WO2005041244A3 - Partikel-massen-spektrometer zur detektion von nanopartikeln und verfahren - Google Patents

Partikel-massen-spektrometer zur detektion von nanopartikeln und verfahren Download PDF

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Publication number
WO2005041244A3
WO2005041244A3 PCT/EP2004/007415 EP2004007415W WO2005041244A3 WO 2005041244 A3 WO2005041244 A3 WO 2005041244A3 EP 2004007415 W EP2004007415 W EP 2004007415W WO 2005041244 A3 WO2005041244 A3 WO 2005041244A3
Authority
WO
WIPO (PCT)
Prior art keywords
charge
particle
mass spectrometer
charged particles
mass spectrum
Prior art date
Application number
PCT/EP2004/007415
Other languages
English (en)
French (fr)
Other versions
WO2005041244A2 (de
Inventor
Werner Baumann
Hartmut Maetzing
Raaij Alexander Van
Manuela Hauser
Hanss-Rudolf Paur
Original Assignee
Karlsruhe Forschzent
Werner Baumann
Hartmut Maetzing
Raaij Alexander Van
Manuela Hauser
Hanss-Rudolf Paur
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Karlsruhe Forschzent, Werner Baumann, Hartmut Maetzing, Raaij Alexander Van, Manuela Hauser, Hanss-Rudolf Paur filed Critical Karlsruhe Forschzent
Priority to EP04740731A priority Critical patent/EP1665328B1/de
Publication of WO2005041244A2 publication Critical patent/WO2005041244A2/de
Publication of WO2005041244A3 publication Critical patent/WO2005041244A3/de

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

Gasgetragene Partikel werden von einer Aerosolquelle durch ein mehrstufiges Molekularstrahlsystem entnommen. Im Hochvakuumteil des Partikel-Massen-Spektrometers fliegt der Partikelstrahl durch einen Ablenkkondensator mit variablem elektrischen Feld. Der Teil geladener Partikel wird entsprechend der Polarität und dem Verhältnis von kinetischer Energie und Ladung getrennt. Schliesslich erreichen die geladenen Partikel den Ladungsdetektor oder die Ladungsdetektoren, Faraday-Becher beispielsweise, und erzeugen jeweils ein Strom- oder Spannungssignal, das proportional der aufgefangenen Anzahl multipliziert mit ihrer Ladungszahl ist. Zusätzlich wird die Partikelgeschwindigkeit gemessen, so dass die Messdaten zu einem Massenspektrum verarbeitet werden können. Mit der Annahme der Einfachladung pro Partikel und der Kugelform, kann das Massenspektrum in ein Grössenspektrum gewandelt werden.
PCT/EP2004/007415 2003-09-25 2004-07-07 Partikel-massen-spektrometer zur detektion von nanopartikeln und verfahren WO2005041244A2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP04740731A EP1665328B1 (de) 2003-09-25 2004-07-07 Partikel-massen-spektrometer zur detektion von nanopartikeln und verfahren

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2003144462 DE10344462B4 (de) 2003-09-25 2003-09-25 Partikel-Massen-Spektrometer zur Detektion von Nanopartikeln und Verfahren
DE10344462.9 2003-09-25

Publications (2)

Publication Number Publication Date
WO2005041244A2 WO2005041244A2 (de) 2005-05-06
WO2005041244A3 true WO2005041244A3 (de) 2005-09-29

Family

ID=34441786

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2004/007415 WO2005041244A2 (de) 2003-09-25 2004-07-07 Partikel-massen-spektrometer zur detektion von nanopartikeln und verfahren

Country Status (3)

Country Link
EP (1) EP1665328B1 (de)
DE (1) DE10344462B4 (de)
WO (1) WO2005041244A2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108328566B (zh) * 2018-01-29 2024-01-19 华南师范大学 一种纳米质谱仪
GB201802917D0 (en) 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
US11842891B2 (en) 2020-04-09 2023-12-12 Waters Technologies Corporation Ion detector

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5091645A (en) * 1989-12-22 1992-02-25 Vg Instruments Group Limited Selectable-resolution charged-particle beam analyzers
US5998215A (en) * 1995-05-01 1999-12-07 The Regents Of The University Of California Portable analyzer for determining size and chemical composition of an aerosol

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5091645A (en) * 1989-12-22 1992-02-25 Vg Instruments Group Limited Selectable-resolution charged-particle beam analyzers
US5998215A (en) * 1995-05-01 1999-12-07 The Regents Of The University Of California Portable analyzer for determining size and chemical composition of an aerosol

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
LINDACKERS D ET AL: "Synthesis of Al2O3 and SnO2 Particles by Oxidation of Metalorganic precursors in Premixed H2/O2/Ar Low Pressure Flames", NANOSTRUCTURED MATERIALS, ELSEVIER, NEW YORK, NY, US, vol. 10, no. 8, 1998, pages 1247 - 1270, XP004192651, ISSN: 0965-9773 *
MÄTZING H. ET AL: "Mass Spectrometer for Particles in the Nanometer Size Regime", JOURNAL OF AEROSOL SCIENCE, vol. 34, 2003, pages S277 - S278, XP002335488 *
ROTH P. AND HOSPITAL A.: "Design and Test of a Particle Mass Spectrometer (PMS)", JOURNAL OF AEROSOL SCIENCE, vol. 25, no. 1, 1994, pages 61 - 73, XP009050132 *
SEAPAN M. ET AL.: "Aerosol Characterization Using Molecular Beam Techniques", JOURNAL OF COLLOID AND INTERFACE SCIENCE, vol. 87, no. 1, 1982, pages 154 - 166, XP002335388 *
ZIEMANN P J: "Particle mass and size measurement using mass spectrometry", TRAC, TRENDS IN ANALYTICAL CHEMISTRY, ANALYTICAL CHEMISTRY. CAMBRIDGE, GB, vol. 17, no. 6, 7 June 1998 (1998-06-07), pages 322 - 328, XP004125244, ISSN: 0165-9936 *

Also Published As

Publication number Publication date
EP1665328B1 (de) 2012-06-27
EP1665328A2 (de) 2006-06-07
DE10344462B4 (de) 2008-01-24
DE10344462A1 (de) 2005-05-19
WO2005041244A2 (de) 2005-05-06

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