WO2008079742A3 - Prévention de dépôt de film sur une paroi de chambre de traitement pecvd - Google Patents
Prévention de dépôt de film sur une paroi de chambre de traitement pecvd Download PDFInfo
- Publication number
- WO2008079742A3 WO2008079742A3 PCT/US2007/087597 US2007087597W WO2008079742A3 WO 2008079742 A3 WO2008079742 A3 WO 2008079742A3 US 2007087597 W US2007087597 W US 2007087597W WO 2008079742 A3 WO2008079742 A3 WO 2008079742A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- chamber
- support
- prevention
- process chamber
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32477—Vessel characterised by the means for protecting vessels or internal parts, e.g. coatings
- H01J37/32495—Means for protecting the vessel against plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Plasma Technology (AREA)
Abstract
L'invention concerne un procédé et un appareil pour traiter un substrat. Le corps d'une chambre comprend un fond et une paroi latérale pourvue d'une valve fendue. Un porte-substrat comprenant un corps de support est disposé dans le corps de la chambre. Une première extrémité d'au moins un conducteur de terre RF large est couplée au corps du support et une deuxième extrémité d'au moins un conducteur de terre RF est couplée au fond de la chambre. Au moins une barre d'extension est positionnée le long d'un bord périphérique du corps de support. Le procédé de l'invention consiste à utiliser une chambre de traitement qui comprend une valve fendue et un porte-substrat; à envoyer une puissance RF à une plaque de distribution disposée sur le porte-substrat; à faire circuler un gaz dans la plaque de distribution; à traiter au plasma un substrat disposé sur le porte-substrat; et à réduire la génération de plasma adjacent à la valve fendue.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US61392406A | 2006-12-20 | 2006-12-20 | |
US61393406A | 2006-12-20 | 2006-12-20 | |
US11/613,934 | 2006-12-20 | ||
US11/613,924 | 2006-12-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2008079742A2 WO2008079742A2 (fr) | 2008-07-03 |
WO2008079742A3 true WO2008079742A3 (fr) | 2008-10-30 |
Family
ID=39563168
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2007/087597 WO2008079742A2 (fr) | 2006-12-20 | 2007-12-14 | Prévention de dépôt de film sur une paroi de chambre de traitement pecvd |
Country Status (2)
Country | Link |
---|---|
TW (1) | TWI455192B (fr) |
WO (1) | WO2008079742A2 (fr) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104513972A (zh) * | 2014-12-31 | 2015-04-15 | 深圳市华星光电技术有限公司 | 化学气相沉积设备 |
WO2020177119A1 (fr) * | 2019-03-07 | 2020-09-10 | Applied Materials, Inc. | Conception de ruban de mise à la terre |
KR20210148406A (ko) * | 2019-04-29 | 2021-12-07 | 어플라이드 머티어리얼스, 인코포레이티드 | 접지 스트랩 조립체들 |
CN110656321B (zh) * | 2019-09-16 | 2021-08-03 | 武汉华星光电半导体显示技术有限公司 | 一种接地结构及具有该接地结构的化学气相沉积设备 |
CN114000192B (zh) * | 2021-10-29 | 2023-10-13 | 北京北方华创微电子装备有限公司 | 半导体工艺设备以及晶圆位置状态的监测方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030211757A1 (en) * | 2002-05-07 | 2003-11-13 | Applied Materials, Inc. | Substrate support with extended radio frequency electrode upper surface |
US20050056370A1 (en) * | 2001-08-09 | 2005-03-17 | Applied Materials, Inc. | Pedestal with integral shield |
US20060060302A1 (en) * | 2004-09-21 | 2006-03-23 | White John M | RF grounding of cathode in process chamber |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7393432B2 (en) * | 2004-09-29 | 2008-07-01 | Lam Research Corporation | RF ground switch for plasma processing system |
-
2007
- 2007-12-14 WO PCT/US2007/087597 patent/WO2008079742A2/fr active Application Filing
- 2007-12-17 TW TW096148312A patent/TWI455192B/zh active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050056370A1 (en) * | 2001-08-09 | 2005-03-17 | Applied Materials, Inc. | Pedestal with integral shield |
US20030211757A1 (en) * | 2002-05-07 | 2003-11-13 | Applied Materials, Inc. | Substrate support with extended radio frequency electrode upper surface |
US20060060302A1 (en) * | 2004-09-21 | 2006-03-23 | White John M | RF grounding of cathode in process chamber |
Also Published As
Publication number | Publication date |
---|---|
WO2008079742A2 (fr) | 2008-07-03 |
TWI455192B (zh) | 2014-10-01 |
TW200834688A (en) | 2008-08-16 |
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