WO2008103733A3 - Gas ionizer - Google Patents
Gas ionizer Download PDFInfo
- Publication number
- WO2008103733A3 WO2008103733A3 PCT/US2008/054425 US2008054425W WO2008103733A3 WO 2008103733 A3 WO2008103733 A3 WO 2008103733A3 US 2008054425 W US2008054425 W US 2008054425W WO 2008103733 A3 WO2008103733 A3 WO 2008103733A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- emitter
- gas
- gas ionizer
- emitters
- ionization
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/26—Ion sources; Ion guns using surface ionisation, e.g. field effect ion sources, thermionic ion sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2201/00—Electrodes common to discharge tubes
- H01J2201/30—Cold cathodes
- H01J2201/304—Field emission cathodes
- H01J2201/30403—Field emission cathodes characterised by the emitter shape
- H01J2201/30434—Nanotubes
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Carbon And Carbon Compounds (AREA)
Abstract
Field emission based ionization sources are provided, with the emitter (305) being a carbon nanotube field emitter. Such emitters can replace Ni-63 beta emitters. Ionization of a gas (308) that is flowed through the gap (310) between the emitter plates (301, 302) is performed by electron capture of the flow of electrons by the molecules in the gas (308).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US90248707P | 2007-02-20 | 2007-02-20 | |
US60/902,487 | 2007-02-20 |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2008103733A2 WO2008103733A2 (en) | 2008-08-28 |
WO2008103733A9 WO2008103733A9 (en) | 2008-10-23 |
WO2008103733A3 true WO2008103733A3 (en) | 2009-06-04 |
Family
ID=39494642
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2008/054425 WO2008103733A2 (en) | 2007-02-20 | 2008-02-20 | Gas ionizer |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2008103733A2 (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102009005982B4 (en) | 2009-01-23 | 2018-07-12 | Airbus Defence and Space GmbH | Surface ionization gas detector with nanotips |
US9500572B2 (en) | 2009-04-30 | 2016-11-22 | Purdue Research Foundation | Sample dispenser including an internal standard and methods of use thereof |
CA2888351A1 (en) | 2013-01-31 | 2014-08-07 | Purdue Research Foundation | Methods of analyzing crude oil |
EP3486937B1 (en) | 2013-06-25 | 2022-07-27 | Purdue Research Foundation | Mass spectrometry analysis of microorganisms in samples |
JP6749459B2 (en) * | 2013-12-30 | 2020-09-02 | パーデュー・リサーチ・ファウンデーションPurdue Research Foundation | Mass spectrometric probe and system for ionizing a sample |
US10395913B2 (en) * | 2013-12-30 | 2019-08-27 | Purdue Research Foundation | Mass spectrometry probes and systems for ionizing a sample transport |
DE102015113314B4 (en) * | 2015-08-12 | 2018-05-30 | Technische Universität Dresden | Ionisierungsanordnung |
CN110095578A (en) * | 2019-05-31 | 2019-08-06 | 北京沃斯彤科技有限公司 | A kind of ion calibration storehouse |
JP7403338B2 (en) * | 2020-02-13 | 2023-12-22 | 日本電子株式会社 | Sample gas analysis system and method |
JP7498653B2 (en) | 2020-12-09 | 2024-06-12 | シャープ株式会社 | Ion generator and ion mobility analyzer |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050098720A1 (en) * | 2003-11-12 | 2005-05-12 | Traynor Peter J. | Carbon nanotube electron ionization sources |
US6958475B1 (en) * | 2003-01-09 | 2005-10-25 | Colby Steven M | Electron source |
US20070029477A1 (en) * | 2005-04-29 | 2007-02-08 | Sionex Corporation | Compact gas chromatography and ion mobility based sample analysis systems, methods, and devices |
-
2008
- 2008-02-20 WO PCT/US2008/054425 patent/WO2008103733A2/en active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6958475B1 (en) * | 2003-01-09 | 2005-10-25 | Colby Steven M | Electron source |
US20050098720A1 (en) * | 2003-11-12 | 2005-05-12 | Traynor Peter J. | Carbon nanotube electron ionization sources |
US20070029477A1 (en) * | 2005-04-29 | 2007-02-08 | Sionex Corporation | Compact gas chromatography and ion mobility based sample analysis systems, methods, and devices |
Also Published As
Publication number | Publication date |
---|---|
WO2008103733A9 (en) | 2008-10-23 |
WO2008103733A2 (en) | 2008-08-28 |
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