WO2006013387A3 - The use of surface measurement probes - Google Patents
The use of surface measurement probes Download PDFInfo
- Publication number
- WO2006013387A3 WO2006013387A3 PCT/GB2005/003095 GB2005003095W WO2006013387A3 WO 2006013387 A3 WO2006013387 A3 WO 2006013387A3 GB 2005003095 W GB2005003095 W GB 2005003095W WO 2006013387 A3 WO2006013387 A3 WO 2006013387A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- artefact
- probe
- measurements
- surface measurement
- measurement probes
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Pens And Brushes (AREA)
- Prostheses (AREA)
- Dental Preparations (AREA)
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE602005005839.7T DE602005005839T3 (en) | 2004-08-06 | 2005-08-05 | USE OF SURFACE TESTS |
EP05772904.8A EP1792139B2 (en) | 2004-08-06 | 2005-08-05 | The use of surface measurement probes |
US11/658,162 US7526873B2 (en) | 2004-08-06 | 2005-08-05 | Use of surface measurement probes |
JP2007524401A JP2008509386A (en) | 2004-08-06 | 2005-08-05 | Usage of probe for surface measurement |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0417536.0 | 2004-08-06 | ||
GBGB0417536.0A GB0417536D0 (en) | 2004-08-06 | 2004-08-06 | The use of surface measurement probes |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2006013387A2 WO2006013387A2 (en) | 2006-02-09 |
WO2006013387A3 true WO2006013387A3 (en) | 2006-03-23 |
WO2006013387A9 WO2006013387A9 (en) | 2007-03-15 |
Family
ID=32982635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB2005/003095 WO2006013387A2 (en) | 2004-08-06 | 2005-08-05 | The use of surface measurement probes |
Country Status (8)
Country | Link |
---|---|
US (1) | US7526873B2 (en) |
EP (1) | EP1792139B2 (en) |
JP (1) | JP2008509386A (en) |
CN (1) | CN100460814C (en) |
AT (1) | ATE391284T1 (en) |
DE (1) | DE602005005839T3 (en) |
GB (1) | GB0417536D0 (en) |
WO (1) | WO2006013387A2 (en) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0608235D0 (en) * | 2006-04-26 | 2006-06-07 | Renishaw Plc | Differential calibration |
GB0703423D0 (en) | 2007-02-22 | 2007-04-04 | Renishaw Plc | Calibration method and apparatus |
JP2008304332A (en) * | 2007-06-07 | 2008-12-18 | Tokyo Seimitsu Co Ltd | Apparatus and method for measuring surface roughness and shape |
WO2009001385A1 (en) * | 2007-06-28 | 2008-12-31 | Hexagon Metrology S.P.A. | Method for determining dynamic errors in a measuring machine |
DE102009004982A1 (en) * | 2009-01-14 | 2010-07-22 | Höfler Maschinenbau GmbH | Measuring method and measuring device |
GB0900878D0 (en) | 2009-01-20 | 2009-03-04 | Renishaw Plc | Method for optimising a measurement cycle |
CN102072701A (en) * | 2010-11-23 | 2011-05-25 | 苏州江城数控精密机械有限公司 | Method for detecting size of part and device |
US10037017B2 (en) | 2012-04-18 | 2018-07-31 | Renishaw Plc | Method of measurement on a machine tool and corresponding machine tool apparatus |
JP6346167B2 (en) | 2012-04-18 | 2018-06-20 | レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company | Analog measurement scanning method in machine tools and corresponding machine tool apparatus |
JP6242856B2 (en) | 2012-04-18 | 2017-12-06 | レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company | How to find features using machine tools |
GB201316329D0 (en) * | 2013-09-13 | 2013-10-30 | Renishaw Plc | A Method of Using a scanning probe |
WO2015085316A1 (en) * | 2013-12-07 | 2015-06-11 | Bruker Nano, Inc. | Force measurement with real-time baseline determination |
DE102015006636A1 (en) * | 2015-05-22 | 2016-11-24 | Blum-Novotest Gmbh | Method and system for detecting a workpiece contour and for correcting a desired path for machining a workpiece in a machine tool |
JP6608726B2 (en) * | 2016-02-18 | 2019-11-20 | 株式会社東京精密 | Positioning measurement system |
DE102019122650A1 (en) * | 2019-08-22 | 2021-02-25 | M & H Inprocess Messtechnik Gmbh | Measuring system |
US11644299B2 (en) * | 2020-12-31 | 2023-05-09 | Mitutoyo Corporation | Inductive position sensor signal gain control for coordinate measuring machine probe |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4991304A (en) * | 1987-06-11 | 1991-02-12 | Renishaw | Workpiece inspection method |
EP0599513A1 (en) * | 1992-11-20 | 1994-06-01 | RENISHAW plc | A method of measuring workpieces using a surface contacting measuring probe |
US20020029119A1 (en) * | 2000-05-23 | 2002-03-07 | Werner Lotze | Correction method for a coordinate measuring apparatus |
WO2004005849A1 (en) * | 2002-07-04 | 2004-01-15 | Renishaw Plc | Method of calibrating a scannig system |
US20040055170A1 (en) * | 1999-04-08 | 2004-03-25 | Renishaw Plc | Use of surface measuring probes |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2242355C2 (en) | 1972-08-29 | 1974-10-17 | Fa. Carl Zeiss, 7920 Heidenheim | Electronic multi-coordinate probe |
US4118871A (en) * | 1978-06-13 | 1978-10-10 | Kearney & Trecker Corporation | Binary inspection probe for numerically controlled machine tools |
GB8624191D0 (en) * | 1986-10-08 | 1986-11-12 | Renishaw Plc | Datuming of analogue measurement probes |
US5390424A (en) | 1990-01-25 | 1995-02-21 | Renishaw Metrology Limited | Analogue probe |
GB9110818D0 (en) | 1991-05-21 | 1991-07-10 | Renishaw Metrology Ltd | A method of measuring workpieces using a surface contacting measuring probe |
DE4134371A1 (en) * | 1991-10-17 | 1993-04-22 | Zeiss Carl Fa | METHOD FOR MEASURING THE EFFECTIVE CURRENT POSITION OF A KEY ELEMENT OR BEARED BY A SLIDE. TOOL |
EP0729005B1 (en) * | 1995-02-23 | 1998-08-05 | Institut Für Fertigungstechnik Der Tu Graz | Measuring device for checking the geometrie and dynamic precision of NC machining tools and industrial robots |
DE29612861U1 (en) † | 1996-07-24 | 1996-09-12 | Fa. Carl Zeiss, 89518 Heidenheim | Coordinate measuring device with measurement time optimization |
GB9907868D0 (en) * | 1999-04-08 | 1999-06-02 | Renishaw Plc | Method of calibrating a scanning system |
JP2002039743A (en) * | 2000-07-28 | 2002-02-06 | Mori Seiki Co Ltd | Measuring instrument |
GB0228371D0 (en) * | 2002-12-05 | 2003-01-08 | Leland E C E | Workpiece inspection method |
GB0329098D0 (en) * | 2003-12-16 | 2004-01-21 | Renishaw Plc | Method of calibrating a scanning system |
DE102004007968B4 (en) * | 2004-02-18 | 2006-02-09 | Carl Zeiss Industrielle Messtechnik Gmbh | Method for probing a workpiece with a coordinate measuring machine |
DE102005003321A1 (en) * | 2005-01-18 | 2006-07-27 | Carl Zeiss Industrielle Messtechnik Gmbh | Method for determining a spatial coordinate of a measuring point on a measuring object and corresponding coordinate measuring machine |
-
2004
- 2004-08-06 GB GBGB0417536.0A patent/GB0417536D0/en not_active Ceased
-
2005
- 2005-08-05 JP JP2007524401A patent/JP2008509386A/en active Pending
- 2005-08-05 US US11/658,162 patent/US7526873B2/en active Active
- 2005-08-05 WO PCT/GB2005/003095 patent/WO2006013387A2/en active IP Right Grant
- 2005-08-05 EP EP05772904.8A patent/EP1792139B2/en active Active
- 2005-08-05 DE DE602005005839.7T patent/DE602005005839T3/en active Active
- 2005-08-05 CN CNB2005800267219A patent/CN100460814C/en active Active
- 2005-08-05 AT AT05772904T patent/ATE391284T1/en not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4991304A (en) * | 1987-06-11 | 1991-02-12 | Renishaw | Workpiece inspection method |
EP0599513A1 (en) * | 1992-11-20 | 1994-06-01 | RENISHAW plc | A method of measuring workpieces using a surface contacting measuring probe |
US20040055170A1 (en) * | 1999-04-08 | 2004-03-25 | Renishaw Plc | Use of surface measuring probes |
US20020029119A1 (en) * | 2000-05-23 | 2002-03-07 | Werner Lotze | Correction method for a coordinate measuring apparatus |
WO2004005849A1 (en) * | 2002-07-04 | 2004-01-15 | Renishaw Plc | Method of calibrating a scannig system |
Also Published As
Publication number | Publication date |
---|---|
JP2008509386A (en) | 2008-03-27 |
CN100460814C (en) | 2009-02-11 |
EP1792139B1 (en) | 2008-04-02 |
CN1993600A (en) | 2007-07-04 |
GB0417536D0 (en) | 2004-09-08 |
WO2006013387A9 (en) | 2007-03-15 |
DE602005005839T2 (en) | 2009-04-02 |
EP1792139A2 (en) | 2007-06-06 |
WO2006013387A2 (en) | 2006-02-09 |
DE602005005839D1 (en) | 2008-05-15 |
US20080028626A1 (en) | 2008-02-07 |
DE602005005839T3 (en) | 2014-04-10 |
US7526873B2 (en) | 2009-05-05 |
EP1792139B2 (en) | 2014-02-19 |
ATE391284T1 (en) | 2008-04-15 |
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