WO1996005506A1 - A dew point sensor - Google Patents
A dew point sensor Download PDFInfo
- Publication number
- WO1996005506A1 WO1996005506A1 PCT/NZ1995/000074 NZ9500074W WO9605506A1 WO 1996005506 A1 WO1996005506 A1 WO 1996005506A1 NZ 9500074 W NZ9500074 W NZ 9500074W WO 9605506 A1 WO9605506 A1 WO 9605506A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- dew point
- capacitor
- temperature
- microcontroller
- sensor
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
- G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
- G01N25/68—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface
Definitions
- the invention comprises a dew point sensor and method.
- the water vapour content of a gas may be measured by several techniques. The most basic method which is readily accessible uses the temperature at which dew condenses out onto a chilled surface. Relative humidity may then be calculated from this temperature and the temperature of the environment.
- Dew point sensors have most commonly been implemented by the use of a light beam whose specular reflection from a mirror surface tends to scatter when dew forms, but electrical methods have also been used, such as the change in capacitance of a structure when water (which has a high dielectric constant) condenses on the surface.
- capacitive detection is a system with fewer parts, in which in principle, the water load can be measured; optical methods merely detect a state of surface roughness which may or may not correspond to a particular water load. Because only surface roughness is required, optical methods are extremely sensitive to the onset of dew; however a difficulty then arises because it is well known that condensation appears at temperatures above the true dew point if the mirror surface is contaminated. Frequent cleaning is required to guard against this occurring if good accuracy is required.
- the present invention comprises a miniature dew point sensor which senses the dew load capacitively operating under microprocessor control.
- the invention comprises a dew point sensor to detect the dew point of a vapour- containing gas, such as air containing water vapour, comprising:
- a miniature capacitor or micro-capacitor comprising insulated electrodes on the surface of a chip, the size and surface relief of which control the disposition of the condensation which may form from the surrounding vapour when the chip is cooled,
- a peltier cooler arranged to cool the capacitor
- a microcontroller arranged to measure variations in capacitance from condensation and evaporation of water on and from the capacitor plates, to measure the temperature of the capacitor, and to control the peltier cooler to maintain the temperature of the capacitor plates to around the dew point in conditions of static and rapidly changing humidity.
- the microcontroller is arranged to control the peltier cooler to maintain the capacitor at a dew loading at which the effect of contamination on the sensor has a minimal effect on the dew point and at which the rates of condensation onto and evaporation from the sensor are substantially equal, thereby indicating the measured dew point.
- the microcontroller is arranged to control the peltier cooler to approach the dew point temperature from below the dew point temperature.
- the microcontroller is arranged to monitor the level of contamination on the sensor by reference to the gradient of the relationship between temperature and capacitance about the dew point temperature.
- the chip is a silicon chip.
- Figure 1 schematically shows the sensor unit of the preferred form dew point sensor, showing a silicon slice on which the capacitor plates and temperature measurement device are formed and a peltier cooler attached thereto
- Figure 2 is a cross-section through the silicon slice and capacitor plates of Figure 1
- FIG. 3 shows the relationship between temperature and capacitance for sensors of the invention
- Figure 4 shows capacitance versus temperature for clean and contaminated sensors
- Figure 5 shows the control loops of the microcontroller of the preferred form dew point sensor.
- Figure 1 shows the sensing element of the preferred form dew point sensor.
- This comprises a silicon chip 1 attached to a peltier cooler 2.
- the chip 1 is made by silicon integrated circuit fabrication methods and contains a miniature capacitor or microcapacitor which in the preferred form is an interdigitated capacitor 3, and a temperature sensor such as a solid state temperature sensor in close proximity.
- the thermal coupling between the two is high as a result of the high thermal conductivity of silicon.
- the interdigitated capacitor is made of two comb-like polycrystalline silicon (polysilicon) shapes, the fingers of which are interleaved as shown. The resulting capacitor fingers and the spaces between them are very small for example of the order of 5 microns.
- a cross-section through the chip 1 is shown in Figure 2.
- the polysilicon layer forming the capacitor 3 is isolated from the silicon substrate 1 by a layer of oxide 5 and protected from the atmosphere by first oxidising the top layer of polysilicon 3 to silicon dioxide, then overcoating the entire structure with a thin layer of silicon nitride 6 produced by low pressure chemical vapour deposition.
- the capacitance of such structures can vary as humidity is increased from low to high values. Overcoats such as silicon dioxide can absorb water vapour and show a capacitance rise before 100% humidity is reached but silicon nitride is a good barrier material and resists hydration; it shows very little increase in capacitance at high humidities due to water vapour absorption.
- a further feature of the device is the very smooth surface achieved by the construction methods described above. Both the feature size and the smooth surface of the sensor impact on the way it is operated because of the effect they have on dew formation.
- Figure 3 shows the capacitance measured as the sensor is cooled below the dew point by the peltier cooler 2. If the sensor is clean, some degree of supercooling below the dew point can be required to initiate condensation and cause the capacitance to rise - point A in Figure 3. Condensation is nucleated at the sharp height discontinuities at the edges of the polysilicon fingers of the capacitor 3 and can be transported along them to build up at the corners of the electrode combs or other discontinuities. With continued cooling below the dew point isolated drops of water may appear on the fingers 3 and between them. Water load grows progressively and the spaces between the fingers will eventually flood, but the capacitance increases slowly in this regime - part B in Figure 3.
- the dew point is found by controlling the peltier cooler to slowly increase temperature - part C in Figure 3 - until water is left predominantly in the crevices at the edges of the fingers. At this point, the capacitance is extremely sensitive to dew load - point D in Figure 3 - which flashes off with small increases in temperature.
- the electronic control algorithm holds the temperature at the point D, which is closely the dew point. The same behaviour is seen on a soiled sensor, but transport along the edges of the fingers is decreased.
- the microcontroller begins by initiating a learning cycle which explores the hysteresis curve of Figure 3.
- the desired water configuration in which the deposit is not allowed time to flow along to the ends of the fingers is then achieved by allowing capacitance to build to a desired value by holding the sensor briefly at the predetermined point C, then moving immediately along the heating curve to D.
- Temperature is controlled by powering the peltier unit by loop 1 which operates under proportional-integral conditions, with modifications to control the slew rate to values appropriate for the mode of operation, for example learn cycle, normal operation, cleanliness report mode.
- Loop 2 exercises control of the capacitance also via the peltier cooler, but operates slower than loop 1.
- the derivative term is adaptive; it becomes active during times of change but decays away automatically if conditions are stable, thereby minimising noise under the latter conditions. If the humidity suddenly changes, it is possible that the dew load may produce a capacitance near the extremes of the transfer function.
- a second over-ride loop 2B is brought into play under these conditions.
- This exercises high gain proportional control to return the capacitance to the control range of loop 2A, in a manner which accounts for the delay in response due to the time constant of water formation and evaporation.
- Ongoing temperature corrections are made, not based on the difference between the measured capacitance and the set-point, but on whether or not the measured capacitance, given its time constant, is tending in the expected way to the set point as a result of the previous temperature correction. Allowance can be made for changes in this time constant with prevailing conditions. Since the temperature algorithm operates much faster than the time required for significant capacitance changes to occur, the effect is to account for the integrated effect of previous temperature adjustments in the approach to the capacitance set point.
- the over-ride loop 2B becomes inactive automatically when the value of capacitance is close to the set-point D, but not necessarily at D. Note that the new dew point temperature in practice will be quite close to the original value. Over a period of time, the equilibrium is drifted so that the capacitance moves back towards the desired set point. During the time the second loop 2B is in control, the system can deviate from equilibrium, and the temperature of the surface not represent the dew point. However, from the control algorithm it is possible to estimate the size of the temperature error, and use this to correct the value of dew temperature which is output. Using this two-level control the device can respond to step changes of humidity of 50% at room temperature in less than a second.
- ice or frost does not begin to form on the sensor until dew point temperatures below -25 degrees are reached. Above this temperature, the condensate is supercooled water. Below -30 degrees, frost forms directly. Ice crystals or frost give a capacitance-temperature response which differs from water because they lack the ability of the latter to flow along or exist within the surface features of the capacitor. Their presence may therefore be distinguished from dew.
- the sensor may be used at temperatures where frost and ice crystals form directly, for example in measuring dryness of gases. A preferred method of operation in this situation is to cool the sensor until ice forms, as seen by a rise in capacitance, and then to slowly raise the temperature to establish the point of sublimation.
- a mode of operation can be implemented which is a combination of the water control mode and the ice mode.
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU33569/95A AU3356995A (en) | 1994-08-16 | 1995-08-16 | A dew point sensor |
NZ291908A NZ291908A (en) | 1994-08-16 | 1995-08-16 | Dew point sensor with micro-capacitor adjacent temperature sensor and peltier cooler with microcontroller measuring capacitance changes |
JP8507218A JPH10508096A (en) | 1994-08-16 | 1995-08-16 | Dew point sensor |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NZ26424894 | 1994-08-16 | ||
NZ264248 | 1994-08-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1996005506A1 true WO1996005506A1 (en) | 1996-02-22 |
Family
ID=19924902
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/NZ1995/000074 WO1996005506A1 (en) | 1994-08-16 | 1995-08-16 | A dew point sensor |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPH10508096A (en) |
AU (1) | AU3356995A (en) |
WO (1) | WO1996005506A1 (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19708053A1 (en) * | 1997-02-28 | 1998-09-03 | Ust Umweltsensortechnik Gmbh | Method and sensor arrangement for the detection of condensation on surfaces |
WO2000026652A1 (en) * | 1998-10-30 | 2000-05-11 | Optiguide Ltd. | Dew point hygrometers and dew sensors |
FR2815953A1 (en) * | 2000-10-27 | 2002-05-03 | Bosch Gmbh Robert | MICROMECHANICAL COMPONENT AND METHOD FOR MANUFACTURING SUCH COMPONENT |
US6566893B2 (en) | 1997-02-28 | 2003-05-20 | Ust Umweltsensortechnik Gmbh | Method and arrangement for monitoring surfaces for the presence of dew |
US6926439B2 (en) | 1998-10-30 | 2005-08-09 | Optiguide Ltd. | Dew point hygrometers and dew sensors |
WO2005100964A1 (en) * | 2004-04-19 | 2005-10-27 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Sensor array and method for measuring dew points based on miniature peltier elements |
EP3211404A1 (en) | 2016-02-25 | 2017-08-30 | ams AG | Cmos-compatible dew point sensor device and method of determining a dew point |
CN109358091A (en) * | 2018-09-25 | 2019-02-19 | 四川泰兰德科技有限公司 | A kind of α-Al2O3-SiO2 capacitance sensor dew point measurement device |
CN113125525A (en) * | 2021-06-17 | 2021-07-16 | 南京瑞路通达信息技术有限公司 | Method and device for detecting electrical characteristics of contact low-temperature easily-condensed object |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4523567B2 (en) * | 2006-04-17 | 2010-08-11 | エスペック株式会社 | Dew point meter |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1983003139A1 (en) * | 1982-03-08 | 1983-09-15 | Ward, Barry, Kendric | Humidity measuring apparatus |
EP0122945A1 (en) * | 1983-04-13 | 1984-10-31 | LICENCIA Találmányokat Ertékesitö Vállalat | Electronic relative humidity meter and/or teletransmitter |
EP0160884A2 (en) * | 1984-05-03 | 1985-11-13 | Joh. Vaillant GmbH u. Co. | Air to fuel-ratio controller for a heating source |
GB2205957A (en) * | 1987-06-16 | 1988-12-21 | Endress Hauser Gmbh Co | Dew-point sensor |
-
1995
- 1995-08-16 WO PCT/NZ1995/000074 patent/WO1996005506A1/en active Application Filing
- 1995-08-16 AU AU33569/95A patent/AU3356995A/en not_active Abandoned
- 1995-08-16 JP JP8507218A patent/JPH10508096A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1983003139A1 (en) * | 1982-03-08 | 1983-09-15 | Ward, Barry, Kendric | Humidity measuring apparatus |
EP0122945A1 (en) * | 1983-04-13 | 1984-10-31 | LICENCIA Találmányokat Ertékesitö Vállalat | Electronic relative humidity meter and/or teletransmitter |
EP0160884A2 (en) * | 1984-05-03 | 1985-11-13 | Joh. Vaillant GmbH u. Co. | Air to fuel-ratio controller for a heating source |
GB2205957A (en) * | 1987-06-16 | 1988-12-21 | Endress Hauser Gmbh Co | Dew-point sensor |
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6566893B2 (en) | 1997-02-28 | 2003-05-20 | Ust Umweltsensortechnik Gmbh | Method and arrangement for monitoring surfaces for the presence of dew |
DE19708053B4 (en) * | 1997-02-28 | 2006-06-08 | Ust Umweltsensortechnik Gmbh | Method and sensor arrangement for the detection of condensation on surfaces |
DE19708053A1 (en) * | 1997-02-28 | 1998-09-03 | Ust Umweltsensortechnik Gmbh | Method and sensor arrangement for the detection of condensation on surfaces |
US6575621B1 (en) | 1998-10-30 | 2003-06-10 | Optiguide Ltd. | Dew point hygrometers and dew sensors |
US6926439B2 (en) | 1998-10-30 | 2005-08-09 | Optiguide Ltd. | Dew point hygrometers and dew sensors |
WO2000026652A1 (en) * | 1998-10-30 | 2000-05-11 | Optiguide Ltd. | Dew point hygrometers and dew sensors |
FR2815953A1 (en) * | 2000-10-27 | 2002-05-03 | Bosch Gmbh Robert | MICROMECHANICAL COMPONENT AND METHOD FOR MANUFACTURING SUCH COMPONENT |
US6832523B2 (en) | 2000-10-27 | 2004-12-21 | Robert Bosch Gmbh | Micromechanical component and manufacturing method |
WO2005100964A1 (en) * | 2004-04-19 | 2005-10-27 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Sensor array and method for measuring dew points based on miniature peltier elements |
EP3211404A1 (en) | 2016-02-25 | 2017-08-30 | ams AG | Cmos-compatible dew point sensor device and method of determining a dew point |
CN109073578A (en) * | 2016-02-25 | 2018-12-21 | ams有限公司 | Cmos compatible dew point transducer device and the method for determining dew point |
US11002696B2 (en) | 2016-02-25 | 2021-05-11 | Sciosense B.V. | CMOS-compatible dew point sensor device and method of determining a dew point |
US11525793B2 (en) | 2016-02-25 | 2022-12-13 | Sciosense B.V. | CMOS compatible dew point sensor device and method of determining a dew point |
CN109358091A (en) * | 2018-09-25 | 2019-02-19 | 四川泰兰德科技有限公司 | A kind of α-Al2O3-SiO2 capacitance sensor dew point measurement device |
CN113125525A (en) * | 2021-06-17 | 2021-07-16 | 南京瑞路通达信息技术有限公司 | Method and device for detecting electrical characteristics of contact low-temperature easily-condensed object |
CN113125525B (en) * | 2021-06-17 | 2021-08-31 | 南京瑞路通达信息技术有限公司 | Method and device for detecting electrical characteristics of contact low-temperature easily-condensed object |
Also Published As
Publication number | Publication date |
---|---|
AU3356995A (en) | 1996-03-07 |
JPH10508096A (en) | 1998-08-04 |
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