WO2003010794A3 - Mass spectrometry device - Google Patents

Mass spectrometry device Download PDF

Info

Publication number
WO2003010794A3
WO2003010794A3 PCT/EP2002/007993 EP0207993W WO03010794A3 WO 2003010794 A3 WO2003010794 A3 WO 2003010794A3 EP 0207993 W EP0207993 W EP 0207993W WO 03010794 A3 WO03010794 A3 WO 03010794A3
Authority
WO
WIPO (PCT)
Prior art keywords
mass spectrometry
ion
ions
spectrometry device
analytical
Prior art date
Application number
PCT/EP2002/007993
Other languages
German (de)
French (fr)
Other versions
WO2003010794A2 (en
Inventor
Wolf-Georg Forssmann
Harald John
Michael Walden
Original Assignee
Ipf Pharmaceuticals Gmbh
Wolf-Georg Forssmann
Harald John
Michael Walden
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ipf Pharmaceuticals Gmbh, Wolf-Georg Forssmann, Harald John, Michael Walden filed Critical Ipf Pharmaceuticals Gmbh
Priority to AU2002321234A priority Critical patent/AU2002321234A1/en
Publication of WO2003010794A2 publication Critical patent/WO2003010794A2/en
Publication of WO2003010794A3 publication Critical patent/WO2003010794A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/065—Ion guides having stacked electrodes, e.g. ring stack, plate stack
    • H01J49/066—Ion funnels
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

Abstract

The invention relates to a mass spectrometry device for the mass spectrometry of ions. The device comprises an ion emitting device (14; 36, 38). An accelerator device (20) is arranged after the ion emitting device to accelerate the ions in the direction of an analytical unit. According to the invention, the ion yield may be increased by the arrangement of an ion-focussing device (22) between the accelerating device (20) and the analytical device, which deflects the ions in the direction of the analytical unit and in particular in the direction of a diaphragm opening (24).
PCT/EP2002/007993 2001-07-20 2002-07-18 Mass spectrometry device WO2003010794A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002321234A AU2002321234A1 (en) 2001-07-20 2002-07-18 Mass spectrometry device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10134652.2 2001-07-20
DE10134652 2001-07-20

Publications (2)

Publication Number Publication Date
WO2003010794A2 WO2003010794A2 (en) 2003-02-06
WO2003010794A3 true WO2003010794A3 (en) 2003-09-18

Family

ID=7692030

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2002/007993 WO2003010794A2 (en) 2001-07-20 2002-07-18 Mass spectrometry device

Country Status (2)

Country Link
AU (1) AU2002321234A1 (en)
WO (1) WO2003010794A2 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7375319B1 (en) 2000-06-09 2008-05-20 Willoughby Ross C Laser desorption ion source
US6818889B1 (en) 2002-06-01 2004-11-16 Edward W. Sheehan Laminated lens for focusing ions from atmospheric pressure
US6949740B1 (en) 2002-09-13 2005-09-27 Edward William Sheehan Laminated lens for introducing gas-phase ions into the vacuum systems of mass spectrometers
US6943347B1 (en) 2002-10-18 2005-09-13 Ross Clark Willoughby Laminated tube for the transport of charged particles contained in a gaseous medium
US6914243B2 (en) 2003-06-07 2005-07-05 Edward W. Sheehan Ion enrichment aperture arrays
US7081621B1 (en) 2004-11-15 2006-07-25 Ross Clark Willoughby Laminated lens for focusing ions from atmospheric pressure
US7960711B1 (en) 2007-01-22 2011-06-14 Chem-Space Associates, Inc. Field-free electrospray nebulizer
US8178833B2 (en) 2007-06-02 2012-05-15 Chem-Space Associates, Inc High-flow tube for sampling ions from an atmospheric pressure ion source
GB2457708B (en) * 2008-02-22 2010-04-14 Microsaic Systems Ltd Mass spectrometer system

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4647772A (en) * 1984-02-22 1987-03-03 Vg Instruments Group Limited Mass spectrometers
US5426301A (en) * 1991-05-21 1995-06-20 Turner; Patrick Off-axis interface for a mass spectrometer
US5663560A (en) * 1993-09-20 1997-09-02 Hitachi, Ltd. Method and apparatus for mass analysis of solution sample
US5898173A (en) * 1996-09-03 1999-04-27 Bruker Daltonik Gmbh High resolution ion detection for linear time-of-flight mass spectrometers

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4647772A (en) * 1984-02-22 1987-03-03 Vg Instruments Group Limited Mass spectrometers
US5426301A (en) * 1991-05-21 1995-06-20 Turner; Patrick Off-axis interface for a mass spectrometer
US5663560A (en) * 1993-09-20 1997-09-02 Hitachi, Ltd. Method and apparatus for mass analysis of solution sample
US5898173A (en) * 1996-09-03 1999-04-27 Bruker Daltonik Gmbh High resolution ion detection for linear time-of-flight mass spectrometers

Also Published As

Publication number Publication date
AU2002321234A1 (en) 2003-02-17
WO2003010794A2 (en) 2003-02-06

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