WO2009047940A1 - Foreign material detector, method for detecting foreign material, and computer program - Google Patents

Foreign material detector, method for detecting foreign material, and computer program Download PDF

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Publication number
WO2009047940A1
WO2009047940A1 PCT/JP2008/063755 JP2008063755W WO2009047940A1 WO 2009047940 A1 WO2009047940 A1 WO 2009047940A1 JP 2008063755 W JP2008063755 W JP 2008063755W WO 2009047940 A1 WO2009047940 A1 WO 2009047940A1
Authority
WO
WIPO (PCT)
Prior art keywords
luminance value
calculated
foreign material
pixel unit
image data
Prior art date
Application number
PCT/JP2008/063755
Other languages
French (fr)
Japanese (ja)
Inventor
Akihiko Goto
Takaaki Kono
Toshihiro Inubushi
Masanori Kitazumi
Original Assignee
Osaka Sangyo University
Shinko Kasei Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osaka Sangyo University, Shinko Kasei Co., Ltd. filed Critical Osaka Sangyo University
Publication of WO2009047940A1 publication Critical patent/WO2009047940A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/85Investigating moving fluids or granular solids
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection

Abstract

To provide a foreign material detector capable of detecting presence of foreign materials on a surface in a short time period with the same level of foreign material detection accuracy as a highly-skilled specialist without use of any equipment of complicated structure, a method for detecting the foreign materials, and a computer program. The image data of the surface of a plate-like object being inspected is captured to detect a position where the foreign materials are present based on the captured image data. The position data and color data are captured in the pixel unit as the image data to calculate a representative luminance value in the pixel unit for the color data in the pixel unit. An average luminance value for the calculated representative luminance value is calculated, and a luminance width consisting of a specified width in larger/smaller direction is calculated based on the calculated average luminance value. It is judged whether or not the calculated representative luminance value in the pixel unit is included within the calculated luminance width. When it is judged that the representative luminance value is not included, the position data of a pixel that is judged to be not included is stored.
PCT/JP2008/063755 2007-10-12 2008-07-31 Foreign material detector, method for detecting foreign material, and computer program WO2009047940A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-266297 2007-10-12
JP2007266297A JP2009092626A (en) 2007-10-12 2007-10-12 Device and method for detecting foreign substance, and computer program

Publications (1)

Publication Number Publication Date
WO2009047940A1 true WO2009047940A1 (en) 2009-04-16

Family

ID=40549089

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/063755 WO2009047940A1 (en) 2007-10-12 2008-07-31 Foreign material detector, method for detecting foreign material, and computer program

Country Status (2)

Country Link
JP (1) JP2009092626A (en)
WO (1) WO2009047940A1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110487809A (en) * 2019-08-22 2019-11-22 武汉轻工大学 A kind of impurities identification device of transparent bottling liquid
CN112673249A (en) * 2018-10-10 2021-04-16 Ckd株式会社 Inspection device, PTP packaging machine, and method for manufacturing PTP sheet
CN116879307A (en) * 2023-07-27 2023-10-13 信浓亚(常州)自动化技术有限公司 Device for judging existence of impurities on surface of molten iron

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0388654A (en) * 1989-09-01 1991-04-15 Kumamoto Techno Porisu Zaidan Laver inspecting device
JPH08189901A (en) * 1995-01-11 1996-07-23 Fuji Electric Co Ltd Testing device using picture signal
JPH09210785A (en) * 1996-02-02 1997-08-15 Tokai Carbon Co Ltd Method for detecting defective part of wood
JPH09288066A (en) * 1996-04-24 1997-11-04 Sekisui Chem Co Ltd Surface flaw inspection apparatus
JP2002122550A (en) * 2000-08-11 2002-04-26 Ajinomoto Faruma Kk Device and method for inspection of foreign matter in flexible plastic container
JP2002195958A (en) * 2000-12-26 2002-07-10 Yamatake Corp Surface inspecting method
JP2006145486A (en) * 2004-11-24 2006-06-08 Nagoya Electric Works Co Ltd Mounting inspection device, technique, and program for electronic component

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0388654A (en) * 1989-09-01 1991-04-15 Kumamoto Techno Porisu Zaidan Laver inspecting device
JPH08189901A (en) * 1995-01-11 1996-07-23 Fuji Electric Co Ltd Testing device using picture signal
JPH09210785A (en) * 1996-02-02 1997-08-15 Tokai Carbon Co Ltd Method for detecting defective part of wood
JPH09288066A (en) * 1996-04-24 1997-11-04 Sekisui Chem Co Ltd Surface flaw inspection apparatus
JP2002122550A (en) * 2000-08-11 2002-04-26 Ajinomoto Faruma Kk Device and method for inspection of foreign matter in flexible plastic container
JP2002195958A (en) * 2000-12-26 2002-07-10 Yamatake Corp Surface inspecting method
JP2006145486A (en) * 2004-11-24 2006-06-08 Nagoya Electric Works Co Ltd Mounting inspection device, technique, and program for electronic component

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112673249A (en) * 2018-10-10 2021-04-16 Ckd株式会社 Inspection device, PTP packaging machine, and method for manufacturing PTP sheet
CN110487809A (en) * 2019-08-22 2019-11-22 武汉轻工大学 A kind of impurities identification device of transparent bottling liquid
CN110487809B (en) * 2019-08-22 2021-09-10 武汉轻工大学 Impurity recognition device for transparent bottled liquid
CN116879307A (en) * 2023-07-27 2023-10-13 信浓亚(常州)自动化技术有限公司 Device for judging existence of impurities on surface of molten iron
CN116879307B (en) * 2023-07-27 2024-02-27 信浓亚(常州)自动化技术有限公司 Device for judging existence of impurities on surface of molten iron

Also Published As

Publication number Publication date
JP2009092626A (en) 2009-04-30

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