WO2008149436A1 - 信号波形データ処理装置及び信号波形データのピーク検出結果補正方法 - Google Patents

信号波形データ処理装置及び信号波形データのピーク検出結果補正方法 Download PDF

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Publication number
WO2008149436A1
WO2008149436A1 PCT/JP2007/061490 JP2007061490W WO2008149436A1 WO 2008149436 A1 WO2008149436 A1 WO 2008149436A1 JP 2007061490 W JP2007061490 W JP 2007061490W WO 2008149436 A1 WO2008149436 A1 WO 2008149436A1
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WIPO (PCT)
Prior art keywords
peak
waveform data
signal waveform
peak detection
correction
Prior art date
Application number
PCT/JP2007/061490
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English (en)
French (fr)
Inventor
Shin-Ichi Utsunomiya
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to PCT/JP2007/061490 priority Critical patent/WO2008149436A1/ja
Publication of WO2008149436A1 publication Critical patent/WO2008149436A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/86—Signal analysis
    • G01N30/8624—Detection of slopes or peaks; baseline correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/86—Signal analysis
    • G01N30/8624—Detection of slopes or peaks; baseline correction
    • G01N30/8631—Peaks
    • G01N30/8634—Peak quality criteria

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

信号波形データのピーク検出結果を簡便に補正する。 信号波形データ処理装置１はピーク検出部３、補正ピーク検出処理５及び表示制御部７を備えている。ピーク検出部３は予め設定されたピーク高さ閾値もしくはピーク面積閾値又はその両方に基づいて信号波形データのピーク検出処理を行なう。補正ピーク検出処理５は信号波形データ上で指定された１点のピーク補正座標を含む所定範囲内でピーク高さ閾値もしくはピーク面積閾値又はその両方を最初のピーク検出処理時よりも小さく設定して補正ピークを検出する補正ピーク検出処理を行なう。表示制御部７は信号波形データ、既検出ピーク及び補正ピーク検出部５によって検出された補正ピークを表示部９に表示させる。操作者により１点のピーク補正座標が指定されると、補正ピーク検出処理５は補正ピーク検出処理を行なう。
PCT/JP2007/061490 2007-06-06 2007-06-06 信号波形データ処理装置及び信号波形データのピーク検出結果補正方法 WO2008149436A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/061490 WO2008149436A1 (ja) 2007-06-06 2007-06-06 信号波形データ処理装置及び信号波形データのピーク検出結果補正方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/061490 WO2008149436A1 (ja) 2007-06-06 2007-06-06 信号波形データ処理装置及び信号波形データのピーク検出結果補正方法

Publications (1)

Publication Number Publication Date
WO2008149436A1 true WO2008149436A1 (ja) 2008-12-11

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ID=40093271

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/061490 WO2008149436A1 (ja) 2007-06-06 2007-06-06 信号波形データ処理装置及び信号波形データのピーク検出結果補正方法

Country Status (1)

Country Link
WO (1) WO2008149436A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103868999A (zh) * 2014-04-02 2014-06-18 华中科技大学 一种利用色谱特征提取对样本进行鉴定的方法
CN111316095A (zh) * 2017-11-09 2020-06-19 株式会社岛津制作所 波形分析装置
CN114460215A (zh) * 2020-11-09 2022-05-10 株式会社岛津制作所 波形处理辅助装置以及波形处理辅助方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0835960A (ja) * 1994-07-20 1996-02-06 Shimadzu Corp クロマトグラフ質量分析装置用データ処理装置
JP2000131304A (ja) * 1998-10-21 2000-05-12 Hitachi Ltd 液体クロマトグラフ装置
JP2000171450A (ja) * 1998-12-02 2000-06-23 Tosoh Corp クロマトグラム処理装置
JP2002005740A (ja) * 2000-06-26 2002-01-09 Shimadzu Corp 分析装置
JP2004053283A (ja) * 2002-07-17 2004-02-19 Shimadzu Corp クロマトグラフデータ処理装置
JP2006058110A (ja) * 2004-08-19 2006-03-02 Shimadzu Corp クロマトグラフ用データ処理装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0835960A (ja) * 1994-07-20 1996-02-06 Shimadzu Corp クロマトグラフ質量分析装置用データ処理装置
JP2000131304A (ja) * 1998-10-21 2000-05-12 Hitachi Ltd 液体クロマトグラフ装置
JP2000171450A (ja) * 1998-12-02 2000-06-23 Tosoh Corp クロマトグラム処理装置
JP2002005740A (ja) * 2000-06-26 2002-01-09 Shimadzu Corp 分析装置
JP2004053283A (ja) * 2002-07-17 2004-02-19 Shimadzu Corp クロマトグラフデータ処理装置
JP2006058110A (ja) * 2004-08-19 2006-03-02 Shimadzu Corp クロマトグラフ用データ処理装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103868999A (zh) * 2014-04-02 2014-06-18 华中科技大学 一种利用色谱特征提取对样本进行鉴定的方法
CN111316095A (zh) * 2017-11-09 2020-06-19 株式会社岛津制作所 波形分析装置
CN114460215A (zh) * 2020-11-09 2022-05-10 株式会社岛津制作所 波形处理辅助装置以及波形处理辅助方法
CN114460215B (zh) * 2020-11-09 2024-01-12 株式会社岛津制作所 波形处理辅助装置以及波形处理辅助方法

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