WO2009034337A2 - Analyseur d'impulsions - Google Patents

Analyseur d'impulsions Download PDF

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Publication number
WO2009034337A2
WO2009034337A2 PCT/GB2008/003095 GB2008003095W WO2009034337A2 WO 2009034337 A2 WO2009034337 A2 WO 2009034337A2 GB 2008003095 W GB2008003095 W GB 2008003095W WO 2009034337 A2 WO2009034337 A2 WO 2009034337A2
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WO
WIPO (PCT)
Prior art keywords
pulse
functions
analyser according
function
sample
Prior art date
Application number
PCT/GB2008/003095
Other languages
English (en)
Other versions
WO2009034337A3 (fr
Inventor
Wieslaw Jerzy Szajnowski
Original Assignee
Mitsubishi Electric Information Technology Centre Europe B.V.
Mitsubishi Electric Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Information Technology Centre Europe B.V., Mitsubishi Electric Corporation filed Critical Mitsubishi Electric Information Technology Centre Europe B.V.
Priority to EP08806253A priority Critical patent/EP2198314A2/fr
Priority to US12/677,744 priority patent/US8575913B2/en
Priority to JP2010524568A priority patent/JP5419878B2/ja
Priority to CN200880106737.4A priority patent/CN101802624B/zh
Priority to EP19169567.5A priority patent/EP3534165A1/fr
Publication of WO2009034337A2 publication Critical patent/WO2009034337A2/fr
Publication of WO2009034337A3 publication Critical patent/WO2009034337A3/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218—Circuits therefor
    • G01R13/0254—Circuits therefor for triggering, synchronisation
    • G01R13/0263—Circuits therefor for triggering, synchronisation for non-recurrent functions, e.g. transients

Definitions

  • This invention relates to a method and apparatus for obtaining simultaneously discrete-time samples of both a wideband transient pulse and a quadrature signal associated with the pulse; the method being especially, but not exclusively, applicable to electronic systems, including oscilloscopes, capable of locating a pulse in time, determining two quadrature representations of the pulse, and extracting parameters characterizing the pulse shape.
  • a wideband pulse x(t) of finite duration and unknown shape is to be sampled at a plurality of J time instants t l5 1 2 , ... , t,, ... , tj . It is assumed that the pulse duration is limited by some maximum value T, and that the pulse time-of- arrival is approximately known.
  • the acquired samples of the pulse x(t) are then used to determine some pulse descriptors such as shape and its moments, including location and time spread.
  • the pulse under examination may be regarded as being observed at the output of a suitable sensor that has captured a portion of electromagnetic radiation scattered by a remote obj ect of interest.
  • the method according to the invention does not use 'time slices' of a pulse, but instead processes the whole pulse to obtain its 'instantaneous' values. Consequently, one of the distinct advantages of the invention follows from its potential capability of producing 'instantaneous' signal samples without actually using expensive ultra-fast sampling circuits.
  • Each 'instantaneous' sample is obtained by suitably combining various averages determined over the duration T of the entire pulse x(t).
  • Fig. 1 depicts an example of a pulse x(t) being sampled at time t j with the use of a function approximating the Dirac impulse ⁇ (t);
  • Fig. 2 shows the shape of a periodic sampling function D 8 (t) obtained by combining a constant and eight consecutive harmonics;
  • Fig. 3 depicts schematically the operations to be performed to obtain a single sample x(t j ) of a pulse x(t);
  • Fig. 5 shows the shape of a quadrature sampling function H 8 (t) obtained by combining eight consecutive harmonics
  • Fig. 6 depicts a first new sampling function A 8 (Q constructed in accordance with the invention
  • Fig. 7 depicts a second new sampling function B 8 (t) constructed in accordance with the invention
  • Fig. 8 is a functional block diagram of a pulse analyzer PAN constructed in accordance with the invention.
  • a wideband pulse x(t) of finite duration and unknown shape is to be sampled at a plurality of J time instants ti, t 2 , ... , t,, ... , tj . It is assumed that the pulse duration is limited by some maximum value T, and that the pulse time-of- arrival is approximately known.
  • the acquired samples of the pulse x(t) are then used to determine some pulse descriptors such as shape and its moments, including location and time spread.
  • the pulse under examination may be regarded as being observed at the output of a suitable sensor that has captured a portion of electromagnetic radiation scattered by a remote object of interest.
  • Fig. 1 depicts an example of a pulse x(t) being sampled at time t j with the use of a function ⁇ '(t) approximating the Dirac impulse ⁇ (t).
  • the Dirac delta function ⁇ (t) can be approximated by a central segment of a sampling function of the form
  • ⁇ ao, a h a 2 , ... , a k , ... , a ⁇ > is a set of predetermined (K+ 1) coefficients
  • Fig. 2 shows the shape of a periodic sampling function D 8 (t) obtained by combining a constant and eight consecutive harmonics,
  • the above sampling function approximates the Dirac delta function ⁇ (t) within the time interval (- ⁇ , ⁇ ) equal to the period of the lowest used frequency, l/(2 ⁇ ).
  • the sampling function is multiplied by a unit- amplitude time gate g(t), spanning the time interval (- ⁇ , ⁇ ).
  • the peak width i.e. the parameter FWHH (full width at half height) is equal to 90 percent of the period of the highest frequency used; the magnitude of the sidelobe level is kept below 0.0037 (i.e. -48.6 dB).
  • the required peak width (FWHH) will depend on time (or range) resolution of the sensing system. For example, if the time resolution is equal to 1 ns (equivalent to range resolution of 0.15 m), then the peak width of D ⁇ (t) should not exceed 1 ns; consequently, in a design similar to the illustrative example above, the highest frequency fk should not be less than 900 MHz.
  • a sample at time t j of pulse x(t), i.e. the value x(t j ), is determined by implementing Procedure 1 : 1. selecting a first frequency f k from a set of K predetermined frequencies , fk
  • ⁇ ao, a ls a 2 , ... , ak, , ajc ⁇ is a set of (K +1) predetermined coefficients
  • Fig. 3 depicts schematically the operations to be performed in order to obtain a single sample x(t j ) of a pulse x(t) under examination.
  • 'instantaneous' sample is obtained by suitably combining various averages determined over the duration T of the entire pulse x(t).
  • the sampling function D ⁇ (t) should be an adequate approximation of the Dirac delta function ⁇ (t) over the entire interval T of pulse duration.
  • a complete characterization of a wideband transient pulse x(t) can only be obtained by determining additionally the so-called quadrature signal y(t) associated with the underlying pulse x(t).
  • the pulse x(t) of interest can be characterized by its (Hubert) envelope z(t) and phase function ⁇ (t), defined by
  • tan " '( ) is a four-quadrant function.
  • the envelope z(t) may then be used to determine the pulse position in time by estimating some location parameters, such as the mean value ('centre of gravity'), median or the 'dominating' mode.
  • the mean location ('centre of gravity') of a pulse is calculated from
  • the median location t M of a pulse is defined as
  • the median location t M is a time instant so selected within the pulse duration as to obtain equal energy in the left and the right portions of the pulse x(t).
  • the mode location tp of a pulse is defined as the time instant at which the power z 2 (t) of the pulse x(t) reaches its maximum value, hence
  • the second central moment will characterize the pulse spread in time, whereas the third central moment will provide information regarding the pulse 'skewness'.
  • x(t) is a pulse scattered by a complex object of interest
  • the envelope z(t) itself, or the power distribution in time z 2 (t) will supply some information about the object's structure, hi some cases, also the phase function ⁇ (t) will be used to provide complementary information.
  • a sample at time tj of the quadrature signal y(t) associated with the underlying pulse x(t), i.e. the value y(t,), can be determined from the integral
  • ⁇ (t) l/( ⁇ t) is a Hilbert transform of the Dirac impulse ⁇ (t). (Because of the singularity of ⁇ (t), the principal value of the above integral must be used.)
  • Fig. 5 shows the shape of a quadrature sampling function H 8 (t) obtained by combining eight consecutive harmonics, where
  • the above quadrature sampling function H 8 (t) is a Hilbert transform of the sampling function Dg(t), depicted in Fig. 2.
  • the quadrature sampling function approximates the kernel ⁇ (t) within the time interval (- ⁇ , ⁇ ) equal to the period of the lowest used frequency, l/(2 ⁇ ).
  • the sampling function is multiplied by a unit-amplitude time gate g(t), spanning the time interval (- ⁇ , ⁇ ).
  • a sample at time t; of the quadrature signal y(t) associated with pulse x(t), i.e. the value y(tj), is determined by implementing Procedure 2:
  • Ja 1 , a 2 , ... , a k ,... , & % ⁇ is a set of K predetermined coefficients
  • a further distinct advantage of the disclosed aspects of the invention follows from its potential ability to produce 'instantaneous' samples of the quadrature signal y(t) by sampling in fact an underlying pulse x(t). Those samples are determined without the use of expensive ultra-fast sampling circuits and complicated digital signal processing. Each 'instantaneous' sample of the quadrature signal is obtained by suitably combining various averages determined over the entire duration T of the underlying pulse x(t).
  • Procedure 1 and Procedure 2 have similar structures, the ranges of the corresponding time indices, ⁇ l, 2, ..., j, ..., J ⁇ and ⁇ 1, 2, ..., i, ..., I ⁇ , are very different. This discrepancy follows from different shapes of the sampling function D ⁇ (t) and the quadrature sampling function H ⁇ (t).
  • the sampling function D ⁇ (t) approximates an impulse and, therefore, is concentrated within a short time interval, whereas the time extent of the quadrature sampling function H ⁇ (t) is intentionally large (compare Fig. 22 and Fig. 25).
  • Those dramatically different time scales of the sampling functions D ⁇ (t) and H ⁇ (t) make concurrent running of Procedures 1 and 2 a very difficult task indeed.
  • sampling functions D ⁇ (t) and H ⁇ (t) are used to construct two new sampling functions, A ⁇ (t) and B ⁇ (t), defined as follows
  • Fig. 6 and Fig. 7 depict two new sampling functions, As(t) and B 8 (t), obtained from previously considered functions D 8 (t) and H 8 (t) and multiplied by a suitable unit-amplitude time gate.
  • As(t) and B 8 (t) obtained from previously considered functions D 8 (t) and H 8 (t) and multiplied by a suitable unit-amplitude time gate.
  • the two shapes are mirror images of one another and are, therefore, of the same time scale.
  • the new sampling functions, A ⁇ (t) and B ⁇ (t), may be viewed as a result of rotation by ⁇ /4 of the original sampling functions D ⁇ (t) and H ⁇ (t).
  • the two new sampling functions, A ⁇ (t) and B ⁇ (t) are used to sample an underlying pulse x(t) to obtain samples of its two images (representations), u(t) and v(t). Those images, being in quadrature to one another, will preserve the shape of the envelope z(t) of the pulse x(t), i.e.,
  • ⁇ ao, aj, a 2 , ... , a ⁇ , ... , ajc ⁇ is a set of (K +1) predetermined coefficients
  • Fig. 8 is a functional block diagram of a pulse analyzer (PAN) 1 constructed in accordance with the invention.
  • the analyzer PAN implements Procedure 3 disclosed above.
  • the system comprises a signal conditioning circuit (SCC) 3, an optical-fibre recirculating loop (RCL) 5, a first (MXC) 7a, a second mixer (MXS) 7b, a first integrator (AVC) 9a, a second integrator (AVS) 9b, a direct digital synthesizer (DDS) 11, an arithmetic unit (ARM) 13, and a timing/control unit (TCU) 15.
  • SCC signal conditioning circuit
  • RCL optical-fibre recirculating loop
  • MXC first
  • MXS second mixer
  • AVC first integrator
  • AVS second integrator
  • DDS direct digital synthesizer
  • ARM arithmetic unit
  • TCU timing/control unit
  • the signal conditioning circuit 3 captures a single pulse x(t) that appears transiently at input XX and sends the pulse to the recirculating loop 5 that regenerates this pulse to produce, at output XR, a pulse train comprising a plurality of replicas of the pulse x(t).
  • the recirculating loop 5 also produces a synchronizing signal SN, preceding each of the pulse replicas.
  • mixer 7a receives signal Cl of the form
  • mixer 7b is driven by signal C2
  • f k is a frequency selected from a set of K predetermined frequencies, f ls f 2 , ... , f k , ... , fjc, and the initial phase is determined from
  • t is a time instant at which a sample is taken.
  • the output signals supplied by the mixers 7a and 7b, are respectively applied to the two gated integrators 9a and 9b via their respective inputs, PC and PS.
  • the integrators 9 perform integration of their input signals, PC and PS, during a time interval determined by a time gate GT supplied by the timing/control unit 15.
  • the values, AC and AS, produced by the integrators 9 are then sent to the arithmetic unit 13.
  • the arithmetic unit 13 utilizes input values, AC and AS, produced for each of K predetermined frequencies, fi, f 2 , ... , fk, ... , fit, and for each of J predetermined time instants, t l5 1 2 , ... , t,, ... , tj, to determine the pulse shape, its envelope z(t) and phase function ⁇ (t) and, if required, other parameters of interest, such as mean time location, time spread etc.
  • the arithmetic unit 13 receives, from the timing/control unit 15 via input FT, a frequency index f and the time index j.
  • the direct digital synthesizer 11 produces two signals, Cl and C2, required by the mixers 7a and 7b in response to two control signals, FR and PH, used by the synthesizer 11 to set the correct frequency, f k , and phase ⁇ jk -
  • the recirculating loop 5 has to produce (J K) identical replicas of the input transient pulse x(t).
  • J K identical replicas of the input transient pulse x(t).
  • the loop 5 has to supply 1032 replicas. This is a realistic requirement; for example, a system described in:Yan Yin, Beam Diagnostics with Optical-Fibre Optics. Proc. 2005 Particle Accelerator Conf., Knoxville, pp. 3040-30-42, May 2005, is capable of producing 3000 replicas with a 2-km long optical-fibre loop. See also:
  • a single pulse could be split and input into multiple parallel channels for processing.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

La présente invention concerne un analyseur d'impulsions permettant d'étalonner une impulsion ou une suite répétitive d'impulsions. L'analyseur multiplie une impulsion par un ensemble de fonctions de base de façon à générer une pluralité de fonctions d'impulsions multipliées, et un synthétiseur combine les fonctions d'impulsions multipliées de façon à générer un échantillon d'impulsion. En particulier, le synthétiseur effectue au moins une opération d'intégration sur toute l'étendue d'un intervalle d'intégration correspondant sensiblement à la durée de l'impulsion et au moins une opération d'addition. Les fonctions de base sont telles que la sortie du synthétiseur correspond à un échantillon d'impulsion pendant un intervalle de temps d'échantillonnage inférieur à l'intervalle d'intégration.
PCT/GB2008/003095 2007-09-12 2008-09-12 Analyseur d'impulsions WO2009034337A2 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
EP08806253A EP2198314A2 (fr) 2007-09-12 2008-09-12 Analyseur d'impulsions
US12/677,744 US8575913B2 (en) 2007-09-12 2008-09-12 Pulse analyzer
JP2010524568A JP5419878B2 (ja) 2007-09-12 2008-09-12 パルスアナライザ
CN200880106737.4A CN101802624B (zh) 2007-09-12 2008-09-12 脉冲分析仪
EP19169567.5A EP3534165A1 (fr) 2007-09-12 2008-09-12 Analyseur d'impulsions

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0717800.7 2007-09-12
GBGB0717800.7A GB0717800D0 (en) 2007-09-12 2007-09-12 Pulse analyzer

Publications (2)

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WO2009034337A2 true WO2009034337A2 (fr) 2009-03-19
WO2009034337A3 WO2009034337A3 (fr) 2009-04-30

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US (1) US8575913B2 (fr)
EP (2) EP2198314A2 (fr)
JP (1) JP5419878B2 (fr)
CN (1) CN101802624B (fr)
GB (1) GB0717800D0 (fr)
WO (1) WO2009034337A2 (fr)

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US8228228B2 (en) * 2009-04-09 2012-07-24 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for receiving electromagnetic waves using photonics
CN108333440B (zh) * 2017-12-30 2021-02-12 聚光科技(杭州)股份有限公司 脉冲检测方法及装置
CN109193657B (zh) * 2018-10-25 2021-06-29 合肥工业大学 基于粒子群算法的三端柔性多状态开关谐波治理方法

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MARK KAHRS: "50 Years of RF and Microwave Sampling", IEEE TRANS. MICROWAVE THEORY TECH., vol. 51, no. 1, June 2003 (2003-06-01), pages 1787 - 1804

Also Published As

Publication number Publication date
US20100295532A1 (en) 2010-11-25
CN101802624A (zh) 2010-08-11
GB0717800D0 (en) 2007-10-24
WO2009034337A3 (fr) 2009-04-30
EP2198314A2 (fr) 2010-06-23
JP5419878B2 (ja) 2014-02-19
CN101802624B (zh) 2014-07-16
JP2010539466A (ja) 2010-12-16
EP3534165A1 (fr) 2019-09-04
US8575913B2 (en) 2013-11-05

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