WO2002033723A3 - High resolution high output microchannel based radiation sensor - Google Patents

High resolution high output microchannel based radiation sensor Download PDF

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Publication number
WO2002033723A3
WO2002033723A3 PCT/US2001/032027 US0132027W WO0233723A3 WO 2002033723 A3 WO2002033723 A3 WO 2002033723A3 US 0132027 W US0132027 W US 0132027W WO 0233723 A3 WO0233723 A3 WO 0233723A3
Authority
WO
WIPO (PCT)
Prior art keywords
microchannel
radiation sensor
phosphors
multiplicity
based radiation
Prior art date
Application number
PCT/US2001/032027
Other languages
French (fr)
Other versions
WO2002033723A2 (en
Inventor
Vishal Chhabra
Rameshwar Nath Bhargava
Samuel B Herko
Bharati S Kulkarni
Nikhil R Taskar
Aleksey Yekimov
Original Assignee
Nanocrystal Imaging Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanocrystal Imaging Corp filed Critical Nanocrystal Imaging Corp
Priority to AU2002216624A priority Critical patent/AU2002216624A1/en
Publication of WO2002033723A2 publication Critical patent/WO2002033723A2/en
Publication of WO2002033723A3 publication Critical patent/WO2002033723A3/en

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
    • G21K2004/06—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens with a phosphor layer
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
    • G21K2004/12—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens with a support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2231/00—Cathode ray tubes or electron beam tubes
    • H01J2231/50—Imaging and conversion tubes
    • H01J2231/50005—Imaging and conversion tubes characterised by form of illumination
    • H01J2231/5001—Photons
    • H01J2231/50031—High energy photons
    • H01J2231/50036—X-rays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2231/00—Cathode ray tubes or electron beam tubes
    • H01J2231/50—Imaging and conversion tubes
    • H01J2231/501—Imaging and conversion tubes including multiplication stage
    • H01J2231/5013—Imaging and conversion tubes including multiplication stage with secondary emission electrodes
    • H01J2231/5016—Michrochannel plates [MCP]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/89—Deposition of materials, e.g. coating, cvd, or ald

Abstract

A microchannel phosphor screen for converting radiation, such as X-rays, into visible light. The screen includes a planar surface, which can be formed from glass, silicon or metal, which has etched therein a multiplicity of closely spaced microchannels (60) having diameters of the order of 40 microns or less. Deposited within each of the microchannels (60) is a multiplicity of phosphors(64) which emit light when acted upon by radiation. The dimensions of the microchannel(60) and the phosphors(64)are optimized so that the light output compares favorably with lower resolution non-microchannel based scintillation screens. A photomultipier can be integrated with the x-ray detector so as to provide an enhanced output for use with low level X-ray of for cine or fluoroscipy applications.
PCT/US2001/032027 2000-10-16 2001-10-15 High resolution high output microchannel based radiation sensor WO2002033723A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002216624A AU2002216624A1 (en) 2000-10-16 2001-10-15 High resolution high output microchannel based radiation sensor

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/688,662 2000-10-16
US09/688,662 US6534772B1 (en) 1997-11-28 2000-10-16 High resolution high output microchannel based radiation sensor

Publications (2)

Publication Number Publication Date
WO2002033723A2 WO2002033723A2 (en) 2002-04-25
WO2002033723A3 true WO2002033723A3 (en) 2002-08-29

Family

ID=24765269

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/032027 WO2002033723A2 (en) 2000-10-16 2001-10-15 High resolution high output microchannel based radiation sensor

Country Status (3)

Country Link
US (1) US6534772B1 (en)
AU (1) AU2002216624A1 (en)
WO (1) WO2002033723A2 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10058810A1 (en) * 2000-11-27 2002-06-06 Philips Corp Intellectual Pty X-ray detector module
US7348946B2 (en) 2001-12-31 2008-03-25 Intel Corporation Energy sensing light emitting diode display
US7679061B2 (en) * 2005-11-22 2010-03-16 Carestream Health, Inc. Radiographic image sensing system
US20100084562A1 (en) * 2006-10-04 2010-04-08 Angell Daniel K Radiation detection device
RU2524449C2 (en) * 2012-07-24 2014-07-27 Закрытое Акционерное Общество "Научно-Производственная Коммерческая Фирма "Элтан Лтд" Fast-acting x-ray-sensitive pad for digital mammography
US10686003B2 (en) * 2015-12-31 2020-06-16 General Electric Company Radiation detector assembly
CN110473650B (en) * 2019-07-11 2023-06-02 长春理工大学 Laminated crosstalk-proof X-ray fluorescent screen
CN110491753A (en) * 2019-07-11 2019-11-22 长春理工大学 X-ray fluorescence screen with vertical channel structure
US20230417935A1 (en) * 2022-06-22 2023-12-28 Ecole Polytechnique Federale De Lausanne (Epfl) High-Resolution Scintillation Detector for Two-Dimensional Reconstruction

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2167279A (en) * 1984-11-15 1986-05-21 Ian Redmayne Radiation imaging
US5334843A (en) * 1992-08-17 1994-08-02 Zeman Herbert D Composite scintillator screen
US5446286A (en) * 1994-08-11 1995-08-29 Bhargava; Rameshwar N. Ultra-fast detectors using doped nanocrystal insulators

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4011454A (en) 1975-04-28 1977-03-08 General Electric Company Structured X-ray phosphor screen
US5113425A (en) 1989-06-02 1992-05-12 Glenbrook Technologies, Inc. X-ray inspection system for electronic components
US5519227A (en) 1994-08-08 1996-05-21 The University Of Massachusetts Medical Center Structured scintillation screens
US5455849A (en) 1994-09-01 1995-10-03 Regents Of The University Of California Air-core grid for scattered x-ray rejection
US5712483A (en) * 1996-06-28 1998-01-27 The Regents Of The University Of California X-ray grid-detector apparatus
US5981959A (en) 1997-12-05 1999-11-09 Xerox Corporation Pixelized scintillation layer and structures incorporating same

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2167279A (en) * 1984-11-15 1986-05-21 Ian Redmayne Radiation imaging
US5334843A (en) * 1992-08-17 1994-08-02 Zeman Herbert D Composite scintillator screen
US5446286A (en) * 1994-08-11 1995-08-29 Bhargava; Rameshwar N. Ultra-fast detectors using doped nanocrystal insulators

Also Published As

Publication number Publication date
WO2002033723A2 (en) 2002-04-25
US6534772B1 (en) 2003-03-18
AU2002216624A1 (en) 2002-04-29

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