Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
  • G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
  • G01C19/58—Turn-sensitive devices without moving masses
  • G01C19/64—Gyrometers using the Sagnac effect, i.e. rotation-induced shifts between counter-rotating electromagnetic beams
  • G01C19/66—Ring laser gyrometers
  • G01C19/661—Ring laser gyrometers details
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
  • H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
  • H01S3/08—Construction or shape of optical resonators or components thereof
  • H01S3/081—Construction or shape of optical resonators or components thereof comprising three or more reflectors
  • H01S3/083—Ring lasers
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
  • H01S3/02—Constructional details
  • H01S3/03—Constructional details of gas laser discharge tubes
  • H01S3/034—Optical devices within, or forming part of, the tube, e.g. windows, mirrors
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
  • H01S3/02—Constructional details
  • H01S3/03—Constructional details of gas laser discharge tubes
  • H01S3/034—Optical devices within, or forming part of, the tube, e.g. windows, mirrors
  • H01S3/0346—Protection of windows or mirrors against deleterious effects
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
  • H01S3/02—Constructional details
  • H01S3/03—Constructional details of gas laser discharge tubes
  • H01S3/038—Electrodes, e.g. special shape, configuration or composition
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
  • H01S3/02—Constructional details
  • H01S3/03—Constructional details of gas laser discharge tubes
  • H01S3/038—Electrodes, e.g. special shape, configuration or composition
  • H01S3/0388—Compositions, materials or coatings
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
  • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
  • H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
  • H01S3/08—Construction or shape of optical resonators or components thereof
  • H01S3/081—Construction or shape of optical resonators or components thereof comprising three or more reflectors
  • H01S3/083—Ring lasers
  • H01S3/0835—Gas ring lasers

Definitions

• the present invention relates generally to ring laser gyroscopes, and more particularly, relates to a method of preventing electrode seal degradation.
• a ring laser gyroscope detects and measures angular rates by measuring the frequency difference between two counter-rotating laser beams according to the Sagnac effect. The two laser beams simultaneously circulate in the cavity of the gyroscope.
• Gyroscopes are used in navigation, stabilization, guidance, and control applications and are located in aircraft, boats, tanks, pipelines, and missiles. The applications generally fall within one of two categories, single or short term use, and continuous or long term use.
• An example of a single use application of a ring laser gyroscope is a missile application. The gyroscope guides the missile to its target and is destroyed upon impact.
• This type of gyroscope has an operational lifetime that may be measured in minutes and is not exposed to the harsh operating conditions that the continuous use gyroscopes are.
• the single use ring laser gyroscopes are generally smaller and manufactured with different materials than continuous use gyroscopes.
• An example of a continuous use application of a ring laser gyroscope is an aircraft application.
• the operational lifetime of a ring laser gyroscope on a commercial airplane may be ten to twenty years.
• the gyroscope is exposed to extreme temperature and pressure fluctuations over an extended period of time.
• the frame of this type of gyroscope must be manufactured using materials that are resistant to expansion over a wide temperature range.
• One such material is Zerodur, a glass ceramic material with an extremely low co-efficient of thermal expansion.
• Indium is frequently chosen as a seal material because of its unique properties of adhering to both ceramics and metals, and of not losing its vacuum seal in the presence of thermal expansion. For the proper operation of the gyroscope, this seal must not degrade allowing the lasing gas to escape. Therefore, there is a need to prevent the degradation of the seal.
• the electrode ring may be made of a thin sheet of copper attached with a conducting adhesive, a thin metal film applied by vacuum deposition, a machined metal alloy attached by mechanical means, or conductive ink brushed onto the frame surface.
• This method adds a dielectric barrier material between the gyroscope frame and the cathode as seen in Fig. 2.
• the dielectric barrier material layer reduces the electric field formed in the gyroscope frame, and thus reduces the ion migration.
• the dielectric barrier may be formed by vapor deposition or welding a sheet of material between the cathode and the frame. It would be desirable to prevent an ion layer from forming on an electrode seal without modifying the manufacturing process of a ring laser gyroscope.
• An exemplary embodiment is described for using current control biasing to protect electrode seals on a ring laser gyroscope.
• the seals are located between the frame of the gyroscope and each of the electrodes.
• ions in the frame will generally migrate towards the lowest electrical potential. If one of the electrodes is at the lowest electrical potential, the ions will form a layer on the electrode seal causing it to degrade.
• the mounting structure By providing a positive supply voltage and locating the current control on the non-ground side of the power supply, the mounting structure will be at the lowest electrical potential.
• Fig. 1 is a plan view of a technique employing an electrode ring
• Fig. 2 is a plan view of a technique employing a dielectric barrier material
• Fig. 3 is a schematic of a ring laser gyroscope system showing the location of a typical current control with respect to ground
• Fig. 4 is a schematic of a ring laser gyroscope system showing the location of the current control with respect to ground, according to an exemplary embodiment of the present invention
• Fig. 5 is a schematic of a ring laser gyroscope system showing exemplary voltage values, according to an exemplary embodiment of the present invention
• Fig. 6 is a schematic of a ring laser gyroscope system showing the location of the current control with respect to ground, according to an exemplary embodiment of the present invention.
• Fig. 7 is a schematic of a ring laser gyroscope system showing a block diagram of an exemplary current control, according to an exemplary embodiment of the present invention.
• Fig. 3 provides a schematic of a ring laser gyroscope system 100, which includes a ring laser gyroscope 118, a current control 102, a power supply 104, and a mounting structure 108.
• the ring laser gyroscope 118 is composed of a frame 114, electrodes 106, 112, electrode seals 110, a cavity, and mirrors.
• the frame 114 may be constructed of a glass ceramic such as Zerodur, which has an extremely low coefficient of thermal expansion. Other frame materials may also be suitable.
• the electrodes located on the frame 114 include one cathode 106 and two anodes 112; however, other configurations are possible.
• the ring laser gyroscope 118 could have two cathodes 106 and one anode 112.
• the electrode seals 110 are located between the frame 114 and each of the electrodes 106, 112.
• the electrode seals 110 in an exemplary embodiment are constructed of indium. Other materials, such as tin, lead or alloys made with indium, tin or lead, may also be used to construct the seals.
• the cavity of the gyroscope 118 is located within the frame 114. Mirrors are used to direct the laser beams around the cavity. The cavity and mirrors are not depicted in Fig. 3.
• the power supply 104 may be located between the current control 102 and the cathode 106.
• the power supply 104 may have one side that is electrically connected to ground 116 and another side that is electrically connected to a non-ground side.
• the current control 102 is connected to the anodes 112 on the frame 114 of the ring laser gyroscope 118 through ballast resistors 120.
• the current control 102 may be used to hold the electrical current entering the anodes 112 to a constant level.
• Ballast resistors 120 are selected based on the size of the ring laser gyroscope 118 and the type of lasing gas employed, and are used to minimize the oscillations of the lasing gas.
• the frame 114 is mounted on the mounting structure 108.
• the mounting structure 108 in an exemplary embodiment is a dither motor. Other mounting structures may be employed.
• Fig. 3 shows a schematic representation of a typical method of powering the ring laser gyroscope system 100.
• the power supply 104 applies a negative voltage to the gyroscope 118.
• a typical supply value is -500 volts, but other negative voltages may be used.
• the current control 102 is connected to the ground 116 side of the power supply 104. This allows the current control 102 to stay at or near ground potential to minimize current leakage, which may cause a current imbalance.
• the cathode 106 may become negatively biased with respect to the mounting structure 108. Ions may migrate to the cathode 106 if it is at the lowest electrical potential of the ring laser gyroscope system 100.
• the ions may form a layer on the electrode seal 110 associated with the cathode 106, which may cause the seal 110 to degrade over time.
• Fig. 4 is a schematic of an exemplary embodiment of powering a ring laser gyroscope system 200.
• the ring laser gyroscope system 200 is comprised of a ring laser gyroscope 218, a current control 202, a power supply 204, and a mounting structure 208.
• the ring laser gyroscope 218 and the mounting structure 208 may be substantially the same as the ring laser gyroscope 118 and the mounting structure 108 of the ring laser gyroscope system 100.
• the ring laser gyroscope 218 is composed of a frame 214, a cathode 206, two anodes 212, electrode seals 210, a cavity, and mirrors.
• the electrode seals 210 are located between the frame 214 and each of the cathode 206 and anodes 212.
• the cavity of the gyroscope 218 is located within the frame 214. Mirrors are used to direct the laser beams around the cavity. The cavity and mirrors are not depicted in Fig. 4.
• the power supply 204 is located between the current control 202 and the cathode 206. A ground 216 side of the power supply 204 is connected to the cathode 206 and a non-ground side is connected to the current control 202.
• the current control 202 is connected to anodes 212 on the ring laser gyroscope 218 through ballast resistors 220.
• a resistance value is selected based on the size of the ring laser gyroscope 218 and the type of lasing gas employed.
• Fig. 5 is a schematic of an exemplary embodiment showing exemplary voltage values.
• the power supply 204 provides a positive supply voltage.
• a typical supply value is +600 volts; however, the supply value is based on the size of the ring laser gyroscope 218 and the type of lasing gas employed. Larger gyroscopes 218 and higher lasing gas pressures may require a higher supply value.
• both the mounting structure 208 and the cathode 206 may be at the lowest electrical potential of the ring laser gyroscope system 200. Ion diffusion may now be directed towards both the mounting structure 208 and the cathode 106 and away from the anodes 112. Because the impedance between the anodes 212 and the mounting structure 208 is smaller than the impedance between the anodes 212 and the cathode 206, the ions will reach the mounting structure 208 prior to reaching the cathode 206. Therefore, substantially fewer ions will migrate to the cathode 206.
• Ion degradation of the electrode seals 210 may be reduced, increasing the lifetime of the seals 210, and thereby increasing the operational lifetime of the gyroscope 218.
• the ions migrate towards the mounting structure 208.
• the mounting structure 208 may not be damaged by ion accumulation during the operational lifetime of the gyroscope 218. It is unlikely that the mounting structure 208 will form a part of the cavity containing the lasing gas; therefore, while a leak into the cavity and contamination of the lasing gas may be a failure mode of the electrode seals 210, it is not a typical failure mode of the mounting structure 208.
• Fig. 6 is a schematic of an exemplary embodiment of a ring laser gyroscope system 300.
• the ring laser gyroscope system 300 is substantially the same as ring laser system 200 with the addition of a cathode resistor 322.
• the cathode 306 may be at a higher electrical potential than the mounting structure 308.
• the mounting structure 308 may be at the lowest electrical potential the system 300. Therefore, ion migration may be directed towards the mounting structure 308. Ion degradation of the electrode seals 310 may be further reduced, increasing the lifetime of the seals 310, and thereby increasing the operational lifetime of the gyroscope 318. No modifications to the manufacturing process of the ring laser gyroscope 318 are necessary and the mounting structure may not be damaged by ion accumulation during the operational lifetime of the gyroscope 318.
• Fig. 7 is a schematic of an exemplary ring laser gyroscope system 400 showing a block diagram of an exemplary current control 402.
• Current control 402 is substantially the same as current control 202 in ring laser gyroscope system 200.
• Current control 402 may include a low voltage control and comparator circuit 406, a low voltage supply 408, and a high voltage control circuit 410.
• the low voltage supply 408 may provide low voltage power to both the low voltage control and comparator circuit 406 and the high voltage control circuit 410.
• the low voltage supply 408 may also be electrically connected to the non-ground side of power supply 404.
• Power supply 404 is substantially the same as power supply 204 in ring laser gyroscope system 200.
• the low voltage control and comparator circuit 406 compares the amount of current entering the ring laser gyroscope 412 with a reference value and sends a signal to the high voltage control circuit 410.
• the high voltage control circuit 410 substantially maintains a constant current entering into the ring laser gyroscope 412.
• Ring laser gyroscope 412 is substantially the same as ring laser gyroscope 218 in ring laser gyroscope system 200.
• Other current control designs may be used, such as designs similar to those outlined in U.S. Patent No. 5,414,727, "Active Current Control Apparatus," and U.S.
• Patent No. 5,271,027 "Gas Discharge Device Current Control Circuit,” which are both assigned to the same assignee as the present invention.
• Ring laser gyroscopes have previously been powered with positive supply voltages in single or limited use applications in which the gyroscope has a very short operational lifetime. These applications include missile guidance systems in which the operational lifetime of the gyroscope may be measured in minutes. Ion degradation of the elecfrode seals is not an operational problem in these applications because the gyroscope does not operate for a long enough time to allow the ions to form a layer.
• the ring laser gyroscopes that are used in single or limited use applications may employ different types of electrode seal material and/or frame material because these applications may not require the gyroscope to operate in conditions in which thermal expansion is a critical factor.
• frit seals may be used. These seals experience less ion degradation because the bonding energy of a frit seal is much higher than that of an indium seal.
• a frame material such as BK7, a hard borosilicate crown glass, may be used. The ions produced from this type of frame material have a slower diffusion rate, which would increase the time it would take to experience an ion degradation problem.
• a gyroscope with a high-temperature application and a life expectancy of ten years may encounter an electrode seal degradation problem after two to three years of gyroscope operation. Accelerated operational life tests may demonstrate a three to four fold increase of the operational lifetime of the electrode seals by reducing the diffusion of the ions to the seals. For example, the operational lifetime of the electrode seals may increase from 5,000 hours to 15,000 hours. While the embodiments have been described for ring laser gyroscope operations, they may also apply to gyroscope manufacturing.
• the electrode seals may be protected from ion degradation during burn-in testing of the frame prior to the sale of the gyroscope. Burn- in testing is performed at elevated temperatures to identify defects prior to delivery.
• Various embodiments of the present invention can be carried out with a variety of different equipment and devices without departing from the scope of the invention itself. It is also understood that this invention applies to other materials that may be impacted by ion migration as well. For example, current confrol biasing may protect the epoxy bond between the path length control (PLC) drivers and the transducer mirrors.
• PLC path length control

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• Physics & Mathematics (AREA)
• Engineering & Computer Science (AREA)
• Electromagnetism (AREA)
• Optics & Photonics (AREA)
• Power Engineering (AREA)
• General Physics & Mathematics (AREA)
• Radar, Positioning & Navigation (AREA)
• Remote Sensing (AREA)
• Plasma & Fusion (AREA)
• Gyroscopes (AREA)
• Lasers (AREA)

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• 2001
  • 2001-12-05 US US10/005,285 patent/US6714580B2/en not_active Expired - Lifetime
• 2002
  • 2002-11-21 WO PCT/US2002/037476 patent/WO2003050476A1/en not_active Ceased
  • 2002-11-21 EP EP02786763A patent/EP1451527A1/en not_active Withdrawn
  • 2002-11-21 AU AU2002350232A patent/AU2002350232A1/en not_active Abandoned
  • 2002-11-21 JP JP2003551482A patent/JP2005512077A/ja active Pending

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