WO2001022501A1 - Electronic component and coating agent - Google Patents
Electronic component and coating agent Download PDFInfo
- Publication number
- WO2001022501A1 WO2001022501A1 PCT/DE2000/003290 DE0003290W WO0122501A1 WO 2001022501 A1 WO2001022501 A1 WO 2001022501A1 DE 0003290 W DE0003290 W DE 0003290W WO 0122501 A1 WO0122501 A1 WO 0122501A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- coating agent
- aqueous solution
- stick layer
- radiation
- solder
- Prior art date
Links
- 239000011248 coating agent Substances 0.000 title claims abstract description 33
- 229910000679 solder Inorganic materials 0.000 claims abstract description 51
- 238000005476 soldering Methods 0.000 claims abstract description 21
- 239000003795 chemical substances by application Substances 0.000 claims abstract 2
- 239000007864 aqueous solution Substances 0.000 claims description 25
- 239000004033 plastic Substances 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 15
- 239000002904 solvent Substances 0.000 claims description 12
- 230000005693 optoelectronics Effects 0.000 claims description 10
- 235000013870 dimethyl polysiloxane Nutrition 0.000 claims description 8
- 239000004205 dimethyl polysiloxane Substances 0.000 claims description 8
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 claims description 8
- 239000000654 additive Substances 0.000 claims description 7
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 claims description 6
- 229920001296 polysiloxane Polymers 0.000 claims description 6
- 238000007598 dipping method Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 5
- 230000005855 radiation Effects 0.000 claims description 5
- 230000000996 additive effect Effects 0.000 claims description 4
- 239000008199 coating composition Substances 0.000 claims description 4
- -1 polysiloxane Polymers 0.000 claims description 4
- 239000006096 absorbing agent Substances 0.000 claims description 3
- 239000004611 light stabiliser Substances 0.000 claims description 3
- 238000005507 spraying Methods 0.000 claims description 3
- 238000012805 post-processing Methods 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 claims description 2
- 230000000855 fungicidal effect Effects 0.000 claims 2
- 239000000417 fungicide Substances 0.000 claims 2
- 239000008363 phosphate buffer Substances 0.000 claims 2
- 238000005260 corrosion Methods 0.000 claims 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims 1
- 238000000576 coating method Methods 0.000 description 9
- 239000000243 solution Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 238000009736 wetting Methods 0.000 description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000007792 addition Methods 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
- 239000012965 benzophenone Substances 0.000 description 2
- 150000008366 benzophenones Chemical class 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 230000032798 delamination Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 239000004954 Polyphthalamide Substances 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- 241000404236 Zizina otis Species 0.000 description 1
- 230000035508 accumulation Effects 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 150000008064 anhydrides Chemical class 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 229910001634 calcium fluoride Inorganic materials 0.000 description 1
- QXJJQWWVWRCVQT-UHFFFAOYSA-K calcium;sodium;phosphate Chemical compound [Na+].[Ca+2].[O-]P([O-])([O-])=O QXJJQWWVWRCVQT-UHFFFAOYSA-K 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000008367 deionised water Substances 0.000 description 1
- 229910021641 deionized water Inorganic materials 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000009760 functional impairment Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 239000012778 molding material Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 229920006375 polyphtalamide Polymers 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3431—Leadless components
- H05K3/3442—Leadless components having edge contacts, e.g. leadless chip capacitors, chip carriers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/483—Containers
- H01L33/486—Containers adapted for surface mounting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/52—Encapsulations
- H01L33/56—Materials, e.g. epoxy or silicone resin
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/05568—Disposition the whole external layer protruding from the surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05573—Single external layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10007—Types of components
- H05K2201/10106—Light emitting diode [LED]
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10636—Leadless chip, e.g. chip capacitor or resistor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/20—Details of printed circuits not provided for in H05K2201/01 - H05K2201/10
- H05K2201/2081—Compound repelling a metal, e.g. solder
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the invention relates to an electronic component, in particular to an optoelectronic component, with a plastic housing that has at least one metallic contact surface. It also relates to a coating agent for such a component and to a method for producing such a component.
- the object of the invention is to provide an electronic component in which the adhesion of solder residues or solder to surfaces of the component housing which are not provided for this purpose is largely prevented.
- a surface-mountable component is to be developed that can be packaged in straps and by means of conventional pick-and-place processes of surface mounting technology (SMT technology) can be further processed.
- SMT technology surface mounting technology
- the plastic housing with the exception of the metallic soldering area, is coated with a non-stick solder layer.
- the invention proposes to avoid those that occur in particular in solder baths or a wave soldering process
- Soldering residues in the form of small solder accumulations at locations of the electrical component which are not provided for this purpose, provide a solder non-stick layer on the areas of the surface of the electrical component which are not intended for soldering, which prevents the solder from adhering.
- solder non-stick layer consists essentially of siloxane.
- solder non-stick layer is particularly preferably a siloxane layer based on polyether-modified dimethylpolysiloxane.
- solder non-stick layer is preferably applied by a 0.01-5% aqueous solution and particularly preferably by a 0.01-2.5% aqueous solution. brings, which preferably contains no further solvent additives.
- a 0.01-2.5% aqueous solution advantageously ensures that the coating is non-tacky, which is of crucial importance for the use of pick-and-place processes in surface mounting technology.
- the solder non-stick layer is applied at room temperature.
- the thickness of the non-stick solder layer in particular in the case of the optoelectronic transmitting and / or receiving components, is particularly preferably less than 3 ⁇ m and consequently has as far as possible no influence on the optical properties of the coated components.
- a highly effective, homogeneous solder non-stick layer is produced, which advantageously does not use any nonvolatile solubilizers due to the special chemical structure and the use of aqueous systems.
- a particular advantage that results from this is that environmentally friendly solvents are no longer used. Also, no droplet residues can occur due to highly volatile solubilizers, which complicate or prevent the perfect soldering of the electrical component.
- a conventional thermal post-processing step is no longer required, which increases the yield and reduces production times. Functional impairments of the coated components do not occur.
- the coatings obtained are also characterized by high storage stability and homogeneity, which improves the quality of the components and reduces the failure rate.
- the invention further relates to a coating agent for reducing solder residues on surfaces not intended for soldering of an electrical see component that is to be soldered to at least one surface, wherein the coating agent is to be applied to the surfaces of the electrical component that are not intended for the soldering, the coating agent being a siloxane.
- the coating composition consists of a polyether-modified dirnethyl polysiloxane.
- the coating agent is advantageously dissolved in a 0.01-5% strength, particularly preferably in a 0.01-2.5% strength aqueous solution for application to a surface provided for this purpose, preferably without further solvent additions.
- a uniform application of the coating agent is ensured without other difficult-to-evaporate solvent residues remaining.
- a resultant advantage is that by using an aqueous solution, environmentally friendly solvents are no longer used.
- the coating agent shows no other usual discolouration or residues on the component surface due to thermal decomposition reactions, which were caused by the previously required heat treatment to evaporate the solvents.
- the aqueous solution is preferably applied to the whole by stamping (for example using a tampon, roller or sponge), dipping (for pulling through a dipping bath), spraying or application by microdosing with fine needles
- the film is advantageously dried in an air stream which does not have to be at elevated temperatures.
- the coating material also shows a low hazard potential for humans and the environment, in particular a low vapor pressure. Used coating solutions can consequently be disposed of without any problems and coated components can be used in particularly critical application areas, such as, for example, automotive applications in the interior, consumer electronics and medical areas, in particular because of the low vapor pressure.
- Buffered coating solutions with a pH between approx. 5.0 and approx. 7.0 can advantageously be kept and used for up to three months.
- the solder non-stick layer is advantageously very light-stable and can be further increased by adding light stabilizers and UV absorbers (for example benzophenones, benzoriazoles, sterically hindered amines with a pH preferably between 6.0 and 7.5), as a result of which the radiation and weather stability of the plastic housing is improved.
- the coating is advantageously also suitable for optoelectronic components with intensive and / or more energy-producing radiation, eg. B. blue light and UV radiation emitting LEDs and high-performance LEDs.
- the coating solutions are preferably on thermoplastic housings made of LCP, PBT, PET, PC, PA and / or particularly preferably on polyphthalamide with or without filler additive (such as
- Titanium oxide, silicon oxide, aluminum oxide etc. and / or epoxy resin, silicone or acrylate casting compounds (preferably Epoxy anhydride molding materials) used.
- the epoxy resin, silicone or acrylate casting compounds can contain diffuser materials such as calcium fluoride, barium sulfate, silicon oxide, aluminum oxide, glass spheres etc. and luminescence conversion pigments.
- Figure 1 is a schematic sectional view of an embodiment of a soldered electrical component according to the invention with a solder non-stick layer;
- Figure 2 is a schematic sectional view of a soldered, conventional electrical component with solder residues.
- FIG. 1 shows a surface-mountable radiation-emitting and / or radiation-sensing optoelectronic component 1 in the soldered state.
- the component 1 is in this case soldered to the metallic soldering areas 4 to be soldered by means of the solder 3 to the conductor tracks 8 printed on a circuit board 7.
- the other areas 5 of the surface 2 of a plastic housing 14 of the component 1, which are not intended for soldering, are coated with a solder non-stick layer 6.
- polyether-modified dimethylpolysiloxane according to the invention as an essential component of the solder non-stick layer 6, wetting of surfaces 5 of the plastic housing 14 with solder is largely prevented.
- FIG. 1 Chen-mountable radiation-emitting and / or radiation-sensing optoelectronic component 1 without solder non-stick layer is shown schematically.
- the component 1 is again shown in the soldered state.
- the component 1 is in turn soldered to the soldering areas 4 to be soldered by means of the solder 3 to the conductor tracks 8 printed on a circuit board 7.
- An aqueous solution of the material of the solder non-stick layer is preferably applied to the whole by stamping (for example using a tampon, roller or sponge), dipping (for pulling through a dipping bath), spraying or application by microdosing with fine needles
- stamping for example using a tampon, roller or sponge
- dipping for pulling through a dipping bath
- the film is advantageously dried in an air stream which does not have to have elevated temperatures.
- the aqueous solution of the polyether-modified dimethylpolysiloxane is composed of 0.1-5% polyethermo- dified dimethylpolysiloxane, for example BYK348 from Byk-Chemie GmbH, and deionized water together.
- polyethermo- dified dimethylpolysiloxane for example BYK348 from Byk-Chemie GmbH
- the solder non-stick layer preferably contains a light stabilizer and / or a UV absorber (for example benzophenones, benzoriazoles, sterically hindered amines with a pH preferably between 6.0 and 7.5), as a result of which the radiation and Weather stability of the plastic housing is improved.
- a light stabilizer and / or a UV absorber for example benzophenones, benzoriazoles, sterically hindered amines with a pH preferably between 6.0 and 7.5
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Paints Or Removers (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Light Receiving Elements (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020017006316A KR20010107975A (en) | 1999-09-21 | 2000-09-21 | Electronic component and coating agent |
JP2001525774A JP2003510818A (en) | 1999-09-21 | 2000-09-21 | Electronic components and coatings |
EP00971253A EP1133800A1 (en) | 1999-09-21 | 2000-09-21 | Electronic component and coating agent |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19945131.1 | 1999-09-21 | ||
DE19945131A DE19945131A1 (en) | 1999-09-21 | 1999-09-21 | Electronic component and coating agent |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2001022501A1 true WO2001022501A1 (en) | 2001-03-29 |
Family
ID=7922718
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE2000/003290 WO2001022501A1 (en) | 1999-09-21 | 2000-09-21 | Electronic component and coating agent |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1133800A1 (en) |
JP (2) | JP2003510818A (en) |
KR (1) | KR20010107975A (en) |
DE (1) | DE19945131A1 (en) |
WO (1) | WO2001022501A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003038912A2 (en) * | 2001-10-31 | 2003-05-08 | Osram Opto Semiconductors Gmbh | Optoelectronic component |
WO2014037263A1 (en) * | 2012-09-05 | 2014-03-13 | Osram Opto Semiconductors Gmbh | Housing for an optical component, assembly, method for producing a housing and method for producing an assembly |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102012217652B4 (en) | 2012-09-27 | 2021-01-21 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelectronic component |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54135845A (en) * | 1978-04-14 | 1979-10-22 | Hodogaya Chem Co Ltd | Polyphenylene sulfide resin composition |
SU1152750A1 (en) * | 1983-10-27 | 1985-04-30 | Предприятие П/Я Г-4311 | Composition for limiting the spreading of solder |
JPH02102594A (en) * | 1988-10-12 | 1990-04-16 | Nec Corp | Hybrid integrated circuit substrate |
EP0588040A2 (en) * | 1992-08-20 | 1994-03-23 | Hewlett-Packard Company | Light source and technique for mounting light emitting diodes |
EP0660403A1 (en) * | 1993-12-27 | 1995-06-28 | Kabushiki Kaisha Toshiba | Semiconductor device |
EP0720241A2 (en) * | 1994-12-27 | 1996-07-03 | AT&T Corp. | Structure of and method for manufacturing an LED |
WO1998010920A1 (en) * | 1996-09-10 | 1998-03-19 | Quantum Materials, Inc. | Maleimide containing formulations and uses therefor |
US5784258A (en) * | 1997-04-11 | 1998-07-21 | Xerox Corporation | Wiring board for supporting an array of imaging chips |
JPH11168154A (en) * | 1997-08-25 | 1999-06-22 | Motorola Inc | Semiconductor element and manufacture thereof |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4246147A (en) * | 1979-06-04 | 1981-01-20 | International Business Machines Corporation | Screenable and strippable solder mask and use thereof |
JPS62295958A (en) * | 1986-06-13 | 1987-12-23 | Shin Etsu Chem Co Ltd | Room temperature curing organosiloxane composition |
JP3424835B2 (en) * | 1991-12-27 | 2003-07-07 | 松下電器産業株式会社 | Color solid-state imaging device and color filter |
EP0808881B1 (en) * | 1996-05-23 | 1999-09-22 | Ewald Dörken Ag | Coating from a powder paint having an antisticking effect and process for its preparation |
-
1999
- 1999-09-21 DE DE19945131A patent/DE19945131A1/en not_active Withdrawn
-
2000
- 2000-09-21 KR KR1020017006316A patent/KR20010107975A/en not_active Application Discontinuation
- 2000-09-21 JP JP2001525774A patent/JP2003510818A/en active Pending
- 2000-09-21 WO PCT/DE2000/003290 patent/WO2001022501A1/en not_active Application Discontinuation
- 2000-09-21 EP EP00971253A patent/EP1133800A1/en not_active Withdrawn
-
2005
- 2005-01-17 JP JP2005009629A patent/JP2005136438A/en active Pending
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
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Publication number | Priority date | Publication date | Assignee | Title |
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WO2003038912A2 (en) * | 2001-10-31 | 2003-05-08 | Osram Opto Semiconductors Gmbh | Optoelectronic component |
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WO2014037263A1 (en) * | 2012-09-05 | 2014-03-13 | Osram Opto Semiconductors Gmbh | Housing for an optical component, assembly, method for producing a housing and method for producing an assembly |
Also Published As
Publication number | Publication date |
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JP2005136438A (en) | 2005-05-26 |
EP1133800A1 (en) | 2001-09-19 |
KR20010107975A (en) | 2001-12-07 |
JP2003510818A (en) | 2003-03-18 |
DE19945131A1 (en) | 2001-04-12 |
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