WO1997002571A1 - Pilotes repartis d'ecriture de donnees pour memoires fonctionnant en mode continu - Google Patents

Pilotes repartis d'ecriture de donnees pour memoires fonctionnant en mode continu Download PDF

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Publication number
WO1997002571A1
WO1997002571A1 PCT/US1996/009098 US9609098W WO9702571A1 WO 1997002571 A1 WO1997002571 A1 WO 1997002571A1 US 9609098 W US9609098 W US 9609098W WO 9702571 A1 WO9702571 A1 WO 9702571A1
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WIPO (PCT)
Prior art keywords
data
write
signal
address
memory
Prior art date
Application number
PCT/US1996/009098
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English (en)
Inventor
Todd A. Merritt
Troy A. Manning
Original Assignee
Micron Technologies, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US08/497,354 external-priority patent/US5598376A/en
Application filed by Micron Technologies, Inc. filed Critical Micron Technologies, Inc.
Priority to AU61542/96A priority Critical patent/AU6154296A/en
Publication of WO1997002571A1 publication Critical patent/WO1997002571A1/fr

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
    • G11C7/109—Control signal input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
    • G11C7/1018—Serial bit line access mode, e.g. using bit line address shift registers, bit line address counters, bit line burst counters
    • G11C7/1021—Page serial bit line access mode, i.e. using an enabled row address stroke pulse with its associated word line address and a sequence of enabled column address stroke pulses each with its associated bit line address
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
    • G11C7/1096—Write circuits, e.g. I/O line write drivers

Definitions

  • This invention relates to memory device architectures designed to provide high density data storage with high speed read and write access cycles. This invention relates more specifically to circuits and methods for controlling memory write cycles.
  • EDO Extended Data Out
  • Determining when valid data will arrive at the outputs of a fast page mode or EDO DRAM can be a complex function of when the column address inputs are valid, when /CAS falls, the state of /OE and when /CAS rose in the previous cycle.
  • the period during which data is valid with respect to the control line signals (especially /CAS) is determined by the specific implementation ofthe EDO mode, as adopted by the various DRAM manufacturers.
  • SDRAM synchronous DRAM
  • the proposed industry standard synchronous DRAM (SDRAM) for example has an additional pin for receiving a system clock signal. Since the system clock is connected to each device in a memory system, it is highly loaded, and it is always toggling circuitry in every device. SDRAMs also have a clock enable pin, a chip select pin and a data mask pin. Other signals which appear to be similar in name to those found on standard DRAMs have dramatically different functionality on a SDRAM. The addition of several control pins has required a deviation in device pinout from standard DRAMs which further complicates design efforts to utilize these new devices. Significant amounts of additional circuitry are required in the SDRAM devices which in turn result in higher device manufacturing costs.
  • write cycles are performed in response to both /CAS and /WE being low after /RAS is low. If an address change occurs at approximately the same time that /CAS falls, then an additional delay is required to equilibrate input/output lines and to fire a new column prior to beginning the write cycle. Data to be written is latched, and the write cycle begins when the latter of /CAS and /WE goes low provided that the equilibrate is complete.
  • the write time can be considered to be the period of time that /WE and /CAS are simultaneously low.
  • the write cycle is often timed out so that it can continue for a short period of time after /CAS or /WE goes high especially for "late write” cycles. Maintaining the write cycle throughout the timeout period eases the timing specifications for /CAS and /WE that the device user must meet, and reduces susceptibility to glitches on the control lines during a write cycle.
  • the write cycle is terminated after the time out period, and if /WE is high a read access begins based on the address present on the address input lines. The read access will typically begin prior to the next /CAS falling edge so that the column address to data valid specification can be met (tAA).
  • Another aspect of controlling the write cycle timing includes delaying the write enable or write enables to guarantee that the write data drivers are not enabled prior to the completion ofthe equilibrate function. Equalization of internal data I/O lines is performed in response to column address transitions in preparation for reading or writing data from another memory cell, and also in response to receipt of a write command to reduce the maximum signal transition on the data lines once the write drivers are enabled. If the data lines are each equalized to one half of Vcc for example, then the write data drivers will only need to drive one line from half Vcc to ground, and the other from half Vcc to Vcc.
  • a simple method of equilibrating the I/O lines is to: disable I/O line drivers; isolate the I/O lines from the digit lines; and couple complimentary I/O lines together. When a true I/O line is coupled to a complimentary I/O line, a logic high will be coupled to a logic low and each line will equalize to a potential approximately halfway between a high and a low.
  • the delay value for the write cycle to write driver enable delay must account for the worst case signal delays from the equilibrate and write driver enable signal sources to the furthest data I/O line equilibrate devices and write data drivers. Since the equilibrate and write driver enable signal sources are located in a main logic area, a considerable signal propagation delay will result from the transmission of these signals across the chip to the furthest I/O line pair. Timing delays due to routing differences in the two signal paths can be very difficult to accurately model and predict. To overcome these difficulties, extra delay is added for timing margin. Unfortunately, this prevents the write drivers from being enabled as soon as the equilibrate function is complete.
  • the write cycle timing circuits may need to be adjusted to shorten the minimum write cycle times to match these performance improvements. Adjustments may include shortening the equilibrate time, shortening the write cycle to write driver enable time and shortening the write cycle hold time. Fine tuning of these timing circuits is time consuming and costly. If the write cycles are too short, the device may fail under some or all operating conditions. If the write cycles are too long, the device may not be able to achieve the higher operating frequencies that are more profitable for the device manufacturers. Finally, if the equilibrate is not complete prior to enabling the write drivers, then excessive current may flow through the write drivers from Vcc to ground. With the increased operating frequencies of burst access memory devices a new method of generating the write cycle timing is desired which will allow for maximum write cycle times despite the operating frequency ofthe device.
  • An integrated circuit memory device with a standard DRAM pinout is designed for high speed data access and for compatibility with existing memory systems.
  • a high speed burst mode of operation is provided where multiple sequential accesses occur following a single column address, and read data is output relative to the /CAS control signal.
  • the address is incremented internal to the device eliminating the need for external address lines to switch at high frequencies.
  • Read/Write commands are issued once per burst access eliminating the need to toggle the Read/Write control line at high speeds. Only one control line per memory chip (/CAS) must toggle at the operating frequency in order to clock the internal address counter and the data input/output latches.
  • each /CAS is typically less than the load on the other control signals (/RAS, /WE and /OE) since each /CAS typically controls only a byte width ofthe data bus.
  • a new write cycle timing method and circuit allow for maximized write cycle timing at all operating frequencies to provide maximum write cycle timing margins.
  • Write control is maintained throughout a write cycle such that the write operation time approaches the write cycle time.
  • the write function is only halted between write cycles for a period of time required to select a new column ofthe array and to equilibrate I/O lines in the array.
  • a logic device is located near the sense amplifiers ofthe device to control the write function directly with the use ofthe I/O line equilibrate signal.
  • the local write enable circuit allows the write cycle time to be essentially equal to the access cycle time minus the I/O line equilibrate time in burst access memory devices.
  • the write function may begin immediately following the end ofthe equilibration cycle to provide a maximum write time without interfering with the address setup time ofthe next cycle.
  • Figure 1 is an electrical schematic diagram of a memory device in accordance with one embodiment ofthe invention.
  • Figure 2 is a timing diagram for a method of accessing the device of figure 1;
  • Figure 3 is a top view of a general device layout for a device designed in accordance with the teachings of the present invention.
  • Figure 4 is block level schematic of a data path portion ofthe device of figure 3;
  • Figure 5 is a more detailed schematic of a portion ofthe circuitry of figure 4; and Figure 6 is a schematic diagram ofa computer system designed in accordance with the teachings ofthe present invention.
  • Figure l is a schematic representation of a sixteen megabit device designed in accordance with the present invention.
  • the device is organized as a 2 Meg x 8 burst EDO DRAM having an eight bit data input/output path 10 providing data storage for 2,097,152 bytes of information in the memory array 12.
  • the device of figure 1 has an industry standard pinout for eight bit wide EDO DRAMs.
  • An active-low row address strobe (/RAS) signal 14 is used to latch a first portion of a multiplexed memory address, from address inputs A0 through A10 16, in latch 18.
  • the latched row address 20 is decoded in row decoder 22.
  • the decoded row address is used to select a row ofthe memory array 12.
  • a column address strobe (/CAS) signal 24 is used to latch a second portion of a memory address from address inputs 16 into column address counter 26.
  • the latched column address 28 is decoded in columrr address decoder 30.
  • the decoded column address is used to select a column ofthe memory array 12.
  • data within the memory array located at the row and column address selected by the row and column address decoders is read out ofthe memory array and sent along data path 32 to output latches 34.
  • Data 10 driven from the burst EDO DRAM may be latched external to the device in synchronization with /CAS after a predetermined number of /CAS cycle delays (latency).
  • the first /CAS falling edge is used to latch the initial address for the burst access.
  • the first burst data from the memory is driven from the memory after the second /CAS falling edge, and remains valid through the third /CAS falling edge.
  • the output drivers 34 continue to drive the data lines without tri-stating the data outputs during /CAS high intervals dependent on the state ofthe output enable and write enable (/OE and /WE) control lines, thus allowing additional time for the system to latch the output data.
  • /OE and /WE state ofthe output enable and write enable
  • the time at which data becomes valid at the outputs ofthe burst EDO DRAM is dependent only on the timing ofthe /CAS signal provided that /OE is maintained low, and /WE remains high.
  • the output data signal levels may be driven in accordance, with, but are not limited to, CMOS, TTL, LVTTL, GTL, or HSTL output level specifications.
  • the address may be advanced linearly, or in an interleaved fashion for maximum compatibility with the overall system requirements.
  • the column address may be advanced with each /CAS transition, each pulse, or multiple of /CAS pulses in the event that more than one data word is read from the array with each column address.
  • data is also driven from the part after each transition following the device latency which is then referenced to each edge of the /CAS signal. This allows for a burst access cycle where the highest switching control line (/CAS) toggles only once (high to low or low to high) for each memory cycle.
  • a device may be designed to access two data words per cycle
  • prefetch architecture The memory array for a prefetch architecture device may be split into odd and even array halves.
  • the column address least significant bit is used to select between odd and even halves while the other column address bits select a column within each ofthe array halves.
  • interleaved access mode with column address 1 data from columns 0 and 1 are read and the data from column 1 is output followed by the data from column 0 in accordance with standard interleaved addressing as described in SDRAM specifications.
  • column address 1 is applied to the odd array half, and incremented to address 2 for accessing the even array half to fulfill the two word access.
  • One method of implementing this type of device architecture is to provide a column address incrementing circuit between the column address counter and the even array half.
  • the incrementing circuit increments the column address only if the initial column address in a burst access cycle is odd, and the address mode is linear. Otherwise the incrementing circuit passes the column address unaltered.
  • the column address is advanced once for every two active edges ofthe /CAS signal.
  • multiple data words may be temporarily stored as they are input to the device.
  • the actual write of data to the memory cells occurs after the last input data is latched, and may extend slightly into the next memory cycle as long as it ends prior to the . ⁇ ext columivbemg activated. Prefetch architectures where more than two data words are accessed are also possible.
  • Other memory architectures applicable to the current invention include a pipelined architecture where memory accesses are performed sequentially, but each access requires more than a single cycle to complete.
  • a pipelined architecture the overall throughput ofthe memory approaches one access per cycle, but the data out ofthe memory is offset by a number of cycles equal to the pipeline length and/or the desired latency from /CAS.
  • each new column address from the column address counter is decoded and is used to access additional data within the memory array without the requirement of additional column addresses being specified on the address inputs 16.
  • This burst sequence of data continues for each /CAS falling edge until a predetermined number of data accesses equal to the burst length occurs.
  • a /CAS falling edge received after the last burst address has been generated latches another column address from the address inputs 16 and a new burst sequence begins.
  • Read data is latched and output with each falling edge of /CAS after the first /CAS latency.
  • data 10 is latched in input data latches 34.
  • Data targeted at the first address specified by the row and column addresses is latched with the /CAS signal when the first column address is latched (write cycle data latency is zero).
  • Other write cycle data latency values are possible; however, for today's memory systems, zero is preferred.
  • Additional input data words for storage at incremented column address locations are latched by /CAS on successive /CAS active transitions.
  • Input data from the input latches 34 is passed along data path 32 to the memory array where it is stored at the location selected by the row and column address decoders.
  • a predetermined number of burst access writes are performed without the requirement of additional column addresses being provided on the address lines 16.
  • a subsequent /CAS pulse latches a new beginning column address, and another burst read or write access begins.
  • the memorj ⁇ device of figure 1 may include the-option of switching between burst EDO and standard EDO modes of operation.
  • the write enable signal /WE 36 is used at the row address latch time (/RAS falling, /CAS high) to determine whether memory accesses for that row are burst or page mode cycles. If /WE is low when /RAS falls, burst access cycles are selected. If /WE is high at /RAS falling, standard extended data out (EDO) page mode cycles are selected. Both the burst and EDO page mode cycles allow for increased memory device operating frequencies by not requiring the data output drivers 34 to place the data lines 10 in a high impedance state between data read cycles while /RAS is low.
  • DRAM control circuitry 38 in addition to performing standard DRAM control functions, controls the I/O circuitry 34 and the column address counter/latch 26 in accordance with the mode selected by /WE when /RAS falls.
  • the state of /WE when /RAS falls may be used to switch between other possible modes of operation such as interleaved versus linear addressing modes.
  • the write enable signal is used in burst access cycles to select read or write burst accesses when the initial column address for a burst cycle is latched by /CAS. /WE low at the column address latch time selects a burst write access.
  • /WE high at the column address latch time selects a burst read access.
  • the level ofthe /WE signal must remain high for read and low for write burst accesses throughout the burst access.
  • a low to high transition within a burst write access terminates the burst access, preventing further writes from occurring.
  • a high to low transition on /WE within a burst read access likewise terminates the burst read access and places the data output 10 in a high impedance state. Transitions ofthe /WE signal may be locked out during critical timing periods within an access cycle in order to reduce the possibility of triggering a false write cycle, and/or to guarantee the completion of a write cycle once it has begun.
  • the state of /WE determines whether a burst access continues, is initiated, or is terminated. Termination of a burst access places the DRAM in a state to receive another burst access command. Both /RAS and /CAS going high during a burst access also terminates the burst access cycle placing the data drivers in a high impedance output state. Read data may remain valid at the device outputs if /RAS alone goes high while /CAS is active for compatibility with hidden refresh cycles, otherwise /RAS high alone may be used to terminate a burst access.
  • a minimum write enable pulse width is only required when it is desired to terminate a burst read and then begin another burst read, or terminate a burst write prior to performing another burst write with a minimum delay between burst accesses.
  • burst reads /WE transitions from high to low to terminate a first burst read, and then /WE transitions back high prior to the next falling edge of /CAS in order to specify a new burst read cycle.
  • For burst writes /WE transitions high to terminate a current burst write access, then back low prior to the next falling edge of /CAS to initiate another burst write access.
  • a minimum /WE pulse width may be specified to guarantee recognition ofthe /WE pulse despite /WE lockout periods. If no /WE lockout circuit is used, termination of a burst access may be edge sensitive to the /WE signal.
  • a basic implementation ofthe device of figure 1 may include a fixed burst length of 4, a fixed /CAS latency of 2 and a fixed interleaved sequence of burst addresses. This basic implementation requires very little additional circuitry to the standard EDO page mode DRAM, and may be mass produced to provide the functions of both the standard EDO page mode and burst EDO DRAMs. This device also allows for the output enable pin (/OE) to be grounded for compatibility with many SIMM module designs.
  • /OE When not disabled (tied to ground), /OE is an asynchronous control which prevents data from being driven from the part in a read cycle if it is inactive (high) prior to /CAS falling and remains inactive beyond /CAS rising. If these setup and hold conditions are not met, then the read data may be driven for a portion ofthe read cycle. It is possible to synchronize the /OE signal with /CAS, however this typically increases the /CAS to data valid delay time and doesn't allow for the last output data to be disabled prior to /RAS high without an additional /CAS low pulse which would otherwise be unnecessary. In a preferred embodiment, if /OE transitions ⁇ ig a1rany time during a read cycle the outputsremain in a high impedance state until the next falling edge of /CAS despite further transitions of the /OE signal.
  • Programmability ofthe burst length, /CAS latency and address sequences may be accomplished through the use of a mode register 40 which latches the state of one or more ofthe address input signals 16 or data signals 10 upon receipt of write-/CAS-before-/RAS (WCBR) programming cycle.
  • outputs 44 from the mode register control the required circuits on the DRAM.
  • Burst length options of 2, 4, 8 and full page as well as /CAS latencies of 1 , 2 and 3 may be provided.
  • Other burst length and latency options may be provided as the operating speeds ofthe device increase, and computer architectures evolve.
  • the device of figure 1 includes programmability ofthe address sequence by latching the state ofthe least significant address bit during a WCBR cycle.
  • the burst length and /CAS latency for this particular embodiment are fixed.
  • Other possible alterations in the feature sets of this DRAM include having a fixed burst mode only, selecting between standard fast page mode (non- EDO) and burst mode, and using the output enable pin (/OE) 42 in combination with /RAS to select between modes of operation.
  • a WCBR refresh cycle could be used to select the mode of operation rather than a control signal in combination with /RAS.
  • a more complex memory device may provide additional modes of operation such as switching between fast page mode, EDO page mode, static column mode and burst operation through the use of various combinations of /WE and /OE at /RAS falling time.
  • One mode from a similar set of modes may be selected through the use ofa WCBR cycle using multiple address or data lines to encode the desired mode.
  • a device with multiple modes of operation may have wire bond locations, or programmable fuses which may be used to program the mode of operation ofthe device.
  • a preferred embodiment of a sixteen bit wide burst EDO mode DRAM designed in accordance with the teachings of this invention has two column address strobe input pins /CASH and /CASL. For read cycles only one /CAS signal needs to toggle. The second /CAS may remain high or toggle with the other /CAS. During burst read cycles, all sixteen data bits will be driven out of part during a read cycle even if one /CAS remains inactive.
  • a microprocessor reads all data bits on a data bus in each read cycle, but may only write certain bytes of data in a write cycle. Allowing one ofthe /CAS control signals to remain static during read cycles helps to reduce overall power consumption and noise within the system.
  • each ofthe /CAS signals (CASH and /CASL) acts as a write enable for an eight bit width ofthe data.
  • the two /CAS's are combined in an AND function to provide a single internal /CAS which will go low when the first external /CAS falls, and returns high after the last external /CAS goes high. All sixteen data inputs are latched when the first ofthe /CAS signals transitions low. If only one /CAS signal transitions low, then the eight bits of data associated with the /CAS that remained high are not stored in the memory.
  • the present invention has been described with reference to several preferred embodiments.
  • fast page mode DRAMs and EDO DRAMs are available in numerous configurations including xl , x4, x8 and xl6 data widths, and 1 Megabit, 4 Megabit, 16 Megabit and 64 Megabit densities; the memory device ofthe present invention may take the form of many different memory organizations. It is believed that one who is skilled in the art of integrated circuit memory design can, with the aide of this specification design a variety of memory devices which do not depart from the spirit of this invention. It is therefore believed that detailed descriptions ofthe various memory device organizations applicable to this invention are not necessary.
  • the pinout for this new burst EDO memory device may be identical to the pinout for a standard EDO DRAM.
  • the common pinout allows this new device to be used in existing memory designs with minimum design changes.
  • the common pinout also allows for ease of new designs by those of skill in the art who are familiar with the standard EDO DRAM pinout.
  • Variations ofthe described invention which maintain the standard EDO DRAM pinout include driving the /CAS pin with a system clock signal to synchronize data access of the memory device with i>.e ⁇ systenrelock.
  • the address may be incremented internally to provide burst access cycles in synchronization with the system clock.
  • Other pin function alternatives include driving the burst address incrementing signal on the /OE pin since the part does not require a data output disable function on this pin.
  • Other alternate uses ofthe /OE pin also allow the device to maintain the standard EDO pinout, but provide increased functionality such as burst mode access.
  • the /OE pin may be used to signal the presence ofa valid column starting address, or to terminate a burst access.
  • Figure 2 is a timing diagram for performing a burst read followed by a burst write ofthe device of figure 1.
  • a row address is latched by the /RAS signal.
  • /WE is low when /RAS falls for an embodiment ofthe design where the state ofthe /WE pin is used to specify a burst access cycle at /RAS time, otherwise /WE may be a "don't care" at /RAS falls.
  • /CAS is driven low with /WE high to initiate a burst read access, and the initial column address is latched.
  • the data out signals (DQ's) are not driven in the first /CAS cycle.
  • the internal address generation circuitry On the second falling edge ofthe /CAS signal the internal address generation circuitry provides a column address, and another access ofthe array begins.
  • the first data out is driven from the device following the second /CAS and a /CAS to data access time (tCAC) delay.
  • Additional burst access cycles continue, for a device with a specified burst length of four, until the fifth falling edge of /CAS which latches a new column address for a new burst read access.
  • /WE falling in the fifth /CAS cycle terminates the burst access, and initializes the device for additional burst accesses.
  • the sixth falling edge of /CAS with /WE low is used to latch a new burst address, latch input data and begin a burst write access ofthe device.
  • Additional data values are latched on successive /CAS falling edges until /RAS rises to terminate ⁇ he burst access. It should be noted from figure 2 that for burst read cycles the data remains valid on the device outputs as long as the /OE pin is low, except for brief periods of data transition. Also, since the /WE pin is low prior to or when /CAS falls, the data input/output lines are not driven from the part during write cycles, and the /OE pin is a "don't care". Only the /CAS signal and the data signals toggle at relatively high frequency, and no control signals other than /CAS are required to be in an active or inactive state for one /CAS cycle time or less.
  • Typical DRAMs also allow for the column address to propagate through to the array to begin a data access prior to /CAS falling. This is done to provide fast data access from /CAS falling if the address has been valid for a sufficient period of time prior to /CAS falling for the data to have been accessed from the a ⁇ ay. In these designs an address transition detection circuit is used to restart the memory access if the column address changes prior to /CAS falling.
  • This method actually requires additional time for performing a memory access since it must allow for a period of time at the beginning of each memory cycle after the last address transition to prepare for a new column address by equilibrating internal I/O lines, deselecting all columns and selecting a new column. Changes in the column address just prior to /CAS falling may increase the access time by approximately five nanoseconds.
  • An embodiment ofthe present invention will not allow the column address to propagate through to the a ⁇ ay until after /CAS has fallen. This eliminates the need for address transition detection circuitry, and allows for a fixed a ⁇ ay access time relative to /CAS.
  • the address counter is advanced on /CAS rising edges, and the address generated in the counter is then presented to the a ⁇ ay on the next /CAS falling edge in a burst access.
  • FIG. 3 shows a topographic layout view of one embodiment of a memory device designed in accordance with the teachings ofthe present invention.
  • Memory device 50 has a central logic region 52, a ⁇ ay regions 54, and logic and pads regions 56.
  • Circuitry in region 52 includes write control circuitry 58 and equilibration control circuitry 60 in addition to other memory timing control circuits.
  • Circuitry in a ⁇ ay interface regions 62 includes a ⁇ ay address drivers.
  • Circuitry in the logic and pads areas includes data buffers and I/O pads. I/O pads running through the center of a chip in this fashion is indicative of a Leads Over Chip (LOC) packaging configuration.
  • LOC Leads Over Chip
  • layouts include but are not limited to: a) layouts with pads and central logic circuits located on the sides and/or ends ofthe memory device with a ⁇ ay circuitry occupying the center ofthe device; b) central logic circuits located centrally along one axis ofthe device with pads on the sides or ends ofthe device; or c) central logic in the center ofthe chip with pads running through the chip and on the sides or ends ofthe chip for a hybrid of LOC and conventional bonding.
  • a ⁇ ay regions 54 are broken into 16 suba ⁇ ay regions 64 each of which has an associated data sense amplifier 66 located along one edge ofthe array.
  • Write enable signal 68 and I/O line equilibrate signal 70 are routed to each data sense amplifier.
  • Figure 4 is block level schematic ofa data path portion ofthe device of figure 3. Elements in figure 4 that have the same or similar function as numbered elements in figure 3 are given the same reference numerals.
  • data written to the memory device is received on data I/O pad 100.
  • the write data is passed through input circuit 102 to a global sense amp 66 over write data lines 103.
  • the sense amplifier includes an I/O line multiplexer 104 which is used to select a path from local I/O data line pair 106 to one of two pairs of a ⁇ ay I/O lines 108 and 110.
  • Write data is driven from write data lines 103 to I/O lines 106 when enabled by a logical combination ofthe equilibrate signal 70 and the write enable signal 68 from timing circuit 59 and data path control circuit 124 of central logic circuitry 52.
  • array I/O lines 108 are coupled to an adjacent section ofthe a ⁇ ay (not shown).
  • Array I/O lines 110 are true and compliment lines coupled to a iocai anay sense amplifier 112 which is part of a ⁇ ay section 64.
  • Column select signal 114 from column driver 115 couples a ⁇ ay data I/O lines 1 10 to a pair of complimentary digit lines 116 inside the local sense amplifier 112.
  • One ofthe complimentary digit lines is coupled to a memory cell 118 through an access device which is selected by a signal on word line 120 from a row address decoder.
  • Read data follows the same path from the memory cell to the global sense amp where it is then driven on complimentary data read lines 122 to complimentary data lines 126 under control of data path control logic 124 and timing circuits 59.
  • Complimentary data 126 is driven to an I/O pad 100 through output circuit 128.
  • This specific embodiment is not intended to provide an exhaustive description of all forms ofthe present invention. For example, I/O line multiplexer 104 would not be necessary if there is a global sense amp 67 for each pair of a ⁇ ay I/O lines.
  • additional a ⁇ ay I/O lines could be multiplexed through the multiplexer 104 to allow for even fewer global sense amplifiers.
  • Another variation is to allow read and write data to share a common path between the global sense amplifiers and the I/O pad.
  • separate input and output data pins can be provided. Numerous additional variations are possible and will be recognized by one of skill in the art.
  • Figure 5 is a schematic diagram providing additional detail for portions ofthe circuitry of figure 4.
  • /WE and /CAS are logically combined in command latch and control circuit 154.
  • the write command output of circuit 154 is buffered through driver 156 to write command signal line 158.
  • the write command is coupled to a plurality of sense amps 66 through a distributed line resistance represented by resistor 160 over a signal line with distributed capacitive load represented by capacitor 162.
  • Write signal 164 a ⁇ iving at the sense amplifier will be a delayed version ofthe output ofthe write command from the command latch.
  • Address inputs 170 are coupled to an address counter 172 and/or column address latch 174- ⁇ vhich provide a burst column address 175 to the memory a ⁇ ay.
  • the column address and a version ofthe write command 176 are used to generate an equilibrate signal 182 in the address transition detection circuit 180.
  • the address transition circuit may generate the equilibrate signal synchronously with an access cycle strobe signal rather than waiting for an actual address transition to be detected, especially if the address is advanced on rising /CAS edges in preparation for the next active falling edge.
  • Equilibration control signal 182 passes through distributed resistance 184, and is loaded by distributed capacitance 186.
  • a delayed version ofthe equilibrate signal 188 is coupled to the sense amp 66.
  • the time delay ofthe write and equilibrate signals 164 and 188 at sense amp 66 will be dependent on which sense amp is being driven, as the distributed resistance and capacitances will vary for each sense amp location.
  • Write command 164 and equilibrate signal 188 are combined at the global sense amp 66 in circuit 200.
  • the write command is gated with a decoded row address signal 204 in circuits 202 and 208.
  • Gated write command 210 is then combined with the equilibrate signal in logic gate 212 to form a write driver enable signal 214.
  • Equilibrate signal 188 provides an active low enable signal to data I/O line equilibration device 232.
  • device 232 couples the two data I/O lines 106 together to equalize their potentials.
  • a low on line 188 also disables logic device 212 preventing the write driver enable 214 from going active.
  • the equilibrate control signal 188 transitions high, the equilibration device 232 is deactivated, and the write driver enable gate 212 is enabled.
  • the write command will be passed through gate 212 placing the write enable signal 214 in an active low condition without the requirement for an equilibration to write enable delay.
  • Signal 214 is inverted in inverter 216 to provide an active high write enable 218.
  • the active low write enable goes to two NOR gates 242 and 246.
  • Active high write enable 218 is coupled to NAND gates 240 and 244.
  • the NOR and NAND gates pass write data to the I/O lines through devices 250-256 when enabled by the write driver enable signals 214 and 218.
  • the write data on line 103 may be high.
  • a high on signal 103 in combination with a high write driver enable on signal line 218 will provide a low output from NAND gate 240 which will turn on device 250 to drive a logic one on the true I/O line.
  • the high signal on data line 103 will disable NOR gate 242 to eliminate a cu ⁇ ent path to ground while NAND 250 is turned on.
  • Data line 103 is inverted at inverter 258 to provide compliment data 260.
  • complimentary data line 260 will be low which will enable NOR gate 246 and disable NAND gate 244.
  • Enabled NOR gate 246 combined with the active write driver enable signal 214 will provide a high output from NOR 246 to turn on device 256 and drive the complimentary I/O line low.
  • the write command 164 can remain active throughout a burst write access. In this case, the write drivers are enabled and disabled by the equilibrate signal which will occur at the beginning of each access cycle.
  • Multiple write command signals 158 may be utilized in devices with multiple /CAS or multiple /WE inputs to control writes to one of multiple data bytes for example.
  • the decoded row address input prevents the write drivers from driving data on I/O lines in nonselected sections ofthe a ⁇ ay.
  • Multiplexer 104 of figure 4 may be turned on during equilibrate and write portions ofthe cycle to allow a ⁇ ay I/O lines to first be equilibrated and then receive write data. For nonburst mode memory devices, it is beneficial to provide the write command prior to the end ofthe equilibrate function to allow the write to begin as soon as possible.
  • the write will typically end prior to the next /CAS falling edge to allow the device to meet the column address to data valid access time in (TAA).
  • TAA column address to data valid access time
  • the page mode cycle time is very short, but the address access time begins while /CAS is high, so the write cycles should end as soon as possible.
  • One way to allow the write cycle to end as soon as possible is to begin it immediately after the equilibrate is complete.
  • devices 250 and 256 will generally be enabled simultaneously, as will devices 252 and 254. If the enable gate 212 were not locally present, then the write enable signal would need to be delayed from the equilibrate disable time to guarantee that a cu ⁇ ent path through devices 250, 232 and 256 or devices 252, 232 and 254 does not exist.
  • the write enable may be deactivated in response to /RAS high and /CAS high, /RAS high alone, or after a time-out period following /CAS high.
  • the write command may be held active is throughout a burst write access. Alternatively, it may be cleared at the beginning of each access cycle, and then relatched provided that /WE is low on the following /CAS high to low transition. If cleared, the period of time that the write command is inactivated within a burst write access is preferably shorter than the equilibrate time so that the write cycle can be maximized which in turn allows for a minimum cycle time.
  • a cu ⁇ ent burst write access When a read command is detected (/WE high at /CAS falling), a cu ⁇ ent burst write access will be terminated and a burst read access will begin. It may be desirable to gate the equilibrate signal with the read command and the write control signal to ensure that the equilibrate signal does not end prior to the write control signal becoming invalid. This would be done to prevent the write drivers from becoming enabled for a fraction ofthe first read cycle in a burst read access sequence.
  • One advantage is a maximized write time since the write cycle can begin as soon as the equilibrate is complete for all device types, and can last until the next cycle begins in burst access devices.
  • a second advantage is elimination of write driver enable delay circuitry which can have a variable delay dependent on the operating conditions ofthe memory device (supply voltage, temperature, etc.). Each driver will be fired when the equilibrate signal is locally deactivated, eliminating the possibility of crossing cu ⁇ ent through complimentary write drivers while complimentary data lines are coupled together for equilibration.
  • a memory device may be designed with multiple /CAS inputs as described above. For a memory device with two /CAS inputs where each /CAS controls eight bits of a sixteen bit wide data port, a write cycle where only one /CAS is low must not write all data bits from the data input to the memory.
  • a portion ofthe write data path associated with an inactive /CAS may be interrupted in a number of ways.
  • Each ofthe two /CAS signals may enable half ofthe column address decoders such that no column will be selected in half of the memory associated with a high /CAS in a write cycle.
  • the write data drivers can be enabled, but the data I/O lines associated with a disabled column decoder will not be coupled to any memory cells.
  • the write control signals may be gated with the appropriate /CAS signal to prevent some ofthe write data drivers from being enabled. In this case, read data may be coupled from some memory cells to data I/O lines.
  • FIG. 6 is a schematic representation of a data processing apparatus designed in accordance with the present invention.
  • a microprocessor may be, but is not limited to, a central processing unit (CPU), a microprocessor, a microcontroller, a digital signal processor, or an arithmetic processor.
  • microprocessor 112 is connected via address lines 114 and control lines 116 to a memory control circuit 118.
  • the memory control circuit provides address and control signals on lines 122 and 120 respectively to a burst access memory device 124.
  • the burst access memory device sends and receives data over data bus 126.
  • Optional data bus buffer 130 between memory data bus 126 and microprocessor data bus 128 allows for amplification ofthe data signals, and/or synchronization with the microprocessor and memory control signals.
  • a fast static random access memory (SRAM) cache circuit 132 is also optional and provides higher speed access to data stored in the cache from the memory circuit or the microprocessor.
  • Memory control circuit 1 18 may be incorporated within the microprocessor.
  • the memory control circuit provides the required address strobe signals and read/write control signals required for burst mode access ofthe memory circuit. By providing burst access ofthe memory by the processor, a computer with relatively high memory bandwidth can be designed without the requirement ofa fast SRAM cache. SRAMs which are fast enough to provide memory access without wait states can significantly add to the cost of a computer.
  • burst access memory device ofthe present invention allows for medium to high performance computers to be manufactured at a cost which is significantly less than those manufactured today.
  • Use ofthe burst access memory device ofthe present invention in cooperation with a fast SRAM cache allows for an even higher performance computer design by providing fast access to main memory in the event of a cache miss.
  • the processor 112 provides an initial address, and a write command to the memory controller.
  • the memory controller provides a row address to the memory with a row address strobe.
  • the memory controller then provides a write command, a column address and a column address strobe to the memory.
  • the memory will equilibrate internal data I/O lines in response to receipt ofthe write command and column address.
  • write data and write command signals are passed to global sense amplifiers within the burst access memory device.
  • write data drivers are enabled, and write data is stored in the memory a ⁇ ay.
  • positive (low to high) transitions of /CAS will cause an internal address counter ofthe memory device to advance to the next burst address.
  • Negative (high to low) transitions of /CAS will then end the previous write cycle and equilibrate the I/O lines.
  • the negative transition of /CAS will also allow the burst address from the counter to be applied to the a ⁇ ay. Once the equilibration is complete, the next write will be performed at the burst address from the counter.
  • a clock signal is input to a burst access device to control generation of a burst address from the counter (SDRAMs for example have a clock input pin).
  • memory 124 operates in a page mode such as Fast Page Mode or EDO mode.
  • Write commands at memory sense amps are enabled by the equilibrate signal becoming inactive at the sense amp.
  • Using the equilibrate signal at the sense amp to gate the write signal to enable the write drivers eliminates wasted time associated with delaying the write driver enable signal to prevent excessive cunents from flowing through the write drivers during the equilibration operation.
  • a node may be, but is not limited to, an intersection of conductors, a circuit input or output, or any point along a signal path.
  • the write command may be said to enter the global sense amp at node 164 and device 250 of figure 5 is said to be connected to a power source at node 270.
  • the term signal may refer to but is not limited to information transfe ⁇ ed along a conductor, or may refer to the conductor itself.
  • the equilibrate signal 188 is coupled to the sense amp 66.
  • the term signal represents a physical conductor for carrying the electrical information to equilibrate the data I/O lines, and is not limited to the electrical information itself which is not present when the device is not connected to a power source.
  • the term “coupled” refers to but is not limited to a connection which may be made directly, after buffering, or through another element such as a resistor, capacitor, transistor, or logic device. Typically, a device will be responsive at some time to a signal or another device which is coupled to it.

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Abstract

Un dispositif de mémorisation à circuits intégrés est conçu pour exécuter des cycles d'écriture de données à grande vitesse. Un signal d'activation d'adresse sert à verrouiller une première adresse. Au cours d'un cycle d'accès en salves, l'adresse est incrémentée à l'intérieur du dispositif au moyen de transitions supplémentaires d'activation d'adresse. Une nouvelle adresse mémoire n'est nécessaire qu'au début de chaque accès en salves. Les commandes de lecture/écriture sont émises une fois par accès en salves, ce qui rend inutile le basculement de la ligne de commande de lecture/écriture à la fréquence de cycle du dispositif. Une transition de la ligne de commande de lecture/écriture au cours d'un accès en salves est utilisée pour mettre fin à l'accès en salves et initialiser le dispositif pour un autre accès en salves. Les durées de cycle d'écriture sont maximisées de façon à permettre des accroissements des fréquences opératoires du mode continu. Les portes logiques locales situées à proximité des amplificateurs de détection de matrices commandent les pilotes d'écriture de données de façon à assurer des temps d'écriture maximum sans croisement de courant au cours des périodes d'équilibrage des lignes d'entrée/sortie. En sélectionnant par porte les signaux globaux d'autorisation d'écriture au moyen de signaux globaux équilibrés au niveau des emplacements des amplificateurs de détection de données, on produit des signaux locaux de commande des cycles d'écriture qui restent valides pendant pratiquement toute la durée de cycle diminuée de la période d'équilibrage de la ligne d'entrée/sortie dans les dispositifs de mémorisation à accès en salves. Pour les dispositifs de mémorisation qui ne fonctionnent pas en mode continu, mais en mode EDO ou en mode Page Rapide, la fonction d'écriture peut démarrer immédiatement après la fin du cycle d'équilibrage de façon à assurer un temps d'écriture maximum sans perturber la durée d'établissement de l'adresse du cycle d'accès suivant.
PCT/US1996/009098 1995-06-30 1996-06-06 Pilotes repartis d'ecriture de donnees pour memoires fonctionnant en mode continu WO1997002571A1 (fr)

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EP1486878A2 (fr) * 2001-02-21 2004-12-15 Fujitsu Limited Mémoire à semiconducteur et unité de traitement des informations
CN114078503A (zh) * 2020-08-18 2022-02-22 美光科技公司 基于存储器装置中的局部命令解码的突发时钟控制

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EP0547890A2 (fr) * 1991-12-17 1993-06-23 STMicroelectronics, Inc. Mémoire à lecture/écriture ayant une commande d'écriture interverrouillée

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EP0547890A2 (fr) * 1991-12-17 1993-06-23 STMicroelectronics, Inc. Mémoire à lecture/écriture ayant une commande d'écriture interverrouillée

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Cited By (3)

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Publication number Priority date Publication date Assignee Title
EP1486878A2 (fr) * 2001-02-21 2004-12-15 Fujitsu Limited Mémoire à semiconducteur et unité de traitement des informations
EP1486878A3 (fr) * 2001-02-21 2005-09-21 Fujitsu Limited Mémoire à semiconducteur et unité de traitement des informations
CN114078503A (zh) * 2020-08-18 2022-02-22 美光科技公司 基于存储器装置中的局部命令解码的突发时钟控制

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