WO2004055550A1 - Switching/depolarizing power supply for a radiation imaging device - Google Patents
Switching/depolarizing power supply for a radiation imaging device Download PDFInfo
- Publication number
- WO2004055550A1 WO2004055550A1 PCT/US2003/039432 US0339432W WO2004055550A1 WO 2004055550 A1 WO2004055550 A1 WO 2004055550A1 US 0339432 W US0339432 W US 0339432W WO 2004055550 A1 WO2004055550 A1 WO 2004055550A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- power supply
- voltage
- high voltage
- switching
- switch
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/10—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
- H02M3/145—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
- H02M3/155—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
- H02M3/156—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/0045—Converters combining the concepts of switch-mode regulation and linear regulation, e.g. linear pre-regulator to switching converter, linear and switching converter in parallel, same converter or same transistor operating either in linear or switching mode
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/10—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
- H02M3/145—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
- H02M3/155—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
Definitions
- the present invention relates to the field of digital imaging of X-ray and gamma ray radiation. More specifically it relates to switching-type voltage power supplies for digital X-ray and gamma ray imaging devices.
- the present invention relates to a Dynamic Imaging Camera (DIC) or Scanning Camera (SCAN) having Cadmium-Telluride (Cd-Te, including Cd-Zn- Te) based radiation detectors for imaging X-ray signals.
- Cd-Te based detectors for imaging X-ray signals are known in the art, and are particularly useful for high energy radiation imaging.
- High energy radiation imaging include X-ray and gamma ray radiation in the 1.0 KeV and greater range.
- these detectors have a blocking contact on one face and pixel contacts on another face. In turn, the pixel contacts are bump-bonded to charge integrating application specific integrated circuits (ASICs).
- ASICs application specific integrated circuits
- the blocking contact serves to reduce the dark or ambient current of the detector by a factor of 3 to 10. Lower dark currents mean higher sensitivity to incoming x-rays (signal).
- a problem can exist in a Cd-Te detector having a blocking contact.
- Such contacts e.g., Indium based blocking contacts
- Polarization means that the detector starts to loose signal and the image loses definition or acuity and gets more blurry. Polarization happens due to gradual electric charge trapping inside the material bulk of the Cd-Te detector.
- a Cadmium-Telluride (Cd-Te) based DIG detector typically requires a high voltage (HV) bias potential to operate properly.
- HV high voltage
- Such detectors can quickly accumulate an electrical charge and become polarized.
- the polarization charge offsets the HV bias potential and adversely affects operation and image quality of the camera imaging device.
- the detector unit requires a "refresh" action, i.e., the bleeding-off of the trapped or accumulated electric charge to depolarize the detector unit and restore operational efficiency of the device.
- the present invention is a high voltage (HV) switching power supply for use with a high energy X-ray camera imaging device with a Cd-Te based detector (including a CdZnTe based detector).
- HV high voltage
- Such X-ray imaging cameras typically comprise a detector substrate bonded to a CMOS substrate and mounted to an interface/signal processing board, in combination with a power supply.
- the output from the camera is typically communicated to a computer for image processing.
- the depolarizing, switching HV power supply of the present invention is intended as a power supply for such an X-ray imaging camera.
- the present HV switching power supply enables the use of Cd-Te detectors (especially those having blocking contacts) in dynamic imaging camera X-ray imaging systems and scanning camera/sensor imaging systems.
- the HV power supply is used to supply HV to the Cd-Te detector of the X-ray imaging system.
- the HV output of the HV power supply is switchable (on/off) at user defined intervals. For example, every few seconds the HV output of the. switching power supply automatically cycles off for a few milliseconds and then very fast on again. When the HV output goes off, any electrical charge trapped at the detector(s) is able to bleed-off, which reverses or prevents polarization of the detector.
- the prevention of polarization allows continuous usage of a Cd-Te type detector DIC imaging device, and enables the use of such devices for inline imaging, e.g., in non-destructive testing or automated X-ray inspection systems.
- the present depolarizing, HV switching power supply provides both high and low voltages useful for powering a Cd-Te base radiation detector, with or without a blocking contact.
- Typical low and high voltage requirements for Cd-Te base radiation detectors are known in the art.
- low bias voltage requirements for the Cd-Te type detectors are on the order of +/- 1.0V to +/- 15.0 V DC to operate the detector's internal circuits.
- the present HV switching power supply also provides an adjustable high bias voltage from +80VDC to +450VDC for driving the detector.
- the current invention is mostly suitable for CdTe or CdZnTe based detectors with a blocking contact, it can also have application in CdTe or CdZnTe detectors without blocking contact, but equipped with Platinum (Pt), Gold (Au) or other conventional contacts. Even such conventional contacts can create polarization after many minutes or hours and a power HV supply as described herein is ideal for the smooth and stable operation over many hours or indeed days.
- Figures 1 to 5 are schematic representations illustrating the present depolarizing/switching power supply and component circuits.
- Fig. , 1 generally illustrates the present depolarizing/switching power supply 10 of the present invention.
- the present invention was externally supplied with +24V DC from a medical grade external power source (not shown).
- a medical grade external power source not shown
- an alternative such a power source of an appropriate supply voltage is known to and selectable by one of ordinary skill in the art for practice in the present invention, either internally or externally.
- the supply power requirement for the present switching power supply was on the order of about 10 W.
- the present HV switching power supply 10 comprised the combination of five main circuits: a control/conditioning circuit 18, an internal power supply 30, a low voltage power supply 50, a high voltage power supply 70, and a high voltage switch 90.
- the conditioning/control circuit 18 has an external power source connection 20 and included a main power on/off switch 24.
- the conditioning circuit 18 conditions the external power appropriately for use by the other circuits of the power supply 10.
- a main operating voltage power connection 22 communicates the conditioned electrical power to the other circuits of the power supply 10.
- the present HV switching power supply 10 is electrically shielded, as is accomplishable by one of ordinary skill in the art.
- the switching power supply was housed in a metal casing (not shown), which casing was connected to a power supply ground J2-1 to attenuate or eliminate electromagnetic interference (EMI).
- EMI electromagnetic interference
- the connectors utilized in the power supply are protected from electrostatic discharge (ESD) and filtered for EMI, and the DC voltage connections are protected from reverse polarity and voltage spikes.
- the high voltage enable signal circuit is protected from over voltages and has a pull-down feature.
- shielded cable is utilized for current carrying conductors and coaxial cable for bias voltage conductors.
- Fig. 2 is a schematic diagram of a preferred embodiment of an internal power supply circuit (int_supply) 30 practiced in the present HV switching power supply 10:
- the internal power supply 30 provides low voltage power as required for the other circuits of the present switching power supply 10.
- the internal power supply 30 comprises a linear regulator (N5) 32 and linear regulator circuit 34 adjusted to provide a +12V DC output 46.
- An LM317 integrated circuit was utilized as the linear regulator 32 of the linear regulator circuit 34.
- the internal power supply 30 also comprises a switching regulator (Nl) 38 and switching regulator circuit 40.
- the switching regulator circuit 40 provide the low negative voltage (e.g., -5V DC in the embodiment illustrated) as required in the other circuits of the HV switching power supply 10 at the negative bias voltage output
- a National LM2672 integrated circuit 260kHz switching regulator in buck- boost configuration was utilized as the switching regulator 38.
- a minimum drain for the negative bias voltage output 42 was provided by an LED 44.
- Fig. 3 is a schematic diagram of a preferred embodiment of a low DC voltage power supply circuit (power supply) 50 practiced in the present HV switching power supply 10.
- the power supply circuit 50 provides low DC voltages for operating external devices, like the detector unit(s), connected to the power supply 10.
- the power supply circuit 50 comprised two switching regulator circuits 52 & 53 to provide +6.7V and + 5 V respectively to operate detector elements.
- National LM2672s regulators 56 were used in the switching regulator circuits 52 & 53 to respectively provide a +6.7v output (Voutl) 58 and a +5V output (Vout2) 60.
- the LM2672s regulators 56 of both switching regulator circuits 52 & 53 were disposed in buck configuration.
- the +5 V switching regulator circuit 53 had a green SMD LED 62 and the +6.7V switching regulator circuit 52 had a yellow angled LED 63 to differentiate and indicate the low voltage power supply 50 was turned on.
- Fig.4 is a schematic diagram of a preferred embodiment of a high voltage, switching power supply circuit (HV_supply) 70 of the present depolarizing/switching power supply 10.
- the HV power supply circuit 70 provides a high voltage bias output 72 to the high voltage switch circuit 90 (see
- the HV switching power supply circuit 70 used a standard UC3842 current-mode PWM controller 76 operating in a boost configuration at about 75 kHz.
- a voltage feedback loop was used to adjust the voltage at high voltage bias output 72 to the desired level (about +350V in the present embodiment) .
- the current feedback protected the switching power supply circuit 70 from short circuits and provided good transient response, improving HV bias rise time.
- the voltage division utilized in the voltage feedback loop of the HV power supply circuit 70 was heavy and yielded a ripple voltage of l-2Vpp without compensation.
- a compensation circuit synchronized to the UC3842's oscillator circuit added an artificial ramp onto each current pulse. The compensation ensures the power supply did not skip pulses, and limited the voltage ripple to about 200mVpp.
- a constant current load was used to provide about a 1.0 mA current drain for the power supply independent of the output voltage.
- Fig. 5 is a schematic diagram of a preferred embodiment of a high voltage switching circuit (HV switch) 90 practicable in the present HV depolarizing power supply 10. As shown in Fig. 5, the HV switching circuit 90 provides a high bias voltage at its HV voltage output 92 in response to the presence of an active high voltage enable signal at its signal input (HV-EN) 94.
- HV switch high voltage switching circuit
- the HV switching circuit 90 provides a -5V DC bias at its voltage output 92.
- an FET sub-circuit in the H ⁇ [ 3witch 90 is cuts off the high voltage bias voltage.
- the bias voltage at the HV voltage output 92 is pulled down to -5 V, causing a reversal of the biasing current in the Cadmium-Telluride photo-conductor material. Reversing the biasing current in the photo-conductor material bleeds off the trapped electrical charge and de-polarizes the detector unit.
- the Q5 FET 100 is connected in series with the HV bias. It has a pull-up to the HV bias, resulting in an output of HV-Vgs in the steady-state. During the ramp-up, current flowing through resistor 102 causes a voltage differential.
- Q7 transistor 104 pulls the FET gate 100 closed when the set current limit is exceeded. This results in a triangular waveform for the HV bias voltage.
- the Q3 FET 106 pulls the Q5 FET gate 100 down to -5V when open. This closes Q5 FET 100 and reverses the bias voltage.
- Q3 FET 106 has a similar current-limiter circuit as Q5 FET 100, resulting in a linear down slope. Opening and closing Q3 FET 106 enables controlling the bias voltage. The voltage of the
- Q3 FET gate 106 is controlled by the high voltage enable signal at the signal input 94.
- the high voltage enable signal at the signal input 94 is active (enabled or “pulled high"), an indicator LED 110 was lit.
- the high voltage switching circuit 90 can be operated at a much higher switching frequency than in the illustrated embodiment. There is about a 50 ⁇ sec initial delay between low-to-high bias voltage transition and the beginning of the HV bias voltage ramp. The delay is likely caused by the large resistors used in pull-up circuit and the FET gate capacitance. Modification of the characteristics of these components could lessen the delay. It was intended in the present embodiment that the imaging system operate at about 50 frames per second, thus enabling dynamic imaging, the X-raying of moving objects.
- Figures 6 - 9 display the ramp-up and ramp-down waveforms of an actual Cd-Te semiconductor detector unit.
- the unit under testing had four 1 cm 2 .
- a DIC 100 has a 25 cm 2 area.
- the falling slope exhibits undershoot, which appears to originate from the Cd-Te detector unit.
- the undershoot amplitude is limited by the power supply 10 current limiter of the HV switch 90.
- the illustrated signal is almost a perfect 5mA current-limited slope until the undershoot peaks.
- Rise time is about 200 ⁇ sec
- fall time is about 250 ⁇ sec.
- the detector takes several milliseconds to stabilize after the state change. Therefore, the ability of the power supply to ramp the high voltage is not the limiting factor in the depolarization process.
- the figures demonstrate the flat slope produced by a pure capacitive load and the power supply current limiter.
- the undershoot exhibited by the falling slope of the Cd-Te detector unit is not present with a capac
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03813376.5A EP1570299B1 (en) | 2002-12-13 | 2003-12-11 | Switching/depolarizing power supply for a radiation imaging device |
US10/537,531 US7154100B2 (en) | 2002-12-13 | 2003-12-11 | Switching/depolarizing power supply for a radiation imaging device |
JP2004560773A JP2006513406A (en) | 2002-12-13 | 2003-12-11 | Switching / depolarizing power supply for radiation imaging device |
AU2003296500A AU2003296500A1 (en) | 2002-12-13 | 2003-12-11 | Switching/depolarizing power supply for a radiation imaging device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US43345702P | 2002-12-13 | 2002-12-13 | |
US60/433,457 | 2002-12-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2004055550A1 true WO2004055550A1 (en) | 2004-07-01 |
Family
ID=32595193
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2003/039432 WO2004055550A1 (en) | 2002-12-13 | 2003-12-11 | Switching/depolarizing power supply for a radiation imaging device |
Country Status (6)
Country | Link |
---|---|
US (1) | US7154100B2 (en) |
EP (1) | EP1570299B1 (en) |
JP (1) | JP2006513406A (en) |
KR (1) | KR100622557B1 (en) |
AU (1) | AU2003296500A1 (en) |
WO (1) | WO2004055550A1 (en) |
Cited By (10)
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US7154100B2 (en) | 2002-12-13 | 2006-12-26 | Konstantinos Spartiotis | Switching/depolarizing power supply for a radiation imaging device |
WO2007110465A1 (en) | 2006-03-27 | 2007-10-04 | Oy Ajat Ltd. | Dental extraoral x-ray imaging system and method |
US7514689B2 (en) * | 2004-12-28 | 2009-04-07 | Hitachi, Ltd. | Radiological imaging apparatus with current regulated units, imaging apparatus with bed, imaging apparatus with opening and closing units, and power supply unit |
WO2009136745A3 (en) * | 2008-05-09 | 2010-02-18 | (주)디알텍 | High-voltage power supply apparatus and method for use with digital flat panel x-ray detectors |
US7676022B2 (en) | 2005-05-02 | 2010-03-09 | Oy Ajat Ltd. | Extra-oral digital panoramic dental x-ray imaging system |
US7715526B2 (en) | 2008-03-13 | 2010-05-11 | Oy Ajat Limited | Single sensor multi-functional dental extra-oral x-ray imaging system and method |
US7715525B2 (en) | 2008-03-13 | 2010-05-11 | Oy Ajat Limited | Single sensor multi-functional dental extra-oral x-ray imaging system and method |
US7742560B2 (en) | 2005-05-02 | 2010-06-22 | Oy Ajat Ltd. | Radiation imaging device with irregular rectangular shape and extraoral dental imaging system therefrom |
US8295432B2 (en) | 2005-05-02 | 2012-10-23 | Oy Ajat Ltd | Radiation imaging device with irregular rectangular shape and extraoral dental imaging system therefrom |
US9332950B2 (en) | 2005-05-02 | 2016-05-10 | Oy Ajat Ltd. | Radiation imaging device with irregular rectangular shape and extraoral dental imaging system therefrom |
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US7312458B2 (en) * | 2005-06-22 | 2007-12-25 | General Electric Company | Method and apparatus for reducing polarization within an imaging device |
US7932693B2 (en) * | 2005-07-07 | 2011-04-26 | Eaton Corporation | System and method of controlling power to a non-motor load |
JP2007214226A (en) * | 2006-02-08 | 2007-08-23 | Oki Electric Ind Co Ltd | Electrostatic discharge protection circuit |
WO2009101772A1 (en) * | 2008-02-12 | 2009-08-20 | Ishida Co., Ltd. | X-ray inspection apparatus |
JP4560101B2 (en) * | 2008-03-31 | 2010-10-13 | 株式会社日立製作所 | Radiation measuring device and nuclear medicine diagnostic device |
WO2009122665A1 (en) * | 2008-04-01 | 2009-10-08 | 株式会社イシダ | X-ray inspection device |
US7679062B2 (en) * | 2008-04-08 | 2010-03-16 | Carestream Health, Inc. | Power supply for portable radiographic detector |
JP4747195B2 (en) * | 2008-11-19 | 2011-08-17 | 株式会社日立製作所 | Radiation measurement circuit, nuclear medicine diagnostic device, radiation measurement method |
JP5009330B2 (en) * | 2009-03-26 | 2012-08-22 | 住友重機械工業株式会社 | Radiation detector |
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US9937397B2 (en) | 2014-03-14 | 2018-04-10 | Acushnet Company | Golf club with improved weight distribution |
US9421421B2 (en) | 2014-03-14 | 2016-08-23 | Acushnet Company | Golf club with improved weight distribution |
KR101725063B1 (en) | 2015-06-25 | 2017-04-12 | 주식회사 뷰웍스 | Readout circuit of x-ray detector |
US9616298B1 (en) | 2015-09-24 | 2017-04-11 | Acushnet Company | Golf club with improved weighting |
WO2019019054A1 (en) * | 2017-07-26 | 2019-01-31 | Shenzhen Xpectvision Technology Co., Ltd. | Radiation detector with built-in depolarization device |
KR20220008618A (en) | 2020-07-14 | 2022-01-21 | 삼성전자주식회사 | Camera module and imaging apparatus comprising thereof |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4133025A (en) * | 1977-09-28 | 1979-01-02 | Motorola, Inc. | Pulse width modulator symmetry correction circuit and method thereof |
US4255659A (en) * | 1978-03-27 | 1981-03-10 | The Regents Of The University Of California | Semiconductor radiation detector |
US5151598A (en) | 1987-03-17 | 1992-09-29 | Neoprobe Corporation | Detector and localizer for low energy radiation emissions |
JPH06121793A (en) | 1992-10-13 | 1994-05-06 | Japan Energy Corp | Radiation ct |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2574341B2 (en) * | 1987-11-25 | 1997-01-22 | 松下電器産業株式会社 | Multi-channel semiconductor radiation detector |
JP3151487B2 (en) * | 1992-06-23 | 2001-04-03 | 株式会社アクロラド | Radiation detection method |
JPH0712947A (en) * | 1993-06-21 | 1995-01-17 | Ge Yokogawa Medical Syst Ltd | Semiconductor radiation detector |
JP3066944B2 (en) * | 1993-12-27 | 2000-07-17 | キヤノン株式会社 | Photoelectric conversion device, driving method thereof, and system having the same |
JP2003294844A (en) * | 2002-04-03 | 2003-10-15 | Hitachi Ltd | X-ray sensor signal processing circuit and x-ray ct apparatus |
EP1570299B1 (en) | 2002-12-13 | 2014-04-16 | Oy Ajat Ltd. | Switching/depolarizing power supply for a radiation imaging device |
-
2003
- 2003-12-11 EP EP03813376.5A patent/EP1570299B1/en not_active Expired - Lifetime
- 2003-12-11 AU AU2003296500A patent/AU2003296500A1/en not_active Abandoned
- 2003-12-11 US US10/537,531 patent/US7154100B2/en not_active Expired - Lifetime
- 2003-12-11 WO PCT/US2003/039432 patent/WO2004055550A1/en active Application Filing
- 2003-12-11 KR KR1020057010400A patent/KR100622557B1/en active IP Right Grant
- 2003-12-11 JP JP2004560773A patent/JP2006513406A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4133025A (en) * | 1977-09-28 | 1979-01-02 | Motorola, Inc. | Pulse width modulator symmetry correction circuit and method thereof |
US4255659A (en) * | 1978-03-27 | 1981-03-10 | The Regents Of The University Of California | Semiconductor radiation detector |
US5151598A (en) | 1987-03-17 | 1992-09-29 | Neoprobe Corporation | Detector and localizer for low energy radiation emissions |
JPH06121793A (en) | 1992-10-13 | 1994-05-06 | Japan Energy Corp | Radiation ct |
Non-Patent Citations (1)
Title |
---|
See also references of EP1570299A4 * |
Cited By (24)
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US7154100B2 (en) | 2002-12-13 | 2006-12-26 | Konstantinos Spartiotis | Switching/depolarizing power supply for a radiation imaging device |
US7514689B2 (en) * | 2004-12-28 | 2009-04-07 | Hitachi, Ltd. | Radiological imaging apparatus with current regulated units, imaging apparatus with bed, imaging apparatus with opening and closing units, and power supply unit |
US7977647B2 (en) | 2004-12-28 | 2011-07-12 | Hitachi, Ltd. | Radiological imaging apparatus |
US9332950B2 (en) | 2005-05-02 | 2016-05-10 | Oy Ajat Ltd. | Radiation imaging device with irregular rectangular shape and extraoral dental imaging system therefrom |
US7336763B2 (en) | 2005-05-02 | 2008-02-26 | Oy Ajat Ltd | Dental extra-oral x-ray imaging system and method |
US9050039B2 (en) | 2005-05-02 | 2015-06-09 | Oy Ajat Ltd. | Radiation imaging device with irregular rectangular shape and extraoral dental imaging system therefrom |
US7676022B2 (en) | 2005-05-02 | 2010-03-09 | Oy Ajat Ltd. | Extra-oral digital panoramic dental x-ray imaging system |
US8693624B2 (en) | 2005-05-02 | 2014-04-08 | Oy Ajat Ltd. | Extra-oral digital panoramic dental X-ray imaging system |
US8532254B2 (en) | 2005-05-02 | 2013-09-10 | Oy Ajat Ltd | Extra-oral digital panoramic dental X-ray imaging system |
US7742560B2 (en) | 2005-05-02 | 2010-06-22 | Oy Ajat Ltd. | Radiation imaging device with irregular rectangular shape and extraoral dental imaging system therefrom |
US8295432B2 (en) | 2005-05-02 | 2012-10-23 | Oy Ajat Ltd | Radiation imaging device with irregular rectangular shape and extraoral dental imaging system therefrom |
US7916833B2 (en) | 2005-05-02 | 2011-03-29 | Oy Ajat Ltd. | Extra-oral digital panoramic dental X-ray imaging system |
EP2223652A1 (en) | 2006-03-27 | 2010-09-01 | Oy Ajat Ltd. | Dental extraoral x-ray imaging system and method |
EP2223653A1 (en) | 2006-03-27 | 2010-09-01 | Oy Ajat Ltd. | Dental extraoral x-ray imaging system and method |
EP2223651A1 (en) | 2006-03-27 | 2010-09-01 | Oy Ajat Ltd. | Dental extraoral x-ray imaging system and method |
EP2221003A1 (en) | 2006-03-27 | 2010-08-25 | Oy Ajat Ltd. | Dental extraoral x-ray imaging system and method |
WO2007110465A1 (en) | 2006-03-27 | 2007-10-04 | Oy Ajat Ltd. | Dental extraoral x-ray imaging system and method |
EP2223653B2 (en) † | 2006-03-27 | 2018-08-08 | Oy Ajat Ltd. | Dental extraoral x-ray imaging system and method |
US7715525B2 (en) | 2008-03-13 | 2010-05-11 | Oy Ajat Limited | Single sensor multi-functional dental extra-oral x-ray imaging system and method |
US7715526B2 (en) | 2008-03-13 | 2010-05-11 | Oy Ajat Limited | Single sensor multi-functional dental extra-oral x-ray imaging system and method |
KR100998313B1 (en) * | 2008-05-09 | 2010-12-06 | 주식회사 디알텍 | Apparatus and method of providing high voltage power supply to digital X-ray detector |
EP2286726A2 (en) * | 2008-05-09 | 2011-02-23 | Drtech Corp. | High-voltage power supply apparatus and method for use with digital flat panel x-ray detectors |
EP2286726A4 (en) * | 2008-05-09 | 2011-12-14 | Drtech Corp | High-voltage power supply apparatus and method for use with digital flat panel x-ray detectors |
WO2009136745A3 (en) * | 2008-05-09 | 2010-02-18 | (주)디알텍 | High-voltage power supply apparatus and method for use with digital flat panel x-ray detectors |
Also Published As
Publication number | Publication date |
---|---|
EP1570299B1 (en) | 2014-04-16 |
US20060097180A1 (en) | 2006-05-11 |
US7154100B2 (en) | 2006-12-26 |
EP1570299A1 (en) | 2005-09-07 |
AU2003296500A1 (en) | 2004-07-09 |
EP1570299A4 (en) | 2010-07-21 |
KR20050084209A (en) | 2005-08-26 |
JP2006513406A (en) | 2006-04-20 |
KR100622557B1 (en) | 2006-09-13 |
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