WO2007090772A3 - Circuit and testing device - Google Patents

Circuit and testing device Download PDF

Info

Publication number
WO2007090772A3
WO2007090772A3 PCT/EP2007/050933 EP2007050933W WO2007090772A3 WO 2007090772 A3 WO2007090772 A3 WO 2007090772A3 EP 2007050933 W EP2007050933 W EP 2007050933W WO 2007090772 A3 WO2007090772 A3 WO 2007090772A3
Authority
WO
WIPO (PCT)
Prior art keywords
conductors
test
column
row
conductor
Prior art date
Application number
PCT/EP2007/050933
Other languages
German (de)
French (fr)
Other versions
WO2007090772A2 (en
Inventor
Erwin Hetzenecker
Gerhard Wild
Original Assignee
Siemens Ag
Erwin Hetzenecker
Gerhard Wild
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag, Erwin Hetzenecker, Gerhard Wild filed Critical Siemens Ag
Publication of WO2007090772A2 publication Critical patent/WO2007090772A2/en
Publication of WO2007090772A3 publication Critical patent/WO2007090772A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60R—VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISE PROVIDED FOR
    • B60R21/00—Arrangements or fittings on vehicles for protecting or preventing injuries to occupants or pedestrians in case of accidents or other traffic risks
    • B60R21/01—Electrical circuits for triggering passive safety arrangements, e.g. airbags, safety belt tighteners, in case of vehicle accidents or impending vehicle accidents
    • B60R21/015—Electrical circuits for triggering passive safety arrangements, e.g. airbags, safety belt tighteners, in case of vehicle accidents or impending vehicle accidents including means for detecting the presence or position of passengers, passenger seats or child seats, and the related safety parameters therefor, e.g. speed or timing of airbag inflation in relation to occupant position or seat belt use
    • B60R21/01512—Passenger detection systems
    • B60R21/0153—Passenger detection systems using field detection presence sensors
    • B60R21/01532—Passenger detection systems using field detection presence sensors using electric or capacitive field sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60R—VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISE PROVIDED FOR
    • B60R21/00—Arrangements or fittings on vehicles for protecting or preventing injuries to occupants or pedestrians in case of accidents or other traffic risks
    • B60R21/01—Electrical circuits for triggering passive safety arrangements, e.g. airbags, safety belt tighteners, in case of vehicle accidents or impending vehicle accidents
    • B60R2021/01122—Prevention of malfunction
    • B60R2021/01184—Fault detection or diagnostic circuits

Abstract

In order to test at least three row conductors and/or at least three column conductors forming leads of circuit elements (SE) which are electrically interconnected in a matrix of rows and columns, at least two row test conductors and/or column test conductors are provided. Each row conductor or column conductor is respectively allocated to one of the row test conductors or column test conductors. At least one row conductor or at least one column conductor is respectively allocated to each row test conductor and/or each column test conductor. At least two row conductors or column conductors are allocated to at least one row test conductor and/or a column test conductor. The row conductors and column conductors are respectively connected to the associated row test conductor or column test conductor by a first end by means of a test element (PE). The row conductors and column conductors and the row test conductors and column test conductors can be respectively coupled by a second end to an evaluation unit (AE).
PCT/EP2007/050933 2006-02-03 2007-01-31 Circuit and testing device WO2007090772A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102006005051A DE102006005051A1 (en) 2006-02-03 2006-02-03 Circuit arrangement and test device
DE102006005051.7 2006-02-03

Publications (2)

Publication Number Publication Date
WO2007090772A2 WO2007090772A2 (en) 2007-08-16
WO2007090772A3 true WO2007090772A3 (en) 2007-09-20

Family

ID=38071805

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2007/050933 WO2007090772A2 (en) 2006-02-03 2007-01-31 Circuit and testing device

Country Status (2)

Country Link
DE (1) DE102006005051A1 (en)
WO (1) WO2007090772A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109983351B (en) * 2016-11-23 2021-11-02 法国大陆汽车公司 Diagnostic method for a bias power supply of an acquisition system comprising an array interface device

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4940934A (en) * 1987-10-15 1990-07-10 Matsushita Electric Industrial Co., Ltd. Method of electrically testing active matrix substrate
US5113134A (en) * 1991-02-28 1992-05-12 Thomson, S.A. Integrated test circuit for display devices such as LCD's
US5481499A (en) * 1992-07-17 1996-01-02 U.S. Philips Corporation Integrated matrix memory, comprising a circuit arrangement for testing the addressing
EP0895091A2 (en) * 1997-07-30 1999-02-03 I.E.E. International Electronics & Engineering S.à.r.l. Method and circuit for monitoring the integrity of conductors in an arrangement of circuits connected in a matrix
EP1045265A2 (en) * 1999-04-16 2000-10-18 Agilent Technologies Inc., A Delaware Corporation Optical switch having test ports
US6613650B1 (en) * 1995-07-31 2003-09-02 Hyundai Electronics America Active matrix ESD protection and testing scheme

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4374384A (en) * 1980-08-28 1983-02-15 Westinghouse Electric Corp. Matrix encoder for resistive sensor arrays
DE19910194C2 (en) * 1999-03-09 2001-06-28 Bosch Gmbh Robert Circuit arrangement for measuring the resistances of a pressure-sensitive resistance mat

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4940934A (en) * 1987-10-15 1990-07-10 Matsushita Electric Industrial Co., Ltd. Method of electrically testing active matrix substrate
US5113134A (en) * 1991-02-28 1992-05-12 Thomson, S.A. Integrated test circuit for display devices such as LCD's
US5481499A (en) * 1992-07-17 1996-01-02 U.S. Philips Corporation Integrated matrix memory, comprising a circuit arrangement for testing the addressing
US6613650B1 (en) * 1995-07-31 2003-09-02 Hyundai Electronics America Active matrix ESD protection and testing scheme
EP0895091A2 (en) * 1997-07-30 1999-02-03 I.E.E. International Electronics & Engineering S.à.r.l. Method and circuit for monitoring the integrity of conductors in an arrangement of circuits connected in a matrix
EP1045265A2 (en) * 1999-04-16 2000-10-18 Agilent Technologies Inc., A Delaware Corporation Optical switch having test ports

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109983351B (en) * 2016-11-23 2021-11-02 法国大陆汽车公司 Diagnostic method for a bias power supply of an acquisition system comprising an array interface device

Also Published As

Publication number Publication date
WO2007090772A2 (en) 2007-08-16
DE102006005051A1 (en) 2007-08-16

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