WO1993014375A1 - Appareil de controle - Google Patents

Appareil de controle Download PDF

Info

Publication number
WO1993014375A1
WO1993014375A1 PCT/GB1993/000128 GB9300128W WO9314375A1 WO 1993014375 A1 WO1993014375 A1 WO 1993014375A1 GB 9300128 W GB9300128 W GB 9300128W WO 9314375 A1 WO9314375 A1 WO 9314375A1
Authority
WO
WIPO (PCT)
Prior art keywords
probe
gauging apparatus
contact element
camera
target
Prior art date
Application number
PCT/GB1993/000128
Other languages
English (en)
Inventor
Eric Ireland
Geoffrey Kaniuk
Original Assignee
Vernon Gauging Systems Limited
M.S. Instruments Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vernon Gauging Systems Limited, M.S. Instruments Plc filed Critical Vernon Gauging Systems Limited
Publication of WO1993014375A1 publication Critical patent/WO1993014375A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates

Definitions

  • the present invention relates to gauging apparatus and more particularly to a probe for such apparatus and which is arranged to contact a surface of a solid object.
  • Gauging apparatus including a probe is already known and such apparatus is used to compare the geometry of test surfaces with a predetermined datum in order to determine manufacturing quality.
  • the present invention provides gauging apparatus comprising a probe for contacting a surface of an object under test and means for optically monitoring the probe in order to derive signals representative of probe movement.
  • the monitoring means may take the form of one or more targets on the probe or probes and means for detecting movement of the targets.
  • the detecting means comprises a camera.
  • Fig. 1 shows a first embodiment of apparatus according to the present invention
  • Fig. 2 shows a second embodiment according to the present invention
  • Fig. 3 shows a third embodiment according to the present invention
  • Fig. 4 shows a fourth embodiment according to the present invention.
  • Fig. 5 shows a modification to the probe as shown in the previous figures.
  • Gauging apparatus comprises a probe having a contact element and at least one target provided at a location and in an orientation on the probe which is known with respect to the contact element.
  • the targets may be self luminous, illuminated, electrically powered or excited with energy so as to emit light. In these examples they are illuminated by a light source and are viewed by a camera(s).
  • the camera(s) may, however, be replaced by any other optical information processing system including direct observation by an operator.
  • the gauging apparatus has a probe 10 associated with a light source 14.
  • Two reflective targets 12 are mounted on a contact element 11 of the probe, each target reflecting the light from the light source 14 as the contact element 11 moves in relation to the surface 16 of an object being gauged.
  • Associated with each target 12 is a camera 15.
  • Each camera is thus able to provide to a processor 17 a signal in which the position in two dimensions of one of the targets at a given time is indicated.
  • a vector representing the position and/or the orientation of the contact element may be determined by the processor 17.
  • This vector in combination with sufficient knowledge of the probe design, allows the actual contact point of the contact element 11 to the surface 16 to be determined. By carrying out this determination at several points on the surface, the characteristics of the complete surface may be measured to a desired resolution.
  • the target or targets should be placed as close to the point of contact with the surface as possible so as to minimize errors associated with the support and positioning of the contact element.
  • the cameras may be a sufficient distance away as to minimize parallax errors.
  • the cameras may be tracked together with the probe, thus allowing the target to remain at or near to the centre of the field of view of each camera even for measurements over a large surface.
  • Embodiments of the invention in which the camera is a long distance from the target allow gauging to be carried out of the insides of long tubes or cavities.
  • the system can be locally zoomed in to provide a magnified result. It may be necessary to zoom in on some portions but not others of a complex surface.
  • the number of targets and/or optical monitoring means can be varied depending of the number of dimensions which it is desired to gauge. In simple cases it may be possible to use only one target.
  • the source may be any source of suitable radiation such as white light, infra-red light, or microwaves, and may be produced in any convenient manner, for example by an LED or a laser.
  • the energy may be directed from the source to the target by a variety of means such as light-guides, fibre-optics, mirrors, wave-guides or conductors as well as by direct illumination.
  • the probe may be a cross-head or combinations of individual probes.
  • Optical fibres may be used.
  • the principal above can also be used in multiple target situations on the same probe to determine the position of the probe in the number of places as there are targets and is particularly useful where a geometric angular component is present, as for example in turbine blade measurement.
  • the light source 14 is located distant from the tip 11 which is provided with transmissive apertures forming the targets 12. This is shown more clearly in Figure 2 where it is assumed that there is only one target and the periphery of the tip 11 is of larger diameter than the stem.
  • the light source 14 can be part of the probe 10 and the light from the source 12 can be transmitted up the stem to the light transmissive aperture in any convenient way including the use of one or more optical fibres.
  • the advantage of this arrangement is that the stem can be very long and if the stem bends there is no loss of accuracy as the light transmissive window is viewed directly and is directly related to the tip diameter.
  • FIG. 3 An alternative probe design is shown in Figure 3 where the probe 10 is provided with a conventional tip 11. However, the probe 10 is pivotally mounted in a frame 20 by means of a ball and socket joint, the ball element 21 forming the base of the probe.
  • the ball is provided with a target 12 again in the form of a light transmissive window for emitting light from a light source such as an LED within the ball element. Movement of the target 12 within the field of view of the camera or other light sensitive device then indicates the profile of the object 16 under test. Equally the camera or other light sensitive device could track movement of the target as it pivots and this movement could be translated by the processor into appropriate signals.
  • Figure 4 shows that the probe tip can be of any convenient predetermined shape such as a cross with a target 12 located at a convenient position depending on the shape. In this case the convenient position is at the centre of the cross.
  • Figure 5 This shows diagrammatically two arrangements for a plurality of probes.
  • Figure 5a there are four probes mounted at the centres of each side of a rectangle. The exact disposition is not important as long as it is known and either remains unchanged or is changed under the control of a processor which can feed appropriate signals to the main processor.
  • An alternative arrangement is shown in Figure 5b, where the four probes are regularly arranged in rows and columns. All probes can be viewed by one camera if desired or each probe can be viewed individually.
  • the probe will be hollow and transmit light through the probe to the target. It is possible, however, to envisage reflective targets where the area of the test piece under test is illuminated by an external source of light and the camera simply views totally reflected light. It is also possible for the target to be coloured or to filter light so that the camera sensitivity and accuracy can be increased.
  • the apparatus is able to provide more accurate data if the probe is stationary at each of a number of points while measurements are made.
  • the apparatus can however, be adapted to measure results dynamically as the probe is traced across the surface of an objection. The reduction of the resulting surface measurements would then be limited only by the processing power of the apparatus and the optical resolution of the cameras.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Appareil de contrôle comprenant une sonde (10) équipée d'un élément de contact destiné à toucher la surface d'un objet qu'on désire mesurer. Un indicateur (12) tel qu'un miroir est placé sur la sonde à un endroit proche du point de contact de l'élément de contact, et émet, transmet ou réfléchit un signal indiquant la position et/ou l'orientation de l'élément de contact dans le champ optique d'une caméra (15). Un processeur détermine les positions de l'élément de contact à partir des signaux interceptés par une ou plusieurs caméras et provenant de cet (ces) indicateurs(s) lorsque l'élément de contact se déplace sur la surface de l'objet.
PCT/GB1993/000128 1992-01-20 1993-01-20 Appareil de controle WO1993014375A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9201123.8 1992-01-20
GB929201123A GB9201123D0 (en) 1992-01-20 1992-01-20 Gauging apparatus

Publications (1)

Publication Number Publication Date
WO1993014375A1 true WO1993014375A1 (fr) 1993-07-22

Family

ID=10708861

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/GB1993/000128 WO1993014375A1 (fr) 1992-01-20 1993-01-20 Appareil de controle

Country Status (2)

Country Link
GB (1) GB9201123D0 (fr)
WO (1) WO1993014375A1 (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998057121A1 (fr) * 1997-06-12 1998-12-17 Werth Messtechnik Gmbh Appareil de mesure de coordonnees comportant un palpeur et detecteur optique mesurant la position de ce dernier
DE102015103373A1 (de) * 2015-03-09 2015-12-31 Hochschule Aalen Messelement für ein Koordinatenmessgerät
KR20210131993A (ko) * 2018-12-04 2021-11-03 엘디아이 파이낸시스 작업편의 프로파일을 측정하기 위한 시스템 및 방법
TWI842790B (zh) 2018-12-04 2024-05-21 瑞士商謹觀股份公司 用於測量一部件之輪廓的系統及方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2457409B1 (de) * 1974-12-05 1976-08-12 Wilhelm Becker Punktorthogonalplanimeter
GB2102574A (en) * 1981-07-13 1983-02-02 Itek Corp Contour measuring system with redundant arrangement of measuring points
US4396945A (en) * 1981-08-19 1983-08-02 Solid Photography Inc. Method of sensing the position and orientation of elements in space
US4574199A (en) * 1983-01-27 1986-03-04 Diffracto Ltd. Sensing location of an object

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2457409B1 (de) * 1974-12-05 1976-08-12 Wilhelm Becker Punktorthogonalplanimeter
GB2102574A (en) * 1981-07-13 1983-02-02 Itek Corp Contour measuring system with redundant arrangement of measuring points
US4396945A (en) * 1981-08-19 1983-08-02 Solid Photography Inc. Method of sensing the position and orientation of elements in space
US4574199A (en) * 1983-01-27 1986-03-04 Diffracto Ltd. Sensing location of an object

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998057121A1 (fr) * 1997-06-12 1998-12-17 Werth Messtechnik Gmbh Appareil de mesure de coordonnees comportant un palpeur et detecteur optique mesurant la position de ce dernier
DE102015103373A1 (de) * 2015-03-09 2015-12-31 Hochschule Aalen Messelement für ein Koordinatenmessgerät
KR20210131993A (ko) * 2018-12-04 2021-11-03 엘디아이 파이낸시스 작업편의 프로파일을 측정하기 위한 시스템 및 방법
US11854220B2 (en) 2018-12-04 2023-12-26 Watchoutcorp Sa System and method for measuring the profile of a workpiece
TWI842790B (zh) 2018-12-04 2024-05-21 瑞士商謹觀股份公司 用於測量一部件之輪廓的系統及方法
KR102671530B1 (ko) * 2018-12-04 2024-06-04 워치아웃코프 에스에이 작업편의 프로파일을 측정하기 위한 시스템 및 방법

Also Published As

Publication number Publication date
GB9201123D0 (en) 1992-03-11

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