WO2001046677A2 - Irradiating device with highly flexible membrane bellows - Google Patents
Irradiating device with highly flexible membrane bellows Download PDFInfo
- Publication number
- WO2001046677A2 WO2001046677A2 PCT/EP2000/011207 EP0011207W WO0146677A2 WO 2001046677 A2 WO2001046677 A2 WO 2001046677A2 EP 0011207 W EP0011207 W EP 0011207W WO 0146677 A2 WO0146677 A2 WO 0146677A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- flange
- sample
- bellows
- sample chamber
- radiation source
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/25—Tubes for localised analysis using electron or ion beams
- H01J2237/2505—Tubes for localised analysis using electron or ion beams characterised by their application
- H01J2237/2555—Microprobes, i.e. particle-induced X-ray spectrometry
Definitions
- the invention relates generally to a device for irradiating a sample in a sample chamber at predetermined irradiation angles and for observing the sample or for detecting scattered radiation emanating from the sample at predetermined observation angles, the pressure chamber in the sample chamber being different from the surroundings.
- the invention also relates to a swivel connection element for components of a system for irradiation or scattered radiation measurement on a sample or for observing the sample at adjustable angles.
- the dispersing element can be, for example, a sample to be examined with X-ray radiation, light or particle radiation or a target for the energy-dispersive scattering of a radiation to be analyzed. If the investigation has to be carried out under vacuum conditions because of the type of radiation used, the technical implementation of the experimental setup with radiation sources or detectors which can be pivoted relative to one another is problematic.
- turntable arrangements are known in which the detector is pivoted in a vacuum on an outer ring of a turntable, in the center of which a dispersing element is arranged in a stationary manner.
- the disadvantages of the turntable arrangement are that the requirements Le gtgangmaschine and vacuum tightness can not be met simultaneously well.
- compromises in terms of vacuum tightness have to be made.
- a multi-differentially pumped seal of the moving parts and the use of materials with a low static friction and a low desorption rate can be provided.
- the overall structure of the rotating arrangement is complicated.
- Another disadvantage of the turntable arrangement is the limited accuracy of the swivel angle setting.
- a so-called jacket shield seal is used.
- a fixed sample chamber with the dispersing element has a slot in the receiving plane. This slot is sealed by a metal tape pressed in from the outside with a small opening to the receiver.
- the object of the invention is to provide an improved irradiation device for specimen irradiation or specimen observation (or scattered radiation detection), in particular under ultra-high vacuum conditions, with which the disadvantages of the conventional rotary arrangements are overcome and with which, in particular, smooth and precise angle adjustment is possible without impairing the vacuum ,
- the object of the invention is also to create a new type of swivel connector element (or: vacuum connector element) for the gas-tight connection of components of an irradiation device with one pivotable radiation source and / or detector device.
- the basic idea of the invention is, in the case of an irradiation device for irradiating a sample in an evacuated sample chamber, to which a radiation source and a detector device are each connected in a vacuum-tight manner, the radiation source and / or the detector device being pivotable relative to the sample with a pivoting device, the radiation source and / or to connect the detector device to the sample chamber via a flexible, gas-tight bellows.
- the radiation source and the detector device there is an overpressure or underpressure with respect to the environment.
- the detector device is generally used to observe the sample or to detect scattered radiation from the sample.
- the bellows used according to the invention is a membrane bellows, at the ends of which a flange is provided for gas-tight (in particular: vacuum-tight) attachment to the sample chamber or the radiation source and / or the detector device.
- a membrane bellows is preferably used, which has one or more of the following modifications compared to a conventional membrane bellows.
- At least one of the flanges has a welding collar which protrudes into the sample chamber or radiation source and / or detector device via a reference plane which is formed by the flange.
- the corresponding end of the membrane bellows is attached to the weld-on collar and is thus advanced towards the sample chamber, radiation source or detector device.
- the pivot point is accordingly advanced to the center of the sample.
- the flange with the weld-on collar is provided on its rear side opposite to the free end with a rounding which runs along the inner edge of the flange. This increases the pivotability of the membrane bellows and the viewing angle through the bellows connection or prevents kinking on the inner edge of the flange.
- the flange with the welding collar advanced is designed for countersunk screwing.
- the flange has, for example, threaded bores for receiving a screw connection with the adjacent sample chamber (or the detector or the radiation source). This allows a further increase in the pivotability of the diaphragm bellows or the viewing angle and the avoidance of injuries or undesirable bending of the bellows joint.
- the bellows connection per se represents a swivel connection element according to the invention, which is suitable for various applications for connecting components of an irradiation device along certain beam directions
- the invention is applicable to a wide variety of research and technology tasks.
- radiation devices can be set up, for example, which have a pivotable source and a fixed detector device, a pivotable source and a pivotable detector device or a stationary source and a pivotable detector device.
- the radiation source can generally be designed for electromagnetic radiation (visible light, X-rays, synchrotron radiation or the like) or for particle radiation (electron beams, atomic or ion beams or the like).
- the sample itself is the subject of the investigation or radiation treatment or is also a target for the energy-dispersive deflection of the radiation.
- the sample can be formed by a solid body positioned in the sample chamber or by a gaseous sample beam guided through the sample chamber.
- the radiation device according to the invention can be designed, for example, to record scattering cross sections on the gaseous sample beam.
- the invention has the following advantages.
- a membrane bellows is used which is commercially available per se, meets all ultra-high vacuum (UHV) requirements and can also be baked out.
- UHV ultra-high vacuum
- the bellows connection according to the invention enables an easily adjustable, shading-free, rectilinear beam connection between the radiation source and / or the detector device with the sample, it being possible to set all practical angle ranges of up to around 90 ° and beyond.
- the construction of the radiation device according to the invention is characterized by low technical complexity and the use of inexpensive components.
- the invention has one Wide range of applications from radiation analysis to solid-state analysis to sample processing and is fully compatible with common vacuum systems.
- the vacuum connecting element according to the invention also ensures maximum optical transmission when irradiating large-area samples.
- the invention can be used not only with vacuum systems, but in general with all radiation or observation devices with an absolute or gas-specific (differential) pressure difference in relation to the environment.
- FIG. 1 a schematic top view of an irradiation device according to the invention
- FIG. 2 a partial sectional view of a membrane bellows according to the invention
- FIG. 3 a schematic top view of an irradiation device according to the invention for energy-selective analysis of X-rays
- Figure 4 is a partial sectional view of an irradiation device according to the invention with a conventional membrane bellows.
- an irradiation device 100 comprises a radiation source 10, a sample chamber 20, a detector device 30, a swivel device 40 and at least one bellows connection 50.
- the radiation source Depending on the application, 10 is a source of electromagnetic radiation (e.g. lens, X-ray source, synchrotron radiation source) or a particle source (e.g. electron source, atomic source, neutron source, ion source) with certain emission properties or also a source with initially unknown radiation properties in an additional one, not in detail shown experimental setup.
- the radiation source 10 is connected to the sample chamber 20 via a straight, vacuum-tight connecting tube 11.
- the connecting tube 11 is directed towards the sample 21 in accordance with the direction of irradiation 12.
- Scattering or an emission excited by the radiation occurs on the sample 21.
- both types of radiation are referred to as scattered radiation.
- the connection between the radiation source and the sample chamber can be modified depending on the application and z. B. include through a window or any connection with "optical" beam steering elements.
- the scattered radiation is detected with the detector device 30 illustrated in two positions A, B, which contains a suitable radiation receiver 31.
- the radiation receiver 31 is, for example, a light receiver (photodiode or photodiode arrangement), an X-ray detector or a particle detector.
- the detector device 30 can be swiveled along a circular swivel line 41 to detect the scattered radiation according to different observation directions 32a, 32b (see arrow direction).
- the swiveling device 40 comprises in particular a rail arrangement for guiding the detector device 30 along the swiveling line 41 and a drive for adjusting the detector device 30.
- the observation directions 32a, 32b can be adjusted over an angular range ⁇ which generally comprises up to 90 °, S with a suitable design of the bellows connection 50 can also be larger (eg 120 °).
- the bellows connection 50 comprises a flexible membrane bellows 51, which has a sample-side flange 52 or a detector-side flange 53 at its ends.
- the membrane bellows 51 consists of a series of metal rings of small thickness, which are welded together alternately on their outer and inner edges. Two adjacent metal rings of the diaphragm bellows 51 form a pair of diaphragms.
- the metal rings have a thickness such that approx. 0.7 mm per pair of membranes, and are preferably made of stainless steel.
- the flexible diaphragm bellows used to construct the bellows connection according to the invention has the following important deformation properties. If the diaphragm bellows 51 is clamped at its ends along differently aligned reference planes in accordance with the position of the flanges mentioned, it performs a combined deformation which consists of two opposite angular displacements. The deformation takes place in such a way that the membrane bellows 51 minimizes its surface.
- An evacuated diaphragm bellows UHV in the interior of diaphragm bellows 51
- the restoring force is formed so that the diaphragm bellows is aligned as straight as possible.
- a membrane bellows used in a bellows connection according to the invention is characterized in that the lateral or angular restoring force is less than the axial force which leads to the linear deformation of the membrane bellows.
- the bellows connection based on a highly flexible membrane bellows provides a vacuum-tight and largely straight connection between the sample chamber 20 and the detector device 30, each of which corresponds to the desired direction of observation (eg 32a, 32b) can be set.
- the desired direction of observation eg 32a, 32b
- special precautions are taken on the flange 52 on the sample side, which are explained in detail below with reference to FIG.
- the radiation source 10 the sample chamber 20 and the swivel device 40 are fixed relative to one another, while the detector device 30 is movable.
- the radiation source 10 is also connected to the sample chamber 20 via a bellows connection.
- the detector device 30 can also be fixed in place or can be completely omitted for certain radiation tasks that do not depend on the detection of scattered radiation (e.g. ion bombardment of semiconductor surfaces).
- FIG. 2 Details of the sample-side flange 52 of the bellows connection 50 are illustrated in FIG. 2. At the end of the membrane bellows 51, the sample-side flange 52 is welded on. The sample-side flange 52 forms a forward welding collar and projects into the attachment flange 22 of the sample chamber 20 at the free end with a circumferential step projection 54 m. At the ledge 54 is the end of the Membrane bellows 51 welded on. The membrane bellows 51 ends in the sample chamber 20 beyond the reference plane, which is formed by the flange connection between the attachment flange 22 and the flange 52 on the sample side.
- the bellows connection 50 can be attached to the sample chamber 20 such that the sample 21 is positioned centrally at the end of the membrane bellows 51.
- the center Z of the bellows rotary movement thus coincides essentially with the position of the sample 21 in the direction of irradiation 12.
- the reference plane formed by the flange connection is oriented obliquely with respect to the direction of irradiation 12.
- the direction of irradiation 12 runs through the attachment flange 22 or the flange 52 (see FIG. 1).
- Reference numeral 56 indicates an enlarged representation of a pair of membranes.
- the flange 52 on the sample side is provided with a rounded portion 55 on its inner edge.
- the rounding 55 has a radius of curvature which is selected depending on the application for optimal use of the swivel range and is, for example, around 25 mm.
- the screw connection 57 is recessed with the adjacent flange.
- the flange 52 has an internal thread for screw connection with the shoulder flange 22. A mutual hindrance of the bellows and flange or an injury to the bellows by protruding bolts or nuts is avoided.
- FIG. 3 shows an irradiation device according to the invention using the example of a Bragg crystal spectrometer.
- a primary beam 13 to be analyzed strikes the sample 21 in the sample chamber 20 along the irradiation direction 12 via an attachment flange 23.
- the sample 21 is a crystal (eg quartz), which acts as a target for diffraction of the primary beam 13 serves.
- the sample 21 is arranged pivotably in the sample chamber 20 in order to optimize the crystal orientation in relation to the energy range of the primary beam to be detected.
- the axis of rotation Z of the sample 21 coincides with the pivot axis of the membrane bellows 50.
- the membrane bellows 50 is connected to the sample chamber 20 via the sample-side flange 52 and the attachment flange 22, as is illustrated in FIG. 2.
- the sample chamber 20 is in the form of a half-shell (hemisphere) with a diameter corresponding to the diameter of the flange 52 with the membrane bellows advanced. This ensures that the detector can observe a maximum target area in all swivel positions.
- the detector device 30 is set in accordance with a predetermined observation direction 32.
- the detector device 30 comprises in particular an X-ray detector 31, an extension bellows 33 and an attachment flange 34 which is connected to the detector-side flange 53 of the bellows connection
- the distance between the detector 31 and the sample 21 is extended in order to achieve an improvement in the resolution in the scattered radiation analysis.
- the diaphragm bellows 51 is a highly flexible, corrosion-resistant diaphragm bellows made of the material AM 350 (manufacturer: VAT Deutschland GmbH) with a nominal width of 150 mm and a leak rate ⁇ 10 "9 mbar '1 / s.
- FIG. 51 is a DN 150 Conflat flange.
- the flange 52 on the sample is also a DN 150 Conflat flange, which, however, is modified as described above by attaching the welding collar and the rounding.
- Figure 3 illustrates an important advantage of the invention.
- the scattered radiation from the entire area of the sample 21 irradiated with the primary beam 13 is directed onto the detector device 30 without a shadow.
- the shadow clearance is ensured, even with relatively large samples with characteristic dimensions of up to 10 '10 cm 2.
- the inside diameter of the membrane bellows is around 180 mm. In the relaxed state, the length of the membrane bellows 51 is around 25 cm.
- FIG. 4 schematically shows the structure according to FIG. 3 with a conventional bellows. Without a forward pivot point or without rounding on the flange back side, there is a reduced viewing angle or shading 35 on the detector 31. In addition, there is a risk of a bellows injury on the screw connections 57 above.
- the radiation device according to the invention can generally be used in all systems in which a radiation source and / or a detector device are to be pivoted with respect to a fixed axis of rotation over a large swiveling range, with none between the radiation source and the sample or between the sample and the detector device
- the internal gas pressure or vacuum in the system breaks.
- Preferred applications are in the construction of a Bragg crystal spectrometer, a spectrometer for angle-resolved particle registration and in all arrangements in which the conventional one Turntable construction with an angular range of around 100 ° is to be replaced.
- the membrane bellows consists of other metals (e.g. aluminum) or plastic (e.g. PTFE), has dimensions other than those given here by way of example and / or has a rectangular or otherwise shaped cross section has.
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP00972908A EP1240505A2 (en) | 1999-12-22 | 2000-11-13 | Irradiating device with highly flexible membrane bellows |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19962198.5 | 1999-12-22 | ||
DE1999162198 DE19962198C2 (en) | 1999-12-22 | 1999-12-22 | Irradiation facility with a highly flexible membrane bellows |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2001046677A2 true WO2001046677A2 (en) | 2001-06-28 |
WO2001046677A3 WO2001046677A3 (en) | 2002-01-24 |
Family
ID=7933928
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2000/011207 WO2001046677A2 (en) | 1999-12-22 | 2000-11-13 | Irradiating device with highly flexible membrane bellows |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1240505A2 (en) |
DE (1) | DE19962198C2 (en) |
WO (1) | WO2001046677A2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP4095523A1 (en) * | 2021-05-27 | 2022-11-30 | Anton Paar GmbH | X-ray examination apparatus |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003322611A (en) | 2002-04-30 | 2003-11-14 | Horiba Ltd | Measuring chamber equipped with optical window |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5094099A (en) * | 1988-06-23 | 1992-03-10 | Ross Ronald D | Chromatographic collection apparatus and method for sequential condensed and vapor phase spectroscopic studies |
DE4121149A1 (en) * | 1991-06-26 | 1993-01-07 | Siemens Ag | X=ray analysis equipment for sample crystal structure - uses transparent measurement chamber having wall provided with retention fluorescent material |
US5732120A (en) * | 1994-07-06 | 1998-03-24 | Rigaku Industrial Corporation | Fluorescent X-ray analyzing apparatus |
WO1999015885A1 (en) * | 1997-09-19 | 1999-04-01 | Japan Science And Technology Corporation | High vacuum xafs measuring instrument |
-
1999
- 1999-12-22 DE DE1999162198 patent/DE19962198C2/en not_active Expired - Fee Related
-
2000
- 2000-11-13 WO PCT/EP2000/011207 patent/WO2001046677A2/en not_active Application Discontinuation
- 2000-11-13 EP EP00972908A patent/EP1240505A2/en not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5094099A (en) * | 1988-06-23 | 1992-03-10 | Ross Ronald D | Chromatographic collection apparatus and method for sequential condensed and vapor phase spectroscopic studies |
DE4121149A1 (en) * | 1991-06-26 | 1993-01-07 | Siemens Ag | X=ray analysis equipment for sample crystal structure - uses transparent measurement chamber having wall provided with retention fluorescent material |
US5732120A (en) * | 1994-07-06 | 1998-03-24 | Rigaku Industrial Corporation | Fluorescent X-ray analyzing apparatus |
WO1999015885A1 (en) * | 1997-09-19 | 1999-04-01 | Japan Science And Technology Corporation | High vacuum xafs measuring instrument |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP4095523A1 (en) * | 2021-05-27 | 2022-11-30 | Anton Paar GmbH | X-ray examination apparatus |
AT525137A1 (en) * | 2021-05-27 | 2022-12-15 | Anton Paar Gmbh | X-ray examination device |
US11821856B2 (en) | 2021-05-27 | 2023-11-21 | Anton Paar Gmbh | X-ray examination device |
AT525137B1 (en) * | 2021-05-27 | 2024-05-15 | Anton Paar Gmbh | X-ray examination device |
Also Published As
Publication number | Publication date |
---|---|
DE19962198A1 (en) | 2001-07-12 |
EP1240505A2 (en) | 2002-09-18 |
DE19962198C2 (en) | 2001-12-13 |
WO2001046677A3 (en) | 2002-01-24 |
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