WO2009088278A2 - Temperature compensation method for ion sensor using vt extractor circuit - Google Patents
Temperature compensation method for ion sensor using vt extractor circuit Download PDFInfo
- Publication number
- WO2009088278A2 WO2009088278A2 PCT/MY2008/000193 MY2008000193W WO2009088278A2 WO 2009088278 A2 WO2009088278 A2 WO 2009088278A2 MY 2008000193 W MY2008000193 W MY 2008000193W WO 2009088278 A2 WO2009088278 A2 WO 2009088278A2
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- Prior art keywords
- circuit
- isfet
- sensor
- temperature coefficient
- temperature
- Prior art date
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
- H03F1/301—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters in MOSFET amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/447—Indexing scheme relating to amplifiers the amplifier being protected to temperature influence
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45138—Two or more differential amplifiers in IC-block form are combined, e.g. measuring amplifiers
Definitions
- the present invention relates to the adaptable analog read-out interface circuit for hydrogen ion sensors, and more specific for ion-sensitive field effect transistor (ISFET) pH sensor.
- This interface circuit is invented together with additional CMOS temperature sensor (threshold voltage extraction) in order to improve the ISFET temperature dependence.
- This invention improves the thermal stability of the ISFET and thus gives a more accurate pH lOmeasurement.
- ISFET Ion-sensitive field effect transistor
- ISFET structure is very similar to conventional MOSFET, except for the standard metal gate is replaced by reference electrode and electrolyte.
- the threshold voltage of ISFET is changed due to the change in concentration of hydrogen ions (expressed by the pH change of the 0electrolyte), so that the voltage response is often used as an output signal of the ISFET.
- the sensor To capture the electrical signal generated by a sensor, the sensor (ISFET) must be accompanied with an analog read-out interface.
- the ISFET has problems in reproducibility, stability, drift and temperature dependence. Every improvement in these aspects will undoubtedly increase the usage of ISFET.
- the invented 5analog read-out circuit provides solution in improving ISFET temperature dependence. BACKGROUND ART
- This application only uses a resistor temperature sensor. There is no means for adjustment and tuning.
- This application is without any temperature compensation at all and uses a bridge type technique as ion sensing mechanism.
- This application uses complementary ISFET-MOSFET pair technique for ion sensing mechanism.
- This readout circuit is to cancel the positive temperature coefficient of ISFET with the negative temperature coefficient of Vt circuit. Temperature coefficient of both devices 5can be combined through summation circuit and produce nearly zero temperature coefficient. Thus, the ISFET temperature dependence characteristic is improved.
- the circuit and method consists of 0 i. a constant voltage constant current circuit, ii. tunable CMOS temperature sensor iii. summation circuit with adjustable output voltage level
- the improvement is achieved by summation of the positive temperature coefficient of the ISFET and the negative coefficient of the CMOS temperature sensor. 5 LIST OF ACCOMPANYING DRAWINGS
- FIG. 1 Shows the analog read-out interface circuit with temperature compensation as schematic
- FIG. 10 Shows the Constant Voltage Constant Current (CVCC) circuit as schematic
- a method and circuit for an analog read-out interface circuit for ion sensor consist of : i. a constant voltage constant current circuit, 0 ii. tunable CMOS temperature sensor iii. summation circuit with adjustable output voltage level
- Fig.2 shows the proposed analog readout-interface circuit for pH sensor. It consists of three major components: a threshold voltage (Vt) extraction circuit as temperature sensor (1) , constant- voltage-constant-current (CVCC) circuit (2) and a summation circuit (4).
- Vt threshold voltage
- CVCC constant- voltage-constant-current
- Fig.2 shows the proposed analog readout-interface circuit for pH sensor. It consists of three major components: a threshold voltage (Vt) extraction circuit as temperature sensor (1) , constant- voltage-constant-current (CVCC) circuit (2) and a summation circuit (4).
- Vt threshold voltage
- CVCC constant- voltage-constant-current
- the sensing circuit of Fig.3 detects the ion concentration of the solution with features of constant voltage/constant current operation mode, and floating reference electrode.
- the drainterrninal of the transistor ISFET is connected to the output terminal of the first amplifier OPl (5), where a constant voltage, e.g., 0.95 volts in the figure, is fed to its positive terminal (12).
- the negative terminal is connected to the output terminal (6).
- the source terminal of the transistor ISFET is coupled with the negative terminal of the second amplifier OP2 (7), and coupled with the ground via a resistor R.
- a constant voltage, e.g., 0.75 volts in the figure, is fedto the positive terminal of the second amplifier OP2 (11).
- the output terminal of the second amplifier OP2 is coupled with the reference electrode Ref of the transistor ISFET (8).
- Another amplifier OP3 is connected as a buffer (9). With this configuration, two constant voltages input to the two positive terminals of the amplifiers cause the source terminal S (7) and the drain terminal D (5) of the transistor ISFET to keep a constant .drain-source voltage difference. Thesolution of the ion concentration creates the connection between the reference electrode Ref and gate sensing membrane (terminal G) (10). The potential difference between the gate sensing membrane and the reference electrode Ref (8) is determined by the ion concentration of the solution. (B). Temperature sensor based on Vt extractor circuit
- This temperature sensor uses CMOS circuitry to extract the threshold voltage of an MOS transistor.
- This three terminal 5 Vt Extractor is designed with the inclusion of self-bias and a differential amplifier. The output is equal to the threshold voltage of one of the transistors used in the design. Thus, the negative temperature coefficient is obtained (sweep temperature).
- a variable resistor, Rl (13) , and fixed resistor, R2 (14), are used to control the current and temperature coefficient.
- R2 (14) By adjusting R2 (14) to the right value, the temperature coefficient of lOtemperature sensor can be tuned closely to ISFET temperature coefficient, but its value still negative. It is important to have this option because fabricated ISFET has high possibility to mismatch from expectation.
- the read-out circuitry is completed by feeding electrical signal generated by both temperature sensor and CVCC circuit into summation circuit that mutually offset their temperature coefficient and produces a temperature independent output signal.
- Fig. 5 shows circuit configuration of summation circuit. It consists of an operational amplifier and four additional 0resistors. The output voltage level of summation circuit can be adjusted by controlling input voltage of Vref ( 15).
- This invention is designed at circuit level and simulated using MTMOS 0.35um CMOS technology.
- the simulated result demonstrates that temperature dependence of ISFET 5improved from 1.42mV/°C to less than 0.2m V/°C over a temperature range of O 0 C to 65 0 C.
- the complete layout of this analog read-out interface circuit has been sent for fabrication, waiting for the complete chip to come out. According to a preferred embodiment of the present invention, there are the following circuits:
Abstract
An adaptable analog read-out interface circuit for ion-sensitive field effect transistor (ISFET) has been invented that uses a CMOS temperature sensor (threshold voltage extraction) to improve the thermal stability of the ISFET. The improvement is achieved by summation of the positive temperature coefficient of the ISFET and the negative coefficient of the CMOS temperature sensor.
Description
TITLE OF THE INVENTION
Temperature compensation method for ion sensor using Vt extractor circuit.
TECHNICAL FIELD
5The present invention relates to the adaptable analog read-out interface circuit for hydrogen ion sensors, and more specific for ion-sensitive field effect transistor (ISFET) pH sensor. This interface circuit is invented together with additional CMOS temperature sensor (threshold voltage extraction) in order to improve the ISFET temperature dependence. This invention improves the thermal stability of the ISFET and thus gives a more accurate pH lOmeasurement.
BACKGROUND
Advancement in microelectronic and semiconductor technology has enabled new in capabilities in field of sensor development, particularly of pH sensors based on field effect
15transistor. Ion-sensitive field effect transistor (ISFET), a kind of micro-sensing device invented by Bergveld in 1970 and developed quickly thereafter.
ISFET structure is very similar to conventional MOSFET, except for the standard metal gate is replaced by reference electrode and electrolyte. The threshold voltage of ISFET is changed due to the change in concentration of hydrogen ions (expressed by the pH change of the 0electrolyte), so that the voltage response is often used as an output signal of the ISFET. To capture the electrical signal generated by a sensor, the sensor (ISFET) must be accompanied with an analog read-out interface.
The ISFET has problems in reproducibility, stability, drift and temperature dependence. Every improvement in these aspects will undoubtedly increase the usage of ISFET. The invented 5analog read-out circuit provides solution in improving ISFET temperature dependence.
BACKGROUND ART
There are three patents that deal with our application area.
US Patent 4879517 5Title: Temperature compensation for potentiometrically operated ISFETs
This application only uses a resistor temperature sensor. There is no means for adjustment and tuning.
US Patent 6906524 lOTitle: Electronic circuit for ion sensor
This application is without any temperature compensation at all and uses a bridge type technique as ion sensing mechanism.
15US Patent 20070138028 Title: PH-Change sensor and method
This application uses complementary ISFET-MOSFET pair technique for ion sensing mechanism.
20
PRINCIPAL CONCEPT
The principle of this readout circuit is to cancel the positive temperature coefficient of ISFET with the negative temperature coefficient of Vt circuit. Temperature coefficient of both devices 5can be combined through summation circuit and produce nearly zero temperature coefficient. Thus, the ISFET temperature dependence characteristic is improved.
SUMMARY OF DISCLOSURE
The circuit and method consists of 0 i. a constant voltage constant current circuit, ii. tunable CMOS temperature sensor iii. summation circuit with adjustable output voltage level
The improvement is achieved by summation of the positive temperature coefficient of the ISFET and the negative coefficient of the CMOS temperature sensor. 5
LIST OF ACCOMPANYING DRAWINGS
Figure 1
Shows the analog read-out interface circuit with temperature compensation as Block diagram 5
Figure 2 Shows the analog read-out interface circuit with temperature compensation as schematic
Figure 3 10 Shows the Constant Voltage Constant Current (CVCC) circuit as schematic
Figure 4
Shows the Vt Extractor circuit with TC controller as schematic
ISFigure 5 Shows the summation circuit as schematic
DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS 0In describing the preferred embodiments of the present invention as shown in Figures 1 to 5 specific terminologies shall be used for the sake of clarity in the description.
However, it is to be noted that the present invention is not intended to be limited to the specific terminologies so selected and it is to be understood that each specific terminology shall include all technical equivalents operating in a similar fashion to accomplish a similar objective/ 5purpose.
A method and circuit for an analog read-out interface circuit for ion sensor is invented that consist of : i. a constant voltage constant current circuit, 0 ii. tunable CMOS temperature sensor
iii. summation circuit with adjustable output voltage level
Fig.2 shows the proposed analog readout-interface circuit for pH sensor. It consists of three major components: a threshold voltage (Vt) extraction circuit as temperature sensor (1) , constant- voltage-constant-current (CVCC) circuit (2) and a summation circuit (4). The principle of this readout circuit is to cancel the positive temperature coefficient of ISFET (3) with the negative temperature coefficient of Vt circuit. Temperature coefficient of both devices can be combined through summation circuit (4) and produce nearly zero temperature coefficient. Thus, the ISFET temperature dependence characteristic is improved.
(A). CVCC circuit
The sensing circuit of Fig.3 detects the ion concentration of the solution with features of constant voltage/constant current operation mode, and floating reference electrode. The drainterrninal of the transistor ISFET is connected to the output terminal of the first amplifier OPl (5), where a constant voltage, e.g., 0.95 volts in the figure, is fed to its positive terminal (12). The negative terminal is connected to the output terminal (6). The source terminal of the transistor ISFET is coupled with the negative terminal of the second amplifier OP2 (7), and coupled with the ground via a resistor R. A constant voltage, e.g., 0.75 volts in the figure, is fedto the positive terminal of the second amplifier OP2 (11). The output terminal of the second amplifier OP2 is coupled with the reference electrode Ref of the transistor ISFET (8). Another amplifier OP3 is connected as a buffer (9). With this configuration, two constant voltages input to the two positive terminals of the amplifiers cause the source terminal S (7) and the drain terminal D (5) of the transistor ISFET to keep a constant .drain-source voltage difference. Thesolution of the ion concentration creates the connection between the reference electrode Ref and gate sensing membrane (terminal G) (10). The potential difference between the gate sensing membrane and the reference electrode Ref (8) is determined by the ion concentration of the solution.
(B). Temperature sensor based on Vt extractor circuit
The circuit configuration of this temperature sensor is shown in Fig. 4. This temperature sensor uses CMOS circuitry to extract the threshold voltage of an MOS transistor. This three terminal 5 Vt Extractor is designed with the inclusion of self-bias and a differential amplifier. The output is equal to the threshold voltage of one of the transistors used in the design. Thus, the negative temperature coefficient is obtained (sweep temperature).
A variable resistor, Rl (13) , and fixed resistor, R2 (14), are used to control the current and temperature coefficient. By adjusting R2 (14) to the right value, the temperature coefficient of lOtemperature sensor can be tuned closely to ISFET temperature coefficient, but its value still negative. It is important to have this option because fabricated ISFET has high possibility to mismatch from expectation.
(C) Summation circuit
15
The read-out circuitry is completed by feeding electrical signal generated by both temperature sensor and CVCC circuit into summation circuit that mutually offset their temperature coefficient and produces a temperature independent output signal. Fig. 5 shows circuit configuration of summation circuit. It consists of an operational amplifier and four additional 0resistors. The output voltage level of summation circuit can be adjusted by controlling input voltage of Vref ( 15).
This invention is designed at circuit level and simulated using MTMOS 0.35um CMOS technology. The simulated result demonstrates that temperature dependence of ISFET 5improved from 1.42mV/°C to less than 0.2m V/°C over a temperature range of O0C to 650C. In addition, the complete layout of this analog read-out interface circuit has been sent for fabrication, waiting for the complete chip to come out.
According to a preferred embodiment of the present invention, there are the following circuits:
1. Vt Extractor circuit with TC controller
2. Constant Voltage Constant Current Circuit 3. Summation Circuit
Claims
1. A method for an adaptable analog read-out interface circuit for ISFET based sensor that improves the temperature dependence of the ISFET comprising the steps of: (1) summation of the positive temperature coefficient of the ISFET and the negative temperature coefficient of a CMOS temperature sensor;
(2) tuning of the drift compensation with a variable resistor
2. An adaptable analog read-out interface circuit for ISFET based sensor comprising a means to tune a drift compensation, a means to provide the drift compensation and a means for the ISFET based sensing.
3. The circuit as claimed in 2, wherein the means to provide the drift compensation delivers a negative temperature coefficient using the negative temperature coefficient of a CMOS temperature sensor.
4. The circuit as claimed in 3, wherein the negative temperature coefficient of the drift compensation means is added to the positive temperature coefficient of the
ISFET and by this compensates the temperature dependant drift of the ISFET
5. The circuit as claimed in 4, wherein the negative temperature coefficient of the CMOS temperature sensor is obtained by extracting the threshold voltage of one of the transistors used in the design.
6. The circuit as claimed in any of claims 2 to 5, whereby the means to tune the drift compensation comprises a variable resistor.
7. The circuit as claimed in any of claims 2 to 6, whereby the means for the ISFET based sensing is used as Ph-sensor.
8. A circuit arrangement for an adaptable analog read-out interface circuit for ISFET based sensor, comprising: a Temperature Sensor arrangement; an ISFET which is connected to a Constant Voltage Constant Current circuit
(CVCC): an OP Amp that connects the Temperature Sensor and the CVCC circuit for summation.
9. The circuit arrangement as claimed in 8, wherein the Temperature Sensor arrangement comprises a Vt Extractor which is connected to the positive input terminal of an OP Amp (OP 1), a variable resistor that is connected to the negative input of the said OP Amp (OP 1) and a fixed resistor that is connected between the output and the negative input of the said OP amp (OP 1) to control a temperature coefficient of the Vt Extractor.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
MYPI20080014 | 2008-01-04 | ||
MYPI20080014A MY154799A (en) | 2008-01-04 | 2008-01-04 | Temperature compensation method for ion sensor using vt extractor circuit |
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Publication Number | Publication Date |
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WO2009088278A2 true WO2009088278A2 (en) | 2009-07-16 |
WO2009088278A3 WO2009088278A3 (en) | 2009-10-29 |
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PCT/MY2008/000193 WO2009088278A2 (en) | 2008-01-04 | 2008-12-23 | Temperature compensation method for ion sensor using vt extractor circuit |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017052251A (en) * | 2015-09-11 | 2017-03-16 | 王子ホールディングス株式会社 | Printing sheet, printing sheet with peeling layer, and decorative sheet |
JP2017052252A (en) * | 2015-09-11 | 2017-03-16 | 王子ホールディングス株式会社 | Printing sheet, printing sheet with peeling layer, and decorative sheet |
CN110186987A (en) * | 2019-06-27 | 2019-08-30 | 上海三信仪表厂 | A kind of general 25 degree of translation methods of solution pH value |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4879517A (en) * | 1988-07-25 | 1989-11-07 | General Signal Corporation | Temperature compensation for potentiometrically operated ISFETS |
US6525554B2 (en) * | 2000-07-20 | 2003-02-25 | National Yunlin University Of Science And Technology | Method and apparatus for measuring temperature parameters of an ISFET using hydrogenated amorphous silicon as a sensing film |
-
2008
- 2008-01-04 MY MYPI20080014A patent/MY154799A/en unknown
- 2008-12-23 WO PCT/MY2008/000193 patent/WO2009088278A2/en active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4879517A (en) * | 1988-07-25 | 1989-11-07 | General Signal Corporation | Temperature compensation for potentiometrically operated ISFETS |
EP0352537B1 (en) * | 1988-07-25 | 1996-12-18 | Honeywell Inc. | Temperature compensation for potentiometrically operated isfets |
US6525554B2 (en) * | 2000-07-20 | 2003-02-25 | National Yunlin University Of Science And Technology | Method and apparatus for measuring temperature parameters of an ISFET using hydrogenated amorphous silicon as a sensing film |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017052251A (en) * | 2015-09-11 | 2017-03-16 | 王子ホールディングス株式会社 | Printing sheet, printing sheet with peeling layer, and decorative sheet |
JP2017052252A (en) * | 2015-09-11 | 2017-03-16 | 王子ホールディングス株式会社 | Printing sheet, printing sheet with peeling layer, and decorative sheet |
CN110186987A (en) * | 2019-06-27 | 2019-08-30 | 上海三信仪表厂 | A kind of general 25 degree of translation methods of solution pH value |
CN110186987B (en) * | 2019-06-27 | 2022-03-08 | 上海三信仪表厂 | Universal solution PH value 25 degree conversion method |
Also Published As
Publication number | Publication date |
---|---|
MY154799A (en) | 2015-07-31 |
WO2009088278A3 (en) | 2009-10-29 |
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