WO2003005046A3 - Apparatus with a test interface - Google Patents
Apparatus with a test interface Download PDFInfo
- Publication number
- WO2003005046A3 WO2003005046A3 PCT/IB2002/002443 IB0202443W WO03005046A3 WO 2003005046 A3 WO2003005046 A3 WO 2003005046A3 IB 0202443 W IB0202443 W IB 0202443W WO 03005046 A3 WO03005046 A3 WO 03005046A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- test
- state machine
- processor
- states
- successive
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318555—Control logic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2736—Tester hardware, i.e. output processing circuits using a dedicated service processor for test
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02733172A EP1407281A2 (en) | 2001-07-05 | 2002-06-20 | Apparatus with a test interface |
US10/482,015 US20040177300A1 (en) | 2001-07-05 | 2002-06-20 | Apparatus with a test interface |
JP2003510970A JP3974110B2 (en) | 2001-07-05 | 2002-06-20 | Device with test interface |
KR10-2003-7003217A KR20030033047A (en) | 2001-07-05 | 2002-06-20 | Apparatus with a test interface |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01202594.6 | 2001-07-05 | ||
EP01202594 | 2001-07-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003005046A2 WO2003005046A2 (en) | 2003-01-16 |
WO2003005046A3 true WO2003005046A3 (en) | 2003-06-05 |
Family
ID=8180601
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IB2002/002443 WO2003005046A2 (en) | 2001-07-05 | 2002-06-20 | Apparatus with a test interface |
Country Status (6)
Country | Link |
---|---|
US (1) | US20040177300A1 (en) |
EP (1) | EP1407281A2 (en) |
JP (1) | JP3974110B2 (en) |
KR (1) | KR20030033047A (en) |
TW (1) | TWI224196B (en) |
WO (1) | WO2003005046A2 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7308629B2 (en) | 2004-12-07 | 2007-12-11 | Texas Instruments Incorporated | Addressable tap domain selection circuit with TDI/TDO external terminal |
US7328387B2 (en) * | 2004-12-10 | 2008-02-05 | Texas Instruments Incorporated | Addressable tap domain selection circuit with selectable ⅗ pin interface |
US7421633B2 (en) * | 2005-03-21 | 2008-09-02 | Texas Instruments Incorporated | Controller receiving combined TMS/TDI and suppyling separate TMS and TDI |
US7159083B2 (en) * | 2002-12-13 | 2007-01-02 | Texas Instruments Incorporated | Programmable transition state machine |
GB0301956D0 (en) * | 2003-01-28 | 2003-02-26 | Analog Devices Inc | Scan controller and integrated circuit including such a controller |
US7707467B2 (en) * | 2007-02-23 | 2010-04-27 | Micron Technology, Inc. | Input/output compression and pin reduction in an integrated circuit |
US10473720B2 (en) * | 2015-10-27 | 2019-11-12 | Nvidia Corporation | Dynamic independent test partition clock |
CN112825063B (en) * | 2019-11-20 | 2024-08-06 | 瑞昱半导体股份有限公司 | Combined test work group transmission system |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0636976A1 (en) * | 1993-07-28 | 1995-02-01 | Koninklijke Philips Electronics N.V. | Microcontroller provided with hardware for supporting debugging as based on boundary scan standard-type extensions |
EP0862116A2 (en) * | 1997-02-28 | 1998-09-02 | Vlsi Technology, Inc. | A smart debug interface circuit |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6594802B1 (en) * | 2000-03-23 | 2003-07-15 | Intellitech Corporation | Method and apparatus for providing optimized access to circuits for debug, programming, and test |
-
2002
- 2002-06-20 EP EP02733172A patent/EP1407281A2/en not_active Withdrawn
- 2002-06-20 JP JP2003510970A patent/JP3974110B2/en not_active Expired - Fee Related
- 2002-06-20 WO PCT/IB2002/002443 patent/WO2003005046A2/en active Application Filing
- 2002-06-20 KR KR10-2003-7003217A patent/KR20030033047A/en not_active Application Discontinuation
- 2002-06-20 US US10/482,015 patent/US20040177300A1/en not_active Abandoned
- 2002-09-05 TW TW091120280A patent/TWI224196B/en not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0636976A1 (en) * | 1993-07-28 | 1995-02-01 | Koninklijke Philips Electronics N.V. | Microcontroller provided with hardware for supporting debugging as based on boundary scan standard-type extensions |
EP0862116A2 (en) * | 1997-02-28 | 1998-09-02 | Vlsi Technology, Inc. | A smart debug interface circuit |
Also Published As
Publication number | Publication date |
---|---|
JP3974110B2 (en) | 2007-09-12 |
EP1407281A2 (en) | 2004-04-14 |
TWI224196B (en) | 2004-11-21 |
KR20030033047A (en) | 2003-04-26 |
JP2004521363A (en) | 2004-07-15 |
WO2003005046A2 (en) | 2003-01-16 |
US20040177300A1 (en) | 2004-09-09 |
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