WO1999010796A1 - Semiconductor integrated circuit and data processing system - Google Patents
Semiconductor integrated circuit and data processing system Download PDFInfo
- Publication number
- WO1999010796A1 WO1999010796A1 PCT/JP1997/002971 JP9702971W WO9910796A1 WO 1999010796 A1 WO1999010796 A1 WO 1999010796A1 JP 9702971 W JP9702971 W JP 9702971W WO 9910796 A1 WO9910796 A1 WO 9910796A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- state
- threshold voltage
- clock frequency
- changed
- mos transistor
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
- G06F1/08—Clock generators with changeable or programmable clock frequency
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Logic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Dram (AREA)
Abstract
A MOS transistor constituting a semiconductor integrated circuit (16) has a 1st state in which the MOS transistor is operated with a 1st threshold voltage at a 1st clock frequency and a 2nd state in which the MOS transistor is operated with a 2nd threshold voltage higher than the 1st threshold voltage at a 2nd clock frequency lower than the 1st clock frequency. When the operating state is changed from the 1st state to the 2nd state, the clock frequency is changed from the 1st clock frequency to the 2nd clock frequency and then the threshold voltage of the MOS transistor is changed from the 1st threshold voltage to the 2nd threshold voltage. When the operating state is changed from the 2nd state to the 1st state, the threshold voltage of the MOS transistor is changed from the 2nd threshold voltage to the 1st threshold voltage and then the clock frequency is changed from the 2nd clock frequency to the 1st frequency. The control is performed by a 1st logic circuit (10) through a clock control circuit (14) and a substrate bias control circuit (12). With this constitution, a state in which priority is given to the processing speed and a state in which reduction of a subthreshold leakage current has priority over the processing speed can be changed over from one to the other without error, and further the power consumption of the semiconductor integrated circuit can be reduced.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP1997/002971 WO1999010796A1 (en) | 1997-08-27 | 1997-08-27 | Semiconductor integrated circuit and data processing system |
TW086117202A TW382669B (en) | 1997-08-27 | 1997-11-18 | Semiconductor integrated circuit and data processing system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP1997/002971 WO1999010796A1 (en) | 1997-08-27 | 1997-08-27 | Semiconductor integrated circuit and data processing system |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1999010796A1 true WO1999010796A1 (en) | 1999-03-04 |
Family
ID=14181013
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1997/002971 WO1999010796A1 (en) | 1997-08-27 | 1997-08-27 | Semiconductor integrated circuit and data processing system |
Country Status (2)
Country | Link |
---|---|
TW (1) | TW382669B (en) |
WO (1) | WO1999010796A1 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000339047A (en) * | 1999-05-27 | 2000-12-08 | Hitachi Ltd | Semiconductor integrated circuit device |
JP2001345693A (en) * | 2000-05-30 | 2001-12-14 | Hitachi Ltd | Semiconductor integrated circuit device |
JP2005244212A (en) * | 2004-01-30 | 2005-09-08 | Semiconductor Energy Lab Co Ltd | Semiconductor device |
US8321711B2 (en) | 2004-01-30 | 2012-11-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having a threshold voltage control function |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI487341B (en) | 2012-01-17 | 2015-06-01 | Throughtek Co Ltd | Identify networked devices to establish point-to-point connections to systems and methods |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05108194A (en) * | 1991-10-17 | 1993-04-30 | Hitachi Ltd | Low power consumption type semiconductor integrated circuit |
JPH0653496A (en) * | 1992-06-02 | 1994-02-25 | Toshiba Corp | Semiconductor device |
JPH07287699A (en) * | 1994-02-28 | 1995-10-31 | Hitachi Ltd | Data processor |
JPH08274620A (en) * | 1995-03-29 | 1996-10-18 | Hitachi Ltd | Semiconductor integrated circuit device and microcomputer |
-
1997
- 1997-08-27 WO PCT/JP1997/002971 patent/WO1999010796A1/en active Application Filing
- 1997-11-18 TW TW086117202A patent/TW382669B/en active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05108194A (en) * | 1991-10-17 | 1993-04-30 | Hitachi Ltd | Low power consumption type semiconductor integrated circuit |
JPH0653496A (en) * | 1992-06-02 | 1994-02-25 | Toshiba Corp | Semiconductor device |
JPH07287699A (en) * | 1994-02-28 | 1995-10-31 | Hitachi Ltd | Data processor |
JPH08274620A (en) * | 1995-03-29 | 1996-10-18 | Hitachi Ltd | Semiconductor integrated circuit device and microcomputer |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000339047A (en) * | 1999-05-27 | 2000-12-08 | Hitachi Ltd | Semiconductor integrated circuit device |
JP2001345693A (en) * | 2000-05-30 | 2001-12-14 | Hitachi Ltd | Semiconductor integrated circuit device |
JP2005244212A (en) * | 2004-01-30 | 2005-09-08 | Semiconductor Energy Lab Co Ltd | Semiconductor device |
US8321711B2 (en) | 2004-01-30 | 2012-11-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having a threshold voltage control function |
JP2014112376A (en) * | 2004-01-30 | 2014-06-19 | Semiconductor Energy Lab Co Ltd | Semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
TW382669B (en) | 2000-02-21 |
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