WO2009022529A1 - 判別装置および判別方法 - Google Patents
判別装置および判別方法 Download PDFInfo
- Publication number
- WO2009022529A1 WO2009022529A1 PCT/JP2008/063210 JP2008063210W WO2009022529A1 WO 2009022529 A1 WO2009022529 A1 WO 2009022529A1 JP 2008063210 W JP2008063210 W JP 2008063210W WO 2009022529 A1 WO2009022529 A1 WO 2009022529A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- region
- feature space
- closed region
- category
- determination
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/24—Classification techniques
- G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
- G06F18/2411—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches based on the proximity to a decision surface, e.g. support vector machines
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- Engineering & Computer Science (AREA)
- Data Mining & Analysis (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Bioinformatics & Computational Biology (AREA)
- Artificial Intelligence (AREA)
- Evolutionary Biology (AREA)
- Evolutionary Computation (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Image Analysis (AREA)
- Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
Abstract
判別装置(1)は、複数の節点と節点間をつなぐ線分とよりなる特徴空間内の閉領域であって、特徴空間における同一カテゴリのデータ分布形状に対応した閉領域についての情報である領域情報を記録する領域情報記録部(12)と、領域情報記録部(12)より領域情報を取得し、特徴空間における判別対象と閉領域との距離に基づき、判別対象が属するカテゴリを決定するカテゴリ決定部(22)とを備える。カテゴリ決定部(22)は、特徴空間における判別対象と閉領域との距離を算出する閉領域表面間距離算出部(221)を備える。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200880102650.XA CN101779213B (zh) | 2007-08-10 | 2008-07-23 | 判别装置和判别方法 |
US12/702,638 US9031882B2 (en) | 2007-08-10 | 2010-02-09 | Category determination device and method comprising a feature space containing a closed region used to determine the category of a target based on the position of the target within the feature space with reference to the closed region |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007210379A JP5237596B2 (ja) | 2007-08-10 | 2007-08-10 | 判別装置 |
JP2007-210379 | 2007-08-10 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/702,638 Continuation-In-Part US9031882B2 (en) | 2007-08-10 | 2010-02-09 | Category determination device and method comprising a feature space containing a closed region used to determine the category of a target based on the position of the target within the feature space with reference to the closed region |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009022529A1 true WO2009022529A1 (ja) | 2009-02-19 |
Family
ID=40350584
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/063210 WO2009022529A1 (ja) | 2007-08-10 | 2008-07-23 | 判別装置および判別方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US9031882B2 (ja) |
JP (1) | JP5237596B2 (ja) |
CN (1) | CN101779213B (ja) |
WO (1) | WO2009022529A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8724911B2 (en) * | 2010-09-16 | 2014-05-13 | Palo Alto Research Center Incorporated | Graph lattice method for image clustering, classification, and repeated structure finding |
US8872828B2 (en) | 2010-09-16 | 2014-10-28 | Palo Alto Research Center Incorporated | Method for generating a graph lattice from a corpus of one or more data graphs |
JP6156126B2 (ja) * | 2013-12-19 | 2017-07-05 | 富士通株式会社 | 検索方法、検索プログラムおよび検索装置 |
JP7006402B2 (ja) * | 2018-03-14 | 2022-01-24 | 富士通株式会社 | クラスタリングプログラム、クラスタリング方法およびクラスタリング装置 |
US11341370B2 (en) * | 2019-11-22 | 2022-05-24 | International Business Machines Corporation | Classifying images in overlapping groups of images using convolutional neural networks |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0498422A (ja) * | 1990-08-13 | 1992-03-31 | Nippon Telegr & Teleph Corp <Ntt> | データクラスタリング装置 |
JP2004354111A (ja) * | 2003-05-27 | 2004-12-16 | Matsushita Electric Works Ltd | 物体検査方法及びその装置 |
JP2005025351A (ja) * | 2003-06-30 | 2005-01-27 | Kagawa Univ | 情報処理装置,状態判定装置及び診断装置,並びに情報処理方法,状態判定方法及び診断方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002334110A (ja) * | 2001-05-11 | 2002-11-22 | Nippon Telegr & Teleph Corp <Ntt> | 類似検索方法,類似検索装置および類似検索用プログラム |
JP4232388B2 (ja) * | 2002-05-29 | 2009-03-04 | 日本電気株式会社 | 映像検索装置及びそれに用いる映像検索方法並びにそのプログラム |
US7620246B2 (en) * | 2002-07-30 | 2009-11-17 | Fujifilm Corporation | Method and apparatus for image processing |
JP4225807B2 (ja) | 2003-03-10 | 2009-02-18 | 富士通株式会社 | 路面状況判定方法および装置 |
JP4176041B2 (ja) * | 2004-04-14 | 2008-11-05 | オリンパス株式会社 | 分類装置及び分類方法 |
JP2006012069A (ja) | 2004-06-29 | 2006-01-12 | Olympus Corp | 分類装置及び分類方法 |
JP2006058979A (ja) * | 2004-08-17 | 2006-03-02 | Fuji Photo Film Co Ltd | 画像分類装置、画像分類方法、画像分類プログラム、及び撮像装置 |
JP4501847B2 (ja) * | 2005-02-23 | 2010-07-14 | セイコーエプソン株式会社 | 画像表示装置、画像表示装置の補正値作成方法、及び画像表示装置の補正値作成プログラム、及びこのプログラムが記録された記録媒体 |
-
2007
- 2007-08-10 JP JP2007210379A patent/JP5237596B2/ja active Active
-
2008
- 2008-07-23 WO PCT/JP2008/063210 patent/WO2009022529A1/ja active Application Filing
- 2008-07-23 CN CN200880102650.XA patent/CN101779213B/zh active Active
-
2010
- 2010-02-09 US US12/702,638 patent/US9031882B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0498422A (ja) * | 1990-08-13 | 1992-03-31 | Nippon Telegr & Teleph Corp <Ntt> | データクラスタリング装置 |
JP2004354111A (ja) * | 2003-05-27 | 2004-12-16 | Matsushita Electric Works Ltd | 物体検査方法及びその装置 |
JP2005025351A (ja) * | 2003-06-30 | 2005-01-27 | Kagawa Univ | 情報処理装置,状態判定装置及び診断装置,並びに情報処理方法,状態判定方法及び診断方法 |
Also Published As
Publication number | Publication date |
---|---|
US20100135533A1 (en) | 2010-06-03 |
JP2009043197A (ja) | 2009-02-26 |
CN101779213B (zh) | 2013-05-08 |
CN101779213A (zh) | 2010-07-14 |
JP5237596B2 (ja) | 2013-07-17 |
US9031882B2 (en) | 2015-05-12 |
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