WO1997020276B1 - Conformal meshing for electromagnetic analysis of planar circuits - Google Patents

Conformal meshing for electromagnetic analysis of planar circuits

Info

Publication number
WO1997020276B1
WO1997020276B1 PCT/US1996/019168 US9619168W WO9720276B1 WO 1997020276 B1 WO1997020276 B1 WO 1997020276B1 US 9619168 W US9619168 W US 9619168W WO 9720276 B1 WO9720276 B1 WO 9720276B1
Authority
WO
WIPO (PCT)
Prior art keywords
subsection
subsections
strings
circuit
edge
Prior art date
Application number
PCT/US1996/019168
Other languages
French (fr)
Other versions
WO1997020276A1 (en
Filing date
Publication date
Application filed filed Critical
Priority to US09/077,644 priority Critical patent/US6163762A/en
Publication of WO1997020276A1 publication Critical patent/WO1997020276A1/en
Publication of WO1997020276B1 publication Critical patent/WO1997020276B1/en

Links

Abstract

Conformal meshing is a technique for selecting basis functions such that an accurate representation of the actual current distribution is realized with only a few subsections. This invention relates to conformal meshing, which allows a circuit to be analyzed with an error corresponding to a very small cell size while maintaining the speed normally seen when using a large cell size. Conformal meshing in accordance with this invention bends the subsection to fit the edge of the metal. The current distribution in the subsection is also modified by the introduction of strings, as will be described in more detail later, to accurately represent the high edge current caused by the edge effect. This represents a considerable improvement over existing meshing techniques.

Claims

AMENDED CLAIMS[received by the International Bureau on 23 May 1997 (23.05.97); original claim 1 amended; new claim 13 added; remaining claims unchanged (2 pages)]
1. In a data processing system, a method for electromagnetic analysis of circuits having curved edges by dividing a conduction portion of the circuit into a plurality of subsections; calculating a coupling between each pair of adjacent subsections by assuming the current on one
5 subsection and calculating the voltage induced in an adjacent subsection; storing the pairwise couplings in a matrix and inverting the matrix to produce the desired result in which the improvement comprises: conforming at least one edge of a subsection corresponding to a portion of the planar circuit having a curved boundary to such boundary to 0 produce a subsection having at least one curved edge.
2. The method of claim 1 further comprising: dividing at least one subsection having a curved edge into a plurality of strings, each string representing a filament of current having a small width, and assigning weights to the strings corresponding to known current distribution across
5 the width of the planar transmission line.
3. The method of claim 2 in which the plurality of strings comprises a plurality of strings having different widths.
4. The method of claim 2 in which the plurality of strings comprises a plurality of strings at least one of whose width varies along its length.
5. The method of claim 2 in which at least one of said strings overlaps at least two subsections.
6. The method of claim 2 in which the current in at least one string decreases linearly along its length.
7. The method of claim 6 in which the width of the at least one string decreases along its length to provide a piece wise linear representation of the current in the string.
8. The method of claim 2 in which at least one of said plurality of strings in each of a pair of adjacent but non overlapping subsections comprises a funnel extending to a common point on a boundary between the subsections for allowing current to flow between the sections.
9. The method of claim 2 in which each of at least two open edges of a portion of a transmission line is represented by a separate subsection, and the currents from each open edge taper linearly towards the other open
-23- edge so that the sum of the currents of the two separate subsections combine to accurately represent the current in the center of the portion of the transmission line.
10. The method of claim 9 further comprising a cross-over string extending from a mutual meeting point for adjacent subsections on one side of a transmission line to a mutual meeting point for adjacent subsections on an opposite side of the transmission line.
11. In a data processing system, a method of measuring the impedance of a three dimensional planar electrical circuit at a high frequency comprising the steps of: storing a datafile in a computer memory representing the topology of the electrical circuit; meshing the circuit into a plurality of subsections that conform to the edges of the circuit; dividing each subsection into a plurality of strings extending from a first mutual meeting point on an edge of the subsection to a second mutual meeting point on an edge of the subsection; using a computer processor to calculate the coupling between each pair of adjacent subsections by assuming the current on one subsection and calculating the voltage induced in an adjacent subsection; storing the pairwise couplings in a matrix in the memory; using a computer processor connected to the memory to invert the matrix; and storing the inverted matrix representing the electromagnetic characteristics of the circuit in the memory.
12. The method of claim 11 comprising displaying the electromagnetic characteristics of the circuit on a computer display in which areas of the circuit in which relatively high currents flow are displayed in a different color than areas of the circuit in which relatively lower currents flow.
13. The method of claim 1 in which the circuits are planar.
PCT/US1996/019168 1995-12-01 1996-11-27 Conformal meshing for electromagnetic analysis of planar circuits WO1997020276A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US09/077,644 US6163762A (en) 1995-12-01 1996-11-27 Conformal meshing for electromagnetic analysis of planar circuits

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US785695P 1995-12-01 1995-12-01
US60/007,856 1995-12-01

Publications (2)

Publication Number Publication Date
WO1997020276A1 WO1997020276A1 (en) 1997-06-05
WO1997020276B1 true WO1997020276B1 (en) 1997-07-03

Family

ID=21728466

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1996/019168 WO1997020276A1 (en) 1995-12-01 1996-11-27 Conformal meshing for electromagnetic analysis of planar circuits

Country Status (2)

Country Link
US (1) US6163762A (en)
WO (1) WO1997020276A1 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6381729B1 (en) * 1999-03-31 2002-04-30 International Business Machines Corporation Data processing system and method for efficient determination of return current spread
US6727776B2 (en) * 2001-02-09 2004-04-27 Sarnoff Corporation Device for propagating radio frequency signals in planar circuits
US20040054509A1 (en) * 2002-09-12 2004-03-18 Breit Stephen R. System and method for preparing a solid model for meshing
GB2411743A (en) * 2004-03-02 2005-09-07 Agilent Technologies Inc Modelling current flows in three-dimensional conductive and dielectric bodies
US7356791B2 (en) * 2005-05-27 2008-04-08 Sonnet Software, Inc. Method and apparatus for rapid electromagnetic analysis
US8479127B1 (en) 2006-10-10 2013-07-02 Sonnet Software, Inc. Network accessible system for synthesis of an electronic circuit model
US7945876B2 (en) * 2006-10-10 2011-05-17 Sonnet Software, Inc. Method and apparatus for automatic synthesis of an electronic circuit model
US11416657B2 (en) * 2020-03-20 2022-08-16 Sonnet Software, Inc. Method for simulating vertically oriented current in a structure

Family Cites Families (11)

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Publication number Priority date Publication date Assignee Title
JPH07120351B2 (en) * 1986-03-14 1995-12-20 株式会社日立製作所 Simulation program generation method
JPS63238665A (en) * 1987-03-26 1988-10-04 Toshiba Corp Forming device for triangular mesh for digitizing
JP2635617B2 (en) * 1987-09-29 1997-07-30 株式会社東芝 Method of generating orthogonal lattice points for evaluating semiconductor device characteristics
US4933889A (en) * 1988-04-29 1990-06-12 International Business Machines Corporation Method for fine decomposition in finite element mesh generation
JPH03263174A (en) * 1990-03-14 1991-11-22 Hitachi Ltd Program generating method and area dividing method for same
US5488566A (en) * 1992-06-02 1996-01-30 Eldec Corporation Multi-coil impedance
US5282140A (en) * 1992-06-24 1994-01-25 Intel Corporation Particle flux shadowing for three-dimensional topography simulation
US5379225A (en) * 1992-06-24 1995-01-03 Intel Corporation Method for efficient calculation of vertex movement for three-dimensional topography simulation
US5367465A (en) * 1992-06-24 1994-11-22 Intel Corporation Solids surface grid generation for three-dimensional topography simulation
JP2744888B2 (en) * 1993-09-10 1998-04-28 インターナショナル・ビジネス・マシーンズ・コーポレイション Method and system for partitioning 3-D object into regions
US5579249A (en) * 1993-11-01 1996-11-26 Texas Instruments Incorporated System for modeling an integrated chip package and method of operation

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