WO2005001020A3 - A multi-stage open ion system in various topologies - Google Patents

A multi-stage open ion system in various topologies Download PDF

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Publication number
WO2005001020A3
WO2005001020A3 PCT/IL2004/000580 IL2004000580W WO2005001020A3 WO 2005001020 A3 WO2005001020 A3 WO 2005001020A3 IL 2004000580 W IL2004000580 W IL 2004000580W WO 2005001020 A3 WO2005001020 A3 WO 2005001020A3
Authority
WO
WIPO (PCT)
Prior art keywords
outlet
ions
electrons
vessel
source
Prior art date
Application number
PCT/IL2004/000580
Other languages
French (fr)
Other versions
WO2005001020A2 (en
Inventor
Doron Weinfeld
Original Assignee
Axiomic Technologies Inc
Doron Weinfeld
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Axiomic Technologies Inc, Doron Weinfeld filed Critical Axiomic Technologies Inc
Publication of WO2005001020A2 publication Critical patent/WO2005001020A2/en
Publication of WO2005001020A3 publication Critical patent/WO2005001020A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J41/00—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
    • H01J41/12—Discharge tubes for evacuating by diffusion of ions, e.g. ion pumps, getter ion pumps
    • H01J41/14—Discharge tubes for evacuating by diffusion of ions, e.g. ion pumps, getter ion pumps with ionisation by means of thermionic cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/08—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32357—Generation remote from the workpiece, e.g. down-stream
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J7/00—Details not provided for in the preceding groups and common to two or more basic types of discharge tubes or lamps
    • H01J7/14—Means for obtaining or maintaining the desired pressure within the vessel
    • H01J7/16—Means for permitting pumping during operation of the tube or lamp

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Particle Accelerators (AREA)

Abstract

An open ion source embodied in a vessel having an accelerating voltage applied to at least one outlet. The source includes a supply of gas molecules. The source also includes at least one magnet for generating a magnetic field, at least one outlet of the vessel, wherein the opening is sufficiently wide for the ions to exit the vessel and an electron source at the same at least one outlet, wherein the electrons collide with the gas molecules to produce the ions, and the electrons form a space charge to focus the ions into a beam in order to facilitate their exiting through the at least one outlet. The electrons are launched, the ions leave and the magnetic lines begin at the point of the same at least one outlet, and the electrons stay on the magnetic lines from which they are launched.
PCT/IL2004/000580 2003-06-30 2004-06-30 A multi-stage open ion system in various topologies WO2005001020A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IL156719 2003-06-30
IL15671903A IL156719A0 (en) 2003-06-30 2003-06-30 A multi-stage open ion system in various topologies

Publications (2)

Publication Number Publication Date
WO2005001020A2 WO2005001020A2 (en) 2005-01-06
WO2005001020A3 true WO2005001020A3 (en) 2006-12-07

Family

ID=32587687

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IL2004/000580 WO2005001020A2 (en) 2003-06-30 2004-06-30 A multi-stage open ion system in various topologies

Country Status (2)

Country Link
IL (1) IL156719A0 (en)
WO (1) WO2005001020A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL156719A0 (en) * 2003-06-30 2004-01-04 Axiomic Technologies Inc A multi-stage open ion system in various topologies
US7098667B2 (en) * 2003-12-31 2006-08-29 Fei Company Cold cathode ion gauge
AU2008339968A1 (en) 2007-12-20 2009-07-02 Basf Plant Science Gmbh Plants having enhanced yield-related traits and a method for making the same
DE102009005620B4 (en) * 2009-01-22 2010-12-30 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Method and arrangement for generating an electron beam

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4145597A (en) * 1975-12-31 1979-03-20 Fujitsu Limited Electron beam lithographic system
US4800100A (en) * 1987-10-27 1989-01-24 Massachusetts Institute Of Technology Combined ion and molecular beam apparatus and method for depositing materials
US5189303A (en) * 1991-07-23 1993-02-23 Nissin Electric Co., Ltd. Ion source having a mass separation device
US5241244A (en) * 1991-03-07 1993-08-31 Proel Tecnologie S.P.A. Cyclotron resonance ion engine
US5274306A (en) * 1990-08-31 1993-12-28 Kaufman & Robinson, Inc. Capacitively coupled radiofrequency plasma source
US5300785A (en) * 1990-10-04 1994-04-05 Superion Limited Apparatus for and method of producing ion beams
US5986264A (en) * 1995-04-29 1999-11-16 Bal-Tec A.G. Ion beam preparation device for electron microscopy
US6160262A (en) * 1997-10-22 2000-12-12 Nissin Electric Co., Ltd Method and apparatus for deflecting charged particles
US6335535B1 (en) * 1998-06-26 2002-01-01 Nissin Electric Co., Ltd Method for implanting negative hydrogen ion and implanting apparatus
US6335534B1 (en) * 1998-04-17 2002-01-01 Kabushiki Kaisha Toshiba Ion implantation apparatus, ion generating apparatus and semiconductor manufacturing method with ion implantation processes
US6498348B2 (en) * 1998-06-19 2002-12-24 Superion Limited Apparatus and method relating to charged particles
WO2005001020A2 (en) * 2003-06-30 2005-01-06 Axiomic Technologies Inc A multi-stage open ion system in various topologies

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4145597A (en) * 1975-12-31 1979-03-20 Fujitsu Limited Electron beam lithographic system
US4800100A (en) * 1987-10-27 1989-01-24 Massachusetts Institute Of Technology Combined ion and molecular beam apparatus and method for depositing materials
US5274306A (en) * 1990-08-31 1993-12-28 Kaufman & Robinson, Inc. Capacitively coupled radiofrequency plasma source
US5300785A (en) * 1990-10-04 1994-04-05 Superion Limited Apparatus for and method of producing ion beams
US5241244A (en) * 1991-03-07 1993-08-31 Proel Tecnologie S.P.A. Cyclotron resonance ion engine
US5189303A (en) * 1991-07-23 1993-02-23 Nissin Electric Co., Ltd. Ion source having a mass separation device
US5986264A (en) * 1995-04-29 1999-11-16 Bal-Tec A.G. Ion beam preparation device for electron microscopy
US6160262A (en) * 1997-10-22 2000-12-12 Nissin Electric Co., Ltd Method and apparatus for deflecting charged particles
US6335534B1 (en) * 1998-04-17 2002-01-01 Kabushiki Kaisha Toshiba Ion implantation apparatus, ion generating apparatus and semiconductor manufacturing method with ion implantation processes
US6614033B2 (en) * 1998-04-17 2003-09-02 Kabushiki Kaisha Toshiba Ion implantation apparatus, ion generating apparatus and semiconductor manufacturing method with ion implantation processes
US6498348B2 (en) * 1998-06-19 2002-12-24 Superion Limited Apparatus and method relating to charged particles
US6335535B1 (en) * 1998-06-26 2002-01-01 Nissin Electric Co., Ltd Method for implanting negative hydrogen ion and implanting apparatus
WO2005001020A2 (en) * 2003-06-30 2005-01-06 Axiomic Technologies Inc A multi-stage open ion system in various topologies

Also Published As

Publication number Publication date
IL156719A0 (en) 2004-01-04
WO2005001020A2 (en) 2005-01-06

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