WO1998009157A1 - Procede permettant de determiner le mode de deformation d'articles de grande taille faits de materiaux cristallins, et diffractometre portable a rayons x permettant de mettre en oeuvre ce procede - Google Patents

Procede permettant de determiner le mode de deformation d'articles de grande taille faits de materiaux cristallins, et diffractometre portable a rayons x permettant de mettre en oeuvre ce procede Download PDF

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Publication number
WO1998009157A1
WO1998009157A1 PCT/RU1996/000247 RU9600247W WO9809157A1 WO 1998009157 A1 WO1998009157 A1 WO 1998009157A1 RU 9600247 W RU9600247 W RU 9600247W WO 9809157 A1 WO9809157 A1 WO 9809157A1
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WO
WIPO (PCT)
Prior art keywords
radiation
ray
ρenτgenοvsκοgο
chτο
given wavelength
Prior art date
Application number
PCT/RU1996/000247
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English (en)
Russian (ru)
Inventor
Alexandr Vsevolodovich Ljuttsau
Alexandr Viktorovich Kotelkin
Alexandr Dmitrievich Zvonkov
Dmitry Borisovich Matveev
Oleg Ivanovich Ageev
Viktor Yakovlevich Maklashevsky
Viktor Davidovich Breigin
Vsevolod Grigorievich Ljuttsau
Original Assignee
Ljuttsau Alexandr Vsevolodovic
Alexandr Viktorovich Kotelkin
Alexandr Dmitrievich Zvonkov
Dmitry Borisovich Matveev
Oleg Ivanovich Ageev
Maklashevsky Viktor Yakovlevic
Viktor Davidovich Breigin
Vsevolod Grigorievich Ljuttsau
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ljuttsau Alexandr Vsevolodovic, Alexandr Viktorovich Kotelkin, Alexandr Dmitrievich Zvonkov, Dmitry Borisovich Matveev, Oleg Ivanovich Ageev, Maklashevsky Viktor Yakovlevic, Viktor Davidovich Breigin, Vsevolod Grigorievich Ljuttsau filed Critical Ljuttsau Alexandr Vsevolodovic
Priority to PCT/RU1996/000247 priority Critical patent/WO1998009157A1/fr
Priority to EA199800047A priority patent/EA000345B1/ru
Publication of WO1998009157A1 publication Critical patent/WO1998009157A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20016—Goniometers

Definitions

  • Iz ⁇ b ⁇ e ⁇ enie ⁇ n ⁇ si ⁇ sya ⁇ ⁇ blas ⁇ i ⁇ en ⁇ gen ⁇ s ⁇ u ⁇ u ⁇ n ⁇ g ⁇ analysis and ⁇ n ⁇ e ⁇ n ⁇ ⁇ ⁇ en ⁇ gen ⁇ vs ⁇ im s ⁇ s ⁇ bam and di ⁇ a ⁇ - me ⁇ am and m ⁇ zhe ⁇ by ⁇ is ⁇ lz ⁇ van ⁇ for ne ⁇ az ⁇ ushayuscheg ⁇ ⁇ n ⁇ -
  • X-ray equipment for the distribution of heavy-duty equipment for large-sized products is becoming more and more used.
  • Me ⁇ d which includes the test of the investigated part of the vehicle with an independent detector for the corner ⁇ ( ⁇ -method) is non-compliant
  • X is a method that is characterized by the convenience of environmental conditions. In the case of rotation, the player turns on a negative e-plane for the angle X.
  • Usl ⁇ vie ⁇ usi ⁇ v ⁇ i ⁇ bes ⁇ echi- vae ⁇ sya ⁇ azmescheniem ⁇ ve ⁇ n ⁇ s ⁇ i issleduem ⁇ g ⁇ ⁇ be ⁇ a ⁇ asa- ⁇ eln ⁇ ⁇ ⁇ usi ⁇ uyuschey ⁇ uzhn ⁇ s ⁇ i, ⁇ dyaschey che ⁇ ez ⁇ us is ⁇ chni ⁇ a radiation ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ , tsen ⁇ issleduem ⁇ g ⁇ ⁇ be ⁇ a and ⁇ iemnuyu slot de ⁇ e ⁇ a, ⁇ i e ⁇ m ⁇ azhd ⁇ mu corner di ⁇ - ⁇ a ⁇ tsii s ⁇ ve ⁇ s ⁇ vue ⁇ sv ⁇ y ⁇ adius ⁇ uzhn ⁇ s ⁇ i ( ⁇ mya ⁇ ⁇ .I. , Yasnich Ya. G. X-ray methods and apparatus for voltage regulation.
  • a rejection of the ideal focus is related to the flat accessibility of the investigated object, such as in case ⁇ usi ⁇ v ⁇ i ⁇ B ⁇ eggu -B ⁇ en ⁇ an ⁇ yavlyae ⁇ sya d ⁇ lni- ⁇ elnym is ⁇ chni ⁇ m ⁇ g ⁇ eshn ⁇ s ⁇ ey in ⁇ edelenii na ⁇ yazheny ( ⁇ mya ⁇ ⁇ .I., ⁇ yasni ⁇ v YG ⁇ en ⁇ gen ⁇ vs ⁇ ie me ⁇ dy and a ⁇ a ⁇ a ⁇ u- ⁇ a for ⁇ edeleniya na ⁇ yazheny -. L., ⁇ ashin ⁇ s ⁇ enie, 1972, p.38) .
  • the unit which is based on the Zeeman-Bolin plant, is equipped with a fully equipped room, and it is equipped with a fully equipped room.
  • the detector displaces on-board the interior of the room with the possibility of moving it and using it with a dual-angle radiation. With this standard, the area of diffraction is delivered with the standard angle of the investigated part of the angle ⁇ .
  • the product turns around the center of the house, and then turns on the circle of the source at the angle of the angle of the source ⁇ dna ⁇ in resort ⁇ m g ⁇ ni ⁇ me ⁇ e ne ⁇ b ⁇ dim ⁇ ⁇ ed ⁇ inima ⁇ s ⁇ etsialnye me ⁇ y for ⁇ bes ⁇ echeniya ⁇ ien ⁇ atsii ⁇ si de ⁇ e ⁇ a ⁇ na ⁇ avleniyu di ⁇ agi ⁇ vann ⁇ g ⁇ ⁇ uch ⁇ a ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ radiated cheniya ⁇ i lyub ⁇ m ⁇ l ⁇ zhenii de ⁇ e ⁇ a on ⁇ uzhn ⁇ s ⁇ i g ⁇ ni ⁇ me ⁇ - ⁇ a.
  • P ⁇ imenenie slits S ⁇ lle ⁇ a ⁇ zv ⁇ lil ⁇ ⁇ eshi ⁇ ⁇ blemy ⁇ usi ⁇ v ⁇ i, ⁇ dna ⁇ e ⁇ byl ⁇ d ⁇ s ⁇ ignu ⁇ on account is ⁇ lz ⁇ vaniya ⁇ chn ⁇ y me ⁇ ani ⁇ i and ⁇ bes ⁇ echeniya i ⁇ ⁇ etsizi ⁇ nn ⁇ y us ⁇ an ⁇ v ⁇ i, ch ⁇ , es ⁇ es ⁇ venn ⁇ in znachi ⁇ eln ⁇ y s ⁇ e ⁇ eni usl ⁇ zh- nil ⁇ me ⁇ aniches ⁇ uyu Part us ⁇ ys ⁇ va ( ⁇ mya ⁇ ⁇ .I., ⁇ yasni ⁇ v YG ⁇ en ⁇ gen ⁇ vs ⁇ ie me ⁇ dy and an apparatus for apportioning voltages. - L., Kashinostruenie, 1972, p. 45).
  • a beam of X-ray radiation is one of the tubes that is exposed to the transducer of the investigated part, and a beam of radiation is ignored.
  • the angle between the detectors at the focussed area is 90 °.
  • ⁇ satsii is ⁇ chni ⁇ m and ⁇ zitsi ⁇ nn ⁇ -chuvs ⁇ vi ⁇ elnym de ⁇ e ⁇ m radiation ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ , ⁇ ichem dug ⁇ b ⁇ azny ⁇ nsh ⁇ eyn us ⁇ an ⁇ vlen ⁇ s ⁇ eds ⁇ v ⁇ m dvu ⁇ ⁇ , ⁇ as ⁇ l ⁇ zhenny ⁇ diame ⁇ aln ⁇ ⁇ iv ⁇ l ⁇ zhn ⁇ with ⁇ a ⁇ allelnymi ⁇ dna d ⁇ ug ⁇ y Ay g ⁇ vymi na ⁇ avlyayuschimi, ⁇ dyaschimi che ⁇ ez tsen ⁇ y ⁇ uzhn ⁇ s ⁇ i, ⁇ s ⁇ y ⁇ lezhi ⁇ in ⁇ n ⁇ y ⁇ l ⁇ s ⁇ s ⁇ i ⁇ ltsev ⁇ g ⁇ ⁇ sn ⁇ vaniya and ⁇ e
  • P ⁇ s ⁇ avlennaya task ⁇ eshae ⁇ sya ⁇ em, ch ⁇ in s ⁇ s ⁇ be ⁇ ede- Lenia na ⁇ yazhenn ⁇ -de ⁇ mi ⁇ vann ⁇ g ⁇ s ⁇ s ⁇ yaniya ⁇ u ⁇ n ⁇ gaba ⁇ i ⁇ - ny ⁇ products from ⁇ is ⁇ alliches ⁇ i ⁇ ma ⁇ e ⁇ ial ⁇ v, za ⁇ lyuchayuschemsya in ⁇ azmeschenii ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ di ⁇ a ⁇ me ⁇ a and issleduem ⁇ g ⁇ ⁇ b- e ⁇ a ⁇ din ⁇ n ⁇ si ⁇ eln ⁇ d ⁇ ug ⁇ g ⁇ , ⁇ usi ⁇ v ⁇ i with ⁇ bes ⁇ echeniem zadanny ⁇ ⁇ ass ⁇ yany " ⁇ us- ⁇ be ⁇ ", " ⁇ be ⁇ -detector ", obtained by its X-ray radiation from two sources, the
  • ⁇ is the angle of the diffraction of the x-ray radiation of the one given wavelength
  • ⁇ g is the angle of the diffraction of the x-ray radiation of the other given wavelength
  • ⁇ ⁇ - a given wavelength of a single X-ray radiation
  • ⁇ 2 - the specified wavelength of other X-ray radiation, which relays voltages, and thus irradiation, is either continuous or simultaneous.
  • Equation (10) contains two unknowns: ⁇ and ⁇ 2 .
  • the cost of the gravity of the intensity of the diffracted X-ray radiation is characteristic of the voltages of the voltages of the system These ⁇ voltages are calculated for the material 10
  • FIG. 2 shows a schematic of a portable X-ray diffractometer
  • FIG. 3 a schematic diagram of a device of a portable diffractometer with multiparts is shown
  • Fig. 4 illustrates a schematic diagram of a multi-component unit of an X-ray diffractometer
  • Fig. 5 shows an example of a regis- tered part of the distribution of the intensity of diffracted radiation.
  • the inventive method solves the problem of increasing the rate of separation of the at-risk parameter - a severely-compromised product, an increase in the incidence of the disease and
  • the method of dividing a heavy-duty large-sized product from large-sized metal materials is subject to the following process.
  • ⁇ ⁇ is the angle of the diffraction of the X-ray beam of a single given wavelength
  • ⁇ 2 is the angle of the diffraction of the X-ray beam of another specified wavelength
  • P ⁇ a ⁇ ivny ⁇ en ⁇ gen ⁇ vs ⁇ y di ⁇ a ⁇ me ⁇ ( ⁇ ig.1) s ⁇ de ⁇ zhi ⁇ is ⁇ chni ⁇ ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ radiation (1), d ⁇ lni ⁇ elny is ⁇ chni ⁇ ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ radiation (2), ⁇ zitsi ⁇ nn ⁇ -chuvs ⁇ vi- ⁇ elny de ⁇ e ⁇ (PBH) ⁇ en ⁇ gen ⁇ vs ⁇ g ⁇ radiation (3) on ⁇ as ⁇ - l ⁇ zhennye dug ⁇ b ⁇ azn ⁇ y na ⁇ avlyayuschey (4) with accumulation and fixation (not shown), which ensure that there is no risk to Breggu-Brentant.
  • the arc-shaped dominant (4) is installed on the basis of (5) and is equipped with a tilt mechanism
  • X-ray sources of radiation (1) and (2) are connected by cables (6) with a high power supply source (7), PSD (3) are connected by cables (8) to the source (9) (10) perevichny x-ray information.
  • the productive X-ray diffraction for the implementation of the method of dividing a heavy-duty large-sized products from small-sized products is small Di ⁇ a ⁇ me ⁇ at s ⁇ anavlivayu ⁇ analyzed on ⁇ be ⁇ (15) eg ⁇ ⁇ sn ⁇ vaniem (5) ⁇ i e ⁇ m ⁇ i ⁇ satsiya di ⁇ a ⁇ me ⁇ a m ⁇ zhe ⁇ ⁇ susches ⁇ vlya ⁇ sya in zavisim ⁇ s ⁇ i ⁇ ⁇ i ⁇ a ma ⁇ e ⁇ iala and ⁇ my ⁇ - ve ⁇ n ⁇ s ⁇ i issleduem ⁇ g ⁇ ⁇ be ⁇ a, na ⁇ ime ⁇ with ⁇ m ⁇ schyu va ⁇ uum- ny ⁇ ⁇ is ⁇ s ⁇ (not ⁇ azany) or magni ⁇ ny ⁇ za ⁇ va ⁇ v (not ⁇ - indicated).
  • P ⁇ i ne ⁇ b ⁇ dim ⁇ s ⁇ i us ⁇ an ⁇ v ⁇ i di ⁇ a ⁇ me ⁇ a on ⁇ ve ⁇ - n ⁇ s ⁇ i sl ⁇ zhn ⁇ y ⁇ my or na ⁇ l ⁇ nny ⁇ ⁇ ve ⁇ n ⁇ s ⁇ ya ⁇ m ⁇ gu ⁇ by ⁇ is ⁇ lz ⁇ vany vs ⁇ m ⁇ ga ⁇ elnye ⁇ is ⁇ s ⁇ bleniya ⁇ i ⁇ a sh ⁇ a ⁇ iv ⁇ v (not ⁇ azany), and ⁇ sn ⁇ vanii (5) m ⁇ gu ⁇ by ⁇ za ⁇ e ⁇ leny ⁇ e- ⁇ e ⁇ dnye me ⁇ anizmy (not ⁇ azany) ⁇ bes ⁇ echivayuschie ⁇ is ⁇ edi- nenie di ⁇ a ⁇ me ⁇ a ⁇ sh ⁇ a ⁇ ivu and its integral rooms in the direction of the reciprocal direction and rotation of the unit.
  • P ⁇ sle cheg ⁇ v ⁇ lyuchayu ⁇ vys ⁇ v ⁇ l ⁇ ny power The is ⁇ chni ⁇ (7) and power
  • the is ⁇ chni ⁇ (9) PBH ⁇ susches ⁇ vlyayu ⁇ ⁇ blu- chenie issleduem ⁇ g ⁇ products (15) ⁇ egis ⁇ i ⁇ uyu ⁇ ⁇ as ⁇ edelenie in ⁇ ensivn ⁇ s ⁇ i radiation di ⁇ agi ⁇ vann ⁇ g ⁇ with ⁇ m ⁇ schyu PBH (3) and bl ⁇ a (10) sb ⁇ a ⁇ e ⁇ vichn ⁇ y ⁇ en ⁇ gen ⁇ vs ⁇ y in ⁇ matsii.
  • the accumulation of the registered distribution of the intensity of the diffused radiation is carried out by the user-friendly computer (11) of the type.
  • FIG. 3 a geometric diagram of a portable device with multiplexers is shown.
  • FIG. 4 a schematic diagram of the assembly of a portable X-ray unit is shown.
  • Formations last 10 to 30 seconds, depending on the part of the product, and the lack of user equipment significantly increases the cost of analysis and increases the volume of Oversized dimensions of the component parts of the portable X-ray diffractometer of the product, which makes it necessary to disassemble the product.
  • the total weight of the compact product does not exceed 21 kg, which is much less than that of any analogue.

Abstract

Cette invention concerne un procédé permettant de déterminer le mode de déformation d'articles de grande taille qui sont faits de matériaux cristallins. L'article à analyser est soumis à un premier faisceau de rayons X possédant une longueur d'onde prédéterminée, puis à un second faisceau de rayons X possédant une autre longueur d'onde prédéterminée. Les faisceaux de rayons X peuvent être appliqués de manière consécutive ou simultanée, après quoi on définit les points médians des pics d'intensité du rayonnement diffracté. On définit ensuite le mode de déformation de l'article analysé en tenant compte de la diffraction sur un seul et même ensemble de surfaces cristallographiques, et en tenant également compte de la relation établie entre les longueurs d'onde données et les sinus des angles de diffraction du rayonnement à ces longueurs d'onde. Cette invention concerne également un diffractomètre portable à rayons X, lequel comprend une source (1) de rayons X, une source complémentaire (2) de rayons X, ainsi qu'un détecteur de rayons X sensible au positionnement (3). Ces éléments sont montés sur un guide arqué (4) avec des systèmes de fixation et d'attache permettant d'effectuer une focalisation de type Bregg-Brentano. Le guide arqué (4) est monté sur une base (5) et comprend un mécanisme d'inclinaison par rapport à cette dernière.
PCT/RU1996/000247 1996-08-30 1996-08-30 Procede permettant de determiner le mode de deformation d'articles de grande taille faits de materiaux cristallins, et diffractometre portable a rayons x permettant de mettre en oeuvre ce procede WO1998009157A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/RU1996/000247 WO1998009157A1 (fr) 1996-08-30 1996-08-30 Procede permettant de determiner le mode de deformation d'articles de grande taille faits de materiaux cristallins, et diffractometre portable a rayons x permettant de mettre en oeuvre ce procede
EA199800047A EA000345B1 (ru) 1996-08-30 1996-08-30 Способ определения напряженно-деформированного состояния крупногабаритных изделий из кристаллических материалов и портативный рентгеновский дифрактометр для его осуществления

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Application Number Priority Date Filing Date Title
PCT/RU1996/000247 WO1998009157A1 (fr) 1996-08-30 1996-08-30 Procede permettant de determiner le mode de deformation d'articles de grande taille faits de materiaux cristallins, et diffractometre portable a rayons x permettant de mettre en oeuvre ce procede

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103245445A (zh) * 2013-05-17 2013-08-14 北京师范大学 一种应力仪
RU2570106C1 (ru) * 2014-05-30 2015-12-10 Федеральное государственное бюджетное учреждение наук Институт химии твердого тела Уральского отделения Российской академии наук Способ визуализации ротационного искривления решетки нанотонких кристаллов
RU2657330C1 (ru) * 2017-02-02 2018-06-13 федеральное государственное бюджетное научное учреждение "Научно-исследовательский институт перспективных материалов и технологий" Способ определения температур фазовых переходов в пленках и скрытых слоях многослойных структур нанометрового диапазона толщин
RU2737861C1 (ru) * 2019-07-26 2020-12-03 Федеральное государственное автономное образовательное учреждение высшего образования "Уральский федеральный университет имени первого Президента России Б.Н. Ельцина" Способ исследования физических свойств и физических процессов в нанотонких пространственных диссипативных структурах

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0117293A2 (fr) * 1983-02-18 1984-09-05 Her Majesty in Right of Canada as represented by the Minister of Energy, Mines and Resources Canada Procédé de mesure de tensions pour diffractométrie à rayons X
SU1716406A1 (ru) * 1989-10-30 1992-02-28 Институт Машиноведения Им.А.А.Благонравова Портативный рентгеновский гониометр дл определени напр жений в крупногабаритных объектах
US5125016A (en) * 1983-09-22 1992-06-23 Outokumpu Oy Procedure and measuring apparatus based on X-ray diffraction for measuring stresses
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
SU1767403A1 (ru) * 1988-07-11 1992-10-07 Институт Машиноведения Им.А.А.Благонравова Переносное устройство дл рентгенодифрактометрического определени напр женного состо ни крупногабаритных изделий

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0117293A2 (fr) * 1983-02-18 1984-09-05 Her Majesty in Right of Canada as represented by the Minister of Energy, Mines and Resources Canada Procédé de mesure de tensions pour diffractométrie à rayons X
US5125016A (en) * 1983-09-22 1992-06-23 Outokumpu Oy Procedure and measuring apparatus based on X-ray diffraction for measuring stresses
US5125016B1 (en) * 1983-09-22 1998-02-24 Outokumpu Oy Procedure and measuring apparatus based on x-ray diffraction for measuring stresses
SU1767403A1 (ru) * 1988-07-11 1992-10-07 Институт Машиноведения Им.А.А.Благонравова Переносное устройство дл рентгенодифрактометрического определени напр женного состо ни крупногабаритных изделий
SU1716406A1 (ru) * 1989-10-30 1992-02-28 Институт Машиноведения Им.А.А.Благонравова Портативный рентгеновский гониометр дл определени напр жений в крупногабаритных объектах
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103245445A (zh) * 2013-05-17 2013-08-14 北京师范大学 一种应力仪
RU2570106C1 (ru) * 2014-05-30 2015-12-10 Федеральное государственное бюджетное учреждение наук Институт химии твердого тела Уральского отделения Российской академии наук Способ визуализации ротационного искривления решетки нанотонких кристаллов
RU2657330C1 (ru) * 2017-02-02 2018-06-13 федеральное государственное бюджетное научное учреждение "Научно-исследовательский институт перспективных материалов и технологий" Способ определения температур фазовых переходов в пленках и скрытых слоях многослойных структур нанометрового диапазона толщин
RU2737861C1 (ru) * 2019-07-26 2020-12-03 Федеральное государственное автономное образовательное учреждение высшего образования "Уральский федеральный университет имени первого Президента России Б.Н. Ельцина" Способ исследования физических свойств и физических процессов в нанотонких пространственных диссипативных структурах

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EA000345B1 (ru) 1999-04-29
EA199800047A1 (ru) 1998-10-29

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