WO2008120182A3 - Method and system for verifying suspected defects of a printed circuit board - Google Patents

Method and system for verifying suspected defects of a printed circuit board Download PDF

Info

Publication number
WO2008120182A3
WO2008120182A3 PCT/IL2007/000419 IL2007000419W WO2008120182A3 WO 2008120182 A3 WO2008120182 A3 WO 2008120182A3 IL 2007000419 W IL2007000419 W IL 2007000419W WO 2008120182 A3 WO2008120182 A3 WO 2008120182A3
Authority
WO
WIPO (PCT)
Prior art keywords
image information
circuit board
printed circuit
suspected defects
verifying
Prior art date
Application number
PCT/IL2007/000419
Other languages
French (fr)
Other versions
WO2008120182A2 (en
Inventor
Lev Reznik
Meir Ben-Levi
Original Assignee
Camtek Ltd
Lev Reznik
Meir Ben-Levi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Camtek Ltd, Lev Reznik, Meir Ben-Levi filed Critical Camtek Ltd
Priority to PCT/IL2007/000419 priority Critical patent/WO2008120182A2/en
Priority to TW097132361A priority patent/TW201009326A/en
Publication of WO2008120182A2 publication Critical patent/WO2008120182A2/en
Publication of WO2008120182A3 publication Critical patent/WO2008120182A3/en
Priority to IL201138A priority patent/IL201138A0/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10148—Varying focus
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Studio Devices (AREA)

Abstract

A system and a method for verifying suspected defects of a printed circuit board, the system includes: (i) a camera (200) that includes a processor (210) and a group of light sensing elements (220), whereby the group of light sensing elements is adapted to generate first image information (310) representative of light arriving from the printed circuit board (102); whereby the processor is adapted to select a portion of the first image information to provide second image information (320), in response to (a) a displayed image related parameter; (b) a size of the first image information; and (c) second image information transmission limitation; and (ii) a bandwidth limited communication channel adapted to convey the second image information from the camera
PCT/IL2007/000419 2007-03-29 2007-03-29 Method and system for verifying suspected defects of a printed circuit board WO2008120182A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
PCT/IL2007/000419 WO2008120182A2 (en) 2007-03-29 2007-03-29 Method and system for verifying suspected defects of a printed circuit board
TW097132361A TW201009326A (en) 2007-03-29 2008-08-25 Method and system for verifying suspected defects of a printed circuit board
IL201138A IL201138A0 (en) 2007-03-29 2009-09-23 Method and system for verifying suspected defects of a printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/IL2007/000419 WO2008120182A2 (en) 2007-03-29 2007-03-29 Method and system for verifying suspected defects of a printed circuit board

Publications (2)

Publication Number Publication Date
WO2008120182A2 WO2008120182A2 (en) 2008-10-09
WO2008120182A3 true WO2008120182A3 (en) 2009-04-09

Family

ID=39808772

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IL2007/000419 WO2008120182A2 (en) 2007-03-29 2007-03-29 Method and system for verifying suspected defects of a printed circuit board

Country Status (2)

Country Link
TW (1) TW201009326A (en)
WO (1) WO2008120182A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI473989B (en) * 2011-11-03 2015-02-21 Univ Nat Kaohsiung Applied Sci Automatic optical inspection system for defect detection of dental floss stick
US9885671B2 (en) 2014-06-09 2018-02-06 Kla-Tencor Corporation Miniaturized imaging apparatus for wafer edge
US9645097B2 (en) 2014-06-20 2017-05-09 Kla-Tencor Corporation In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning
CN110006903A (en) * 2018-01-05 2019-07-12 皓琪科技股份有限公司 Printed circuit board rechecks system, marker method and reinspection method
TWI693386B (en) * 2019-05-09 2020-05-11 聯策科技股份有限公司 System and method for optimally adjusting imaging parameters
KR20220100621A (en) * 2019-12-24 2022-07-15 주식회사 히타치하이테크 Defect Inspection System and Defect Inspection Method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5204912A (en) * 1990-02-26 1993-04-20 Gerber Systems Corporation Defect verification and marking system for use with printed circuit boards
US5369431A (en) * 1992-02-25 1994-11-29 Orbotech Verification and repair station of PCBS
US20040120570A1 (en) * 2002-12-24 2004-06-24 Orbotech Ltd Automatic optical inspection system and method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5204912A (en) * 1990-02-26 1993-04-20 Gerber Systems Corporation Defect verification and marking system for use with printed circuit boards
US5369431A (en) * 1992-02-25 1994-11-29 Orbotech Verification and repair station of PCBS
US20040120570A1 (en) * 2002-12-24 2004-06-24 Orbotech Ltd Automatic optical inspection system and method

Also Published As

Publication number Publication date
WO2008120182A2 (en) 2008-10-09
TW201009326A (en) 2010-03-01

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