WO2004017016A3 - Vorrichtung und verfahren zum vermessen der dimension eines körpers - Google Patents
Vorrichtung und verfahren zum vermessen der dimension eines körpers Download PDFInfo
- Publication number
- WO2004017016A3 WO2004017016A3 PCT/EP2003/008648 EP0308648W WO2004017016A3 WO 2004017016 A3 WO2004017016 A3 WO 2004017016A3 EP 0308648 W EP0308648 W EP 0308648W WO 2004017016 A3 WO2004017016 A3 WO 2004017016A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- radiation
- axis
- sensor device
- plane
- dimensions
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2003281994A AU2003281994A1 (en) | 2003-06-24 | 2003-08-05 | Device and method for measuring the dimensions of a body |
EP03773600A EP1639312A2 (de) | 2003-06-24 | 2003-08-05 | VORRICHTUNG UND VERFAHREN ZUM VERMESSEN DER DIMENSION EINES KÖRPERS |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10328537.7 | 2003-06-24 | ||
DE10328537.7A DE10328537B4 (de) | 2003-06-24 | 2003-06-24 | Vorrichtung und Verfahren zum Vermessen der Dimension eines Körpers |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004017016A2 WO2004017016A2 (de) | 2004-02-26 |
WO2004017016A3 true WO2004017016A3 (de) | 2004-09-30 |
Family
ID=29432768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2003/008648 WO2004017016A2 (de) | 2003-06-24 | 2003-08-05 | Vorrichtung und verfahren zum vermessen der dimension eines körpers |
Country Status (5)
Country | Link |
---|---|
US (1) | US7245386B2 (de) |
EP (1) | EP1639312A2 (de) |
AU (1) | AU2003281994A1 (de) |
DE (1) | DE10328537B4 (de) |
WO (1) | WO2004017016A2 (de) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004052508B4 (de) * | 2004-10-21 | 2006-08-03 | Pixargus Gmbh | System und Verfahren zum Vermessen und zum Überwachen der Oberfläche eines Körpers |
DE102006045101A1 (de) * | 2006-09-21 | 2008-04-03 | Sobotta, Andreas, Dipl.-Ing. | Verfahren zur Bestimmung einer Ortskoordinate eines Punkts an einem aus einem Extrusionswerkzeug dringenden Strang, sowie eines Qualitätsmerkmals eines Extrusionswerkzeugs, einer Extrusionsvorrichtung oder eines Materials zur Herstellung eines Profils |
US8355042B2 (en) | 2008-10-16 | 2013-01-15 | Spatial Cam Llc | Controller in a camera for creating a panoramic image |
DE102009009393A1 (de) * | 2009-02-18 | 2010-08-19 | Pixargus Gmbh | Vorrichtung und Verfahren zum Vermessen eines Körpers |
WO2011032733A1 (en) * | 2009-09-17 | 2011-03-24 | Komax Holding Ag | Vision system and method for inspecting solar cell strings |
DE102010021260A1 (de) | 2010-05-21 | 2011-11-24 | Vereinigung zur Förderung des Instituts für Kunststoffverarbeitung in Industrie und Handwerk an der Rhein.-Westf. Technischen Hochschule Aachen e.V. | Verfahren und System zur Qualitätskontrolle |
EP2485010B1 (de) * | 2011-02-03 | 2014-08-06 | DMA S.r.l. | Verfahren zur Messung eines Schienenprofils mittels optischer Triangulation und entsprechendes Messsystem |
SE537186C2 (sv) * | 2011-02-17 | 2015-02-24 | Komatsu Forest Ab | Mätanordning för diametermätning av timmerstammar vid skördaraggregat |
WO2016109563A1 (en) | 2014-12-31 | 2016-07-07 | Wal-Mart Stores, Inc. | System and method for monitoring gas emission of perishable products |
US10466111B2 (en) | 2016-05-05 | 2019-11-05 | Walmart Apollo, Llc | Systems and methods for monitoring temperature or movement of merchandise |
CA3034397A1 (en) * | 2016-09-19 | 2018-03-22 | Wal-Mart Stores, Inc. | Secure enclosure system and associated methods |
JP6921578B2 (ja) * | 2017-03-28 | 2021-08-18 | 株式会社東京精密 | 表面異物検出装置およびそれを用いた表面異物検出方法 |
DE102017208485A1 (de) * | 2017-05-19 | 2018-11-22 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Anordnung und Verfahren zur berührungslosen Entfernungsbestimmung nach Art des Lichtschnittverfahrens |
WO2018217280A1 (en) | 2017-05-23 | 2018-11-29 | Walmart Apollo, Llc | Automated inspection system |
US11448632B2 (en) | 2018-03-19 | 2022-09-20 | Walmart Apollo, Llc | System and method for the determination of produce shelf life |
FR3084147B1 (fr) * | 2018-07-19 | 2021-06-11 | Eberle | Procede de controle de la qualite et/ou de mesure des parametres dimensionnels de profiles, dispositif permettant la mise en œuvre dudit procede et ligne de production comprenant un tel dispositif |
US11393082B2 (en) | 2018-07-26 | 2022-07-19 | Walmart Apollo, Llc | System and method for produce detection and classification |
US11715059B2 (en) | 2018-10-12 | 2023-08-01 | Walmart Apollo, Llc | Systems and methods for condition compliance |
WO2020106332A1 (en) | 2018-11-20 | 2020-05-28 | Walmart Apollo, Llc | Systems and methods for assessing products |
CN111351441A (zh) * | 2018-12-20 | 2020-06-30 | 大连因特视智能传感科技有限公司 | 基于视觉的厚度测量设备及方法 |
CN112577445B (zh) * | 2020-12-18 | 2021-08-03 | 深圳市泽峰光电科技有限公司 | 一种旋转光栅的原木端面轮廓提取方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB395649A (en) * | 1932-03-10 | 1933-07-20 | Gustav Schmaltz | Improvements in methods and apparatus for microscopically examining the profiles of surfaces |
US4113389A (en) * | 1976-04-19 | 1978-09-12 | Morton Kaye | Optical measurement system |
EP0330429A2 (de) * | 1988-02-26 | 1989-08-30 | National Research Council Of Canada | Verfahren und Apparat zur Ueberwachung des Oberflächenprofils eines Werkstückes |
US5015867A (en) * | 1989-08-30 | 1991-05-14 | Ppg Industries, Inc. | Apparatus and methods for measuring the diameter of a moving elongated material |
US6064759A (en) * | 1996-11-08 | 2000-05-16 | Buckley; B. Shawn | Computer aided inspection machine |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1449044A (en) * | 1972-11-14 | 1976-09-08 | Kongsberg Vapenfab As | Procedures and apparatuses for determining the shapes of surfaces |
US3806253A (en) * | 1972-12-13 | 1974-04-23 | Weyerhaeuser Co | Sweep measuring scheme |
US4373816A (en) * | 1981-01-09 | 1983-02-15 | Morvue, Inc. | Scanning beam optical position determining apparatus and method |
DE3204086A1 (de) * | 1982-02-06 | 1983-08-11 | Ibm Deutschland Gmbh, 7000 Stuttgart | Vorrichtung zur automatischen optischen beschaffenheitspruefung |
US4645348A (en) * | 1983-09-01 | 1987-02-24 | Perceptron, Inc. | Sensor-illumination system for use in three-dimensional measurement of objects and assemblies of objects |
US4846577A (en) * | 1987-04-30 | 1989-07-11 | Lbp Partnership | Optical means for making measurements of surface contours |
US4938599A (en) * | 1988-06-07 | 1990-07-03 | Contrologic, Inc. | Non-contact optical gauge |
GB9110570D0 (en) * | 1991-05-16 | 1991-07-03 | Cruickshank John S | Measuring,inspection and comparative analysis apparatus for moving object profiles |
JP3417222B2 (ja) * | 1996-08-07 | 2003-06-16 | 松下電器産業株式会社 | 実時間レンジファインダ |
WO1998051993A1 (fr) * | 1997-05-16 | 1998-11-19 | Olympus Optical Co., Ltd. | Dispositif servant a mesurer une hauteur |
US6415051B1 (en) * | 1999-06-24 | 2002-07-02 | Geometrix, Inc. | Generating 3-D models using a manually operated structured light source |
DE10136809A1 (de) * | 2001-07-27 | 2003-02-13 | Schindler & Wagner Gmbh & Co | Verfahren zum Zerteilen von Produktlaiben sowie Vorrichtung zu seiner Durchführung |
EP1302742B1 (de) * | 2001-10-16 | 2016-03-30 | Datalogic IP Tech S.r.l. | Optoelektronisches Rastersystem zur Messung der Form und/oder des Volumens von Körpern |
-
2003
- 2003-06-24 DE DE10328537.7A patent/DE10328537B4/de not_active Expired - Fee Related
- 2003-08-05 WO PCT/EP2003/008648 patent/WO2004017016A2/de active Application Filing
- 2003-08-05 AU AU2003281994A patent/AU2003281994A1/en not_active Abandoned
- 2003-08-05 EP EP03773600A patent/EP1639312A2/de not_active Withdrawn
-
2004
- 2004-06-23 US US10/874,841 patent/US7245386B2/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB395649A (en) * | 1932-03-10 | 1933-07-20 | Gustav Schmaltz | Improvements in methods and apparatus for microscopically examining the profiles of surfaces |
US4113389A (en) * | 1976-04-19 | 1978-09-12 | Morton Kaye | Optical measurement system |
EP0330429A2 (de) * | 1988-02-26 | 1989-08-30 | National Research Council Of Canada | Verfahren und Apparat zur Ueberwachung des Oberflächenprofils eines Werkstückes |
US5015867A (en) * | 1989-08-30 | 1991-05-14 | Ppg Industries, Inc. | Apparatus and methods for measuring the diameter of a moving elongated material |
US6064759A (en) * | 1996-11-08 | 2000-05-16 | Buckley; B. Shawn | Computer aided inspection machine |
Also Published As
Publication number | Publication date |
---|---|
WO2004017016A2 (de) | 2004-02-26 |
DE10328537B4 (de) | 2015-03-26 |
US7245386B2 (en) | 2007-07-17 |
AU2003281994A1 (en) | 2004-03-03 |
AU2003281994A8 (en) | 2004-03-03 |
US20060017935A1 (en) | 2006-01-26 |
EP1639312A2 (de) | 2006-03-29 |
DE10328537A1 (de) | 2003-12-11 |
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