WO2006008721A3 - Interfaces d'emulation et de mise au point pour essais de circuits integres - Google Patents
Interfaces d'emulation et de mise au point pour essais de circuits integres Download PDFInfo
- Publication number
- WO2006008721A3 WO2006008721A3 PCT/IB2005/052372 IB2005052372W WO2006008721A3 WO 2006008721 A3 WO2006008721 A3 WO 2006008721A3 IB 2005052372 W IB2005052372 W IB 2005052372W WO 2006008721 A3 WO2006008721 A3 WO 2006008721A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- emulation
- testing
- integrated circuit
- asynchronous microcontroller
- microcontroller
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/362—Software debugging
- G06F11/3648—Software debugging using additional hardware
- G06F11/3656—Software debugging using additional hardware using a specific debug interface
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Debugging And Monitoring (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05758728A EP1782204A2 (fr) | 2004-07-16 | 2005-07-16 | Interfaces d'emulation et de mise au point pour essais de circuits integres |
JP2007520966A JP2008507025A (ja) | 2004-07-16 | 2005-07-16 | 集積回路テスト用エミュレーション及びデバッグインターフェイス |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US58856204P | 2004-07-16 | 2004-07-16 | |
US60/588,562 | 2004-07-16 | ||
US63211204P | 2004-11-30 | 2004-11-30 | |
US60/632,112 | 2004-11-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2006008721A2 WO2006008721A2 (fr) | 2006-01-26 |
WO2006008721A3 true WO2006008721A3 (fr) | 2006-12-21 |
Family
ID=35462490
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IB2005/052372 WO2006008721A2 (fr) | 2004-07-16 | 2005-07-16 | Interfaces d'emulation et de mise au point pour essais de circuits integres |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1782204A2 (fr) |
JP (1) | JP2008507025A (fr) |
WO (1) | WO2006008721A2 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7263427B2 (ja) | 2020-08-31 | 2023-04-24 | ベイジン バイドゥ ネットコム サイエンス テクノロジー カンパニー リミテッド | チップを検証する方法、装置、電子デバイス、コンピュータ可読記憶媒体及びコンピュータプログラム |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070214389A1 (en) * | 2006-03-08 | 2007-09-13 | Severson Matthew L | JTAG power collapse debug |
DE102008019861A1 (de) * | 2008-04-17 | 2009-10-29 | Göpel electronic GmbH | Verfahren zum Steuern von Anschlusspins eines emulationsfähigen Bausteins und Anordnung zur Durchführung des Verfahrens |
CN101814054B (zh) * | 2010-03-23 | 2012-05-02 | 苏州国芯科技有限公司 | 一种用于调试微控制器的指令追踪控制器 |
CN104239176A (zh) * | 2014-10-16 | 2014-12-24 | 成都傅立叶电子科技有限公司 | 基于互联网的多用户多目标远程jtag调试系统 |
CN105528270B (zh) * | 2015-12-30 | 2018-03-30 | 东风商用车有限公司 | 一种jtag和bdm集成调试接口及其使用方法 |
CN111984521B (zh) * | 2019-05-23 | 2022-11-29 | 核工业理化工程研究院 | 一种无需jtag介入的板级调试方法 |
CN111753475B (zh) * | 2020-06-28 | 2022-06-28 | 福建工程学院 | 一种基于Cortex-M0+微控制器仿真MSI数字逻辑芯片的方法 |
CN117632611B (zh) * | 2023-12-05 | 2024-05-14 | 北京中天星控科技开发有限公司 | 一种微处理器芯片的通用测试装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020065646A1 (en) * | 2000-09-11 | 2002-05-30 | Waldie Arthur H. | Embedded debug system using an auxiliary instruction queue |
-
2005
- 2005-07-16 WO PCT/IB2005/052372 patent/WO2006008721A2/fr active Application Filing
- 2005-07-16 JP JP2007520966A patent/JP2008507025A/ja not_active Withdrawn
- 2005-07-16 EP EP05758728A patent/EP1782204A2/fr not_active Withdrawn
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020065646A1 (en) * | 2000-09-11 | 2002-05-30 | Waldie Arthur H. | Embedded debug system using an auxiliary instruction queue |
Non-Patent Citations (2)
Title |
---|
BEEREL P A: "Asynchronous circuits: an increasingly practical design solution", QUALITY ELECTRONIC DESIGN, 2002. PROCEEDINGS. INTERNATIONAL SYMPOSIUM ON 18-21 MARCH 2002, PISCATAWAY, NJ, USA,IEEE, 18 March 2002 (2002-03-18), pages 367 - 372, XP010589388, ISBN: 0-7695-1561-4 * |
GARSIDE J D ET AL: "AMULET3i-an asynchronous system-on-chip", ADVANCED RESEARCH IN ASYNCHRONOUS CIRCUITS AND SYSTEMS, 2000. (ASYNC 2000). PROCEEDINGS. SIXTH INTERNATIONAL SYMPOSIUM ON EILAT, ISRAEL 2-6 APRIL 2000, LOS ALAMITOS, CA, USA,IEEE COMPUT. SOC, US, 2 April 2000 (2000-04-02), pages 162 - 175, XP010377325, ISBN: 0-7695-0586-4 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7263427B2 (ja) | 2020-08-31 | 2023-04-24 | ベイジン バイドゥ ネットコム サイエンス テクノロジー カンパニー リミテッド | チップを検証する方法、装置、電子デバイス、コンピュータ可読記憶媒体及びコンピュータプログラム |
Also Published As
Publication number | Publication date |
---|---|
EP1782204A2 (fr) | 2007-05-09 |
WO2006008721A2 (fr) | 2006-01-26 |
JP2008507025A (ja) | 2008-03-06 |
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