WO2005093923A1 - Absorbeur de surtension et circuit d’absorption de surtension - Google Patents

Absorbeur de surtension et circuit d’absorption de surtension Download PDF

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Publication number
WO2005093923A1
WO2005093923A1 PCT/JP2004/004377 JP2004004377W WO2005093923A1 WO 2005093923 A1 WO2005093923 A1 WO 2005093923A1 JP 2004004377 W JP2004004377 W JP 2004004377W WO 2005093923 A1 WO2005093923 A1 WO 2005093923A1
Authority
WO
WIPO (PCT)
Prior art keywords
electrode
discharge gap
voltage
impedance
discharge
Prior art date
Application number
PCT/JP2004/004377
Other languages
English (en)
Japanese (ja)
Inventor
Kenshichirou Mishima
Original Assignee
Otowa Electric Co. Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Otowa Electric Co. Ltd. filed Critical Otowa Electric Co. Ltd.
Priority to PCT/JP2004/004377 priority Critical patent/WO2005093923A1/fr
Publication of WO2005093923A1 publication Critical patent/WO2005093923A1/fr

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01T—SPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES
    • H01T2/00—Spark gaps comprising auxiliary triggering means
    • H01T2/02—Spark gaps comprising auxiliary triggering means comprising a trigger electrode or an auxiliary spark gap

Definitions

  • the present invention relates to a surge absorbing device, and more particularly to a surge absorbing device and a surge absorbing circuit suitable for protecting various electric and electronic devices from a lightning surge and a switching surge caused by devices installed in a circuit.
  • a test voltage is applied by disconnecting the Ares element from the power line and the earth so that no voltage is applied to them. There is. According to this method, the test There is an advantage that an insulation performance test can be performed even when an ARES device having a discharge starting voltage lower than the voltage is used.
  • the troublesome work of disconnecting the ground connection as described above is required at the time of the test, and it is troublesome to reconnect after the test. There is also a risk of
  • a relay device equipped with a normally closed contact is connected in series to the Ares element, and this relay device is connected before the test during the insulation performance test.
  • a device has been proposed in which the device is turned off to temporarily disconnect the Ares device from the power line and the ground (Japanese Patent Application Laid-Open No. 2000-28067, page 3-4). (See Fig. 1-4).
  • a normally open type relay device connect the exciting coil between the power supply lines, and connect the contact mechanism.
  • a device has also been proposed that is connected in series to an ALES device so that the contact mechanism is turned off during the insulation performance test of the device and turned on during normal use (Japanese Patent Laid-Open No. 8-205). No. 393, No. 2-3, page 3, see Fig. 1, Fig. 4, Fig. 5).
  • an ARES element is configured by connecting a ballast element and a discharge gap element in series, and the discharge starting voltage of the discharge gap element is set to a voltage that can withstand an insulation performance test.
  • this method has the advantage that it is not necessary to disconnect the Ares element during the insulation performance test, the surge voltage application level is extremely high because the surge voltage application level is determined by the discharge starting voltage of the discharge gap element. It is not practical to apply to electrical and electronic devices equipped with.
  • the former method is more practical than the latter method to realize equipment with excellent insulation performance while keeping the surge suppression level low.
  • the Ares element is disconnected from the power supply and the ground, and then restored after the test is completed. Therefore, the work of the insulation performance test becomes extremely easy.
  • new equipment must be added for use only during testing, which complicates the configuration of the equipment and increases the size of the equipment used.
  • a contact mechanism is provided, a highly reliable relay device must be used, which increases the cost of equipment used.
  • the present invention has solved such a problem, and has a high insulation performance, can suppress a surge to a low voltage, and can perform insulation without disconnecting a ground connection of equipment.
  • a surge absorbing device and a surge absorbing circuit capable of performing a performance test are provided.
  • the surge absorbing device includes a second discharge electrode having a lower discharge start voltage than the first discharge gap between the first and second electrodes constituting the first discharge gap and the second electrode.
  • the surge absorbing device includes a second discharge electrode having a lower discharge start voltage than the first discharge gap between the first and second electrodes constituting the first discharge gap and the second electrode.
  • a first impedance element connected between the other terminal of the first and second electrodes and a second and third electrode having a high impedance characteristic in a high frequency region and a low impedance characteristic in a low frequency region.
  • a second impedance element is a second impedance element.
  • the surge absorbing circuit includes a second discharge electrode having a lower discharge start voltage than the first discharge gap between the first and second electrodes constituting the first discharge gap and the second electrode.
  • a discharge gap element having a third electrode forming a discharge gap, a voltage-dependent nonlinear element connected between the first electrode and the first line, and between a second electrode and the first line Connected to the first impedance element having low impedance characteristics in a high frequency region and high impedance characteristics in a low frequency region, and connected between the third electrode and the second line.
  • a second impedance element having high impedance characteristics in a high frequency region and low impedance characteristics in a low frequency region is provided.
  • the surge absorbing circuit includes a second discharge electrode having a lower discharge start voltage than the first discharge gap between the first and second electrodes constituting the first discharge gap and the second electrode.
  • a discharge gap element having a third electrode forming a discharge gap, a plurality of voltage-dependent nonlinear elements respectively connected between the first electrode and the plurality of lines, a second electrode and a plurality of lines
  • a plurality of first impedance elements each having a low impedance characteristic in a high frequency region and a high impedance characteristic in a low frequency region, and a second electrode and the third electrode
  • a discharge gap having a different firing voltage is arranged in the discharge gap element, and a low impedance characteristic in a high frequency region and a low impedance characteristic are provided in parallel with the first discharge gap having a high firing voltage.
  • the first impedance element which has high impedance characteristics in the frequency domain, and the second
  • a second impedance element with high impedance characteristics in the high frequency region and low impedance characteristics in the low frequency region in parallel with the gap low-frequency AC such as commercial power frequency can be obtained.
  • a voltage or a DC voltage is applied substantially to the first discharge gap side, and a surge voltage including a high frequency component is applied to the second impedance element.
  • the discharge starting voltage of the first discharge gap is set to a value that satisfies predetermined insulation performance test conditions
  • the discharge starting voltage of the second discharge gap is set to the withstand voltage of the circuit element incorporated in the equipment.
  • one end of the plurality of voltage-dependent nonlinear elements is arranged between the corresponding line and the first discharge gap of the discharge gap element, and between each line and the common second impedance element. Since the second impedance element is placed, surge can be suppressed to a lower voltage level, and insulation performance test can be performed without disconnecting the ground connection of the equipment used. It can be regulated by the conduction voltage of the voltage-dependent nonlinear element.
  • FIG. 1A is a diagram showing a structure of a surge absorber according to Embodiment 1 of the present invention.
  • FIG. 1B is the circuit diagram.
  • FIG. 2A is a diagram showing a structure of a surge absorber according to Embodiment 2 of the present invention.
  • FIG. 2B is the circuit diagram.
  • FIG. 3 is a diagram showing a configuration of a surge absorbing circuit according to Embodiment 3 of the present invention.
  • FIG. 4 is a diagram showing a configuration of a surge absorbing circuit according to Embodiment 4 of the present invention.
  • this surge absorbing device is composed of a discharge gap element 1, a capacitor 2 as a first impedance element, and an inductor 3 as a second impedance element.
  • Capacitance 2 has a frequency-impedance characteristic in which the impedance is low in the high frequency range and high in the low frequency range.
  • Inductance 3 shows the opposite frequency-impedance characteristic: the impedance is high in the high frequency region and low in the low frequency region.
  • the discharge gap element 1 includes two insulating tubular members 4 and 5 having different lengths, a ring-shaped electrode 6 for connecting them in an airtight state, and an opening end of each of the tubular members 4 and 5.
  • the electrodes 7 and 8 are stopped, and an inert gas such as argon, helium, or a mixed gas thereof is sealed therein at a predetermined pressure.
  • an inert gas such as argon, helium, or a mixed gas thereof is sealed therein at a predetermined pressure.
  • the inside may be kept substantially in a vacuum state.
  • the cylindrical bodies 4 and 5 are made of ceramics such as alumina porcelain or glass, and have a cylindrical, quadrangular or polygonal cylindrical shape.
  • the electrodes 6, 7, and 8 are made of a metal having a high melting point, such as tungsten, tantalum, molybdenum, niobium, and vanadium, and chromium, titanium, iron, cobalt, nickel, manganese, copper, and aluminum having a relatively lower melting point. Etc., and furthermore, of those alloys.
  • the electrode 6 has an annular shape, and has an inner diameter smaller than the inner diameters of the cylindrical bodies 4 and 5 and an outer diameter equal to or larger than the outer diameters of the cylindrical bodies 4 and 5.
  • the electrodes 7 and 8 have a disk shape and have protrusions on the surfaces facing each other. In addition, they may be cap-shaped, and the shape is not particularly limited as long as the external shape does not affect the firing voltage.
  • a first discharge gap 9 is formed by the electrodes 6 and 7, and a second discharge gap 10 is formed by the electrodes 6 and 8.
  • Each gap length that is, the distance between the electrodes is set according to the firing voltage.
  • the distance between the electrodes 7 and 6 is made larger than the distance between the electrodes 6 and 8 by making the dimension of the cylindrical body 4 longer than that of the cylindrical body 5, and the discharge starting voltage of the discharge gap 9 is reduced. It is configured to be higher than that of 10.
  • the firing voltage between the electrodes 7 and 6 can be reduced to the specified insulation performance
  • the voltage that can withstand the test is the voltage between electrodes 6 and 8 at the surge suppression level.
  • One electrode of each of the capacity 2 and the inductor 3 is connected to the electrode 6 of the discharge gap element 1.
  • the other electrode of capacitor 2 is connected to terminal 11 together with electrode 7 of discharge gap element 1
  • the other electrode of inductor 3 is connected to terminal 12 together with electrode 8 of discharge gap element 1.
  • the capacity 2 and the inductor 3 are connected in parallel with the discharge gaps 10 and 10, respectively.
  • the frequency of the test voltage is f, the capacity of the Capacity evening 2 C, if the inductor evening 3 inductance is L, of the impedance X c and inductor evening 3 Capacity evening 2 impedance XJ Masore it following equation Is represented by
  • test voltage is V and the divided voltages by capacity 2 and inductance 3 are V c , they are expressed by the following relational expressions.
  • V c ⁇ X c / (X C 2 + X L 2 ) 1/2 ⁇ V
  • V L ⁇ X no (X C 2 + X L 2 ) 1/2 ⁇ V
  • the discharge starting voltage of the discharge gap 1 ° connected in parallel with the inductor 3 is set to the same value as the test voltage, and is set very low.
  • the discharge gap element 1 the appropriate insulation test can be performed without disconnecting the terminals 11 and 12 from the ground connection.
  • V SUR when a surge test voltage, for example, a surge voltage V SUR at a frequency of 1 0 kHz is applied between the terminals 11 and 12, most of the series connection of the capacitor 2 and the inductor 3 has an inductor 3 And the voltage applied to capacity 2 is extremely low. Therefore, the surge voltage V SUR is substantially applied between the electrodes 6 and 8, that is, the discharge gap 10, and a much lower voltage is applied between the electrodes 7 and 6, that is, the discharge gap 9. Is done.
  • At least the electrode 8 is made of a metal having a relatively low melting point, such as copper or aluminum, as compared with a high melting point material such as tungsten or molybdenum, or covers the electrode surface, further roughens the electrode surface, By providing projections on the surface, the start of discharge between the electrodes 6 and 8 is reduced, the discharge between the electrodes 7 and 8 is reliably generated, and the surge suppression effect of the element 1 can be enhanced.
  • the voltage is substantially applied to the capacity 2 side, that is, the discharge gap 10 having a high discharge starting voltage.
  • the discharge gap 10 can sufficiently withstand this normal use voltage.
  • the discharge starting voltage of the discharge gap 9 on the side where the capacitor 2 is connected in parallel is set to a voltage suitable for the insulation performance test for the device in which it is incorporated.
  • the test can be performed without disconnecting the power line and the earth line as in the past.
  • the discharge gap 10 on the side where the inductor 3 is connected in parallel the discharge starting voltage is extremely low according to the desired surge suppression voltage level without particular consideration of the insulation performance test voltage. It can be set to a value, and the surge resistance required for applicable equipment can be realized very easily.
  • This embodiment is most different from the first embodiment described above, as is clear from the diagram shown in FIG. 2A and the circuit shown in FIG.
  • the configuration is such that a paris 13 is inserted and connected between the terminal 11 and the terminal 11 so that the continuation flow of the discharge gap element 1 after the discharge can be cut off.
  • components corresponding to those in Embodiment 1 are given the same reference numerals.
  • a discharge gap element 1 having a discharge gap 9 with characteristics suitable for it and Paris 13 as a voltage-dependent nonlinear element are used.
  • zinc oxide paris can be used for paris 13.
  • an AC or DC voltage with a low frequency is substantially applied to the series connection of the ballast 13 and the discharge gap 9 of the element 1, while a surge voltage with a significantly higher frequency is used. Is applied to the discharge gap 10 substantially. Therefore, also in this type of device, the low-frequency AC voltage or DC voltage is suppressed to the conduction voltage level of the series connection of Paris 13 and discharge gap 9, and the surge voltage is the conduction voltage level of discharge gap 10. Is suppressed. Then, the insulation performance test of the applied equipment can be performed without disconnecting the ground connection. Furthermore, according to this device, the Norris 13 can immediately shut off the follow-up current between the terminals 11 and 12 after the overvoltage / surge voltage suppression operation, thus improving the reliability of the on-board equipment. Becomes possible. In particular, this type of device is useful when applied to equipment used by connecting to a power supply line or the like having a low line impedance.
  • the surge absorber of the second embodiment is incorporated in a device 14, and the main unit 15 of the device is supplied with power from a power supply 16 via the device. It was done. That is, the terminal 11 is connected to the negative power line 17 and the terminal 12 is grounded. And the other power line 18 is grounded o
  • the insulation performance test of the device 14 can be performed without disconnecting the terminal 12 from the ground.
  • a discharge occurs on the discharge gap 10 side where the discharge starting voltage is low, and this triggers immediately, causing a discharge between the electrodes 7 and 8.
  • the voltage between lines 17 and 18 can be suppressed to a voltage level determined by the sum of the conduction voltage of Paris 13 and the discharge voltage between electrodes 7 and 8.
  • the conduction voltage of Paris 13 By setting the conduction voltage of Paris 13 to correspond to the steady voltage between lines 17 and 18, the voltage between lines 17 and 18 is maintained at a predetermined voltage and the following current is cut off. I do. Therefore, the influence of the surge on the power supply 16 and the device body 15 can be significantly reduced.
  • this embodiment is an example of installation between the power supply line and the ground, it goes without saying that a similar effect can be obtained when applied between power supply lines.
  • the operation start voltage of the circuit of this mode is set lower than the voltage between the power supply line and the ground, and the surge suppression voltage caused by the discharge gap element and the ballast is set even lower, so that the circuit is directly connected between the lines.
  • This makes it possible to reduce the withstand voltage level of the semiconductor device to be used, thereby alleviating restrictions on the use of the semiconductor device and increasing the surge resistance of the equipment used. (Embodiment 4)
  • the configuration of the surge absorber of the second embodiment is partially modified and used.
  • one terminal of two varistors 13-1 and 11-2 is connected to the electrode 7 of the discharge gap element 1, and two capacitors 2-1 and 2-2 are connected to the electrode 6 thereof. Are connected to one of terminals 11-1 and 11-2.
  • the other terminal of NORIS 13-1 and capacity 2-1 is connected to one power supply line 199-1, and the other terminal of VAR 13-3 and capacity 2-2 is connected to the other terminal.
  • Power lines 1 9—2 are connected to each other.
  • the electrode 12 of the discharge gap element 1 is grounded. Of course, the electrodes 12 may be connected to a ground line.
  • This device is used by being incorporated into the device 20.
  • the device main body 22 receives power from the power supply 21, one of the lines 19—1 and 19—2, for example, the line 19—
  • the line 19— When a surge occurs in 1, a discharge occurs first on the discharge gap 10 side of the discharge gap element 1, thereby immediately causing a discharge between the electrodes 7 and 8. Surge is suppressed to a low voltage level, and line 1 Maintain the voltage between 9-1 and earth. And since Paris evening 13-1 and 13-2 are connected in series between lines 19-1 and 19-2, the voltage between lines 19-1 and 191-2 is also Since the power is maintained at a voltage equal to the sum of the conduction voltages, the power supply 21 and the device 20 are effectively protected from surge.

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  • Emergency Protection Circuit Devices (AREA)

Abstract

Absorbeur de surtension et circuit d’absorption de surtension démontrant un fort pouvoir d’isolation qui permettent de réduire au minimum une surtension et d’effectuer un test de performance dans avoir à déconnecter la prise de masse d’un appareil. L’absorbeur de surtension comprend un premier séparateur de décharge formé par une première et une deuxième électrodes et un second séparateur de décharge formé par une deuxième et une troisième électrodes, le second séparateur produisant une tension de démarrage de décharge plus faible que le premier séparateur ; un premier élément d’impédance connecté entre la première et la deuxième électrodes et démontrant de faibles caractéristiques d’impédance dans la région à haute fréquence, et de fortes caractéristiques d’impédance dans la région à basse fréquence, et un second élément d’impédance connecté entre la deuxième et la troisième électrodes et démontrant de fortes caractéristiques d’impédance dans la région à haute fréquence, et de faibles caractéristiques d’impédance dans la région à basse fréquence. Les tensions alternatives à basse fréquence, c’est-à-dire à fréquence commerciale, et les tensions continues sont appliquées principalement au premier séparateur de décharge tandis que les surtensions contenant des composants à haute fréquence sont appliquées principalement au second séparateur de décharge.
PCT/JP2004/004377 2004-03-26 2004-03-26 Absorbeur de surtension et circuit d’absorption de surtension WO2005093923A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2004/004377 WO2005093923A1 (fr) 2004-03-26 2004-03-26 Absorbeur de surtension et circuit d’absorption de surtension

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2004/004377 WO2005093923A1 (fr) 2004-03-26 2004-03-26 Absorbeur de surtension et circuit d’absorption de surtension

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2729942A4 (fr) * 2011-07-08 2015-05-20 Kemet Electronics Corp Composant de protection vis-à-vis d'une surtension
US9142353B2 (en) 2011-07-08 2015-09-22 Kemet Electronics Corporation Discharge capacitor

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53123854A (en) * 1977-04-05 1978-10-28 Shiroyama Seisakusho Kk Protector circuit
JPS55117429A (en) * 1979-02-28 1980-09-09 Shiroyama Seisakusho Kk Safety circuit for telephone subscriber
JPH11136855A (ja) * 1997-10-29 1999-05-21 Toyo Commun Equip Co Ltd 不平衡型雷保護回路

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53123854A (en) * 1977-04-05 1978-10-28 Shiroyama Seisakusho Kk Protector circuit
JPS55117429A (en) * 1979-02-28 1980-09-09 Shiroyama Seisakusho Kk Safety circuit for telephone subscriber
JPH11136855A (ja) * 1997-10-29 1999-05-21 Toyo Commun Equip Co Ltd 不平衡型雷保護回路

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2729942A4 (fr) * 2011-07-08 2015-05-20 Kemet Electronics Corp Composant de protection vis-à-vis d'une surtension
US9142353B2 (en) 2011-07-08 2015-09-22 Kemet Electronics Corporation Discharge capacitor

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