USD873159S1 - Electric contact - Google Patents

Electric contact Download PDF

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Publication number
USD873159S1
USD873159S1 US29/658,645 US201829658645F USD873159S US D873159 S1 USD873159 S1 US D873159S1 US 201829658645 F US201829658645 F US 201829658645F US D873159 S USD873159 S US D873159S
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US
United States
Prior art keywords
electric contact
view
design
indicated
elevation view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/658,645
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English (en)
Inventor
Mika NASU
Tsuyoshi Muramoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Assigned to KABUSHIKI KAISHA NIHON MICRONICS reassignment KABUSHIKI KAISHA NIHON MICRONICS ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MURAMOTO, TSUYOSHI, NASU, MIKA
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US29/658,645 2018-02-02 2018-08-01 Electric contact Active USD873159S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018-002093 2018-02-02
JPD2018-2093F JP1622968S (enrdf_load_stackoverflow) 2018-02-02 2018-02-02

Publications (1)

Publication Number Publication Date
USD873159S1 true USD873159S1 (en) 2020-01-21

Family

ID=65037339

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/658,645 Active USD873159S1 (en) 2018-02-02 2018-08-01 Electric contact

Country Status (3)

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US (1) USD873159S1 (enrdf_load_stackoverflow)
JP (1) JP1622968S (enrdf_load_stackoverflow)
TW (1) TWD197820S (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD967033S1 (en) * 2020-10-06 2022-10-18 Kyocera Corporation Electrical connector

Citations (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
US20110050261A1 (en) * 2009-09-01 2011-03-03 Hon Hai Precision Industry Co., Ltd. Test probe
TWD150990S (zh) 2012-03-27 2012-12-21 欣興電子股份有限公司 針格陣列的針腳
US20130069669A1 (en) * 2011-09-19 2013-03-21 Vasu MOGAVEERA Electrostatic shielding technique on high voltage diodes
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
US20150070040A1 (en) * 2012-04-13 2015-03-12 Xcerra Corporation Test probe assembly and related methods
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
US20150369859A1 (en) * 2012-07-23 2015-12-24 Yamaichi Electronics Co., Ltd. Contact probe and semiconductor element socket provided with same
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
US9547023B2 (en) * 2010-07-02 2017-01-17 Isc Co., Ltd. Test probe for test and fabrication method thereof
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
US20170138985A1 (en) * 2014-06-16 2017-05-18 Omron Corporation Probe pin and electronic device using the same
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly

Patent Citations (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
US20110050261A1 (en) * 2009-09-01 2011-03-03 Hon Hai Precision Industry Co., Ltd. Test probe
US8283939B2 (en) * 2009-09-01 2012-10-09 Hon Hai Precision Industry Co., Ltd. Test probe
US9547023B2 (en) * 2010-07-02 2017-01-17 Isc Co., Ltd. Test probe for test and fabrication method thereof
US20130069669A1 (en) * 2011-09-19 2013-03-21 Vasu MOGAVEERA Electrostatic shielding technique on high voltage diodes
TWD150990S (zh) 2012-03-27 2012-12-21 欣興電子股份有限公司 針格陣列的針腳
US20150070040A1 (en) * 2012-04-13 2015-03-12 Xcerra Corporation Test probe assembly and related methods
US20150369859A1 (en) * 2012-07-23 2015-12-24 Yamaichi Electronics Co., Ltd. Contact probe and semiconductor element socket provided with same
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
US20170138985A1 (en) * 2014-06-16 2017-05-18 Omron Corporation Probe pin and electronic device using the same
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD967033S1 (en) * 2020-10-06 2022-10-18 Kyocera Corporation Electrical connector

Also Published As

Publication number Publication date
JP1622968S (enrdf_load_stackoverflow) 2019-01-28
TWD197820S (zh) 2019-06-01

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