WO2007003806A2 - Source de photons comprenant une source rce a gradient de pression - Google Patents
Source de photons comprenant une source rce a gradient de pression Download PDFInfo
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- WO2007003806A2 WO2007003806A2 PCT/FR2006/050429 FR2006050429W WO2007003806A2 WO 2007003806 A2 WO2007003806 A2 WO 2007003806A2 FR 2006050429 W FR2006050429 W FR 2006050429W WO 2007003806 A2 WO2007003806 A2 WO 2007003806A2
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- WIPO (PCT)
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- chamber
- photon source
- source according
- photons
- plasma
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- 150000002500 ions Chemical class 0.000 claims abstract description 66
- 239000000470 constituent Substances 0.000 claims description 19
- 229910052751 metal Inorganic materials 0.000 claims description 12
- 239000002184 metal Substances 0.000 claims description 11
- 239000004020 conductor Substances 0.000 claims description 5
- 239000002245 particle Substances 0.000 claims description 4
- 238000005086 pumping Methods 0.000 claims description 3
- 238000006073 displacement reaction Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 9
- 238000001459 lithography Methods 0.000 abstract description 2
- 210000002381 plasma Anatomy 0.000 description 53
- 239000007789 gas Substances 0.000 description 24
- 238000009826 distribution Methods 0.000 description 10
- 238000000605 extraction Methods 0.000 description 10
- 238000004804 winding Methods 0.000 description 9
- 238000002347 injection Methods 0.000 description 8
- 239000007924 injection Substances 0.000 description 8
- 230000006870 function Effects 0.000 description 7
- 239000000463 material Substances 0.000 description 4
- 238000005315 distribution function Methods 0.000 description 2
- 238000001900 extreme ultraviolet lithography Methods 0.000 description 2
- 239000002784 hot electron Substances 0.000 description 2
- 230000005596 ionic collisions Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000002887 superconductor Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/003—Production of X-ray radiation generated from plasma the plasma being generated from a material in a liquid or gas state
Definitions
- the present invention relates to a source of photons and, more particularly, to a source of photons comprising a plasma source of ions charged with electron cyclotron resonance.
- RCE RCE more commonly referred to as RCE source.
- An application of the photon source according to the invention is, for example, the production of EUV photons (EUV for "Extreme Ultra-Violet”) that can be used for lithography.
- EUV photons EUV for "Extreme Ultra-Violet
- EUV lithography Different light sources are used for EUV lithography, such as, for example, laser plasmas (LPP), synchrotron light, discharge sources (Z-pinch, hollow cathode, capillary source).
- LPP laser plasmas
- synchrotron light discharge sources
- Z-pinch hollow cathode
- capillary source discharge sources
- Radiofrequency plasmas are little used to make EUV photon sources because the electron density is rather low.
- the US patent application US-2003-0006708 proposes a photon source that combines an RF plasma and an ECR plasma. It is considered in this patent application that the magnetic structure that leads to electron cyclotron resonance is complicated to achieve. A solution devoid of such a structure is then proposed.
- the source of photons obtained has few states of charge (see Figure 1) and a single element emits photons of desired wavelength.
- a disadvantage of this source of photons is the low power that it delivers which is of the order of milliwatt.
- an EUV photon source that uses the de-excitation of multicharged ions produced by an ECR source has been proposed (see reference [2]).
- the disclosed photon source produces 13.5nm wavelength photons from Xe 10+ ion deexcitation. Due to their short wavelength, the photons emitted advantageously make it possible to produce etchings less than 65 nm.
- a disadvantage of this source of photons is the low emitted power, namely 100 wW in 211 steradians.
- a source of photons that uses a RCE source has many advantages:
- the magnetic structure is made of permanent magnets.
- the invention relates to a source of photons comprising a plasma source of ions charged with electron cyclotron resonance.
- the photon source further comprises means for establishing, within the chamber, a pressure gradient of the first component and / or at least a second component different from the first component, the pressure gradient being suitable. creating an electron energy gradient of the plasma such that additional multicharged ions corresponding to at least one state of charge of the first constituent and / or at least one state of charge of the second constituent are created in the chamber, additional multicharged ions emitting, by de-excitation, photons of wavelength substantially equal to ⁇ o .
- the means for establishing a pressure gradient comprise a first diaphragm situated on a first side of the chamber and a second diaphragm situated on a second side of the chamber, opposite the first side, where is located an opening by which photons are extracted from the photon source.
- the second diaphragm comprises a central orifice through which the photons are extracted from the source of photons and the pump holes distributed around the central orifice, the diameter of the pump holes being chosen to prevent that microwaves that are injected into the vacuum cylindrical chamber do not leave the chamber, the number of pump holes being chosen, in relation to the diameter of the holes, to establish a pressure value of the first constituent and / or the second component in an area of the chamber located near the second diaphragm.
- the second diaphragm is made of a conductive material and is polarized either to capture ions on impact zones and to return electrons to the plasma, or to capture electrons on electrons. impact zones and to return ions to the plasma.
- the photon source comprises Q additional diaphragms placed between the first and second diaphragms so that the chamber is divided into Q + 1 areas.
- each of the Q additional diaphragms comprises an opening of greater size than a wavelength of microwave cutoff injected into the chamber.
- the opening of each of the Q additional diaphragms has a shape such that it does not intercept the lines of a magnetic field present in the chamber, thus leaving particles of the plasma to flow freely between the Q + l areas.
- At least one additional diaphragm is made of a conductive material and is biased to capture or return ions or electrons to the plasma.
- the first constituent and / or the second constituent are introduced into at least one of the Q + 1 zones of the chamber.
- the chamber has a truncated cone shape which participates in the means for establishing the pressure gradient.
- the source comprises pumping means which participate in the means for establishing a pressure gradient.
- the source comprises means for introducing additional electrons into the chamber.
- the first component and / or the second component is a metal gas or vapor.
- a magnetic structure which participates in the multicharged ion plasma source comprises two cylindrical magnetic structures with axial confinement of the magnetic field and a cylindrical magnetic structure with radial confinement of the magnetic field surrounding the chamber and which is situated between the two cylindrical magnetic structures with axial confinement, a first cylindrical magnetic structure with axial confinement being located at a first end of the chamber and the second cylindrical magnetic structure with axial confinement being located at a second end of the chamber where the photons are extracted from the source.
- at least one cylindrical magnetic structure with additional axial confinement is located between the two cylindrical magnetic structures with axial confinement located at the two ends of the chamber.
- the cylindrical magnetic structures with axial confinement and the cylindrical magnetic structure with additional axial confinement consist of superconducting coils.
- the cylindrical magnetic structure with radial confinement consists of superconducting coils.
- the superconducting coils constituting the cylindrical magnetic structure with radial confinement are inside the superconducting coils which constitute the magnetic structures with axial confinement. According to another characteristic of the invention, the superconducting coils constituting the cylindrical magnetic structure with radial confinement are outside the superconducting coils which constitute the magnetic structures with axial confinement.
- the superconducting coils constituting the cylindrical magnetic structure with radial confinement are "race track” type coils.
- the cylindrical magnetic structure with radial confinement consists of permanent magnets.
- the cylindrical magnetic structure with axial confinement located at the second end of the chamber has a inner diameter which increases for a movement from the inside of the chamber to the exit of the chamber.
- the wavelength ⁇ o is substantially equal to 13.5 nm.
- a typical photon source according to the invention delivers a photonic power of the order of a few tens of Watts in 4 ⁇ steradians.
- FIG. 1 represents a typical electronic density distribution curve in a RCE plasma as a function of electronic temperature
- FIG. 2 represents an electron density distribution curve in an ECR plasma as a function of the ionization potential of constituents of atomic number less than 36;
- FIGS. 3, 5-8 and 10-14 represent different variants of photon sources according to the invention
- FIG. 4 represents a detail view of an element of the photon source represented in FIG. 3
- Figs. 9A and 9B show detail views of elements of the photon source shown in Fig. 8;
- FIGS. 15 to 17 represent different magnetic structures that can be used in a source of photons according to the invention.
- FIG. 18 represents, in the context of the invention, an electron density distribution curve in an ECR plasma as a function of the ionization potential of constituents of atomic number less than 36.
- the source of photons according to the invention comprises a source RCE.
- ECR sources are continuous or pulsed sources of multicharged ions in which several states of charge of a given species are produced.
- the person skilled in the art who designs an ECR source seeks to obtain a plasma having a function of narrow electron energy distribution so as to produce in large quantities a particular charge state by electron / ion collision.
- it is the Pb 27+ ion that is produced by the ion source of the CERN LHC particle accelerator (LHC for Large Hadron Collider).
- the electron population is not monocinetic, and can be represented by a distribution function.
- An ECR plasma thus contains electrons of a few eV (so-called “cold electrons”), a few hundred eV (so-called “warm electrons”) and some keV (so-called “hot electrons”) or even several hundred keV ( so-called “very hot electrons”).
- the electron density curve n e has a maximum that strongly depends on the parameters of the plasma, in particular the pressure of the various elements that compose it as well as the power of the microwave waves that are injected into the chamber.
- Plasma electrons thus play a dual role according to their energy: they create the multicharged ions and they excite them. Ions excited return to a stable state by emitting photons.
- Table 1 below gives some examples of possible transitions, in the vicinity of 13 nm, for elements of atomic number Z less than 36.
- a simple gas cylinder with a valve is connected to the plasma chamber.
- a vapor is first created.
- This metal vapor can be produced by various well known techniques in ECR ion sources.
- the intensity of the photons emitted is directly related to the ion density of the constituents, which depends on the local pressure of the latter.
- the pressure giving the optimal density of Ar 8+ ions different from the pressure giving the optimal density of O 6+ ions.
- FIG. 2 represents, by way of nonlimiting example, an electron density distribution curve n e in an ECR plasma as a function of the ionization potential Pi of constituents of atomic number Z less than 36 capable of delivering photons of length. wavelength between 13.4nm and 13.5nm.
- the ions of the plasma which emit photons at the desired wavelength are the ions Mn 5+ , Cr 7+ , Mg 4+ , Na 4+ , F 4+ , Sc 9+ , V 7+ , Na 5+ , F 5+ , Cu 10+ , F 6+ , Ca 13+ , Ti 14+ , Sc 15+ , Ti 15+ , V 16+ , Cr 18+ , Cr 19+ .
- An essential feature of the invention is to modify the electronic density distribution of the plasma present in the chamber to create additional multicharged ions which emit by de-excitation photons at the desired wavelength.
- FIG. 3 represents a sectional view of a first photon source variant according to the invention.
- the photon source comprises a cylindrical vacuum plasma chamber CH of axis AA surrounded by a magnetic structure 1-6.
- the magnetic structure 1-6 comprises two cylindrical magnetic structures with axial confinement [3, 4] and [5, 6] and a cylindrical magnetic structure with radial confinement [1, 2].
- a first cylindrical structure with axial confinement [3, 4] is located at a first end of the chamber while the second structure [5, 6] is located at the other end, the radial confinement structure being located between the two structures with axial confinement.
- Each axial confinement structure gives a maximum of the magnetic field.
- a microwave injection guide GD provided with a sealing window (not shown in the figure) injects microwaves into the chamber CH.
- a closed surface S, without contact with the walls of the chamber and on which the magnetic field has a value substantially equal to the value B RCE of the resonance field RCE is present inside the chamber CH.
- a gas injection device I injects at least one gas into the chamber CH.
- An ion plasma multicharged corresponding to a state of charge distribution of a first gas gl is formed inside the chamber CH.
- the diaphragm D2 may be made of a conductive material which is polarized for stop the ions before they come out of the source.
- the gases gl and g2 can be introduced into the plasma chamber by the same injection device
- FIG. 3 represents, by way of example, a system for injecting two gases into a zone of high pressure, thus favoring the production of low states of charge.
- FIG. 4 represents an example of diaphragm D2 which is situated on the photon extraction side, in the case where the radial magnetic field is hexapolar.
- the diaphragm D2 comprises a central opening 0 through which the photons are extracted from the source and the pump holes t.
- the pump holes t are arranged in three zones Z1, Z2, Z3 separated from each other by zones E1, E2, E3 devoid of holes and substantially located at 120 ° from each other.
- the zones E1, E2 and E3 are plasma impact zones and constitute, mainly, the zones of the diaphragm which limit the leaks of the plasma.
- the pump holes t are arranged in N zones Z1, Z2, ..., ZN separated from each other by N zones E1, E2, ... , EN located at 360 ° / N from each other.
- the diameter of the central opening 0 depends on the size of the plasma, which depends on the intensity of the magnetic fields present in the chamber and the frequency of the microwaves.
- the diameter of the central opening 0 also depends on the position of the device that recovers the photons (not shown in the figures).
- the diameter of the holes t is chosen to be small enough to avoid micro-leaks. waves.
- the diameter of the holes may be equal to 2 mm while the frequency of the microwaves varies from 2 GHz to 100 GHz, which corresponds to a wavelength variation of 14 cm to 0.3 cm. With a fixed hole diameter, the number of holes is then chosen according to the desired pressure in the chamber in the vicinity of the diaphragm D2.
- the size of the openings in the diaphragm D2 (which is located on the side of the photon extraction) and the size of the openings in the diaphragm D1 (which is located on the opposite side to the extraction side of the photons ) are designed to obtain a "low” pressure on the photon extraction side and a “strong” pressure on the opposite side.
- the orifices made in the diaphragm D1 are therefore preferably chosen as small as possible.
- a pressure of 10 ⁇ 4 mbar can be created on the injection side of the constituents, favoring the creation of the Cr 7+ ion, while a pressure of 10 "6 mbar or 10 "7 mbar is created on the side of photon extraction, favoring the creation of the Cr 19+ ion.
- FIG. 5 represents a second variant of photon source according to the invention.
- the photon source comprises at least one furnace F to create a metal vapor which is introduced into the chamber.
- the pressure gradient which appears due to the presence of the diaphragms D1 and D2 is then adapted to increase the density of multicharged metal ions which emit, by de-excitation, photons at the wavelength. desired. It is then possible to create, for example, Al 4+ and Cr 19+ ions which allow respective photon emissions at 13.04 nm and 13.15 nm (see table above).
- the metal vapors can also be introduced into the CH chamber by other known means, for example by sputtering in the English language.
- FIG. 6 represents a third variant of a photon source according to the invention.
- a gas inlet gl is placed on the side of the microwave injection, at the diaphragm Dl. In this region of the chamber there is high pressure.
- a gas inlet g2 is placed on the photon extraction side where there is a lower pressure.
- the gl gas then gives ions of a first species having low states of charge while the gas g2 gives ions of a second species having high charge states.
- the gases gl and g2 may be identical or different.
- FIG. 7 represents a fourth variant of photon source according to the invention. All gas and / or metal vapor inputs are placed on the photon extraction side where low pressure prevails. High charge states of each species can then be produced.
- FIG. 8 represents a fifth variant of photon source according to the invention.
- an additional diaphragm D3 is placed in the chamber CH between the diaphragms D1 and D2.
- the diaphragm D3 then separates the chamber into two zones Za and Zb.
- Zone Za is a zone of high pressure (typically 10 -4 mbar) in which medium load states are produced (for example Xe 4+ ) and zone Zb is a zone of low pressure (typically 10 ⁇ 7 mbar) in which higher charge states are produced (eg Cr 19+ ).
- the charge states produced are capable of giving photons of wavelength ⁇ o by de-energizing.
- the shape of the diaphragm D3 is adapted so as not to disturb the propagation of microwaves in the cavity.
- the diaphragm D3 then has an opening whose size is greater than the cut-off wavelength of the microwaves injected into the cavity. Furthermore, it is also desirable that the opening of the diaphragm D3 does not intercept the magnetic field lines so that the electrons and plasma ions can flow freely from the zone Za to the zone Zb, and vice versa.
- the determination of the magnetic field lines is calculated using codes (for example "Poisson-Superfish" type codes).
- FIGS. 9A and 9B show, by way of example, two diaphragm shapes D3 which comply with the above conditions depending on whether the radial magnetic field is hexapolar (FIG. 9A) or quadrupole (FIG. 9B).
- the diaphragm D3 has a central opening in the form of a three-pointed star, which opening surrounds the surface S of the plasma. More generally, the diaphragm D3 has a central opening in the form of a star with N branches when the Radial magnetic field is a field with 2N poles.
- FIG. 10 represents a sixth variant of photon source according to the invention.
- the chamber CH is divided into four distinct zones Zc, Zd, Ze, Zf separated by diaphragms D4, D5, D6.
- the diaphragms D4, D5, D6 are placed between the diaphragms D1 and D2 and have, for example, larger apertures as one approaches the diaphragm D2 located on the source exit side. in order to avoid hindering the propagation of photons towards the exit of the source.
- a plasma chamber of the photon source according to the invention can be divided into Q + 1 zones, Q being an integer greater than or equal to 1, separated from each other by Q diaphragms placed between the diaphragms D1 and D2 located at both ends of the chamber.
- FIG. 11 represents another alternative source of photons according to the invention.
- the chamber CH is in the shape of a truncated cone.
- the output of the photon source is located on the long side of the truncated cone while the arrival of gases and / or metal vapors is, for example, on the short side.
- a grille-shaped diaphragm Gr with a central opening prevents the microwaves from leaving the chamber CH.
- the truncated cone shape of the chamber is here the essential means by which the pressure gradient is realized.
- Other embodiments of the invention (not shown in the figures) are of course possible, which combine the presence of all or part of the diaphragms mentioned above with the truncated cone-shaped chamber.
- FIG. 12 represents another variant of the photon source according to the invention.
- the photon source comprises an external supply of electrons.
- This external supply of electrons can be advantageously chosen, for example in terms of quantity of electrons and / or electronic energy, as a function of the charge state or states that it is desired to obtain for the constituents present in the CH chamber.
- An electron gun K preferably aligned along the axis AA of the chamber CH, then emits electrons in the chamber CH. The electron density is thus increased to obtain multicharged ions capable of producing, by de-excitation, photons at the desired wavelength.
- Intermediate diaphragms D3, D4, D5 are present between the diaphragms D1 and D2.
- FIG. 13 represents another variant of the photon source according to the invention.
- FIG. 14 represents yet another variant of the photon source according to the invention.
- the photon source of FIG. 14 contains a highly confined fine plasma whose length, along the axis AA of the chamber, is increased with respect to the length of the plasmas of the previous photon sources.
- the length of the highly confined plasma can then be equal to 23 cm while the length of an unconfined plasma (see FIGS. 3, 5, 6, 8, 10, 12, 13) is equal to for example, 6cm.
- such an increase in the length of the plasma is obtained by moving the two cylindrical magnetic structures with axial confinement [3,4] and [5,6] apart.
- the length of the chamber CH is then also increased, as is the length of the cylindrical magnetic structure with radial confinement [7,8] which surrounds it.
- the source of photons Figure 10 comprises two additional axial confinement structures [9, 10] and [11, 12].
- intermediate diaphragms D3-D7 are present between the diaphragms D1 and D2.
- a highly confined plasma produces a fine emission of photons which not only increases the power emitted but also to avoid any debris that may be produced by impacts of the plasma particles on the chamber (a phenomenon known as the English language " sputtering ").
- a 37GHz transmitter delivering a continuous microwave power of 15kW can thus be used.
- the magnetic structure that creates the axial magnetic field is constituted, for example, of four superconducting axial windings B1, B2, B3, B4 as shown in FIG. 15.
- the windings B1 and B2 create the maximum of the magnetic field at both ends of the chamber while the windings B3 and B4, located between the windings B1 and B2, optimize the minima of this field.
- the windings B1, B2, B3 and B4 are made, for example, with superconducting materials in a temperature range of 1.5 0 K to 100 0 K.
- the radial magnetic field is here created by a hexapole H consisting of, for example, 24 sectors of permanent magnets.
- the coil B4 located on the photon extraction side has a truncated cone shape on its inside diameter, the diameter widening when moving from the inside the room towards the exit of the source.
- the photon emission zone is advantageously increased.
- the permanent magnets [7, 8], H used for radially confining the plasma have a remanence and a limited coercive field.
- the maxima of the magnetic field can not then exceed 1.5T.
- superconducting coils can be used to create the radial magnetic field.
- FIG. 16 represents a variant of magnetic structure according to the invention in which superconducting coils R1-R6 are used to create the radial magnetic field.
- the magnetic structure of the RCE source is then entirely realized using superconducting windings.
- three coils Superconductors B5, B6, B7 create the axial confinement of the magnetic field while six superconducting coils R1-R6 create the radial confinement.
- the six superconducting windings R1-R6 are, for example, of the hexapolar type (three North poles / three South poles, one North pole alternating with a South pole) of the type commonly called "race track”.
- the superconducting coils which create the radial and / or axial magnetic field consist of superconducting material whose critical temperature is sufficiently low to be used, for example, at a temperature of less than 50 K.
- the superconducting material is said to "high temperature" (HTS material in English) to be used, for example, at a temperature of about 7O 0 K.
- the radially contained windings may also be placed outside the axial confinement structure, as shown in Figure 17. This variant is advantageous in some cases for reasons of space.
- the radial magnetic field is for example twelve-pole, made by twelve windings R1-R12 type "race track" (six North poles alternating with six poles South).
- FIG. 18 represents, in the context of the invention, an example of an electron density distribution curve n e in an ECR plasma as a function of of the ionization potential Pi of constituents of atomic number less than 36. This curve is to be compared with the curve of FIG. 2 which corresponds to the case where the photon source is devoid of specific means for establishing a pressure gradient in the chamber .
- the pressure gradient here applies a "high" pressure for constituents that require a relatively low ionization potential (a few tens of eV) and a “low” pressure for constituents that require a higher ionization potential (some hundreds of eV).
- the pressure gradient thus advantageously increases the electron density of the plasma and, consequently, the density of the ions capable of emitting photons by deexcitation.
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Abstract
Description
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/582,515 US20090152473A1 (en) | 2005-05-13 | 2006-05-11 | Photon source comprising an ecr source with pressure gradient |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0551256A FR2885730B1 (fr) | 2005-05-13 | 2005-05-13 | Source de photons comprenant une source rce a gradient de pression |
FR0551256 | 2005-05-13 |
Publications (2)
Publication Number | Publication Date |
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WO2007003806A2 true WO2007003806A2 (fr) | 2007-01-11 |
WO2007003806A3 WO2007003806A3 (fr) | 2007-03-08 |
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PCT/FR2006/050429 WO2007003806A2 (fr) | 2005-05-13 | 2006-05-11 | Source de photons comprenant une source rce a gradient de pression |
Country Status (3)
Country | Link |
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US (1) | US20090152473A1 (fr) |
FR (1) | FR2885730B1 (fr) |
WO (1) | WO2007003806A2 (fr) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030006708A1 (en) * | 2001-05-17 | 2003-01-09 | Ka-Ngo Leung | Microwave ion source |
Family Cites Families (2)
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US5323442A (en) * | 1992-02-28 | 1994-06-21 | Ruxam, Inc. | Microwave X-ray source and methods of use |
US6815700B2 (en) * | 1997-05-12 | 2004-11-09 | Cymer, Inc. | Plasma focus light source with improved pulse power system |
-
2005
- 2005-05-13 FR FR0551256A patent/FR2885730B1/fr not_active Expired - Fee Related
-
2006
- 2006-05-11 WO PCT/FR2006/050429 patent/WO2007003806A2/fr active Application Filing
- 2006-05-11 US US10/582,515 patent/US20090152473A1/en not_active Abandoned
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030006708A1 (en) * | 2001-05-17 | 2003-01-09 | Ka-Ngo Leung | Microwave ion source |
Non-Patent Citations (3)
Title |
---|
D. HITZ ET AL: "All permanent magnet ECR plasma for EUV light" SEMATECH 3RD SYMPOSIUM EUVL, novembre 2004 (2004-11), XP001208116 Miyazaki, Japan cité dans la demande * |
D. HITZ ET AL: "an all permanent magnet ECR ion source for the ORNL MIRF upgrade project" 16TH INTERNATIONAL WORKSHOP ECRIS'04, BERKELEY CA, 2004, XP009059909 * |
S. K. HAHTO ET AL: "Permanent magnet ECR source for generation of EUV light" SEMATECH EUV SOURCE WORKSHOP, 22 février 2004 (2004-02-22), XP002365322 Santa Clara CA * |
Also Published As
Publication number | Publication date |
---|---|
US20090152473A1 (en) | 2009-06-18 |
FR2885730A1 (fr) | 2006-11-17 |
WO2007003806A3 (fr) | 2007-03-08 |
FR2885730B1 (fr) | 2007-06-22 |
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