WO2003046475A1 - Detection de decalages de phase transitoires dans n'importe quel front d'onde optique a l'aide d'un cristal photorefractif et de faisceaux polarises - Google Patents

Detection de decalages de phase transitoires dans n'importe quel front d'onde optique a l'aide d'un cristal photorefractif et de faisceaux polarises Download PDF

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Publication number
WO2003046475A1
WO2003046475A1 PCT/US2001/045060 US0145060W WO03046475A1 WO 2003046475 A1 WO2003046475 A1 WO 2003046475A1 US 0145060 W US0145060 W US 0145060W WO 03046475 A1 WO03046475 A1 WO 03046475A1
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Prior art keywords
photorefractive crystal
beams
polarization
light
receiving surface
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PCT/US2001/045060
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English (en)
Inventor
Alexei Kamshilin
Alexander Grachev
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Oy Optoinspection Ltd.
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Priority to AU2002219985A priority Critical patent/AU2002219985A1/en
Priority to EP01274858A priority patent/EP1456601A1/fr
Priority to US10/496,149 priority patent/US20050083535A1/en
Priority to PCT/US2001/045060 priority patent/WO2003046475A1/fr
Publication of WO2003046475A1 publication Critical patent/WO2003046475A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/50—Processing the detected response signal, e.g. electronic circuits specially adapted therefor using auto-correlation techniques or cross-correlation techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0423—Surface waves, e.g. Rayleigh waves, Love waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0427—Flexural waves, plate waves, e.g. Lamb waves, tuning fork, cantilever

Definitions

  • the present invention relates to a method and apparatus for detecting a transient phase shift in any optical avefronts.
  • the invention is particularly directed toward detecting ultrasonic motion of a diffusely scattering or reflecting surface, which is very useful for remote nondestruc ive testing applications.
  • the invention is directed toward the measurements of small phase shifts of a complicated wavefront arising from a multimode optical fiber when it is subjected to bending, pressure, or another impact providing that such phase shift is representative of this impact.
  • phase modulation or frequency modulation of an optical wave is important for various fields of application where optical beams are used to detect the motion of the objects. This is the case of laser sensing of vibrations and laser detection of ultrasound and of transient body deformations such as those produced by a shock or on impact. Unlike transducer-based systems, optical detection is noncontacting, thus allowing inspection of parts at high temperatures or in hazardous environment. In addition, the laser beams can be scanned rapidly over curved surfaces, thus increasing the rate of inspection.
  • interferometric methods and apparatus are known to transfer a phase (or frequency) modulation of a light wave to a light power modulation by combining the phase-modulated object beam with the reference one, and further detection of light power modulation by means of a photo-receiver unit. Since in many cases, the modulation excursions to be detected are very small, sensitivity of an interferometer is a prime concern.
  • the two-wave mixing process requires in the ideal case a ⁇ /2 difference between the phases of the two interfering wavefronts (object and reference) incident on the photo-receiver (quadrature condition) .
  • the phase shift between diffracted part of the reference beam and non-diffracted part of the object beam is defined by the physical mechanism of the real- time hologram formation. If the hologram is recorded without application to the crystal of an external electric field (diffusion mechanism of recording) , this phase shift is equal either 0 or ⁇ , which is the least sensitive to phase modulation.
  • a method for detection a transient phase shift in an object laser beam of predetermined frequency having any optical wavefront which generally includes the steps of: a) setting the polarization state of the said object laser beam being elliptical with proper degree of ellipticity and with proper axes orientation in respect to the crystallographic axes of a photorefractive crystal, which belongs to the crystal symmetry group 23 or 43m ; b) setting the polarization state of a second reference laser beam coherent with the said object laser beam being also elliptical but with the polarization state different from the polarization state of the said object laser beam; c) directing said object laser beam together with said reference laser beam onto said photorefractive crystal, wherein said object and said reference beams are made co-propagating and with superposed wavefronts; and d) directing said co-propagating superposed object and reference laser beams onto a photodetector to result in an electrical output signal that is representative of the transient phase
  • the present invention also provides an apparatus for detection of the transient phase shift in any optical wavefronts, which generally includes a laser source for generating a laser beam with a predetermined frequency and an optical assembly for deriving two mutually coherent beams, one of which serves as a reference beam and another an object beam interacting with an object, for example by means of scattering or reflecting, to obtain a transient phase shift, for collecting the object and reference beams into the photorefractive crystal, and for causing the reference beam to interfere inside the photorefractive crystal with the object beam.
  • a laser source for generating a laser beam with a predetermined frequency
  • an optical assembly for deriving two mutually coherent beams, one of which serves as a reference beam and another an object beam interacting with an object, for example by means of scattering or reflecting, to obtain a transient phase shift, for collecting the object and reference beams into the photorefractive crystal, and for causing the reference beam to interfere inside the photorefractive crystal with the object beam.
  • the apparatus further includes a phase retardation optical element installed at least in one of the said beams for setting the proper polarization state and an optical assembly for collecting a beam, which is combined of the partially transmitted object beam and partially diffracted reference beam, into an optical detector for detecting the optical signal and converting it into an electrical signal representative of a transient phase shift.
  • the apparatus may also includes a power supply for producing of an alternating electric voltage varying in time with a period shorter than the response time of the photorefractive crystal to apply to the photorefractive crystal so as to increase the strength of the dielectric-permittivity-tensor grating.
  • Photorefractive crystals are optical materials in which electrical charges can be released from their initial localized sites by photo-excitation and then trapped at other sites, thus producing a local electrical charge variation in the case of spatially nonuniform light illumination. This charge variation then creates an electric field, the spatial distribution of which corresponds to the three-dimensional intensity distribution of the incident optical pattern.
  • Photorefractive crystals of the symmetry groups 23 and 43m possess the linear electrooptic effect. Therefore, the space-charge electric field results in the spatial modulation of the dielectric-permittivity tensor of the crystal.
  • these beams are diffracted from the self-created grating of the dielectric-permittivity tensor so as the partially transmitted object beam and partially diffracted reference beam are co-propagating in one direction being emerged from the crystal.
  • the holographic combination of these beams insures that they have precisely overlapped wavefronts irrespectively on complexity of the incident wavefronts. It is well known that the dielectric-permittivity-tensor grating created in a photorefractive crystal without external electric field or under a fast varying alternating electric field is ⁇ /2-phase shifted in respect with the input interference pattern.
  • Such a condition can be fulfilled, for example, by setting the polarization state of the reference beam being circular and the polarization state of the object beam being linear. If the grating is formed without electric field, an optimum orientation is achieved when the object and reference beams propagate under small angle to the crystallographic axis ⁇ 110> of a photorefractive crystal without optical activity forming the interference pattern with the fringes perpendicular to the axis ⁇ 110>, while the linear polarization of the object beam is parallel to the same axis ⁇ 110 > and the reference beam is circularly polarized. When the grating is created under an alternating electric field, an optimal polarization states and the crystal orientation can be either theoretically calculated using vectorial coupled-wave equations or found experimentally.
  • the invention is particularly useful for detecting small surface deformations or displacements of a material subjected to ultrasonic energy, enabling displacements ranging from a fraction of 1A to a few hundred of A to be detected from any rough surface and with a broad frequency bandwidth.
  • FIG.l is a schematic view showing diagrammatically the paths of the object and reference laser beams through a photorefractive crystal up to a photodetector;
  • FIG.2 is a schematic perspective view of a photorefractive crystal showing polarization states of the interfering beams and orientation of the crystal according to the invention
  • FIG.3 illustrates an improvement of the embodiment shown in FIG.l, incorporating the generator of alternating electric voltage
  • FIG.4 shows a plot (a) showing the minimum detectable wavefront displacement of the adaptive interferometer normalized to that of the classical interferometer as a function of the external field for linearly polarized object beam and circularly polarized reference beam and plot (b) similar to (a) but for elliptically polarized object beam and linearly polarized reference beam;
  • FIG.5 shows a plot (a) of the amplification gain of the object beam as a function of the external field calculated using the same parameters as in FIG.4 (a) and a plot (b) of the amplification gain of the object beam as a function of the external field calculated using the same parameters as in FIG.4 plot (b) ;
  • FIG.6a shows the input polarization states used for calculations of plots in FIGs . 4a and 5a;
  • FIG.6Jb shows the input polarization states used for calculations of plots in FIGs. 4Jb and 5b;
  • FIG.6c shows the input polarization states leading to the same minimal detectable phase shift at the external electric field of 20 kV/cm as the polarization states of FIG.6Jb;
  • FIG.7 illustrates an optical scheme similar to FIG. 3 but including a multimode fiber for introducing a complex wavefront, said multimode fiber being subjected to acoustic or ultrasonic vibrations;
  • FIG.8 shows modification of the optical schemes of FIGs. 1, 3, and 7 that exploits a feature of counter- phase intensity modulation for orthogonally polarized parts of the object beam and allows effective suppression of amplitude noise of the laser source;
  • FIG.9 shows a plot (a) (left ordinate) of the signal-to-noise ratio of a Bi ⁇ 2 Ti0 2 o photorefractive crystal as a function of the external electric field and a plot (b) (right ordinate) of the amplification gain of the object beam as a function of the external electric field measured for the same crystal;
  • FIG.10 shows an oscilloscope trace of the electrical signal from the photo-detector when the square-wave alternating electric field is applied to the crystal ;
  • FIG.11 shows an oscilloscope trace of the electrical signal from the photo-detector (trace a) for the case of a sinusoidal external electric field (trace jb) applied to the crystal.
  • FIG.l illustrates a preferred embodiment 10 according to the invention in which the reference beam is circularly polarized, the object beam is linearly polarized and no electric field is applied to the crystal.
  • a linearly-polarized laser beam 12 generated by a laser source 14 is divided by a beamsplitter 16 into two mutually coherent parts 12a and 12Jb.
  • the beam part 12a is directed onto the surface 18 which can be subjected to acoustic (low frequency) or ultrasonic (high frequency) energy. Sonic displacements of the surface 18 lead to a transient phase shift of the scattered (or reflected) beam 20.
  • Scattered light 20 is collected into a photorefractive crystal 22 by means of a lens 24 or by another way, using, for example, prisms, mirrors, or optical waveguides or their combinations (not shown) .
  • the photorefractive crystal may be, for example, but not limited to Bi 12 TiO 20 belonging to the 23 group of symmetry.
  • a polarizing optical element 26 installed before the photorefractive crystal 24 ensures the linear polarization of the object beam 28.
  • the object beam 28 impinged on the entrance face of the photorefractive crystal 22 is phase modulated and it has an arbitrary wavefront schematically shown in FIG.l by a curve 30.
  • the reference beam 32 is formed from a laser beam part 12J transmitted through a phase-retardation optical element 34 (a quarter-wave phase plate) , which is adjusted so as the reference bean becomes circularly polarized.
  • the reference beam 32 is directed into the same photorefractive crystal 22 where it intersects the object beam 28.
  • the co-propagating partially transmitted beam 28' and partially diffracted beam 32 ' together comprise the combined beam 42 that is collected into a photodetector 44 by means of a lens 46 or by another way, using, for example, prisms, mirrors, or optical waveguides or their combinations (not shown) .
  • the intensity of the combined beam 42 measured by the photodetector 44 is representative of the transient phase shift between the reference and object beams 28, 32.
  • the light beam emerged from the crystal in the direction of the transmitted reference beam is a superposition of the partially transmitted reference beam 32' ' and the partially diffracted object beam 28' ' .
  • the intensity of this combination also represents the transient phase shift.
  • FIG.2 shows in details the perspective view of the photorefractive crystal 22 with the input object and reference beams 28, 32.
  • the crystal is cut so that the input face of the crystal is the crystallographic surface (110), which is orthogonal to the axis ⁇ 110>.
  • the polarization state of the reference beam is circular as schematically shown by a circle 48, while the polarization state of the object beam is linear as schematically shown by an arrow 50 and it makes an angle ⁇ with the axis x, which is parallel to the axis ⁇ 001>.
  • the object and reference beams are directed on the photorefractive crystal so as a plane containing average propagation directions of both the object and reference beams inside the crystal is orthogonal to the crystallographic axis ⁇ 001>, which makes the vector of the dielectric-permittivity-tensor grating 52 being parallel to the axis ⁇ 110>.
  • Other crystal cuts can be used as well, however, the highest transformation rate of the phase-to-intensity modulation is achieved in the cut shown in FIG.2.
  • the separate beams 28', 32' have different polarization states that are defined by the input polarization states of the beams 28, 32 and by the orientation of the dielectric-permittivity-tensor grating in respect to the crystallographic axes of the crystal 22.
  • Intensity of the beam 42 is defined by the vectorial sum of the amplitudes of the beams 28' and 32' and it depends on both the phase shift between the interference pattern and the dielectric-permittivity- tensor grating and the transient phase shift between the input object and reference beams 28, 32.
  • the formation of the space-charge field is not instantaneous but requires a specific time, ⁇ R , which depends on the material parameters of the crystal, on the light wavelength, and on the light intensity.
  • ⁇ R a specific time
  • the optical beams propagate and diffract from the dielectric-permittivity-tensor grating induced by the space-charge field. If the transient phase shift occurs faster than the response time ⁇ R of the space-charge formation, the optical beams is propagating in a
  • K is a coupling constant of the interfering beams
  • I 0 is the input intensity of the object beam
  • R is the intensity ratio of the input reference to the input object beam
  • L is the crystal thickness
  • ⁇ is the laser wavelength
  • n 0 is the refractive index of the crystal
  • a is the absorption coefficient of the crystal
  • p is the optical rotatory power (for optically active crystals)
  • 4 ⁇ is the electrooptic coefficient
  • ⁇ is the average angle between the reference and object beams
  • k B is the Boltzmann constant
  • T is the temperature of the crystal
  • e is the electron's charge
  • q ⁇ p 2 + ⁇ 2 .
  • Equations (l)-(4) remain the same if the object beam is circularly polarized and the reference beam is linearly polarized under the angle ⁇ in respect to the crystallographic axis ⁇ 001>. Note that in the case of the equal polarization states (either linear or elliptical) of the reference and object beams, the intensity variation of the superposed beam 42 is always proportional to cos ⁇ ) , which makes the interferometer being the least sensitive to small transient phase shifts.
  • FIG.3 shows an optical scheme 54, which is an improvement of the preferred embodiment 10 of the invention in which alternating electric field with the repetition frequency higher than the reciprocal response time of the crystal is applied to the photorefractive crystal. It is done by means of a generator 56 output of which is electrically connected with the crystal 22.
  • the electrical connection can be realized for example with help of electrodes 58 evaporated on the side faces of the photorefractive crystal as shown in FIG.2.
  • the highest influence of the external electric field on the amplitude of the dielectric-permittivity-tensor grating is achieved when the electric field is parallel to the grating vector. In the geometry shown in FIG.2, this optimum corresponds to the electrodes 58 orthogonal to the axis ⁇ 110>.
  • Common reference characters in FIG.3 represent identical or similar elements shown in FIG.l.
  • Applicant has found quite unexpectedly that the power of the superposed beam 42 emerged from the crystal is larger than the power of the input object beam while ability of the linear phase-to-intensity transformation is preserved.
  • a key parameter that allows different homodyne interferometers to be compared is the signal-to-noise ratio (SNR) of the electrical signal generated by the photodetector, which is representative of the transient phase shift ⁇ .
  • SNR defines the smallest transient displacement of the object wavefront that can be detected above the noise level for a defined detection bandwidth and for a defined power level on the photodetector.
  • the signal is proportional to the amplitude of the light power modulation at the photodetector caused by the phase modulation of the object beam.
  • the noise is proportional to the square root of the average number of photons reached the photodetector.
  • the expression for the intensity of the superposed beam 40 as a function of the transient phase shift (such as Eq.l or Eq.4) is enough to calculate the minimum detectable wavefront displacement ⁇ PTN of the interferometric method according to the invention.
  • derivation of the analytical expression for the case of the grating recording under an external alternating electric field is impossible because of the strong non-linearity of the grating formation process.
  • Applicant has solved numerically the system of the coupled wave equation derived by Sturman et . al . (B. I. Sturman, E. V. Podivilov, K. H. Ringhofer, E. Shamonina, V. P. Kamenov, E. Nippolainen, V. V. Prokofiev, and A. A. Kamshilin, "Theory of photorefractive vectorial wave coupling in cubic crystals," Phys . Rev. E, vol. 60, pp. 3332-3352, 1999) .
  • the system was solved for the case when two light beams with different polarization states are coupled through a dielectric-permittivity-tensor grating self-recorded in a photorefractive crystal of cubic symmetry subjected to application of an alternating electric field of a square-wave form in the geometry shown in FIG. 2.
  • This solution allows us to calculate SNR and, consequently, the minimum detectable wavefront displacement, ⁇ PT w
  • ⁇ PTW depends on the polarization states of the reference and object beams, their intensity ratio R, applied electric field, thickness of the crystal L, its absorption coefficient a, electro-optic coefficient r 4i , and optical rotatory power p.
  • the ratio ⁇ p ⁇ w j ⁇ CL calculated under condition that the incident power of the object beam is the same for the classical interferometer and the interferometer according to the invention, is the best parameter for comparison of . the interferometers performance .
  • the curve (a) in FIG.4 was calculated for the case when the reference beam is circularly polarized and the object beam is linearly polarized at ⁇ 15.3°, which is the optimal polarization-state pair for recording without external field in accordance with Eq.3.
  • the ⁇ PT w approaches to ⁇ CL when strong alternating field is applied to the crystal.
  • the optimal pair of the polarization states for the reference and object beams which leads to the minimal ⁇ PT w ⁇ depends itself on the external electric field.
  • the optimal polarization states at the external field of 20 kV/cm were found as following.
  • the curve (b) in FIG.4 shows the ratio ⁇ pm l ⁇ c L as a function of the external field calculated for this pair of the polarization states.
  • FIG. 5 shows the gain of the object beam, which is defined as the ratio of the power of the combined output beam 42 to the power of the input beam 28, as a function of the external electric field. Curves (a) and (b) in Fig. 5 were calculated for the same pairs of the input polarization states as the curves (a) and (b) in FIG. 4, respectively.
  • the optimal polarization-state pair can also be found in an experiment independently varying the input polarization state of the reference and object beams so as to maximize SNR, which is proportional to the ratio of the intensity variation of the combined output beam
  • transient phase shift of the light wavefront occurs also when the light wave exits from an either multi-mode or single- mode fiber 62 subjected to acoustic or ultrasonic vibrations.
  • common reference characters in FIG.7 represent identical or similar elements shown in FIGs. 1 and 3. The difference between embodiment 54, FIG.3, and
  • the object beam 28 is launched in embodiment 60 into the fiber 62 and the output light from the fiber 62 is collected by the lens 24.
  • Analyzing dependences of the phase-to-intensity- transformation rate on the input polarization states of the interfering beams applicant has found quite unexpectedly that there are two mutually orthogonal polarization states of the object beam, which create respectively two optimal pairs (leading to the highest rate of the phase-to-intensity transformation) with one and the same polarization state of the reference beam. Both the intensity modulation and the mean intensity are the same for these optimal pairs but the intensity of the combined beam 42 in one pair is modulated in counter phase compare to that of the other pair.
  • the highest rate of the phase-to-intensity transformation is achieved when the reference beam is circularly polarized and the object beam is linearly polarized with the plane of the polarization making the angle of either
  • FIG.8 represents identical or similar elements shown in FIGs. 1, 3, and 7.
  • the object beam 20 reflected from the test surface or transmitted trough the optical fiber is split into two beams 68, 70 with mutually-orthogonal linear polarization states and with almost equal light power by means of the polarization beam-splitter 66. If the object beam 20 is completely depolarized, this can be achieved at any position of the polarization beam- splitter 66. Otherwise, one can always find a proper orientation of the polarization beam-splitter that leads to beam splitting with almost equal light power. Further, each part of the object beam is transmitted through a polarization optical transformer 26a (26b) to set the optimal input polarization state for each part.
  • one quarter-wave plate instead of two transformers 26a and 26b can be utilized for setting required mutually orthogonal polarization states of the object-beam parts 28a and 28b.
  • the beams 28a and 28b are directed into the photorefractive crystal 22 where they intersect the reference beam 32, which polarization state is set by the polarization transformer 34 (phase-retardation plate) .
  • Beams 28a and 28b can be directed either into the same or different areas of the entrance face of the photorefractive crystal 22.
  • the second case is more preferable, because it avoids mutual diminishing of the respective dielectric-permittivity-tensor gratings.
  • the reference beam 32 must be either expanded or split to overlap both beams 28a and 28b.
  • two combined beams 42a and 42b are collected into a respective photo-detector 44a and 44b by means of a lens 46a and 46b.
  • Electrical signal from the photodiodes 46a, 46b enters a processing circuit 72, which output signal is proportional to the difference of the input signals.
  • the input electrical signals which are proportional to the light power modulation entering into photo-detectors
  • the output signal will have double modulation amplitude around the zero level. Consequently, the amplitude noise of the laser source will be effectively suppressed, which results in increased sensitivity.
  • the photorefractive crystal 22 of Bi ⁇ 2 Ti0 2 o was cut in the parallelepiped shape similar to that shown in FIG.2.
  • the input face polished to the optical quality is orthogonal to the crystallographic axis ⁇ 110>.
  • the thickness, L, of the crystal is equal to 1.97 mm.
  • Gold electrodes were evaporated onto the faces that are orthogonal to the crystallographic axis ⁇ 110 > .
  • the distance between electrodes is equal to 1.95 mm.
  • the third dimension of the crystal (along to the axis ⁇ 001>) is equal to 5.48 mm.
  • the beam 12 was divided into two mutually coherent parts 12a and 12b by a beam-splitter with the ratio of 50:50.
  • the beam part 12a was directed onto the loudspeaker diffuser 18 and the scattered light was collected onto the input surface of the photorefractive crystal 22 by a lens 24.
  • a polarizer 26 installed between the lens 24 and crystal 22 provides the linear polarization state of the object beam 28.
  • the polarizer 26 is mounted into a rotational stage allowing us to vary the polarization angle ⁇ .
  • the beam part 12b was directed onto the input surface of the photorefractive crystal 22 after passing through a quarter-wave plate 34.
  • a quarter-wave plate 34 was also mounted into a rotational stage providing possibility to change the elliptical polarization state of the reference beam 32.
  • the plane of incidence of both the object and reference beams 28, 32 was orthogonal to the crystallographic axis ⁇ 001> thus providing the vector of the dielectric-permittivity-tensor grating being parallel to both the external electric field and the axis ⁇ 110>.
  • Intensity of the object and reference beams 28, 32 at the input face of the crystal were 15.5 and 220 mW/cm 2 , respectively.
  • the input intensity ratio R was about 14.
  • the average angle ⁇ between the object and reference beams is about 20°.
  • the light beam 42 emerged from the photorefractive crystal in the direction of the transmitted object beam is collected into a photo-detector 44 by a lens 46.
  • the response time of the Bi 12 Ti0 2 o crystal was measured to be about 0.07 s when the reference and object beams with total intensity of 235 mW/cm 2 illuminate the crystal.
  • vibrations of the loudspeaker diffuser at the frequency of 1.34 kHz introduce a transient phase shift between the object and reference beams.
  • the loudspeaker was independently calibrated and the amplitude of the phase-shift oscillations was set to be equal to 0.24 radians.
  • the intensity of the beam 42 is modulated in time at the frequency of the loudspeaker oscillations either without external field on the crystal or under alternating electric field, if the reference beam is circularly polarized and the object beam is linearly polarized parallel to the axis ⁇ 001>. This is a solid prove that small transient phase modulations is linearly transferred into the intensity modulation.
  • the intensity-modulation amplitude depends on the polarization states of the reference and object beams. Under 20 kV/cm of the external electric field, the maximal intensity modulation is achieved when the object beam is linearly polarized parallel to the axis ⁇ 001> and the reference beam is elliptically modulated with the ellipticity of 0.38 and the inclination angle of 34°.
  • FIG.9 (curve a) shows in arbitrary units the ratio of the measured amplitude of the intensity modulation to the square root of the average intensity, which represents the signal- to-noise ratio, as a function of the external electric field.
  • SNR signal- to-noise ratio
  • the average intensity of the beam 42 is increases 4 times. Total optical losses of the object beam transmitted through the crystal (including absorption and reflection from the surfaces) are 34%.
  • FIG.9 curve b shows the ratio of the average intensity of the beam 42 to the intensity of the object beam 28 as a function of the external electric field. The net amplification of the signal beam at 20 kV/cm is about 2.6.
  • FIG.10 shows an oscilloscope trace of the electric signal from the photo-detector 44, when the phase of the of the object beam is modulated at the frequency of 12 kHz with the amplitude of 0.12 radians and an alternating electric field of the square-wave form with the amplitude of 10 kV/cm and repetition frequency of 1 kHz is applied to the crystal .
  • Sharp peaks in the trace of FIG.10 reflect a reaction of the crystal on the switching of the electric-field sign.
  • the output signal is modulated at the frequency of the input phase modulation and there is no signal-phase flip during switching of the external-field sign.
  • FIG.11 shows an oscilloscope trace of the electric signal from the photo-detector 44 (trace a) , when the phase of the of the object beam is modulated at the frequency of 50 kHz with the amplitude of 0.12 radians and an alternating electric field of the sinusoidal form (trace b) with the amplitude of 15 kV/cm and frequency of 1 kHz is applied to the crystal.
  • trace a shows an oscilloscope trace of the electric signal from the photo-detector 44
  • trace b an alternating electric field of the sinusoidal form

Abstract

La présente invention concerne la détection de décalages de phase transitoires dans un faisceau laser objet de fréquence prédéterminée ayant un front d'onde arbitraire et un appareil permettant de diriger ledit faisceau laser objet de manière qu'il croise un second faisceau laser de référence cohérent avec ledit faisceau objet dans un cristal photoréfractif orienté (22) (Bi12TiO20) (auquel est appliqué un champ électrique alternatif) appartenant au groupe de symétrie 43m ou 23 des cristaux. Le procédé selon la présente invention consiste à fixer l'état de polarisation dudit faisceau objet (20, 26) et dudit faisceau de référence (32, 34) pour qu'ils soient elliptiques et différents l'un de l'autre, à provoquer l'interférence dudit faisceau laser objet avec ledit faisceau de référence dans le cristal photoréfractif de manière à former un réseau à tenseur de constante diélectrique diffractant ledit faisceau de référence dans ledit faisceau objet et vice versa et à diriger un faisceau transmis à travers le cristal photoréfractif en direction d'un faisceau objet transmis sur un photo-détecteur (44) pour produire un signal de sortie électrique représentatif du décalage de phase transitoire dans le faisceau laser objet. Des fibres optiques et des faisceaux objet divisés peuvent être utilisés.
PCT/US2001/045060 2001-11-27 2001-11-27 Detection de decalages de phase transitoires dans n'importe quel front d'onde optique a l'aide d'un cristal photorefractif et de faisceaux polarises WO2003046475A1 (fr)

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AU2002219985A AU2002219985A1 (en) 2001-11-27 2001-11-27 Detection of transient phase shifts in any optical wave front with photorefractive crystal and polarized beams
EP01274858A EP1456601A1 (fr) 2001-11-27 2001-11-27 Detection de decalages de phase transitoires dans n'importe quel front d'onde optique a l'aide d'un cristal photorefractif et de faisceaux polarises
US10/496,149 US20050083535A1 (en) 2001-11-27 2001-11-27 Detection of transient phase shifts in any optical wave front with photorefractive crystal and polarized beams
PCT/US2001/045060 WO2003046475A1 (fr) 2001-11-27 2001-11-27 Detection de decalages de phase transitoires dans n'importe quel front d'onde optique a l'aide d'un cristal photorefractif et de faisceaux polarises

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JP4654649B2 (ja) * 2004-10-07 2011-03-23 ソニー株式会社 量子暗号通信方法、および量子暗号通信装置、並びに量子暗号通信システム
US7684047B2 (en) * 2006-10-27 2010-03-23 Lockheed Martin Corporation Apparatus and method for two wave mixing (TWM) based ultrasonic laser testing
US7920263B2 (en) 2007-09-06 2011-04-05 The United States Of America As Represented By The Secretary Of The Navy Apparatus and system for electro magnetic field measurements and automatic analyses of phase modulated optical signals from electrooptic devices
US20090190214A1 (en) * 2008-01-29 2009-07-30 Nicholas Francis Borrelli Polarizing photorefractive glass
US8179595B2 (en) * 2008-01-29 2012-05-15 Corning Incorporated Polarizing photorefractive glass
WO2011003041A1 (fr) * 2009-07-01 2011-01-06 The Government Of The United States Of America, As Represented By The Secretary Of The Navy Capteur micro-onde électro-optique à puissance élevée quasi longitudinal
US9906870B2 (en) * 2016-02-15 2018-02-27 Aalap Rajendra SHAH Apparatuses and methods for sound recording, manipulation, distribution and pressure wave creation through energy transfer between photons and media particles
JP6797564B2 (ja) * 2016-06-01 2020-12-09 オリンパス株式会社 位相物体可視化装置、位相物体可視化方法

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