WO1993006467A2 - Procede et dispositif d'inspection du verre - Google Patents
Procede et dispositif d'inspection du verre Download PDFInfo
- Publication number
- WO1993006467A2 WO1993006467A2 PCT/FR1992/000859 FR9200859W WO9306467A2 WO 1993006467 A2 WO1993006467 A2 WO 1993006467A2 FR 9200859 W FR9200859 W FR 9200859W WO 9306467 A2 WO9306467 A2 WO 9306467A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- glass
- plane
- piece
- light curtain
- observation
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
Definitions
- the invention relates to the field of automatic industrial inspection and more particularly relates to a process, and the corresponding device, for the inspection of glass.
- the purpose of glass inspection is to detect and locate faults, called “inclusions", generated during the manufacturing phase in pieces of glass.
- inclusions generated during the manufacturing phase in pieces of glass.
- the impact of these defects on the quality of the glass produced depends on their number, their shape, and the standards imposed on glassmakers according to the intended application. These defects are of two types:
- - "broth” type the defects are gas bubbles which remain in the molten material
- - "stone” type the defects are defects in the homogeneity of the basic constituents, leading to the formation of a visible particle in the glass.
- the size of these inclusions is generally less than a millimeter and their measurement must be carried out with great precision, at least for certain applications, the required precision possibly ranging from 1 / 10th to 1 / 100th of a millimeter.
- the subject of the invention is a method of inspecting glass, and the corresponding device, which makes it possible to avoid the drawbacks of conventional methods by making it possible both to locate the defects on the surface as in the thickness of the glass and to know approximately their positions in the thickness of the glass, which allows very good discrimination between surface defects and inclusions.
- the inspection method uses a three-dimensional treatment and for this performs localized lighting of the glass by a laser beam, and suitable detection which makes it possible to view the upper face of the glass and its lower face separately. and, between the two, its thickness.
- a method of inspecting a glass by illumination by means of a light source external to its illuminating surface characterized in that it consists in illuminating the illuminating surface by an applied laser beam in a direction approximately perpendicular to the illumination face to form a light curtain in the form of a plane passing through the glass in its thickness, for detecting by a camera the reflected radiation emerging from the piece of glass in a direction of oblique observation with respect to the direction of the plane formed by the light curtain when inclusions are presented in the glass at the location of the light curtain, and visualize by the camera the image of the inclusions thus obtained, between two lines representing respectively the rays light weakly reflected by the entry and exit surfaces of the light beam during its passage through the thickness of the glass.
- the invention also relates to the inspection device intended for the implementation of the method as described above.
- the invention will be better understood and other features will appear with the aid of the description which follows with reference to the appended figures.
- FIG. 1 is a diagram of the inspection device according to the invention
- FIG. 2 is a detailed diagram of the device
- the glass inspection device comprises, in one embodiment illustrated schematically in plan view in FIG. 1, two stations, a station 1 for detecting and locating faults in three dimensions, X, Y, Z and a station 2 for classification and measurement of these faults.
- the piece of glass 3 is placed on a conveyor 4 and analyzed as it passes vertically from station 1 for the detection and location of faults, the movement of the conveyor taking place along the X axis.
- Station 1 provides an image of successive sections of the piece of glass (in the YZ plane), such as that shown in Figure 1 where an inclusion has been represented between two lines corresponding respectively to the upper surface and the lower surface of the glass .
- the first station is constituted as follows. It comprises a lighting source 10 of the neon helium laser type, HeNe illustrated in FIG. 2.
- the beam emitted by the laser source is widened by an optical bar disposed at the output of this source so as to constitute a kind of light curtain , of suitable thickness, as illustrated in FIG. 2, which corresponds at all times to a YZ section of the piece of glass.
- This light curtain therefore illuminates the glass perpendicular to the plane of the conveyor and therefore encountered successively:
- a camera 20 placed above the glass and obliquely to the light curtain, as shown in section in FIG. 3, is intended to capture the radiation emerging from the piece of glass in its direction, called the direction of observation, and therefore sees these interruptions respectively as:
- the corresponding lines can be lines if the intersection of the light curtain and the upper face of the glass is a straight line, or curved lines for a spherical or cylindrical face if the curvature extends in the direction of the light curtain.
- the method of inspecting a piece of glass consists of scrolling this piece of glass over the conveyor belt 4 under the station 1 comprising the laser source and the camera system, the carpet being animated by a uniform translational movement.
- the laser beam is chosen to be sufficiently spread; if the width of the room exceeds the possible width of expansion of the beam, the optical laser lighting device will be reproduced as many times as necessary.
- station 1 is equipped with additional cameras to cover the useful field.
- the images are acquired by the camera system at video frequency; the sequence of images thus obtained is processed in a computer processing device which makes it possible to detect and follow the two lines associated with the surfaces as well as one or more inclusions between these two lines.
- the information provided by the station 1 is therefore a location by imaging of the defects in three dimensions X, Y and Z.
- the luminance information of the defect also makes it possible to approximately quantify the size of the defects, and this information can be used by item 2 for classification and measurement.
- the characteristics of the lighting system are such that the source is a neon helium laser source as indicated above, the means for expanding the beam from the source laser consist of an optical bar or a divergent lens, half cylinder plan / concave, so as to spread the laser beam in one direction; the thickness of the laser curtain must be greater than the size of the defects so as to guarantee detection of the defect in all cases.
- the sensors used are of the CCD type; the number of sensors depends on the width of the piece of glass to be inspected and on the desired resolution.
- the number of cameras is doubled so as to overcome parasitic phenomena due to multiple reflections of the laser beam in the glass , capable of generating on the image light lines of lesser energy inside the two lines described above.
- the duplication of information processing makes the device more robust, especially in the case of a dusty atmosphere.
- two cameras are placed symmetrically with respect to the laser whose axis is vertical.
- the angle of incidence (i) between the laser and the optical axis of the camera is chosen so that one of the axes of the two cameras is always located on the side opposite the laser beam relative to the normal to the surface glass.
- the camera 21 will be used while for the right part of the room the camera 22 will be used.
- the camera's optical system at station 1 the problem is not precision but simply the detection and location of faults whose coordinates along the X, Y and Z axes are then communicated to station 2 for precise measurement.
- the camera optics are therefore chosen as follows.
- the camera's optical system includes an anamorphic element: in practice it is not necessary to have the same resolution along the two axes of the image. Good precision is required along the vertical axis so as to correctly separate the inclusions from the two surface lines (which are the two horizontal lines in the images in FIGS. 4a to 4d; on the other hand, it is desired to be able to cover the widest band possible glass along the horizontal axis (Y) in order to limit the number of cameras required and the power of computer processing. This is why an anamorphic optical system is used to ensure an anisotropic magnification in the image in both directions orthogonal X and Z.
- the invention is not limited to the method and device for inspecting glass as described in detail above.
- it was describes a conveyor on which is driven a piece of glass which scrolls vertically from an observation post.
- a mobile observation post the material to be inspected remaining fixed. This arrangement is particularly interesting for large pieces of glass to be inspected.
- the camera was provided in the example to form an image from the radiation emerging in the direction of observation.
- an optic which would facilitate the formation of the useful image, in particular an optical filter transmitting to the detector the radiation emerging at the length d wave of the laser source used.
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5505828A JPH06510856A (ja) | 1991-09-13 | 1992-09-14 | ガラスの検査方法及び装置 |
EP92920289A EP0603311A1 (fr) | 1991-09-13 | 1992-09-14 | Procede et dispositif d'inspection du verre |
US08/196,212 US5459330A (en) | 1991-09-13 | 1992-09-14 | Process and device for the inspection of glass |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR91/11315 | 1991-09-13 | ||
FR9111315A FR2681429B1 (fr) | 1991-09-13 | 1991-09-13 | Procede et dispositif d'inspection du verre. |
Publications (2)
Publication Number | Publication Date |
---|---|
WO1993006467A2 true WO1993006467A2 (fr) | 1993-04-01 |
WO1993006467A3 WO1993006467A3 (fr) | 1993-05-13 |
Family
ID=9416923
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FR1992/000859 WO1993006467A2 (fr) | 1991-09-13 | 1992-09-14 | Procede et dispositif d'inspection du verre |
Country Status (6)
Country | Link |
---|---|
US (1) | US5459330A (fr) |
EP (1) | EP0603311A1 (fr) |
JP (1) | JPH06510856A (fr) |
FR (1) | FR2681429B1 (fr) |
RU (1) | RU94026774A (fr) |
WO (1) | WO1993006467A2 (fr) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999012022A1 (fr) * | 1997-09-03 | 1999-03-11 | Vitro Flotado, S.A. De C.V. | Appareil et procede de determination de la distorsion optique d'un substrat transparent |
WO1999064845A1 (fr) * | 1998-06-05 | 1999-12-16 | Glaverbel | Unite de detection de defauts |
EP3304055A4 (fr) * | 2015-06-03 | 2019-01-09 | Saint-Gobain Glass France | Dispositif optique pour détecter un défaut interne d'un substrat transparent et procédé associé |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3003562B2 (ja) * | 1995-04-25 | 2000-01-31 | 関西日本電気株式会社 | 蛍光面検査装置 |
AU698522B2 (en) * | 1995-09-29 | 1998-10-29 | Johnson & Johnson Vision Products, Inc. | Lens parameter measurement using optical sectioning |
US6018159A (en) * | 1997-12-10 | 2000-01-25 | Honeywell Inc. | Differential clear container sensor with improved noise immunity |
CA2252308C (fr) | 1998-10-30 | 2005-01-04 | Image Processing Systems, Inc. | Systeme d'inspection de vitrage |
DE19858316C2 (de) * | 1998-12-17 | 2000-11-30 | Kostal Leopold Gmbh & Co Kg | Verfahren zum Detektieren und Lokalisieren von auf einer lichtdurchlässigen Scheibe befindlichen, diffusreflektierenden Belägen sowie Vorrichtung |
DE19929118C2 (de) * | 1999-06-25 | 2001-05-10 | Basler Ag | Verfahren zum optischen Prüfen der Zwischenschicht eines wenigstens dreischichtigen flächigen Gegenstandes |
AUPQ262299A0 (en) * | 1999-09-02 | 1999-09-23 | Resolve Engineering Pty Ltd | Detection of inclusions in glass |
US6633377B1 (en) | 2000-04-20 | 2003-10-14 | Image Processing Systems Inc. | Dark view inspection system for transparent media |
US6501546B1 (en) | 2000-05-05 | 2002-12-31 | Photon Dynamics Canada Inc. | Inspection system for edges of glass |
US6512239B1 (en) * | 2000-06-27 | 2003-01-28 | Photon Dynamics Canada Inc. | Stereo vision inspection system for transparent media |
WO2002018980A2 (fr) * | 2000-09-01 | 2002-03-07 | Applied Process Technologies | Systeme optique permettant de visualiser les distorsions dans des feuilles reflechissantes en mouvement |
DE10111907A1 (de) * | 2001-03-13 | 2002-10-31 | Giesecke & Devrient Gmbh | Vorrichtung und Verfahren zur Entwertung von Blattgut |
KR20030046616A (ko) * | 2001-12-06 | 2003-06-18 | 삼성전자주식회사 | 레이져 광 산란을 이용한 고순도 글래스 튜브의 미세 기포분석 장치 |
US6690460B2 (en) * | 2002-06-27 | 2004-02-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | Real time detection of cracked quartz window |
DE10301931A1 (de) | 2003-01-19 | 2004-07-29 | Massen, Robert, Prof. Dr.-Ing. | Automatische optische Oberflächeninspektion von farbig gemusterten Oberflächen, welche mit einer transparenten Schutzschicht versehen sind |
JP2004325389A (ja) * | 2003-04-28 | 2004-11-18 | Renesas Technology Corp | 端部検査装置 |
GB2415776B (en) * | 2004-06-28 | 2009-01-28 | Carglass Luxembourg Sarl Zug | Investigation of vehicle glazing panels |
US20060054843A1 (en) * | 2004-09-13 | 2006-03-16 | Electronic Design To Market, Inc. | Method and apparatus of improving optical reflection images of a laser on a changing surface location |
AT501080B1 (de) * | 2005-01-12 | 2006-06-15 | Schuller Thomas | Verfahren zur prüfung auf nickelsulfideinschlüsse in einscheibensicherheitsglas und vorrichtung hierfür |
DE102005022271B3 (de) * | 2005-05-10 | 2006-08-17 | Schott Ag | Verfahren und Vorrichtung zum Detektieren von Blasen in einem Glaskörper sowie zur Herstellung von Glaskörpern |
DE102005050882B4 (de) * | 2005-10-21 | 2008-04-30 | Isra Vision Systems Ag | System und Verfahren zur optischen Inspektion von Glasscheiben |
DE102005052044A1 (de) * | 2005-10-31 | 2007-05-03 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Vorrichtung zur Vermessung eines transparenten Objekts |
US7800749B2 (en) * | 2007-05-31 | 2010-09-21 | Corning Incorporated | Inspection technique for transparent substrates |
CN101790679B (zh) * | 2007-09-04 | 2012-05-09 | 旭硝子株式会社 | 检测透明板体内部的微小异物的方法及其装置 |
FR2933516B1 (fr) * | 2008-07-07 | 2010-10-15 | Tiama | Procede et dispositif optique pour analyser une marque sur une paroi courbe translucide ou transparente |
DE102010037788B4 (de) * | 2010-09-27 | 2012-07-19 | Viprotron Gmbh | Verfahren und Vorrichtung zur Anzeige von automatisiert ermittelten Fehlerstellen |
RU2475726C1 (ru) * | 2011-06-16 | 2013-02-20 | Некоммерческая организация Научно-техническое учреждение "Инженерно-технический центр" открытого акционерного общества "Ижевский мотозавод "Аксион-холдинг" (НТУ "ИТЦ") | Устройство контроля качества стекла |
DE102013002602B4 (de) | 2013-02-15 | 2022-05-05 | Hegla Boraident Gmbh & Co. Kg | Verfahren und Vorrichtung zur Detektion von Partikeln in Glas |
JP2015034071A (ja) * | 2013-08-08 | 2015-02-19 | 日本電気硝子株式会社 | シート部材搬送装置、シート部材支持装置、シート部材検査装置、およびシート部材搬送方法 |
US10767977B1 (en) * | 2019-02-28 | 2020-09-08 | Lumina Instruments Inc. | Scattered radiation defect depth detection |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6232345A (ja) * | 1985-08-02 | 1987-02-12 | Yaskawa Electric Mfg Co Ltd | 欠点検出装置 |
JPS6256847A (ja) * | 1985-09-06 | 1987-03-12 | Toshiba Corp | 光ビ−ム表面検査装置 |
FR2591341A1 (fr) * | 1985-12-10 | 1987-06-12 | Saint Gobain Vitrage | Technique de detection de defauts optiques sur ligne de production de verre |
US4847510A (en) * | 1987-12-09 | 1989-07-11 | Shell Oil Company | Method for comparison of surfaces |
DE3926349A1 (de) * | 1989-08-09 | 1991-02-14 | Sick Optik Elektronik Erwin | Optische fehlerinspektionsvorrichtung |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1315654A (en) * | 1969-05-21 | 1973-05-02 | Pilkington Brothers Ltd | Detection of faults in transparent material using lasers |
CA1074756A (fr) * | 1977-05-26 | 1980-04-01 | Pilkington Glass Industries Limited/Les Industries Du Verre Pilkington L Imitee | Appareil servant a verifier les elements en verre plat |
ATE15965T1 (de) * | 1982-06-03 | 1985-10-15 | Hell Rudolf Dr Ing Gmbh | Abtastverfahren und abtasteinrichtung. |
US4601576A (en) * | 1983-12-09 | 1986-07-22 | Tencor Instruments | Light collector for optical contaminant and flaw detector |
DE3565893D1 (en) * | 1984-12-14 | 1988-12-01 | Flachglas Ag | Method and device for inspecting transparent strip material, in particular flat glass ribbons |
-
1991
- 1991-09-13 FR FR9111315A patent/FR2681429B1/fr not_active Expired - Fee Related
-
1992
- 1992-09-14 JP JP5505828A patent/JPH06510856A/ja active Pending
- 1992-09-14 US US08/196,212 patent/US5459330A/en not_active Expired - Fee Related
- 1992-09-14 WO PCT/FR1992/000859 patent/WO1993006467A2/fr not_active Application Discontinuation
- 1992-09-14 RU RU94026774/25A patent/RU94026774A/ru unknown
- 1992-09-14 EP EP92920289A patent/EP0603311A1/fr not_active Ceased
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6232345A (ja) * | 1985-08-02 | 1987-02-12 | Yaskawa Electric Mfg Co Ltd | 欠点検出装置 |
JPS6256847A (ja) * | 1985-09-06 | 1987-03-12 | Toshiba Corp | 光ビ−ム表面検査装置 |
FR2591341A1 (fr) * | 1985-12-10 | 1987-06-12 | Saint Gobain Vitrage | Technique de detection de defauts optiques sur ligne de production de verre |
US4847510A (en) * | 1987-12-09 | 1989-07-11 | Shell Oil Company | Method for comparison of surfaces |
DE3926349A1 (de) * | 1989-08-09 | 1991-02-14 | Sick Optik Elektronik Erwin | Optische fehlerinspektionsvorrichtung |
Non-Patent Citations (3)
Title |
---|
IBM TECHNICAL DISCLOSURE BULLETIN vol. 20, no. 11B, 1 Avril 1978, pages 4939 - 4940 W.HOPKINS 'OPTICAL SCANNER FOR SURFACE ANALYSIS' WHOLE DOCUMENT * |
PATENT ABSTRACTS OF JAPAN vol. 11, no. 211 (P-594)(2568) 9 Juillet 1987 & JP,A,62 032 345 ( YASKAWA ELECTRIC ) 12 Février 1987 * |
PATENT ABSTRACTS OF JAPAN vol. 11, no. 252 (P-605)(2699) 15 Août 1987 & JP,A,62 056 847 ( TOSHIBA CORP. ) 12 Mars 1987 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999012022A1 (fr) * | 1997-09-03 | 1999-03-11 | Vitro Flotado, S.A. De C.V. | Appareil et procede de determination de la distorsion optique d'un substrat transparent |
WO1999064845A1 (fr) * | 1998-06-05 | 1999-12-16 | Glaverbel | Unite de detection de defauts |
EP3304055A4 (fr) * | 2015-06-03 | 2019-01-09 | Saint-Gobain Glass France | Dispositif optique pour détecter un défaut interne d'un substrat transparent et procédé associé |
Also Published As
Publication number | Publication date |
---|---|
WO1993006467A3 (fr) | 1993-05-13 |
JPH06510856A (ja) | 1994-12-01 |
RU94026774A (ru) | 1996-06-27 |
US5459330A (en) | 1995-10-17 |
FR2681429B1 (fr) | 1995-05-24 |
FR2681429A1 (fr) | 1993-03-19 |
EP0603311A1 (fr) | 1994-06-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO1993006467A2 (fr) | Procede et dispositif d'inspection du verre | |
EP0665951B1 (fr) | Procede et dispositif d'inspection de materiau transparent | |
KR102386192B1 (ko) | 워크 피스들에서의 결함 검출을 위한 장치, 방법 및 컴퓨터 프로그램 제품 | |
EP2992315B1 (fr) | Procédé et dispositif d'observation et d'analyse de singularités optiques portées par des récipients en verre | |
EP2732273B2 (fr) | Procede d'acquisition de plusieurs images d'un meme emballage a l'aide d'une seule camera lineaire | |
FR3073044A1 (fr) | Procede et dispositif de mesure de dimensions par rayons x, sur des recipients en verre vide defilant en ligne | |
EP0060160A1 (fr) | Procédé pour la recherche des défauts des feuilles de verre et dispositif mettant en oeuvre ce procédé | |
FR2623789A1 (fr) | Dispositif de controle des fonds de bouteilles | |
EP3963284B1 (fr) | Ligne de contrôle de récipients vides en verre | |
EP3055681B1 (fr) | Procede et dispositif pour inspecter les soudures d'emballages | |
CN103105403A (zh) | 透明光学元件表面缺陷的检测方法及装置 | |
EP1558919B1 (fr) | Procede et dispositif pour detecter des defauts de surface presentes par une bague d'un recipient de revolution transparent ou translucide | |
EP2356429B1 (fr) | Dispositif d'analyse d'un melange polyphasique via un faisceau de lumiere retrodiffusee par celui-ci | |
CN203069531U (zh) | 透明光学元件表面缺陷的检测装置 | |
FR2562249A1 (fr) | Cellule humide tres radio-active, blindee, pour une installation nucleaire, avec un dispositif pour la reconnaissance des fuites et procede pour l'utilisation d'une telle cellule | |
EP1602001B1 (fr) | Dispositif optique et module d inspection | |
EP1617208A1 (fr) | Machine pour détecter des défauts d'un objet transparent ou translucide | |
FR2816296A1 (fr) | Dispositif de mise en defilement continu d'objet a symetrie de revolution-application a l'inspection visuelle et au controle | |
WO2012035257A1 (fr) | Dispositif et procédé de mesure de la forme d'un miroir ou d'une surface speculaire | |
WO2010072912A1 (fr) | Dispositif de numerisation tridimensionnelle a reconstruction dense | |
EP2742320B1 (fr) | Procede et appareil optoelectronique pour mesurer le diametre interne d'un corps creux | |
WO2001055705A1 (fr) | Installation et procede pour la detection de glacures | |
EP0692714A1 (fr) | Procédé et dispositif de reconnaissance de particularités géométriques de pièces parallélépipédiques de section polygonale | |
FR2857152A1 (fr) | Dispositif et procede de controle d'aspect exterieur de crayons de combustible pour reacteur nucleaire | |
FR2719119A1 (fr) | Dispositif pour détecter par traitement d'images des défauts réfléchissant la lumière et présentés par un objet creux transparent. |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A2 Designated state(s): BR CS JP KR SU US |
|
AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): AT BE CH DE DK ES FR GB GR IT LU NL SE |
|
AK | Designated states |
Kind code of ref document: A3 Designated state(s): BR CS JP KR SU US |
|
AL | Designated countries for regional patents |
Kind code of ref document: A3 Designated state(s): AT BE CH DE DK ES FR GB GR IT LU NL SE |
|
DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
EX32 | Extension under rule 32 effected after completion of technical preparation for international publication |
Ref country code: UA |
|
WWE | Wipo information: entry into national phase |
Ref document number: 1992920289 Country of ref document: EP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 08196212 Country of ref document: US |
|
WWP | Wipo information: published in national office |
Ref document number: 1992920289 Country of ref document: EP |
|
WWR | Wipo information: refused in national office |
Ref document number: 1992920289 Country of ref document: EP |
|
WWW | Wipo information: withdrawn in national office |
Ref document number: 1992920289 Country of ref document: EP |