WO2008107951A1 - Confocal optical microscope - Google Patents

Confocal optical microscope Download PDF

Info

Publication number
WO2008107951A1
WO2008107951A1 PCT/JP2007/054000 JP2007054000W WO2008107951A1 WO 2008107951 A1 WO2008107951 A1 WO 2008107951A1 JP 2007054000 W JP2007054000 W JP 2007054000W WO 2008107951 A1 WO2008107951 A1 WO 2008107951A1
Authority
WO
WIPO (PCT)
Prior art keywords
irradiation light
irradiated
observation object
optical microscope
object sample
Prior art date
Application number
PCT/JP2007/054000
Other languages
French (fr)
Japanese (ja)
Inventor
Takenao Fujii
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to PCT/JP2007/054000 priority Critical patent/WO2008107951A1/en
Publication of WO2008107951A1 publication Critical patent/WO2008107951A1/en

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

An observation object sample is irradiated with irradiation light from all directions and further irradiated from a direction oblique to the optical axis so that a steep incline part is irradiated well with irradiation light, thus acquiring an image at a steep incline part of the observation object sample. Since the observation object sample is irradiated with the irradiation light from all directions, scanning with the irradiation light is not required and thereby a scanning mechanism is not required. Consequently, an image at a steep incline part of the observation object sample is acquired in a confocal optical microscope.
PCT/JP2007/054000 2007-03-02 2007-03-02 Confocal optical microscope WO2008107951A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/054000 WO2008107951A1 (en) 2007-03-02 2007-03-02 Confocal optical microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/054000 WO2008107951A1 (en) 2007-03-02 2007-03-02 Confocal optical microscope

Publications (1)

Publication Number Publication Date
WO2008107951A1 true WO2008107951A1 (en) 2008-09-12

Family

ID=39737856

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/054000 WO2008107951A1 (en) 2007-03-02 2007-03-02 Confocal optical microscope

Country Status (1)

Country Link
WO (1) WO2008107951A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05113408A (en) * 1991-10-22 1993-05-07 Sony Corp Reflection optical microscope with oblique illumination
JP2650215B2 (en) * 1989-03-02 1997-09-03 カール・ツアイス‐スチフツング Observation device having illumination device
JP2001068900A (en) * 1999-08-30 2001-03-16 Sony Corp Mounted part checking method and device, and lighting equipment

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2650215B2 (en) * 1989-03-02 1997-09-03 カール・ツアイス‐スチフツング Observation device having illumination device
JPH05113408A (en) * 1991-10-22 1993-05-07 Sony Corp Reflection optical microscope with oblique illumination
JP2001068900A (en) * 1999-08-30 2001-03-16 Sony Corp Mounted part checking method and device, and lighting equipment

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