WO2001034399A1 - Printing head and method for making same - Google Patents

Printing head and method for making same Download PDF

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Publication number
WO2001034399A1
WO2001034399A1 PCT/FR2000/003125 FR0003125W WO0134399A1 WO 2001034399 A1 WO2001034399 A1 WO 2001034399A1 FR 0003125 W FR0003125 W FR 0003125W WO 0134399 A1 WO0134399 A1 WO 0134399A1
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WO
WIPO (PCT)
Prior art keywords
diodes
elementary
support
manufacturing
blocks
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PCT/FR2000/003125
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French (fr)
Inventor
Benoît Giffard
Christel Buj-Dufournet
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Commissariat A L'energie Atomique
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Publication of WO2001034399A1 publication Critical patent/WO2001034399A1/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/315Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material
    • B41J2/32Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads
    • B41J2/345Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads characterised by the arrangement of resistors or conductors
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/315Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material
    • B41J2/32Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads
    • B41J2/335Structure of thermal heads
    • B41J2/34Structure of thermal heads comprising semiconductors

Definitions

  • the invention relates to a printhead and a method for producing a printhead.
  • the invention applies to the field of support printing and, more particularly, of high density support printing.
  • a known printing technique is printing using bars. Each bar is made up of elementary points arranged side by side. Each elementary point is either a self-induction or a resistance, depending on whether the printing signal is magnetostatic or thermal. One or more strips placed end to end form a line the width of the support to be printed.
  • the support which receives the impression scrolls in relation to the bars which transform the electrical writing signals received either into magnetic signals or into thermal signals.
  • the printing of the support is carried out line by line by relative scrolling of the support and the bars. Each elementary point of each bar receives a write signal which is renewed with each line to be printed.
  • each elementary point and each diode comprises a second electrical connection (internal connection), so that a single diode is connected to a single elementary point.
  • Each diode of the same line is connected to an elementary point of a different column and each elementary point of a column is connected to a diode of a different line.
  • the simultaneous selection of a column and a row activates only the elementary point of the column linked to the diode of the selected row.
  • the number L of rows and the number C of columns are such that the product L x C is equal to the total number of elementary points of a bar.
  • the total number of external electrical connections is then equal to L + C. These external electrical connections allow addressing.
  • the elementary points have dimensions all the smaller when it is necessary to carry out a printing at high resolution.
  • the density of elementary points is commonly measured in number of points per inch or dp (the abbreviation dpi comes from the English "dot per mch").
  • the diodes are individually attached to a support by wire wiring or via a printed circuit, the elementary points being integrated on the support or attached to it. This technique does not provide high resolution printing.
  • the diodes are grouped functionally into L lines of C diodes. Each diode in a group of C diodes is electrically isolated from the other diodes in the group and the groups of diodes are electrically isolated from each other.
  • a magnetographic printing head of this type is described in the document entitled "Silicon-Based Structures for High-Density Magnetographic Heads ith Co-Integrated Multiplexmg Electronics", Proc. ISKT's Tenth International Congress On Advances m Non- Impact Printing Technologies. New Orleans, 1994, pp. 534-538.
  • the insulations between diodes and / or groups of diodes are made by reverse voltage polarized junctions.
  • the configurations thus implemented to ensure insulation between the diodes lead to the appearance of structures capable of causing the establishment of parasitic currents. It is then possible that a spurious impression takes place at unselected elementary points.
  • the parasitic structures which appear are multifunctional bipolar structures capable of causing a phenomenon commonly referred to as a "latch-up".
  • the “latch-up” phenomenon is due to the presence of a parasitic structure of 4 PNPN layers of the thyristor type which is capable of suddenly becoming conductive and of locking in this state, which can lead to the degradation of the function or component.
  • the "latch-up" phenomenon can be reduced by moving the diodes and / or groups of diodes away from each other, or even by making buried layers that are not very resistive.
  • the low resistive buried layers are high doping layers of P + or N + type under the devices which drain the parasitic currents likely to initialize the "latch-up".
  • the distance between the diodes and groups of diodes is limited by the desired density of the elementary points and the low resistive buried layers are difficult to produce.
  • the diodes have a relatively high parasitic resistance.
  • a parasitic diode resistance produced in silicon can be of the order of 10 ⁇ . This resistance is due to the lateral path of the current in the silicon whose optimal doping is limited.
  • the currents required in the diodes are high, which is the case, for example, for magnetographic or thermal strips, such parasitic diode resistance leads to significant heating of the component.
  • Another problem consists in the complexity of producing diodes and elementary points, in particular of the magnetographic type, on the same substrate during the same process.
  • the process for manufacturing the elementary points is hardly compatible with the production of diodes.
  • This also results in an additional cost since the diodes must occupy a surface of silicon with high added value (silicon) which is used to manufacture the elementary points whereas the diode itself could be made independently on a substrate with low added value.
  • the invention does not have the drawbacks mentioned above.
  • the invention relates to a print head comprising at least one bar of L x C elementary points and a matrix addressing device of elementary points of type L rows x C columns for selecting an elementary point of the bar, the addressing device comprising selection diodes, each selection diode being paired and connected to an elementary point.
  • the diodes are grouped on a support in L independent blocks of C diodes per block, the diodes of the same block being mounted as a common electrode.
  • the invention also relates to a method of manufacturing a print head comprising at least one bar of L x C elementary points and a matrix addressing device of elementary points of type L rows x C columns for selecting an elementary point of the bar. , the addressing device comprising selection diodes, each selection diode being paired and connected to an elementary point.
  • the method comprises a step of manufacturing L independent blocks of C diodes per block and a step of transferring the blocks onto a support, the diodes of the same block being mounted as a common electrode.
  • An advantage of the invention consists, among other things, in suppressing the appearance of parasitic currents in the print head.
  • FIG. 1 represents a print head according to a first embodiment of the invention
  • FIG. 2 represents a print head according to a second embodiment of the invention
  • FIG. 3 represents the sectional view of a block of diodes according to an exemplary embodiment of the invention
  • FIGS. 4A-4C represent a method for producing a block of diodes according to the exemplary embodiment of FIG. 3.
  • Figure 1 shows a print head according to a first embodiment of the invention.
  • the print head comprises a support 17 and
  • the support 17 includes 4 elementary points PI, P2, P3, P4 as well as internal conductive links 15,
  • FIG. 1 represents an exemplary embodiment of the invention for which the matrix addressing device is a device with 2 rows and 2 columns. More generally, however, the invention relates to a printhead comprising L x C elementary dots and L blocks of C diodes to define a matrix addressing device with L rows and C columns.
  • the diodes of the blocks are either a self-induction or a resistance depending on whether the printing signal is magnetostatic or thermal.
  • the diodes of the blocks are either a self-induction or a resistance depending on whether the printing signal is magnetostatic or thermal.
  • B1 and B2 are produced collectively in a common structure (cf. FIGS. 4A-4C).
  • the structure is then cut to form the individual blocks Bl and B2.
  • Each diode has two electrodes, an anode and a cathode.
  • the two diodes contained in the block B1 have a common electrode 3 and the two diodes contained in the block B2 have a common electrode 6.
  • the common electrodes 3 and 6 can be either the anodes or the cathodes of the diodes.
  • the common electrode 3 of the diodes of the block B1 is connected to a first addressing line L1 (external connection) and the common electrode 6 of the diodes of the block B2 is connected to a second addressing line L2 (external connection). These lines are produced on the support 17.
  • the electrodes 1 and 2 of the 2 diodes of the block B1 which are not the common electrode 3 are respectively connected to the first terminals 8 and 10 of the elementary points PI and P2.
  • the electrodes 4 and 5 of the 2 diodes of the block B2 which are not the common electrode 6 are respectively connected to the terminals 12 and 14 of the elementary points P3 and P4.
  • the second terminals 7 and 11 of the elementary points PI and P3 are connected to the same first addressing column C1 (external connection) and the second terminals 9 and 13 of the elementary points P2 and P4 are connected to the same second addressing column C2 (external connection).
  • mounting the diodes by transferring independent diode blocks to a support eliminates any risk of "latch-up" as well as any crosstalk between diode blocks. It is then possible to achieve a very high density of elementary points, for example a density of 1200 dpi. Since the diode blocks are physically isolated from each other when the diode circuits are cut, it is possible to produce them on highly conductive epitaxial substrates, which achieves the low resistance function at low cost at low cost of the diode and decreases the power dissipated during operation.
  • B1 and B2 is a transfer type assembly on substrate by inversion commonly known as a "flip-chip” assembly.
  • a “flip-chip” type mounting of a component on a support uses a component of which all the wiring pads are located on the same face of the component. It is then the face of the component on which the wiring pads are located which is transferred to the support.
  • the bar shown in FIG. 1 integrated into the support could be produced in an independent substrate and transferred also by mounting "flip-chip" on the support to reduce on the one hand wired cabling and use a low cost support.
  • the invention also relates to the case where the transfer of the diode blocks to the support is not an assembly of the "flip-chip" type.
  • the diode blocks then have their common electrode on a first face, the other electrodes being located on the face opposite to the first face.
  • This other type of assembly is shown in Figure 2.
  • FIG. 2 represents, moreover, a second embodiment of the invention according to which the elementary points PI, P2, P3, P4 are not produced in the support on which the blocks Bl and
  • the elementary points PI, P2, P3, P4 are produced in a substrate 18.
  • the substrate 18, like the diode blocks, are transferred onto the same support 19 by the transfer technique without flipping.
  • the addressing lines L1, L2 and the addressing columns C1, C2 are produced on the support 19.
  • the common electrode of the diode block B1 is transferred to a pad 20 of the support 19 electrically connected to the line L1.
  • the common electrode of the diode block B2 is transferred to a pad 21 of the support 19 electrically connected to the line L2.
  • the electrodes of the 2 diodes of block Bl which are not the common electrode are connected by connection wires, one to terminal 8 of elementary point PI, and the other to terminal 10 of elementary point P2.
  • the electrodes of the 2 diodes in block B2 which are not the common electrode are connected by connection wires, one to terminal 12 of elementary point P3, and the other to terminal 14 of point elementary P4.
  • the transfer of the diode blocks to the support (17, 19) can be done individually, diode block by diode block, or collectively, all or part of the diode blocks being previously grouped.
  • each support (17, 19) is made in one piece.
  • the invention however relates to other embodiments for which each support (17, 19) can be made of several separate blocks.
  • FIG. 3 represents a sectional view of a block of diodes according to an exemplary embodiment of the invention.
  • the diodes of the block are mounted as a common anode.
  • the semiconductor substrate from which the diodes are made is then a P-type substrate.
  • the diodes of the block are mounted as a common cathode and the semiconductor substrate from which the diodes are made is a N-type substrate.
  • FIG. 3 represents 2 diodes with a common anode.
  • a first diode consists of an electrode 28 forming a cathode, an N + doped region 30, a zone 31 of P-doped substrate, a region 32 doped P + and an electrode 33 forming a common anode.
  • a second diode consists of an electrode 29 forming a cathode, an N + doped region 21, a zone 22 of P-doped substrate, a region 23 doped P + and the electrode 33 forming a common anode.
  • the conductivity of zones 32 and 23 of P + doped substrate is advantageously very high, for example equal to 100 ⁇ "1 .cm " 1 , and regions 31 and 22 are part of a zone P whose doping and thickness are compatible with the voltage withstand of the diodes in reverse, that is, for example, a few tens of volts.
  • the zone P is advantageously obtained by epitaxy on the substrate P + .
  • a P + doped area 24 separates the N + 30 and 21 doped regions.
  • the area 24 is advantageously diffused so as to be in contact with the P + doped substrate area.
  • the access resistance to the common anode is then minimal.
  • the gain of the parasitic bipolar transistor made up of zones N + 30 and 21 and of zone P + 24 is consequently minimal, which induces minimal crosstalk. Oxidation 25, 26, 27 is carried out on the upper face of the diode block.
  • the common anode of the diodes of the diode block is located on the rear face, that is to say opposite the face where the cathodes are located 28 and 29.
  • the invention however also relates to the case (not shown in the figures) where the common anode is located on the same face as that where the cathodes 28 and 29 are located.
  • the common anode is produced using a metallization covering the zone 24 which separates the 2 diodes after opening in the oxide 26.
  • FIGS. 4A-4C represent a method for producing a block of diodes according to the exemplary embodiment of FIG. 3.
  • FIG. 4A represents the formation of the P + doped zones 24.
  • a silicon substrate 34 doped P in its upper part and P + in its lower part is covered on its upper face with an oxide layer 35 and on its lower face with an oxide layer 36.
  • a set of masks Ml , M2, M3, M4 are placed on the oxide layer 35 which covers the upper face of the silicon substrate.
  • the P + doped zones 24 are produced by implantation or doping diffusion of ions on the upper face of the silicon substrate, for example boron ions. As mentioned previously, the P + doping is advantageously carried out so that the zones 24 join the P + doped zone of the substrate 34.
  • FIG. 4B represents the formation of the zones
  • the masks M1, M2, M3 and M4 have been removed.
  • a thick oxide is deposited on top of the oxide layer 35 forming a new oxide layer. Openings are then made by photolithography in this new oxide layer so that the zones 24 are covered with thick oxide layers 25, 26, 27 protecting them from implantation or diffusion. During this etching, the oxide 36 is incidentally removed.
  • the N + zones are then produced by implantation or doping diffusion of ions, for example arsenic or phosphorus ions, in the P-doped upper part of the substrate 34.
  • FIG. 4C represents the metallization of the front and rear faces of the diode block.
  • the metallization 28 is formed in contact with the N + doped region 30 and the metallization 29 is formed in contact with the N + doped region 21.
  • the underside of the silicon substrate 34 is covered with metallization 33.
  • the metallization 33 constitutes the common anode contact on the rear face of the diode block.
  • the contact common anode can also be made on the front face.
  • a fraction of at least one zone 24 is then covered with a metallization to ensure contact with the common anode on the front face.
  • the diodes for selecting the elementary points can be produced according to a simple process which makes it possible to obtain chips at low cost while guaranteeing minimal parasitic structures.

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  • Printers Or Recording Devices Using Electromagnetic And Radiation Means (AREA)
  • Facsimile Heads (AREA)

Abstract

The invention concerns a printing head comprising at least one stick of L x C elementary points and a matrix addressing device of elementary points of the type L lines x C columns for selecting an elementary point of the stick, the addressing device comprising selecting diodes, each selecting diode being paired and connected to an elementary point of the stick. The diodes are assembled on a support in independent L blocks (B1, B2) of C diodes per block. The invention is useful for high density base fabric printing.

Description

TETE D'IMPRESSION ET PROCEDE DE REALISATION DE TETE PRINTHEAD AND METHOD FOR PRODUCING THE HEAD
D ' IMPRESSIONPRINTING
Domaine technique et art antérieurTechnical field and prior art
L'invention concerne une tête d'impression ainsi qu'un procédé de réalisation de tête d' impression .The invention relates to a printhead and a method for producing a printhead.
L'invention s'applique au domaine de l'impression de support et, plus particulièrement, de l'impression de support à haute densité. Une technique d'impression connue est l'impression à l'aide de barrettes. Chaque barrette est constituée de points élémentaires disposés côte à côte. Chaque point élémentaire est soit une self-induction, soit une résistance, selon que le signal d'impression est magnétostatique ou thermique. Une ou plusieurs barrettes mises bout à bout forment une ligne de la largeur du support à imprimer.The invention applies to the field of support printing and, more particularly, of high density support printing. A known printing technique is printing using bars. Each bar is made up of elementary points arranged side by side. Each elementary point is either a self-induction or a resistance, depending on whether the printing signal is magnetostatic or thermal. One or more strips placed end to end form a line the width of the support to be printed.
Le support qui reçoit l'impression défile par rapport aux barrettes qui transforment les signaux électriques d'écriture reçus soit en signaux magnétiques, soit en signaux thermiques. L'impression du support s'effectue ligne par ligne par défilement relatif du support et des barrettes. Chaque point élémentaire de chaque barrette reçoit un signal d'écriture qui se renouvelle à chaque ligne à imprimer.The support which receives the impression scrolls in relation to the bars which transform the electrical writing signals received either into magnetic signals or into thermal signals. The printing of the support is carried out line by line by relative scrolling of the support and the bars. Each elementary point of each bar receives a write signal which is renewed with each line to be printed.
Afin d'éviter de connecter par une liaison électrique élémentaire chaque point élémentaire de chaque barrette au circuit de commande d'écriture, il est connu d'utiliser un adressage séquentiel de plusieurs points élémentaires à l'aide d'un câblage approprié. Le nombre de liaisons électriques entre le circuit de commande d'écriture et une barrette est alors moins grand. L'adressage peut être réalisé en associant une diode de sélection à chaque point élémentaire. Un point élémentaire peut alors être sélectionné indépendamment des autres points .In order to avoid connecting each elementary point of each bar to the write control circuit by an elementary electrical connection, it is known practice to use a sequential addressing of several elementary points using appropriate wiring. The number of electrical connections between the write control circuit and a strip is then smaller. Addressing can be carried out by associating a selection diode with each elementary point. An elementary point can then be selected independently of the other points.
Pour une même barrette, les points élémentaires sont fonctionnellement associés en C groupes que l'on appellera "colonnes" et les diodes de sélection sont fonctionnellement associées en L groupes que l'on appellera "lignes". L'ensemble des points élémentaires d'une même colonne ont une liaison électrique commune externe et l'ensemble des diodes de sélection d'une même ligne ont une liaison électrique commune. L'activation électrique de la liaison électrique commune externe d'une ligne ou d'une colonne permet l'adressage de ladite ligne ou de ladite colonne. Par ailleurs, chaque point élémentaire et chaque diode comprend une deuxième liaison électrique (liaison interne), de sorte qu'une seule diode soit reliée à un seul point élémentaire. Chaque diode d'une même ligne est reliée à un point élémentaire d'une colonne différente et chaque point élémentaire d'une colonne est relié à une diode d'une ligne différente. La sélection simultanée d'une colonne et d'une ligne active uniquement le point élémentaire de la colonne relié à la diode de la ligne sélectionnée. Le nombre L de lignes et le nombre C de colonnes sont tels que le produit L x C est égal au nombre total de points élémentaires d'une barrette. Le nombre total de liaisons électriques externes est alors égal à L+C . Ces liaisons électriques externes permettent l'adressage. Les points élémentaires ont des dimensions d'autant plus petites qu'il est nécessaire de réaliser une impression à haute résolution. La densité des points élémentaires se mesure communément en nombre de points par pouce ou dp (l'abréviation dpi provient de l'anglais "dot per mch").For the same bar, the elementary points are functionally associated in C groups which will be called "columns" and the selection diodes are functionally associated in L groups which will be called "lines". All of the elementary points of the same column have an external common electrical connection and all of the selection diodes of the same line have a common electrical connection. The electrical activation of the external common electrical connection of a line or of a column allows the addressing of said line or of said column. Furthermore, each elementary point and each diode comprises a second electrical connection (internal connection), so that a single diode is connected to a single elementary point. Each diode of the same line is connected to an elementary point of a different column and each elementary point of a column is connected to a diode of a different line. The simultaneous selection of a column and a row activates only the elementary point of the column linked to the diode of the selected row. The number L of rows and the number C of columns are such that the product L x C is equal to the total number of elementary points of a bar. The total number of external electrical connections is then equal to L + C. These external electrical connections allow addressing. The elementary points have dimensions all the smaller when it is necessary to carry out a printing at high resolution. The density of elementary points is commonly measured in number of points per inch or dp (the abbreviation dpi comes from the English "dot per mch").
Pour des densités faibles, les diodes sont rapportées individuellement sur un support par câblage filaire ou via un circuit imprimé, les points élémentaires étant intégrés sur le support ou rapportés sur celui-ci. Cette technique ne permet pas d'obtenir une impression à haute résolution.For low densities, the diodes are individually attached to a support by wire wiring or via a printed circuit, the elementary points being integrated on the support or attached to it. This technique does not provide high resolution printing.
Pour des densités moyennes ou fortes, par exemple 480 dpi, il est connu de réaliser les points élémentaires et les diodes dans un même substrat. Comme cela a été mentionné précédemment, les diodes sont regroupées fonctionnellement en L lignes de C diodes. Chaque diode d'un groupe de C diodes est électriquement isolée des autres diodes du groupe et les groupes de diodes sont électriquement isolés les uns des autres.For medium or high densities, for example 480 dpi, it is known to produce the elementary points and the diodes in the same substrate. As mentioned previously, the diodes are grouped functionally into L lines of C diodes. Each diode in a group of C diodes is electrically isolated from the other diodes in the group and the groups of diodes are electrically isolated from each other.
Une tête d'impression magnétographique de ce type est décrite dans le document intitulé "Silicon- Based Structures for High-Density Magnetographic Heads ith Co-Integrated Multiplexmg Electronics", Proc. ISKT's Tenth International Congress On Advances m Non- Impact Printing Technologies. New Orléans, 1994, pp. 534-538.A magnetographic printing head of this type is described in the document entitled "Silicon-Based Structures for High-Density Magnetographic Heads ith Co-Integrated Multiplexmg Electronics", Proc. ISKT's Tenth International Congress On Advances m Non- Impact Printing Technologies. New Orleans, 1994, pp. 534-538.
Les isolations entre diodes et/ou groupes de diodes sont réalisées par des jonctions polarisées en tension inverse. Les configurations ainsi mises en oeuvre pour assurer l'isolation entre les diodes conduisent à l'apparition de structures susceptibles de provoquer l'établissement de courants parasites. Il est alors possible qu'une impression parasite ait lieu en des points élémentaires non sélectionnés .The insulations between diodes and / or groups of diodes are made by reverse voltage polarized junctions. The configurations thus implemented to ensure insulation between the diodes lead to the appearance of structures capable of causing the establishment of parasitic currents. It is then possible that a spurious impression takes place at unselected elementary points.
Les structures parasites qui apparaissent sont des structures bipolaires multifonctions susceptibles de provoquer un phénomène couramment désigné sous l'appellation de "latch-up". Comme cela est connu de l'homme de l'art, le phénomène de "latch-up" est dû à la présence d'une structure parasite de 4 couches PNPN de type thyristor qui est susceptible de devenir subitement conductrice et de se verrouiller dans cet état, ce qui peut amener la dégradation de la fonction ou du composant.The parasitic structures which appear are multifunctional bipolar structures capable of causing a phenomenon commonly referred to as a "latch-up". As is known to those skilled in the art, the “latch-up” phenomenon is due to the presence of a parasitic structure of 4 PNPN layers of the thyristor type which is capable of suddenly becoming conductive and of locking in this state, which can lead to the degradation of the function or component.
Le phénomène de "latch-up" peut être diminué en éloignant les diodes et/ou les groupes de diodes les uns des autres, ou encore en réalisant des couches enterrées peu résistives. Les couches enterrées peu résistives sont des couches de fort dopage de type P+ ou N+ sous les dispositifs qui drainent les courants parasites susceptibles d' initialiser le "latch-up".The "latch-up" phenomenon can be reduced by moving the diodes and / or groups of diodes away from each other, or even by making buried layers that are not very resistive. The low resistive buried layers are high doping layers of P + or N + type under the devices which drain the parasitic currents likely to initialize the "latch-up".
Cependant, 1 ' éloignement des diodes et groupes de diodes est limité par la densité souhaitée des points élémentaires et les couches enterrées peu résistives sont difficiles à réaliser.However, the distance between the diodes and groups of diodes is limited by the desired density of the elementary points and the low resistive buried layers are difficult to produce.
Par ailleurs, les diodes présentent une résistance parasite relativement élevée. A titre d'exemple, une résistance parasite de diode réalisée dans du silicium peut être de l'ordre de 10 Ω. Cette résistance est due au trajet latéral du courant dans le silicium dont le dopage optimal est limité. Lorsque les courants requis dans les diodes sont importants, ce qui est le cas, par exemple, pour les barrettes magnetographiques ou thermiques, une telle résistance parasite de diode conduit à un echauffement important du composant.Furthermore, the diodes have a relatively high parasitic resistance. By way of example, a parasitic diode resistance produced in silicon can be of the order of 10 Ω. This resistance is due to the lateral path of the current in the silicon whose optimal doping is limited. When the currents required in the diodes are high, which is the case, for example, for magnetographic or thermal strips, such parasitic diode resistance leads to significant heating of the component.
Un autre problème consiste en la complexité de réalisation des diodes et des points élémentaires, notamment de type magnétographique, sur le même substrat au cours du même procédé. En effet, le .procédé de fabrication des points élémentaires est difficilement compatible avec la réalisation de diodes. Il en résulte également un surcoût car les diodes doivent occuper une surface de silicium à forte valeur ajoutée (le silicium) qui sert à fabriquer les points élémentaires alors que la diode elle-même pourrait être faite indépendamment sur un substrat à faible valeur ajoutée .Another problem consists in the complexity of producing diodes and elementary points, in particular of the magnetographic type, on the same substrate during the same process. In fact, the process for manufacturing the elementary points is hardly compatible with the production of diodes. This also results in an additional cost since the diodes must occupy a surface of silicon with high added value (silicon) which is used to manufacture the elementary points whereas the diode itself could be made independently on a substrate with low added value.
Exposé de 1 ' inventionStatement of the invention
L'invention ne présente pas les inconvénients mentionnés ci-dessus. En effet, l'invention concerne une tête d'impression comprenant au moins une barrette de L x C points élémentaires et un dispositif d'adressage matriciel des points élémentaires de type L lignes x C colonnes pour sélectionner un point élémentaire de la barrette, le dispositif d'adressage comprenant des diodes de sélection, chaque diode de sélection étant appariée et reliée à un point élémentaire. Les diodes sont regroupées sur un support en L blocs indépendants de C diodes par bloc, les diodes d'un même bloc étant montées en électrode commune .The invention does not have the drawbacks mentioned above. In fact, the invention relates to a print head comprising at least one bar of L x C elementary points and a matrix addressing device of elementary points of type L rows x C columns for selecting an elementary point of the bar, the addressing device comprising selection diodes, each selection diode being paired and connected to an elementary point. The diodes are grouped on a support in L independent blocks of C diodes per block, the diodes of the same block being mounted as a common electrode.
L'invention concerne également un procédé de fabrication de tête d'impression comprenant au moins une barrette de L x C points élémentaires et un dispositif d'adressage matriciel des points élémentaires de type L lignes x C colonnes pour sélectionner un point élémentaire de la barrette, le dispositif d'adressage comprenant des diodes de sélection, chaque diode de sélection étant appariée et reliée à un point élémentaire. Le procédé comprend une étape de fabrication de L blocs indépendants de C diodes par bloc et une étape de report des blocs sur un support, les diodes d'un même bloc étant montées en électrode commune.The invention also relates to a method of manufacturing a print head comprising at least one bar of L x C elementary points and a matrix addressing device of elementary points of type L rows x C columns for selecting an elementary point of the bar. , the addressing device comprising selection diodes, each selection diode being paired and connected to an elementary point. The method comprises a step of manufacturing L independent blocks of C diodes per block and a step of transferring the blocks onto a support, the diodes of the same block being mounted as a common electrode.
Un avantage de l'invention consiste, entre autres, à supprimer l'apparition de courants parasites dans la tête d'impression.An advantage of the invention consists, among other things, in suppressing the appearance of parasitic currents in the print head.
Brève description des figuresBrief description of the figures
D'autres caractéristiques et avantages de l'invention apparaîtront à la lecture d'un mode de réalisation préférentiel de l'invention fait en référence aux figures ci-annexées parmi lesquelles :Other characteristics and advantages of the invention will appear on reading a preferred embodiment of the invention made with reference to the appended figures among which:
- la figure 1 représente une tête d'impression selon un premier mode de réalisation de l'invention,FIG. 1 represents a print head according to a first embodiment of the invention,
- la figure 2 représente une tête d'impression selon un deuxième mode de réalisation de l'invention, - la figure 3 représente la vue en coupe d'un bloc de diodes selon un exemple de réalisation de 1 ' invention,FIG. 2 represents a print head according to a second embodiment of the invention, FIG. 3 represents the sectional view of a block of diodes according to an exemplary embodiment of the invention,
- les figures 4A-4C représentent un procédé de réalisation d'un bloc de diodes selon l'exemple de réalisation de la figure 3.FIGS. 4A-4C represent a method for producing a block of diodes according to the exemplary embodiment of FIG. 3.
Sur toutes les figures, les mêmes références désignent les mêmes éléments .In all the figures, the same references designate the same elements.
Les figures 1 et 2 représentent le cas L=2 et C=2, mais il est extrapolable à des valeurs élevées de L et C, L>20 et C>20 par exemple.Figures 1 and 2 represent the case L = 2 and C = 2, but it can be extrapolated to high values of L and C, L> 20 and C> 20 for example.
Description détaillée de modes de mise en oeuyre deDetailed description of methods of implementing
1 ' invention La figure 1 représente une tête d'impression selon un premier mode de réalisation de l'invention.1 invention Figure 1 shows a print head according to a first embodiment of the invention.
La tête d'impression comprend un support 17 etThe print head comprises a support 17 and
2 blocs de diodes Bl et B2 reportés sur le support 17.2 blocks of diodes Bl and B2 transferred to the support 17.
Le support 17 comprend 4 points élémentaires PI, P2, P3, P4 ainsi que des liaisons conductrices internes 15,The support 17 includes 4 elementary points PI, P2, P3, P4 as well as internal conductive links 15,
16 permettant de relier les points élémentaires PI, P2,16 making it possible to connect the elementary points PI, P2,
P3, P4 aux diodes des blocs Bl et B2.P3, P4 to the diodes of blocks Bl and B2.
La figure 1 représente un exemple de réalisation de l'invention pour lequel le dispositif d'adressage matriciel est un dispositif à 2 lignes et 2 colonnes. De façon plus générale cependant, l'invention concerne une tête d'impression comprenant L x C points élémentaires et L blocs de C diodes pour définir un dispositif d'adressage matriciel à L lignes et C colonnes. Chaque point élémentaire Pi (i=l, 2, 3, 4) est soit une self-induction, soit une résistance selon que le signal d'impression est magnétostatique ou thermique . De façon préférentielle, les diodes des blocsFIG. 1 represents an exemplary embodiment of the invention for which the matrix addressing device is a device with 2 rows and 2 columns. More generally, however, the invention relates to a printhead comprising L x C elementary dots and L blocks of C diodes to define a matrix addressing device with L rows and C columns. Each elementary point Pi (i = 1, 2, 3, 4) is either a self-induction or a resistance depending on whether the printing signal is magnetostatic or thermal. Preferably, the diodes of the blocks
Bl et B2 sont fabriquées collectivement dans une structure commune (cf. figures 4A-4C) . La structure est ensuite découpée pour former les blocs individuels Bl et B2. Chaque diode comprend deux électrodes, soit une anode et une cathode. Les deux diodes contenues dans le bloc Bl ont une électrode commune 3 et les deux diodes contenues dans le bloc B2 ont une électrode commune 6.B1 and B2 are produced collectively in a common structure (cf. FIGS. 4A-4C). The structure is then cut to form the individual blocks Bl and B2. Each diode has two electrodes, an anode and a cathode. The two diodes contained in the block B1 have a common electrode 3 and the two diodes contained in the block B2 have a common electrode 6.
Les électrodes communes 3 et 6 peuvent être soit les anodes, soit les cathodes des diodes.The common electrodes 3 and 6 can be either the anodes or the cathodes of the diodes.
L'électrode commune 3 des diodes du bloc Bl est reliée à une première ligne d'adressage Ll (liaison externe) et l'électrode commune 6 des diodes du bloc B2 est reliée à une deuxième ligne d'adressage L2 (liaison externe). Ces lignes sont réalisées sur le support 17.The common electrode 3 of the diodes of the block B1 is connected to a first addressing line L1 (external connection) and the common electrode 6 of the diodes of the block B2 is connected to a second addressing line L2 (external connection). These lines are produced on the support 17.
Les électrodes 1 et 2 des 2 diodes du bloc Bl qui ne sont pas l'électrode commune 3 sont respectivement reliées aux premières bornes 8 et 10 des points élémentaires PI et P2. De même, les électrodes 4 et 5 des 2 diodes du bloc B2 qui ne sont pas l'électrode commune 6 sont respectivement reliées aux bornes 12 et 14 des points élémentaires P3 et P4.The electrodes 1 and 2 of the 2 diodes of the block B1 which are not the common electrode 3 are respectively connected to the first terminals 8 and 10 of the elementary points PI and P2. Likewise, the electrodes 4 and 5 of the 2 diodes of the block B2 which are not the common electrode 6 are respectively connected to the terminals 12 and 14 of the elementary points P3 and P4.
Les deuxièmes bornes 7 et 11 des points élémentaires PI et P3 sont reliées à une même première colonne d'adressage Cl (liaison externe) et les deuxièmes bornes 9 et 13 des points élémentaires P2 et P4 sont reliées à une même deuxième colonne d'adressage C2 (liaison externe) .The second terminals 7 and 11 of the elementary points PI and P3 are connected to the same first addressing column C1 (external connection) and the second terminals 9 and 13 of the elementary points P2 and P4 are connected to the same second addressing column C2 (external connection).
Selon l'invention, le montage des diodes par report de blocs de diodes indépendants sur un support supprime tout risque de "latch-up" ainsi que toute diaphonie entre blocs de diodes. Il est alors possible d'atteindre une densité très poussée de points élémentaires, par exemple une densité de 1200 dpi. Les blocs de diodes étant physiquement isolés les uns des autres au moment de la découpe des circuits de diodes, il est possible de les réaliser sur des substrats très conducteurs épitaxiés, ce qui réalise à peu de frais la fonction faible résistance à l'état passant de la diode et diminue la puissance dissipée en fonctionnement .According to the invention, mounting the diodes by transferring independent diode blocks to a support eliminates any risk of "latch-up" as well as any crosstalk between diode blocks. It is then possible to achieve a very high density of elementary points, for example a density of 1200 dpi. Since the diode blocks are physically isolated from each other when the diode circuits are cut, it is possible to produce them on highly conductive epitaxial substrates, which achieves the low resistance function at low cost at low cost of the diode and decreases the power dissipated during operation.
A titre d'exemple, toutes choses égales par ailleurs, la puissance dissipée en fonctionnement peut être réduite de 50% par rapport à l'art antérieur. Sur la figure 1, le montage des blocs de diodesFor example, all other things being equal, the power dissipated during operation can be reduced by 50% compared to the prior art. In Figure 1, the assembly of the diode blocks
Bl et B2 est un montage de type report sur substrat par retournement communément appelé montage "flip-chip".B1 and B2 is a transfer type assembly on substrate by inversion commonly known as a "flip-chip" assembly.
Comme cela est connu de l'homme de l'art, un montage de type "flip-chip" de composant sur un support utilise un composant dont tous les plots de câblage se situent sur une même face du composant. C'est alors la face du composant sur laquelle sont situés les plots de câblage qui est reportée sur le support.As is known to those skilled in the art, a “flip-chip” type mounting of a component on a support uses a component of which all the wiring pads are located on the same face of the component. It is then the face of the component on which the wiring pads are located which is transferred to the support.
Selon une variante de réalisation, la barrette représentée figure 1 intégrée dans le support pourrait être réalisée dans un substrat indépendant et reporté également par montage "flip-chip" sur le support pour réduire d'une part les câblages filaires et utiliser un support faible coût.According to an alternative embodiment, the bar shown in FIG. 1 integrated into the support could be produced in an independent substrate and transferred also by mounting "flip-chip" on the support to reduce on the one hand wired cabling and use a low cost support.
L'invention concerne également le cas où le report des blocs de diodes sur le support n'est pas un montage de type "flip-chip". Les blocs de diodes ont alors leur électrode commune sur une première face, les autres électrodes étant situées sur la face opposée à la première face . Cet autre type de montage (report sans retournement) est représenté en figure 2.The invention also relates to the case where the transfer of the diode blocks to the support is not an assembly of the "flip-chip" type. The diode blocks then have their common electrode on a first face, the other electrodes being located on the face opposite to the first face. This other type of assembly (transfer without reversal) is shown in Figure 2.
La figure 2 représente, par ailleurs, un deuxième mode de réalisation de l'invention selon lequel les points élémentaires PI, P2, P3, P4 ne sont pas réalisés dans le support sur lequel les blocs Bl etFIG. 2 represents, moreover, a second embodiment of the invention according to which the elementary points PI, P2, P3, P4 are not produced in the support on which the blocks Bl and
B2 sont reportés .B2 are carried over.
Selon ce deuxième mode de réalisation de l'invention, les points élémentaires PI, P2, P3, P4 sont réalisés dans un substrat 18. Le substrat 18, comme les blocs de diodes, sont reportés sur un même support 19 par la technique de report sans retournement .According to this second embodiment of the invention, the elementary points PI, P2, P3, P4 are produced in a substrate 18. The substrate 18, like the diode blocks, are transferred onto the same support 19 by the transfer technique without flipping.
Les lignes d'adressage Ll, L2 et les colonnes d'adressage Cl, C2 sont réalisées sur le support 19. L'électrode commune du bloc de diodes Bl est reportée sur un plot 20 du support 19 électriquement relié à la ligne Ll . L'électrode commune du bloc de diodes B2 est reportée sur un plot 21 du support 19 électriquement relié à la ligne L2. Les électrodes des 2 diodes du bloc Bl qui ne sont pas l'électrode commune sont reliées par des fils de connexion, l'une, à la borne 8 du point élémentaire PI, et l'autre, à la borne 10 du point élémentaire P2. De même, les électrodes des 2 diodes du bloc B2 qui ne sont pas l'électrode commune sont reliées par des fils de connexion, l'une à la borne 12 du point élémentaire P3, et l'autre, à la borne 14 du point élémentaire P4. Outre les avantages déjà mentionnés ci-dessus, ce deuxième mode de réalisation de l'invention présente l'avantage d'être peu coûteux.The addressing lines L1, L2 and the addressing columns C1, C2 are produced on the support 19. The common electrode of the diode block B1 is transferred to a pad 20 of the support 19 electrically connected to the line L1. The common electrode of the diode block B2 is transferred to a pad 21 of the support 19 electrically connected to the line L2. The electrodes of the 2 diodes of block Bl which are not the common electrode are connected by connection wires, one to terminal 8 of elementary point PI, and the other to terminal 10 of elementary point P2. Likewise, the electrodes of the 2 diodes in block B2 which are not the common electrode are connected by connection wires, one to terminal 12 of elementary point P3, and the other to terminal 14 of point elementary P4. In addition to the advantages already mentioned above, this second embodiment of the invention has the advantage of being inexpensive.
Quel que soit le mode de réalisation de l'invention, le report des blocs de diodes sur le support (17, 19) peut se faire individuellement, bloc de diodes par bloc de diodes, ou collectivement, tout ou partie des blocs de diodes étant préalablement regroupés .Whatever the embodiment of the invention, the transfer of the diode blocks to the support (17, 19) can be done individually, diode block by diode block, or collectively, all or part of the diode blocks being previously grouped.
Par ailleurs, selon les modes de réalisation décrits aux figures 1 et 2, les supports 17 et 19 sont fait d'un seul bloc. L'invention concerne cependant d'autres modes de réalisation pour lesquels chaque support (17, 19) peut être fait de plusieurs blocs séparés .Furthermore, according to the embodiments described in Figures 1 and 2, the supports 17 and 19 are made in one piece. The invention however relates to other embodiments for which each support (17, 19) can be made of several separate blocks.
La figure 3 représente une vue en coupe d'un bloc de diodes selon un exemple de réalisation de 1 ' invention.FIG. 3 represents a sectional view of a block of diodes according to an exemplary embodiment of the invention.
Selon l'exemple de réalisation de l'invention représenté en figure 3, les diodes du bloc sont montées en anode commune. Le substrat semi-conducteur à partir duquel les diodes sont réalisées est alors un substrat de type P . Selon un autre exemple de réalisation de l'invention (non représenté sur les figures), les diodes du bloc sont montées en cathode commune et le substrat semi-conducteur à partir duquel les diodes sont réalisées est un substrat de type N.According to the exemplary embodiment of the invention shown in FIG. 3, the diodes of the block are mounted as a common anode. The semiconductor substrate from which the diodes are made is then a P-type substrate. According to another embodiment of the invention (not shown in the figures), the diodes of the block are mounted as a common cathode and the semiconductor substrate from which the diodes are made is a N-type substrate.
La figure 3 représente 2 diodes à anode commune. Une première diode est constituée d'une électrode 28 formant cathode, d'une région 30 dopée N+, d'une zone 31 de substrat dopé P, d'une région 32 dopée P+ et d'une électrode 33 formant anode commune.FIG. 3 represents 2 diodes with a common anode. A first diode consists of an electrode 28 forming a cathode, an N + doped region 30, a zone 31 of P-doped substrate, a region 32 doped P + and an electrode 33 forming a common anode.
Une deuxième diode est constituée d'une électrode 29 formant cathode, d'une région 21 dopée N+, d'une zone 22 de substrat dopée P, d'une région 23 dopée P+ et de l'électrode 33 formant anode commune. La conductivité des zones 32 et 23 de substrat dopé P+ est avantageusement très élevée, par exemple égale à 100 Ω"1.cm"1, et les régions 31 et 22 font partie d'une zone P dont le dopage et l'épaisseur sont compatibles avec la tenue en tension des diodes en inverse, soit, par exemple, quelques dizaines de volts. La zone P est avantageusement obtenue par épitaxie sur le substrat P+.A second diode consists of an electrode 29 forming a cathode, an N + doped region 21, a zone 22 of P-doped substrate, a region 23 doped P + and the electrode 33 forming a common anode. The conductivity of zones 32 and 23 of P + doped substrate is advantageously very high, for example equal to 100 Ω "1 .cm " 1 , and regions 31 and 22 are part of a zone P whose doping and thickness are compatible with the voltage withstand of the diodes in reverse, that is, for example, a few tens of volts. The zone P is advantageously obtained by epitaxy on the substrate P + .
Pour améliorer l'immunité en diaphonie entre les 2 diodes, une zone 24 dopée P+ sépare les régions dopées N+ 30 et 21. La zone 24 est avantageusement diffusée de façon à être en contact avec la zone de substrat dopée P+ . La résistance d'accès à l'anode commune est alors minimale. Le gain du transistor bipolaire parasite constitué des zones N+ 30 et 21 et de la zone P+ 24 est en conséquence minimal, ce qui induit une diaphonie minimale. Une oxydation 25, 26, 27 est réalisée sur la face supérieure du bloc de diodes .To improve the crosstalk immunity between the 2 diodes, a P + doped area 24 separates the N + 30 and 21 doped regions. The area 24 is advantageously diffused so as to be in contact with the P + doped substrate area. The access resistance to the common anode is then minimal. The gain of the parasitic bipolar transistor made up of zones N + 30 and 21 and of zone P + 24 is consequently minimal, which induces minimal crosstalk. Oxidation 25, 26, 27 is carried out on the upper face of the diode block.
Selon l'exemple de réalisation de l'invention représenté en figure 3, l'anode commune des diodes du bloc de diodes est située en face arrière, c'est-à-dire à l'opposé de la face où sont situées les cathodes 28 et 29. L'invention concerne cependant également le cas (non représenté sur les figures) où l'anode commune est située sur la même face que celle où sont situées les cathodes 28 et 29. Dans ce cas, l'anode commune est réalisée à l'aide d'une métallisation recouvrant la zone 24 qui sépare les 2 diodes après ouverture dans l'oxyde 26.According to the embodiment of the invention shown in Figure 3, the common anode of the diodes of the diode block is located on the rear face, that is to say opposite the face where the cathodes are located 28 and 29. The invention however also relates to the case (not shown in the figures) where the common anode is located on the same face as that where the cathodes 28 and 29 are located. In this case, the common anode is produced using a metallization covering the zone 24 which separates the 2 diodes after opening in the oxide 26.
Les figures 4A-4C représentent un procédé de réalisation d'un bloc de diodes selon l'exemple de réalisation de la figure 3.FIGS. 4A-4C represent a method for producing a block of diodes according to the exemplary embodiment of FIG. 3.
La figure 4A représente la formation des zones 24 dopées P+ .FIG. 4A represents the formation of the P + doped zones 24.
Un substrat silicium 34 dopé P dans sa partie supérieure et P+ dans sa partie inférieure est recouvert sur sa face supérieure d'une couche d'oxyde 35 et sur sa face inférieure d'une couche d'oxyde 36. Un ensemble de masques Ml, M2, M3, M4 sont placés sur la couche d'oxyde 35 qui recouvre la face supérieure du substrat silicium.A silicon substrate 34 doped P in its upper part and P + in its lower part is covered on its upper face with an oxide layer 35 and on its lower face with an oxide layer 36. A set of masks Ml , M2, M3, M4 are placed on the oxide layer 35 which covers the upper face of the silicon substrate.
Les zones 24 dopées P+ sont réalisées par implantation ou diffusion dopante d'ions sur la face supérieure du substrat silicium, par exemple des ions de bore. Comme cela a été mentionné précédemment, le dopage P+ est avantageusement réalisé de façon que les zones 24 rejoignent la zone dopée P+ du substrat 34.The P + doped zones 24 are produced by implantation or doping diffusion of ions on the upper face of the silicon substrate, for example boron ions. As mentioned previously, the P + doping is advantageously carried out so that the zones 24 join the P + doped zone of the substrate 34.
La figure 4B représente la formation des zonesFIG. 4B represents the formation of the zones
30 et 21 dopées N+ .30 and 21 N + doped.
A ce stade, on a enlevé les masques Ml, M2 , M3 et M4. Puis on dépose un oxyde épais au-dessus de la couche d'oxyde 35 formant une nouvelle couche d'oxyde. On réalise alors par photolithographie des ouvertures dans cette nouvelle couche d'oxyde de façon que les zones 24 soient recouvertes de couches d'oxyde 25, 26, 27 épaisses les protégeant de l'implantation ou de la diffusion. Au cours de cette gravure, l'oxyde 36 est accessoirement retiré. Les zones N+ sont ensuite réalisées par implantation ou diffusion dopante d'ions, par exemple des ions d'arsenic ou de phosphore, dans la partie supérieure dopée P du substrat 34.At this stage, the masks M1, M2, M3 and M4 have been removed. Then a thick oxide is deposited on top of the oxide layer 35 forming a new oxide layer. Openings are then made by photolithography in this new oxide layer so that the zones 24 are covered with thick oxide layers 25, 26, 27 protecting them from implantation or diffusion. During this etching, the oxide 36 is incidentally removed. The N + zones are then produced by implantation or doping diffusion of ions, for example arsenic or phosphorus ions, in the P-doped upper part of the substrate 34.
La figure 4C représente la métallisation des faces avant et arrière du bloc de diodes . La métallisation 28 est formée au contact de la région 30 dopée N+ et la métallisation 29 est formée au contact de la région 21 dopée N+ . La face inférieure du substrat silicium 34 est recouverte de la métallisation 33.FIG. 4C represents the metallization of the front and rear faces of the diode block. The metallization 28 is formed in contact with the N + doped region 30 and the metallization 29 is formed in contact with the N + doped region 21. The underside of the silicon substrate 34 is covered with metallization 33.
Selon le mode de réalisation représenté en figure 4C, la métallisation 33 constitue le contact d'anode commune en face arrière du bloc de diodes. Comme cela a été mentionné précédemment, le contact d'anode commune peut également être réalisé en face avant .According to the embodiment shown in FIG. 4C, the metallization 33 constitutes the common anode contact on the rear face of the diode block. As mentioned earlier, the contact common anode can also be made on the front face.
Une fraction d'au moins une zone 24 est alors recouverte d'une métallisation pour assurer le contact d ' anode commune en face avant .A fraction of at least one zone 24 is then covered with a metallization to ensure contact with the common anode on the front face.
Selon l'invention, les diodes de sélection des points élémentaires sont réalisables selon un processus simple qui permet l'obtention de puces à faible coût tout en garantissant des structures parasites minimales.According to the invention, the diodes for selecting the elementary points can be produced according to a simple process which makes it possible to obtain chips at low cost while guaranteeing minimal parasitic structures.
Une tête d'impression regroupant les caractéristiques suivantes a pu être obtenue- :A print head with the following characteristics was obtained:
- densité de 600 dpi,- density of 600 dpi,
- diodes de 62 μm de longueur et 42 μm de largeur, - courant nominal parcourant une diode de 400 mA sous une tension directe d'environ 1,3 volt,- diodes 62 μm long and 42 μm wide, - nominal current flowing through a 400 mA diode at a direct voltage of approximately 1.3 volts,
- tenue en tension inverse supérieure ou égale à 20 volts,- withstand in reverse voltage greater than or equal to 20 volts,
- diaphonie entre diodes inférieure à 1% du courant d'écriture. - crosstalk between diodes less than 1% of the write current.

Claims

REVENDICATIONS
1. Tête d'impression comprenant au moins une barrette de L x C points élémentaires et un dispositif d'adressage matriciel des points élémentaires de type L lignes x C colonnes pour sélectionner un point élémentaire de la barrette, le dispositif d'adressage comprenant des diodes de sélection, chaque diode de sélection étant appariée et reliée à un point élémentaire de la barrette, caractérisée en ce que les diodes sont regroupées sur un support (17, 19) en L blocs (Bl, B2) indépendants de C diodes par bloc, les diodes d'un même bloc étant montées en électrode commune .1. Printhead comprising at least one bar of L x C elementary points and a matrix addressing device of elementary points of type L rows x C columns for selecting an elementary point of the bar, the addressing device comprising selection diodes, each selection diode being paired and connected to an elementary point of the strip, characterized in that the diodes are grouped on a support (17, 19) in L blocks (Bl, B2) independent of C diodes per block , the diodes of the same block being mounted as a common electrode.
2. Tête d'impression selon la revendication 1, caractérisée en ce que la barrette de points élémentaires est réalisée dans le support (17) .2. Printhead according to claim 1, characterized in that the strip of elementary dots is produced in the support (17).
3. Tête d'impression selon la revendication 1, caractérisée en ce que la barrette de points élémentaires est réalisée dans un substrat (18) et en ce que le substrat est reporté sur le support (19) .3. Printhead according to claim 1, characterized in that the strip of elementary dots is made in a substrate (18) and in that the substrate is transferred to the support (19).
4. Tête d'impression selon l'une quelconque des revendications 1 à 3, caractérisée en ce que les diodes d'un même bloc sont des diodes séparées par des zones dopées (24) pour minimiser la diaphonie entre diodes.4. Printhead according to any one of claims 1 to 3, characterized in that the diodes of the same block are diodes separated by doped areas (24) to minimize crosstalk between diodes.
5. Tête d'impression selon l'une quelconque des revendications précédentes, caractérisée en ce que les diodes d'un même bloc sont montées en anode commune. 5. Printhead according to any one of the preceding claims, characterized in that the diodes of the same block are mounted as a common anode.
6. Tête d'impression selon l'une quelconque des revendications 1 à 4, caractérisée en ce que les diodes d'un même bloc sont montées en cathode commune.6. Print head according to any one of claims 1 to 4, characterized in that the diodes of the same block are mounted as a common cathode.
7. Tête d'impression selon l'une quelconque des revendications 5 ou 6, caractérisée en ce que l'anode commune ou la cathode commune est réalisée par l'ensemble des zones dopées (24) pour minimiser la diaphonie entre diodes.7. Printhead according to any one of claims 5 or 6, characterized in that the common anode or the common cathode is produced by all of the doped zones (24) to minimize crosstalk between diodes.
8. Tête d'impression selon l'une quelconque des revendications précédentes, caractérisée en ce qu'un point élémentaire est une self-induction .8. Printhead according to any one of the preceding claims, characterized in that an elementary point is a self-induction.
9. Tête d'impression selon l'une quelconque des revendications 1 à 7, caractérisée en ce qu'un point élémentaire est une résistance.9. Printhead according to any one of claims 1 to 7, characterized in that an elementary point is a resistor.
10. Procède de fabrication de tête d'impression comprenant au moins une barrette de L x C points élémentaires et un dispositif d'adressage matriciel des points élémentaires de type L lignes x C colonnes pour sélectionner un point élémentaire de la barrette, le dispositif d'adressage comprenant des diodes de sélection, chaque diode de sélection étant appariée et reliée à un point élémentaire, caractérisé en ce qu'il comprend une étape de fabrication de L blocs indépendants de C diodes par bloc et une étape de report des blocs sur un support (17, 19), les diodes d'un même bloc étant montées en électrode commune. 10. Printing head manufacturing process comprising at least one bar of L x C elementary points and a matrix addressing device of elementary points of type L rows x C columns for selecting an elementary point of the bar, the device d addressing comprising selection diodes, each selection diode being paired and connected to an elementary point, characterized in that it comprises a step of manufacturing L independent blocks of C diodes per block and a step of transferring the blocks onto a support (17, 19), the diodes of the same block being mounted as a common electrode.
11. Procédé de fabrication de tête d'impression selon la revendication 10, caractérisé en ce qu'il comprend une étape de fabrication de la barrette de points élémentaires dans le support (17) .11. A method of manufacturing a print head according to claim 10, characterized in that it comprises a step of manufacturing the bar of elementary points in the support (17).
12. Procédé de fabrication de tête d'impression selon l'une quelconque des revendications 10 ou 11, caractérisé en ce que l'étape de report des L blocs sur le support (17) est une étape de report sur substrat par retournement.12. A method of manufacturing a print head according to any one of claims 10 or 11, characterized in that the step of transferring the L blocks onto the support (17) is a step of transferring onto the substrate by inversion.
13. Procédé de fabrication de tête d'impression selon la revendication 10, caractérisé en ce qu'il comprend une étape de fabrication de la barrette de points élémentaires dans un substrat (18), une étape de report du substrat (18) sur le support (19) et une étape de report des blocs de diodes (Bl, B2) sur le support (19) .13. A method of manufacturing a print head according to claim 10, characterized in that it comprises a step of manufacturing the strip of elementary dots in a substrate (18), a step of transferring the substrate (18) onto the support (19) and a step of transferring the diode blocks (B1, B2) to the support (19).
14. Procédé de fabrication de tête d'impression selon la revendication 13, caractérisé en ce que le report du substrat (18) et/ou des blocs de diodes (Bl, B2) est une étape de report sur substrat par retournement.14. A method of manufacturing a print head according to claim 13, characterized in that the transfer of the substrate (18) and / or of the diode blocks (B1, B2) is a step of transfer to the substrate by inversion.
15. Procédé de fabrication de tête d'impression selon l'une quelconque des revendications 10 à 14, caractérisé en ce que les blocs de diodes (Bl, B2) sont réalisés de façon collective puis découpés. 15. A method of manufacturing a print head according to any one of claims 10 to 14, characterized in that the diode blocks (Bl, B2) are produced collectively and then cut.
16. Procédé de fabrication de tête d'impression selon l'une quelconque des revendications 10 à 15, caractérisé en ce que la réalisation des blocs de diodes comprend une étape d'implantation ou diffusion dopante d'ions entre les diodes d'un même bloc de façon à créer un ensemble de zones dopées pour minimiser la diaphonie entre diodes d'un même bloc.16. A method of manufacturing a print head according to any one of claims 10 to 15, characterized in that the production of the diode blocks comprises a step of implantation or doping diffusion of ions between the diodes of the same block so as to create a set of doped zones to minimize crosstalk between diodes of the same block.
17. Procédé de fabrication de tête d'impression selon l'une quelconque des revendications 10 à 16, caractérisé en ce que le report des blocs de . diodes (Bl, B2) sur le support (17, 19) se fait bloc par bloc.17. A method of manufacturing a print head according to any one of claims 10 to 16, characterized in that the transfer of the blocks. diodes (Bl, B2) on the support (17, 19) is done block by block.
18. Procédé de fabrication de tête d'impression selon l'une quelconque des revendications 10 à 16, caractérisé en ce que le report des blocs de diodes (Bl, B2) sur le support (17, 19) se fait collectivement . 18. A method of manufacturing a print head according to any one of claims 10 to 16, characterized in that the transfer of the diode blocks (B1, B2) on the support (17, 19) is done collectively.
PCT/FR2000/003125 1999-11-10 2000-11-09 Printing head and method for making same WO2001034399A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9914119A FR2800666A1 (en) 1999-11-10 1999-11-10 PRINT HEAD AND METHOD FOR MAKING PRINT HEAD
FR99/14119 1999-11-10

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WO2001034399A1 true WO2001034399A1 (en) 2001-05-17

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WO (1) WO2001034399A1 (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4123647A (en) * 1976-05-31 1978-10-31 Matsushita Electric Industrial Co., Ltd. Thermal head apparatus
GB2076747A (en) * 1980-05-09 1981-12-09 Hitachi Ltd Thermal Recording Head
FR2633101A1 (en) * 1988-06-16 1989-12-22 Commissariat Energie Atomique PHOTODIODE AND MATRIX OF HGCDTE PHOTODIODES AND METHODS OF MAKING SAME
US5567630A (en) * 1990-02-09 1996-10-22 Canon Kabushiki Kaisha Method of forming an ink jet recording device, and head using same
WO1999053547A1 (en) * 1998-04-13 1999-10-21 Wisconsin Alumni Research Foundation Photodiode arrays having minimized cross-talk between diodes

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4123647A (en) * 1976-05-31 1978-10-31 Matsushita Electric Industrial Co., Ltd. Thermal head apparatus
GB2076747A (en) * 1980-05-09 1981-12-09 Hitachi Ltd Thermal Recording Head
FR2633101A1 (en) * 1988-06-16 1989-12-22 Commissariat Energie Atomique PHOTODIODE AND MATRIX OF HGCDTE PHOTODIODES AND METHODS OF MAKING SAME
US5567630A (en) * 1990-02-09 1996-10-22 Canon Kabushiki Kaisha Method of forming an ink jet recording device, and head using same
WO1999053547A1 (en) * 1998-04-13 1999-10-21 Wisconsin Alumni Research Foundation Photodiode arrays having minimized cross-talk between diodes

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