USD931228S1 - Electrical contact - Google Patents
Electrical contact Download PDFInfo
- Publication number
- USD931228S1 USD931228S1 US29/713,906 US201929713906F USD931228S US D931228 S1 USD931228 S1 US D931228S1 US 201929713906 F US201929713906 F US 201929713906F US D931228 S USD931228 S US D931228S
- Authority
- US
- United States
- Prior art keywords
- electrical contact
- view
- design
- dash
- ornamental design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019-011016 | 2019-05-21 | ||
| JP2019011016F JP1646397S (enExample) | 2019-05-21 | 2019-05-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD931228S1 true USD931228S1 (en) | 2021-09-21 |
Family
ID=68610810
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/713,906 Active USD931228S1 (en) | 2019-05-21 | 2019-11-19 | Electrical contact |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD931228S1 (enExample) |
| JP (1) | JP1646397S (enExample) |
| TW (1) | TWD209939S (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD1086075S1 (en) * | 2023-03-06 | 2025-07-29 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD1087034S1 (en) * | 2023-03-06 | 2025-08-05 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD1113760S1 (en) * | 2020-03-10 | 2026-02-17 | Kabushiki Kaisha Nihon Micronics | Electrical contact |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP1715945S (ja) * | 2021-10-27 | 2022-05-26 | 電気接触子 | |
| JP1769756S (ja) | 2023-08-04 | 2024-05-07 | 導通検査用プローブピン | |
| JP1769757S (ja) | 2023-08-04 | 2024-05-07 | 導通検査用プローブピン | |
| JP1785161S (ja) | 2023-08-04 | 2024-11-21 | 導通検査用プローブピン |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080197869A1 (en) * | 2007-02-19 | 2008-08-21 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus |
| US7449906B2 (en) * | 2003-05-13 | 2008-11-11 | Kabushiki Kaisha Nihon Micronics | Probe for testing an electrical device |
| US20090051382A1 (en) * | 2005-03-07 | 2009-02-26 | Kabushiki Kaisha Nihon Micronics | Probe for electrical test and electrical connecting apparatus using it |
| US20090160473A1 (en) * | 2007-12-21 | 2009-06-25 | Kabushiki Kaisha Nihon Micronics | Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor |
| US20100033201A1 (en) * | 2008-08-05 | 2010-02-11 | Tseng-Yang Hsu | Mems probe fabrication on a reusable substrate for probe card application |
| US7736690B2 (en) * | 2007-02-01 | 2010-06-15 | Kabushiki Kaisha Nihon Micronics | Method for manufacturing an electrical test probe |
| US7924038B2 (en) * | 2007-01-22 | 2011-04-12 | Kabushiki Kaisha Nihon Micronics | Probe and electrical connecting apparatus using it |
| US8063651B2 (en) * | 2008-05-02 | 2011-11-22 | Kabushiki Kaisha Nihon Micronics | Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same |
| USD665361S1 (en) * | 2011-02-15 | 2012-08-14 | Omron Corporation | Electric connector terminal |
| USD702646S1 (en) * | 2012-08-29 | 2014-04-15 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| US8975908B2 (en) * | 2010-09-17 | 2015-03-10 | Kabushiki Kaisha Nihon Micronics | Electrical test probe and probe assembly with improved probe tip |
| US20210041482A1 (en) * | 2019-08-09 | 2021-02-11 | Kabushiki Kaisha Nihon Micronics | Electrical contactor and electrical connecting apparartus |
| US20210041480A1 (en) * | 2019-08-09 | 2021-02-11 | Kabushiki Kaisha Nihon Micronics | Electrical contactor and electrical connecting apparatus |
-
2019
- 2019-05-21 JP JP2019011016F patent/JP1646397S/ja active Active
- 2019-11-19 US US29/713,906 patent/USD931228S1/en active Active
- 2019-11-20 TW TW108307106F patent/TWD209939S/zh unknown
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7449906B2 (en) * | 2003-05-13 | 2008-11-11 | Kabushiki Kaisha Nihon Micronics | Probe for testing an electrical device |
| US20090051382A1 (en) * | 2005-03-07 | 2009-02-26 | Kabushiki Kaisha Nihon Micronics | Probe for electrical test and electrical connecting apparatus using it |
| US7679389B2 (en) * | 2005-03-07 | 2010-03-16 | Kabushiki Kaisha Nihon Micronics | Probe for electrical test and electrical connecting apparatus using it |
| US7924038B2 (en) * | 2007-01-22 | 2011-04-12 | Kabushiki Kaisha Nihon Micronics | Probe and electrical connecting apparatus using it |
| US7736690B2 (en) * | 2007-02-01 | 2010-06-15 | Kabushiki Kaisha Nihon Micronics | Method for manufacturing an electrical test probe |
| US20080197869A1 (en) * | 2007-02-19 | 2008-08-21 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus |
| US20090160473A1 (en) * | 2007-12-21 | 2009-06-25 | Kabushiki Kaisha Nihon Micronics | Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor |
| US7960988B2 (en) * | 2007-12-21 | 2011-06-14 | Kabushiki Kaisha Nihon Micronics | Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor |
| US8063651B2 (en) * | 2008-05-02 | 2011-11-22 | Kabushiki Kaisha Nihon Micronics | Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same |
| US20100033201A1 (en) * | 2008-08-05 | 2010-02-11 | Tseng-Yang Hsu | Mems probe fabrication on a reusable substrate for probe card application |
| US8975908B2 (en) * | 2010-09-17 | 2015-03-10 | Kabushiki Kaisha Nihon Micronics | Electrical test probe and probe assembly with improved probe tip |
| USD665361S1 (en) * | 2011-02-15 | 2012-08-14 | Omron Corporation | Electric connector terminal |
| USD702646S1 (en) * | 2012-08-29 | 2014-04-15 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| US20210041482A1 (en) * | 2019-08-09 | 2021-02-11 | Kabushiki Kaisha Nihon Micronics | Electrical contactor and electrical connecting apparartus |
| US20210041480A1 (en) * | 2019-08-09 | 2021-02-11 | Kabushiki Kaisha Nihon Micronics | Electrical contactor and electrical connecting apparatus |
Non-Patent Citations (1)
| Title |
|---|
| Electrical contacts. (Design—© Questel) orbit.com. [Online PDF compilation of references] 13 pgs. Print Dates Range Jul. 16, 2013-Jun. 5, 2020 [Retrieved Mar. 1, 2021] https://www.orbit.com/export/UCZAH96B/pdf4/59ff9031-3303-4e2a-ad86-a96ee5817655-191103.pdf (Year: 2021). * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD1113760S1 (en) * | 2020-03-10 | 2026-02-17 | Kabushiki Kaisha Nihon Micronics | Electrical contact |
| USD1086075S1 (en) * | 2023-03-06 | 2025-07-29 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD1087034S1 (en) * | 2023-03-06 | 2025-08-05 | Kabushiki Kaisha Nihon Micronics | Electric contact |
Also Published As
| Publication number | Publication date |
|---|---|
| JP1646397S (enExample) | 2019-11-25 |
| TWD209939S (zh) | 2021-02-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |