WO2004088723A2 - Polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (soi) platform - Google Patents

Polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (soi) platform Download PDF

Info

Publication number
WO2004088723A2
WO2004088723A2 PCT/US2004/009655 US2004009655W WO2004088723A2 WO 2004088723 A2 WO2004088723 A2 WO 2004088723A2 US 2004009655 W US2004009655 W US 2004009655W WO 2004088723 A2 WO2004088723 A2 WO 2004088723A2
Authority
WO
WIPO (PCT)
Prior art keywords
layer
poly
silicon
waveguide layer
disposed
Prior art date
Application number
PCT/US2004/009655
Other languages
French (fr)
Other versions
WO2004088723A3 (en
Inventor
Prakash Gothoskar
Margaret Ghiron
Vipulkumar Patel
Robert Keith Montgomery
Kalpendu Shastri
Soham Pathak
Katherine A. Yanushefski
Original Assignee
Sioptical, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sioptical, Inc. filed Critical Sioptical, Inc.
Priority to JP2006501249A priority Critical patent/JP2006522465A/en
Priority to CA002528184A priority patent/CA2528184A1/en
Priority to EP04758565A priority patent/EP1614146A2/en
Publication of WO2004088723A2 publication Critical patent/WO2004088723A2/en
Publication of WO2004088723A3 publication Critical patent/WO2004088723A3/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/122—Basic optical elements, e.g. light-guiding paths
    • G02B6/125—Bends, branchings or intersections
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/122—Basic optical elements, e.g. light-guiding paths
    • G02B6/1225—Basic optical elements, e.g. light-guiding paths comprising photonic band-gap structures or photonic lattices
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/122—Basic optical elements, e.g. light-guiding paths
    • G02B6/1226—Basic optical elements, e.g. light-guiding paths involving surface plasmon interaction
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/122—Basic optical elements, e.g. light-guiding paths
    • G02B6/1228—Tapered waveguides, e.g. integrated spot-size transformers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/13—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body combined with thin-film or thick-film passive components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H01L31/02327—Optical elements or arrangements associated with the device the optical elements being integrated or being directly associated to the device, e.g. back reflectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
    • H01L31/035281—Shape of the body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
    • H01L31/0368—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including polycrystalline semiconductors
    • H01L31/03682—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including polycrystalline semiconductors including only elements of Group IV of the Periodic Table
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
    • H01L31/1808—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table including only Ge
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/015—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on semiconductor elements having potential barriers, e.g. having a PN or PIN junction
    • G02F1/025—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on semiconductor elements having potential barriers, e.g. having a PN or PIN junction in an optical waveguide structure
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
    • G02F2201/58—Arrangements comprising a monitoring photodetector
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/546—Polycrystalline silicon PV cells

Definitions

  • the present invention related to optical detectors and, more particularly, to a polycrystalline germanium-based waveguide detector integrated on a thin silicon-on- insulator (SOI) platform.
  • SOI silicon-on- insulator
  • relatively thin (e.g., ⁇ l ⁇ m) silicon waveguides are used to distribute light across the entire chip and provide multiple optical functions (for example, splitting/combining, modulation, switching, wavelength multiplexing/demultiplexing, add/drop, equalization, and dispersion compensation).
  • optical functions for example, splitting/combining, modulation, switching, wavelength multiplexing/demultiplexing, add/drop, equalization, and dispersion compensation.
  • the ability for light coupling and manipulation in a thin waveguide on an SOI platform enables a true integration of optics and microelectronics on a single silicon chip.
  • One of the reasons for the high cost, high power consumption and large form factors of the optical components/subsystems in the optical communication industry is the lack of available component integration.
  • Today's opto-electronic industry relies upon discrete building blocks and hybrid integration of various components.
  • Germanium-based area detectors are well known in the art. Germanium detectors exhibit a higher dark current than InGaAs-based detectors, which limit their application in the telecommunications industry. In recent years, attempts have been made to improve the performance of polycrystalline germanium-based detectors for these applications.
  • One exemplary prior art poly-germanium detector is discussed in an article entitled "Efficient high-speed near-infrared Ge photodetectors integrated on Si substrates ", by L. Colace et al., appearing in Applied Physics Letters, Vol. 76, p. 1231 et seq., 2000.
  • the present invention relates to optical detectors and, more particularly, to a polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (SOI) platform.
  • SOI silicon-on-insulator
  • the present invention relates to various poly-germanium-based photodetector structures that are monolithically integrated with relatively thin silicon waveguides formed in an SOI platform.
  • Poly-germanium may be formed using various techniques such as, but not limited to, physical vapor deposition (PVD) or chemical vapor deposition (CVD).
  • PVD physical vapor deposition
  • CVD chemical vapor deposition
  • the light propagating in a silicon waveguide, upon reaching the region with the overlying poly-germanium layer undergoes absorption into the poly-germanium.
  • the band gap of germanium ensures effective absorption of near-IR wavelength light.
  • the electron-hole pairs generated due to the absorption of light can be efficiently collected using suitable electrode structures fabricated upon the poly-germanium layer.
  • the physical dimensions of the poly-germanium layer i.e., height, width and length) are used to control the amount of light that is absorbed.
  • the detector layer is formed as a wrap-around geometry over a silicon strip waveguide formed on an SOI platform, with contacts formed on either side of the strip for biasing the detector.
  • the narrow lateral waveguide dimensions allow for high speed, low dark current operation with a high responsivity, due to a significantly smaller area when compared to normal incidence detectors.
  • the poly-germanium layer is formed directly upon a slab silicon waveguide and the light is focused into the poly-germanium detector using a focusing element (for example, a mirror, lens or a concave grating) fabricated in the silicon layer.
  • a focusing element for example, a mirror, lens or a concave grating
  • W m i n is the minimum beam diameter, ⁇ s; is the wavelength of light in silicon and NA is the numerical aperture of the focusing element.
  • the wavelength of light in silicon is much smaller than in free space, which enables a very narrow focusing of light in a thin silicon waveguide.
  • the detector area can then be very small (for example, 10 ⁇ m 2 ), allowing for high speed operation of the detector.
  • the shape of the poly-germanium detector layer may be tailored to minimize reflection losses and/or appropriately focus the light into the detector.
  • the poly-germanium detector is formed upon a narrow silicon rib waveguide such that the light propagating along the rib waveguide interacts with the poly-germanium layer along the entire length of the waveguide. This results in a complete absorption of light without the drawback of the absorption length and the carrier collection length being the same (as in the case of a normal incidence detector).
  • the carrier collection length remains the same, while the absorption of light is independently controlled by the length of the poly-germanium detector.
  • FIG. 1 contains a cross-sectional view of a conventional prior art normal incidence photodetector
  • FIG. 2 illustrates a cross-sectional view of an exemplary SOI structure upon which a poly-germanium photodetector of the present invention may be formed
  • FIGs. 3(a) and (b) contain cross-sectional and isometric views, respectively, of an exemplary SOI structure including a slab waveguide;
  • FIGs. 4(a) and (b) contain cross-sectional and isometric views, respectively, of a poly-germanium detector formed on the slab waveguide SOI structure of FIG. 3;
  • FIGs. 5(a) and (b) contain cross-sectional and isometric views, respectively, of an alternative embodiment of the arrangement of FIG. 4, including a dielectric layer interposed between the waveguide and detector;
  • FIGs. 6(a) and (b) contain cross-sectional and isometric views, respectively, of an exemplary SOI structure including a strip waveguide;
  • FIGs. 7(a) and (b) contain cross-sectional and isometric views, respectively, of a poly-germanium detector formed on the strip waveguide SOI structure of FIG. 6;
  • FIGs. 8(a) and (b) contain cross-sectional and isometric views, respectively, of an alternative embodiment of the arrangement of FIG. 7, including a dielectric layer interposed between the waveguide and detector;
  • FIGs. 9(a) and (b) contain cross-sectional and isometric views, respectively, of an exemplary SOI structure including a rib waveguide;
  • FIGs. 10(a) and (b) contain cross-sectional and isometric views, respectively, of a poly-germanium detector formed on the rib waveguide SOI structure of FIG. 9;
  • FIGs. 11(a) and (b) contain cross-sectional and isometric views, respectively, of an alternative embodiment of the arrangement of FIG. 10, including a dielectric layer interposed between the slab waveguide layer and the rib waveguide structure;
  • FIG. 12 contains a side view of an SOI-based strip waveguide arrangement with a poly-germanium detector of the present invention formed at the termination of the strip waveguide along a top surface of the SOI structure;
  • FIG. 13 contains a side view of an SOI-based rib waveguide arrangement with a poly-germanium detector of the present invention formed at the termination of the rib waveguide along a top surface of the SOI structure;
  • FIG. 14 contains a side view of a poly-silicon rib waveguide formed on a poly-silicon strip waveguide separated by a dielectric insulating layer, with a poly- germanium detector having contacts formed at the end of the waveguide coupled to the strip waveguide;
  • FIG. 15 contains a side view of a poly-silicon rib waveguide formed on a silicon strip waveguide separated by a dielectric insulating layer, with a poly- germanium detector formed upon the silicon strip waveguide at the end of the waveguide;
  • FIGs. 16(a) - (e) illustrate various opto-electronic systems utilizing the poly- germanium detector of the present invention.
  • FIG. 17 contains a graph illustrating the absorption qualities of germanium.
  • FIG. 1 illustrates, in cross-sectional view, one such conventional prior art detector 1.
  • Detector 1 is considered a "normal" incidence photodetector since the direction of the incoming light beam is perpendicular to the plane of the impinging surface, in this case, an AR coating layer 2.
  • Detector 1 is a p- i-n photodetector comprising a p-doped poly-germanium layer 3, an intrinsically doped layer 4 and an n-doped layer 5.
  • the electrical contacts are formed on opposing sides of detector 1, as shown, with a bottom contact 6 and a top, ring-shaped contact 7.
  • the thickness and doping of layers 3, 4 and 5 determine the amount of light absorbed and the speed of response of detector 1.
  • the absorption area within p-doped layer 3 is typically on the order of 100 ⁇ m 2 (the larger absorption area resulting from the lack of cost-effective methods of focusing the light into detector 1).
  • the relatively large absorption areas of these conventional prior art detectors limit their scope to applications that can tolerate the resulting higher dark current.
  • the thickness of the p-i-n layers is reduced to improve the speed of response, at the sacrifice of the responsivity (due to less absorption).
  • FIG. 2 contains a cross-sectional view of an exemplary SOI structure 10 upon which a poly-germanium layer may be disposed and used as a photodetector in accordance with the teachings of the present invention.
  • SOI structure 10 includes a silicon substrate 12 upon which is formed a silicon dioxide buried oxide layer 14.
  • a relatively thin slab silicon waveguide layer 16 is shown as disposed over buried oxide layer 14, where slab silicon waveguide 16 is used to provide propagation of an optical signal along the length of the waveguide.
  • a poly-germanium layer 18 is disposed over a portion of waveguide layer 16.
  • both electrical contacts are formed on the "top” of the device (i.e., planar contact geometry), which is considered easier to work with from a manufacturing and packaging point of view than the prior art need for "top" and "bottom” contacts.
  • the use of the relatively thin (i.e. ⁇ 1 ⁇ m) silicon waveguide 16 functions to confine a propagating light signal in the vertical dimension. As the signal propagates along the waveguide, it is coupled into poly- germanium layer 18, creating electron-hole pairs.
  • the distance between the separate metal contacts (as will be described below) can be made very short - on the order of the waveguide dimensions - ensuring a high speed operation without sacrificing responsivity.
  • the absorption of light in the waveguide detector arrangement of the present invention is controlled by the length and doping of poly-germanium detector layer 18.
  • an evanescent tail of the optical mode extends beyond the silicon waveguide layer, making it very sensitive to the top and bottom surfaces of the waveguide.
  • the poly-germanium layer is formed upon the silicon waveguide to absorb the light propagating in the waveguide.
  • the band gap of germanium allows for efficient absorption of near-IR wavelength light, as illustrated in FIG. 17.
  • a poly-germanium layer can be formed using various conventional techniques including, but not limited to physical vapor deposition (PVD) or chemical vapor deposition (CVD).
  • PVD physical vapor deposition
  • CVD chemical vapor deposition
  • the present invention involves the confinement of light into silicon waveguides with very narrow dimensions (for example, height ⁇ 1 ⁇ m, width - 1 ⁇ m).
  • the tight confinement of light enables the fabrication of detectors with very small dimensions.
  • the narrow waveguide geometry also relaxes the limitation associated with the prior art large area detectors, such as the prior art arrangement of FIG. 1. Material defects such as threading dislocations and small grain size adversely affect of the performance of the prior art detector.
  • the poly-germanium material can also be doped with suitable dopants, such as boron for p-type doping or P, As or Sb for n-type doping, to create a lateral p-i-n structure.
  • suitable dopants such as boron for p-type doping or P, As or Sb for n-type doping, to create a lateral p-i-n structure.
  • a p-i-n based photodetector can also be formed using appropriately positioned contacts (electrodes).
  • an undoped absorbing layer of germanium may be disposed between a p-type highly doped contact layer and an n- type highly doped contact layer.
  • a reverse bias is applied to the photodetector, the depletion region width increases, reducing the transit time of carriers.
  • the optical mode propagating in the silicon waveguide of the SOI structure creates electron-hole pairs when interacting with the poly-germanium region.
  • the electron-hole pairs are collected by the appropriately positioned electrodes. The collection efficiency depends upon the distance between the two electrodes, as well as the quality of the poly-germanium material.
  • the generation of electron-hole pairs is directly related to the absorption of light, since every absorbed photon generates one electron-hole pair.
  • the optical generation rate gop is given by:
  • A is the illuminated area of the photodiode
  • Pj n is the incident power
  • h is Planck's constant
  • c is the velocity of light in a vacuum
  • ⁇ is the wavelength of light.
  • the photocurrent can be given by the following integral: xn+d -xp where d is the thickness of the undoped region (which depletes), q is the electronic charge, and the integration is taken over the width of the depletion region.
  • the integral may be reduced to:
  • R is the reflection at the interface of the waveguide and the detector.
  • conventional dark currents on the order of 10 "3 A/cm 2 have been reported for normal incidence detectors, such as that shown in FIG. 1.
  • the expected dark currents for the poly-germanium- based waveguide detectors of the present invention (-10 ⁇ m 2 ) are on the order of 1 nA, resulting in a higher signal-to-noise ratio.
  • waveguide layer 16 will comprise one of three geometries: (1) slab, (2) strip, or (3) rib.
  • FIGs. 3(a) and (b) contain cross-sectional and isometric views, respectively, of a slab waveguide SOI- based structure.
  • upper silicon waveguide layer is denoted 16 s ⁇ ab .
  • the cross-sectional view of FIG. 3(a) also illustrates an exemplary optical mode for a signal propagating along slab waveguide 16 s i at> .
  • FIGs. 4(a) and (b) illustrate an exemplary photodetector of the present invention as used with a slab waveguide, where a poly-germanium layer 18 is disposed on top surface 17 of the SOI-based structure 10 of FIG. 3. Also with reference to FIG. 2, it is shown clearly in FIG.
  • a pair of electrical contacts 20 ⁇ and 20 2 are formed along opposing sides of layer 18, where the amount of absorption will be controlled by the length of layer 18 along the lateral dimension of structure 10.
  • an array of such detectors can be formed upon the same waveguide layer 16 slab and used to absorb different wavelengths propagating along the same layer 16 s ⁇ ab (such as, for example, in a wavelength division multiplexed (WDM) communication system).
  • WDM wavelength division multiplexed
  • a dielectric layer 22 (such as, for example, Si0 2 ) may be disposed to cover top surface 17 of waveguide layer 16 slab -
  • FIGs. 5(a) and (b) illustrate a cross-sectional view and isometric view, respectively, of such a structure. In most cases, this layer may be grown over the underlying silicon waveguide layer 16 slab - Alternatively, layer 22 may be deposited. It has been found useful to include a dielectric layer 22 in the photodetector structure of the present invention to simplify the process integration of introducing the poly-germanium detector layer 18 with the silicon waveguide layer 16.
  • FIGs. 6(a) and (b) contain a cross-sectional and isometric view, respectively, of a strip waveguide SOI-based structure.
  • upper silicon strip waveguide layer is denoted 16 str ip.
  • the cross-sectional view of FIG. 6(a) also illustrates an exemplary optical mode for a signal propagating along strip waveguide 16 s trip.
  • the optical mode is well-confined in both the horizontal and vertical dimensions, thus exhibiting a higher signal power as a function of lateral dimension than the slab waveguide geometry of FIG. 3.
  • FIGs. 7(a) and (b) illustrate an exemplary poly-germanium photodetector arrangement of the present invention utilizing the strip waveguide geometry illustrated in FIG. 6.
  • poly-germanium detector layer 18 is formed to comprise a "wrap-around" geometry so as to completely cover both the top and side surfaces of silicon strip waveguide layer 16 str ip-
  • detector layer 18 is formed to comprise a first side portion 18 ⁇ that contacts the top surface of buried oxide layer 14 on one side of waveguide layer 16 str ip, and a second side portion 18 2 that contacts the top surface of buried oxide layer 14 on the opposing side of waveguide layer 16 s r ip, as clearly illustrated in both FIGs. 7(a) and (b).
  • first electrical contact 20 1 is disposed over first portion 18 ⁇ of poly-germanium layer 18 and second electrical contact 20 2 is disposed over second portion 18 2 of poly- germanium layer 18.
  • strip waveguide layer 16 s tri P is illustrated as rectangular in cross-section, other geometries are possible. Also, various strip waveguide configurations including Y-splitters, ring resonators and/or couplers may be formed, with separate detectors disposed in a similar wrap-around configuration along various waveguide portions.
  • a dielectric layer 22 may be disposed between silicon strip waveguide layer 16 s r i p and poly-germanium photodetector layer 18, as shown in FIG. 8. This layer 22 is used to provide electrical isolation between waveguide layer 16 and electrical contacts 20 associated with poly- germanium detector 18. Dielectric layer 22, if chosen of a proper material, may also simplify the process of integrating poly-germanium layer 18 with the conventional SOI structure 10.
  • FIGs. 9(a) and (b) contain a cross-sectional and isometric view, respectively, of a rib waveguide structure.
  • a polysilicon rib waveguide layer 16 r ; b is formed over a portion of slab silicon waveguide layer 16 slab -
  • the cross-sectional view of FIG. 9(a) clearly illustrates the coupling of an exemplary optical mode into rib waveguide layer 16 r i b .
  • a poly-germanium detector may be disposed over top surface 17 of waveguide layer 16 s ⁇ ab to capture that portion of the optical mode extending above top surface 17 of layer 16.
  • FIGs. 10(a) and (b) illustrate an exemplary poly-germanium photodetector arrangement of the present invention utilizing the rib waveguide geometry illustrated in FIG. 9.
  • poly-germanium detector layer 18 is formed to comprise a "wrap-around" geometry so as to completely cover both the top and side surfaces of polysilicon rib waveguide layer 16 r i b .
  • detector layer 18 is formed to comprise a first side portion 18 ⁇ that contacts the top surface of silicon slab waveguide layer 16 s ⁇ ab on one side of rib waveguide layer 16 ⁇ b, and a second side portion 18 2 that contacts the top surface of silicon slab waveguide layer 16 s ⁇ ab on the opposing side of rib waveguide layer 16 r i , as clearly illustrated in both FIGs. 10(a) and (b).
  • first electrical contact 20 ⁇ is disposed over first portion 18 ⁇ of poly-germanium layer 18 and second electrical contact 20 2 is disposed over second portion 18 2 of poly-germanium layer 18.
  • rib waveguide 16 ⁇ b is illustrated as rectangular in cross-section, other geometries are possible.
  • various rib waveguide configurations including Y-splitters, ring resonators and/or couplers may be formed, with separate detectors disposed in a similar wrap-around configuration along various waveguide portions.
  • a dielectric layer 22 may be disposed between silicon slab waveguide layer 16 s ⁇ ab and polysilicon rib waveguide layer 16 r j b , as shown in FIG. 11. This layer 22 is used to provide electrical isolation between waveguide layer 16 and electrical contacts 20 associated with poly- germanium detector 18. Dielectric layer 22, if chosen of a proper material, may also simplify the process of integrating poly-germanium layer 18 with the conventional SOI structure 10.
  • FIG. 12 contains an isometric view of an alternative embodiment of the present invention, formed using a silicon strip waveguide layer 16 str ip and poly- germanium detector layer 18 formed as a coplanar structure.
  • poly-germanium detector layer 18 is disposed at a termination area T of silicon strip waveguide layer 16 str ip.
  • a pair of electrical contacts 20 ⁇ and 20 2 are disposed along opposing sides of detector layer 18.
  • This particular embodiment of the present invention may be used when complete optical-to-electrical conversion is required since the optical mode propagating along strip waveguide layer 16 str i p will be completely absorbed into poly-germanium layer 18, creating electron- hole pairs.
  • FIG. 13 illustrates an alternative embodiment of the arrangement of FIG.
  • FIG. 13 contains an isometric view of a poly-silicon rib waveguide structure formed upon a dielectric layer 22 that is disposed upon a silicon strip waveguide.
  • a poly- germanium detector 18 is disposed at a termination of both the poly-silicon rib and the silicon strip waveguide layers.
  • the arrangement shown in FIG. 14 is different in that germanium layer 18 is not directly formed on buried oxide layer 14, but rather is disposed over a section of a poly-silicon loaded strip waveguide layer 16 str ip.
  • a dielectric layer 22 may be disposed between poly-silicon loaded strip waveguide layer 16 str ip and polysilicon rib waveguide layer 16 r ib, as shown in FIG. 15.
  • the arrangement shown in FIG. 15 is slightly different in that germanium layer 18 is not directly formed on buried oxide layer 14, but rather is disposed over a section of a silicon loaded strip waveguide layer 16 str ip.
  • a dielectric layer 22 may * be disposed between silicon loaded strip waveguide layer 16 s r i p and poly-silicon rib waveguide layer 16 r ;b, as shown in FIG. 15.
  • FIGs. 16(a) - (e) illustrate various systems, in high-level form, that may utilize the SOI-based planar poly-germanium detector of the present invention.
  • FIGs. 16(a) - (e) illustrate various systems, in high-level form, that may utilize the SOI-based planar poly-germanium detector of the present invention.
  • use of discrete InGaAs detectors is considered as a less practical approach than that of the present invention, where the poly-germanium detector is directly formed upon the narrow waveguides of the SOI structure.
  • a coupled waveguide-based tap can be used to monitor transmitted/reflected power, as shown in FIG. 16(a).
  • a conventional prior art approach of tapping off a particular wavelength requires expensive optical filters and precise optical alignment.
  • a simple ring resonator configuration (FIG. 16(b)) can be used to tap off a particular wavelength for either monitoring purposes or for complete drop off. Multiple “taps” can then be used with a plurality of separate waveguides to monitor different wavelengths (see FIG. 16(c)).
  • a common method of wavelength multiplexing/demultiplexing involves the use of expensive multi-layer narrowband dielectric thin-film filters, which require precise optical alignment and are not considered cost effective.
  • a concave grating etched in silicon can be used (as shown in FIG. 16(d)) to demultiplex different wavelengths into separate silicon waveguides, with separate poly-germanium detectors associated with each waveguide.

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Optics & Photonics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nanotechnology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Manufacturing & Machinery (AREA)
  • Optical Integrated Circuits (AREA)
  • Light Receiving Elements (AREA)
  • Orthopedics, Nursing, And Contraception (AREA)
  • Optical Couplings Of Light Guides (AREA)

Abstract

A photodetector (10) for use with relatively thin (i.e., sub-micron) silicon optical waveguides formed in a silicon-on-insulator (SOI) structure comprises a layer of poly-germanium disposed to couple at least a portion of the optical signal propagating along the silicon optical waveguide. Tight confinement of the optical signal within the waveguide structure allows for efficient evanescent coupling into the poly-germanium detector. The silicon optical waveguide may comprise any desired geometry, with the poly-germanium detector (10) formed to either cover a portion of the waveguide, or be butt-coupled to an end portion of the waveguide. When covering a portion of the waveguide, poly-germanium detector (10) may comprise a 'wrap-around' geometry to cover the side and top surfaces of the optical waveguide, with electrical contacts formed at opposing ends of the detector (10).

Description

POLYCRYSTALLINE GERMANIUM-BASED WAVEGUIDE DETECTOR INTEGRATED ON A THIN SILICON-ON-INSULATOR (SOI) PLATFORM
Cross-Reference to Related Application
This application claims the benefit of Provisional Application No. 60/459,348, filed March 31, 2003.
Technical Field The present invention related to optical detectors and, more particularly, to a polycrystalline germanium-based waveguide detector integrated on a thin silicon-on- insulator (SOI) platform.
Background of the Invention In an SOI-based opto-electronic platform, relatively thin (e.g., <lμm) silicon waveguides are used to distribute light across the entire chip and provide multiple optical functions (for example, splitting/combining, modulation, switching, wavelength multiplexing/demultiplexing, add/drop, equalization, and dispersion compensation). The ability for light coupling and manipulation in a thin waveguide on an SOI platform enables a true integration of optics and microelectronics on a single silicon chip. One of the reasons for the high cost, high power consumption and large form factors of the optical components/subsystems in the optical communication industry is the lack of available component integration. Today's opto-electronic industry relies upon discrete building blocks and hybrid integration of various components. Similar to the IC industry in the 1960s, these discrete components are open loop, where the loop is then closed externally (using, for example, external optics and electronics), resulting in lower yields and higher costs. Using on-chip feedback control techniques, analog ICs meet very high precision specifications at very low cost, in spite of significant operating condition variations. Conversion of photons to electrons is essential for the successful integration of microphotonics with microelectronics. InGaAs-based PIN photodetectors are commonly used for telecommunication applications, due to their high responsivity and speed. The majority of the InGaAs-based detectors are normal incidence detectors, and integration of such devices on silicon surfaces is expensive. Additionally, integration of high-speed InGaAs detectors requires special optics to focus light into a small active area, which has been found to effect device performance.
Germanium-based area detectors are well known in the art. Germanium detectors exhibit a higher dark current than InGaAs-based detectors, which limit their application in the telecommunications industry. In recent years, attempts have been made to improve the performance of polycrystalline germanium-based detectors for these applications. One exemplary prior art poly-germanium detector is discussed in an article entitled "Efficient high-speed near-infrared Ge photodetectors integrated on Si substrates ", by L. Colace et al., appearing in Applied Physics Letters, Vol. 76, p. 1231 et seq., 2000.
In view of all of the above, a need still remains for a low cost, efficient optical to electrical conversion mechanism for simplifying the integration of optical and electronic functions on a single silicon-based chip.
Summary of the Invention
The need remaining in the prior art is addressed by the present invention, which relates to optical detectors and, more particularly, to a polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (SOI) platform.
In particular, the present invention relates to various poly-germanium-based photodetector structures that are monolithically integrated with relatively thin silicon waveguides formed in an SOI platform. Poly-germanium may be formed using various techniques such as, but not limited to, physical vapor deposition (PVD) or chemical vapor deposition (CVD). In SOI-based thin silicon waveguides, the optical mode is tightly confined, due to the large index contrast (nsi = 3.5 and nSio2 = 1.5). In accordance with the present invention, the light propagating in a silicon waveguide, upon reaching the region with the overlying poly-germanium layer undergoes absorption into the poly-germanium. The band gap of germanium (-0.72 eV) ensures effective absorption of near-IR wavelength light. The electron-hole pairs generated due to the absorption of light can be efficiently collected using suitable electrode structures fabricated upon the poly-germanium layer. The physical dimensions of the poly-germanium layer (i.e., height, width and length) are used to control the amount of light that is absorbed. In a preferred embodiment of the poly-germanium detector of the present invention, the detector layer is formed as a wrap-around geometry over a silicon strip waveguide formed on an SOI platform, with contacts formed on either side of the strip for biasing the detector. The narrow lateral waveguide dimensions (~ 1 μm) allow for high speed, low dark current operation with a high responsivity, due to a significantly smaller area when compared to normal incidence detectors.
In an alternative embodiment, the poly-germanium layer is formed directly upon a slab silicon waveguide and the light is focused into the poly-germanium detector using a focusing element (for example, a mirror, lens or a concave grating) fabricated in the silicon layer. The focal spot size achievable in silicon due to its higher refractive index is given by:
0.6λs
W mm ■ =
NA
where Wmin is the minimum beam diameter, λs; is the wavelength of light in silicon and NA is the numerical aperture of the focusing element. The wavelength of light in silicon is much smaller than in free space, which enables a very narrow focusing of light in a thin silicon waveguide. The detector area can then be very small (for example, 10 μm2), allowing for high speed operation of the detector. Additionally, the shape of the poly-germanium detector layer may be tailored to minimize reflection losses and/or appropriately focus the light into the detector.
In yet another embodiment of the present invention, the poly-germanium detector is formed upon a narrow silicon rib waveguide such that the light propagating along the rib waveguide interacts with the poly-germanium layer along the entire length of the waveguide. This results in a complete absorption of light without the drawback of the absorption length and the carrier collection length being the same (as in the case of a normal incidence detector). In this arrangement of the present invention, the carrier collection length remains the same, while the absorption of light is independently controlled by the length of the poly-germanium detector.
Brief Description of the Drawings
Referring now to the drawings, FIG. 1 contains a cross-sectional view of a conventional prior art normal incidence photodetector;
FIG. 2 illustrates a cross-sectional view of an exemplary SOI structure upon which a poly-germanium photodetector of the present invention may be formed; FIGs. 3(a) and (b) contain cross-sectional and isometric views, respectively, of an exemplary SOI structure including a slab waveguide;
FIGs. 4(a) and (b) contain cross-sectional and isometric views, respectively, of a poly-germanium detector formed on the slab waveguide SOI structure of FIG. 3;
FIGs. 5(a) and (b) contain cross-sectional and isometric views, respectively, of an alternative embodiment of the arrangement of FIG. 4, including a dielectric layer interposed between the waveguide and detector;
FIGs. 6(a) and (b) contain cross-sectional and isometric views, respectively, of an exemplary SOI structure including a strip waveguide;
FIGs. 7(a) and (b) contain cross-sectional and isometric views, respectively, of a poly-germanium detector formed on the strip waveguide SOI structure of FIG. 6;
FIGs. 8(a) and (b) contain cross-sectional and isometric views, respectively, of an alternative embodiment of the arrangement of FIG. 7, including a dielectric layer interposed between the waveguide and detector;
FIGs. 9(a) and (b) contain cross-sectional and isometric views, respectively, of an exemplary SOI structure including a rib waveguide;
FIGs. 10(a) and (b) contain cross-sectional and isometric views, respectively, of a poly-germanium detector formed on the rib waveguide SOI structure of FIG. 9;
FIGs. 11(a) and (b) contain cross-sectional and isometric views, respectively, of an alternative embodiment of the arrangement of FIG. 10, including a dielectric layer interposed between the slab waveguide layer and the rib waveguide structure;
FIG. 12 contains a side view of an SOI-based strip waveguide arrangement with a poly-germanium detector of the present invention formed at the termination of the strip waveguide along a top surface of the SOI structure;
FIG. 13 contains a side view of an SOI-based rib waveguide arrangement with a poly-germanium detector of the present invention formed at the termination of the rib waveguide along a top surface of the SOI structure;
FIG. 14 contains a side view of a poly-silicon rib waveguide formed on a poly-silicon strip waveguide separated by a dielectric insulating layer, with a poly- germanium detector having contacts formed at the end of the waveguide coupled to the strip waveguide;
FIG. 15 contains a side view of a poly-silicon rib waveguide formed on a silicon strip waveguide separated by a dielectric insulating layer, with a poly- germanium detector formed upon the silicon strip waveguide at the end of the waveguide;
FIGs. 16(a) - (e) illustrate various opto-electronic systems utilizing the poly- germanium detector of the present invention; and
FIG. 17 contains a graph illustrating the absorption qualities of germanium.
Detailed Description
Prior to describing in detail the poly-germanium SOI-based photodetector of the present invention, it is useful to briefly describe the working of a conventional, normal incidence photodetector. FIG. 1 illustrates, in cross-sectional view, one such conventional prior art detector 1. Detector 1 is considered a "normal" incidence photodetector since the direction of the incoming light beam is perpendicular to the plane of the impinging surface, in this case, an AR coating layer 2. Detector 1 is a p- i-n photodetector comprising a p-doped poly-germanium layer 3, an intrinsically doped layer 4 and an n-doped layer 5. The electrical contacts are formed on opposing sides of detector 1, as shown, with a bottom contact 6 and a top, ring-shaped contact 7. The thickness and doping of layers 3, 4 and 5 determine the amount of light absorbed and the speed of response of detector 1. The absorption area within p-doped layer 3 is typically on the order of 100 μm2 (the larger absorption area resulting from the lack of cost-effective methods of focusing the light into detector 1). The relatively large absorption areas of these conventional prior art detectors limit their scope to applications that can tolerate the resulting higher dark current. In some cases, the thickness of the p-i-n layers is reduced to improve the speed of response, at the sacrifice of the responsivity (due to less absorption).
FIG. 2 contains a cross-sectional view of an exemplary SOI structure 10 upon which a poly-germanium layer may be disposed and used as a photodetector in accordance with the teachings of the present invention. As shown, SOI structure 10 includes a silicon substrate 12 upon which is formed a silicon dioxide buried oxide layer 14. A relatively thin slab silicon waveguide layer 16 is shown as disposed over buried oxide layer 14, where slab silicon waveguide 16 is used to provide propagation of an optical signal along the length of the waveguide. A poly-germanium layer 18 is disposed over a portion of waveguide layer 16. Fundamental to every embodiment of the present invention, as discussed below, is that it comprises a monolithically integrated poly-germanium detector associated with a relatively thin (sub-micron) silicon waveguide formed in an SOI-based opto-electronic platform operating with near-IR wavelength light (i.e., 1.1 - 1.7 μm). As will be discussed in detail below in the various embodiments, both electrical contacts are formed on the "top" of the device (i.e., planar contact geometry), which is considered easier to work with from a manufacturing and packaging point of view than the prior art need for "top" and "bottom" contacts.
Referring back to FIG. 2, the use of the relatively thin (i.e. < 1 μm) silicon waveguide 16 functions to confine a propagating light signal in the vertical dimension. As the signal propagates along the waveguide, it is coupled into poly- germanium layer 18, creating electron-hole pairs. The distance between the separate metal contacts (as will be described below) can be made very short - on the order of the waveguide dimensions - ensuring a high speed operation without sacrificing responsivity. The absorption of light in the waveguide detector arrangement of the present invention, as will be discussed in detail below, is controlled by the length and doping of poly-germanium detector layer 18.
As a result of the sub-micron geometry of waveguide layer 16, an evanescent tail of the optical mode extends beyond the silicon waveguide layer, making it very sensitive to the top and bottom surfaces of the waveguide. Fundamental to the present invention is that the poly-germanium layer is formed upon the silicon waveguide to absorb the light propagating in the waveguide.
The band gap of germanium (-0.72 eV) allows for efficient absorption of near-IR wavelength light, as illustrated in FIG. 17. A poly-germanium layer can be formed using various conventional techniques including, but not limited to physical vapor deposition (PVD) or chemical vapor deposition (CVD). The present invention involves the confinement of light into silicon waveguides with very narrow dimensions (for example, height < 1 μm, width - 1 μm). The tight confinement of light enables the fabrication of detectors with very small dimensions. The narrow waveguide geometry also relaxes the limitation associated with the prior art large area detectors, such as the prior art arrangement of FIG. 1. Material defects such as threading dislocations and small grain size adversely affect of the performance of the prior art detector. Techniques of the thin-film transistor industry, such as cyclic annealing and laser annealing, can be used to improve the quality of the poly-germanium material for better electrical and optical performance. Appropriate process control during the formation of the poly- germanium detector of the present invention allows for changing the dimensions of grain size and threading dislocations to improve detector performance in terms of lower dark current, increased carrier lifetime and higher mobility. The poly-germanium material can also be doped with suitable dopants, such as boron for p-type doping or P, As or Sb for n-type doping, to create a lateral p-i-n structure. A p-i-n based photodetector can also be formed using appropriately positioned contacts (electrodes). For example, an undoped absorbing layer of germanium may be disposed between a p-type highly doped contact layer and an n- type highly doped contact layer. When a reverse bias is applied to the photodetector, the depletion region width increases, reducing the transit time of carriers. The optical mode propagating in the silicon waveguide of the SOI structure creates electron-hole pairs when interacting with the poly-germanium region. The electron-hole pairs are collected by the appropriately positioned electrodes. The collection efficiency depends upon the distance between the two electrodes, as well as the quality of the poly-germanium material.
The generation of electron-hole pairs is directly related to the absorption of light, since every absorbed photon generates one electron-hole pair. The optical generation rate gop is given by:
Figure imgf000009_0001
where A is the illuminated area of the photodiode, Pjn is the incident power, is the absorption coefficient, h is Planck's constant, c is the velocity of light in a vacuum, and λ is the wavelength of light. As an example, using a poly-germanium detector having the dimensions of 1 μm x 10 μm x 0.2 μm, if an input light signal at λ=1.55 μm and power of 1 μW is absorbed into the detector, then the number of electron-hole pairs generated in the volume of the detector is equal to about 8 x 1013 cm"3. Therefore, the thermally generated electron-hole pair concentration equals about 20. Due to the tight confinement of light, a significant amount of power is delivered to the poly-germanium detector, resulting in at least two orders of magnitude more electron- hole pairs compared to thermal generation.
Assuming all electron-hole pairs generated contribute to the photocurrent, the photocurrent can be given by the following integral: xn+d -xp where d is the thickness of the undoped region (which depletes), q is the electronic charge, and the integration is taken over the width of the depletion region. In all cases, the integral may be reduced to:
Figure imgf000010_0001
where R is the reflection at the interface of the waveguide and the detector. A near-IR wavelength light with λ = 1.55 μm, P;n = 1 μW and α = 103 cm"1 results in 1 μA of current for a 10 μm long detector. In the prior art, conventional dark currents on the order of 10"3 A/cm2 have been reported for normal incidence detectors, such as that shown in FIG. 1. In contrast, the expected dark currents for the poly-germanium- based waveguide detectors of the present invention (-10 μm2) are on the order of 1 nA, resulting in a higher signal-to-noise ratio.
In most of the embodiments of the present invention, waveguide layer 16 will comprise one of three geometries: (1) slab, (2) strip, or (3) rib. FIGs. 3(a) and (b) contain cross-sectional and isometric views, respectively, of a slab waveguide SOI- based structure. In this example, upper silicon waveguide layer is denoted 16sιab. The cross-sectional view of FIG. 3(a) also illustrates an exemplary optical mode for a signal propagating along slab waveguide 16siat>. As a result of the sub-micron thickness of silicon slab waveguide 16sιab, an evanescent tail of the optical mode extends beyond waveguide layer 16S >, making the mode very sensitive to both top surface 17 and bottom surface 19 of waveguide layer 16sιab- Advantageously, a poly- germanium detector may be disposed over top surface 17 of waveguide layer 16sιab to capture that portion of the optical mode extending above top surface 17 of layer 16. FIGs. 4(a) and (b) illustrate an exemplary photodetector of the present invention as used with a slab waveguide, where a poly-germanium layer 18 is disposed on top surface 17 of the SOI-based structure 10 of FIG. 3. Also with reference to FIG. 2, it is shown clearly in FIG. 4(a) that the optical mode is coupled into poly-germanium layer 18, allowing for absorption to take place. As shown, a pair of electrical contacts 20Ϊ and 202 are formed along opposing sides of layer 18, where the amount of absorption will be controlled by the length of layer 18 along the lateral dimension of structure 10. In one arrangement not illustrated, an array of such detectors can be formed upon the same waveguide layer 16slab and used to absorb different wavelengths propagating along the same layer 16sιab (such as, for example, in a wavelength division multiplexed (WDM) communication system).
If it is desired to electrically isolate the detector from silicon waveguide layer 16siab, a dielectric layer 22 (such as, for example, Si02) may be disposed to cover top surface 17 of waveguide layer 16slab- FIGs. 5(a) and (b) illustrate a cross-sectional view and isometric view, respectively, of such a structure. In most cases, this layer may be grown over the underlying silicon waveguide layer 16slab- Alternatively, layer 22 may be deposited. It has been found useful to include a dielectric layer 22 in the photodetector structure of the present invention to simplify the process integration of introducing the poly-germanium detector layer 18 with the silicon waveguide layer 16.
FIGs. 6(a) and (b) contain a cross-sectional and isometric view, respectively, of a strip waveguide SOI-based structure. In this example, upper silicon strip waveguide layer is denoted 16strip. The cross-sectional view of FIG. 6(a) also illustrates an exemplary optical mode for a signal propagating along strip waveguide 16strip. As a result of the sub-micron thickness and width of silicon strip waveguide lόstrip, the optical mode is well-confined in both the horizontal and vertical dimensions, thus exhibiting a higher signal power as a function of lateral dimension than the slab waveguide geometry of FIG. 3.
FIGs. 7(a) and (b) illustrate an exemplary poly-germanium photodetector arrangement of the present invention utilizing the strip waveguide geometry illustrated in FIG. 6. As evident in FIG. 7, poly-germanium detector layer 18 is formed to comprise a "wrap-around" geometry so as to completely cover both the top and side surfaces of silicon strip waveguide layer 16strip- In particular, detector layer 18 is formed to comprise a first side portion 18ι that contacts the top surface of buried oxide layer 14 on one side of waveguide layer 16strip, and a second side portion 182 that contacts the top surface of buried oxide layer 14 on the opposing side of waveguide layer 16s rip, as clearly illustrated in both FIGs. 7(a) and (b). In this case, first electrical contact 201 is disposed over first portion 18ι of poly-germanium layer 18 and second electrical contact 202 is disposed over second portion 182 of poly- germanium layer 18. Although strip waveguide layer 16striP is illustrated as rectangular in cross-section, other geometries are possible. Also, various strip waveguide configurations including Y-splitters, ring resonators and/or couplers may be formed, with separate detectors disposed in a similar wrap-around configuration along various waveguide portions.
As with the slab configuration discussed above, a dielectric layer 22 may be disposed between silicon strip waveguide layer 16s rip and poly-germanium photodetector layer 18, as shown in FIG. 8. This layer 22 is used to provide electrical isolation between waveguide layer 16 and electrical contacts 20 associated with poly- germanium detector 18. Dielectric layer 22, if chosen of a proper material, may also simplify the process of integrating poly-germanium layer 18 with the conventional SOI structure 10. FIGs. 9(a) and (b) contain a cross-sectional and isometric view, respectively, of a rib waveguide structure. In this example, a polysilicon rib waveguide layer 16r;b is formed over a portion of slab silicon waveguide layer 16slab- The use of polysilicon rib 16rib, in combination with slab waveguide layer 16sιab, functions to pull the optical mode up into the rib section, thereby enabling lateral confinement for the slab waveguide geometry. The cross-sectional view of FIG. 9(a) clearly illustrates the coupling of an exemplary optical mode into rib waveguide layer 16rib. As a result of the sub-micron thickness and width of silicon rib waveguide 16πb, an evanescent tail of the optical mode extends beyond waveguide layer 16π , making the mode very sensitive to both top surface 17 and bottom surface 19 of rib waveguide layer 16rib. Advantageously, a poly-germanium detector may be disposed over top surface 17 of waveguide layer 16sιab to capture that portion of the optical mode extending above top surface 17 of layer 16.
FIGs. 10(a) and (b) illustrate an exemplary poly-germanium photodetector arrangement of the present invention utilizing the rib waveguide geometry illustrated in FIG. 9. As evident in FIG. 10, and similar to the arrangement described above in association with FIG. 7, poly-germanium detector layer 18 is formed to comprise a "wrap-around" geometry so as to completely cover both the top and side surfaces of polysilicon rib waveguide layer 16rib. In particular, detector layer 18 is formed to comprise a first side portion 18ι that contacts the top surface of silicon slab waveguide layer 16sιab on one side of rib waveguide layer 16πb, and a second side portion 182 that contacts the top surface of silicon slab waveguide layer 16sιab on the opposing side of rib waveguide layer 16ri , as clearly illustrated in both FIGs. 10(a) and (b). In this case, first electrical contact 20ι is disposed over first portion 18ι of poly-germanium layer 18 and second electrical contact 202 is disposed over second portion 182 of poly-germanium layer 18. Although rib waveguide 16πb is illustrated as rectangular in cross-section, other geometries are possible. Also, various rib waveguide configurations including Y-splitters, ring resonators and/or couplers may be formed, with separate detectors disposed in a similar wrap-around configuration along various waveguide portions.
Similar to the slab and strip configurations discussed above, a dielectric layer 22 may be disposed between silicon slab waveguide layer 16sιab and polysilicon rib waveguide layer 16rjb, as shown in FIG. 11. This layer 22 is used to provide electrical isolation between waveguide layer 16 and electrical contacts 20 associated with poly- germanium detector 18. Dielectric layer 22, if chosen of a proper material, may also simplify the process of integrating poly-germanium layer 18 with the conventional SOI structure 10.
FIG. 12 contains an isometric view of an alternative embodiment of the present invention, formed using a silicon strip waveguide layer 16strip and poly- germanium detector layer 18 formed as a coplanar structure. In particular and as shown in FIG. 12, poly-germanium detector layer 18 is disposed at a termination area T of silicon strip waveguide layer 16strip. As before, a pair of electrical contacts 20ι and 202 are disposed along opposing sides of detector layer 18. This particular embodiment of the present invention may be used when complete optical-to-electrical conversion is required since the optical mode propagating along strip waveguide layer 16strip will be completely absorbed into poly-germanium layer 18, creating electron- hole pairs. FIG. 13 illustrates an alternative embodiment of the arrangement of FIG. 12, incorporating a dielectric layer 22 between silicon strip waveguide layer 16strip and silicon rib waveguide layer 16rjb. As with the arrangement of FIG. 12, all of the propagating optical signal will be absorbed by poly-germanium detector layer 18. FIG. 13 contains an isometric view of a poly-silicon rib waveguide structure formed upon a dielectric layer 22 that is disposed upon a silicon strip waveguide. A poly- germanium detector 18 is disposed at a termination of both the poly-silicon rib and the silicon strip waveguide layers. The arrangement shown in FIG. 14 is different in that germanium layer 18 is not directly formed on buried oxide layer 14, but rather is disposed over a section of a poly-silicon loaded strip waveguide layer 16strip. As with the arrangements discussed above, a dielectric layer 22 may be disposed between poly-silicon loaded strip waveguide layer 16strip and polysilicon rib waveguide layer 16rib, as shown in FIG. 15. The arrangement shown in FIG. 15 is slightly different in that germanium layer 18 is not directly formed on buried oxide layer 14, but rather is disposed over a section of a silicon loaded strip waveguide layer 16strip. As with the arrangements discussed above, a dielectric layer 22 may*be disposed between silicon loaded strip waveguide layer 16s rip and poly-silicon rib waveguide layer 16r;b, as shown in FIG. 15.
FIGs. 16(a) - (e) illustrate various systems, in high-level form, that may utilize the SOI-based planar poly-germanium detector of the present invention. There are several advantages of using the arrangement of the present invention over the conventional normal incidence detectors, as discussed above in association with FIG. 1. First, use of discrete InGaAs detectors is considered as a less practical approach than that of the present invention, where the poly-germanium detector is directly formed upon the narrow waveguides of the SOI structure. Additionally, a coupled waveguide-based tap can be used to monitor transmitted/reflected power, as shown in FIG. 16(a). A conventional prior art approach of tapping off a particular wavelength requires expensive optical filters and precise optical alignment. In accordance with the present invention, a simple ring resonator configuration (FIG. 16(b)) can be used to tap off a particular wavelength for either monitoring purposes or for complete drop off. Multiple "taps" can then be used with a plurality of separate waveguides to monitor different wavelengths (see FIG. 16(c)). A common method of wavelength multiplexing/demultiplexing involves the use of expensive multi-layer narrowband dielectric thin-film filters, which require precise optical alignment and are not considered cost effective. In accordance with the present invention, a concave grating etched in silicon can be used (as shown in FIG. 16(d)) to demultiplex different wavelengths into separate silicon waveguides, with separate poly-germanium detectors associated with each waveguide. In-line detection, another useful monitoring function, is also simplified by using the poly-germanium detector of the present invention, as shown in FIG. 16(e). It is to be understood that the above-described embodiments of the present invention are considered to be exemplary only and should not be considered to define or limit the scope of the present invention, as defined by the claims appended hereto:

Claims

What is claimed is:
1. A photodetector structure based on a silicon-on-insulator (SOI) platform, the structure comprising: a silicon substrate including a top major surface; a buried oxide layer disposed to cover the top major surface of said silicon substrate, said buried oxide layer including a top major surface; a sub-micron thickness silicon optical waveguide layer disposed to cover at least a portion of the buried oxide layer top major surface; a poly-germanium detector layer disposed to contact a portion of the silicon optical waveguide layer; and a pair of electrical contacts disposed on opposing lateral terminals of the poly- germanium detector layer, wherein said poly-germanium detector layer exhibits a band gap suitable for absorbing an optical signal propagating along the sub-micron thickness silicon optical waveguide layer and generating an electrical output signal between the pair of electrical contacts.
2. A photodetector structure as defined in claim 1 wherein the structure further comprises a dielectric layer disposed between the sub-micron thickness silicon optical waveguide layer and the poly-germanium detector layer.
3. A photodetector structure as defined in claim 2 where the dielectric layer comprises a grown Si02 layer.
4. A photodetector structure as defined in claim 1 wherein the sub-micron thickness silicon optical waveguide layer comprises a slab geometry, with the poly- germanium detector layer disposed to cover a top major surface portion of said slab waveguide layer.
5. A photodetector structure as defined in claim 1 wherein the sub-micron thickness silicon optical waveguide layer comprises a strip geometry, with the poly- germanium detector layer disposed to conformally coat a portion of the top major surface of the buried oxide layer, as well as the side and top surfaces of the silicon strip waveguide layer.
6. A photodetector structure as defined in claim 5 where the pair of electrical contacts are disposed on those portions of the poly-germanium layer in direct contact with the underlying buried oxide layer.
7. A photodetector structure as defined in claim 6 wherein the structure further comprises a dielectric layer disposed between the sub-micron silicon optical strip waveguide layer and the poly-germanium layer.
8. A photodetector structure as defined in claim 6 wherein the silicon strip waveguide comprises a rectangular geometry.
9. A photodetector structure as defined in claim 6 wherein the silicon strip waveguide comprises a geometry including elements such as Y-splitters, ring resonators and/or coupled waveguides.
10. A photodetector structure as defined in claim 6 wherein the poly- germanium detector layer is disposed at an end termination of the silicon strip waveguide layer so as to overly a portion of the top surface of the buried oxide layer.
11. A photodetector structure as defined in claim 1 wherein the sub-micron thickness silicon optical waveguide layer comprises a slab layer, with a poly-silicon rib waveguide disposed to cover a portion of the top major surface of said slab and the poly-germanium detector layer disposed to conformally coat a portion of the top major surface of the rib waveguide layer, as well as the side and top surfaces of the silicon rib waveguide layer.
12. A photodetector structure as defined in claim 11 wherein a dielectric electrical insulating layer is disposed between the silicon slab waveguide layer and the poly-silicon rib waveguide layer.
13. A photodetector structure as defined in claim 11 wherein the poly-silicon rib waveguide comprises a geometry including elements such as Y-splitters, ring resonators and/or coupled waveguides.
14. A photodetector structure as defined in claim 1 wherein the sub-micron thickness silicon optical waveguide layer comprises a silicon strip layer, with a polysilicon rib waveguide disposed to cover a portion of the top major surface of said strip and the poly-germanium detector layer disposed to conformally coat a portion of the top major surface of the strip waveguide layer, as well as the side and top surfaces of the silicon strip waveguide layer.
15. A photodetector structure as defined in claim 14 wherein the poly- germanium detector layer is disposed at an end termination of both the silicon strip waveguide layer and the poly-silicon rib waveguide layer.
16. A photodetector structure as defined in claim 14 wherein the poly- germanium detector layer is disposed to conformally coat a portion of the top major surface of the silicon strip waveguide layer, as well as the side and top surfaces of the silicon strip waveguide layer at the end termination of the poly-silicon rib waveguide layer.
17. A photodetector structure as defined in claim 14 wherein the sub-micron thickness silicon optical waveguide layer comprises a poly-silicon strip waveguide layer, with a poly-silicon rib waveguide layer disposed to cover a portion of the top major surface of the poly-silicon strip waveguide layer.
18. A photodetector structure as defined in claim 17 wherein the poly- germanium detector layer is disposed at an end termination of both the poly-silicon strip waveguide layer and the poly-silicon rib waveguide layer.
19. A photodetector structure as defined in claim 18 wherein the poly- germanium detector layer is disposed to conformally coat a portion of the top major surface of the poly-silicon strip waveguide layer, as well as the side and top surfaces of the silicon strip waveguide layer at an end termination of the poly-silicon rib waveguide layer.
20. A photodetector structure as defined in claim 1 wherein the poly- germanium detector layer includes lateral regions of p-type and n-type doping to form a PN junction in the detector.
21. A photodetector structure as defined in claim 1 wherein the poly- germanium detector layer includes lateral, separated regions of p-type and n-type doping to form a PIN structure photodetector.
PCT/US2004/009655 2003-03-31 2004-03-30 Polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (soi) platform WO2004088723A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006501249A JP2006522465A (en) 2003-03-31 2004-03-30 Polycrystalline germanium-based waveguide detector integrated on thin-film silicon-on-insulator (SOI) platform
CA002528184A CA2528184A1 (en) 2003-03-31 2004-03-30 Polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (soi) platform
EP04758565A EP1614146A2 (en) 2003-03-31 2004-03-30 Polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (soi) platform

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US45934803P 2003-03-31 2003-03-31
US60/459,348 2003-03-31
US10/772,724 US6897498B2 (en) 2003-03-31 2004-02-05 Polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (SOI) platform
US10/772,724 2004-02-05

Publications (2)

Publication Number Publication Date
WO2004088723A2 true WO2004088723A2 (en) 2004-10-14
WO2004088723A3 WO2004088723A3 (en) 2005-11-03

Family

ID=32995057

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/009655 WO2004088723A2 (en) 2003-03-31 2004-03-30 Polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (soi) platform

Country Status (6)

Country Link
US (1) US6897498B2 (en)
EP (1) EP1614146A2 (en)
JP (1) JP2006522465A (en)
KR (1) KR100745274B1 (en)
CA (1) CA2528184A1 (en)
WO (1) WO2004088723A2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005043614A2 (en) * 2003-11-03 2005-05-12 International Business Machines Corporation METHOD FOR FABRICATING SiGe-ON-INSULATOR (SGOI) AND Ge-ON-INSULATOR (GOI) SUBSTRATES
US9799791B2 (en) 2012-07-13 2017-10-24 Huawei Technologies Co., Ltd. Process for manufacturing a photonic circuit with active and passive structures
US10830968B2 (en) 2018-04-12 2020-11-10 Samsung Electronics Co., Ltd. Photodetector structure

Families Citing this family (78)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060055800A1 (en) * 2002-12-18 2006-03-16 Noble Device Technologies Corp. Adaptive solid state image sensor
CA2521660A1 (en) * 2003-04-23 2004-11-04 Sioptical, Inc. Sub-micron planar lightwave devices formed on an soi optical platform
US7672558B2 (en) * 2004-01-12 2010-03-02 Honeywell International, Inc. Silicon optical device
US7177489B2 (en) * 2004-03-18 2007-02-13 Honeywell International, Inc. Silicon-insulator-silicon thin-film structures for optical modulators and methods of manufacture
US7149388B2 (en) * 2004-03-18 2006-12-12 Honeywell International, Inc. Low loss contact structures for silicon based optical modulators and methods of manufacture
US7217584B2 (en) 2004-03-18 2007-05-15 Honeywell International Inc. Bonded thin-film structures for optical modulators and methods of manufacture
US20050214989A1 (en) * 2004-03-29 2005-09-29 Honeywell International Inc. Silicon optoelectronic device
US7397101B1 (en) * 2004-07-08 2008-07-08 Luxtera, Inc. Germanium silicon heterostructure photodetectors
US20060063679A1 (en) * 2004-09-17 2006-03-23 Honeywell International Inc. Semiconductor-insulator-semiconductor structure for high speed applications
US7327911B2 (en) * 2004-10-19 2008-02-05 Sioptical, Inc. Optical detector configuration and utilization as feedback control in monolithic integrated optic and electronic arrangements
JP2008526003A (en) * 2004-12-24 2008-07-17 ピレリ・アンド・チ・ソチエタ・ペル・アツィオーニ Germanium-on-silicon photodetector
US7826688B1 (en) 2005-10-21 2010-11-02 Luxtera, Inc. Enhancing the sensitivity of resonant optical modulating and switching devices
US7305157B2 (en) * 2005-11-08 2007-12-04 Massachusetts Institute Of Technology Vertically-integrated waveguide photodetector apparatus and related coupling methods
US7266263B2 (en) * 2005-11-08 2007-09-04 Massachusetts Institute Of Technology Integrated waveguide photodetector apparatus with matching propagation constants and related coupling methods
US20070101927A1 (en) * 2005-11-10 2007-05-10 Honeywell International Inc. Silicon based optical waveguide structures and methods of manufacture
US7362443B2 (en) * 2005-11-17 2008-04-22 Honeywell International Inc. Optical gyro with free space resonator and method for sensing inertial rotation rate
US7811913B2 (en) * 2005-12-19 2010-10-12 Sharp Laboratories Of America, Inc. Method of fabricating a low, dark-current germanium-on-silicon pin photo detector
US7514285B2 (en) * 2006-01-17 2009-04-07 Honeywell International Inc. Isolation scheme for reducing film stress in a MEMS device
US7442589B2 (en) * 2006-01-17 2008-10-28 Honeywell International Inc. System and method for uniform multi-plane silicon oxide layer formation for optical applications
US7515793B2 (en) * 2006-02-15 2009-04-07 International Business Machines Corporation Waveguide photodetector
US7613369B2 (en) * 2006-04-13 2009-11-03 Luxtera, Inc. Design of CMOS integrated germanium photodiodes
US7463360B2 (en) 2006-04-18 2008-12-09 Honeywell International Inc. Optical resonator gyro with integrated external cavity beam generator
US7454102B2 (en) * 2006-04-26 2008-11-18 Honeywell International Inc. Optical coupling structure
US20070274655A1 (en) * 2006-04-26 2007-11-29 Honeywell International Inc. Low-loss optical device structure
US7535576B2 (en) 2006-05-15 2009-05-19 Honeywell International, Inc. Integrated optical rotation sensor and method for sensing rotation rate
US20080105940A1 (en) * 2006-06-15 2008-05-08 Sioptical, Inc. SOI-based inverse nanotaper optical detector
US7670908B2 (en) * 2007-01-22 2010-03-02 Alpha & Omega Semiconductor, Ltd. Configuration of high-voltage semiconductor power device to achieve three dimensional charge coupling
CN100552984C (en) * 2007-09-19 2009-10-21 中国科学院半导体研究所 Germanium/silicon mixes integrated waveguide type photoelectric converter and manufacture method thereof
US7790495B2 (en) * 2007-10-26 2010-09-07 International Business Machines Corporation Optoelectronic device with germanium photodetector
JP5150216B2 (en) * 2007-11-08 2013-02-20 株式会社東芝 Waveguide-type photodetector and manufacturing method thereof
US7902620B2 (en) * 2008-08-14 2011-03-08 International Business Machines Corporation Suspended germanium photodetector for silicon waveguide
US8269303B2 (en) 2008-03-07 2012-09-18 Nec Corporation SiGe photodiode
JP5234104B2 (en) * 2008-03-28 2013-07-10 日本電気株式会社 Semiconductor photo detector
US8290325B2 (en) * 2008-06-30 2012-10-16 Intel Corporation Waveguide photodetector device and manufacturing method thereof
US8084739B2 (en) 2008-07-16 2011-12-27 Infrared Newco., Inc. Imaging apparatus and methods
US8686365B2 (en) * 2008-07-28 2014-04-01 Infrared Newco, Inc. Imaging apparatus and methods
JP5480512B2 (en) * 2009-03-11 2014-04-23 国立大学法人広島大学 Photodetector and optical integrated circuit device including the same
US8078016B2 (en) * 2009-04-10 2011-12-13 Empire Technology Development Llc Optical circuit device and method
US8232516B2 (en) 2009-07-31 2012-07-31 International Business Machines Corporation Avalanche impact ionization amplification devices
KR101272783B1 (en) * 2009-08-31 2013-06-11 한국전자통신연구원 waveguide photo-detector
US8450186B2 (en) * 2009-09-25 2013-05-28 Intel Corporation Optical modulator utilizing wafer bonding technology
FR2953607B1 (en) 2009-12-09 2012-05-18 Commissariat Energie Atomique DEVICE FOR COUPLING AN ELECTROMAGNETIC WAVE BETWEEN A WAVEGUIDE AND A SLOTTED METAL GUIDE, METHOD OF MANUFACTURING THE SAME
JP5152874B2 (en) * 2010-03-04 2013-02-27 日本電信電話株式会社 Photodetector manufacturing method
EP2386890A1 (en) 2010-05-12 2011-11-16 Imec Transparent photonic integrated circuit
WO2012008272A1 (en) * 2010-07-16 2012-01-19 日本電気株式会社 Light-receiving element, optical communication device equipped with same, process for production of light-receiving element, and process for production of optical communication device
KR101683770B1 (en) * 2010-07-28 2016-12-08 삼성전자주식회사 Method for manufacturing photodetector structure
US8633067B2 (en) 2010-11-22 2014-01-21 International Business Machines Corporation Fabricating photonics devices fully integrated into a CMOS manufacturing process
US8861909B2 (en) 2011-02-17 2014-10-14 Cornell University Polysilicon photodetector, methods and applications
US8741684B2 (en) 2011-05-09 2014-06-03 Imec Co-integration of photonic devices on a silicon photonics platform
KR20120137839A (en) 2011-06-13 2012-12-24 삼성전자주식회사 Semiconductor device having an optical transceiver
JP2013012548A (en) * 2011-06-28 2013-01-17 Hitachi Ltd Optical module and photo-electric hybrid board
KR20130029293A (en) 2011-09-14 2013-03-22 삼성전자주식회사 Optical input/output device and metho for fabricating the same
US9116290B1 (en) 2011-10-07 2015-08-25 Bae Systems Information And Electronic Systems Integration Inc. Faceted, germanium slotted waveguide
KR101750742B1 (en) * 2011-10-14 2017-06-28 삼성전자주식회사 Photodetector structure
KR101771427B1 (en) * 2011-11-02 2017-09-05 삼성전자주식회사 Waveguide-integrated graphene photodetector
WO2013066325A1 (en) * 2011-11-02 2013-05-10 Intel Corporation Waveguide avalanche photodetectors
US9709740B2 (en) 2012-06-04 2017-07-18 Micron Technology, Inc. Method and structure providing optical isolation of a waveguide on a silicon-on-insulator substrate
US9117946B2 (en) 2013-01-15 2015-08-25 International Business Machines Corporation Buried waveguide photodetector
JP6020295B2 (en) * 2013-03-28 2016-11-02 富士通株式会社 Si optical integrated circuit device and manufacturing method thereof
US9229164B2 (en) 2013-04-23 2016-01-05 Globalfoundries Inc. Butt-coupled buried waveguide photodetector
EP3296805B1 (en) 2013-06-12 2021-03-03 Massachusetts Institute Of Technology Optical modulator from standard fabrication processing
WO2015016942A1 (en) * 2013-08-02 2015-02-05 Intel Corporation Low voltage photodetectors
JP5898732B2 (en) * 2014-07-17 2016-04-06 株式会社日立製作所 Manufacturing method of optical module
KR102171268B1 (en) 2014-09-30 2020-11-06 삼성전자 주식회사 manufacturing method of Hybrid silicon laser
US9310576B1 (en) * 2014-11-26 2016-04-12 International Business Machines Corporation Integrated circuit having redundant optical signal paths and method of creating same
US11105974B2 (en) * 2015-06-30 2021-08-31 Massachusetts Institute Of Technology Waveguide-coupled silicon-germanium photodetectors and fabrication methods for same
SG11201806132TA (en) * 2016-02-29 2018-09-27 Univ Nanyang Tech Optical structure and method of forming the same
CN107068784B (en) * 2017-01-16 2019-07-19 中国科学院半导体研究所 A kind of transverse structure germanium/silicon heterogenous avalanche photodetector and preparation method thereof
US10914892B2 (en) * 2018-10-18 2021-02-09 Cisco Technology, Inc. Germanium photodetector coupled to a waveguide
CN111326533B (en) * 2018-12-14 2023-01-13 上海新微技术研发中心有限公司 Waveguide integrated photoelectric detector and manufacturing method thereof
US11075307B2 (en) * 2019-07-18 2021-07-27 International Business Machines Corporation Compact electro-optical devices with laterally grown contact layers
JP7318434B2 (en) * 2019-09-09 2023-08-01 富士通オプティカルコンポーネンツ株式会社 Optical semiconductor device, optical transceiver using the same, and method for manufacturing optical semiconductor device
CA3111302A1 (en) * 2020-03-09 2021-09-09 Thorlabs Quantum Electronics, Inc. Tunable laser assembly and method of control
US11378747B2 (en) 2020-07-02 2022-07-05 Globalfoundries U.S. Inc. Waveguide attenuator
US11353651B2 (en) * 2020-11-02 2022-06-07 Globalfoundries U.S. Inc. Multi-mode optical waveguide structures with isolated absorbers
CN112289892B (en) * 2020-11-02 2022-06-14 联合微电子中心有限责任公司 Photoelectric detector and manufacturing method thereof
CN113517360A (en) * 2021-03-10 2021-10-19 广东省大湾区集成电路与系统应用研究院 Thermosensitive detector structure and integration method thereof
CN113488557B (en) * 2021-07-06 2022-04-22 中国科学院半导体研究所 Silicon-based detector with gradually-changed width and preparation method thereof

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6090636A (en) * 1998-02-26 2000-07-18 Micron Technology, Inc. Integrated circuits using optical waveguide interconnects formed through a semiconductor wafer and methods for forming same
US6316281B1 (en) * 1998-09-12 2001-11-13 Electronics And Telecommunications Research Institute Method for fabricating a hybrid optical integrated circuit employing SOI optical waveguide

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2910696B2 (en) * 1996-09-20 1999-06-23 日本電気株式会社 Semiconductor photodetector
EP0993053A1 (en) * 1998-10-09 2000-04-12 STMicroelectronics S.r.l. Infrared detector integrated with a waveguide and method of manufacturing
US6387720B1 (en) 1999-12-14 2002-05-14 Phillips Electronics North America Corporation Waveguide structures integrated with standard CMOS circuitry and methods for making the same
US6504977B1 (en) 2000-02-01 2003-01-07 Agere Systems, Inc. Integrated CMOS pigtailed receiver using CMOS-compatible optical bench
US6677655B2 (en) 2000-08-04 2004-01-13 Amberwave Systems Corporation Silicon wafer with embedded optoelectronic material for monolithic OEIC
US6815245B2 (en) * 2000-12-26 2004-11-09 National Research Council Of Canada High speed and high efficiency Si-based photodetectors using waveguides formed with silicides for near IR applications

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6090636A (en) * 1998-02-26 2000-07-18 Micron Technology, Inc. Integrated circuits using optical waveguide interconnects formed through a semiconductor wafer and methods for forming same
US6316281B1 (en) * 1998-09-12 2001-11-13 Electronics And Telecommunications Research Institute Method for fabricating a hybrid optical integrated circuit employing SOI optical waveguide

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005043614A2 (en) * 2003-11-03 2005-05-12 International Business Machines Corporation METHOD FOR FABRICATING SiGe-ON-INSULATOR (SGOI) AND Ge-ON-INSULATOR (GOI) SUBSTRATES
WO2005043614A3 (en) * 2003-11-03 2005-11-03 Ibm METHOD FOR FABRICATING SiGe-ON-INSULATOR (SGOI) AND Ge-ON-INSULATOR (GOI) SUBSTRATES
US9799791B2 (en) 2012-07-13 2017-10-24 Huawei Technologies Co., Ltd. Process for manufacturing a photonic circuit with active and passive structures
US10830968B2 (en) 2018-04-12 2020-11-10 Samsung Electronics Co., Ltd. Photodetector structure
US11428877B2 (en) 2018-04-12 2022-08-30 Samsung Electronics Co., Ltd. Photodetector structure

Also Published As

Publication number Publication date
KR100745274B1 (en) 2007-08-01
US6897498B2 (en) 2005-05-24
US20040188794A1 (en) 2004-09-30
WO2004088723A3 (en) 2005-11-03
CA2528184A1 (en) 2004-10-14
KR20060026847A (en) 2006-03-24
EP1614146A2 (en) 2006-01-11
JP2006522465A (en) 2006-09-28

Similar Documents

Publication Publication Date Title
US6897498B2 (en) Polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (SOI) platform
US8148794B2 (en) Photodetector in germanium on silicon
US8326094B2 (en) In-line light sensor
EP1716596B1 (en) Silicon-based schottky barrier infrared optical detector
JP5232981B2 (en) SiGe photodiode
US7305157B2 (en) Vertically-integrated waveguide photodetector apparatus and related coupling methods
CN101563790B (en) Photodiode, optical communication device, and optical interconnection module
JP6793786B1 (en) Manufacturing method of semiconductor light receiving element, photoelectric fusion module and avalanche photodiode
US6307242B1 (en) Semiconductor photo-detector with square-shaped optical wave-guide
US20080105940A1 (en) SOI-based inverse nanotaper optical detector
US6522799B1 (en) Optical planar waveguide device and method of fabrication
WO2008080428A1 (en) Waveguide photodetector in germanium on silicon
JP6726248B2 (en) Semiconductor light receiving element and photoelectric fusion module
Ono et al. Si photonics butt-coupled waveguide germanium avalanche photodiodes with lateral SAM structures
CN100407378C (en) Polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (SOI) platform
Gong et al. Germanium–tin (Ge1–x Sn x) photodetectors for 2 μm wavelength band
JP7125822B2 (en) Optical semiconductor device and optical transmission device
Benedikovic et al. High-performance waveguide photodetectors based on lateral Si/Ge/Si heterojunction
JP2024130595A (en) Light receiving element
WO2004017428A1 (en) Wavelength-demultiplexer with integrated monolithic photodiodes
GB2383680A (en) A Light Sensor

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): BW GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 2528184

Country of ref document: CA

WWE Wipo information: entry into national phase

Ref document number: 2434/CHENP/2005

Country of ref document: IN

WWE Wipo information: entry into national phase

Ref document number: 20048088587

Country of ref document: CN

WWE Wipo information: entry into national phase

Ref document number: 1020057018556

Country of ref document: KR

Ref document number: 2006501249

Country of ref document: JP

WWE Wipo information: entry into national phase

Ref document number: 2004758565

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 2004758565

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 1020057018556

Country of ref document: KR