WO2008149711A1 - 磁気検出装置 - Google Patents

磁気検出装置 Download PDF

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Publication number
WO2008149711A1
WO2008149711A1 PCT/JP2008/059678 JP2008059678W WO2008149711A1 WO 2008149711 A1 WO2008149711 A1 WO 2008149711A1 JP 2008059678 W JP2008059678 W JP 2008059678W WO 2008149711 A1 WO2008149711 A1 WO 2008149711A1
Authority
WO
WIPO (PCT)
Prior art keywords
magnetic field
field intensity
waveform
intensity
output waveform
Prior art date
Application number
PCT/JP2008/059678
Other languages
English (en)
French (fr)
Inventor
Katsuya Kikuiri
Kiyoshi Sato
Yoshito Sasaki
Original Assignee
Alps Electric Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alps Electric Co., Ltd. filed Critical Alps Electric Co., Ltd.
Publication of WO2008149711A1 publication Critical patent/WO2008149711A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)

Abstract

【課題】　特に、外部磁界の磁界強度変化に対する磁界検知信号を従来に比べて簡単に生成でき、また集積回路の標準化を可能とした磁気検出装置を提供することを目的としている。 【解決手段】　第１直列回路の第１出力取り出し部から得られる第１の出力波形Ａと、第２直列回路の第２出力取り出し部から得られる第２の出力波形Ｂは、（＋）方向の外部磁界Ｈが第１の磁界強度Ｈ１のとき、及び、（－）方向の外部磁界Ｈが第２の磁界強度Ｈ２のときに夫々交わり、前記第１の磁界強度Ｈ１及び前記第２の磁界強度Ｈ２よりも大きい磁界強度のときと、前記第１の磁界強度Ｈ１及び第２の磁界強度Ｈ２よりも小さい磁界強度のときとで、前記第１の出力波形Ａと前記第２の出力波形Ｂとの出力値の大小関係が反転する。これにより外部磁界の磁界強度変化に対する磁界検知信号を従来に比べて簡単に生成できる。
PCT/JP2008/059678 2007-05-31 2008-05-26 磁気検出装置 WO2008149711A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-144686 2007-05-31
JP2007144686A JP2010190571A (ja) 2007-05-31 2007-05-31 磁気検出装置

Publications (1)

Publication Number Publication Date
WO2008149711A1 true WO2008149711A1 (ja) 2008-12-11

Family

ID=40093533

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/059678 WO2008149711A1 (ja) 2007-05-31 2008-05-26 磁気検出装置

Country Status (2)

Country Link
JP (1) JP2010190571A (ja)
WO (1) WO2008149711A1 (ja)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04265819A (ja) * 1990-11-06 1992-09-22 Santa Barbara Res Center 磁界変化感知システムおよびその製造方法
JP2000310504A (ja) * 1999-02-26 2000-11-07 Tokai Rika Co Ltd 回転検出センサの検出回路
JP2005236134A (ja) * 2004-02-20 2005-09-02 Tdk Corp 磁気検出素子およびその形成方法ならびに磁気センサ、電流計

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04265819A (ja) * 1990-11-06 1992-09-22 Santa Barbara Res Center 磁界変化感知システムおよびその製造方法
JP2000310504A (ja) * 1999-02-26 2000-11-07 Tokai Rika Co Ltd 回転検出センサの検出回路
JP2005236134A (ja) * 2004-02-20 2005-09-02 Tdk Corp 磁気検出素子およびその形成方法ならびに磁気センサ、電流計

Also Published As

Publication number Publication date
JP2010190571A (ja) 2010-09-02

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