WO2002082063A1 - Procede et dispositif d'evaluation de surfaces - Google Patents

Procede et dispositif d'evaluation de surfaces Download PDF

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Publication number
WO2002082063A1
WO2002082063A1 PCT/EP2002/003682 EP0203682W WO02082063A1 WO 2002082063 A1 WO2002082063 A1 WO 2002082063A1 EP 0203682 W EP0203682 W EP 0203682W WO 02082063 A1 WO02082063 A1 WO 02082063A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
sample
light source
imaging device
recording
Prior art date
Application number
PCT/EP2002/003682
Other languages
English (en)
Inventor
Klaas Hendrik De Haas
Gerrit Cornelis Dubbeldam
Ivo Bernardus Nicolaas Van Der Lans
Robin Paul Fries
Original Assignee
Akzo Nobel Coatings International B.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akzo Nobel Coatings International B.V. filed Critical Akzo Nobel Coatings International B.V.
Priority to BR0208660-3A priority Critical patent/BR0208660A/pt
Priority to AU2002338353A priority patent/AU2002338353B2/en
Priority to EP02742872A priority patent/EP1373867A1/fr
Priority to JP2002579783A priority patent/JP3933581B2/ja
Priority to KR1020037012945A priority patent/KR100875806B1/ko
Publication of WO2002082063A1 publication Critical patent/WO2002082063A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0216—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using light concentrators or collectors or condensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/504—Goniometric colour measurements, for example measurements of metallic or flake based paints
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/52—Measurement of colour; Colour measuring devices, e.g. colorimeters using colour charts
    • G01J3/524—Calibration of colorimeters

Abstract

L'invention concerne un dispositif et un procédé destinés à enregistrer les propriétés visuelles d'une surface, comprenant un dispositif d'imagerie (3) destiné à enregistrer l'interaction de la lumière (réflexion ou transmission) avec une surface, une source de lumière (2) et une zone d'échantillon destinée à positionner un échantillon (6) avec une surface à examiner. Le dispositif d'imagerie, la source de lumière ainsi que la zone d'échantillon sont agencées de telle manière que dans une image au moins une des propriétés de surface est enregistrable en fonction d'une gamme continue d'angles entre le sens d'illumination (7, 9) et le sens d'observation (4, 5). Le dispositif d'imagerie est une caméra à dispositif à transfert de charge. Le dispositif et le procédé permettent d'imager et d'évaluer les propriétés visuelles dépendant de la géométrie optique telle que le comportement du métamérisme géométrique et la brillance.
PCT/EP2002/003682 2001-04-06 2002-03-28 Procede et dispositif d'evaluation de surfaces WO2002082063A1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
BR0208660-3A BR0208660A (pt) 2001-04-06 2002-03-28 Método e dispositivo para avaliação de superfìcie
AU2002338353A AU2002338353B2 (en) 2001-04-06 2002-03-28 Method and device for surface evaluation
EP02742872A EP1373867A1 (fr) 2001-04-06 2002-03-28 Procede et dispositif d'evaluation de surfaces
JP2002579783A JP3933581B2 (ja) 2001-04-06 2002-03-28 表面評価の方法および装置
KR1020037012945A KR100875806B1 (ko) 2001-04-06 2002-03-28 표면 평가를 위한 방법 및 장치

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01201276 2001-04-06
EP01201276.1 2001-04-06

Publications (1)

Publication Number Publication Date
WO2002082063A1 true WO2002082063A1 (fr) 2002-10-17

Family

ID=8180117

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2002/003682 WO2002082063A1 (fr) 2001-04-06 2002-03-28 Procede et dispositif d'evaluation de surfaces

Country Status (9)

Country Link
EP (1) EP1373867A1 (fr)
JP (1) JP3933581B2 (fr)
KR (1) KR100875806B1 (fr)
CN (1) CN100403011C (fr)
AU (1) AU2002338353B2 (fr)
BR (1) BR0208660A (fr)
RU (1) RU2292037C2 (fr)
WO (1) WO2002082063A1 (fr)
ZA (1) ZA200307712B (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2463162C2 (ru) * 2006-12-23 2012-10-10 Колорматрикс Холдингс, Инк. Полимерные материалы
US9823130B2 (en) 2012-04-20 2017-11-21 Office Color Science Co., Ltd. Multi-angle spectral imaging measurement method and apparatus
US11280743B2 (en) 2015-03-30 2022-03-22 Gemological Institute Of America, Inc. (Gia) Apparatus and method for assessing optical quality of gemstones
CN114502266A (zh) * 2019-10-09 2022-05-13 株式会社日立制作所 粉体混合系统及粉体混合方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9025153B2 (en) * 2011-11-16 2015-05-05 Axalta Coating Systems Ip Co., Llc Process for predicting degree of mottling in coating compositions by wet color measurement
CA2872898A1 (fr) * 2012-05-09 2013-11-14 Seagate Technology Llc Mappage de caracteristiques d'une surface
CN103674903A (zh) * 2013-12-31 2014-03-26 爱彼思（苏州）自动化科技有限公司 非接触式光泽度仪
US9880098B2 (en) * 2014-10-28 2018-01-30 Axalta Coatings Systems Ip Co., Llc Method and systems for quantifying differences between colored surfaces
CN106908149A (zh) * 2017-04-11 2017-06-30 上海电机学院 一种机器人物体颜色识别系统及方法
KR102047206B1 (ko) * 2018-10-31 2019-11-20 한국과학기술원 체적함수비별 반사율 측정을 위한 함수특성곡선-초분광 캠 테스트 방법 및 장치

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system
US5640237A (en) * 1995-08-29 1997-06-17 Kla Instruments Corporation Method and apparatus for detecting non-uniformities in reflective surafaces
US5946029A (en) * 1996-06-25 1999-08-31 Matsushita Electric Works, Ltd Image processing process

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2588297B2 (ja) * 1990-06-20 1997-03-05 日産自動車株式会社 塗装表面の鮮映性評価方法
EP1016126B1 (fr) * 1997-03-31 2018-12-26 Nanometrics Incorporated Module d'inspection optique et méthode de détection de particules ainsi que de défauts sur des substrats dans un appareillage de traitement integré

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system
US5640237A (en) * 1995-08-29 1997-06-17 Kla Instruments Corporation Method and apparatus for detecting non-uniformities in reflective surafaces
US5946029A (en) * 1996-06-25 1999-08-31 Matsushita Electric Works, Ltd Image processing process

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
H. KUGISAWA ET AL.: "Method for measuring glossiness of spherical surfaces utilizing brightness pattern of image", IEICE TRANS. JAPAN, vol. E74, no. 9, 1991, pages 2655 - 2662, XP000271986 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2463162C2 (ru) * 2006-12-23 2012-10-10 Колорматрикс Холдингс, Инк. Полимерные материалы
US9823130B2 (en) 2012-04-20 2017-11-21 Office Color Science Co., Ltd. Multi-angle spectral imaging measurement method and apparatus
US11280743B2 (en) 2015-03-30 2022-03-22 Gemological Institute Of America, Inc. (Gia) Apparatus and method for assessing optical quality of gemstones
US11921051B2 (en) 2015-03-30 2024-03-05 Gemological Institute Of America, Inc. (Gia) Apparatus and method for assessing optical quality of gemstones
CN114502266A (zh) * 2019-10-09 2022-05-13 株式会社日立制作所 粉体混合系统及粉体混合方法
CN114502266B (zh) * 2019-10-09 2024-03-05 株式会社日立制作所 粉体混合系统及粉体混合方法

Also Published As

Publication number Publication date
EP1373867A1 (fr) 2004-01-02
RU2292037C2 (ru) 2007-01-20
CN1505757A (zh) 2004-06-16
JP2004526969A (ja) 2004-09-02
KR20040012743A (ko) 2004-02-11
CN100403011C (zh) 2008-07-16
RU2003132476A (ru) 2005-03-20
JP3933581B2 (ja) 2007-06-20
KR100875806B1 (ko) 2008-12-26
BR0208660A (pt) 2004-03-09
AU2002338353B2 (en) 2006-05-25
ZA200307712B (en) 2004-07-06

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