WO2006041567A3 - Optical bench for a mass spectrometer system - Google Patents

Optical bench for a mass spectrometer system Download PDF

Info

Publication number
WO2006041567A3
WO2006041567A3 PCT/US2005/029171 US2005029171W WO2006041567A3 WO 2006041567 A3 WO2006041567 A3 WO 2006041567A3 US 2005029171 W US2005029171 W US 2005029171W WO 2006041567 A3 WO2006041567 A3 WO 2006041567A3
Authority
WO
WIPO (PCT)
Prior art keywords
base plate
pcb base
mass spectrometer
coupled
optic assembly
Prior art date
Application number
PCT/US2005/029171
Other languages
French (fr)
Other versions
WO2006041567A2 (en
Inventor
Adi A Scheidemann
Mark S Mcgraw
Clare R Long
Gottfried P G Kibelka
Original Assignee
Oi Corp
Adi A Scheidemann
Mark S Mcgraw
Clare R Long
Gottfried P G Kibelka
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oi Corp, Adi A Scheidemann, Mark S Mcgraw, Clare R Long, Gottfried P G Kibelka filed Critical Oi Corp
Publication of WO2006041567A2 publication Critical patent/WO2006041567A2/en
Publication of WO2006041567A3 publication Critical patent/WO2006041567A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0271—Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0284—Details of three-dimensional rigid printed circuit boards
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/20—Details of printed circuits not provided for in H05K2201/01 - H05K2201/10
    • H05K2201/2009—Reinforced areas, e.g. for a specific part of a flexible printed circuit

Abstract

Mass spectrometer systems for measuring mass/charge ratios of analytes are described. A mass spectrometer system includes a vacuum flange, a PCB base plate coupled to the vacuum flange, and an ion optic assembly coupled to the PCB base plate. The PCB base plate may include signal-processing electronics. The system may include an electrical cable coupled to the PCB base plate for supplying power, control, and I/O to the ion optic assembly and the signal processing electronics. Alternatively, a mass spectrometer system includes a PCB base plate and an ion optic assembly. The PCB base plate has a sealant portion and an electrical portion. The ion optic assembly is coupled to the electrical portion. The system may include a vacuum housing for enclosing the ion optic assembly. The vacuum housing is coupled to the sealant portion of the PCB base plate for sustaining a vacuum while the system is in operation.
PCT/US2005/029171 2004-08-16 2005-08-16 Optical bench for a mass spectrometer system WO2006041567A2 (en)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US60181004P 2004-08-16 2004-08-16
US60180304P 2004-08-16 2004-08-16
US60186704P 2004-08-16 2004-08-16
US60/601,867 2004-08-16
US60/601,803 2004-08-16
US60/601,810 2004-08-16

Publications (2)

Publication Number Publication Date
WO2006041567A2 WO2006041567A2 (en) 2006-04-20
WO2006041567A3 true WO2006041567A3 (en) 2007-04-26

Family

ID=36010918

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/029171 WO2006041567A2 (en) 2004-08-16 2005-08-16 Optical bench for a mass spectrometer system

Country Status (2)

Country Link
US (1) US7442920B2 (en)
WO (1) WO2006041567A2 (en)

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DE202009002192U1 (en) * 2009-02-16 2009-04-23 Thermo Fisher Scientific (Bremen) Gmbh Electrode for influencing ion motion in mass spectrometers
US8134290B2 (en) 2009-04-30 2012-03-13 Scientific Instrument Services, Inc. Emission filaments made from a rhenium alloy and method of manufacturing thereof
CN105869982B (en) * 2011-02-14 2018-06-01 麻省理工学院 For the method, apparatus and system of mass spectral analysis
DE102011108876B4 (en) * 2011-07-28 2018-08-16 Technische Universität Dresden Direct conversion X-ray detector with radiation protection for the electronics
US9312115B2 (en) * 2012-05-08 2016-04-12 Shimadzu Corporation Mass spectrometer
US9093253B2 (en) * 2012-12-31 2015-07-28 908 Devices Inc. High pressure mass spectrometry systems and methods
US9099286B2 (en) 2012-12-31 2015-08-04 908 Devices Inc. Compact mass spectrometer
US8525111B1 (en) 2012-12-31 2013-09-03 908 Devices Inc. High pressure mass spectrometry systems and methods
CN116864367A (en) * 2012-12-31 2023-10-10 九零八图案公司 Mass spectrometer and method for measuring information about a sample using a mass spectrometer
US9753242B2 (en) * 2013-11-27 2017-09-05 Bae Systems Information And Electronic Systems Integration Inc. Optical bench assembly
EP3094958B1 (en) 2014-01-14 2023-07-12 908 Devices Inc. Sample collection in compact mass spectrometry systems
US8816272B1 (en) 2014-05-02 2014-08-26 908 Devices Inc. High pressure mass spectrometry systems and methods
US8921774B1 (en) 2014-05-02 2014-12-30 908 Devices Inc. High pressure mass spectrometry systems and methods
GB201808894D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808892D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808936D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
WO2019229463A1 (en) 2018-05-31 2019-12-05 Micromass Uk Limited Mass spectrometer having fragmentation region
WO2019229469A1 (en) 2018-05-31 2019-12-05 Micromass Uk Limited Mass spectrometer
CN112735937B (en) * 2020-12-10 2022-03-01 中国科学院大连化学物理研究所 PCB board Faraday signal receiving disc device

Citations (3)

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Publication number Priority date Publication date Assignee Title
US4859848A (en) * 1987-10-09 1989-08-22 Masstron, Inc. Mass spectrometer apparatus
US5386115A (en) * 1993-09-22 1995-01-31 Westinghouse Electric Corporation Solid state micro-machined mass spectrograph universal gas detection sensor
US6051832A (en) * 1996-08-20 2000-04-18 Graseby Dynamics Limited Drift chambers

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US5046018A (en) * 1989-09-11 1991-09-03 Nellcor, Inc. Agent gas analyzer and method of use
US5231591A (en) * 1989-09-11 1993-07-27 Nellcor Incorporated Agent gas analyzer and method of use
US6316768B1 (en) * 1997-03-14 2001-11-13 Leco Corporation Printed circuit boards as insulated components for a time of flight mass spectrometer
US6329850B1 (en) * 1999-12-27 2001-12-11 Texas Instruments Incorporated Precision frequency and phase synthesis
US6858839B1 (en) * 2000-02-08 2005-02-22 Agilent Technologies, Inc. Ion optics for mass spectrometers
US6831276B2 (en) * 2000-05-08 2004-12-14 Philip S. Berger Microscale mass spectrometric chemical-gas sensor
US6940937B2 (en) * 2001-12-24 2005-09-06 Texas Instruments Incorporated Scalable high-speed precision frequency and phase synthesis
US7065172B2 (en) * 2002-07-15 2006-06-20 Texas Instruments Incorporated Precision jitter-free frequency synthesis
KR100449876B1 (en) * 2002-12-05 2004-09-22 삼성전기주식회사 A multi-layer PCB for connecting multi-channel optical signals of block type, and methods thereof
KR100451635B1 (en) * 2002-12-10 2004-10-08 삼성전기주식회사 Fiber blocks and pipe blocks, and methods for connecting optical signals of multi-layer PCB by using them
US20060076482A1 (en) * 2002-12-13 2006-04-13 Hobbs Steven E High throughput systems and methods for parallel sample analysis
KR100525223B1 (en) * 2002-12-24 2005-10-28 삼성전기주식회사 An optical printed circuit board for transmitting of signals long-distance
KR100499005B1 (en) * 2002-12-27 2005-07-01 삼성전기주식회사 A printed circuit board being packaged optical devices of multi-channel block type
US20040222374A1 (en) * 2003-05-07 2004-11-11 Scheidemann Adi A. Ion detector array assembly and devices comprising the same
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Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4859848A (en) * 1987-10-09 1989-08-22 Masstron, Inc. Mass spectrometer apparatus
US5386115A (en) * 1993-09-22 1995-01-31 Westinghouse Electric Corporation Solid state micro-machined mass spectrograph universal gas detection sensor
US6051832A (en) * 1996-08-20 2000-04-18 Graseby Dynamics Limited Drift chambers

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SCHEIDEMANN A A ET AL: "Faraday cup detector array with electronic multiplexing for multichannel mass spectrometry", JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A. VACUUM, SURFACES AND FILMS, AMERICAN INSTITUTE OF PHYSICS, NEW YORK, NY, US, vol. 20, no. 3, May 2002 (2002-05-01), pages 597 - 604, XP012006037, ISSN: 0734-2101 *

Also Published As

Publication number Publication date
US7442920B2 (en) 2008-10-28
US20060076483A1 (en) 2006-04-13
WO2006041567A2 (en) 2006-04-20

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