WO2005006458A3 - Test structures and methods - Google Patents

Test structures and methods Download PDF

Info

Publication number
WO2005006458A3
WO2005006458A3 PCT/GB2004/002927 GB2004002927W WO2005006458A3 WO 2005006458 A3 WO2005006458 A3 WO 2005006458A3 GB 2004002927 W GB2004002927 W GB 2004002927W WO 2005006458 A3 WO2005006458 A3 WO 2005006458A3
Authority
WO
WIPO (PCT)
Prior art keywords
methods
devices
test structures
oleds
molecular electronic
Prior art date
Application number
PCT/GB2004/002927
Other languages
French (fr)
Other versions
WO2005006458A2 (en
Inventor
Haydn Gregory
Jan Jongman
Martin Lewis
Original Assignee
Cambridge Display Tech Ltd
Haydn Gregory
Jan Jongman
Martin Lewis
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cambridge Display Tech Ltd, Haydn Gregory, Jan Jongman, Martin Lewis filed Critical Cambridge Display Tech Ltd
Priority to GB0526009A priority Critical patent/GB2421852B/en
Publication of WO2005006458A2 publication Critical patent/WO2005006458A2/en
Publication of WO2005006458A3 publication Critical patent/WO2005006458A3/en

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/17—Passive-matrix OLED displays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/17—Passive-matrix OLED displays
    • H10K59/173—Passive-matrix OLED displays comprising banks or shadow masks
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/17—Passive-matrix OLED displays
    • H10K59/179—Interconnections, e.g. wiring lines or terminals
    • H10K59/1795—Interconnections, e.g. wiring lines or terminals comprising structures specially adapted for lowering the resistance
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/80—Constructional details
    • H10K59/88—Dummy elements, i.e. elements having non-functional features

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

This invention generally relates to apparatus and methods for testing molecular electronic devices, especially organic light emitting diodes (OLEDs). More particularly the invention relates to substrates and masks for such devices, particularly including test structures, and methods of use of these. We therefore describe a substrate having formed thereon a plurality of organic molecular electronic devices, in particular OLEDs, and at least one test structure, the test structure being configured for evaluating the devices or for characterising a layer of active organic material of the devices, or, for example, for monitoring ingress of a contaminant.
PCT/GB2004/002927 2003-07-09 2004-07-07 Test structures and methods WO2005006458A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB0526009A GB2421852B (en) 2003-07-09 2004-07-07 Test Structures and Methods

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0316106.4 2003-07-09
GBGB0316106.4A GB0316106D0 (en) 2003-07-09 2003-07-09 Test structures and methods

Publications (2)

Publication Number Publication Date
WO2005006458A2 WO2005006458A2 (en) 2005-01-20
WO2005006458A3 true WO2005006458A3 (en) 2005-06-30

Family

ID=27741888

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/GB2004/002927 WO2005006458A2 (en) 2003-07-09 2004-07-07 Test structures and methods

Country Status (2)

Country Link
GB (2) GB0316106D0 (en)
WO (1) WO2005006458A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7048602B2 (en) * 2003-08-25 2006-05-23 Eastman Kodak Company Correcting potential defects in an OLED device
US7214554B2 (en) * 2004-03-18 2007-05-08 Eastman Kodak Company Monitoring the deposition properties of an OLED
US9171497B2 (en) * 2013-05-06 2015-10-27 Shenzhen China Star Optoelectronics Technology Co., Ltd Method for inspecting packaging effectiveness of OLED panel
TWI636267B (en) * 2018-02-12 2018-09-21 友達光電股份有限公司 Method of testing light emitting diode

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001061767A2 (en) * 2000-02-14 2001-08-23 Sarnoff Corporation Light-emitting fiber, and method for making and testing same
US20020021089A1 (en) * 2000-08-17 2002-02-21 Seon-Hee Kim Organic EL device and method for manufacturing the same
US20020079920A1 (en) * 2000-10-31 2002-06-27 Takashi Fujikawa Method for manufacturing a display device, and display device substrate
US20020130675A1 (en) * 2001-03-19 2002-09-19 Semiconductor Energy Laboratory Co., Ltd. Inspection method and inspection apparatus
US20020152800A1 (en) * 2001-03-29 2002-10-24 Bouten Petrus Cornelis Paulus Method for measuring a permeation rate, a test and an apparatus for measuring and testing
WO2002093186A1 (en) * 2001-05-15 2002-11-21 Koninklijke Philips Electronics N.V. Display device comprising a plurality of leds

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6274978B1 (en) * 1999-02-23 2001-08-14 Sarnoff Corporation Fiber-based flat panel display

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001061767A2 (en) * 2000-02-14 2001-08-23 Sarnoff Corporation Light-emitting fiber, and method for making and testing same
US20020021089A1 (en) * 2000-08-17 2002-02-21 Seon-Hee Kim Organic EL device and method for manufacturing the same
US20020079920A1 (en) * 2000-10-31 2002-06-27 Takashi Fujikawa Method for manufacturing a display device, and display device substrate
US20020130675A1 (en) * 2001-03-19 2002-09-19 Semiconductor Energy Laboratory Co., Ltd. Inspection method and inspection apparatus
US20020152800A1 (en) * 2001-03-29 2002-10-24 Bouten Petrus Cornelis Paulus Method for measuring a permeation rate, a test and an apparatus for measuring and testing
WO2002093186A1 (en) * 2001-05-15 2002-11-21 Koninklijke Philips Electronics N.V. Display device comprising a plurality of leds

Also Published As

Publication number Publication date
GB0316106D0 (en) 2003-08-13
GB2421852B (en) 2007-01-03
WO2005006458A2 (en) 2005-01-20
GB0526009D0 (en) 2006-02-01
GB2421852A (en) 2006-07-05

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