WO2008011035A3 - Line-reflect-reflect match calibration - Google Patents

Line-reflect-reflect match calibration Download PDF

Info

Publication number
WO2008011035A3
WO2008011035A3 PCT/US2007/016220 US2007016220W WO2008011035A3 WO 2008011035 A3 WO2008011035 A3 WO 2008011035A3 US 2007016220 W US2007016220 W US 2007016220W WO 2008011035 A3 WO2008011035 A3 WO 2008011035A3
Authority
WO
WIPO (PCT)
Prior art keywords
reflect
line
calibration
match calibration
match
Prior art date
Application number
PCT/US2007/016220
Other languages
French (fr)
Other versions
WO2008011035A2 (en
Inventor
Leonard Hayden
Original Assignee
Cascade Microtech Inc
Leonard Hayden
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cascade Microtech Inc, Leonard Hayden filed Critical Cascade Microtech Inc
Publication of WO2008011035A2 publication Critical patent/WO2008011035A2/en
Publication of WO2008011035A3 publication Critical patent/WO2008011035A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Abstract

A method of compensating a calibration for a vector network analyzer [VNA] includes performing calibrations on at least a pair of por [El. E2 E3.E4] to determine error terms associated with each port [E1.E2.E3 E4] wherein at least one of the error term is based upon selecting the reactacne of the load standard from a set of potential values in a manner such that the reference reactance errors are reduced
PCT/US2007/016220 2006-07-18 2007-07-17 Line-reflect-reflect match calibration WO2008011035A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US83194006P 2006-07-18 2006-07-18
US60/831,940 2006-07-18
US85125406P 2006-10-11 2006-10-11
US60/851,254 2006-10-11

Publications (2)

Publication Number Publication Date
WO2008011035A2 WO2008011035A2 (en) 2008-01-24
WO2008011035A3 true WO2008011035A3 (en) 2008-09-04

Family

ID=38957326

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/016220 WO2008011035A2 (en) 2006-07-18 2007-07-17 Line-reflect-reflect match calibration

Country Status (2)

Country Link
TW (1) TW200807601A (en)
WO (1) WO2008011035A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106324541B (en) * 2016-08-17 2019-09-24 中国电子科技集团公司第四十一研究所 A kind of non-insertable devices measurement calibration method
CN111289930A (en) * 2020-03-13 2020-06-16 深圳天溯计量检测股份有限公司 Calibration method of inductance tester
CN114137379A (en) * 2021-11-01 2022-03-04 中国电子科技集团公司第十三研究所 Preparation method of LRRM calibration piece and LRRM calibration piece

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5047725A (en) * 1989-11-28 1991-09-10 Cascade Microtech, Inc. Verification and correction method for an error model for a measurement network

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5047725A (en) * 1989-11-28 1991-09-10 Cascade Microtech, Inc. Verification and correction method for an error model for a measurement network

Also Published As

Publication number Publication date
WO2008011035A2 (en) 2008-01-24
TW200807601A (en) 2008-02-01

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