WO2009047940A1 - Foreign material detector, method for detecting foreign material, and computer program - Google Patents
Foreign material detector, method for detecting foreign material, and computer program Download PDFInfo
- Publication number
- WO2009047940A1 WO2009047940A1 PCT/JP2008/063755 JP2008063755W WO2009047940A1 WO 2009047940 A1 WO2009047940 A1 WO 2009047940A1 JP 2008063755 W JP2008063755 W JP 2008063755W WO 2009047940 A1 WO2009047940 A1 WO 2009047940A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- luminance value
- calculated
- foreign material
- pixel unit
- image data
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
Abstract
To provide a foreign material detector capable of detecting presence of foreign materials on a surface in a short time period with the same level of foreign material detection accuracy as a highly-skilled specialist without use of any equipment of complicated structure, a method for detecting the foreign materials, and a computer program. The image data of the surface of a plate-like object being inspected is captured to detect a position where the foreign materials are present based on the captured image data. The position data and color data are captured in the pixel unit as the image data to calculate a representative luminance value in the pixel unit for the color data in the pixel unit. An average luminance value for the calculated representative luminance value is calculated, and a luminance width consisting of a specified width in larger/smaller direction is calculated based on the calculated average luminance value. It is judged whether or not the calculated representative luminance value in the pixel unit is included within the calculated luminance width. When it is judged that the representative luminance value is not included, the position data of a pixel that is judged to be not included is stored.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007-266297 | 2007-10-12 | ||
JP2007266297A JP2009092626A (en) | 2007-10-12 | 2007-10-12 | Device and method for detecting foreign substance, and computer program |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009047940A1 true WO2009047940A1 (en) | 2009-04-16 |
Family
ID=40549089
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/063755 WO2009047940A1 (en) | 2007-10-12 | 2008-07-31 | Foreign material detector, method for detecting foreign material, and computer program |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2009092626A (en) |
WO (1) | WO2009047940A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110487809A (en) * | 2019-08-22 | 2019-11-22 | 武汉轻工大学 | A kind of impurities identification device of transparent bottling liquid |
CN112673249A (en) * | 2018-10-10 | 2021-04-16 | Ckd株式会社 | Inspection device, PTP packaging machine, and method for manufacturing PTP sheet |
CN116879307A (en) * | 2023-07-27 | 2023-10-13 | 信浓亚(常州)自动化技术有限公司 | Device for judging existence of impurities on surface of molten iron |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0388654A (en) * | 1989-09-01 | 1991-04-15 | Kumamoto Techno Porisu Zaidan | Laver inspecting device |
JPH08189901A (en) * | 1995-01-11 | 1996-07-23 | Fuji Electric Co Ltd | Testing device using picture signal |
JPH09210785A (en) * | 1996-02-02 | 1997-08-15 | Tokai Carbon Co Ltd | Method for detecting defective part of wood |
JPH09288066A (en) * | 1996-04-24 | 1997-11-04 | Sekisui Chem Co Ltd | Surface flaw inspection apparatus |
JP2002122550A (en) * | 2000-08-11 | 2002-04-26 | Ajinomoto Faruma Kk | Device and method for inspection of foreign matter in flexible plastic container |
JP2002195958A (en) * | 2000-12-26 | 2002-07-10 | Yamatake Corp | Surface inspecting method |
JP2006145486A (en) * | 2004-11-24 | 2006-06-08 | Nagoya Electric Works Co Ltd | Mounting inspection device, technique, and program for electronic component |
-
2007
- 2007-10-12 JP JP2007266297A patent/JP2009092626A/en active Pending
-
2008
- 2008-07-31 WO PCT/JP2008/063755 patent/WO2009047940A1/en active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0388654A (en) * | 1989-09-01 | 1991-04-15 | Kumamoto Techno Porisu Zaidan | Laver inspecting device |
JPH08189901A (en) * | 1995-01-11 | 1996-07-23 | Fuji Electric Co Ltd | Testing device using picture signal |
JPH09210785A (en) * | 1996-02-02 | 1997-08-15 | Tokai Carbon Co Ltd | Method for detecting defective part of wood |
JPH09288066A (en) * | 1996-04-24 | 1997-11-04 | Sekisui Chem Co Ltd | Surface flaw inspection apparatus |
JP2002122550A (en) * | 2000-08-11 | 2002-04-26 | Ajinomoto Faruma Kk | Device and method for inspection of foreign matter in flexible plastic container |
JP2002195958A (en) * | 2000-12-26 | 2002-07-10 | Yamatake Corp | Surface inspecting method |
JP2006145486A (en) * | 2004-11-24 | 2006-06-08 | Nagoya Electric Works Co Ltd | Mounting inspection device, technique, and program for electronic component |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112673249A (en) * | 2018-10-10 | 2021-04-16 | Ckd株式会社 | Inspection device, PTP packaging machine, and method for manufacturing PTP sheet |
CN110487809A (en) * | 2019-08-22 | 2019-11-22 | 武汉轻工大学 | A kind of impurities identification device of transparent bottling liquid |
CN110487809B (en) * | 2019-08-22 | 2021-09-10 | 武汉轻工大学 | Impurity recognition device for transparent bottled liquid |
CN116879307A (en) * | 2023-07-27 | 2023-10-13 | 信浓亚(常州)自动化技术有限公司 | Device for judging existence of impurities on surface of molten iron |
CN116879307B (en) * | 2023-07-27 | 2024-02-27 | 信浓亚(常州)自动化技术有限公司 | Device for judging existence of impurities on surface of molten iron |
Also Published As
Publication number | Publication date |
---|---|
JP2009092626A (en) | 2009-04-30 |
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