WO1987000275A1 - Detecteur de fuite d'halogene - Google Patents

Detecteur de fuite d'halogene Download PDF

Info

Publication number
WO1987000275A1
WO1987000275A1 PCT/SU1985/000053 SU8500053W WO8700275A1 WO 1987000275 A1 WO1987000275 A1 WO 1987000275A1 SU 8500053 W SU8500053 W SU 8500053W WO 8700275 A1 WO8700275 A1 WO 8700275A1
Authority
WO
WIPO (PCT)
Prior art keywords
anode
power supply
power
output
anοda
Prior art date
Application number
PCT/SU1985/000053
Other languages
English (en)
French (fr)
Russian (ru)
Inventor
Jury Grigorievich Marchenko
Valentin Davidovich Doroshev
Original Assignee
Ukrainsky Gosudarstvenny Proektny I Nauchno-Issled
Donetsky Fiziko-Tekhnichesky Institut Akademii Nau
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ukrainsky Gosudarstvenny Proektny I Nauchno-Issled, Donetsky Fiziko-Tekhnichesky Institut Akademii Nau filed Critical Ukrainsky Gosudarstvenny Proektny I Nauchno-Issled
Priority to JP60504419A priority Critical patent/JPS62503185A/ja
Priority to FI870825A priority patent/FI870825A0/fi
Priority to DE19853590817 priority patent/DE3590817T1/de
Priority to PCT/SU1985/000053 priority patent/WO1987000275A1/ru
Priority to GB8702259A priority patent/GB2186695B/en
Priority to FR8513274A priority patent/FR2587112B1/fr
Publication of WO1987000275A1 publication Critical patent/WO1987000275A1/ru
Priority to DK095487A priority patent/DK95487D0/da
Priority to SE8700793A priority patent/SE459888B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/626—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas

Definitions

  • the area of technology The current invention is available to devices for detecting leaks in vacuum and gas-filled 5 systems, and more specifically, it is easy.
  • the sensor of the primary initialization of the indicated halogen-free generator operates under the conditions of heating the anode to a temperature of 900 -200 ° C.
  • a temperature of 900 -200 ° C For this type of temperature, there is a risk of falling into the hands of the majority of the respondents with 20 substances, for example, causing the “pressure”.
  • the “response” is a result of a sharp increase in the external frequency between the anode and the card and the process of sensing the transmission.
  • a long heated temperature of 25 ° C to 900-1200 ° C is carried out in contact with galogens, which is longer than the "pressure".
  • the main task of the invention was to create such. a galgenic processor, the electrical circuit would also be performed so that it would increase the reliability and profitability of the business
  • Halogen-free printer which contains a sensor of a primary ionization, having an anode, electrically connected to a power source
  • the difference is that it includes a bridge of 10 (Fig. 2), which includes switches II, 12, 35 ID and anode 2, and the amplifier 14 is very large. • 4 - the unbalance signal is connected to the input of the individual power supply 3 of the anode 2, which is connected to the other diagonal of the bridge 10.
  • Unit 9 is an electric device with two stable states. In the most basic cases, these devices can be selected from the list of well-known specialists working in this field of technology, depending
  • An individual source of 3 feed anode 2 creates a charge on anode 2, which is sufficient for a charge of anode 2 at a temperature of 900-1200 ° C (usually 10–20 ° C).
  • the individual source 5 of the power supply 4 is connected between the anode 2 and the power supply 4 35 potential differences of 100 * 300 available. .. - 5 - ... - If there are fewer open circuits, the voltage is less than that which causes the sensor to “fail”; therefore, the signal at the input of amplifier 6 does not recognize
  • the halogen reagent may be used in a vacuum and a good condition.

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electrochemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
PCT/SU1985/000053 1985-06-27 1985-06-27 Detecteur de fuite d'halogene WO1987000275A1 (fr)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP60504419A JPS62503185A (ja) 1985-06-27 1985-06-27 ハロゲンガス漏れ検知器
FI870825A FI870825A0 (fi) 1985-06-27 1985-06-27 Halogenlaeckagedektor.
DE19853590817 DE3590817T1 (enrdf_load_stackoverflow) 1985-06-27 1985-06-27
PCT/SU1985/000053 WO1987000275A1 (fr) 1985-06-27 1985-06-27 Detecteur de fuite d'halogene
GB8702259A GB2186695B (en) 1985-06-27 1985-06-27 Halogen gas leak detector
FR8513274A FR2587112B1 (fr) 1985-06-27 1985-09-06 Detecteur de fuites d'halogenes
DK095487A DK95487D0 (da) 1985-06-27 1987-02-25 Halogengas-laekdetektor
SE8700793A SE459888B (sv) 1985-06-27 1987-02-25 Halogenlaecksoekare innefattande en ytjoniseringsgivare

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/SU1985/000053 WO1987000275A1 (fr) 1985-06-27 1985-06-27 Detecteur de fuite d'halogene

Publications (1)

Publication Number Publication Date
WO1987000275A1 true WO1987000275A1 (fr) 1987-01-15

Family

ID=21616920

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/SU1985/000053 WO1987000275A1 (fr) 1985-06-27 1985-06-27 Detecteur de fuite d'halogene

Country Status (8)

Country Link
JP (1) JPS62503185A (enrdf_load_stackoverflow)
DE (1) DE3590817T1 (enrdf_load_stackoverflow)
DK (1) DK95487D0 (enrdf_load_stackoverflow)
FI (1) FI870825A0 (enrdf_load_stackoverflow)
FR (1) FR2587112B1 (enrdf_load_stackoverflow)
GB (1) GB2186695B (enrdf_load_stackoverflow)
SE (1) SE459888B (enrdf_load_stackoverflow)
WO (1) WO1987000275A1 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007162075A (ja) * 2005-12-14 2007-06-28 Dowa Holdings Co Ltd ガリウム含有溶液の精製方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4910463A (en) * 1987-12-17 1990-03-20 Sentech Corporation Halogen monitoring apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH506062A (de) * 1970-06-30 1971-04-15 Balzers Patent Beteilig Ag Verfahren zum Betrieb einer Halogennachweisdiode und Vorrichtung zur Durchführung des Verfahrens
DD124842A1 (enrdf_load_stackoverflow) * 1975-12-22 1977-03-16

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1418042A (fr) * 1964-06-04 1965-11-19 Albert Le Boeuf & Fils Dispositif de protection des jauges d'ionisation
US3292090A (en) * 1964-07-01 1966-12-13 Gen Electric Ion gauge system having overload protection
JPS57152654A (en) * 1981-03-18 1982-09-21 Anelva Corp Ionic current measuring device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH506062A (de) * 1970-06-30 1971-04-15 Balzers Patent Beteilig Ag Verfahren zum Betrieb einer Halogennachweisdiode und Vorrichtung zur Durchführung des Verfahrens
FR2096215A5 (enrdf_load_stackoverflow) * 1970-06-30 1972-02-11 Balzers Patent Beteilig Ag
DD124842A1 (enrdf_load_stackoverflow) * 1975-12-22 1977-03-16

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
V.A. LANIS et al., "Tekhnika Vakuumnykh Ispytany", 1963, GOSUDARSTVENNOE ENERGETICHESKOE IZDATELSTVO (MOSCOW, LENINGRAD), pages 171-172. *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007162075A (ja) * 2005-12-14 2007-06-28 Dowa Holdings Co Ltd ガリウム含有溶液の精製方法

Also Published As

Publication number Publication date
DE3590817T1 (enrdf_load_stackoverflow) 1987-05-14
FI870825A7 (fi) 1987-02-26
FR2587112B1 (fr) 1988-11-25
SE8700793D0 (sv) 1987-02-25
DK95487A (da) 1987-02-25
DK95487D0 (da) 1987-02-25
GB2186695B (en) 1989-07-12
SE459888B (sv) 1989-08-14
SE8700793L (sv) 1987-02-25
GB8702259D0 (en) 1987-03-11
GB2186695A (en) 1987-08-19
FR2587112A1 (fr) 1987-03-13
FI870825L (fi) 1987-02-26
FI870825A0 (fi) 1987-02-26
JPS62503185A (ja) 1987-12-17

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