WO2008093257A3 - Method of protecting against attacks and circuit therefor - Google Patents
Method of protecting against attacks and circuit therefor Download PDFInfo
- Publication number
- WO2008093257A3 WO2008093257A3 PCT/IB2008/050203 IB2008050203W WO2008093257A3 WO 2008093257 A3 WO2008093257 A3 WO 2008093257A3 IB 2008050203 W IB2008050203 W IB 2008050203W WO 2008093257 A3 WO2008093257 A3 WO 2008093257A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- circuit
- protecting against
- against attacks
- circuit therefor
- address
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/20—Address safety or protection circuits, i.e. arrangements for preventing unauthorized or accidental access
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/024—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0409—Online test
Landscapes
- Engineering & Computer Science (AREA)
- Computer Security & Cryptography (AREA)
- Microelectronics & Electronic Packaging (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Storage Device Security (AREA)
Abstract
The invention relates to a method and to a circuit having a memory module (1) that comprises a memory matrix (2), a column decoder (3), and a line decoder (4), the circuit of the memory module in addition comprising a validation circuit (5), wherein said validation circuit (5) is capable of reconstructing an address from selection signals and comparing this address with the original address or carrying out a plausibility test, whereupon a validation signal can be given if the addresses match or the plausibility thereof is established.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP07001951 | 2007-01-30 | ||
EP07001951.8 | 2007-01-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2008093257A2 WO2008093257A2 (en) | 2008-08-07 |
WO2008093257A3 true WO2008093257A3 (en) | 2008-10-30 |
Family
ID=39523547
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IB2008/050203 WO2008093257A2 (en) | 2007-01-30 | 2008-01-21 | Method of protecting against attacks and circuit therefor |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2008093257A2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR3010822B1 (en) * | 2013-09-17 | 2015-10-02 | Inside Secure | MEMORY CIRCUIT COMPRISING MEANS FOR DETECTING AN ERROR INJECTION |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4912710A (en) * | 1988-02-29 | 1990-03-27 | Harris Corporation | Self-checking random access memory |
US20060156193A1 (en) * | 2004-11-30 | 2006-07-13 | Nicolas Demange | Error test for an address decoder of a non-volatile memory |
US20070002616A1 (en) * | 2005-06-15 | 2007-01-04 | Stmicroelectronics S.A. | Memory protected against attacks by error injection in memory cells selection signals |
-
2008
- 2008-01-21 WO PCT/IB2008/050203 patent/WO2008093257A2/en active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4912710A (en) * | 1988-02-29 | 1990-03-27 | Harris Corporation | Self-checking random access memory |
US20060156193A1 (en) * | 2004-11-30 | 2006-07-13 | Nicolas Demange | Error test for an address decoder of a non-volatile memory |
US20070002616A1 (en) * | 2005-06-15 | 2007-01-04 | Stmicroelectronics S.A. | Memory protected against attacks by error injection in memory cells selection signals |
Also Published As
Publication number | Publication date |
---|---|
WO2008093257A2 (en) | 2008-08-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2007005551A3 (en) | Automatic detection of micro-tile enabled memory | |
WO2006056988A3 (en) | System, method and apparatus of securing an operating system | |
WO2011094437A3 (en) | Memory access methods and apparatus | |
WO2011034673A3 (en) | Memory device and method | |
WO2007100694A3 (en) | Systems, methods, and apparatuses for using the same memory type to support an error check mode and a non-error check mode | |
TW428175B (en) | Integrated memory | |
WO2007010189A3 (en) | Flash memory error correction | |
WO2008025515A3 (en) | Test engine selecting test cases based on application configuration settings | |
WO2007124307A3 (en) | Virtually-tagged instruction cache with physically-tagged behavior | |
WO2008042298A3 (en) | Data cache virtual hint way prediction, and applications thereof | |
WO2006118667A3 (en) | Prefetching across a page boundary | |
NO20084253L (en) | Tetrahydroisoquinoline derivatives to improve memory function | |
WO2007015773A3 (en) | Memory device and method having multiple address, data and command buses | |
WO2007137023A3 (en) | Flow sensor with conditioning-coefficient memory | |
TW200641909A (en) | Pseudo SRAM capable of operating in continuous burst mode and method of controlling burst mode operation thereof | |
WO2008019189A3 (en) | Secure storage of data | |
WO2007137025A3 (en) | Signal conditioning ic with conditioning-coefficient memory | |
GB0517644D0 (en) | Systems and methods for protecting against erroneous price entries in the electronic trading of financial and other instruments | |
PL1891838T3 (en) | Determination of the bus address of a subscriber in an illuminating bus system | |
WO2006014395A3 (en) | Memory systems and methods | |
WO2011163022A3 (en) | Memory write operation methods and circuits | |
WO2010039625A3 (en) | Common memory device for variable device width and scalable pre-fetch and page size | |
WO2010059490A3 (en) | Replacing defective memory blocks in response to external addresses | |
WO2008089157A3 (en) | Column leakage compensation in a sensing circuit | |
WO2009002940A3 (en) | Systems and methods of reading nonvolatile memory |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 08702474 Country of ref document: EP Kind code of ref document: A2 |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 08702474 Country of ref document: EP Kind code of ref document: A2 |