GB0526009D0 - N/a - Google Patents
N/aInfo
- Publication number
- GB0526009D0 GB0526009D0 GBGB0526009.6A GB0526009A GB0526009D0 GB 0526009 D0 GB0526009 D0 GB 0526009D0 GB 0526009 A GB0526009 A GB 0526009A GB 0526009 D0 GB0526009 D0 GB 0526009D0
- Authority
- GB
- United Kingdom
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/17—Passive-matrix OLED displays
-
- H01L27/3281—
-
- H01L51/56—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/70—Testing, e.g. accelerated lifetime tests
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/17—Passive-matrix OLED displays
- H10K59/173—Passive-matrix OLED displays comprising banks or shadow masks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/17—Passive-matrix OLED displays
- H10K59/179—Interconnections, e.g. wiring lines or terminals
- H10K59/1795—Interconnections, e.g. wiring lines or terminals comprising structures specially adapted for lowering the resistance
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/88—Dummy elements, i.e. elements having non-functional features
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB0316106.4A GB0316106D0 (en) | 2003-07-09 | 2003-07-09 | Test structures and methods |
PCT/GB2004/002927 WO2005006458A2 (en) | 2003-07-09 | 2004-07-07 | Test structures and methods |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0526009D0 true GB0526009D0 (en) | 2006-02-01 |
GB2421852A GB2421852A (en) | 2006-07-05 |
GB2421852B GB2421852B (en) | 2007-01-03 |
Family
ID=27741888
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB0316106.4A Ceased GB0316106D0 (en) | 2003-07-09 | 2003-07-09 | Test structures and methods |
GB0526009A Expired - Fee Related GB2421852B (en) | 2003-07-09 | 2004-07-07 | Test Structures and Methods |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB0316106.4A Ceased GB0316106D0 (en) | 2003-07-09 | 2003-07-09 | Test structures and methods |
Country Status (2)
Country | Link |
---|---|
GB (2) | GB0316106D0 (en) |
WO (1) | WO2005006458A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7048602B2 (en) * | 2003-08-25 | 2006-05-23 | Eastman Kodak Company | Correcting potential defects in an OLED device |
US7214554B2 (en) | 2004-03-18 | 2007-05-08 | Eastman Kodak Company | Monitoring the deposition properties of an OLED |
US9171497B2 (en) * | 2013-05-06 | 2015-10-27 | Shenzhen China Star Optoelectronics Technology Co., Ltd | Method for inspecting packaging effectiveness of OLED panel |
TWI636267B (en) * | 2018-02-12 | 2018-09-21 | 友達光電股份有限公司 | Method of testing light emitting diode |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6274978B1 (en) * | 1999-02-23 | 2001-08-14 | Sarnoff Corporation | Fiber-based flat panel display |
WO2001061767A2 (en) * | 2000-02-14 | 2001-08-23 | Sarnoff Corporation | Light-emitting fiber, and method for making and testing same |
KR100477100B1 (en) * | 2000-08-17 | 2005-03-17 | 삼성에스디아이 주식회사 | Method for fabricating organic electroluminescent display device |
JP4051190B2 (en) * | 2000-10-31 | 2008-02-20 | シャープ株式会社 | Display device manufacturing method, display device substrate, and measurement system |
US6850080B2 (en) * | 2001-03-19 | 2005-02-01 | Semiconductor Energy Laboratory Co., Ltd. | Inspection method and inspection apparatus |
EP1373861A2 (en) * | 2001-03-29 | 2004-01-02 | Koninklijke Philips Electronics N.V. | A method for measuring a permeation rate, a test and an apparatus for measuring and testing |
US20040164939A1 (en) * | 2001-05-15 | 2004-08-26 | Johnson Mark Thomas | Display device comprising a plurality of leds |
-
2003
- 2003-07-09 GB GBGB0316106.4A patent/GB0316106D0/en not_active Ceased
-
2004
- 2004-07-07 WO PCT/GB2004/002927 patent/WO2005006458A2/en active Application Filing
- 2004-07-07 GB GB0526009A patent/GB2421852B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB0316106D0 (en) | 2003-08-13 |
WO2005006458A3 (en) | 2005-06-30 |
GB2421852A (en) | 2006-07-05 |
GB2421852B (en) | 2007-01-03 |
WO2005006458A2 (en) | 2005-01-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20170707 |