WO2004107055A3 - Ensemble electrodes et son utilisation - Google Patents
Ensemble electrodes et son utilisation Download PDFInfo
- Publication number
- WO2004107055A3 WO2004107055A3 PCT/EP2004/005386 EP2004005386W WO2004107055A3 WO 2004107055 A3 WO2004107055 A3 WO 2004107055A3 EP 2004005386 W EP2004005386 W EP 2004005386W WO 2004107055 A3 WO2004107055 A3 WO 2004107055A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- electrode
- optical element
- electrode arrangement
- charged particles
- inert
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70941—Stray fields and charges, e.g. stray light, scattered light, flare, transmission loss
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70916—Pollution mitigation, i.e. mitigating effect of contamination or debris, e.g. foil traps
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70925—Cleaning, i.e. actively freeing apparatus from pollutants, e.g. using plasma cleaning
Landscapes
- Health & Medical Sciences (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Physics & Mathematics (AREA)
- Atmospheric Sciences (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- General Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- X-Ray Techniques (AREA)
Abstract
Ensemble électrodes destiné à éloigner des particules chargées, dans lequel un élément optique (1) est connecté en tant que première électrode (10) qui émet des électrons secondaires photoinduits lorsque ledit élément optique est exposé à des rayons ultraviolets extrêmes et / ou à des rayons X mous. Une seconde électrode (20) est placée à un certain écart de la surface exposée aux rayons de l'élément optique, la surface (1a) au moins de la seconde électrode (20) étant constituée d'au moins une matière inerte. L'avantage des matières inertes est que l'efficacité de l'électrode reste constante et qu'aucune matière elle-même n'est expulsée de la surface de l'électrode pendant l'éloignement de particules chargées.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10324613.4 | 2003-05-30 | ||
DE2003124613 DE10324613A1 (de) | 2003-05-30 | 2003-05-30 | Elektrodenanordnung und deren Verwendung |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004107055A2 WO2004107055A2 (fr) | 2004-12-09 |
WO2004107055A3 true WO2004107055A3 (fr) | 2005-03-03 |
Family
ID=33441507
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2004/005386 WO2004107055A2 (fr) | 2003-05-30 | 2004-05-19 | Ensemble electrodes et son utilisation |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE10324613A1 (fr) |
WO (1) | WO2004107055A2 (fr) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1726993A1 (fr) * | 2005-05-24 | 2006-11-29 | Carl Zeiss SMT AG | Système optique et procédé destiné au fonctionnement de celui-ci |
US7646004B2 (en) | 2005-05-24 | 2010-01-12 | Carl Zeiss Smt Ag | Optical element for radiation in the EUV and/or soft X-ray region and an optical system with at least one optical element |
DE102010030023A1 (de) | 2010-06-14 | 2011-12-15 | Carl Zeiss Smt Gmbh | Optisches System |
DE102018211498A1 (de) * | 2018-07-11 | 2019-08-01 | Carl Zeiss Smt Gmbh | Optische Anordnung |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3710125A (en) * | 1970-04-29 | 1973-01-09 | Univ Northwestern | Secondary emission enhancer for an x-ray image intensifier |
EP1182510A1 (fr) * | 2000-08-25 | 2002-02-27 | Asm Lithography B.V. | Appareil de projection lithographique et dispositif de manipulation de masques |
US6642531B1 (en) * | 2002-12-23 | 2003-11-04 | Intel Corporation | Contamination control on lithography components |
EP1411392A1 (fr) * | 2002-10-18 | 2004-04-21 | ASML Netherlands B.V. | Appareil de projection lithographique |
-
2003
- 2003-05-30 DE DE2003124613 patent/DE10324613A1/de not_active Withdrawn
-
2004
- 2004-05-19 WO PCT/EP2004/005386 patent/WO2004107055A2/fr active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3710125A (en) * | 1970-04-29 | 1973-01-09 | Univ Northwestern | Secondary emission enhancer for an x-ray image intensifier |
EP1182510A1 (fr) * | 2000-08-25 | 2002-02-27 | Asm Lithography B.V. | Appareil de projection lithographique et dispositif de manipulation de masques |
EP1411392A1 (fr) * | 2002-10-18 | 2004-04-21 | ASML Netherlands B.V. | Appareil de projection lithographique |
US6642531B1 (en) * | 2002-12-23 | 2003-11-04 | Intel Corporation | Contamination control on lithography components |
Also Published As
Publication number | Publication date |
---|---|
DE10324613A1 (de) | 2004-12-16 |
WO2004107055A2 (fr) | 2004-12-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4435211B2 (ja) | 帯電物体の電荷除去方法 | |
WO2005037074A3 (fr) | Source de rayons x multi-energetiques | |
AU5180800A (en) | Modification of 193 nm sensitive photoresist materials by electron beam exposure | |
CA2275159A1 (fr) | Detecteur de rayonnements a tres haute performance et imageur a rayons x planispherique sans parallaxe | |
EP0952491A3 (fr) | Appareil lithographique | |
CA2229170A1 (fr) | Source de rayons x a plasma laser, appareil de gravure de semiconducteurs et procede correspondant | |
CA2267359A1 (fr) | Dispositif de capture d'insectes | |
EP1351094A3 (fr) | Dispositif pour la reproduction d'image de rayonnement et méthode de reproduction d'image de rayonnement | |
WO2004044657A3 (fr) | Systeme a base de nanostructure et procede de chargement d'une surface photoconductrice | |
AU6437898A (en) | Electron beam radiation curable inks for game balls, golf balls and the like | |
CA2112432A1 (fr) | Appareil d'imagerie et reglage du diametre du faisceau electronique au support de l'image dans un appareil d'imagerie | |
EP0869528A3 (fr) | Appareil de formation d'image pour la formation d'image par irradiation d'électrons | |
WO2004107055A3 (fr) | Ensemble electrodes et son utilisation | |
CA2440402A1 (fr) | Protection contre les rayonnements | |
EP1357608A3 (fr) | Détecteur de rayons x | |
GB9913068D0 (en) | An electron gun used in an electron beam exposure apparatus | |
EP1764820A3 (fr) | Appareil de génération de rayons x à anode tournante et agitée axialement | |
TW200510924A (en) | Compositions, systems, and methods for imaging | |
EP1248153A3 (fr) | Appareil d'exposition aux rayons x | |
JPS6037616B2 (ja) | X線リゾグラフイ装置 | |
WO2002037905A3 (fr) | Mecanisme de prevention de rayonnements de neutrons dans la ligne de faisceau d'un implanteur ionique | |
AU631610B2 (en) | Positive radiation-sensitive mixture, and radiation-sensitive recording material produced therefrom for high-energy radiation | |
AU2001252849A1 (en) | Method and device for protection against radiation when working in a radiating zone | |
WO2004013655A3 (fr) | Teledetecteur de rayonnement ionisant | |
EP1426063A3 (fr) | Grains et extenseurs pour brachythérapie, qui peuvent être activés par un rayon de neutrons |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A2 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
122 | Ep: pct application non-entry in european phase |