WO2008014157A2 - Intumescent paint coatings for inhibiting tin whisker growth and methods of making and using the same - Google Patents

Intumescent paint coatings for inhibiting tin whisker growth and methods of making and using the same Download PDF

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Publication number
WO2008014157A2
WO2008014157A2 PCT/US2007/073746 US2007073746W WO2008014157A2 WO 2008014157 A2 WO2008014157 A2 WO 2008014157A2 US 2007073746 W US2007073746 W US 2007073746W WO 2008014157 A2 WO2008014157 A2 WO 2008014157A2
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WO
WIPO (PCT)
Prior art keywords
tin
lead
coating
electrical
finish
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2007/073746
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French (fr)
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WO2008014157A3 (en
Inventor
Merrill M. Jackson
David Humphrey
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Honeywell International Inc
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Honeywell International Inc
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Filing date
Publication date
Application filed by Honeywell International Inc filed Critical Honeywell International Inc
Publication of WO2008014157A2 publication Critical patent/WO2008014157A2/en
Publication of WO2008014157A3 publication Critical patent/WO2008014157A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C13/00Alloys based on tin
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D5/00Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
    • C09D5/18Fireproof paints including high temperature resistant paints
    • C09D5/185Intumescent paints
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistors
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components
    • H05K3/3436Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/40Leadframes
    • H10W70/456Materials
    • H10W70/457Materials of metallic layers on leadframes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/40Leadframes
    • H10W70/456Materials
    • H10W70/458Materials of insulating layers on leadframes
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621Components characterised by their electrical contacts
    • H05K2201/10689Leaded Integrated Circuit [IC] package, e.g. dual-in-line [DIL]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10742Details of leads
    • H05K2201/10886Other details
    • H05K2201/10909Materials of terminal, e.g. of leads or electrodes of components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/24Reinforcing of the conductive pattern
    • H05K3/244Finish plating of conductors, especially of copper conductors, e.g. for pads or lands
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12493Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
    • Y10T428/12535Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.] with additional, spatially distinct nonmetal component
    • Y10T428/12556Organic component

Definitions

  • the present invention relates to new or refurbished electronic assemblies or assembly components that may have a metal plating or finish, and more particularly to such assemblies or components having a tin plating or finish.
  • Tin finishes may be susceptible to spontaneous growth of single crystal structures known as tin whiskers.
  • Tin whiskers are cylindrical, needle-like crystals that may grow either straight or kinked, and usually have a longitudinally striated surface. Growth rates for tin whiskers vary, although rates from 0.03 to 9 mm/yr have been reported. Interrelated factors including substrate materials, grain structure, plating chemistry, and plating thickness may influence growth rate. Although the whisker length depends on growth rate and sustained periods of growth, in experimental tests most measure between 0.5 and 5.0 mm although whiskers having a length of more than to 10 mm have been reported.
  • tin whiskers The growth mechanisms for tin whiskers are largely unknown, although it is widely believed that whisker formation and growth are correlated with stresses such as localized compressive forces and environmental stresses on the tin plating or finish. Additional factors that may influence tin whisker growth include the materials constituting the substrate underlying the tin, and specifically a significant difference in the coefficients of thermal expansion between tin and the underlying substrate material since such a difference may stress the tin.
  • Tin whiskers may cause electrical failures ranging from performance degradation to short circuits.
  • the elongate structures have interfered with sensitive optical surfaces or the movement of micro-electromechanical systems (MEMS).
  • MEMS micro-electromechanical systems
  • solder layer is thin and consequently incorporates less lead to the lead body than a conventional tin/lead coating that would be used in the absence of a tin plating or finish. While the thin solder layer is effective, it is not easily applied at the lead body region that interfaces with another electrical component without damaging the electrical component.
  • a quad flat pack is a fine-pitch surface mounting technology package that is rectangular or square with numerous ⁇ 1 mm gull-wing shaped leads on all four sides. Each of the leads may include a tin finish.
  • the leads may be dipped in molten tin/lead solder.
  • molten solder touches the quad flat pack base surface, the heat may damage the component.
  • there is a collar of pure tin on each lead body adjacent to the component body which may produce tin whiskers. Since the numerous leads are very fine and closely-spaced, the tin whiskers may degrade the component performance or even cause adjacent leads to short circuit.
  • the present invention provides an electrical component, comprising a conductive substrate, a tin layer formed on the substrate, and a coating of a foam formed on the tin layer to impede tin whisker growth, the coating comprising a foam having voids dispersed therethrough.
  • the present invention also provides a method for impeding tin whisker growth from a tin plating or finish formed over an electrical component.
  • the tin plating or finish is first covered with a coating of intumescent paint. Thereafter, the intumescent paint is expanded into a foam having voids dispersed therethrough.
  • FIG. 1 is a cross-sectional view of a quad flat pack having tin finished leads extending therefrom, the leads having an intumescent paint formed thereon according to an embodiment of the present invention
  • FIG. 2 is a cross-sectional view of one of the leads illustrated in FIG. 1, including the tin finish and the intumescent paint formed thereon according to an embodiment of the present invention.
  • FIG. 3 is a flow chart that illustrates an exemplary method for forming a coating of expanded intumescent paint on an electrical component according to an embodiment of the present invention.
  • Electrical assemblies and components of the present invention have a tin plating or finish, and a coating formed from an expanded intumescent paint around the tin plating or finish.
  • the paint is electrically nonconductive, and includes voids that are produced when the paint expands. Growth of tin whiskers through the expanded intumescent paint is inhibited due to the paint's discontinuous structure. More particularly, the voids remove lateral support for the tin whiskers, causing them to buckle and consequently either fail to exit the intumescent paint coating or fail to grow a substantial distance from the intumescent paint coating outer surface.
  • FIG. 1 a cross-sectional view of a quad flat pack 10 having tin finished leads 18 extending therefrom.
  • the quad flat pack 10 is just one exemplary, and the present invention is directed to any assembly or electrical component that may practically incorporate an intumescent paint formed around a tin plated or finished conductive element.
  • a few examples of such components include a circuit card assembly, a wiring board, one or more components printed on a wiring board, and one or more conductive leads.
  • the quad flat pack 10 illustrated in FIG. 1 includes a die-attach pad 12, which is formed from a conductive material such as a copper alloy, and a die 14 having an integrated circuit formed therein disposed on the pad 12.
  • the pad 12 and die 14 are encapsulated in a mold compound 15 such as an epoxy material.
  • a plurality of leads 18, i.e. two hundred and fifty or more leads, are coupled to contacts for respective circuit elements on the die 14 using a plurality of respective bond wires 16. A portion of each lead 18, along with its associated bond wire 16, is encapsulated in the mold compound 15.
  • Each of the leads 18 is a conductive material such as copper, and includes a tin finish.
  • FIG. 2 is a cross-sectional view of the region "A" from FIG. 1, and depicts one representative lead 18 having a tin finish 19 formed around the lead 18.
  • a thin layer of tin/lead solder 20 is coated over most of the tin.
  • the solder 20 is not easily applied at the lead body region that interfaces with the quad flat pack 10. For example, if molten solder touches the quad flat pack base surface, the heat may damage the overall quad flat pack 10.
  • the collar 25 of pure tin is coated with a layer of intumescent paint 22 to impede tin whisker growth.
  • the intumescent paint 22 is a foam that is expanded by thermally activating a paint layer.
  • most intumescent paints are a latex- based material, which forms a carbon-based char foam when thermally activated
  • the foam includes a paint matrix 28 with a distribution of voids 30 that are products of the thermal expansion.
  • a tin whisker 24 may penetrate the paint matrix 28 immediately adjacent to the tin finish 19. Further, a tin whisker 24 may continue to grow until it enters one of the voids 30 distributed throughout the foam.
  • the tin whisker 24 buckles after it continues to grow and traverses a void 30. Buckling occurs as the tin whisker 24 collides with the paint matrix 28 after traversing the void 30, and has insufficient lateral support to re-penetrate the paint matrix 28. Instead, the whisker 24 buckles and is unable to continue penetrating the coating.
  • the voids 30 preferably have a width that is at least ten times the tin whisker width. For example, if a tin whisker has a width of 3 microns, the void 30 should have a width of at least about 30 microns. Since tin whiskers typically have widths of up to about 5 microns, exemplary voids 30 have average widths of at least about 50 microns, although smaller voids may be selected if it is found that the tin whiskers are particularly thin growths. The tin whisker 24 becomes more bendable as it lengthens inside a void 30.
  • the paint matrix 28, at the point where the tin whisker 24 entered the void 30, may provide sufficient lateral support to enable the tin whisker 24 to re-penetrate the paint matrix 28 without buckling. Since voids 30 are created by thermally activating the intumescent paint 22 and causing it to swell into a foam, void size can be manipulated by controlling the heating conditions, as will be subsequently described in detail.
  • FIG. 3 a flow diagram illustrates an exemplary method for forming a coating of expanded intumescent paint on an electrical component.
  • the method is applicable generally to various electrical components that include a tin plating or finish.
  • an intumescent paint is applied to at least a portion of the tin plated or finished component as step 32.
  • the paint may be applied by a variety of application methods, including screen printing, chemical deposition, and thermal or cold physical deposition methods, to name a few.
  • the paint is activated and thereby expanded as step 34.
  • the paint is expanded by subjecting the painted component to a temperature sufficient to expand the paint to a foam having predetermined void sizes.
  • the voids dispersed throughout the foam should be sufficiently large to allow any tin whiskers to grow until the whiskers, before traversing the entire void, have insufficient lateral support to re-enter the foam matrix. Since the voids become larger as the paint increases in temperature, heat application is preferably controlled to control the average pore size in the paint foam.
  • FIG. 4 is a flow diagram that illustrates a more specific exemplary method for forming a coating of expanded intumescent paint. This method is directed to the embodiment depicted in FIG. 1, which includes a lead 18 having a tin finish 19 is covered with an intumescent paint foam 22. Before the intumescent paint is applied, the assembly 10 includes the tin finished leads 18 bonded to circuit elements that are part of the encapsulated die. Any assembling that may be necessary to bring the assembly 10 to this point, including bonding the leads 18 to the die 14, may be performed as a preliminary step 42.
  • the intumescent paint 22 is applied to the collar region 25 of the tin finished leads 18 as step 44.
  • the paint may be applied by a variety of application methods, including screen printing, chemical deposition, and thermal or cold physical deposition methods, to name a few.
  • solder is applied to the leads 18 as step 46.
  • exemplary solders include a lead/tin material or a tin/silver/copper (SAC) alloy, as tin whiskers do not tend to grow through such a solders.
  • the solder is applied by dipping the leads into molten-phase solder, which then solidifies to form the solder coating 20.
  • soldered ends of the leads 18 are joined to an external component as step 48.
  • Joining by a soldering technique requires sufficient heat to melt the solder.
  • the heat generated by melting the solder is conducted along the lead to heat and thereby expand the intumescent paint 22 into a foam as step 50.
  • the solder and intumescent paint are selected such that the melting temperature for the solder coincides with the expansion temperature for the intumescent paint.
  • the voids in the expanded foam preferably have a width that is at least ten times the tin whisker width since a tin whisker becomes more bendable as it lengthens inside a void.
  • void size can be manipulated by controlling the heating conditions. More particularly, the temperature and the heating duration may be increased or decreased in order to respectively increase or decrease the average void size in the foam. The temperature and heating duration will vary depending on the paint material and its expansion properties.
  • the several methods and coating materials therefore provide electrical assemblies and components having a tin plating or finish, and a coating of expanded intumescent paint around the tin plating or finish.
  • the voids in the foamed paint inhibit growth of any tin whiskers through the coating.

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
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  • Electroplating Methods And Accessories (AREA)
  • Paints Or Removers (AREA)

Abstract

An electrical component includes a conductive substrate (18), a tin layer (19) formed on the substrate, and a coating (22) of a foam formed on the tin layer to impede tin whisker growth, the coating comprising a foam (28) having voids (30) dispersed therethrough. A method for impeding tin whisker growth from a tin plating or finish formed over an electrical component includes covering the tin plating or finish with a coating of intumescent paint, and thereafter expanding the intumescent paint into a foam having voids dispersed therethrough.

Description

INTUMESCENT PAINT COATINGS FOR INHIBITING TIN WHISKER GROWTH AND METHODS OF MAKING AND USING THE SAME
CROSS-REFERENCES TO RELATED APPLICATIONS
[0001] This application claims the benefit of U.S. Provisional Application No. 60/811,609, filed June 7, 2006.
TECHNICAL FIELD
[0002] The present invention relates to new or refurbished electronic assemblies or assembly components that may have a metal plating or finish, and more particularly to such assemblies or components having a tin plating or finish.
BACKGROUND
[0003] Electronic assemblies or assembly components are often plated or finished with a metal. Printed wiring boards and electrical leads are just some examples of many components that typically have a metal finish. Perhaps the most abundant metal composition for a plating or a finish has been lead/tin (PbSn). However, laws and directives recently passed in several countries encourage or require the elimination of lead by those procuring, designing, building, or repairing electronic assemblies. The restriction of lead use has generated a transition by many piece part and board suppliers from PbSn surface finishes to lead-free finishes such as pure tin.
[0004] Tin finishes may be susceptible to spontaneous growth of single crystal structures known as tin whiskers. Tin whiskers are cylindrical, needle-like crystals that may grow either straight or kinked, and usually have a longitudinally striated surface. Growth rates for tin whiskers vary, although rates from 0.03 to 9 mm/yr have been reported. Interrelated factors including substrate materials, grain structure, plating chemistry, and plating thickness may influence growth rate. Although the whisker length depends on growth rate and sustained periods of growth, in experimental tests most measure between 0.5 and 5.0 mm although whiskers having a length of more than to 10 mm have been reported. The growth mechanisms for tin whiskers are largely unknown, although it is widely believed that whisker formation and growth are correlated with stresses such as localized compressive forces and environmental stresses on the tin plating or finish. Additional factors that may influence tin whisker growth include the materials constituting the substrate underlying the tin, and specifically a significant difference in the coefficients of thermal expansion between tin and the underlying substrate material since such a difference may stress the tin.
[0005] Tin whiskers may cause electrical failures ranging from performance degradation to short circuits. In some cases, the elongate structures have interfered with sensitive optical surfaces or the movement of micro-electromechanical systems (MEMS). Thus, tin whiskers are a potential reliability hazard.
[0006] One conventional attempt to impede tin whisker formation on tin plated or finished lead bodies is to overcoat the tin with a layer of tin/lead solder. The solder layer is thin and consequently incorporates less lead to the lead body than a conventional tin/lead coating that would be used in the absence of a tin plating or finish. While the thin solder layer is effective, it is not easily applied at the lead body region that interfaces with another electrical component without damaging the electrical component. For example, a quad flat pack is a fine-pitch surface mounting technology package that is rectangular or square with numerous < 1 mm gull-wing shaped leads on all four sides. Each of the leads may include a tin finish. To impede tin whisker growth, the leads may be dipped in molten tin/lead solder. However, if molten solder touches the quad flat pack base surface, the heat may damage the component. Thus, there is a collar of pure tin on each lead body adjacent to the component body, which may produce tin whiskers. Since the numerous leads are very fine and closely-spaced, the tin whiskers may degrade the component performance or even cause adjacent leads to short circuit.
[0007] It is therefore desirable to provide materials and manufacturing procedures that mitigate the tendencies of pure tin and tin-containing solders, platings, and finishes to form tin whiskers. It is also desirable to provide such materials and methods that minimize the use of lead-containing compositions.
BRIEF SUMMARY
[0008] The present invention provides an electrical component, comprising a conductive substrate, a tin layer formed on the substrate, and a coating of a foam formed on the tin layer to impede tin whisker growth, the coating comprising a foam having voids dispersed therethrough.
[0009] The present invention also provides a method for impeding tin whisker growth from a tin plating or finish formed over an electrical component. The tin plating or finish is first covered with a coating of intumescent paint. Thereafter, the intumescent paint is expanded into a foam having voids dispersed therethrough.
[0010] Other independent features and advantages of the preferred coatings and coating methods will become apparent from the following detailed description, taken in conjunction with the accompanying drawings which illustrate, by way of example, the principles of the invention.
BRIEF DESCRIPTION OF THE DRAWINGS
[0011] FIG. 1 is a cross-sectional view of a quad flat pack having tin finished leads extending therefrom, the leads having an intumescent paint formed thereon according to an embodiment of the present invention;
[0012] FIG. 2 is a cross-sectional view of one of the leads illustrated in FIG. 1, including the tin finish and the intumescent paint formed thereon according to an embodiment of the present invention; and
[0013] FIG. 3 is a flow chart that illustrates an exemplary method for forming a coating of expanded intumescent paint on an electrical component according to an embodiment of the present invention.
DETAILED DESCRIPTION OF A PREFERRED EMBODIMENT
[0014] The following detailed description of the invention is merely exemplary in nature and is not intended to limit the invention or the application and uses of the invention. Furthermore, there is no intention to be bound by any theory presented in the preceding background of the invention or the following detailed description of the invention.
[0015] Electrical assemblies and components of the present invention have a tin plating or finish, and a coating formed from an expanded intumescent paint around the tin plating or finish. The paint is electrically nonconductive, and includes voids that are produced when the paint expands. Growth of tin whiskers through the expanded intumescent paint is inhibited due to the paint's discontinuous structure. More particularly, the voids remove lateral support for the tin whiskers, causing them to buckle and consequently either fail to exit the intumescent paint coating or fail to grow a substantial distance from the intumescent paint coating outer surface. [0016] Turning now to FIG. 1, a cross-sectional view of a quad flat pack 10 having tin finished leads 18 extending therefrom. The quad flat pack 10 is just one exemplary, and the present invention is directed to any assembly or electrical component that may practically incorporate an intumescent paint formed around a tin plated or finished conductive element. A few examples of such components include a circuit card assembly, a wiring board, one or more components printed on a wiring board, and one or more conductive leads. The quad flat pack 10 illustrated in FIG. 1 includes a die-attach pad 12, which is formed from a conductive material such as a copper alloy, and a die 14 having an integrated circuit formed therein disposed on the pad 12. The pad 12 and die 14 are encapsulated in a mold compound 15 such as an epoxy material. A plurality of leads 18, i.e. two hundred and fifty or more leads, are coupled to contacts for respective circuit elements on the die 14 using a plurality of respective bond wires 16. A portion of each lead 18, along with its associated bond wire 16, is encapsulated in the mold compound 15.
[0017] Each of the leads 18 is a conductive material such as copper, and includes a tin finish. FIG. 2 is a cross-sectional view of the region "A" from FIG. 1, and depicts one representative lead 18 having a tin finish 19 formed around the lead 18. To impede tin whisker formation from the tin finish 19, a thin layer of tin/lead solder 20 is coated over most of the tin. However, the solder 20 is not easily applied at the lead body region that interfaces with the quad flat pack 10. For example, if molten solder touches the quad flat pack base surface, the heat may damage the overall quad flat pack 10. Thus, there is a collar 25 of pure tin on each lead body adjacent to the quad flat pack 10.
[0018] The collar 25 of pure tin is coated with a layer of intumescent paint 22 to impede tin whisker growth. The intumescent paint 22 is a foam that is expanded by thermally activating a paint layer. For example, most intumescent paints are a latex- based material, which forms a carbon-based char foam when thermally activatedThe foam includes a paint matrix 28 with a distribution of voids 30 that are products of the thermal expansion. A tin whisker 24 may penetrate the paint matrix 28 immediately adjacent to the tin finish 19. Further, a tin whisker 24 may continue to grow until it enters one of the voids 30 distributed throughout the foam. However, the tin whisker 24 buckles after it continues to grow and traverses a void 30. Buckling occurs as the tin whisker 24 collides with the paint matrix 28 after traversing the void 30, and has insufficient lateral support to re-penetrate the paint matrix 28. Instead, the whisker 24 buckles and is unable to continue penetrating the coating.
[0019] In order for the tin whisker 24 to buckle inside a void 30 without substantial resistance, the voids 30 preferably have a width that is at least ten times the tin whisker width. For example, if a tin whisker has a width of 3 microns, the void 30 should have a width of at least about 30 microns. Since tin whiskers typically have widths of up to about 5 microns, exemplary voids 30 have average widths of at least about 50 microns, although smaller voids may be selected if it is found that the tin whiskers are particularly thin growths. The tin whisker 24 becomes more bendable as it lengthens inside a void 30. If the tin whisker 24 is too short, the paint matrix 28, at the point where the tin whisker 24 entered the void 30, may provide sufficient lateral support to enable the tin whisker 24 to re-penetrate the paint matrix 28 without buckling. Since voids 30 are created by thermally activating the intumescent paint 22 and causing it to swell into a foam, void size can be manipulated by controlling the heating conditions, as will be subsequently described in detail.
[0020] Turning now to FIG. 3, a flow diagram illustrates an exemplary method for forming a coating of expanded intumescent paint on an electrical component. The method is applicable generally to various electrical components that include a tin plating or finish. To start, an intumescent paint is applied to at least a portion of the tin plated or finished component as step 32. The paint may be applied by a variety of application methods, including screen printing, chemical deposition, and thermal or cold physical deposition methods, to name a few.
[0021] After applying the intumescent paint to selected component areas, the paint is activated and thereby expanded as step 34. In an exemplary method, the paint is expanded by subjecting the painted component to a temperature sufficient to expand the paint to a foam having predetermined void sizes. As previously discussed, the voids dispersed throughout the foam should be sufficiently large to allow any tin whiskers to grow until the whiskers, before traversing the entire void, have insufficient lateral support to re-enter the foam matrix. Since the voids become larger as the paint increases in temperature, heat application is preferably controlled to control the average pore size in the paint foam.
[0022] FIG. 4 is a flow diagram that illustrates a more specific exemplary method for forming a coating of expanded intumescent paint. This method is directed to the embodiment depicted in FIG. 1, which includes a lead 18 having a tin finish 19 is covered with an intumescent paint foam 22. Before the intumescent paint is applied, the assembly 10 includes the tin finished leads 18 bonded to circuit elements that are part of the encapsulated die. Any assembling that may be necessary to bring the assembly 10 to this point, including bonding the leads 18 to the die 14, may be performed as a preliminary step 42.
[0023] The intumescent paint 22 is applied to the collar region 25 of the tin finished leads 18 as step 44. As with the previous method, the paint may be applied by a variety of application methods, including screen printing, chemical deposition, and thermal or cold physical deposition methods, to name a few.
[0024] After applying the intumescent paint, solder is applied to the leads 18 as step 46. Exemplary solders include a lead/tin material or a tin/silver/copper (SAC) alloy, as tin whiskers do not tend to grow through such a solders. According to an exemplary embodiment, the solder is applied by dipping the leads into molten-phase solder, which then solidifies to form the solder coating 20.
[0025] Next, the soldered ends of the leads 18 are joined to an external component as step 48. Joining by a soldering technique requires sufficient heat to melt the solder. The heat generated by melting the solder is conducted along the lead to heat and thereby expand the intumescent paint 22 into a foam as step 50. In a preferred embodiment, the solder and intumescent paint are selected such that the melting temperature for the solder coincides with the expansion temperature for the intumescent paint. As previously discussed, the voids in the expanded foam preferably have a width that is at least ten times the tin whisker width since a tin whisker becomes more bendable as it lengthens inside a void. Since voids are created by thermally activating the intumescent paint, void size can be manipulated by controlling the heating conditions. More particularly, the temperature and the heating duration may be increased or decreased in order to respectively increase or decrease the average void size in the foam. The temperature and heating duration will vary depending on the paint material and its expansion properties.
[0026] The several methods and coating materials therefore provide electrical assemblies and components having a tin plating or finish, and a coating of expanded intumescent paint around the tin plating or finish. The voids in the foamed paint inhibit growth of any tin whiskers through the coating. While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted for elements thereof without departing from the scope of the invention. In addition, many modifications may be made to adapt to a particular situation or material to the teachings of the invention without departing from the essential scope thereof. Therefore, it is intended that the invention not be limited to the particular embodiment disclosed as the best mode contemplated for carrying out this invention, but that the invention will include all embodiments falling within the scope of the appended claims.

Claims

CLAIMSWE CLAIM:
1. An electrical component, comprising: a conductive substrate (18); a tin layer (19) formed on the substrate; and a coating (22) of a foam formed on the tin layer to impede tin whisker growth, the coating comprising a foam (28) having voids (30) dispersed therethrough.
2. The electrical component according to claim 1, wherein the foam comprises expanded intumescent paint.
3. The electrical component according to claim 1, wherein the conductive substrate is an electrical lead (18), the electrical component further comprises an electrical contact (16), and the electrical lead includes an end that is coupled to the electrical contact, the electrical lead including a painted region proximate to the lead end, the painted region having the coating of expanded intumescent paint thereon.
4. The electrical component according to claim 7, wherein the electrical lead further comprises a coating of solder (22) adjacent to the painted region.
5. The electrical component according to claim 8, wherein the solder comprises an alloy selected from the group consisting of a lead/tin alloy, and a tin/silver/copper alloy.
6. A method for impeding tin whisker growth from a tin plating or finish formed over an electrical component, the method comprising: covering (32) the tin plating or finish (19) with a coating (22) of intumescent paint; and expanding (34) the intumescent paint into a foam (28) having voids (30) dispersed therethrough.
7. The method according to claim 6, wherein the intumescent paint covers a tin plating or finish on an electrical lead (18), the electrical component comprises an electrical contact (16), and the electrical lead includes an end that is coupled to the electrical contact, and the step of covering the tin plating or finish produces a painted region on the lead proximate to the lead end, the painted region having the coating of expanded intumescent paint thereon.
8. The method according to claim 7, further comprising: forming a coating of solder (22) adjacent to the painted region; and soldering the lead to an external component by heating and melting the coating of solder, and thereby expanding the intumescent paint into a foam.
9. The method according to claim 8, wherein the soldering step is performed using a solder selected from the group consisting of a lead/tin alloy, and a tin/silver/copper alloy.
10. The method according to claim 6, wherein covering the tin plating or finish with a coating of intumescent paint comprises applying to the tin plating or finish a material that includes latex.
PCT/US2007/073746 2006-07-25 2007-07-18 Intumescent paint coatings for inhibiting tin whisker growth and methods of making and using the same Ceased WO2008014157A2 (en)

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Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10231344B2 (en) 2007-05-18 2019-03-12 Applied Nanotech Holdings, Inc. Metallic ink
US8404160B2 (en) 2007-05-18 2013-03-26 Applied Nanotech Holdings, Inc. Metallic ink
JP2009108339A (en) * 2007-10-26 2009-05-21 Renesas Technology Corp Semiconductor device and manufacturing method thereof
US8506849B2 (en) 2008-03-05 2013-08-13 Applied Nanotech Holdings, Inc. Additives and modifiers for solvent- and water-based metallic conductive inks
US9730333B2 (en) 2008-05-15 2017-08-08 Applied Nanotech Holdings, Inc. Photo-curing process for metallic inks
JP5740389B2 (en) 2009-03-27 2015-06-24 アプライド・ナノテック・ホールディングス・インコーポレーテッド Buffer layer to enhance photosintering and / or laser sintering
US8422197B2 (en) 2009-07-15 2013-04-16 Applied Nanotech Holdings, Inc. Applying optical energy to nanoparticles to produce a specified nanostructure
TW201419315A (en) 2012-07-09 2014-05-16 Applied Nanotech Holdings Inc Photosintering of micron-sized copper particles
US8907225B1 (en) * 2013-04-11 2014-12-09 The United States Of America As Represented By The Secretary Of The Navy Structures and methods related to detection, sensing, and/or mitigating undesirable structures or intrusion events on structures
CN116887533A (en) * 2023-09-06 2023-10-13 江苏上达半导体有限公司 Surface treatment method for reducing whisker growth of printed circuit board

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3042780A (en) * 1960-09-28 1962-07-03 Gen Electric Resin foam insulated cabinet structure including improved electrical conductor arrangement
US3670091A (en) * 1971-05-20 1972-06-13 Sqrague Electric Co Encapsulated electrical components with protective pre-coat containing collapsible microspheres
US4749626A (en) * 1985-08-05 1988-06-07 Olin Corporation Whisker resistant tin coatings and baths and methods for making such coatings
US4888057A (en) * 1988-06-29 1989-12-19 Her Majesty The Queen As Represented By The Minister Of National Defence Of Her Majesty's Canadian Government Inorganic intumescent fire protective coatings
US5320737A (en) * 1989-08-10 1994-06-14 Olin Corporation Treatment to reduce solder plating whisker formation
US5032421A (en) * 1990-08-21 1991-07-16 Amp Incorporated Metal coating method
US5393573A (en) * 1991-07-16 1995-02-28 Microelectronics And Computer Technology Corporation Method of inhibiting tin whisker growth
US5206088A (en) * 1991-11-13 1993-04-27 Development Products, Inc. Ablative-intumescent system
JP2774906B2 (en) * 1992-09-17 1998-07-09 三菱電機株式会社 Thin semiconductor device and method of manufacturing the same
WO1997012718A1 (en) * 1995-10-06 1997-04-10 Brown University Research Foundation Soldering methods and compositions
JP3302240B2 (en) * 1995-11-28 2002-07-15 シャープ株式会社 Thin film transistor and method of manufacturing the same
US20010051209A1 (en) * 1996-10-11 2001-12-13 Richard Silberglitt Suppresion of voltage breakdown and field emission from surfaces
JP3639088B2 (en) * 1997-06-06 2005-04-13 株式会社ルネサステクノロジ Semiconductor device and wiring tape
US6083633A (en) * 1997-06-16 2000-07-04 Olin Corporation Multi-layer diffusion barrier for a tin coated electrical connector
US6248455B1 (en) * 1998-12-22 2001-06-19 International Business Machines Corporation Alloy-plated sheet steel cured with a thin layer of insulating polymer material forming an electrically nonconductive breachable metal substrate
US6361823B1 (en) * 1999-12-03 2002-03-26 Atotech Deutschland Gmbh Process for whisker-free aqueous electroless tin plating
JP2001185670A (en) * 1999-12-10 2001-07-06 Texas Instr Inc <Ti> Lead frame and its manufacturing method
US20030180621A1 (en) * 2000-08-30 2003-09-25 Isao Matsumoto Non-sintered type thin electrode for battery, battery using same and process for same
JP3417395B2 (en) * 2000-09-21 2003-06-16 松下電器産業株式会社 Lead frame for semiconductor device, method of manufacturing the same, and semiconductor device using the same
EP1215724B1 (en) * 2000-11-20 2012-10-31 Texas Instruments Incorporated Wire bonded semiconductor device with low capacitance coupling
WO2002042519A1 (en) * 2000-11-21 2002-05-30 Sambix Corporation Zinc-plated article free from occurrence of whisker and having rust-resistant, multi-layered film, composition for forming rust-resistant multi-layered film and method for preparing zinc-plated article free from occurrence of whisker and having rust-resistant, multi-layered film
EP1241281A1 (en) * 2001-03-16 2002-09-18 Shipley Co. L.L.C. Tin plating
US20020185716A1 (en) * 2001-05-11 2002-12-12 Abys Joseph Anthony Metal article coated with multilayer finish inhibiting whisker growth
US20030025182A1 (en) * 2001-06-22 2003-02-06 Abys Joseph A. Metal article coated with tin or tin alloy under tensile stress to inhibit whisker growth
CN100517422C (en) * 2002-03-07 2009-07-22 三洋电机株式会社 Distributing structure, its manufacturing method and optical equipment
US20040002559A1 (en) * 2002-04-10 2004-01-01 Malisa Troutman Flame retardant coatings
TW543164B (en) * 2002-05-29 2003-07-21 Kingtron Electronics Co Ltd Tape structure and fabrication method thereof
DE10238943B4 (en) * 2002-08-24 2013-01-03 Evonik Degussa Gmbh Separator-electrode unit for lithium-ion batteries, method for their production and use in lithium batteries and a battery, comprising the separator-electrode unit
US7105383B2 (en) * 2002-08-29 2006-09-12 Freescale Semiconductor, Inc. Packaged semiconductor with coated leads and method therefore
KR100495184B1 (en) * 2002-12-02 2005-06-14 엘지마이크론 주식회사 A tape substrate and tin plating method of the tape substrate
JP2004204308A (en) * 2002-12-25 2004-07-22 Nec Semiconductors Kyushu Ltd Lead-free tin alloy plating method
JP4688406B2 (en) * 2003-04-17 2011-05-25 セイコーインスツル株式会社 Electrochemical cell with terminal
US6773828B1 (en) * 2003-04-18 2004-08-10 Ase Electronics (M) Sdn. Bhd. Surface preparation to eliminate whisker growth caused by plating process interruptions
JP4603812B2 (en) * 2003-05-12 2010-12-22 ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. Improved tin plating method
JP4434669B2 (en) * 2003-09-11 2010-03-17 Necエレクトロニクス株式会社 Electronic components
US7391116B2 (en) * 2003-10-14 2008-06-24 Gbc Metals, Llc Fretting and whisker resistant coating system and method
US20050249968A1 (en) * 2004-05-04 2005-11-10 Enthone Inc. Whisker inhibition in tin surfaces of electronic components
US20050249969A1 (en) * 2004-05-04 2005-11-10 Enthone Inc. Preserving solderability and inhibiting whisker growth in tin surfaces of electronic components
KR20070006747A (en) * 2004-01-21 2007-01-11 엔쏜 인코포레이티드 Method of preserving solderability and suppressing whisker growth on tin surface of electronic parts
US20050274480A1 (en) * 2004-05-24 2005-12-15 Barsoum Michel W Reduction of spontaneous metal whisker formation
US7215014B2 (en) * 2004-07-29 2007-05-08 Freescale Semiconductor, Inc. Solderable metal finish for integrated circuit package leads and method for forming
US20060068218A1 (en) * 2004-09-28 2006-03-30 Hooghan Kultaransingh N Whisker-free lead frames
JP4185480B2 (en) * 2004-09-28 2008-11-26 富士通マイクロエレクトロニクス株式会社 Semiconductor device using multilayer lead-free plating and manufacturing method thereof

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