およびはんだ濡れ性(ゼロクロスタイム)の評価結果を表4に示す。
 這い上がり防止剤としては、一般的な這い上がり防止剤の濃度よりもかなり濃い1%濃度で処理を行っても、未処理とほとんど変わらない接触抵抗を示した。このことより、這い上がり防止剤による被膜が電気部品の接点部に形成されても、接触不良を起こす可能性が非常に低いことが確認できた。
 また、上記1%濃度で処理後のゼロクロスタイムについても、1秒以下であることから、這い上がり防止被膜がはんだ付け部分に処理されていても、はんだ付けに影響を与えないことが確認できた。
Table 4 shows the evaluation results of contact resistance and solder wettability (zero cross time).
As the scooping-up preventing agent, even when the treatment was performed at a concentration of 1% which is considerably higher than the concentration of a general scooping-up preventing agent, the contact resistance was almost the same as that of untreated. From this, it was confirmed that even if a film made of the scooping-up preventing agent is formed on the contact portion of the electrical component, the possibility of contact failure is very low.
Moreover, since the zero cross time after the treatment at the above 1% concentration is also 1 second or less, it has been confirmed that even if the scooping prevention coating is processed on the soldered portion, it does not affect the soldering. .
Figure JPOXMLDOC01-appb-T000007
Figure JPOXMLDOC01-appb-T000007
 上記のように、本発明の這い上がり防止剤は、パーフルオロアルキル基の炭素数が6以下であっても、低濃度における撥IPA性が、従来のパーフルオロアルキル基の炭素数が8以上のものと同等であった。この事は、本発明が、生体および環境へのリスクを大きく低下させながらも、従来品と同程度の高い性能を有する這い上がり防止剤の提供を可能にすることを示している。 As described above, the creep-up preventing agent of the present invention has a low concentration of IPA repellency even when the perfluoroalkyl group has 6 or less carbon atoms, and the conventional perfluoroalkyl group has 8 or more carbon atoms. It was equivalent to the one. This indicates that the present invention makes it possible to provide an anti-cracking agent having high performance comparable to that of conventional products while greatly reducing risks to living bodies and the environment.
(試験3)
 実施例1,4および5と、比較例1,2,8および9で得られた重合組成物を、HFE7200で希釈し、重合体濃度0.05%および0.01%の極低濃度の希釈液を調製し、それらのフラックスの這い上がり性能を検討した。具体的な這い上がり性能評価の一例として、サイド型コネクター05FDZ-ST(S)(LF)(SN)(日本圧着端子製)を用い、いくつかの試験的条件を設定する方法により、以下のような試験を実施した。
 コネクター部品を上記希釈液に1分間浸漬し、取り出した後室温で30分間乾燥させた。コネクター部品を、リード線の付け根までフラックスに10秒間漬けた。部品を基板に設置し、部品を設置した状態ではんだ付け面をフラックスに漬けた。235℃で溶融させた共晶はんだ(H63A-B20 千住金属工業株式会社)に、はんだ付け面を漬け、はんだ付けを行った。コネクター部品を解体して、接点部分にフラックスが這い上がっているかどうかを確認した。
 上記のようなフラックスの這い上がり性能評価の結果を表5に示す。本発明の重合組成物は、低濃度でも充分な性能を示すことが確認できた。
(Test 3)
The polymerization compositions obtained in Examples 1, 4 and 5 and Comparative Examples 1, 2, 8 and 9 were diluted with HFE7200, and diluted at extremely low concentrations with polymer concentrations of 0.05% and 0.01%. Liquids were prepared and the creeping performance of those fluxes was examined. As an example of a specific climbing performance evaluation, a side type connector 05FDZ-ST (S) (LF) (SN) (manufactured by Nippon Crimp Terminal) was used, and several test conditions were set as follows. Tests were conducted.
The connector part was immersed in the diluted solution for 1 minute, taken out, and dried at room temperature for 30 minutes. The connector part was soaked in the flux for 10 seconds to the root of the lead wire. The component was placed on the board, and the soldering surface was immersed in the flux with the component placed. The soldering surface was dipped in eutectic solder (H63A-B20 Senju Metal Industry Co., Ltd.) melted at 235 ° C. and soldered. The connector parts were disassembled and it was confirmed whether or not the flux crawls up at the contact portions.
Table 5 shows the evaluation results of the flux climbing performance as described above. It has been confirmed that the polymerization composition of the present invention exhibits sufficient performance even at a low concentration.
Figure JPOXMLDOC01-appb-T000008

○:這い上がり無 ×:這い上がり有
Figure JPOXMLDOC01-appb-T000008

○: No scooping up ×: Scooping up

Claims (7)

  1.  下記式(a)で表される化合物から導かれる重合単位(A)と、水酸基を含有する不飽和化合物から導かれる重合単位(B)のそれぞれ少なくとも1種を含有し、重量平均分子量(ポリメチルメタクリレート換算)が15万以上である重合体を含むはんだ用フラックス這い上がり防止組成物:
    CH=C(R1)-C(O)O-Q-R (a)
    式中、R:水素原子またはメチル基、
     Q:単結合または2価の連結基、
     R:主鎖の鎖長が炭素数1~6のポリフルオロアルキル基またはポリフルオロエーテル基を示す。
    It contains at least one polymer unit (A) derived from a compound represented by the following formula (a) and a polymer unit (B) derived from an unsaturated compound containing a hydroxyl group, and has a weight average molecular weight (polymethyl) Flux creep-up preventing composition for solder containing a polymer having a methacrylate equivalent of 150,000 or more:
    CH 2 ═C (R 1 ) —C (O) OQ 1 —R f (a)
    In the formula, R 1 : a hydrogen atom or a methyl group,
    Q 1 : a single bond or a divalent linking group,
    R f represents a polyfluoroalkyl group or polyfluoroether group having a main chain length of 1 to 6 carbon atoms.
  2.  前記R基が炭素数1~6の直鎖のパーフルオロアルキル基またはパーフルオロエーテル基である請求項1に記載の組成物。 The composition according to claim 1, wherein the R f group is a linear perfluoroalkyl group or perfluoroether group having 1 to 6 carbon atoms.
  3.  前記重合単位(B)が、下記式(b)で表される化合物から導かれる請求項1または2に記載の組成物:
    CH=C(R1)-C(O)O-Q-OH (b)
    式中、R:前記式(a)と同じ、Q:2価の連結基。
    The composition according to claim 1 or 2, wherein the polymerization unit (B) is derived from a compound represented by the following formula (b):
    CH 2 ═C (R 1 ) —C (O) O—Q 2 —OH (b)
    Wherein, R 1: same as in the formula (a), Q 2: 2 divalent linking group.
  4.  前記重合体中の前記重合単位(B)の割合が10質量%以下である請求項1~3のいずれかに記載の組成物。 The composition according to any one of claims 1 to 3, wherein a ratio of the polymerization unit (B) in the polymer is 10% by mass or less.
  5.  電子部材のはんだ付けする箇所に、請求項1~4のいずれかに記載の組成物からなる被膜を有し、はんだ用フラックス這い上がり防止性能を有する電子部材。 An electronic member having a coating made of the composition according to any one of claims 1 to 4 at a soldering position of the electronic member and having a solder flux creeping-up preventing performance.
  6.  電子部材のはんだ付けする箇所に、請求項1~4のいずれかに記載の組成物からなる被膜を形成し、該被膜の上にはんだ用フラックスを塗布した後、はんだ付けする、電子部材のはんだ付け方法。 A solder for an electronic member, wherein a film made of the composition according to any one of claims 1 to 4 is formed at a place to be soldered on the electronic member, a solder flux is applied on the film, and then soldered. Attaching method.
  7.  請求項6に記載の方法ではんだ付けした電子部材を含む電気製品。 An electrical product including an electronic member soldered by the method according to claim 6.
PCT/JP2008/071320 2008-01-18 2008-11-25 Flux creeping-up preventive composition for solder, electronic member for solder coated with the composition, method for soldering the member, and electrical appliance WO2009090798A1 (en)

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WO2011152126A1 (en) * 2010-06-02 2011-12-08 Dic株式会社 Cationically polymerizable composition, adhesive containing same, and cured product and polarizing plate which are obtained using same
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